JPH10115596A - Sample holder for x-ray diffratometer and sample fixation method - Google Patents

Sample holder for x-ray diffratometer and sample fixation method

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Publication number
JPH10115596A
JPH10115596A JP9079762A JP7976297A JPH10115596A JP H10115596 A JPH10115596 A JP H10115596A JP 9079762 A JP9079762 A JP 9079762A JP 7976297 A JP7976297 A JP 7976297A JP H10115596 A JPH10115596 A JP H10115596A
Authority
JP
Japan
Prior art keywords
sample
fixed
holder
sample holder
nut
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9079762A
Other languages
Japanese (ja)
Inventor
Shigeaki Mitsuoka
重日 密岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzuki Motor Corp
Original Assignee
Suzuki Motor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzuki Motor Corp filed Critical Suzuki Motor Corp
Priority to JP9079762A priority Critical patent/JPH10115596A/en
Publication of JPH10115596A publication Critical patent/JPH10115596A/en
Pending legal-status Critical Current

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  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a sample holder, for an X-ray diffractometer, and a sample fixation method which simplify an operation to fix a sample to the sample holder in such a way that a sample measuring face and the surface of the sample holder are on the same plane. SOLUTION: A fixed base 1 which is provided with a sample sandwiching face 2 and a moving base 5 which is provided with a sample sandwiching face 7 are installed, an rods 4 which comprise thread grooves 3 are fixed to the sample sandwiching face 2 at the fixed base 1 so as to protrude. The moving face 5 is inserted into, and passed through, the rods 4 in such a way that the sample sandwiching face 7 is faced with the sample sandwiching face 2 at the fixed base 1, nuts 8 are screwed, and a sample holder, for an X-ray diffractometer, which fixes a sample is formed. Taper faces which are force-fitted to the moving base 5 may be formed at edges of the nuts 8 so that the dislocation of the rods 4 from through holes in the moving base 5 is prevented and that a sample measuring face and the surface of the sample holder are the same plane. In addition, when the sample is a powder, adhesive fixation body in which an adhesive material is filled into a box body is used, and the sample can be fixed easily to the sample holder.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、X線回折装置で分
析を行う際に試料を固定するための試料ホルダおよびそ
の試料ホルダを用いた試料固定方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sample holder for fixing a sample when performing analysis with an X-ray diffractometer and a method for fixing a sample using the sample holder.

【0002】[0002]

【従来の技術】X線回折装置は、試料を構成する分子の
種類を調べる装置であり、その概略構成は、図12に示
すように、試料を固定する試料ホルダ21を試料台22
に固定し、電子源23から電子ビームを放出して純物質
からなるターゲット24に当て、これにより発生するX
線を試料で回折させ、該X線をX線検出器25によって
検出することにより、試料を構成する分子の種類が判
る。このとき、試料とターゲット24とX線検出器25
が共通のローランド円R上に位置することがX線を試料
で回折させる条件となっている。
2. Description of the Related Art An X-ray diffractometer is a device for examining the types of molecules constituting a sample. The schematic configuration of the device is as shown in FIG.
, And emits an electron beam from the electron source 23 to impinge on a target 24 made of a pure substance.
X-rays are diffracted by the sample, and the X-rays are detected by the X-ray detector 25, whereby the types of molecules constituting the sample can be determined. At this time, the sample, the target 24 and the X-ray detector 25
Are on the common Rowland circle R, which is a condition for diffracting X-rays by the sample.

【0003】図13に示すように、従来、試料を固定す
る試料ホルダ21は、金属板からなる本体26の一部に
貫通孔を穿設して保持穴27とし、該保持穴27に試料
を保持させる構成である。ここで、試料ホルダ21にお
いて、試料台22に載置する際に表側になる面を上面2
8とする。
As shown in FIG. 13, conventionally, a sample holder 21 for fixing a sample is provided with a through hole in a part of a main body 26 made of a metal plate to form a holding hole 27, and the sample is placed in the holding hole 27. This is a configuration for holding. Here, in the sample holder 21, the surface that becomes the front side when placed on the sample stage 22 is the upper surface 2.
8 is assumed.

【0004】ここで、試料を試料ホルダ21に固定する
方法を説明する。試料が微粉体の場合は、平坦な台に上
面28が当接する向きに試料ホルダ21を載置し、保持
穴27に試料を詰め圧迫して保持穴27内に固定してい
る。このとき、試料は平坦な台に圧迫固定されることに
よって、平坦な台に接する面が平坦面となり、かつ、平
坦な台に接している試料ホルダ21面と同一平面となる
ので、その面を試料測定面として試料台22に固定す
る。また試料が固体の場合は、図14のように、平坦な
台に試料ホルダ21の上面28を下にして載置し、保持
穴27に試料Aを載置し、粘着テープ29(粘土でも
可)によって試料Aを試料ホルダ21に固定する。この
とき、図15に示すように、試料Aの試料測定面Bは平
面であり、試料測定面Bと試料ホルダ21の上面28が
平坦な台に接しているため同一平面となるので、測定時
には、試料ホルダ21を裏返して試料台22に固定す
る。
Here, a method for fixing a sample to the sample holder 21 will be described. When the sample is a fine powder, the sample holder 21 is placed in a direction in which the upper surface 28 abuts on a flat table, and the sample is packed in the holding hole 27 and pressed to fix the sample in the holding hole 27. At this time, since the sample is pressed and fixed to the flat table, the surface in contact with the flat table becomes a flat surface, and the sample holder 21 in contact with the flat table becomes flush with the surface. It is fixed to the sample table 22 as a sample measurement surface. When the sample is a solid, as shown in FIG. 14, the sample is placed on a flat table with the upper surface 28 of the sample holder 21 down, the sample A is placed in the holding hole 27, and an adhesive tape 29 (clay may be used). ) To fix the sample A to the sample holder 21. At this time, as shown in FIG. 15, the sample measurement surface B of the sample A is a plane, and since the sample measurement surface B and the upper surface 28 of the sample holder 21 are in contact with a flat table, they are on the same plane. Then, the sample holder 21 is turned over and fixed to the sample table 22.

【0005】さらに、試料Aが微粉体である場合は保持
穴27に対して試料Aの量が十分でなければ試料Aを固
定することができないため、少量の試料Aを固定し得る
ように、図16に示す底面30を有する保持穴27’を
備える試料ホルダ21’が提案されている。
Further, when the sample A is a fine powder, the sample A cannot be fixed unless the amount of the sample A is sufficient for the holding hole 27, so that a small amount of the sample A can be fixed. A sample holder 21 ′ having a holding hole 27 ′ having a bottom surface 30 shown in FIG. 16 has been proposed.

【0006】このような試料ホルダ21’に微粉体の試
料Aを固定する方法を説明する。試料ホルダ21’の上
面28を上にして台上に載置し、保持穴27’に試料A
を充填して固定し、試料Aが上面28と同一平面になる
ようにへら等を用いて試料Aをすり切って平坦にする。
さらに、保持穴27’に充填できるほど試料Aの量が十
分でない場合には、図17および図18に示すように、
保持穴27’の底面30に、上面28とほぼ同一平面と
なるように両面テープ31を貼り、該両面テープ31上
に試料Aを接着させて固定したり、あるいは、上面28
とほぼ同一平面となるように、のり32を保持孔27’
内に充填して、のり32の表面に試料Aを接着させて固
定している。
A method for fixing the fine powder sample A to the sample holder 21 'will be described. The sample holder 21 ′ is placed on a table with the upper surface 28 facing up, and the sample A is inserted into the holding hole 27 ′.
Is filled and fixed, and the sample A is scraped and flattened using a spatula or the like so that the sample A is flush with the upper surface 28.
Further, when the amount of the sample A is not enough to fill the holding hole 27 ′, as shown in FIG. 17 and FIG.
A double-sided tape 31 is attached to the bottom surface 30 of the holding hole 27 ′ so as to be substantially flush with the upper surface 28, and the sample A is adhered and fixed on the double-sided tape 31.
Glue 32 into holding hole 27 ′ so that
The sample A is adhered and fixed to the surface of the paste 32.

【0007】[0007]

【発明が解決しようとする課題】ところで、X線回折装
置で試料を測定する場合には、試料AでX線を回折させ
てそれをX線検出器25で検出するため、試料Aの試料
測定面を平面にし、かつ試料ホルダ21の上面28と試
料測定面を同一平面にして、図12のローランド円R上
に試料Aを位置させねばならない。
When a sample is measured by an X-ray diffractometer, the sample A is diffracted by the sample A and detected by the X-ray detector 25. The sample A must be positioned on the Rowland circle R in FIG. 12 with the surface being a plane and the upper surface 28 of the sample holder 21 and the sample measurement surface being the same plane.

【0008】上述の貫通穴の保持穴27を備える試料ホ
ルダ21(図13参照)に試料Aを固定する場合には、
測定作業を煩雑にする以下に述べる問題点がある。試料
Aが微粉体の場合には、上述のように保持穴27に試料
Aを詰め圧迫して固定しているため、一応は平面とする
ことができるが、測定中に試料が崩れたり、測定面がず
れてしまうという問題点がある。また、微粉体である試
料Aを保持穴27に固定しなければならない煩わしさが
あった。
When the sample A is fixed to the sample holder 21 (see FIG. 13) having the above-described through hole holding hole 27,
There are the following problems that complicate the measurement operation. When the sample A is a fine powder, since the sample A is packed in the holding hole 27 and pressed and fixed as described above, the sample A can be temporarily formed into a flat surface. There is a problem that the surface is shifted. Further, there is an annoyance that the sample A, which is a fine powder, must be fixed to the holding hole 27.

【0009】一方、固体の試料Aの場合には、保持穴2
7よりも大きな試料の場合には試料を切断して加工しな
ければならない煩わしさがあった。そして、上述のよう
に試料ホルダ21の上面28が平坦な台に接するように
載置して固定する場合にも、測定のために、試料ホルダ
21を裏返すので、試料測定面Bと上面28がずれてし
まうという問題がある。そして、試料Aの厚みが薄過ぎ
たり厚過ぎる場合には、粘着テープ29等によって試料
Aの試料測定面Bと試料ホルダ21の上面28を同一平
面を保つように固定するのが困難であった。
On the other hand, in the case of the solid sample A, the holding hole 2
In the case of a sample larger than 7, the sample must be cut and processed. When the sample holder 21 is placed and fixed so that the upper surface 28 of the sample holder 21 is in contact with the flat table as described above, the sample measurement surface B and the upper surface 28 are turned over because the sample holder 21 is turned over for measurement. There is a problem of shifting. When the thickness of the sample A is too thin or too thick, it is difficult to fix the sample measurement surface B of the sample A and the upper surface 28 of the sample holder 21 with the adhesive tape 29 or the like so as to keep the same plane. .

【0010】さらに、底面30を有する保持穴27’を
備える試料ホルダ21’(図16参照)に試料Aを固定
する場合には、以下に述べる問題点がある。試料ホルダ
21’に試料Aを固定する場合には、保持穴27’に微
粉体の試料Aを圧迫して固定し、へら等で試料Aをすり
切って上面28と同一平面になるようにしているため、
一応は平面とすることができ、さらに底面30を有する
ので比較的試料Aが崩れにくいが、実際にへら等で試料
Aをすり切って上面28と同一平面とするためには、試
料Aの粒径がおよそ1μm以下でなければならない。こ
のため、試料ホルダ21’に固定可能な試料Aには制限
があった。
Further, when the sample A is fixed to the sample holder 21 '(see FIG. 16) having the holding hole 27' having the bottom surface 30, there are the following problems. When the sample A is fixed to the sample holder 21 ′, the fine powder sample A is pressed and fixed in the holding hole 27 ′, and the sample A is cut off with a spatula or the like so that the sample A is flush with the upper surface 28. Because
Although the sample A can be made flat and the bottom surface 30 is used, the sample A is relatively hard to collapse. However, in order to actually cut the sample A with a spatula or the like so as to be flush with the upper surface 28, the sample A The diameter must be less than about 1 μm. For this reason, there is a limit on the sample A that can be fixed to the sample holder 21 ′.

【0011】そして、図17に示すように、両面テープ
31を使用する場合には、その上面を平面にすることが
困難であり、さらに試料Aの粒径が大きな場合には、上
面28よりも上方に突出してしまい正確な測定をするこ
とが不可能であった。また図18に示すように、のり3
2を保持穴27’に充填する場合には、この充填作業が
非常に困難であるという問題があった。
As shown in FIG. 17, when the double-sided tape 31 is used, it is difficult to make the upper surface thereof flat, and when the particle size of the sample A is large, it is larger than that of the upper surface 28. Since it protruded upward, it was impossible to measure accurately. Also, as shown in FIG.
In the case where 2 is filled in the holding hole 27 ', there is a problem that this filling operation is very difficult.

【0012】したがって、本発明は、試料Aの試料測定
面Bと試料ホルダ21,21’の上面28とを同一平面
になるように、試料Aを試料ホルダ21,21’に固定
する作業を簡素化させるX線回折装置用試料ホルダおよ
び試料固定方法を提供するものである。
Accordingly, the present invention simplifies the operation of fixing the sample A to the sample holders 21 and 21 'so that the sample measurement surface B of the sample A and the upper surface 28 of the sample holders 21 and 21' are flush with each other. An object of the present invention is to provide a sample holder for an X-ray diffractometer and a sample fixing method.

【0013】[0013]

【課題を解決するための手段】上記目的を達成するため
に、請求項1の発明においては、試料挟持面をそれぞれ
備えた固定台と可動台とからなり、ねじ溝を有する複数
本のロッドを固定台の試料挟持面に所定距離をおいて突
出するように固定し、前記可動台の試料挟持面を固定台
の試料挟持面に対向するように前記可動台を前記ロッド
に挿通し、前記ロッドに螺合されるナットを有すること
を特徴とするX線回折装置用試料ホルダとした。
In order to achieve the above object, according to the first aspect of the present invention, a plurality of rods each including a fixed table and a movable table each having a sample holding surface and having a thread groove are provided. The movable table is fixed to the sample holding surface of the fixed table so as to protrude at a predetermined distance, and the movable table is inserted through the rod so that the sample holding surface of the movable table faces the sample holding surface of the fixed table. A sample holder for an X-ray diffractometer, comprising a nut screwed into the sample holder.

【0014】請求項2の発明においては、請求項1記載
の構成において、前記ナットの端面は、前記可動台に圧
入するようにテーパ面に形成されることを特徴とするX
線回折装置用試料ホルダである。
According to a second aspect of the present invention, in the configuration of the first aspect, the end surface of the nut is formed in a tapered surface so as to press-fit the movable table.
It is a sample holder for a line diffraction apparatus.

【0015】請求項3の発明においては、固定台の試料
挟持面に設けられたロッドを可動台の試料挟持面に対向
するように挿通して平坦な台の上に載置し、次に固定台
および可動台の試料挟持面の間に試料を載置し、続いて
ナットをロッドにねじ込んで、ナットに設けられたテー
パ面の先端を可動台に圧入するようにナットを締めるこ
とを特徴とする試料固定方法である。
According to the third aspect of the present invention, the rod provided on the sample holding surface of the fixed table is inserted so as to face the sample holding surface of the movable table, and is mounted on a flat table. The sample is placed between the sample holding surface of the table and the movable table, and then the nut is screwed into the rod, and the nut is tightened so that the tip of the tapered surface provided on the nut is pressed into the movable table. This is the method for fixing the sample.

【0016】請求項4の発明においては、請求項3記載
の方法において、前記試料は、側面の高さが前記試料挟
持面に等しい箱体内に、粘着部材を充填した粘着固定体
に固定されていることを特徴とする。
According to a fourth aspect of the present invention, in the method according to the third aspect, the sample is fixed to an adhesive fixed body filled with an adhesive member in a box having a side surface height equal to the sample holding surface. It is characterized by being.

【0017】[0017]

【発明の実施の形態】請求項1に基づく発明の実施の形
態として、本発明のX線回折装置用試料ホルダは、図1
に示すように、ねじ溝3を有するロッド4を固定台1の
試料挟持面2に突出するように固定し、可動台5の試料
挟持面7を固定台1の試料挟持面2に対向するように可
動台5をロッド4に挿通し、ナット8を螺合することに
よって試料を固定する。このように、固定台1と可動台
5が別部材で構成されるので、従来の試料ホルダ21の
様に保持穴27に試料を合わせることなく、試料挟持面
2,7の間に試料を載置してナット8を螺合する。した
がって、試料ホルダに試料を固定する作業が容易にな
る。
DESCRIPTION OF THE PREFERRED EMBODIMENTS As an embodiment of the present invention based on claim 1, a sample holder for an X-ray diffraction apparatus according to the present invention is shown in FIG.
As shown in FIG. 1, a rod 4 having a thread groove 3 is fixed so as to protrude from the sample holding surface 2 of the fixed base 1, and the sample holding surface 7 of the movable base 5 is opposed to the sample holding surface 2 of the fixed base 1. The sample is fixed by inserting the movable table 5 through the rod 4 and screwing the nut 8. As described above, since the fixed base 1 and the movable base 5 are formed of different members, the sample is placed between the sample holding surfaces 2 and 7 without aligning the sample with the holding hole 27 as in the conventional sample holder 21. And screw the nut 8 into place. Therefore, the work of fixing the sample to the sample holder becomes easy.

【0018】請求項2に基づく発明の実施の形態とし
て、前記ナット8の端面は、図2に示すように、可動台
5に圧入するテーパ面9を形成する。このような構成と
すると、可動台5の貫通孔6とロッド4のずれを防止で
きるので可動台5が安定する。
As an embodiment of the invention based on claim 2, the end face of the nut 8 forms a tapered surface 9 that is press-fitted into the movable base 5 as shown in FIG. With such a configuration, the displacement of the through hole 6 of the movable base 5 and the rod 4 can be prevented, so that the movable base 5 is stabilized.

【0019】請求項3に基づく実施の形態として、固定
台1の試料挟持面2に設けられたロッド4を可動台5の
試料挟持面7に対向するように挿通して平坦な台の上に
載置し、次に固定台1および可動台5の試料挟持面2,
7の間に試料を載置し、続いてナット8をロッド4にね
じ込んで、ナット8に設けられたテーパ面9の先端を可
動台5に圧入するようにナット8を締めることにより、
試料を確実に固定し、かつ、試料と試料ホルダの上面と
が同一平面となる。
According to an embodiment of the present invention, the rod 4 provided on the sample holding surface 2 of the fixed table 1 is inserted into the movable table 5 so as to face the sample holding surface 7 and is placed on a flat table. And then the sample holding surfaces 2 of the fixed table 1 and the movable table 5
7, the nut 8 is screwed into the rod 4, and the nut 8 is tightened so that the tip of the tapered surface 9 provided on the nut 8 is pressed into the movable base 5.
The sample is securely fixed, and the sample and the upper surface of the sample holder are flush with each other.

【0020】請求項4に基づく実施の形態として、試料
Aは、図9に示すように、側面の高さが前記試料挟持面
2,7に等しい箱体18内に粘着部材17を充填した粘
着固定体16に固定される。これにより、試料Aが粉体
であっても、試料ホルダに固定可能である。
As an embodiment based on claim 4, as shown in FIG. 9, a sample A has an adhesive member 17 filled in a box 18 having a side surface height equal to the sample holding surfaces 2 and 7. It is fixed to the fixed body 16. Thereby, even if the sample A is a powder, it can be fixed to the sample holder.

【0021】本発明のX線回折装置用試料ホルダを添付
図面に基づいて説明する。図1および図2において、固
定台1の一側面を試料挟持面2とし、ねじ溝3を有する
2本のロッド4を所定距離をおいて、突出するように試
料挟持面2に固定する。固定台1と同一の厚みを有する
可動台5の側面に、前記ロッド4を挿通可能な貫通孔6
を穿設し、該貫通孔6を有する一面を試料挟持面7とす
る。可動台5は、試料挟持面7と試料挟持面2とが対向
するように位置させロッド4に挿通される。ロッド4に
は、ナット8が螺合される。ナット8は、図2に示すよ
うに、可動台5に対向する側がテーパ面9となってお
り、その先端周縁は可動台5の貫通孔6に挿通される。
このため貫通孔6は、ナット8のテーパ面9全体、ある
いは、テーパ面9の一部が挿入可能な径とする。
A sample holder for an X-ray diffraction apparatus according to the present invention will be described with reference to the accompanying drawings. 1 and 2, one side surface of a fixing table 1 is used as a sample holding surface 2, and two rods 4 having screw grooves 3 are fixed to the sample holding surface 2 so as to protrude at a predetermined distance. A through hole 6 through which the rod 4 can be inserted is provided on a side surface of the movable base 5 having the same thickness as the fixed base 1.
And one surface having the through hole 6 is used as a sample holding surface 7. The movable table 5 is positioned so that the sample holding surface 7 and the sample holding surface 2 face each other, and is inserted into the rod 4. A nut 8 is screwed into the rod 4. As shown in FIG. 2, the nut 8 has a tapered surface 9 on the side facing the movable table 5, and a peripheral edge of the tip is inserted into the through hole 6 of the movable table 5.
For this reason, the diameter of the through hole 6 is such that the entire tapered surface 9 of the nut 8 or a part of the tapered surface 9 can be inserted.

【0022】可動台5はロッド4に移動可能に挿通され
ているため、通常は可動台5が揺動するので、その高さ
が不安定になる。しかし、本発明の試料ホルダは、ナッ
ト8にテーパ面9を設けているので、テーパ面9の先端
周縁が可動台5の貫通孔6に圧入され可動台5を固定す
るので高さが安定し、固定台1、可動台5および試料測
定面Bを同一平面とすることができる。
Since the movable table 5 is movably inserted into the rod 4, the movable table 5 normally swings, and the height thereof becomes unstable. However, in the sample holder of the present invention, since the tapered surface 9 is provided on the nut 8, the peripheral edge of the tapered surface 9 is press-fitted into the through hole 6 of the movable base 5 to fix the movable base 5, so that the height is stable. The fixed table 1, the movable table 5, and the sample measurement surface B can be coplanar.

【0023】上述した構成の本発明のX線回折装置用試
料ホルダを用いた試料の固定方法を以下に説明する。図
3に示すように、試料Aが固体の場合を説明する。ま
ず、ナット8を緩めてロッド4の自由端側に可動台5を
位置させて固定台1と可動台5それぞれの試料挟持面
2,7間を所定間隔あけ、本発明の試料ホルダを平坦な
台の上に載置する。続いて、試料Aは両試料挟持面2,
7間に、その試料測定面Bが平坦な台に接する向きで載
置される。そして、ナット8をロッド4にねじ込んで、
ナット8に設けられたテーパ面9の先端周縁を可動台5
の貫通孔6に圧入しながら試料Aを固定する。試料測定
時には、図3に示すように、試料測定面Bが上面になる
ように試料ホルダを裏返し、試料台22(図12参照)
に固定すればよい。
A method for fixing a sample using the sample holder for an X-ray diffraction apparatus of the present invention having the above-described structure will be described below. The case where the sample A is a solid as shown in FIG. 3 will be described. First, the nut 8 is loosened, the movable table 5 is positioned on the free end side of the rod 4, and a predetermined interval is provided between the sample holding surfaces 2 and 7 of the fixed table 1 and the movable table 5, respectively. Place on a table. Subsequently, the sample A is placed on both sample holding surfaces 2,
Between 7, the sample measurement surface B is placed so as to be in contact with the flat table. Then, screw the nut 8 into the rod 4,
The periphery of the distal end of the tapered surface 9 provided on the nut 8 is
The sample A is fixed while being press-fitted into the through hole 6 of FIG. At the time of sample measurement, as shown in FIG. 3, the sample holder is turned upside down so that the sample measurement surface B is on the upper surface, and the sample table 22 (see FIG. 12).
Should be fixed to.

【0024】また、図4に示すように、試料挟持面2
(試料挟持面7も同様)に、凹凸を設け摩擦面10を設
けてもよい。このように摩擦面10を設けると、試料A
と試料挟持面2,7の間に摩擦が生じるため、試料Aを
より確実に固定できる。このとき、摩擦面10は、試料
挟持面2,7に直接加工してもよいし、フェルト等の布
およびゴムを試料挟持面2,7に貼り付けてもよい。
Further, as shown in FIG.
Irregularities may be provided on the sample holding surface 7 (similarly), and the friction surface 10 may be provided. When the friction surface 10 is provided in this manner, the sample A
The friction between the sample holding surfaces 2 and 7 causes the sample A to be fixed more reliably. At this time, the friction surface 10 may be directly processed on the sample holding surfaces 2 and 7, or a cloth such as felt or rubber may be attached to the sample holding surfaces 2 and 7.

【0025】図5に示す試料ホルダは、試料挟持面2,
7に切込を入れ係止溝11を形成したものである。この
ように試料挟持面2,7に係止溝11を施すことによっ
て、係止溝11に試料Aの一部分が係止されるので、試
料Aをより確実に固定できる。
The sample holder shown in FIG.
A notch 7 is formed to form a locking groove 11. By providing the locking grooves 11 on the sample holding surfaces 2 and 7 as described above, a part of the sample A is locked in the locking grooves 11, so that the sample A can be more securely fixed.

【0026】図6に示すのは、試料挟持面2,7の面積
をより大きくするために、固定台1および可動台5に係
止壁12を設けるものである。係止壁12を設けること
によって、試料Aと試料挟持面2,7との接触面が増加
するので多少厚みのある試料Aの保持も確実になされ
る。試料Aを測定する場合には、図6に示すような向き
で試料ホルダを平坦な台の上に載置し、試料Aの試料測
定面Bが平坦な台に接触する向きに試料挟持面2,7の
間に試料Aを載置し、ナット8をねじ込む。試料測定時
には、試料測定面Bが上面になるように試料ホルダを裏
返し、試料台22(図12参照)に固定すればよい。
FIG. 6 shows a structure in which a locking wall 12 is provided on the fixed base 1 and the movable base 5 in order to increase the area of the sample holding surfaces 2 and 7. By providing the locking wall 12, the contact surface between the sample A and the sample holding surfaces 2 and 7 increases, so that the sample A having a somewhat thick thickness can be reliably held. When measuring the sample A, the sample holder is placed on a flat table in the direction shown in FIG. 6, and the sample holding surface 2 is set so that the sample measurement surface B of the sample A contacts the flat table. , 7 are mounted, and nut 8 is screwed. At the time of sample measurement, the sample holder may be turned upside down so that the sample measurement surface B is the upper surface, and fixed to the sample table 22 (see FIG. 12).

【0027】また、図7に示す試料ホルダは、固定台1
の試料挟持面2にロッド4に平行に係合片13を突出し
て設け、該係合片13の内側にガイド溝14を施し、該
ガイド溝14に対応させて可動台5の側面に溝係合部1
5を施している。このような試料ホルダとした場合に
は、可動台5の溝係合部15は固定台1のガイド溝14
に係止されるため、常に、固定台1と可動台5は同一平
面となる。このため、このような構成の試料ホルダとし
た場合には、ナット8にテーパ面を設けなくてもよい。
The sample holder shown in FIG.
An engaging piece 13 is provided on the sample holding surface 2 so as to protrude in parallel with the rod 4, a guide groove 14 is formed inside the engaging piece 13, and a groove is formed on a side surface of the movable base 5 corresponding to the guide groove 14. Joint 1
5 is given. In the case of such a sample holder, the groove engaging portion 15 of the movable table 5 is
, The fixed table 1 and the movable table 5 are always on the same plane. Therefore, when the sample holder having such a configuration is used, the nut 8 does not need to be provided with a tapered surface.

【0028】続いて、微粉体の試料Aを固定する場合を
説明する。まず図8に基づいて、微粉体の試料Aを固定
するための粘着固定体16について説明する。粘着固定
体16は、試料Aを固定する粘着部材17と該粘着部材
17を保持するための箱体18とで構成されている。箱
体18の側面の高さは、図9に示すように、固定台1お
よび可動台5の試料挟持面2,7の高さと同一に形成さ
れ、箱体18の内部には粘着部材17が充填される。
Next, the case where the fine powder sample A is fixed will be described. First, the adhesive fixing body 16 for fixing the fine powder sample A will be described with reference to FIG. The adhesive fixing body 16 includes an adhesive member 17 for fixing the sample A and a box 18 for holding the adhesive member 17. As shown in FIG. 9, the height of the side surface of the box 18 is formed to be the same as the height of the sample holding surfaces 2 and 7 of the fixed table 1 and the movable table 5, and an adhesive member 17 is provided inside the box 18. Will be filled.

【0029】上述の粘着固定体16に試料Aを固定する
場合には、粘着部材17上に試料Aを適量載せ、平らな
へら等で上方から試料Aを押えつければよい。このとき
箱体18の側面の高さを試料挟持面2,7に等しく形成
しているので、へら等によって押えつけられた試料A
は、固定台1および可動台5と同一平面となる。このう
に試料Aを粘着部材17上に載せ、さらに、平らなへら
等で上方から試料Aを押えつければよいので、試料Aが
微量であっても固定可能である。さらに、試料Aの粒径
が大きい場合も粘着部材17にへら等で押えつければよ
いので固定可能である。したがって、あらゆる粉体の試
料Aを粘着固定体16に固定することができる。
When the sample A is fixed to the above-mentioned adhesive fixing body 16, an appropriate amount of the sample A may be placed on the adhesive member 17, and the sample A may be pressed from above with a flat spatula or the like. At this time, since the height of the side surface of the box 18 is formed equal to the sample holding surfaces 2 and 7, the sample A pressed by a spatula or the like is used.
Is on the same plane as the fixed base 1 and the movable base 5. Thus, the sample A can be placed on the adhesive member 17 and pressed down from above with a flat spatula or the like, so that even a small amount of the sample A can be fixed. Further, even when the particle size of the sample A is large, the sample A can be fixed by pressing the adhesive member 17 with a spatula or the like. Therefore, any powder sample A can be fixed to the adhesive fixing body 16.

【0030】上面に粉体の試料Aが固定されている粘着
固定体16を本発明のX線回折装置用試料ホルダに固定
する場合を以下に説明する。まず、ナット8を緩めてロ
ッド4の自由端側に可動台5を位置させて固定台1と可
動台5それぞれの試料挟持面2,7間を所定間隔あけ、
本発明の試料ホルダを平坦な台の上に載置する。続い
て、図9に示すように、試料Aが固定されている面を上
方にして粘着固定体16を試料挟持面2,7の間に載置
し、さらに、ナット8をロッド4にねじ込んで、ナット
8に設けられたテーパ面9の先端周縁を可動台5の貫通
孔6に圧入しながら粘着固定体16を固定する。
The case where the adhesive fixed body 16 having the powder sample A fixed on the upper surface thereof is fixed to the sample holder for the X-ray diffraction apparatus of the present invention will be described below. First, the nut 8 is loosened, the movable table 5 is positioned on the free end side of the rod 4, and a predetermined interval is provided between the sample holding surfaces 2 and 7 of the fixed table 1 and the movable table 5, respectively.
The sample holder of the present invention is placed on a flat table. Subsequently, as shown in FIG. 9, the adhesive fixing body 16 is placed between the sample holding surfaces 2 and 7 with the surface on which the sample A is fixed facing upward, and the nut 8 is screwed into the rod 4. Then, the pressure-sensitive adhesive fixing body 16 is fixed while the peripheral edge of the tip end of the tapered surface 9 provided on the nut 8 is pressed into the through hole 6 of the movable base 5.

【0031】このとき、粘着固定体16の大きさは、本
発明のX線回折装置用試料ホルダの試料挟持面2,7の
間に納まり、かつ、X線回折装置のX線照射面積より十
分大きいことが望ましく、さらに、粘着固定体16の高
さは、試料挟持面2,7に等しく形成する。このように
試料固定体16の高さと試料挟持面2,7の高さを等し
くすることで試料固定体16の上面および試料ホルダの
上面を同一平面にすることができる。試作品としての粘
着固定体16は、その底面が15mm×15mm、高さ
2mm(本発明のX線回折装置用試料ホルダの試料挟持
面2,7の厚さを2mmとした)とした。
At this time, the size of the adhesive fixing body 16 is set between the sample holding surfaces 2 and 7 of the sample holder for the X-ray diffraction device of the present invention, and is sufficiently larger than the X-ray irradiation area of the X-ray diffraction device. It is preferable that the height is large, and the height of the adhesive fixing body 16 is formed equal to the sample holding surfaces 2 and 7. By making the height of the sample fixing body 16 equal to the height of the sample holding surfaces 2 and 7 in this manner, the upper surface of the sample fixing body 16 and the upper surface of the sample holder can be made the same plane. The adhesive fixed body 16 as a prototype had a bottom surface of 15 mm × 15 mm and a height of 2 mm (the thickness of the sample holding surfaces 2 and 7 of the sample holder for the X-ray diffraction apparatus of the present invention was 2 mm).

【0032】さらに、粘着固定体16の箱体18を安価
な樹脂等で作製し、あらかじめ粘着部材17をそれぞれ
充填しておくと、使い捨て可能な粘着固定体16として
使用できる。このとき、粘着部材17の粘着力を維持す
るために、図10に示すように、あらかじめ樹脂等をコ
ーティングした紙19で粘着部材17を覆って保管して
おくと、粘着固定体16を随時使用可能なため、箱体1
8への粘着部材17の充填作業を省略できるので、試料
Aの固定作業は一層簡略化され、X線回折装置による試
料Aの測定前後の作業が容易になる。
Further, when the box 18 of the adhesive fixing body 16 is made of inexpensive resin or the like and is filled with the adhesive members 17 in advance, the disposable adhesive fixing body 16 can be used. At this time, as shown in FIG. 10, if the adhesive member 17 is kept covered with paper 19 coated with resin or the like in advance to maintain the adhesive strength of the adhesive member 17, the adhesive fixing body 16 can be used as needed. Box 1 for possible
Since the work of filling the adhesive member 17 into the sample 8 can be omitted, the work of fixing the sample A is further simplified, and the work before and after the measurement of the sample A by the X-ray diffractometer becomes easy.

【0033】また、図11に示すように、粘着固定体1
6の箱体18の底面に、箱体18の底面より大きな保持
板20を固定してもよい。粘着固定体16は、上述のよ
うにその底面が15mm×15mm、高さが2mm程度
の大きさであるから、保持板20を箱体18に固定する
ことによって取扱易くなり、X線回折装置用試料ホルダ
への固定が容易になる。このとき、試料AとX線回折装
置用試料ホルダの上面が同一平面となるように、保持板
20を含む粘着固定体16の高さを試料挟持面2,7と
同一になるように形成する(図11参照)。
Further, as shown in FIG.
A holding plate 20 larger than the bottom surface of the box 18 may be fixed to the bottom surface of the box 18 of FIG. Since the adhesive fixed body 16 has a bottom surface of 15 mm × 15 mm and a height of about 2 mm as described above, it becomes easy to handle by fixing the holding plate 20 to the box 18. Fixing to the sample holder becomes easy. At this time, the height of the adhesive fixing body 16 including the holding plate 20 is formed to be the same as the sample holding surfaces 2 and 7 so that the upper surfaces of the sample A and the sample holder for the X-ray diffraction apparatus are flush with each other. (See FIG. 11).

【0034】さらに粘着固定体16の箱体18の側面
に、凹凸を設け摩擦面を形成してもよい。このように摩
擦面を設けると、箱体18と試料挟持面2,7の間に摩
擦が生じるため、粘着固定体16をより確実に固定でき
る。このとき、摩擦面は、箱体18の側面に直接凹凸加
工してもよいし、フェルト等の布およびゴムを貼り付け
てもよい。
Further, a friction surface may be formed by providing irregularities on the side surface of the box 18 of the adhesive fixing body 16. When the friction surface is provided in this manner, friction occurs between the box body 18 and the sample holding surfaces 2 and 7, so that the adhesive fixing body 16 can be more reliably fixed. At this time, the friction surface may be formed by directly embossing the side surface of the box 18, or may be a cloth such as felt or a rubber.

【0035】粘着固定体16の粘着部材17は、測定の
際に試料Aで回折したX線を検出するため、非晶質
(例:トンボ鉛筆(株)製スティックのり 商品名:ピ
ットアートグレート)のものを使用することが望ましい
が、ブランク測定を行う場合には非晶質でなくてもよ
い。さらに粘着固定体16を繰り返し使用する場合に
は、粘着部材17は、常温では流動せずに溶媒に解かし
たり過熱することによって容易に箱体18から除去でき
る性質のものが望ましい。このような粘着部材17とし
て、前述のスティックのりを含むのり状物の他、α−ゲ
ル、光架橋PVAゲル、寒天およびゼリーなどが使用可
能である。
The adhesive member 17 of the adhesive fixing body 16 is amorphous (for example, stick glue manufactured by Tombo Pencil Co., Ltd., product name: Pit Art Great) in order to detect X-rays diffracted by the sample A during measurement. Although it is desirable to use a non-amorphous material, it is not necessary to be amorphous when performing a blank measurement. Further, when the adhesive fixing body 16 is used repeatedly, it is desirable that the adhesive member 17 has such a property that the adhesive member 17 does not flow at room temperature but can be easily removed from the box 18 by being dissolved in a solvent or overheated. As such an adhesive member 17, in addition to the above-mentioned glue-like material including the stick glue, α-gel, photo-crosslinked PVA gel, agar, jelly, and the like can be used.

【0036】[0036]

【発明の効果】以上説明したように、請求項1に記載の
発明によれば、試料ホルダは、別体である固定台と可動
台とを主構成とし、両台の間に試料を保持させるため、
種々の大きさおよび形状の試料を試料挟持面の間に挟持
することができる。また、試料が粉体の場合でも、固定
台と可動台の試料挟持面およびロッドで区画される部分
に、粘土などを使用して試料を保持することができる。
したがって、試料の大きさ等の制限が緩和されたため試
料ホルダへの試料の固定が容易になる。固体の試料を固
定する場合には、さらに、切断等の加工を不要にしたの
で、煩雑な作業を省略できる。また、ナットにより試料
を確実に固定することができるので、試料測定中に試料
測定面がずれない。
As described above, according to the first aspect of the present invention, the sample holder mainly includes the fixed table and the movable table which are separate bodies, and holds the sample between the two tables. For,
Samples of various sizes and shapes can be held between the sample holding surfaces. Further, even when the sample is a powder, the sample can be held by using clay or the like at the portion defined by the sample holding surfaces of the fixed base and the movable base and the rod.
Therefore, since the restriction on the size of the sample is relaxed, the sample can be easily fixed to the sample holder. In the case of fixing a solid sample, since a process such as cutting is not required, a complicated operation can be omitted. In addition, since the sample can be securely fixed by the nut, the sample measurement surface does not shift during the sample measurement.

【0037】請求項2に記載の発明によれば、ナットに
テーパ面を形成したことから、テーパ面の先端周縁が可
動台の貫通孔に圧入するので、ロッドと貫通孔とのずれ
をなくして可動台を安定した位置に保持できるので、固
定台、可動台および試料測定面を容易に同一平面とする
ことができる。
According to the second aspect of the present invention, since the tapered surface is formed on the nut, the peripheral edge of the tapered surface is press-fitted into the through hole of the movable base, so that the displacement between the rod and the through hole is eliminated. Since the movable table can be held at a stable position, the fixed table, the movable table, and the sample measurement surface can be easily coplanar.

【0038】請求項3に記載の発明によれば、テーパ面
を形成すると、該テーパ面が可動台に圧入するため可動
台の垂直・水平方向のずれを抑制するので、試料を平坦
な台の上に試料挟持面を下方に載置してナットをねじ込
みながら固定するだけで試料を確実に固定できる。
According to the third aspect of the present invention, when the tapered surface is formed, the tapered surface is pressed into the movable table, thereby suppressing the vertical and horizontal displacement of the movable table. The sample can be reliably fixed only by placing the sample holding surface on the upper side and fixing the screw while screwing the nut.

【0039】請求項4に記載の発明によれば、試料挟持
面の高さと等しい側面の高さの箱体に粘着部材を充填し
て、粘着部材の表面に試料を固定させれば、試料Aが粉
体である場合も、試料ホルダに固定することができる。
さらに、試料挟持面の高さに箱体の高さを対応させてい
るので、試料Aを粘着部材に押圧することにより試料ホ
ルダの上面と試料Aを同一平面にせしめることができる
ので、測定前の試料固定作業が容易になる。
According to the fourth aspect of the present invention, if the adhesive member is filled in a box having a side surface height equal to the height of the sample holding surface and the sample is fixed on the surface of the adhesive member, the sample A Is also a powder, it can be fixed to the sample holder.
Furthermore, since the height of the box corresponds to the height of the sample holding surface, the upper surface of the sample holder and the sample A can be made flush with each other by pressing the sample A against the adhesive member. Sample fixing work becomes easy.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例のX線回折装置用試料ホルダ
の構造を示す斜視図である。
FIG. 1 is a perspective view showing a structure of a sample holder for an X-ray diffraction apparatus according to one embodiment of the present invention.

【図2】図1に示す試料ホルダのナットの構造を示す斜
視図である。
FIG. 2 is a perspective view showing a structure of a nut of the sample holder shown in FIG.

【図3】試料を固定した図1に示す試料ホルダを示す斜
視図である。
FIG. 3 is a perspective view showing the sample holder shown in FIG. 1 to which a sample is fixed.

【図4】試料挟持面に摩擦面を付した試料ホルダを示す
斜視図である。
FIG. 4 is a perspective view showing a sample holder in which a friction surface is provided on a sample holding surface.

【図5】試料挟持面に係止溝を設けた試料ホルダを示す
斜視図である。
FIG. 5 is a perspective view showing a sample holder in which a locking groove is provided on a sample holding surface.

【図6】試料挟持面に係止壁を設けた試料ホルダを示す
斜視図である。
FIG. 6 is a perspective view showing a sample holder in which a locking wall is provided on a sample holding surface.

【図7】図1とは異なる試料ホルダの構造を示す斜視図
である。
FIG. 7 is a perspective view showing a structure of a sample holder different from FIG.

【図8】粉体の試料を測定する際に使用する粘着固定体
の構造を示す斜視図である。
FIG. 8 is a perspective view showing a structure of an adhesive fixing body used when measuring a powder sample.

【図9】図1に示す試料ホルダへの粘着固定体の固定方
法を説明するための斜視図である。
FIG. 9 is a perspective view for explaining a method of fixing the adhesive fixing body to the sample holder shown in FIG.

【図10】粘着固定体の保管方法を説明するための断面
図である。
FIG. 10 is a cross-sectional view for explaining a method for storing an adhesive fixed body.

【図11】図8とは異なる粘着固定体の構造を示す断面
図である。
FIG. 11 is a cross-sectional view showing a structure of an adhesive fixing body different from FIG.

【図12】X線回折装置の構造を示す概略図である。FIG. 12 is a schematic view showing the structure of an X-ray diffraction device.

【図13】従来の試料ホルダの構造を示す斜視図であ
る。
FIG. 13 is a perspective view showing the structure of a conventional sample holder.

【図14】従来の試料ホルダに固体の試料を固定する説
明をするための図である。
FIG. 14 is a view for explaining fixing a solid sample to a conventional sample holder.

【図15】固体の試料を固定した従来の試料ホルダを示
す斜視図である。
FIG. 15 is a perspective view showing a conventional sample holder to which a solid sample is fixed.

【図16】図13に示す従来の試料ホルダとは異なる構
造の試料ホルダの構造を示す断面図である。
FIG. 16 is a cross-sectional view showing a structure of a sample holder having a structure different from that of the conventional sample holder shown in FIG.

【図17】粉体の試料を固定した図16の試料ホルダを
示す断面図である。
FIG. 17 is a cross-sectional view showing the sample holder of FIG. 16 to which a powder sample is fixed.

【図18】図17とは異なる方法で試料を固定した図1
6の試料ホルダを示す断面図である。
FIG. 18 shows a state in which a sample is fixed by a method different from that in FIG. 17;
It is sectional drawing which shows the sample holder of No. 6.

【符号の説明】[Explanation of symbols]

1 固定台 2 試料挟持面 3 ねじ溝 4 ロッド 5 可動台 7 試料挟持面 8 ナット 9 テーパ面 16 粘着固定体 17 粘着部材 18 箱体 DESCRIPTION OF SYMBOLS 1 Fixed table 2 Sample holding surface 3 Screw groove 4 Rod 5 Movable table 7 Sample holding surface 8 Nut 9 Tapered surface 16 Adhesive fixed body 17 Adhesive member 18 Box

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 試料挟持面をそれぞれ備えた固定台と可
動台とからなり、ねじ溝を有する複数本のロッドを固定
台の試料挟持面に所定距離をおいて突出するように固定
し、前記可動台の試料挟持面を固定台の試料挟持面に対
向するように前記可動台を前記ロッドに挿通し、前記ロ
ッドに螺合されるナットを有することを特徴とするX線
回折装置用試料ホルダ。
1. A fixed table comprising a sample holding surface and a movable table each having a sample holding surface, and a plurality of rods having screw grooves are fixed so as to protrude at a predetermined distance from the sample holding surface of the fixed table, and A sample holder for an X-ray diffractometer, comprising a nut inserted into the rod so that the sample holding surface of the movable table faces the sample holding surface of the fixed table and screwed to the rod. .
【請求項2】 前記ナットの端面は、前記可動台に圧入
するようにテーパ面に形成されることを特徴とする請求
項1記載のX線回折装置用試料ホルダ。
2. The sample holder for an X-ray diffraction apparatus according to claim 1, wherein an end face of said nut is formed in a tapered surface so as to press-fit said movable table.
【請求項3】 固定台の試料挟持面に設けられたロッド
を可動台の試料挟持面に対向するように挿通して平坦な
台の上に載置し、次に固定台および可動台の試料挟持面
の間に試料を載置し、続いてナットをロッドにねじ込ん
で、ナットに設けられたテーパ面の先端を可動台に圧入
するようにナットを締めることを特徴とする試料固定方
法。
3. A rod provided on a sample holding surface of a fixed table is inserted into the movable table so as to face the sample holding surface of the movable table, and is placed on a flat table. A method for fixing a sample, comprising mounting a sample between clamping surfaces, then screwing the nut into a rod, and tightening the nut so that the tip of a tapered surface provided on the nut is pressed into a movable table.
【請求項4】 前記試料は、側面の高さが前記試料挟持
面に等しい箱体内に、粘着部材を充填した粘着固定体に
固定されていることを特徴とする請求項3記載の試料固
定方法。
4. The sample fixing method according to claim 3, wherein the sample is fixed to an adhesive fixed body filled with an adhesive member in a box body having a side surface height equal to the sample holding surface. .
JP9079762A 1996-08-21 1997-03-31 Sample holder for x-ray diffratometer and sample fixation method Pending JPH10115596A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9079762A JPH10115596A (en) 1996-08-21 1997-03-31 Sample holder for x-ray diffratometer and sample fixation method

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP8-219735 1996-08-21
JP21973596 1996-08-21
JP9079762A JPH10115596A (en) 1996-08-21 1997-03-31 Sample holder for x-ray diffratometer and sample fixation method

Publications (1)

Publication Number Publication Date
JPH10115596A true JPH10115596A (en) 1998-05-06

Family

ID=26420756

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9079762A Pending JPH10115596A (en) 1996-08-21 1997-03-31 Sample holder for x-ray diffratometer and sample fixation method

Country Status (1)

Country Link
JP (1) JPH10115596A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002139462A (en) * 2000-10-31 2002-05-17 Shimadzu Corp X-ray diffraction device
JP2009210538A (en) * 2008-03-06 2009-09-17 Fujitsu Ltd Sample for x-ray evaluation, and preparing method therefor
KR101009899B1 (en) * 2008-10-28 2011-01-20 현대제철 주식회사 A holder apparatus for specimen in scanning elctron microscope
KR101042505B1 (en) * 2008-11-27 2011-06-16 현대제철 주식회사 A holder apparatus for specimen in scanning elctron microscope
WO2011149162A1 (en) * 2010-05-27 2011-12-01 한국식품연구원 Dedicated powder-sample holder for terahertz spectroscopy/imaging measurement
KR101095208B1 (en) * 2010-05-27 2011-12-16 고려대학교 산학협력단 Flexible device test jig for scanning electron microscopy
KR101100493B1 (en) 2009-06-26 2011-12-29 현대제철 주식회사 A holder apparatus for specimen in scanning elctron microscope
KR101349177B1 (en) * 2011-12-13 2014-01-08 한국기계연구원 A height adjustable sample holder
JP2018066652A (en) * 2016-10-19 2018-04-26 住友金属鉱山株式会社 Analytical method of powder sample
JP2018091834A (en) * 2016-11-04 2018-06-14 ソニックス・インコーポレイテッドSonix, Inc. Adjustment type fixture and method for using adjustment type fixture

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002139462A (en) * 2000-10-31 2002-05-17 Shimadzu Corp X-ray diffraction device
JP2009210538A (en) * 2008-03-06 2009-09-17 Fujitsu Ltd Sample for x-ray evaluation, and preparing method therefor
KR101009899B1 (en) * 2008-10-28 2011-01-20 현대제철 주식회사 A holder apparatus for specimen in scanning elctron microscope
KR101042505B1 (en) * 2008-11-27 2011-06-16 현대제철 주식회사 A holder apparatus for specimen in scanning elctron microscope
KR101100493B1 (en) 2009-06-26 2011-12-29 현대제철 주식회사 A holder apparatus for specimen in scanning elctron microscope
WO2011149162A1 (en) * 2010-05-27 2011-12-01 한국식품연구원 Dedicated powder-sample holder for terahertz spectroscopy/imaging measurement
KR101095208B1 (en) * 2010-05-27 2011-12-16 고려대학교 산학협력단 Flexible device test jig for scanning electron microscopy
KR101168040B1 (en) 2010-05-27 2012-07-27 한국식품연구원 A powder sample holder for terahertz spectroscopic and imaging system
KR101349177B1 (en) * 2011-12-13 2014-01-08 한국기계연구원 A height adjustable sample holder
JP2018066652A (en) * 2016-10-19 2018-04-26 住友金属鉱山株式会社 Analytical method of powder sample
JP2018091834A (en) * 2016-11-04 2018-06-14 ソニックス・インコーポレイテッドSonix, Inc. Adjustment type fixture and method for using adjustment type fixture

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