JPH09260585A - Flat-type semiconductor device - Google Patents

Flat-type semiconductor device

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Publication number
JPH09260585A
JPH09260585A JP6754796A JP6754796A JPH09260585A JP H09260585 A JPH09260585 A JP H09260585A JP 6754796 A JP6754796 A JP 6754796A JP 6754796 A JP6754796 A JP 6754796A JP H09260585 A JPH09260585 A JP H09260585A
Authority
JP
Japan
Prior art keywords
semiconductor device
plate
flat
flat semiconductor
semiconductor element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6754796A
Other languages
Japanese (ja)
Inventor
Tadashi Hebinuma
匡 蛇沼
Izumi Azuma
泉 東
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP6754796A priority Critical patent/JPH09260585A/en
Publication of JPH09260585A publication Critical patent/JPH09260585A/en
Pending legal-status Critical Current

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  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a flat-type semiconductor device which enables an electric power control device including a cooling device to be reduced in size and weight by reducing the thermal resistance between the semiconductor device and a coolant when a double-side cooling flat-type semiconductor is used in a circulating water cooling system. SOLUTION: A plate-like protrusion is provided to the one end of each of the electrode plates 4a and 4b of a flat-type semiconductor device 1 extending outwards beyond the periphery of an insulating ring 5 to serve as a current terminal 6. A usual current plate can be dispensed with, so that a thermal resistance between the current plate and a contact can be eliminated. As compared with a conventional one, a thermal resistance between the flat-type semiconductor device 1 and a coolant can be reduced by 25%. It is preferable that the current terminals 6 are set deviating from each other in position so as not to impede their connection with outer conductors.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、電鉄用車両の主回
路変換装置等に用いられ、大電流を制御する電力用の平
型半導体素子に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a flat semiconductor device for electric power, which is used in a main circuit conversion device for electric railway vehicles and which controls a large current.

【0002】[0002]

【従来の技術】図3は、従来の電力用の両面冷却型平型
半導体素子の断面図である。図において、平型半導体素
子1は、半導体素子チップ2を挟んで、その両側に伝熱
部材3と電極板4とが配置され、加圧接触するようにな
っている。電極板4の周辺はアルミナの絶縁環5に固着
され、半導体素子ケースが構成されている。伝熱部材3
はシリコンと熱膨張係数の近い、例えばモリブデンであ
り、電極板4は電気、熱伝導度の大きい、例えば銅であ
る。半導体素子チップ2で発生した損失熱は、熱伝導に
より伝熱部材3と電極部材4に伝えられ、電極部材4の
表面に接する両側の冷却体へと放熱される。半導体チッ
プ2の代わりに、タングステン等の耐熱金属板に合金し
た半導体エレメントを用いることもできる。なお、図で
は半導体チップ2を位置決めする手段等の詳細は省略さ
れている。
2. Description of the Related Art FIG. 3 is a sectional view of a conventional double-sided cooling type flat semiconductor device for electric power. In the figure, the flat semiconductor element 1 has a heat transfer member 3 and an electrode plate 4 arranged on both sides of the semiconductor element chip 2 so as to come into pressure contact with each other. The periphery of the electrode plate 4 is fixed to an insulating ring 5 of alumina to form a semiconductor element case. Heat transfer member 3
Is molybdenum, which has a thermal expansion coefficient close to that of silicon, and the electrode plate 4 is copper, which has high electric and thermal conductivity. The heat loss generated in the semiconductor element chip 2 is transferred to the heat transfer member 3 and the electrode member 4 by heat conduction, and is radiated to the cooling bodies on both sides in contact with the surface of the electrode member 4. Instead of the semiconductor chip 2, a semiconductor element alloyed with a heat-resistant metal plate such as tungsten may be used. In the figure, details such as means for positioning the semiconductor chip 2 are omitted.

【0003】平型半導体素子の冷却方法については、冷
却水(不凍液)を循環ポンプにより、半導体素子発熱面
に装着した冷却体の内部流路に循環させ、半導体素子を
冷却する循環水冷却方式がある。循環水冷却方式の冷却
水媒体は、冷却水(不凍液)を用いている。他の冷却方
式として、絶縁性冷媒(例えば、フロン液、或いはフッ
化炭素液)の液中に半導体素子と冷却体とを浸漬させ、
絶縁性冷媒の沸騰現象により半導体素子を冷却する浸漬
沸騰冷却方式があるが、環境問題の配慮から絶縁性冷媒
(例えば、フロン液、或いはフッ化炭素液)の使用を規
制するという動きに対応して、循環水冷却方式を用いる
ことが多くなっている。
As a cooling method for a flat semiconductor element, there is a circulating water cooling method in which a cooling water (antifreeze liquid) is circulated by a circulation pump in an internal flow path of a cooling body mounted on a heating surface of the semiconductor element to cool the semiconductor element. is there. Cooling water (antifreeze) is used as the cooling water medium in the circulating water cooling system. As another cooling method, the semiconductor element and the cooling body are dipped in a liquid of an insulating refrigerant (for example, CFC liquid or fluorocarbon liquid),
There is an immersion boiling cooling method that cools the semiconductor element by the boiling phenomenon of the insulating refrigerant, but in consideration of environmental issues, it corresponds to the movement to regulate the use of insulating refrigerant (for example, CFC liquid or fluorocarbon liquid). Therefore, the circulating water cooling method is often used.

【0004】図4は、図3の平型半導体素子を用いた循
環水冷却方式の構成を示す図である。平型半導体素子1
と冷却体8とが交互に複数個直列配置され、加圧して半
導体スタック11が構成される。14は加圧用の皿バ
ネ、15は均等加重するための鋼球である。その際に平
型半導体素子1は、非絶縁性の冷却水(不凍液)と電気
的に絶縁する必要があるため、平型半導体素子1と冷却
水21が通流する冷却体8との間には、平型半導体素子
1に通電するための通電板10および高熱伝導材料でで
きた絶縁板7が挟まれる。12、13はそれぞれ冷却水
の分配用、集合用ヘッダである。平型半導体素子1で発
生した損失熱は、平型半導体素子1から、通電板10お
よび絶縁板7を通して電気絶縁された冷却体8まで熱伝
導で伝わる。この熱を、冷却体8内の流路に循環ポンプ
19により冷却水(不凍液)21を循環させて強制対流
熱伝達により除熱する。そして、最終的に空冷放熱器1
6により、外気へと放熱を行うものである。17は電動
ファン、18は冷却空気、20は冷却水配管、22はタ
ンクである。
FIG. 4 is a diagram showing the structure of a circulating water cooling system using the flat semiconductor device of FIG. Flat semiconductor device 1
And a plurality of cooling bodies 8 are alternately arranged in series and pressurized to form the semiconductor stack 11. Reference numeral 14 is a disc spring for pressurization, and 15 is a steel ball for evenly weighting. At that time, since the flat semiconductor element 1 needs to be electrically insulated from the non-insulating cooling water (antifreeze liquid), it is between the flat semiconductor element 1 and the cooling body 8 through which the cooling water 21 flows. A sandwiched between an energizing plate 10 for energizing the flat semiconductor element 1 and an insulating plate 7 made of a highly heat conductive material. Reference numerals 12 and 13 are headers for distributing and collecting cooling water, respectively. The heat loss generated in the flat semiconductor element 1 is transferred by heat conduction from the flat semiconductor element 1 to the electrically insulated cooling body 8 through the current-carrying plate 10 and the insulating plate 7. This heat is removed by forced convection heat transfer by circulating the cooling water (antifreeze liquid) 21 by the circulation pump 19 in the flow path in the cooling body 8. And finally, the air-cooled radiator 1
6, heat is radiated to the outside air. Reference numeral 17 is an electric fan, 18 is cooling air, 20 is cooling water piping, and 22 is a tank.

【0005】[0005]

【発明が解決しようとする課題】図4に示した従来の平
型半導体素子を用いた上記構成の半導体スタックでは、
半導体素子と冷却体との間に絶縁板および通電板が存在
する。従って半導体素子と冷却体との間には、半導体素
子と通電板、通電板と絶縁板、絶縁板と冷却体と、三箇
所の接触部があり、それぞれの箇所で接触熱抵抗が介在
する。
In the semiconductor stack having the above-mentioned structure using the conventional flat semiconductor device shown in FIG.
An insulating plate and a conducting plate exist between the semiconductor element and the cooling body. Therefore, between the semiconductor element and the cooling body, there are three contact portions, that is, the semiconductor element and the conducting plate, the conducting plate and the insulating plate, the insulating plate and the cooling body, and the contact thermal resistance is interposed at each of the contact portions.

【0006】熱抵抗を実測したところ、一か所の接触部
における接触熱抵抗の値は約0.0014K/Wで、電
極板内部の熱伝導抵抗の値の2〜3倍に相当しており、
半導体素子と冷却体間の全体の熱抵抗0.0057K/
Wの約25%を占めていることがわかった。このような
大きな熱抵抗は、冷却体および空冷放熱器の大型化を招
くことになる。すなわち、電鉄用車両に搭載される主変
換装置等における、寸法の小型化および重量の軽量化と
いう課題に対して大きな障害となっている。
When the thermal resistance was measured, the value of the contact thermal resistance at one contact portion was about 0.0014 K / W, which corresponds to 2 to 3 times the value of the thermal conductive resistance inside the electrode plate. ,
Overall thermal resistance between semiconductor element and cooling body 0.0057K /
It was found that it occupies about 25% of W. Such a large thermal resistance leads to an increase in size of the cooling body and the air-cooling radiator. That is, it is a major obstacle to the problems of size reduction and weight reduction in the main conversion device mounted on the electric railway vehicle.

【0007】以上の問題に鑑みて、本発明の目的は、冷
却装置まで含めた組立状態での外形を小さくできる平型
半導体素子を提供することにある。
In view of the above problems, it is an object of the present invention to provide a flat semiconductor element which can be reduced in outer shape in an assembled state including a cooling device.

【0008】[0008]

【課題を解決するための手段】上記課題を解決するため
本発明は、セラミックの絶縁環に固着された二枚の金属
電極板をもち、収納された半導体エレメントの両面から
放熱する両面冷却型の平型半導体素子において、少なく
とも一方の電極板の一部がセラミックケースの外周より
外側に延長された板状突起を有し、その板状突起を主電
流端子とするものとする。
In order to solve the above problems, the present invention is a double-sided cooling type having two metal electrode plates fixed to a ceramic insulating ring and radiating heat from both sides of a semiconductor element housed therein. In the flat semiconductor element, at least one of the electrode plates has a plate-like protrusion extending outward from the outer periphery of the ceramic case, and the plate-like protrusion serves as a main current terminal.

【0009】また、両側の電極板の一部をセラミックケ
ースの外周より外側に延長した板状突起を有し、その板
状突起を主電流端子としてもよい。電力用平型半導体素
子の電極板を上記のように構成すれば、板状突起で、従
来の通電板を兼ねることができるので、半導体素子スタ
ックでの半導体素子と冷却体との間から通電板を削除で
きる。
Further, a part of the electrode plates on both sides may have a plate-like projection extending outward from the outer circumference of the ceramic case, and the plate-like projection may be used as a main current terminal. If the electrode plate of the flat type semiconductor element for electric power is configured as described above, the plate-shaped protrusion can also serve as the conventional energizing plate, so that the energizing plate is provided between the semiconductor element and the cooling body in the semiconductor element stack. Can be deleted.

【0010】特に、両側の電極板の延長部分の主電流端
子が対称的な位置、或いは互いに直角方向を向くなど、
位置がずらして設けられていることがよい。そのように
すれば、主電流端子が互いに干渉することなく、外部導
体との接続が容易である。更に、電極板の延長部分の主
電流端子に穴が設けられているものとする。
In particular, the main current terminals of the extension portions of the electrode plates on both sides are symmetrically positioned or face each other at right angles.
It is preferable that the positions are shifted. By doing so, the main current terminals do not interfere with each other and the connection with the external conductor is easy. Furthermore, it is assumed that a hole is provided in the main current terminal in the extended portion of the electrode plate.

【0011】そのようにすれば、外部導体との接続が容
易である。
By doing so, the connection with the external conductor is easy.

【0012】[0012]

【発明の実施の形態】図1(a)は、本発明の実施例の
平型半導体素子の断面図、図1(b)は図1(a)の平
型半導体素子を図の左側から見た外形図である。図1
(a)において、平型半導体素子1は、半導体素子チッ
プ2を挟んで、その両側に伝熱部材3と電極板4とが配
置され、加圧接触するようになっている。図の左側の電
極板4aの周辺にろう付けされた鉄−ニッケル合金の絞
り板25aは、アルミナの絶縁環5にろう付けされてい
る。図の右側の電極板4bの周辺にろう付けされた鉄−
ニッケル合金の絞り板25bと、アルミナの絶縁環5に
ろう付けされた鉄−ニッケル合金の溶接板26とは、縁
でアーク溶接されて、半導体素子ケースが構成されてい
る。伝熱部材3はシリコンと熱膨張係数の近いモリブデ
ンであり、電極板4は電気、熱伝導度の大きい銅であ
る。チップ2で発生した損失熱が、熱伝導により伝熱部
材3と電極板4に伝えられ、電極板4の表面に接する冷
却体へと放熱されるのは、図4の従来の平型素子と同じ
である。
1 (a) is a cross-sectional view of a flat semiconductor device according to an embodiment of the present invention, and FIG. 1 (b) is a plan view of the flat semiconductor device of FIG. 1 (a) viewed from the left side of the drawing. FIG. FIG.
In (a), the flat semiconductor element 1 has a heat transfer member 3 and an electrode plate 4 arranged on both sides of the semiconductor element chip 2 so as to come into pressure contact with each other. A diaphragm plate 25a of iron-nickel alloy brazed around the electrode plate 4a on the left side of the drawing is brazed to the insulating ring 5 of alumina. Iron brazed around the electrode plate 4b on the right side of the figure-
The diaphragm plate 25b made of nickel alloy and the welding plate 26 made of iron-nickel alloy brazed to the insulating ring 5 made of alumina are arc-welded at their edges to form a semiconductor element case. The heat transfer member 3 is molybdenum having a thermal expansion coefficient close to that of silicon, and the electrode plate 4 is copper having high electric and thermal conductivity. Loss heat generated in the chip 2 is transferred to the heat transfer member 3 and the electrode plate 4 by heat conduction, and is radiated to the cooling body in contact with the surface of the electrode plate 4 by the conventional flat element shown in FIG. Is the same.

【0013】図4の従来の平型半導体素子と異なる点
は、半導体素子1の両面にある電極部材4の一部を半導
体素子ケース5の外部より外側に延長させた板状突起を
設け、電流端子6としている点である。電流端子6の幅
と、厚さは、通電する電流容量、および接続されるブス
によって決められる。この例では、半導体素子の両面の
電極板4の電流端子6が、対称的な位置に設けられてい
る。
4 is different from the conventional flat type semiconductor device in that a plate-like projection is formed by extending a part of the electrode members 4 on both sides of the semiconductor device 1 from the outside of the semiconductor device case 5 to provide a current The point is that the terminal 6 is used. The width and thickness of the current terminal 6 are determined by the current capacity to be conducted and the bus to be connected. In this example, the current terminals 6 of the electrode plates 4 on both sides of the semiconductor element are provided at symmetrical positions.

【0014】図1(b)の外形図では、電極板4aの一
部に電流端子6が設けられている様子が見られる。そし
て、電流端子6には穴61が開けられている。電極板4
aの周囲には絞り板25aが見られ、その外側には、絶
縁環5が見える。図2は、本発明の平型半導体素子を用
いた半導体スタックの部分構成図である。半導体素子1
と冷却体8とが、窒化アルミニウムの絶縁板7を挟んで
密着されている。スタック11の端には、図4で示した
ように加圧のための皿バネや、均等加圧のための鋼球が
あるが、この図には示されていない。半導体素子1の電
極板から延びた電流端子6と通電用の外部導体23と
が、ボルトナット24で接続されている。9は冷却水で
ある。
In the external view of FIG. 1B, it can be seen that the current terminal 6 is provided on a part of the electrode plate 4a. A hole 61 is formed in the current terminal 6. Electrode plate 4
A diaphragm plate 25a can be seen around a, and the insulating ring 5 can be seen outside thereof. FIG. 2 is a partial configuration diagram of a semiconductor stack using the flat semiconductor device of the present invention. Semiconductor element 1
And the cooling body 8 are in close contact with each other with the aluminum nitride insulating plate 7 interposed therebetween. At the end of the stack 11, there are disc springs for pressurization and steel balls for uniform pressurization as shown in FIG. 4, but they are not shown in this figure. The current terminal 6 extending from the electrode plate of the semiconductor element 1 and the energizing outer conductor 23 are connected by a bolt nut 24. 9 is cooling water.

【0015】この例では、従来の半導体スタック構成に
比べて通電板が不要になり、半導体素子1と冷却体8の
間の接触部が一か所削除されている。そのため、半導体
素子1と冷却体8の間の熱抵抗が25%低下した。その
結果、同じ冷却条件で、通電電流を約10%増大させる
ことができた。逆に、同じ通電電流なら、循環水冷却方
式の冷却装置の小型化が可能になる。
In this example, a current-carrying plate is not required as compared with the conventional semiconductor stack structure, and one contact portion between the semiconductor element 1 and the cooling body 8 is deleted. Therefore, the thermal resistance between the semiconductor element 1 and the cooling body 8 decreased by 25%. As a result, the energizing current could be increased by about 10% under the same cooling conditions. On the contrary, if the same energizing current is applied, the cooling device of the circulating water cooling system can be downsized.

【0016】半導体素子の両側の電流端子の方向として
は、図1の実施例の他に、互いに直角方向を向くように
設ける方法や、或いは同じ方向だが位置をずらす方法な
ど、色々考えられる。また、角形の絶縁環をもつ平型半
導体素子の例を示したが、角形に限られるものではな
く、通常見られる円形の平型半導体素子にも適用できる
ことは勿論である。
As the direction of the current terminals on both sides of the semiconductor element, in addition to the embodiment of FIG. 1, various methods such as a method of providing them so as to face each other at right angles or a method of shifting the positions in the same direction can be considered. Further, although an example of the flat semiconductor element having a rectangular insulating ring has been shown, it is needless to say that the present invention is not limited to the square semiconductor element, and can be applied to a circular flat semiconductor element that is usually found.

【0017】[0017]

【発明の効果】以上説明したように、本発明の平型半導
体素子は、電極板の一部が絶縁環の外周より外側に延長
された板状突起を主電流端子とすることにより、冷却水
(不凍液)を用いた循環水冷却方式による半導体素子ス
タックの構成において、従来の平型半導体素子を用いた
半導体素子スタック構成の場合に比べ、半導体素子−冷
却体間の熱経路上の接触箇所を一か所削減でき、半導体
素子−冷却体間の熱抵抗を小さくできる。
As described above, in the flat semiconductor device of the present invention, the plate-shaped projection in which a part of the electrode plate is extended to the outside of the outer circumference of the insulating ring serves as the main current terminal. In the structure of the semiconductor element stack by the circulating water cooling method using (antifreeze liquid), compared with the case of the semiconductor element stack structure using the conventional flat semiconductor element, the contact point on the heat path between the semiconductor element and the cooling body is It can be reduced in one place, and the thermal resistance between the semiconductor element and the cooling body can be reduced.

【0018】その結果、冷却体および空冷放熱器の形状
を小さくでき、電鉄車両に搭載される主変換装置等の小
型化軽量化に貢献できる。
As a result, the shapes of the cooling body and the air-cooling radiator can be reduced, which contributes to the reduction in size and weight of the main conversion device mounted on the electric railway vehicle.

【図面の簡単な説明】[Brief description of drawings]

【図1】(a)は本発明の実施例の平型半導体素子の断
面図、(b)はその外形図
1A is a cross-sectional view of a flat semiconductor device according to an embodiment of the present invention, and FIG. 1B is an outline drawing thereof.

【図2】本発明の平型半導体素子を用いた半導体スタッ
クの部分構成図
FIG. 2 is a partial configuration diagram of a semiconductor stack using a flat semiconductor device of the present invention.

【図3】従来の平型半導体素子の断面図FIG. 3 is a sectional view of a conventional flat semiconductor device.

【図4】図3の平型半導体素子を用いた循環水冷却方式
の構成図
4 is a configuration diagram of a circulating water cooling system using the flat semiconductor device of FIG.

【符号の説明】[Explanation of symbols]

1 平型半導体素子 2 半導体チップ 3 伝熱部材 4 電極板 5 絶縁環 6 電流端子 61 穴 7 絶縁板 8 冷却体 9 冷却水の流れ 10 通電板 11 スタック 12 冷却水分配ヘッダー 13 冷却水集合ヘッダー 14 皿バネ 15 鋼球 16 空冷放熱器 17 電動ファン 18 冷却空気 19 循環ポンプ 20 液配管 21 冷却水 22 タンク 23 外部導体 24 ボルトナット DESCRIPTION OF SYMBOLS 1 Flat semiconductor element 2 Semiconductor chip 3 Heat transfer member 4 Electrode plate 5 Insulating ring 6 Current terminal 61 Hole 7 Insulating plate 8 Cooling body 9 Cooling water flow 10 Current-carrying plate 11 Stack 12 Cooling water distribution header 13 Cooling water collecting header 14 Belleville spring 15 Steel ball 16 Air-cooled radiator 17 Electric fan 18 Cooling air 19 Circulation pump 20 Liquid piping 21 Cooling water 22 Tank 23 Outer conductor 24 Bolt nut

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】セラミックの絶縁環に固着された二枚の金
属電極板をもち、収納された半導体チップの両側から放
熱する両面冷却型の平型半導体素子において、少なくと
も一方の電極板の一部が絶縁環の外周より外側に延長さ
れた板状突起を有し、その板状突起を主電流端子とする
ことを特徴とする平型半導体素子。
1. A double-sided cooling type flat semiconductor device having two metal electrode plates fixed to a ceramic insulating ring and radiating heat from both sides of a housed semiconductor chip, at least a part of one of the electrode plates. Has a plate-like protrusion extending outward from the outer circumference of the insulating ring, and the plate-like protrusion serves as a main current terminal.
【請求項2】両側の電極板の一部をセラミックの絶縁環
の外周より外側に延長した板状突起を有し、その板状突
起を主電流端子とすることを特徴とする請求項1記載の
平型半導体素子。
2. A plate-shaped projection formed by extending a part of the electrode plates on both sides to the outside of the outer circumference of a ceramic insulating ring, and the plate-shaped projection is used as a main current terminal. Flat semiconductor device.
【請求項3】両側の電極板の延長部分の主電流端子の位
置が互いにずらされていることを特徴とする請求項2記
載の平型半導体素子。
3. The flat semiconductor device according to claim 2, wherein the positions of the main current terminals of the extended portions of the electrode plates on both sides are displaced from each other.
【請求項4】両側の電極板の延長部分の主電流端子が、
対称的な位置に設けられていることを特徴とする請求項
3記載の平型半導体素子。
4. The main current terminals on the extended portions of the electrode plates on both sides,
The flat semiconductor device according to claim 3, wherein the flat semiconductor device is provided at symmetrical positions.
【請求項5】両側の電極板の延長部分の主電流端子が、
互いに直角方向を向くように設けられていることを特徴
とする請求項3記載の平型半導体素子。
5. The main current terminals of the extension parts of the electrode plates on both sides are
4. The flat semiconductor device according to claim 3, wherein the flat semiconductor devices are provided so as to face each other at right angles.
【請求項6】電極板の延長部分の主電流端子に穴が設け
られていることを特徴とする請求項1ないし5のいずれ
かに記載の平型半導体素子。
6. The flat semiconductor device according to claim 1, wherein a hole is provided in the main current terminal of the extended portion of the electrode plate.
JP6754796A 1996-03-25 1996-03-25 Flat-type semiconductor device Pending JPH09260585A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6754796A JPH09260585A (en) 1996-03-25 1996-03-25 Flat-type semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6754796A JPH09260585A (en) 1996-03-25 1996-03-25 Flat-type semiconductor device

Publications (1)

Publication Number Publication Date
JPH09260585A true JPH09260585A (en) 1997-10-03

Family

ID=13348106

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6754796A Pending JPH09260585A (en) 1996-03-25 1996-03-25 Flat-type semiconductor device

Country Status (1)

Country Link
JP (1) JPH09260585A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001308245A (en) * 2000-04-25 2001-11-02 Denso Corp Refrigerant cooling type both-face cooling semiconductor device
US6867068B2 (en) 1996-10-17 2005-03-15 Seiko Epson Corporation Semiconductor device, method of making the same, circuit board, and film carrier tape
US7190054B2 (en) 2003-02-19 2007-03-13 Denso Corporation Semiconductor module having inner pressure release portion
US7456531B2 (en) 2003-07-24 2008-11-25 Toyota Jidosha Kabushiki Kaisha Switching device, generator-motor apparatus using switching device, drive system including generator-motor apparatus, and computer-readable recording medium on which a program for directing computer to perform control of generator-motor apparatus is recorded
JP2010016402A (en) * 2009-10-07 2010-01-21 Denso Corp Coolant cooling type both sides cooling semiconductor device
US7671458B2 (en) 2005-03-28 2010-03-02 Toyota Jidosha Kabushiki Kaisha Connecting member used for semiconductor device including plurality of arranged semiconductor modules and semiconductor device provided with the same
JP2014033125A (en) * 2012-08-06 2014-02-20 Toyota Motor Corp Semiconductor device and manufacturing method of the same

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6867068B2 (en) 1996-10-17 2005-03-15 Seiko Epson Corporation Semiconductor device, method of making the same, circuit board, and film carrier tape
JP2001308245A (en) * 2000-04-25 2001-11-02 Denso Corp Refrigerant cooling type both-face cooling semiconductor device
US7190054B2 (en) 2003-02-19 2007-03-13 Denso Corporation Semiconductor module having inner pressure release portion
US7456531B2 (en) 2003-07-24 2008-11-25 Toyota Jidosha Kabushiki Kaisha Switching device, generator-motor apparatus using switching device, drive system including generator-motor apparatus, and computer-readable recording medium on which a program for directing computer to perform control of generator-motor apparatus is recorded
US7759831B2 (en) 2003-07-24 2010-07-20 Toyota Jidosha Kabushiki Kaisha Switching device, generator-motor apparatus using switching device, drive system including generator-motor apparatus, and computer-readable recording medium on which a program for directing computer to perform control of generator-motor apparatus is recorded
US7671458B2 (en) 2005-03-28 2010-03-02 Toyota Jidosha Kabushiki Kaisha Connecting member used for semiconductor device including plurality of arranged semiconductor modules and semiconductor device provided with the same
JP2010016402A (en) * 2009-10-07 2010-01-21 Denso Corp Coolant cooling type both sides cooling semiconductor device
JP2014033125A (en) * 2012-08-06 2014-02-20 Toyota Motor Corp Semiconductor device and manufacturing method of the same

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