JPH10123203A - Ic test system - Google Patents

Abstract

PROBLEM TO BE SOLVED: To automate the correspondence of the physical pin of a prepared socket board and the logic pin in the test program to be executed. SOLUTION: A socket board 2, wherein a DUT(device under test) 1 is mounted, and an IC tester 3, which is connected to the board 2 and performs the quality inspection of the DUT 1 mounted on the board by executing the prepared test program, are provided. The different design/wiring are provided for the socket board 2 in correspondence with the kind of the DUT 1. The socket board 2 is replaced in correspondence with the kind of the DUT 1. In the respective socket board 2 of each kind, an information memory 4, which stores the pin setting information for obtaining the correspondence between the physical pin of the socket and the logic pin used in the test program, is provided. The IC tester 3 reads the pin setting information from the information memory 4 of the connected socket board and obtains the correspondence of the physical pin and the logic pin in the test program base on the information.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

[0001] 1. Field of the Invention [0002] The present invention relates to an IC test system for mounting a device under test (DUT) on a socket board in a state where the device under test (DUT) is inserted into a socket and inspecting the quality thereof.

[0002]

2. Description of the Related Art An IC test system of this kind includes a DUT.
And an IC tester connected to the board via an interface to test the DUT.

[0003] Socket boards are designed and wired for each type of DUT, and are replaced each time according to the type of DUT. The IC tester includes a plurality of units (such as an operator's terminal for executing a test by downloading a dedicated program) constituting a test system and a control unit for controlling the entire system. The control unit includes a test program suitable for each type of DUT, and downloads a program relating to the DUT mounted on the board to a predetermined unit to execute a test.

In the above IC test system, a socket board corresponding to the type of DUT to be inspected is prepared, and the DUT is mounted on the board to perform quality inspection. Since the position (number) of the socket pin (physical pin) of the socket board is different for each board, when performing the test, the physical pin of the prepared socket board is used in the test program to be executed. It is necessary to correspond to a logical pin indicating a physical pin of the board. Normally, a user must create a program in which physical pins and logical pins are associated with each socket board. This program was created separately from the test program and was loaded when testing the device.

[0005]

However, in the above-described conventional IC test system, a user has to prepare a program for associating physical pins of a prepared socket board with logical pins in a test program to be executed. Since it is necessary to load each test program, an erroneous program may be loaded and electric circuits on the DUT and the socket board may be damaged.

[0006] In addition, the fact that the user loads a program in which pin information is described for each test program is one factor that hinders the efficiency of inspection work.

An object of the present invention is to provide an IC test system capable of automatically associating physical pins of a prepared socket board with logical pins in a test program to be executed in order to solve the above problem. Is to do.

[0008]

In order to achieve the above object, an IC test system according to the present invention comprises a socket board on which a device to be measured is mounted, and a test program connected to the socket board and provided in advance. The socket board is designed / wired according to the type of the device under test, and is configured with an IC tester for performing a quality inspection of the device under test mounted on the board. In an IC test system in which a socket board is replaced according to the following, each of the various socket boards has pin setting information for associating a physical pin of the socket with a logical pin used in the test program. Is provided, and the IC tester is provided with an information memo of the connected socket board. Read the pin configuration information from,
It is characterized in that a correspondence between a physical pin and a logical pin in a test program is obtained based on the information.

In the above case, the information memory may be constituted by a ROM.

According to the present invention as described above, each of the various socket boards is provided with an information memory storing pin setting information indicating the correspondence between the physical pins of the socket board and the logical pins in the test program. Yes, IC
The tester reads the pin setting information from the information memory of the connected socket board, and automatically associates the physical pins with the logical pins in the test program based on the read pin setting information. Therefore, it is possible to prevent a user from loading an erroneous program, and to reduce complexity of work.

[0011]

Next, embodiments of the present invention will be described with reference to the drawings.

FIG. 1 is a block diagram showing an embodiment of an IC test system according to the present invention.

In this IC test system, an electric circuit for measuring the DUT 1 is incorporated, and a socket board 2 for mounting the DUT 1 in a socket is connected to the board 2 via an interface and stored in advance. And an IC tester 3 for executing the test program and testing the DUT 1.

The socket board 2 is designed and wired for each type of DUT, and is replaced each time according to the type of DUT. The various socket boards 2 are provided with an information memory 4 which stores pin setting information indicating correspondence between socket pins (physical pins) of the board and logical pins in the test program. This information memory 4 stores R
It can be configured by a storage medium such as OM.

The IC tester 3 comprises a plurality of units (such as an operator's terminal for executing a test by downloading a dedicated program) constituting a test system 32 and a control unit 31 for controlling the entire system. The control unit 31 includes a test program for various tests, downloads the program to a predetermined unit, and executes the test. The control unit 31 also accesses the information memory 4 provided on the socket board 2 via the interface, and
Then, the pin setting information is read from the CPU, and the correspondence between the physical pin and the logical pin in the test program is determined based on the information.

In the IC test system having the above configuration, the DUT is inspected as follows.

First, a socket board 2 corresponding to the type of DUT to be inspected is prepared and connected to the IC tester 3. When the socket board 2 is connected to the IC tester 3, the control unit 31 accesses the information memory 4 of the socket board 2 via the interface and reads out the pin setting information on the connected board. When the pin setting information is read, the control unit 31 associates the physical pins with the logical pins in the test program based on the read pin setting information, and then downloads the program to a predetermined unit 32 to execute the DUT test. Let it.

Subsequently, when testing another type of DUT, the socket board 2 is replaced with a board corresponding to the type of DUT to be tested, and connected to the IC tester 3. When the socket board 2 is connected to the IC tester 3, the control unit 31 accesses the information memory 4 of the socket board 2 via the interface and reads out pin setting information relating to the connected board, as in the above operation. . Then, based on the read pin setting information, the correspondence between the physical pins and the logical pins in the test program is determined, the program is downloaded to a predetermined unit 32, and the DUT is loaded.
Run the test.

[0019]

According to the present invention configured as described above, the IC tester can automatically associate the physical pins of the connected socket board with the logical pins in the test program. It is possible to prevent a user from loading an erroneous program and damaging an electric circuit on the DUT or the socket board.

In addition, since the user does not need to reload the program, the quality inspection of the DUT can be performed quickly.

[Brief description of the drawings]

FIG. 1 is a block diagram showing an embodiment of an IC test system according to the present invention.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Device under test (DUT) 2 Socket board 3 IC tester 4 Information memory 31 Control part 32 unit

Claims (2)

[Claims] A socket on which a device under test is mounted.
A socket and an IC tester connected to the socket board and executing a test program provided in advance to perform a quality inspection of a device to be measured mounted on the board. ICs that are designed / wired according to the type of product and that replace the socket / board according to the type of device under test
In the test system, each of the various socket boards is provided with an information memory storing pin setting information for associating a physical pin of the socket with a logical pin used in the test program; Is an IC test system which reads pin setting information from an information memory of a connected socket board and makes correspondence between physical pins and logical pins in a test program based on the pin setting information. 2. The IC test system according to claim 1, wherein said information memory comprises a ROM.