JPH09239330A - Defect detector and device for removing defects - Google Patents

Abstract

PROBLEM TO BE SOLVED: To exactly and chassifiedly detect foreign matter such as glass mixed in a material to be inspected (a grain group (k)) to separately from the grain group (k) while appropriately judging normal grain in the material from defective grain and to separate and remove the defective grain and the foreign matter from the normal grain. SOLUTION: The material to be inspected (grain group (k)) transferred along a prescribed route is illuminated by a illuminating means 4. The illuminating light is reflected on the grain group (k) and a reference surface 8a positioned on the back side thereof and having the same reflection factor as that of the grain group (k), and the reflected light is received by a light receiving means 5B. Based on the light receiving information thereof, it is judged whether the grain is normal or defective, or whether there is the foreign matter or not. Even when the light reflected or a peripheral surface 8b positioned adjacent to the reference surface 8a and having a different reflection factor from that of the grain group (k) is made incident on the light receiving means B through the foreign matter, it is discriminated from the normal grain. Based to the judgment results, defects are separated into a route different from that of the normal grain and removed.

Description

Detailed Description of the Invention

[0001]

TECHNICAL FIELD The present invention relates to a grain group such as rice, grain of wheat, and seeds of beans such as adzuki bean / soybean, etc. as an inspection object, and the quality of the grain or mixing in the grain group. The present invention relates to a defect detection device that detects foreign matter existing therein, and a defective product removal device that removes defective grains or foreign matter detected by the defect detection device.

[0002]

2. Description of the Related Art In the above defect detecting device, as shown in FIG. 9, for example, a rice grain group k, which is an example of a grain group transferred along a predetermined path L as an inspection object, is used as a light source Lg.
And the reflected light reflected by the rice grain group k is received by the light receiving means S such as a photo sensor, and if the received light level is within a preset proper range, it is determined as normal rice grain. On the other hand, if it deviates from the proper range, it is determined that there is a defect such as coloring of rice grains and the inclusion of foreign matters such as stones and plastics. Here, a reflecting plate h having a reflecting surface having the same reflectance as the rice grain is arranged on the back side of the rice grain group k in the light receiving direction of the light receiving means S, and the light receiving level of the reflected light from the reflecting plate h is used as a reference. Is set to the appropriate range.

[0003]

However, in the above-mentioned prior art, the reflecting surface of the reflecting plate h is formed in a relatively large area with the reference position a located in the light receiving direction of the light receiving means S as the center. For a foreign substance such as a glass piece g, for example, the reflected light from the reference position a is refracted by the glass piece g and does not enter the light receiving means S as shown by the dotted line in the figure, but the peripheral position b of the reflection plate h. When the reflected light from B is refracted by the glass piece g and is incident on the light receiving means S, the reflected light from the normal rice grain may be erroneously determined and the glass piece g may not be detected as a foreign substance.

The present invention has been made in view of the above circumstances, and its purpose is to solve the above-mentioned problems of the prior art, and since it is transparent, the light reception level of light passing therethrough hardly changes. It is possible to accurately detect foreign substances such as glass fragments, and based on the detection results, normalize the defective grains and foreign substances in grain groups such as rice, wheat grain, and legume seeds such as adzuki beans and soybeans. The purpose is to ensure that it can be separated and removed from the grain.

[0005]

According to the structure of claim 1, the illumination light illuminating the grain group as the inspection object is reflected by the grain group and is in the light receiving direction of the light receiving means. Reflected by the reference surface located on the back side of the grain group, based on the light reception information received by the light receiving means reflected light from the grain group and reflected light from the reference surface, the quality of the grain or the grain group The presence or absence of foreign matter mixed in the inside is determined. That is, since the reflected light from the reference surface having the same reflectance as the grain group has the same light amount as the reflected light from the grain group, the quality of the grain based on the reflected light from the reference plane or It will be possible to determine the presence or absence of foreign matter mixed in the grain group,

At the same time, as illustrated in FIGS. 2 and 8,
The reflected light from the peripheral surface 8b, which is located close to the reference surface 8a and in a direction different from the light receiving direction of the light receiving means 5B, is not normally incident on the light receiving means 5B, but due to foreign matter such as glass g, the light from the peripheral surface 8b is not incident. The optical path of the reflected light is bent and the light receiving means 5
By entering B, since the peripheral portion 8b has a reflectance different from the reflectance of the grain group k, the amount of light reflected from the peripheral surface 8b can be distinguished from the light reflected from the grain group k. Become.

Therefore, the quality of the grain or the presence or absence of a foreign substance mixed into the grain group is accurately detected with reference to the reflected light from the reference surface arranged on the back side of the grain group in the light receiving direction of the light receiving means. However, even when the reflected light from the peripheral surface located in a direction different from the light receiving direction of the light receiving means is incident on the light receiving means through a foreign substance such as a glass piece, the peripheral surface of the grain group, that is, the reference surface In the conventional technology that forms the same as the reflectance, there is a possibility that it may be erroneously detected as a normal grain, but by forming the peripheral surface with a reflectance different from the reference surface, it may be erroneously detected as a normal grain. By doing so, it is possible to obtain a defect detection device capable of accurately detecting a defect in a grain or a mixture of foreign matter.

According to the second aspect of the present invention, in the first aspect, the light receiving amount of the light receiving means is set with reference to the light receiving amount of the reflected light from the normal grain, that is, the reflected light from the reference surface. If it is out of the range, it is determined that the grain is defective or the presence of foreign matter.

Therefore, when the grain is, for example, rice grain, defective grain such as colored rice or broken rice, glass or the like that receives light reflected from the peripheral surface of the reflector by refraction, and black type grain For foreign substances with low light reflectance such as stones and plastics, it can be detected by lowering the amount of light reflected from normal grains (that is, falling below the proper setting range), such as glass fragments. When a strong reflected light is received by light reflection from a part thereof as described above, various defects can be accurately detected so that they can be detected by being out of the upper side of the proper setting range. Therefore, according to claim 1, A suitable means of the defect detection device can be obtained.

According to the configuration of claim 3, claim 1 or 2
In the above, the reference surface located on the back side of the inspection object in the light receiving direction of the light receiving means, and the peripheral surface located near the reference surface are formed on a single member.

Therefore, for example, when the reference surface and the peripheral surface are formed on different members, the reference surface is formed with the reference surface positioned on the back side of the grain group in the light receiving direction of the light receiving means. After installing the formed member, it is necessary to install the member forming the peripheral surface with the peripheral surface close to the reference surface,
It takes a lot of time and effort to install the reference surface and the peripheral surface on the device, but it is only necessary to attach a single member to the device while the reference surface is located on the back side of the grain group in the light receiving direction of the light receiving means. It can be installed with a small amount of labor, and therefore, the suitable means of the defect detection device according to claim 1 or 2 can be obtained.

According to the structure of claim 4, in claim 1, 2 or 3, when the reflected light from the peripheral surface close to the reference surface enters the light receiving means through a foreign substance such as a glass piece, Since the reflectance of the peripheral surface is smaller than the reflectance of the grain group, the light amount of the reflected light from the peripheral surface is smaller than the light amount from the grain group, and can be distinguished from the grain group.

Therefore, for example, when the reflectance of the peripheral surface is made larger than that of the grain group to form different reflectances, the reflected light from the peripheral surface is incident on the light receiving means. The light intensity at this time may be indistinguishable due to the light intensity from the grain group, which may be indistinguishable depending on the light transmittance of foreign matter, while the reflectance of the peripheral surface is higher than that of the grain group. The presence of a foreign substance or the like can be accurately detected with a small reflectance and a light amount that is surely smaller than the light amount from the grain group, and thus a suitable means of the defect detection device according to claim 1, 2 or 3 can be obtained. .

According to the structure of claim 5, claims 1, 2,
The defect detection device according to 3 or 4 is provided, and when the grain group transferred along the planned transfer route is transferred to the light receiving target portion with respect to the planned transfer route of the light receiving unit, from one side across the planned transfer route. Illumination light is reflected by the reference surface on the other side of the grain group and the planned transfer path, and is received by the light receiving means on the same side of the planned transfer path, based on the light reception information at the light receiving target location. The determined defective grain and foreign matter are separated and transferred to a route different from the route of the normal grain in the grain group.

Therefore, for example, in order to detect the defect and remove the defect without transferring the inspection object (grain group), it is necessary to make the apparatus movable so that the inspection object can be moved. The defective grains and foreign substances are separated from the normal grains while sequentially transferring the objects (grain groups) from the light receiving target position of the light receiving unit, that is, the defect detection position to the separation position on a different path, that is, the defective substance removal position. By carrying out transfer by means of the above, it is possible to obtain a defective product removing device in which the respective parts of the device can be rationally arranged and smooth operation can be realized while keeping the device side from moving.

According to the structure of claim 6, in claim 5, the whole width in the direction of arrangement of the grain groups transferred in a single layer along the planned transfer route in a state of being aligned in a plurality of rows is illuminated, and The reference surface formed in a longitudinal shape along the arrangement direction of the grain groups is illuminated, and the reflected light from the plurality of rows of the grain groups and the reference surface in the longitudinal direction is along the arrangement direction of the grain groups by the light receiving means. Light is received with the entire longitudinal width as the detection target range, and based on the received light information, the quality of the grains or the presence or absence of mixed foreign matter in the entire width in the arrangement direction of the grain groups of the plurality of rows is determined. Here, the reflected light from the peripheral surfaces provided on both sides of the longitudinal reference surface in the lateral direction is different from the reflected light from the grain group even if the light is received by the light receiving means through a foreign substance or the like. They are distinguished by being small (for example, small).

Therefore, in comparison with a case where the inspection objects are not arranged in a plurality of rows and are transferred along a planned transfer path in a single row, for example, the entire width in the arrangement direction is parallel, that is, efficient, and the glass pieces are more efficient. It is possible to satisfactorily detect a defect while preventing erroneous detection of a foreign matter such as erroneous grain as a normal grain, thereby providing a suitable means of the defective product removing apparatus according to claim 5.

According to the configuration of claim 7, claim 5 or 6
In, the air is blown to the defective grain or foreign matter in the grain group being dropped and transported by its own weight, and the defective grain or foreign matter is in a route different from the normal grain transport route. To be separated.

Therefore, since the defective grain or the foreign matter is separated from the normal grain transfer route by the air blowing action, for example, the direct contact is made by a mechanical means such as a plate that moves in and out. As compared with the case of separating the devices, the device can be separated favorably with a fast response speed and without the risk of damaging the soft touch. Therefore, the preferred means of the defective product removing apparatus according to claim 5 or 6 can be obtained.

[0020]

BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the defect detection device and the defect removal device of the present invention will be described below along a predetermined route with a rice grain group such as brown rice and polished rice, which is an example of a grain group, as an inspection target. A case where a defect is detected and a defective is removed during transportation will be described with reference to the drawings.

As shown in FIGS. 1 and 2, a plate-shaped shooter 1 having a predetermined width is attached to a horizontal plane at a predetermined angle (for example, 45).
The rice grain group k supplied by the hopper 7 or the like from the upper side of the shooter 1 is slid and transferred in a laterally spread state in a single state. Below the shooter 1, a good rice collection box 2 for collecting normal rice grains k of a group of rice grains k naturally falling from the lower end of the shooter at a predetermined speed, and a colored rice (burnt rice) separated from the flow of normal rice grains k ) And a defective product recovery box 3 for recovering defective rice such as broken rice or foreign matter such as stone or glass fragments. From the above, the shooter 1 is arranged in a single layer and in a plurality of rows in which the rice grain group k is arranged along the planned transfer route (that is, the flow route of the rice grain group k on the shooter and the dropping route of the rice grain group k jumping out from the lower end of the shooter). A transfer means H for transferring is configured.

A fluorescent lamp or the like is provided so as to illuminate the entire width of the rice grain group k in a row in one direction on one side of the planned transportation route, that is, the dropping route of the rice grain group k from the lower end of the shooter. A line-shaped light source 4 as an illuminating means and a line sensor 5B as a light-receiving means for receiving the reflected light of the illumination light from the line-shaped light source 4 reflected by the rice grain group k are provided, and the line-shaped light source 5B is provided on the other side. A line sensor 5A is provided for receiving the transmitted light in which the illumination light from the light source 4 has passed through the rice grain group k. Then, both line sensors 5A and 5A
The light receiving target portion J for the planned transfer route of B is shown in FIG.
As shown in FIG. 3, the line sensors 5A and 5A are set at substantially the same position in the route direction of the planned transfer route.
The detection target range of B is set to the entire width in the longitudinal direction along the arrangement direction of the rice grain groups k in a plurality of rows at the light receiving target location J, and the transfer means H moves to the light receiving target location J to the rice grain group k.
Is configured to be transported.

On the other side of the dropping path of the rice grain group k, a reflecting plate 8 for receiving the illumination light from the linear light source 4 and reflecting the illumination light toward the line sensor 5B for reflected light is provided. Has been. In other words, the reflector 8 has a structure shown in FIG.
And as shown in FIG. 7, the line sensor 5 for the reflected light
On the back side of the rice grain group k in the light receiving direction of B, the reference surface 8a having the same reflectance as the reflectance of the rice grain group k is formed in a longitudinal shape corresponding to the longitudinal detection target range of the line sensor 5B. The peripheral surface 8b having a reflectance smaller than the reflectance of the rice grain group k so as to be different from the reflectance of the rice grain group k by being close to both sides of the longitudinal reference surface 8a in the lateral direction is a black region. Is formed in. From the above, the reflection plate 8 becomes the reference surface 8a.
And a single member forming the peripheral surface 8b.

As shown in FIG.
A and 5B are provided with a plurality of light receiving portions 5a capable of taking out light receiving information for each light receiving target range with a range p smaller than the size of the rice grain k (for example, about 1/10 of the size of the rice grain k). , The entire rice grain group k is provided. Specifically, a monochrome type CCD sensor in which light-receiving elements as a plurality of light-receiving units 5a are juxtaposed linearly over the entire width along the arrangement direction of the rice grain groups k in the plurality of rows, and the rice grain groups k And an optical system for forming an image on the respective light receiving elements of the CCD sensor.

From the light receiving target portion J in the planned transfer route of both the line sensors 5A and 5B to the lower side in the route,
An air blowing device 6 is provided for blowing air to the rice grains k and foreign substances that have been determined to be defective to separate them from the normal flow direction of the rice grains k and to collect them in the defective product collection box 3. This air spraying device 6 uses rice grains k
It is provided with a plurality of air guns 6a that are individually sprayed to each rice grain group k divided into a predetermined width in the lateral direction with respect to the flow direction of.

To explain the control configuration, as shown in FIG. 3, a control device 10 using a microcomputer is provided, and the control device 10 includes the two line sensors 5A and 5A.
Each image signal from B is input, and from the control device 10,
In order to individually operate each air gun 6a of the air blowing device 6, a drive signal is output to a plurality of solenoid valves 11 for turning on / off the air circulation of each air supply path from the compressor (not shown) to each air gun 6a. ing.

Utilizing the control device 10, a discriminating means 100 for discriminating the quality of the rice grain or the presence or absence of the foreign matter is constructed based on the light receiving information of the line sensors 5A and 5B. Each line sensor 5
It is configured to determine the defect of the rice grain or the presence of the foreign matter when the received light amounts of A and 5B are out of the proper setting ranges. Specifically, the line sensor 5 for transmitted light in FIG.
As shown in A and each output waveform of the line sensor 5B for reflected light in FIG. 6, each light receiving section 5a is based on the light receiving information of the plurality of light receiving sections 5a of each line sensor 5A, 5B.
The output voltage corresponding to the received light amount of
When it is out of Eh, the defect of the rice grain or the presence of the foreign matter is judged. Here, in the case of transmitted light, the output voltage level e0 when the standard transmitted light from the normal rice grain is received is larger at the position where the rice grain k does not exist, so the setting proper range ΔEt for transmitted light is It is set as a range equal to or more than a set level ek that is a predetermined amount lower than the voltage level e0, and the proper setting range ΔEh for reflected light is above and below the output voltage level e0 ′ for standard reflected light from normal rice grains. It is set within a predetermined width range.

In FIGS. 5 and 6, the proper setting range Δ is set at a position where a part of the rice grain k is colored (indicated by e1 and e1 ') and a position where a cracked portion exists (indicated by e2).
Illustrates the state where it deviates downward from Et, ΔEh, and
When a foreign substance such as a piece of glass is present, the strong light directly reflected by the foreign substance deviates upward from the proper setting range ΔEh as shown in the position e3 ′ of the reflected light, or as shown in FIG. The light reflected from the peripheral surface 8b of the reflection plate 8 is bent by the glass piece g or the like and is incident on the line sensor 5B for reflection, so that the peripheral surface 8b is formed in a black region and its reflectance is rice grain. Since it is much smaller than k, it deviates downward from ΔEh as shown by e4 ′ in FIG. Further, although not shown, in a black stone or the like, the reflectance and the transmittance are both very small, so that in both waveforms, the setting proper ranges ΔEt and ΔEh are greatly deviated downward.

Then, the transfer means H also utilizes the control device 10 and the air blowing device 6, and based on the discrimination information of the discrimination means 100, normal rice grains in the rice grain group k and defective ones. The rice grains and the foreign matter are separated and transferred to different routes. Specifically, when the determination unit 100 determines that the rice grain is defective or the foreign matter is present, the both line sensors 5
Separation points (the air gun 6a) from the light receiving target portions of A and 5B for the planned transfer path to different paths for the defective rice grain or the foreign matter in the planned transfer path.
The defective rice grain or the foreign substance is separated into a path different from the normal rice grain path with the passage of the transfer time to the installation location. That is, the rice grain group k is dropped and transferred by its own weight, and the defective rice grain or foreign matter is
Air is blown from each air gun 6a corresponding to the position to separate it from the normal rice grain path.

[Other Embodiments] In the above embodiment, the peripheral surface 8b is formed in a black region in order to make the reflectance of the peripheral surface 8b smaller than the reflectance of the inspection object (grain group k). , A color with low lightness other than black may be used, or
The reflectance may be reduced in other surface states (unevenness, etc.) other than color. Further, in order to make the reflectance different from the reflectance of the inspection object, the reflectance is not lower than the reflectance of the inspection object, and conversely, the reflectance is higher than the reflectance of the inspection object. Good. Further, the reference surface 8a and the peripheral surface 8b may not be formed on a single member (reflection plate 8) but may be formed on different members.

In the above embodiment, the discriminating means 100 uses the information on the amount of light received by the line sensor 5A for transmitted light and the amount of light received by the line sensor 5B for reflected light, and one of them is out of the proper setting range. In the case where the grain defect or the presence of the foreign matter is determined, it is determined that if the information is out of the proper setting range using only the information on the amount of light received by the line sensor 5B for reflected light. It can also be configured to determine defective grains or the presence of foreign material.

In the above embodiment, each of the light receiving means 5A, 5B
Although it is configured by using a monochrome type CCD sensor, it may be configured by using an image pickup tube type television camera. Also, it is not a monochrome type but a color type CC
A D sensor may be used to more accurately determine the presence or absence of defective grains or foreign matter based on the amount of light received for each of the color information R, G, and B.

In the above embodiment, the inspection object (grain group k) is transferred by the transfer means H in a state where the inspection object (grain group k) is lined up in a plurality of rows along the planned transfer path (that is, in a state of being spread in the lateral direction). In addition to this, for example, they may be transferred in a single line (that is, linearly) along the planned transfer route. Then, according to the transfer form of the transfer means H to the inspection target (grain group k), the illumination means 4 is also not a linear light source that illuminates the entire width of the inspection target (grain group k) in a plurality of rows. The light source is appropriately changed to another light source or the like, and the detection range of each of the line sensors 5A and 5B, which are light receiving means, and the reference plane 8 are also included.
The shapes of a and the peripheral surface 8b are also changed to an appropriate shape other than the longitudinal shape. The light receiving target locations J of the line sensors 5A and 5B with respect to the planned transfer route may be set at different positions in the route direction of the planned transfer route instead of being substantially the same position.

In the above-described embodiment, the tilted shooter 1 is provided in order to configure the transfer means H for transferring the inspection object (grain group k) along the planned transfer path in a single line in a plurality of rows. The object to be inspected (grain group k) is slid on the surface thereof, but in addition to this, for example, a transport device or the like on which the object to be inspected (grain group k) is placed and conveyed in a single state. May be provided. Further, a transfer means is provided so that air is blown toward the defective grain or the like in the grain group k that is falling by its own weight to separate and transport the defective grain or foreign matter from the normal grain path. Although H is configured, the present invention is not limited to this, and for example, defective grains and the like may be sucked by air.

Incidentally, reference numerals are written in the claims for convenience of comparison with the drawings, but the present invention is not limited to the configuration of the attached drawings by the entry.

[Brief description of drawings]

FIG. 1 is a schematic perspective view of a defect detection / removal device.

FIG. 2 is a schematic side view of the same.

FIG. 3 is a block diagram of a control configuration.

FIG. 4 is an explanatory diagram of a light reception detection range.

FIG. 5 is an output waveform diagram of a line sensor for transmitted light.

FIG. 6 is an output waveform diagram of a line sensor for reflected light.

FIG. 7 is a front view of a reflector.

FIG. 8 is an explanatory diagram of defect detection in reflected light.

FIG. 9 is an explanatory diagram of erroneous detection by a reflector of a conventional example.

[Explanation of symbols]

 4 illuminating means 5B light receiving means 100 discriminating means 8a reference surface 8b peripheral surface 8 member H transfer means

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Yuichi Yamazaki, 64, Ishizukita-machi, Sakai City, Osaka Prefecture Kubota Sakai Factory Co., Ltd. (72) Tomoko Nakao, 64, Ishizukita-machi, Sakai City, Osaka Kubota Sakai Co., Ltd. Inside the factory (72) Inventor Shinichi Kitano 64 Ishizukita-cho, Sakai City, Osaka Prefecture Kubota Sakai Factory

Claims (7)

[Claims] 1. A defect detection device for detecting quality of a grain or a foreign substance mixed in the grain group by using the grain group as an inspection object, and an illumination means (4) for illuminating the inspection object. , A light receiving means (5B) for receiving the reflected light that the illumination light from the illuminating means (4) reflects on the inspection object, and the quality of the grain or the foreign matter based on the light receiving information of the light receiving means (5B). And a reference surface (8a) having the same reflectance as the reflectance of the inspection target on the back side of the inspection target in the light receiving direction of the light receiving unit (5B). ) Is provided, and the peripheral surface (8) having a reflectance different from the reflectance of the inspection object is provided close to the reference surface (8a).
The defect detection device provided with b). 2. The determining means (100) is configured to determine whether the grain is defective or the foreign matter is present when the amount of light received by the light receiving means (5B) is out of an appropriate setting range. The defect detection device according to claim 1. 3. The reference surface (8a) and the peripheral surface (8)
The defect detection device according to claim 1 or 2, wherein b) and are formed on a single member (8). 4. The reflectance of the peripheral surface (8b) is smaller than the reflectance of the inspection object.
The defect detection device according to 2 or 3. 5. A defective article removing device comprising the defect detecting device according to claim 1, 2, 3 or 4, wherein a transfer means (H) for transferring the inspection object along a planned transfer path is provided. The illumination means (4) and the light receiving means (5B) are arranged on one side of the planned transfer path, and the reference surface (8a) and the peripheral surface (8) are arranged on the other side.
b) is arranged, and the transfer means (H) transfers the inspection object to the light receiving target portion of the light receiving means (5B) with respect to the planned transfer path, and the determination information of the determination means (100). On the basis of the above, a defective product removing device configured to separate and transfer a normal grain, a defective grain, and the foreign matter of the inspection object to different paths. 6. The transfer means (H) is configured to transfer the inspection objects in a single-layer state and in a state where they are arranged in a plurality of rows, and the illumination means (4) is arranged so that the inspection objects of the plurality of rows are inspected. The light receiving means (5B) is configured to illuminate the entire width in the arrangement direction, and the light receiving unit (5B) is configured to set the entire width in the longitudinal direction along the arrangement direction of the inspection objects in the plurality of rows as the detection target range. (8a) is formed in a longitudinal shape corresponding to the longitudinal detection target range of the light receiving means (5B), and the peripheral surface (8b) is formed on both sides of the longitudinal reference surface (8a) in the lateral direction. ) Is provided, The defective object removal device of Claim 5. 7. The transfer means (H) drops the object to be inspected and transfers the object to be inspected by its own weight, and blows air to the defective grain or the foreign substance to form a normal grain path. 7. The defective article removing apparatus according to claim 5, wherein the defective article removing apparatus is configured to be separated into different paths.