JPH0961459A - Probe pin - Google Patents

Abstract

PROBLEM TO BE SOLVED: To attain a sure contact even when a material to be brought into contact is deviated by forming a probe head in contact with the electrode of a circuit board in a rectangular shape having a plurality of pointed parts. SOLUTION: A probe pin head 1A of a rectangular shape having a plurality of pointed parts to be brought into contact with the electrodes of a circuit board to introduce the potential of the board is mounted at a housing 4A, and extended only in one direction from the center of the shaft of the housing 4A. Accordingly, at the corner of the board or the corner of a metal case having an edge at the inside, the head 1A can be connected in contact with the land of the board. Further, a protrusion 4B is axially provided in the housing 4A, and a guide groove 3 is provided axially even in a plunger 2A. The housing 4A and the plunger 2A slide, and the protrusion 4B and the groove 3 slide. Thus, the position of the housing 4A and the direction of the head 1A are designated and can be positioned.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a probe pin, and more particularly to a probe pin having a wide range of contact surfaces for use in a testing machine for conducting an electrical adjustment test or an inspection machine for conducting an electrical inspection.

[0002]

2. Description of the Related Art Conventional probe pins (for example, US Q
A probe pin manufactured by A Technology Co., Ltd.) is composed of a probe head having a contact surface as shown in FIG. 2, a cylindrical plunger, and a housing. Next, the operation will be described. In many conventional probe pins, for example, a printed board has a circular contact portion corresponding to a solder electrode. An object to be contacted (for example, a pattern of a printed circuit board) hits the contact portion, and the plunger is pushed into the housing. At this time, a repulsive force acts on the plunger and an appropriate pressure is applied to the contact portion. This type of probe pin is, for example, a probe manufactured by US QA Technology Co., Ltd., which is 100-PLP25 series or 100.
-There are products commercially available under the trade name of PRP25 series and the like.

[0003]

In the conventional probe pin, it was difficult to obtain contact when the contacted object (for example, the land of the printed wiring board) on the printed board was deviated by several mm.

Therefore, it suffices to determine the size of the contact surface of the head of the probe pin, including the tolerance of the printed board and its mounting. In that case, the size of the probe corresponds to the electrode of the printed board. The size of the probe pin may be set with a margin between the size and the above-mentioned tolerance of the printed board and its mounting.

The probe pin must come into contact with the electrode (in this case, called "land") portion on the printed board, but if the size of the pin head is adapted to the above-mentioned conditions, the pin head is required. The problem is that the size of the

[0006]

A probe pin according to a first aspect of the present invention is a probe pin used in at least a circuit board tester, and comprises a plurality of probe pins that come into contact with electrodes of the circuit board and guide the potential of the circuit board. A rectangular probe pin head having a pointed portion; and a housing that accommodates a plunger that supports the probe pin head in a direction opposite to the pointed portion, and comprises a housing that slides on the surface of the plunger, the housing and the plunger. Are concentrically formed, and are provided with unevenness that is slidable in the axial direction.

A second aspect of the present invention is the first aspect of the present invention, which is provided with a rectangular probe pin head having a plurality of pyramidal portions which come into contact with the electrodes of the circuit board to guide the potential of the circuit board. It

[0008]

BEST MODE FOR CARRYING OUT THE INVENTION Next, the present invention will be described with reference to the drawings.

FIG. 1 is an explanatory diagram showing the configuration of an embodiment of the present invention.

First, in one embodiment of the electrodes of the printed board,
The probe pin head 1A is attached to a housing 4A holding the probe pin head 1A and extends only in one direction from the center of the axis of the housing 4A. Therefore, the probe pin head 1A can be brought into contact with and connect to the land of the printed circuit board, whether it is a corner of the printed circuit board or a corner of a metal case having an inner edge. is there. Further, the housing 4A is provided with a projecting portion 4B in the axial direction so that the housing 4A and the plunger 2A rotate coaxially, and the plunger 2A is also provided with a guide groove 3 in the axial direction so that the housing 4A and the plunger 2A slide. At the same time, the protrusion 4B and the guide groove 3 slide.

With such a structure, the probe pin head 1 protruding in a direction perpendicular to the axis of the probe pin.
The protruding portion of A is fixed to the plunger 2A, and the plunger 2A
Since it is configured to be movable and slidable with respect to the housing 4A, the position of the probe pin is determined by specifying the position of the housing 4A and the azimuth of the probe pin head 1A and determining the position.

[0012]

As described above, according to the present invention, the shape of the probe pin head is changed to extend in one direction with respect to the contact surface, and the plunger and the housing are provided with guides in the axial direction so that the object to be contacted can be contacted. It has the result that a contact can be easily obtained even when there is a positional deviation.

[Brief description of drawings]

FIG. 1 is an explanatory diagram showing a configuration of an embodiment of the present invention.

FIG. 2 is an explanatory diagram showing an example of a configuration of a probe pin according to a conventional technique.

[Explanation of symbols]

 1A Probe pin head 1B Probe pin head 2A Plunger 2B Plunger 3 Guide groove 4A Housing 4B Housing

Claims (2)

[Claims] 1. A probe pin used for at least a circuit board test, comprising: a rectangular probe pin head having a plurality of pointed portions that are in contact with electrodes of the circuit board to guide the potential of the circuit board; and a longitudinal direction of the probe pin head. In an eccentric position,
A probe pin, comprising: a plunger provided with a guide groove in the axial direction, and a housing provided with a protrusion on an inner side corresponding to the guide groove of the plunger and allowing the plunger to slide. 2. A rectangular probe pin head having a plurality of pyramid-shaped portions that are in contact with the electrodes of the circuit board and guide the potential of the circuit board.
The indicated probe pin.