JP2000097866A - Detector for defective, and separator using same - Google Patents

Detector for defective, and separator using same

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Publication number
JP2000097866A
JP2000097866A JP10273509A JP27350998A JP2000097866A JP 2000097866 A JP2000097866 A JP 2000097866A JP 10273509 A JP10273509 A JP 10273509A JP 27350998 A JP27350998 A JP 27350998A JP 2000097866 A JP2000097866 A JP 2000097866A
Authority
JP
Japan
Prior art keywords
light
light receiving
inspection
rice
defective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10273509A
Other languages
Japanese (ja)
Inventor
Hideji Sonoda
秀二 園田
Naoto Ikeda
直人 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kubota Corp
Original Assignee
Kubota Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kubota Corp filed Critical Kubota Corp
Priority to JP10273509A priority Critical patent/JP2000097866A/en
Publication of JP2000097866A publication Critical patent/JP2000097866A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/85Investigating moving fluids or granular solids

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Sorting Of Articles (AREA)

Abstract

PROBLEM TO BE SOLVED: To eliminate troublesome work operation requiring many labors and times for inclination adjustment for a reflection face when the type of an inspection object is changed, so as to conduct proper detection for a defective, and to properly separate the defective from fair articles. SOLUTION: Detected light from a particle group (k) illuminated by an illumination means 4 in a planed existence portion J is received in a light receiving means 5 provided with a plurality of light receiving parts having as respective light receiving ranges ranges smaller than respective particle sizes, and plural kinds of reflection faces (hm) for reflecting toward the receiving means 5 light having brightness same or substantially same to the detected light from a fair article out of inspection objects after change are arranged in a backpart side portion of the portion J while used in an alternative way in response to type change of the inspection object. Whether received light quantity of the receiving means 5 for receiving the detected light from the particle group (k) and reflected light from the reflection faces (hm) is out of a fair light quantity range or not is determined in each light receiving part in the plural receiving parts provided in the receiving means 5.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、粒状体群を検査対
象物として、その検査対象物の存在予定箇所を照明する
照明手段と、前記照明手段にて照明された前記検査対象
物からの検出光を受光する受光手段と、前記受光手段の
受光方向であって前記存在予定箇所の背部側箇所に設置
されて、前記検査対象物のうちの適正物からの検出光と
同一又は略同一の明るさの光を前記受光手段に向けて反
射する反射面と、前記検査対象物からの検出光及び前記
反射面からの反射光を受光する前記受光手段の受光情報
に基づいて、その受光量が前記検査対象物のうちの適正
物からの検出光に対する適正光量範囲を外れたか否かの
判別を行う判別手段とが設けられた不良物検出装置、及
び、その不良物検出装置を用いた分離装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an illumination means for illuminating a place where an inspection object is supposed to exist with a group of granular objects as an inspection object, and detection from the inspection object illuminated by the illumination means. A light receiving means for receiving light; and a light receiving direction of the light receiving means, which is installed at a position on the back side of the expected location, and which has the same or substantially the same brightness as detection light from a proper one of the inspection objects. A light-reflecting surface for reflecting the light toward the light-receiving means, and a light-receiving amount based on light-receiving information of the light-receiving means for receiving detection light from the inspection object and light reflected from the reflection surface. A defect detection device provided with a determination unit for determining whether or not a detection light from a proper one of inspection objects is out of a proper light amount range; and a separation device using the defect detection device. .

【0002】[0002]

【従来の技術】上記不良物検出装置では、検査対象物の
粒状体群としての例えば米粒群が予定移送経路に沿って
存在予定箇所に移送されると、照明手段である蛍光灯等
の光源にて米粒群が照明され、同時に、フォトセンサ等
の受光手段の受光方向であって前記存在予定箇所の背部
側箇所に配置した反射面が上記光源等にて照明されて、
その反射面から受光手段に向けて米粒群のうちの適正物
からの検出光と同一又は略同一の明るさの光が反射され
る。そして、照明光が米粒群で反射し又は米粒群を透過
した米粒群からの検出光及び上記反射面からの反射光が
受光手段にて受光され、その受光量が予め設定した適正
物に対する適正光量範囲を外れると、着色米等の不良米
や石・プラスチック等の不良物が存在すると判別してい
た(例えば、特開平2−21980号公報参照)。尚、
上記存在が判別された不良物は、上記存在予定箇所の位
置よりも経路下手側箇所において、噴射ノズル等によっ
てエアーを吹き付けられて、適正物の経路とは異なる経
路に分離される。
2. Description of the Related Art In the above-mentioned defective object detection apparatus, when a group of, for example, rice grains as a group of particles of an inspection object is transferred to an expected location along a predetermined transfer path, a light source such as a fluorescent lamp, which is an illuminating means, is used. The rice grain group is illuminated, and at the same time, the reflection surface arranged in the light receiving direction of the light receiving means such as a photo sensor and the back side of the expected location is illuminated by the light source or the like,
Light having the same or substantially the same brightness as the detection light from a proper one of the rice grain groups is reflected from the reflection surface toward the light receiving means. Then, the detection light from the rice grain group reflected by the rice grain group or transmitted through the rice grain group and the reflected light from the reflection surface are received by the light receiving means, and the amount of light received is an appropriate amount of light for a predetermined appropriate object. If it is out of the range, it is determined that defective rice such as colored rice or defective such as stone or plastic exists (for example, see Japanese Patent Application Laid-Open No. 22980/1990). still,
The defective object whose presence has been determined is blown by air by an injection nozzle or the like at a position on the lower side of the route from the position of the expected existence portion, and is separated into a route different from the route of the proper product.

【0003】そして、上記不良物検出装置では、多くの
場合、受光手段として、各米粒と同程度の大きさの検出
部(フォトセンサ等の光検出部)を備えたものが用いら
れていた。又、上記の検査対象物である米粒群は玄米や
精米等のように異なる種類のものに変更される場合があ
るが、その場合に各検査対象物の適正物からの検出光の
光量は、各検査対象物の照明光に対する反射率や透過率
の違いによって変化する。そこで、従来では、検査対象
物を変更した場合には、検査対象物の存在予定箇所の背
部側に設置した反射面から受光手段に向けて反射される
光が、変更される検査対象物の適正物からの検出光と同
一又は略同一の明るさの光になるように、反射面の傾き
を調整して、不良物の検出が適正になされるようにして
いた。
[0003] In the above-mentioned defective object detection apparatus, in many cases, a light receiving means provided with a detection unit (a light detection unit such as a photo sensor) having a size similar to that of each rice grain is used. In addition, the above-mentioned inspection target rice grain group may be changed to a different type such as brown rice or polished rice, in which case, the light amount of the detection light from the proper object of each inspection target, It changes depending on the difference in reflectance and transmittance of each inspection object with respect to illumination light. Therefore, conventionally, when the inspection object is changed, the light reflected toward the light receiving means from the reflection surface installed on the back side of the expected location of the inspection object is changed to the appropriateness of the inspection object to be changed. The inclination of the reflection surface is adjusted so that the light has the same or substantially the same brightness as the detection light from the object, so that the defective object is properly detected.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記従
来技術では、受光手段が各粒の大きさと同程度の検出部
を備えるように形成されていたので、米粒に一部着色等
の部分的な不良が存在する不良物では、不良物からの検
出光と適正物(正常粒)からの検出光との光量の差が小
さくなるため、その光量差を的確に検出できるようにす
るには、反射面から受光手段に向けて反射される光が、
変更される検査対象物の適正物からの検出光と極力同一
の明るさになる状態に調整する必要があり、前記反射面
の傾き調整作業が面倒であって、多くの労力と時間を要
するという不具合があった。
However, in the above-mentioned prior art, the light receiving means is formed so as to have a detection unit having a size approximately equal to the size of each grain. In the case of a defective object, the difference in the amount of light between the detection light from the defective object and the detection light from the proper object (normal grain) is small. Therefore, in order to accurately detect the difference in the amount of light, it is necessary to use a reflective surface. The light reflected from the
It is necessary to adjust as much as possible the same brightness as the detection light from the proper inspection object to be changed, and the work of adjusting the inclination of the reflection surface is troublesome, and requires much labor and time. There was a defect.

【0005】本発明は、上記実情に鑑みてなされたもの
であって、その目的は、上記従来技術の不具合を解消さ
せるべく、検査対象物の種類を変更した場合に、前記反
射面の傾き調整という面倒で且つ多くの労力と時間を要
する作業を不要として、適正な判別処理ができる不良物
検出装置を得ることにあり、さらに、変更された各種類
の検査対象物において、不良物の検出、及び、その不良
物と適正物とを適切に分離させることができる分離装置
を得ることにある。
SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances, and has as its object to adjust the inclination of the reflecting surface when the type of the inspection object is changed in order to eliminate the above-mentioned disadvantages of the prior art. The object of the present invention is to obtain a defective object detection device that can perform appropriate discrimination processing by eliminating the troublesome and time-consuming work that is required, and furthermore, in each of the changed types of the inspection target, detecting the defective object, Another object of the present invention is to provide a separation device capable of appropriately separating a defective product from a proper product.

【0006】[0006]

【課題を解決するための手段】請求項1では、粒状体群
を検査対象物としてその検査対象物の存在予定箇所が照
明手段にて照明され、その照明手段にて照明された粒状
体群からの検出光が、上記粒状体群の各粒の大きさより
も小さい範囲を夫々の受光対象範囲とする複数個の受光
部を前記存在予定箇所の全体に亘って備えて構成された
受光手段にて受光されるとともに、受光手段の受光方向
であって上記存在予定箇所の背部側箇所に、変更後の検
査対象物のうちの適正物からの検出光と同一又は略同一
の明るさの光を前記受光手段に向けて反射する複数種の
反射面が、検査対象物の種類が変更されるのに応じて択
一的に使用されて設置され、その反射面からの反射光が
受光手段にて受光される。そして、上記粒状体群からの
検出光及び反射面からの反射光を受光した受光手段の受
光量が、前記検査対象物のうちの適正物からの検出光に
対する適正光量範囲を外れたか否かの判別が、上記受光
手段に備えさせた複数個の受光部夫々について行われ
る。
According to the first aspect of the present invention, a portion where the inspection object is to be present is illuminated by illumination means using the group of granular objects as an inspection object, and the particles are illuminated by the illumination means. The detection light is provided with a plurality of light receiving portions that are each a light receiving target range with a range smaller than the size of each particle of the granular body group over the entire expected location. While being received, the light having the same or substantially the same brightness as the detection light from the proper one of the inspection objects after the change in the light receiving direction of the light receiving means and on the back side of the expected existence position is described above. A plurality of types of reflecting surfaces that reflect toward the light receiving means are selectively used and installed in accordance with a change in the type of the inspection object, and light reflected from the reflecting surface is received by the light receiving means. Is done. Then, it is determined whether or not the amount of light received by the light receiving unit that has received the detection light from the particulate group and the reflection light from the reflection surface is out of the appropriate light amount range for the detection light from the appropriate one of the inspection objects. The determination is performed for each of the plurality of light receiving units provided in the light receiving unit.

【0007】つまり、粒状体群からの検出光の光量が適
正光量範囲を外れたか否かの判別を、粒状体群の各粒の
大きさよりも小さい範囲を対象として行うことにより、
一部着色等の部分的な不良部が存在する場合にも、その
不良部からの検出光量が大きく変化することになるの
で、複数種の反射面の中から検査対象物の種類に応じて
択一的に使用されて、粒状体群の存在予定箇所の背部側
に配置される反射面からの反射光が、粒状体群の適正物
からの検出光の明るさから多少ずれていても、上記検出
光が適正光量範囲から外れたことを確実に判別すること
ができる。従って、検査対象物の種類を変更した場合
に、複数種の反射面の中から変更される検査対象物に対
応する反射面を択一的に使用することで、変更後の検査
対象物からの検出光が適正光量範囲を外れたか否かを適
切に判別することができ、従来のように、検査対象物の
種類を変更する毎に、反射面から受光手段に向けて反射
される光が変更される検査対象物の適正物からの検出光
と極力同一の明るさになるように、反射面の傾きを調整
する面倒で且つ多くの労力と時間を要する作業を不要と
して、適正な判別処理ができる不良物検出装置が得られ
る。
That is, the determination as to whether or not the light amount of the detection light from the granular body group has deviated from the appropriate light amount range is performed for a range smaller than the size of each particle of the granular body group.
Even if there is a partially defective portion such as partial coloring, the amount of light detected from the defective portion will vary greatly.Therefore, select from a plurality of types of reflective surfaces according to the type of inspection object. Even if the reflected light from the reflecting surface arranged on the back side of the expected location of the particulate group is slightly different from the brightness of the detection light from the appropriate object of the particulate group, It is possible to reliably determine that the detection light is out of the appropriate light amount range. Therefore, when the type of the inspection object is changed, by using the reflection surface corresponding to the inspection object to be changed from among the plurality of types of reflection surfaces, the reflection object from the changed inspection object is used. It is possible to appropriately determine whether the detection light is out of the appropriate light amount range, and the light reflected from the reflection surface toward the light receiving means is changed every time the type of the inspection object is changed, as in the related art. The troublesome and time-consuming work of adjusting the inclination of the reflecting surface so that the brightness of the inspection object to be detected is the same as the detected light from the appropriate object is eliminated, and proper discrimination processing is possible. A possible defective object detection device is obtained.

【0008】請求項2では、請求項1において、前記検
査対象物の種類が変更されるのに応じて、前記照明手段
の照明光の波長が異なる波長に変更される。従って、検
査対象物の種類が変更される場合に、変更される検査対
象物の適正物に対して不良物の存在を判別するのに適し
た波長の照明光を用いて、良好な不良物検出を行うこと
ができ、もって、請求項1の好適な手段が得られる。
According to a second aspect of the present invention, in accordance with the first aspect, the wavelength of the illumination light of the illumination means is changed to a different wavelength in accordance with the change of the type of the inspection object. Therefore, when the type of the inspection object is changed, good defective object detection is performed by using illumination light having a wavelength suitable for determining the presence of a defective object with respect to a proper inspection object to be changed. Can be performed, and the preferable means of claim 1 can be obtained.

【0009】請求項3では、請求項1又は2において、
複数種の反射面を備えた反射部材が、前記複数種の反射
面を択一的に使用状態に切換えるように、設置状態を変
更して設置される。従って、例えば複数種の反射面を別
々の反射部材に備えさせて、そのうちで使用する反射面
を備えた反射部材を選んで設置するようにすると、多数
の反射部材が必要になって反射部材の保管・管理が面倒
になると共に、一部の反射面だけを紛失するおそれがあ
るのに比べて、例えば使用する複数種の反射面のすべて
を1つの反射部材に備えさせることにより、反射部材の
保管・管理が簡素になるとともに、一部の反射面だけが
紛失するおそれも適切に回避させることができ、もっ
て、請求項1又は2の好適な手段が得られる。
According to a third aspect, in the first or second aspect,
A reflecting member having a plurality of types of reflecting surfaces is installed with its installation state changed such that the plurality of types of reflecting surfaces are selectively switched to a use state. Therefore, for example, when a plurality of types of reflecting surfaces are provided on separate reflecting members, and a reflecting member having a reflecting surface to be used is selected and installed, a large number of reflecting members are required, and the number of reflecting members becomes large. For example, by providing all of a plurality of types of reflective surfaces to be used in one reflective member, the storage and management becomes troublesome and there is a possibility that only some of the reflective surfaces may be lost. Storage and management can be simplified, and the possibility that only a part of the reflecting surface is lost can be appropriately avoided, whereby the preferable means of claim 1 or 2 can be obtained.

【0010】請求項4では、請求項1又は2において、
複数種の反射面のうちで、互いに異なる種類の反射面を
各別に備える複数の反射部材が択一的に設置されて、前
記複数種の反射面が択一的に使用状態が切換えられる。
従って、例えば使用する複数種の反射面のすべてを1つ
の反射部材に備えさせるようにすると、反射部材が大型
になって大きな設置スペースが必要になり、不良物検出
装置が大型化するのに比べて、例えば使用する複数種の
反射面を別々の反射部材に備えさせることにより、各反
射部材が小型のものになって小さな設置スペースで済
み、不良物検出装置を極力小型化させることができ、も
って、請求項1又は2の好適な手段が得られる。
[0010] In claim 4, in claim 1 or 2,
Among the plurality of types of reflecting surfaces, a plurality of reflecting members each having a different type of reflecting surface are separately installed, and the use state of the plurality of types of reflecting surfaces is selectively switched.
Accordingly, for example, if all of a plurality of types of reflecting surfaces to be used are provided in one reflecting member, the reflecting member becomes large and a large installation space is required. Thus, for example, by providing a plurality of types of reflecting surfaces to be used on separate reflecting members, each of the reflecting members can be reduced in size and the installation space can be reduced, and the defective object detection device can be miniaturized as much as possible. Thus, the preferred means of claim 1 or 2 is obtained.

【0011】請求項5では、請求項1又は2において、
複数種の反射面のうちで、その一部の種類のものを備え
た反射部材が装着されて、その反射部材に備えた反射面
が使用され、一方、その反射部材の離脱状態において露
出する部分に設けられて、上記複数種の反射面のうちで
上記反射部材が備える反射面とは異なる種類の反射面
が、上記反射部材の離脱状態において、使用される。従
って、着脱自在に設置される反射部材に備える反射面の
数を少なくして、反射部材を簡素なものに構成しなが
ら、装置内部の部材を有効に活用して反射面を形成し
て、全体として必要な数の反射面を確保させることがで
き、もって、請求項1又は2の好適な手段が得られる。
According to a fifth aspect, in the first or second aspect,
Of the plurality of types of reflective surfaces, a reflective member provided with a part of the reflective members is mounted, and the reflective surface provided on the reflective member is used, while a portion exposed when the reflective member is detached. And a reflection surface of a type different from the reflection surface of the reflection member among the plurality of types of reflection surfaces is used in a state where the reflection member is separated. Therefore, the number of reflection surfaces provided on the reflection member that is detachably installed is reduced, and while the reflection member is configured to be simple, the reflection surface is formed by effectively using the members inside the apparatus, and As a result, it is possible to secure a necessary number of reflecting surfaces, thereby obtaining the preferable means of claim 1 or 2.

【0012】請求項6では、請求項1〜5のいずれか1
項の不良物検出装置を備えた分離装置において、検査対
象物としての粒状体群が、予定移送経路に沿って前記存
在予定箇所つまり前記受光手段の受光位置と、その存在
予定箇所の位置よりも経路下手側の分離箇所とに移送さ
れるとともに、前記受光手段の受光量が前記検査対象物
のうちの適正物からの検出光に対する適正光量範囲を外
れたか否かの判別情報に基づいて、上記分離箇所に移送
された粒状体群のうちの適正物と不良物とを異なる経路
に分離させる分離手段の作動を制御する制御手段が、前
記検査対象物の種類が変更されると、その変更に応じた
異なる制御パラメータを備えた複数の検査モードに、択
一的に切換えられる。従って、例えば粒状体群を移送さ
せずに不良物検出と不良物等の分離を行うには、装置を
可動式に構成する必要があるのに比べて、粒状体群を不
良物検出位置から、不良物と適正物とを分離させる分離
箇所に順次移送させるように装置各部を合理的に配置す
ることで、装置を非可動式に簡素に構成しながら、検査
対象物としての粒状体群の種類が変更された場合、その
変更後の各検査対象物に応じた適切な制御パラメータに
よって、不良物の検出、及び、その不良物と適正物とを
適切に分離させることができる分離装置が得られる。
[0012] In claim 6, any one of claims 1 to 5 is provided.
In the separation device provided with the defective object detection device according to the item, the granular material group as an inspection object is located along the expected transfer path, that is, the expected existence position, that is, the light receiving position of the light receiving means, and the position of the expected existence position. While being transferred to the separation point on the lower side of the route, based on the determination information on whether or not the amount of light received by the light receiving means is out of the appropriate light amount range for the detection light from the appropriate one of the inspection objects, When the type of the inspection object is changed, the control unit that controls the operation of the separation unit that separates the proper object and the defective object out of the group of granular materials transferred to the separation point into different paths is changed. It is alternatively possible to switch to a plurality of test modes with different control parameters. Therefore, for example, in order to perform the defect detection and the separation of the defect without transferring the particulate group, for example, it is necessary to configure the apparatus to be movable. By arranging each part of the equipment rationally so that it can be sequentially transported to the separation point where the defective and proper parts are separated, the type of granular material group as the inspection object can be configured while simplifying the equipment in a non-movable manner. Is changed, an appropriate control parameter corresponding to each inspection object after the change can be used to detect a defective product and to obtain a separation device capable of appropriately separating the defective product from an appropriate product. .

【0013】請求項7では、請求項6において、前記制
御手段が、前記複数の検査モードに択一的に切換えられ
ると、その切り換えられた各検査モードにおいて、前記
存在予定箇所にて不良物の存在が判別された後、前記分
離手段を作動させるまでの時間間隔を、検査対象物の種
類に応じた異なる値に設定する。従って、変更される検
査対象物の種類によって、前記予定移送経路における移
送速度が異なる場合に、その移送速度の違いに応じて、
移送速度が速い検査対象物では、移送速度が遅い検査対
象物のときに比べて上記時間間隔を短くするようにし
て、分離箇所において適切な分離を行わせることがで
き、もって、請求項6の好適な手段が得られる。
According to a seventh aspect of the present invention, in the sixth aspect, when the control means is selectively switched to the plurality of inspection modes, in each of the switched inspection modes, a defective product is detected at the expected location. After the presence is determined, a time interval until the separation unit is operated is set to a different value according to the type of the inspection object. Therefore, depending on the type of the inspection object to be changed, when the transfer speed in the planned transfer path is different, according to the difference in the transfer speed,
In the inspection object having a high transfer speed, the time interval is shortened as compared with the inspection object having a low transfer speed, so that appropriate separation can be performed at the separation point. Suitable measures are obtained.

【0014】請求項8では、請求項6又は7において、
前記検査対象物の存在予定箇所が直線状に設定されると
ともに、前記受光手段に備えた前記複数個の受光部が、
前記直線状の存在予定箇所に対応させてライン状に並べ
られ、前記制御手段は、前記ライン状に並ぶ設定個数の
受光部の受光量が連続して前記適正光量範囲を外れたこ
とが判別された場合にのみ、不良物の存在を判別する連
結判別処理を行うとともに、前記複数の検査モードに択
一的に切換えられると、その切り換えられた各検査モー
ドにおいて、前記連結判別処理における受光部の設定個
数の値を異なる値に設定する。従って、検査対象物の適
正物において検出光量が前記適正光量範囲を外れるよう
な領域を部分的に含む場合に、受光手段に備えた各受光
部の受光量が1つでも前記適正光量範囲を外れると不良
物であると判別する通常の処理では、適正物を不良物と
誤って判別するおそれがあるのに対して、前記連結判別
処理によって適正物を不良物と誤判別することを極力回
避させることができ、しかも、検査対象物の種類によっ
て上記領域の大きさが異なるような場合に、その違いに
応じて、上記連結判別処理における受光部の設定個数の
値を適切な値に設定することができ、もって、請求項6
又は7の好適な手段が得られる。
According to claim 8, in claim 6 or 7,
The expected location of the inspection object is set to be linear, and the plurality of light receiving units provided in the light receiving unit are:
The control unit determines that the light receiving amount of the set number of light receiving units arranged continuously in the line is out of the proper light amount range in a line shape corresponding to the expected position of the linear shape. Only when this is the case, the connection determination processing for determining the presence of a defective is performed, and when the mode is selectively switched to the plurality of inspection modes, the light receiving unit in the connection determination processing is switched in each of the switched inspection modes. Set the value of the set number to a different value. Therefore, in the case where the detection light amount partially deviates from the appropriate light amount range in a proper inspection object, even one light receiving amount of each light receiving unit provided in the light receiving unit is out of the appropriate light amount range. In the normal process of determining that a proper object is defective, the proper process may be erroneously determined to be defective. In the case where the size of the area differs depending on the type of the inspection object, the value of the set number of light receiving units in the connection determination processing is set to an appropriate value according to the difference. Claim 6
Or 7 suitable means are obtained.

【0015】請求項9では、請求項6〜8のいずれか1
項において、前記検査対象物としての粒状体群を精米及
び玄米に変更しながら、照明手段からの照明光が前記検
査対象物で反射した反射検出光と、反射光受光手段の受
光方向であって前記存在予定箇所の背部側に設けられた
反射光用反射面からの反射光とが、反射光受光手段にて
受光され、一方、粒状体群が精米及び玄米に変更される
のに応じて、透過光受光手段の受光方向であって前記存
在予定箇所の背部側に設けられた透過光用反射面におい
て、精米及び玄米の夫々に対応するように形成して備え
られた精米用反射面と玄米用反射面とが択一的に使用さ
れ、照明手段からの照明光が前記検査対象物を透過した
透過検出光と、上記択一的に使用される精米用反射面及
び玄米用反射面からの反射光とが、透過光受光手段にて
受光される。そして、反射光受光手段及び透過光受光手
段の各受光情報に基づいて、各受光手段の受光量が前記
検査対象物のうちの適正物からの反射及び透過の各検出
光に対する適正光量範囲を外れたか否かの判別が行われ
る。従って、粒状体群を精米及び玄米に変更しながら不
良物の検出をするときに、透過光用反射面のみを精米及
び玄米の夫々に対応する精米用反射面及び玄米用反射面
に変更し、反射光用反射面は変更せずに同じ反射面を使
用するので、両方の反射面を変更するのに比べて、装置
構成を簡素化することができ、もって、請求項6〜8の
いずれか1項の好適な手段が得られる。
In a ninth aspect, any one of the sixth to eighth aspects is provided.
In the paragraph, while changing the group of granules as the inspection object to rice milling and brown rice, the illumination light from the illumination means is reflected detection light reflected by the inspection object, the light receiving direction of the reflected light receiving means, The reflected light from the reflective surface for reflected light provided on the back side of the expected existence location is received by the reflected light receiving means, while the granular group is changed to polished rice and brown rice, In the light receiving direction of the transmitted light receiving means and on the reflection surface for transmitted light provided on the back side of the expected location, the reflection surface for brown rice and the brown rice formed and provided so as to correspond to rice and brown rice respectively. Reflective surface is used as an alternative, and the illumination light from the illuminating means is transmitted through the inspection object, and the transmission detection light is transmitted from the selectively used rice reflective surface and the brown rice reflective surface. The reflected light is received by the transmitted light receiving means. Then, based on the respective light receiving information of the reflected light receiving means and the transmitted light receiving means, the amount of light received by each light receiving means deviates from an appropriate light amount range for each detection light of reflection and transmission from a proper one of the inspection objects. A determination is made as to whether or not it has occurred. Therefore, when detecting the defective while changing the granular body group to milled rice and brown rice, only the transmitted light reflecting surface is changed to the milled rice reflecting surface and brown rice reflecting surface corresponding to the milled rice and brown rice respectively, Since the same reflecting surface is used without changing the reflecting surface for reflected light, the device configuration can be simplified as compared with changing both reflecting surfaces, and thus any one of claims 6 to 8 can be used. The preferred means of paragraph 1 is obtained.

【0016】請求項10では、請求項9において、前記
制御手段は、検査対象物が精米及び玄米に変更されるの
に応じて、精米検査モード及び玄米検査モードに夫々切
り換えられるとともに、玄米検査モードにおいて且つ前
記透過光受光手段に備えた複数個の受光部の受光情報に
ついてのみ、前記連結判別処理を行う。従って、玄米で
は精米と違って、光の透過率が悪い胚芽の部分が残って
いて、その胚芽領域からの透過光の光量が前記適正光量
範囲を外れるような場合に、玄米検査モードの透過光受
光情報において上記胚芽領域に対応する受光部の個数を
設定して前記連結判別処理を行うことにより、玄米の適
正物を不良物と誤判別することを回避させるようにしな
がら、玄米からの反射光情報、並びに、胚芽のない精米
からの透過光及び反射光情報では、前記連結判別処理を
行わずに、細かい不良箇所まで精度良く検査することが
でき、もって、請求項9の好適な手段が得られる。
According to a tenth aspect of the present invention, in the ninth aspect, the control means switches to the rice inspection mode and the brown rice inspection mode in accordance with the change of the inspection object to the rice polishing and the brown rice inspection mode, respectively. And the connection determining process is performed only on the light receiving information of the plurality of light receiving units provided in the transmitted light receiving unit. Therefore, unlike the polished rice, unlike the polished rice, a portion of the germ having poor light transmittance remains, and when the light amount of the transmitted light from the germ region is out of the appropriate light amount range, the transmitted light of the brown rice inspection mode is used. By setting the number of light receiving portions corresponding to the embryo regions in the light receiving information and performing the connection determination process, the reflected light from the brown rice is prevented while avoiding erroneous determination of an appropriate brown rice as a defective one. With the information and the transmitted light and reflected light information from the germ-free rice, it is possible to accurately inspect even a fine defective portion without performing the connection discrimination processing, and thus the preferable means of claim 9 is obtained. Can be

【0017】[0017]

【発明の実施の形態】以下、本発明に係る不良物検出装
置及び分離装置の実施形態を、玄米や精米等の米粒群か
らなる粒状体群を検査対象物として、予定移送経路に沿
って移送しながら、不良物検出及び分離処理を行う場合
について図面に基づいて説明する。
BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, an embodiment of a defective object detecting device and a separating device according to the present invention will be described. Meanwhile, the case where the defective object detection and separation processing is performed will be described with reference to the drawings.

【0018】図1〜図3(尚、図3は、不良物検出及び
分離処理の動作説明図であるために、図1及び図2とは
装置構成の配置が異なる箇所がある)に示すように、広
幅の板状のシュータ1が、水平面に対して所定角度(例
えば60度)に傾斜されて設置され、このシュータ1の
上部側に設けた貯溜タンク7からフィーダ9によって搬
送・供給された米粒群kが、シュータ1の上面を一層状
態で横方向に広がった状態で流下案内されて移送されて
いる。ここで、上記シュータ1は、幅方向全幅に亘って
平坦な案内面に形成された平面シュータである。尚、こ
こでは、一層状態で移送させることを目的としているの
で、流れ状態により部分的に粒が重なって2層状態等に
なっても、一層状態の概念に含まれる。
As shown in FIGS. 1 to 3 (note that FIG. 3 is an explanatory diagram of the operation of the defective object detection and separation process, and the arrangement of the device configuration is different from that of FIGS. 1 and 2). A wide plate-like shooter 1 is installed at a predetermined angle (for example, 60 degrees) with respect to a horizontal plane, and is conveyed and supplied by a feeder 9 from a storage tank 7 provided on an upper side of the shooter 1. The rice grain group k is transported while being guided downward in a state where the upper surface of the chute 1 is spread in the horizontal direction in a single state. Here, the shooter 1 is a plane shooter formed on a flat guide surface over the entire width in the width direction. Here, since the purpose is to transfer the particles in a single layer state, even if the particles partially overlap depending on the flow state to form a two-layer state or the like, it is included in the concept of a single layer state.

【0019】貯溜タンク7には、外部の籾摺機から供給
される玄米や精米機から供給される精米等の検査対象物
が貯溜され、又、その外部からの検査対象物を1次選別
処理して得られた適正物又は不良物が再選別するために
貯溜される。タンク7は下端側ほど先細筒状に形成さ
れ、タンク7からフィーダ9上に落下した米粒群kのシ
ュータ1への供給量は、フィーダ9の振動による米粒群
kの搬送速度を変化させて調節される。
The storage tank 7 stores inspection objects such as brown rice supplied from an external huller and milled rice supplied from a rice mill, and also subjects the inspection objects from outside to a primary sorting process. The proper or defective product obtained is stored for re-sorting. The tank 7 is formed in a tapered cylindrical shape toward the lower end, and the supply amount of the rice grains k dropped from the tank 7 onto the feeder 9 to the shooter 1 is adjusted by changing the transport speed of the rice grains k by the vibration of the feeder 9. Is done.

【0020】シュータ1の下端部から流下する米粒群k
の流下経路中に、米粒群kが広幅状態で存在することが
予定される直線状の存在予定箇所J(以後、検出位置J
と呼ぶ)が設定され、その検出位置Jを照明する照明手
段としての蛍光灯等からなるライン状光源4A,4B
と、そのライン状光源4A,4Bからの照明光が上記検
出位置Jの米粒群kで反射した反射光を受光する反射光
受光手段としての反射用ラインセンサ5Bとが、上記検
出位置Jに対して同じ側に設けられている。一方、上記
検出位置Jを挟んでライン状光源4A,4Bの設置位置
とは反対側に、ライン状光源4A,4Bからの照明光が
検出位置Jの米粒群kを透過した透過光を受光する透過
光受光手段としての透過用ラインセンサ5Aが設けられ
ている。以上より、ライン状光源4A,4Bにて照明さ
れた米粒群kからの検出光を受光する受光手段として、
透過用ラインセンサ5Aと、反射用ラインセンサ5Bと
が設けられている。
Rice grains k flowing down from the lower end of shooter 1
In the flow-down path, the rice grain group k is expected to be present in a wide state in a straight line.
) Are set, and the linear light sources 4A and 4B made of fluorescent lamps and the like as illumination means for illuminating the detection position J are provided.
And a reflection line sensor 5B as reflected light receiving means for receiving the reflected light of the illumination light from the linear light sources 4A and 4B at the rice grain group k at the detection position J. On the same side. On the other hand, the illumination light from the linear light sources 4A and 4B receives the transmitted light transmitted through the rice grain group k at the detection position J on the opposite side of the detection position J from the installation position of the linear light sources 4A and 4B. A transmission line sensor 5A is provided as transmitted light receiving means. As described above, as the light receiving means for receiving the detection light from the rice grain group k illuminated by the linear light sources 4A and 4B,
A transmission line sensor 5A and a reflection line sensor 5B are provided.

【0021】図5に示すように、上記両ラインセンサ5
A,5Bは、米粒群の各米粒kの大きさよりも小さい範
囲p(例えば米粒kの大きさの10分の1程度)を夫々
の受光対象範囲とする複数個の受光部5aを、前記直線
状の検出位置Jの全体に亘って、直線状の検出位置Jに
対応させてライン状に並ぶ状態で備えて構成されてい
る。具体的には、複数個の受光部5aとしての受光素子
が直線状に並置されたモノクロタイプのCCDセンサ5
0と、検出位置Jでの米粒群kの像を上記CCDセンサ
の各受光素子上に結像させる光学系51とから構成され
ている。そして、両ラインセンサ5A,5Bは、例えば
図3において、検出位置Jの左端側から右端側に向け
て、各受光部5aから各受光情報が順次取り出される。
As shown in FIG.
A and 5B denote a plurality of light receiving portions 5a each having a range p (for example, about one-tenth of the size of the rice grain k) smaller than the size of each rice grain k of the rice grain group as the light receiving target range, by the straight line. The entirety of the detection positions J are arranged in a line so as to correspond to the detection positions J in a straight line. Specifically, a monochrome CCD sensor 5 in which light receiving elements as a plurality of light receiving portions 5a are arranged in a straight line.
0, and an optical system 51 for forming an image of the rice grain group k at the detection position J on each light receiving element of the CCD sensor. In the line sensors 5A and 5B, for example, in FIG. 3, each light reception information is sequentially extracted from each light reception unit 5a from the left end to the right end of the detection position J.

【0022】前記ライン状光源4A,4Bは、透過用ラ
インセンサ5A並びに反射用ラインセンサ5Bの受光方
向に対して傾いた複数の方向から米粒群kを照明するよ
うに、検出位置Jを斜め下方から照明する下側光源4A
と、検出位置Jを斜め上方から照明する上側光源4Bの
2つのライン状光源4A,4Bを備え、この両光源4
A,4Bは、上記傾いた照明角度を維持する状態でフレ
ーム22に保持されている。そして、このように検出位
置Jを照明光の照明角度を変えて異なる方向から照明し
ているので、米粒kが正常な検出位置Jから横方向にず
れた場合でも、極力均一な状態で良好に照明できること
になる。
The linear light sources 4A and 4B obliquely lower the detection position J so as to illuminate the rice grain group k from a plurality of directions inclined with respect to the light receiving direction of the transmission line sensor 5A and the reflection line sensor 5B. Light source 4A that illuminates from above
And two linear light sources 4A and 4B of an upper light source 4B for illuminating the detection position J from obliquely above.
A and 4B are held by the frame 22 while maintaining the inclined illumination angle. And, since the detection position J is illuminated from different directions by changing the illumination angle of the illumination light, even if the rice grain k is shifted from the normal detection position J in the lateral direction, it is preferably in a uniform state as much as possible. You will be able to illuminate.

【0023】又、ライン状光源4A,4Bは、米粒群k
の種類が例えば玄米と精米とに変更されるのに応じて、
その照明光の波長を、異なる波長に変更自在に構成され
ている。つまり、図6に示すように、精米の吸光度は、
波長が短い青色系の光に比べて、波長が長い赤色系の光
では大きく低下するのに対して、玄米の吸光度は、波長
が短い青色系の光と波長が長い赤色系の光とでそれほど
大きな違いはない。そこで、精米を検査する場合には、
精米の適正物(良米)に対して例えば赤黒色に焼けた不
良米等を良好に識別できるように青色の蛍光灯を使用
し、一方、玄米を検査する場合には、玄米の適正物に対
して、黒色のヤケ米や不透明な死米等の異物を識別でき
るように、昼光色あるいは電球色の蛍光灯を使用する。
The linear light sources 4A and 4B are provided with a rice grain group k.
As the type of rice is changed to, for example, brown rice and milled rice,
The wavelength of the illumination light can be changed to a different wavelength. That is, as shown in FIG.
Compared to blue light with a short wavelength, red light with a long wavelength is much lower, but the absorbance of brown rice is much less for blue light with a short wavelength and red light with a long wavelength. No big difference. So, when inspecting rice polishing,
For example, use a blue fluorescent lamp to properly identify defective rice that has been burnt red and black against the appropriate polished rice (good rice). On the other hand, a daylight-colored or light-bulb-colored fluorescent lamp is used so that foreign substances such as black burnt rice and opaque dead rice can be identified.

【0024】前記受光手段5A,5Bの受光方向であっ
て前記検出位置Jの背部側箇所に、米粒群kのうちの適
正物(正常米)からの検出光と同一又は略同一の明るさ
の光を前記受光手段5A,5Bに向けて反射する反射面
hmが設置されている。具体的には、上記反射面hmと
して、前記透過用ラインセンサ5Aの受光方向であって
前記検出位置Jの背部側に、米粒群kのうちの適正物
(正常米)を透過した透過光と同一又は略同一の明るさ
の光を透過用ラインセンサ5Aに向けて反射する透過光
用反射面hmを備えた透過光用反射板8Aが設置され、
一方、反射用ラインセンサ5Bの受光方向であって前記
検出位置Jの背部側に、米粒群kのうちの適正物(正常
米)で反射した反射光と同一又は略同一の明るさの光を
反射用ラインセンサ5Bに向けて反射する反射光用反射
面hmを備えた反射光用反射板8Aが設けられている。
そして、ライン状光源4A,4Bが、上記各反射面h
m,hmを照明するように配置されている。
In the light receiving direction of the light receiving means 5A and 5B and on the back side of the detection position J, the same or substantially the same brightness as the detection light from a proper one (normal rice) of the rice grain group k is provided. A reflecting surface hm for reflecting light toward the light receiving means 5A, 5B is provided. Specifically, as the reflection surface hm, the transmitted light transmitted through a proper one of the rice grain group k (normal rice) in the light receiving direction of the transmission line sensor 5A and on the back side of the detection position J. A transmitted light reflection plate 8A having a transmitted light reflection surface hm that reflects light having the same or substantially the same brightness toward the transmission line sensor 5A is provided.
On the other hand, in the light receiving direction of the reflection line sensor 5B and on the back side of the detection position J, light having the same or substantially the same brightness as the reflected light reflected by a proper one (normal rice) of the rice grain group k is applied. A reflected light reflector 8A having a reflected light reflection surface hm that reflects toward the reflection line sensor 5B is provided.
The linear light sources 4A and 4B are connected to the respective reflecting surfaces h.
m, hm.

【0025】そして、ライン状光源4A,4Bと、反射
用ラインセンサ5Bと、上記透過光用反射板8Aとが、
一方の収納部13Bに収納され、透過用ラインセンサ5
Aと、反射光用反射板8Bとが、他方の収納部13Aに
収納されている。尚、両収納部13A,13Bは側板が
共通の一体の箱体に形成され、両収納部13A,13B
夫々は、検出位置Jに面する側に板状の透明なガラスか
らなる光透過用の窓部14A,14Bを備えている。こ
こで、2つの窓部14A,14Bは、下方側ほど互いの
間隔が狭くなる状態(V字状)に配置されている。
The linear light sources 4A and 4B, the reflection line sensor 5B, and the transmitted light reflection plate 8A are
The transmission line sensor 5 is stored in one of the storage portions 13B.
A and the reflection plate for reflected light 8B are stored in the other storage portion 13A. In addition, both storage parts 13A, 13B are formed in an integral box body having a common side plate, and both storage parts 13A, 13B.
Each is provided with window portions 14A and 14B for light transmission made of plate-shaped transparent glass on the side facing the detection position J. Here, the two windows 14A and 14B are arranged in a state (V-shape) in which the distance from each other decreases toward the lower side.

【0026】次に、前記透過光用反射板8Aについて説
明する。図7及び図8(イ)(ロ)に示すように、長尺
状に形成された断面コの字状のブラケット22aが光源
支持用のフレーム22にネジ止め固定されるとともに、
そのブラケット22aにおけるフレーム22への固定部
とは反対側の角部に、長尺状に形成された断面L字型の
透過用光反射板8Aが、90度に折り曲げた各面h1,
h2の夫々を前記透過光用反射面hmとして使用する位
置に付け換えながら、ネジ止めされてブラケット22a
に取り付けられている。そして、上記透過光反射板8A
に備えた各面h1,h2が、精米及び玄米の夫々に対応
するように形成された精米用反射面h1と、玄米用反射
面h2とに相当する。以上より、複数種の反射面h1,
h2を備えた反射部材としての透過光用反射板8Aが、
その複数種の反射面h1,h2を択一的に使用状態に切
り換えるように、設置状態を変更自在に構成されてい
る。
Next, the reflection plate for transmitted light 8A will be described. As shown in FIGS. 7 and 8 (a) and (b), a long bracket 22a having a U-shaped cross section is fixed to the light source supporting frame 22 by screws.
At the corner of the bracket 22a on the opposite side to the portion fixed to the frame 22, a long-shaped light-reflecting plate for transmission 8A having an L-shaped cross section is bent at 90 degrees to each of the surfaces h1 and h1.
h2 while being replaced with a position to be used as the reflection surface hm for transmitted light,
Attached to. Then, the transmitted light reflecting plate 8A
The surfaces h1 and h2 provided in the above correspond to a rice-reflecting reflective surface h1 and a brown rice reflective surface h2 formed so as to correspond to rice and brown rice, respectively. From the above, a plurality of types of reflecting surfaces h1,
h2, the transmitted light reflecting plate 8A as a reflecting member provided with
The installation state is configured to be changeable so that the plurality of types of reflection surfaces h1 and h2 are selectively switched to the use state.

【0027】尚、上記ライン状光源4A,4Bの交換
と、透過光用反射板8Aの各面h1,h2の付け換え作
業を行う場合には、図2(ロ)に示すように、収納部1
3Bの上面側の蓋板13fを上げた状態で手を入れて、
フレーム22を支点22b回りに上向きに約90度回転
させて、ライン状光源4A,4Bと、透過光用反射板8
Aを上方に向けた状態で作業を行うことになる。
When replacing the linear light sources 4A and 4B and replacing the surfaces h1 and h2 of the transmitted light reflecting plate 8A, as shown in FIG. 1
Put your hand in a state where the lid plate 13f on the upper surface side of 3B is raised,
By rotating the frame 22 upward about the fulcrum 22b by about 90 degrees, the linear light sources 4A and 4B and the transmitted light reflecting plate 8 are rotated.
The work is performed with A facing upward.

【0028】さらに、図8(ハ)に示すように、上記反
射面h1,h2の背部に位置するブラケット22aの横
側面が、上記精米用及び玄米用の反射面h1,h2とは
異なる仕様の第3の反射面h3に形成されている。つま
り、精米用反射面h1は、比較的明るい色(例えば、ク
リーム色)に形成され、玄米用反射面h2は、精米用反
射面h1よりも少し暗い色に形成され、第3の反射面h
3は、例えば不良物の中から良米を選別するような場合
に使用されるもので、黒色系の色に形成される。尚、各
反射面は、ベース部材の表面に印刷等による塗膜として
形成される。以上より、複数種の反射面h1,h2,h
3のうちで、その一部の種類(反射面h1,h2)を備
える反射部材としての透過光用反射板8Aが、着脱自在
に設置されるとともに、その透過光用反射板8Aの離脱
状態において、露出する部分(ブラケット22aの表
面)に、上記複数種の反射面h1,h2,h3のうち
で、透過光用反射板8Aが備える反射面h1,h2とは
異なる種類の反射面h3が設けられることになる。
Further, as shown in FIG. 8C, the lateral surface of the bracket 22a located at the back of the reflecting surfaces h1 and h2 has a different specification from the reflecting surfaces h1 and h2 for milled rice and brown rice. It is formed on the third reflecting surface h3. That is, the rice-reflecting surface h1 is formed in a relatively bright color (for example, cream), the brown rice-reflecting surface h2 is formed in a slightly darker color than the rice-reflecting surface h1, and the third reflecting surface h is formed.
Reference numeral 3 is used when, for example, good rice is selected from defective products, and is formed in a black color. In addition, each reflection surface is formed as a coating film by printing or the like on the surface of the base member. As described above, a plurality of types of reflecting surfaces h1, h2, h
3, the transmitted light reflecting plate 8A as a reflecting member having some of the types (reflecting surfaces h1 and h2) is detachably installed, and the transmitted light reflecting plate 8A is detached. In the exposed portion (the surface of the bracket 22a), a reflection surface h3 of a different type from the reflection surfaces h1, h2 provided in the transmitted light reflection plate 8A among the plurality of types of reflection surfaces h1, h2, h3 is provided. Will be done.

【0029】一方、上記反射光用反射板8Bに備えた反
射光用反射面hmは、米粒kの良米と同じ反射率の領域
8aを上記ライン状光源4A,4Bにて照明された米粒
群kの全幅に対応して長手状に形成し、且つその長手状
の領域8aの両側に黒色の領域8bを形成するように、
窓部14Aの内面に印刷等による塗膜として形成されて
いる。ここで、反射光用反射板8Bは、検査対象物が玄
米と精米とに変更された場合でも、玄米及び精米からの
反射検出光が同一となるように、光源4A,4Bからの
照明光量等が調整され、同じ反射板が使用される。つま
り、検査対象物が玄米と精米とに変更された場合に、前
記透過光用反射板8Aに備えた透過光用反射面hmのみ
が、前記精米用反射面h1と玄米用反射面h2とを備え
て、それらが択一的に使用自在に構成されている。
On the other hand, the reflected light reflecting surface hm provided on the reflected light reflecting plate 8B is a group of rice grains illuminated by the linear light sources 4A and 4B in a region 8a having the same reflectance as the good rice of the rice grains k. k so as to form a longitudinal shape corresponding to the entire width of k, and form black regions 8b on both sides of the longitudinal region 8a.
It is formed as a coating by printing or the like on the inner surface of the window 14A. Here, even if the inspection object is changed to brown rice and polished rice, the reflection plate 8B for reflected light is used so that the amount of illuminating light from the light sources 4A and 4B is the same so that the reflection detection light from brown rice and polished rice is the same. Are adjusted and the same reflector is used. That is, when the inspection object is changed to brown rice and polished rice, only the transmitted light reflecting surface hm provided on the transmitted light reflecting plate 8A is connected to the polished rice reflecting surface h1 and the brown rice reflecting surface h2. In addition, they are alternatively configured to be freely used.

【0030】次に、上記窓部14A,14Bを清掃する
清掃手段Cについて説明する。図9及び図10に示すよ
うに、両窓部14A,14Bの表面に接当する一対のワ
イパー部材23が、両窓部14A,14Bの間隙形状に
合わせたV字配置で支持板24に固定され、この支持板
24が、上下向きのアーム25の下端部に取り付けられ
ている。アーム25の上部に付設された円筒状の上部部
分25Aが、横向き姿勢のロッドレスシリンダ26に摺
動自在に外嵌されるとともに、シリンダ26内のピスト
ン29に備えた磁石30に磁気力で係合している。ロッ
ドレスシリンダ26の両端部の夫々には、後述のエアタ
ンク15から供給されるエアーを電磁弁26A(図4参
照)によって断続して供給するエアー供給口26Bが設
けられ、この各エアー供給口26Bから交互にシリンダ
26内にエアーを供給して、ピストン29をシリンダ2
6の両端部間で往復移動させると、このピストン29に
連動して上部部分25Aが移動して、各ワイパー部材2
3が両窓部14A,14Bを清掃するようになってい
る。尚、上部部分25Aが、ロッドレスシリンダ26の
各端部に達したことを検出する左右一対のリミットスイ
ッチLS1,LS2が設けられている(図4参照)。
Next, the cleaning means C for cleaning the windows 14A and 14B will be described. As shown in FIGS. 9 and 10, a pair of wiper members 23 abutting on the surfaces of both windows 14A, 14B are fixed to the support plate 24 in a V-shaped arrangement corresponding to the gap between the windows 14A, 14B. The support plate 24 is attached to the lower end of an arm 25 that faces vertically. A cylindrical upper portion 25A attached to an upper portion of the arm 25 is slidably fitted to a rodless cylinder 26 in a laterally oriented posture, and is engaged with a magnet 30 provided on a piston 29 in the cylinder 26 by a magnetic force. I agree. At both ends of the rodless cylinder 26, there are provided air supply ports 26B for intermittently supplying air supplied from an air tank 15 to be described later by a solenoid valve 26A (see FIG. 4). The air is supplied alternately to the cylinder 26 from the
6, the upper portion 25A moves in conjunction with the piston 29, and each wiper member 2
3 cleans both windows 14A, 14B. A pair of left and right limit switches LS1 and LS2 for detecting that the upper portion 25A has reached each end of the rodless cylinder 26 is provided (see FIG. 4).

【0031】又、機枠に支持された左右の案内ガイド4
0に対して上方側から挿入される左右一対の縦長部材3
1に、上記ロッドレスシリンダ26の左右端部が保持さ
れるとともに、特殊用途のために点灯される第3の照明
光源4Cが取付板部材28等を介して保持され、これに
よって、清掃手段Cと光源4Cとが、装置に対して上下
方向に出し入れするようにして脱着自在に構成されてい
る。そして、装着時には、押え用のノブ33を機枠側の
ナット42に螺合させて上下方向でのがたつきを防止
し、離脱時には、ノブ33のナット42との螺合を解除
して上に持ち上げることができるように構成されてい
る。
Left and right guides 4 supported by the machine frame
A pair of left and right vertically long members 3 inserted from above with respect to
1, the left and right ends of the rodless cylinder 26 are held, and a third illumination light source 4C that is turned on for a special purpose is held via a mounting plate member 28 or the like. The light source 4C and the light source 4C are configured to be detachably attached to and removed from the apparatus in the vertical direction. At the time of mounting, the holding knob 33 is screwed into the nut 42 on the machine frame side to prevent rattling in the vertical direction, and at the time of detachment, the screwing of the knob 33 with the nut 42 is released. It is configured so that it can be lifted.

【0032】上記両ラインセンサ5A,5Bの検出位置
Jから流下方向下流側に、上記検出位置Jでの受光情報
に基づいて不良と判定された米粒kや異物等に対してエ
アーを吹き付けて正常な米粒kの流れ方向から横方向に
分離させるためのエアー吹き付け装置6が設けられてい
る。このエアー吹き付け装置6は、噴射ノズル6aの複
数個を、粒状体群の全幅を所定幅で複数個の区画に分割
形成した各区画に対応する状態で並置させ、不良物が存
在する区画の噴射ノズル6aが作動されるように構成さ
れている。
Air is blown to the downstream of the detection position J of the two line sensors 5A and 5B to the rice k or foreign matter determined to be defective on the basis of the light reception information at the detection position J. An air blowing device 6 for separating the rice grains k in the horizontal direction from the flow direction is provided. The air blowing device 6 arranges a plurality of spray nozzles 6a side by side in a state corresponding to each section formed by dividing the granular material group into a plurality of sections with a predetermined width, and ejecting the section where a defective object exists. The nozzle 6a is configured to be operated.

【0033】以上より、シュータ1が、米粒群kを予定
移送経路(シュータ上の米粒群kの流れ経路及びシュー
タ下端から落下する米粒群kの落下経路)に沿って前記
両ラインセンサ5A,5Bの検出位置Jと、その検出位
置Jよりも経路下手側の分離箇所とに移送する移送手段
Hを構成し、前記エアー吹き付け装置6が、上記分離箇
所に移送された米粒群kのうちの適正物と不良物とを異
なる経路に分離させる分離手段を構成する。
As described above, the shooter 1 moves the rice grain group k along the predetermined transfer path (the flow path of the rice grain group k on the chute and the fall path of the rice grain group k falling from the lower end of the chute) on the two line sensors 5A and 5B. Of the rice grain group k transferred to the separation position, the transfer means H configured to transfer the detection position J to the detection position J and the separation position on the lower side of the route than the detection position J. A separating means for separating an object and a defective object into different paths is provided.

【0034】そして、シュータ1の下端部から所定経路
に沿って流下する米粒群kのうちで、前記噴射ノズル6
aからのエアーの吹き付けを受けずにそのまま進行して
くる正常な米粒kを回収する良米用の受口部2Bと、エ
アーの吹き付けを受けて正常な米粒kの流れから横方向
に分離した着色米や胴割れ米等の不良米又は石やガラス
片等の異物を回収する不良物用の受口部3Bとが設けら
れ、良米用の受口部2Bが横幅方向に細長い筒状に形成
され、その良米用の受口部2Bの周囲を囲むように、不
良物用の受口部3Bが形成されている。尚、良米用の受
口部2Bにて回収された米粒k、及び、不良物用の受口
部3Bにて回収された不良物は、再選別等のために、本
検査装置のタンク7又は他の検査装置に搬送される。
Then, of the rice grains k flowing down from the lower end of the chute 1 along a predetermined path, the spray nozzle 6
The receptacle 2B for good rice, which collects normal rice grains k that proceed as they are without being blown by air from a, and is separated from the flow of normal rice grains k by blowing air. A receiving portion 3B for collecting defective rice such as colored rice or cracked rice or a foreign matter such as stone or glass fragments is provided, and a receiving portion 2B for good rice is formed in a tubular shape elongated in the width direction. A defective receiving port 3B is formed so as to surround the good rice receiving port 2B. Note that the rice grains k collected at the good rice receiving portion 2B and the defectives collected at the defective product receiving portion 3B are stored in the tank 7 of the inspection apparatus for re-sorting or the like. Or, it is transported to another inspection device.

【0035】図1に示すように、ジャッキボルト式の脚
部F0を備えた底板F1上に立設された縦枠F2,F
3,F4が、横枠F5,F6,F7によって連結されて
機枠が構成されている。表側の縦枠F4の上部斜め部分
に、情報の表示及び入力用の操作卓21が設置され、前
記フィーダ9に対する振動発生器9Aが横枠F5上に設
置され、底板F1上には、電源ボックス17と、前記エ
アー吹き付け装置6及び前記ロッドレスシリンダ26に
対するエアー供給用のエアタンク15とが設置されてい
る。又、箱状の前記収納部13A,13Bが前部側で縦
枠F4に後部側で縦枠F3に夫々支持され、シュート1
が上部側で横枠F6に下部側で収納部13Bに支持さ
れ、制御ボックス16が、横枠F7上に設置されてい
る。装置上部には、警報用の回転灯18(「パトライ
ト」という)が設置され、機枠には、装置外面を覆うカ
バー12が取り付けられている。
As shown in FIG. 1, vertical frames F2 and F standing upright on a bottom plate F1 having jack bolt type legs F0.
3, F4 are connected by horizontal frames F5, F6, F7 to form a machine frame. An operation console 21 for displaying and inputting information is installed in the upper oblique portion of the front vertical frame F4, a vibration generator 9A for the feeder 9 is installed on the horizontal frame F5, and a power supply box is installed on the bottom plate F1. 17 and an air tank 15 for supplying air to the air blowing device 6 and the rodless cylinder 26. The box-shaped storage portions 13A and 13B are supported by the vertical frame F4 on the front side and the vertical frame F3 on the rear side, respectively.
Are supported on the upper side by the horizontal frame F6 and on the lower side by the storage section 13B, and the control box 16 is installed on the horizontal frame F7. A rotary light 18 for alarm (referred to as a "patlight") is installed at the upper part of the apparatus, and a cover 12 that covers the outer surface of the apparatus is attached to the machine frame.

【0036】実際には、図11に示すように、4台の検
査装置(ユニット)SU1,SU2,SU3,SU4を
横方向に並べて検査システムに構成され、そのうちの1
台SU1に設置した前記操作卓21によって、全ユニッ
トについての運転操作を行うように構成されている。
又、図1に示すように、各ユニットの前面側のカバー1
2のカバー上部12Aは、上下方向に開閉式に構成され
ており、そのカバー上部12Aを持ち上げた状態で、前
記透過光用反射板8Aの反射面hmの付け換え作業やラ
イン光源4A,4Bの交換作業、及び、装置内部の点検
等を行うようになっている。
Actually, as shown in FIG. 11, four inspection apparatuses (units) SU1, SU2, SU3, and SU4 are arranged in a horizontal direction to constitute an inspection system.
The operation console 21 installed on the table SU1 is configured to perform a driving operation for all units.
As shown in FIG. 1, a cover 1 on the front side of each unit is provided.
The upper cover 12A of the second unit is configured to be openable and closable in the vertical direction. With the upper cover 12A raised, the work of replacing the reflection surface hm of the reflection plate 8A for transmitted light and the operation of the line light sources 4A and 4B are performed. Replacement work and inspection of the inside of the device are performed.

【0037】前記表示卓21には、図12に示すよう
に、タッチパネルに構成した表示用の操作パネル21a
と、装置の電源を入り切りする主電源スイッチ21b
と、フィーダスイッチ21cと、排除スイッチ21dと
が設けられている。ここで、フィーダスイッチ21cを
入り操作すると、全ユニットのフィーダ9が一括して作
動し、排除スイッチ21dを入り操作すると、全ユニッ
トのエアー吹き付け装置6が一括して排除作動する。
又、各ユニットには、作動中の情報等を表示するための
LEDパネル20と、各エアタンク15から供給される
エアーの圧力を示す圧力計32とが設けられている。
As shown in FIG. 12, the display console 21 has a display operation panel 21a formed on a touch panel.
And a main power switch 21b for turning on / off the power of the apparatus
, A feeder switch 21c, and an exclusion switch 21d. Here, when the feeder switch 21c is turned on, the feeders 9 of all units operate collectively, and when the elimination switch 21d is turned on, the air blowing devices 6 of all units operate collectively.
Each unit is provided with an LED panel 20 for displaying information during operation and the like, and a pressure gauge 32 indicating the pressure of air supplied from each air tank 15.

【0038】制御構成を説明すると、図4に示すよう
に、マイクロコンピュータ利用の制御装置10が設けら
れ、この制御装置10に、両ラインセンサ5A,5Bか
らの各画像信号と、前記操作卓21からの操作情報と、
前記リミットスイッチLS1,LS2からの検出信号が
入力されている。一方、制御装置10からは、前記操作
卓21及びLEDパネル20に対する表示用の各駆動信
号と、前記ライン状光源4A,4B,4Cを点灯させる
点灯回路19に対する駆動信号と、前記回転灯18を作
動させる駆動信号と、各噴射ノズル6aへの各エアー供
給をオンオフする複数個の電磁弁11に対する駆動信号
と、前記フィーダ用振動発生器9Aに対する駆動信号
と、前記ロッドレスシリンダ26へのエアー流通をオン
オフする電磁弁26Aに対する駆動信号とが出力されて
いる。
To explain the control structure, as shown in FIG. 4, a control device 10 using a microcomputer is provided, and the control device 10 includes the image signals from both line sensors 5A and 5B and the console 21. Operation information from
Detection signals from the limit switches LS1 and LS2 are input. On the other hand, from the control device 10, each drive signal for display on the console 21 and the LED panel 20, a drive signal for a lighting circuit 19 for lighting the linear light sources 4A, 4B, 4C, and the rotary lamp 18 are transmitted. A drive signal to be actuated, a drive signal to a plurality of solenoid valves 11 for turning on and off each air supply to each injection nozzle 6a, a drive signal to the feeder vibration generator 9A, and air flow to the rodless cylinder 26 And a drive signal for the electromagnetic valve 26A that turns on and off the power supply.

【0039】上記制御装置10を利用して、前記米粒群
kからの検出光(透過検出光及び反射検出光)及び前記
各反射面hmからの反射光を受光する前記受光手段5
(透過用及び反射用ラインセンサ5A,5B)の受光情
報に基づいて、その受光量が前記米粒群kのうちの適正
物(良米)からの検出光に対する適正光量範囲を外れた
か否かの判別を行う判別手段100が構成されている。
具体的には、この判別手段100は、前記透過用ライン
センサ5A及び反射用ラインセンサ5Bの各受光情報に
基づいて、各ラインセンサ5A,5Bに備えた前記受光
部5a夫々について、各受光部5aの受光量が適正光量
範囲(透過光の場合はΔEt、反射光の場合はΔEh)
を外れたか否かの判別を行う。
The light receiving means 5 which receives the detection light (transmission detection light and reflection detection light) from the rice grain group k and the reflection light from each reflection surface hm using the control device 10.
Based on the light reception information of the (transmission and reflection line sensors 5A, 5B), it is determined whether or not the amount of received light is out of the appropriate light amount range for the detection light from the proper one (good rice) in the rice grain group k. A determination unit 100 for performing the determination is configured.
More specifically, the determination means 100 determines, for each of the light receiving units 5a provided in each of the line sensors 5A and 5B, each light receiving unit based on the light receiving information of the transmission line sensor 5A and the reflection line sensor 5B. The light receiving amount of 5a is within an appropriate light amount range (ΔEt for transmitted light, ΔEh for reflected light).
Is determined.

【0040】又、前記制御装置10を利用して、上記判
別手段100の判別情報に基づいて、前記エアー吹き付
け装置6の作動を制御する制御手段101が構成され、
この制御手段101が、前記検査対象物の種類が変更さ
れるのに応じた異なる制御パラメータを備えた複数の検
査モードに、択一的に切換自在に構成されている。
Further, control means 101 for controlling the operation of the air blowing device 6 based on the discrimination information of the discrimination means 100 using the control device 10 is constituted.
The control means 101 is configured to be selectively switchable to a plurality of inspection modes having different control parameters according to a change in the type of the inspection object.

【0041】具体的には、上記複数の検査モードが備え
る異なる制御パラメータとして、前記検出位置Jにて不
良物の存在が判別された後、前記エアー吹き付け装置6
を作動させるまでの時間間隔が含まれている。つまり、
前記予定移送経路(シュータ上の米粒群kの流れ経路及
びシュータ下端から落下する米粒群kの落下経路)にお
ける移送速度は検査対象物によって異なり、その移送速
度の違いによって、検出位置Jから分離箇所までの移送
時間が異なるからである。例えば、玄米の場合には、精
米の場合に比べて上記移送時間が約20パーセント程度
速くなる。そこで、前記制御手段101は、前記検査対
象物が前記精米及び玄米に変更されるのに応じて、精米
検査モード及び玄米検査モードに夫々切り換えられると
ともに、玄米検査モードでは、上記時間間隔を精米検査
モードの場合に比べて約20パーセント程度短く設定し
ている。
More specifically, as a different control parameter provided in the plurality of inspection modes, after the presence of a defective object is detected at the detection position J, the air blowing device 6
The time interval before activating is included. That is,
The transfer speed in the planned transfer path (the flow path of the rice grain group k on the chute and the fall path of the rice particle group k falling from the lower end of the chute) differs depending on the inspection object. This is because the transfer time until the transfer is different. For example, in the case of brown rice, the transfer time is about 20% faster than in the case of milled rice. Therefore, the control means 101 switches to the rice polishing mode and the brown rice inspection mode in accordance with the change of the inspection target to the rice polishing and the brown rice, respectively. It is set to be about 20% shorter than in the mode.

【0042】又、上記制御手段101は、前記判別手段
100にて、前記ライン状に並ぶ設定個数の受光部5a
の受光量が連続して前記適正光量範囲を外れたことが判
別された場合にのみ、不良物の存在を判別する連結判別
処理を行うように構成されるとともに、前記複数の検査
モードが備える異なる制御パラメータとして、前記連結
判別処理における受光部5aの設定個数の値が含まれて
いる。具体的には、図13(イ)に例示するように、玄
米kでは、透過光に対して不透明な胚芽kgの部分が残
っているので、この胚芽kgを不良物として判別するの
を回避させるために、制御手段101は、前記玄米検査
モードにおいて且つ前記透過用ラインセンサ5Aに備え
複数個の受光部5aの受光情報についてのみ、設定個数
(例えば、5個)の受光部5aの受光量が連続して前記
適正光量範囲を外れたことが判別された場合に、不良物
の存在を判別する連結判別処理を行うように構成されて
いる。つまり、上記胚芽kgの部分が受光されたときに
連続して適正光量範囲を外れる受光部5aの数を、最大
4個として上記連結判別処理により、図(ロ)のように
4個の受光部5aが連続して適正光量範囲を外れたとき
に、不良物と誤って判別しないようにしている。従っ
て、玄米検査モードの反射用ラインセンサ5B、並びに
精米検査モードの透過用及び反射用ラインセンサ5A,
5Bの受光部5aの受光情報については、上記連結判別
処理は行わない。
The control means 101 causes the discriminating means 100 to set the number of light receiving sections 5a arranged in a line.
Only when it is determined that the amount of received light is out of the proper light amount range continuously, a connection determination process for determining the presence of a defective object is performed, and the plurality of inspection modes are different. The control parameter includes the value of the set number of the light receiving units 5a in the connection determination processing. Specifically, as illustrated in FIG. 13A, in the brown rice k, a portion of the germ kg that is opaque to the transmitted light remains, so that it is avoided to determine the germ kg as a defective. For this reason, the control unit 101 determines that the light receiving amount of the set number (for example, five) of the light receiving units 5a is the only one in the brown rice inspection mode and the light receiving information of the plurality of light receiving units 5a provided in the transmission line sensor 5A. When it is determined that the proper light amount range has been continuously deviated, a connection determination process for determining the presence of a defective object is performed. In other words, the number of the light receiving portions 5a that are continuously out of the appropriate light amount range when the portion of the embryo kg is received is set to a maximum of four, and as a result of the above connection discrimination processing, the four light receiving portions 5a as shown in FIG. When 5a continuously deviates from the appropriate light amount range, it is prevented from being erroneously determined to be defective. Therefore, the line sensor 5B for reflection in the brown rice inspection mode, and the line sensor 5A for transmission and reflection in the rice inspection mode,
The connection determination processing is not performed on the light reception information of the light receiving unit 5a of 5B.

【0043】次に、各検査対象物(精米と玄米)につい
て、前記適正光量範囲を設定するための補正処理につい
て説明する。照明光源5A,5Bからの照明光量が十分
に安定した状態で、図14及び図15に示すように、前
記米粒群kにおける適正物(正常米)と透過率及び反射
率が同一の長尺状の検査基準物Kjを前記検出位置Jに
位置させて、前記透過用及び反射用ラインセンサ5A,
5Bが受光する各受光情報を基準受光量情報として求め
る。つまり、各センサ5A,5Bの各受光部5a毎に、
透過光の基準受光量Siと反射光の基準受光量Si'
(i=0〜〔受光部の数−1〕)を記憶し、同時に、そ
の基準受光量Si,Si' についての平均値Sm,S
m' を求めておく(この処理を「リファレンスデータ作
成」と呼ぶ)。ここで、検査基準物Kjは、各検査対象
物(精米と玄米)に合わせた色の樹脂板等にて構成さ
れ、各検査対象物(精米と玄米)毎に、検査基準物Kj
を交換して、上記「リファレンスデータ作成」を行う。
Next, a description will be given of a correction process for setting the appropriate light amount range for each inspection object (polished rice and brown rice). In a state where the illumination light amounts from the illumination light sources 5A and 5B are sufficiently stable, as shown in FIGS. 14 and 15, a long product having the same transmittance and reflectance as the proper product (normal rice) in the rice grain group k is used. Is positioned at the detection position J, and the transmission and reflection line sensors 5A, 5A,
Each piece of light receiving information received by 5B is obtained as reference light receiving amount information. That is, for each light receiving section 5a of each sensor 5A, 5B,
Reference received light amount Si of transmitted light and reference received light amount Si 'of reflected light
(I = 0 to [the number of light-receiving parts-1]), and at the same time, average values Sm, Sm for the reference light-receiving amounts Si, Si '.
m ′ is obtained (this process is called “reference data creation”). Here, the inspection reference material Kj is formed of a resin plate or the like of a color corresponding to each inspection object (polished rice and brown rice), and is provided for each inspection object (polished rice and brown rice).
Are exchanged, and the above-mentioned “reference data creation” is performed.

【0044】又、照明光源5A,5Bからの照明光量の
変動を検出する。具体的には、照明光量が十分に安定し
た状態で、図16に示すように、前記反射光用反射板8
Bからの反射光を受光する反射用ラインセンサ5Bの各
受光部5aの出力電圧r〔i〕(i=0〜〔受光部の数
−1〕)を基準の照明光量値として計測し、その全受光
部についての平均値rmを求めておく(この処理を「照
明光補正データ作成」と呼ぶ)。一方、実際の検査を行
う最新の時点で、上記反射用反射板8Bからの反射光を
受光する反射用ラインセンサ5Bの各受光部5aの出力
電圧r' 〔i〕を計測し、その全受光部についての平均
値rm' を求め、基準の照明光量値の平均値rmと最新
の照明光量値の平均値rm' との比(rm' /rm)を
照明光量の変化率とする。
Also, a change in the amount of illumination light from the illumination light sources 5A and 5B is detected. Specifically, in a state where the illumination light amount is sufficiently stable, as shown in FIG.
The output voltage r [i] (i = 0 to [the number of light-receiving portions−1]) of each light-receiving portion 5a of the reflection line sensor 5B that receives the reflected light from B is measured as a reference illumination light amount value. An average value rm for all light receiving units is obtained in advance (this process is referred to as “illumination light correction data creation”). On the other hand, at the latest time when the actual inspection is performed, the output voltage r '[i] of each light receiving section 5a of the reflection line sensor 5B that receives the reflected light from the reflection reflector 8B is measured, and the total light reception is performed. The average value rm 'of the part is obtained, and the ratio (rm' / rm) of the average value rm of the reference illumination light value to the average value rm 'of the latest illumination light value is defined as the change rate of the illumination light amount.

【0045】尚、上記照明光量の安定状態を得るため
に、出荷調整時等において、点灯後充分な時間が経過し
てから上記基準光量の測定を行う。又、実際の検査運転
時には、清掃動作を行う時間間隔を設定して(例えば3
0分)検査を行い、その清掃間隔の時間が経過すると、
前記清掃手段Cにて窓部14A,14Bが清掃されるの
で、その清掃後に、前記照明光量の測定を行う。
In order to obtain a stable state of the illumination light quantity, the reference light quantity is measured after a sufficient time elapses after lighting at the time of shipment adjustment or the like. At the time of the actual inspection operation, a time interval for performing the cleaning operation is set (for example, 3.
0 minutes) After performing the inspection and the time of the cleaning interval elapses,
Since the windows 14A and 14B are cleaned by the cleaning unit C, the illumination light amount is measured after the cleaning.

【0046】そして、透過光及び反射光の各センサ出力
電圧jについて、基準受光量の平均値Sm,Sm' に対
する各受光部5aの基準受光量Si,Si' の偏差を打
ち消すために、基準受光量の平均値Sm,Sm' と各受
光部5aの基準受光量Si,Si' の比を掛け、さら
に、照明光量の変動の影響を打ち消すために、前記照明
光量の変化率(rm' /rm)で割るように、下式に基
づいて補正処理して、透過光センサ5Bの補正後の出力
電圧jt(センサ補正出力)、及び反射光センサ5Aの
補正後の出力電圧jh(センサ補正出力)を得る。
Then, for each sensor output voltage j of the transmitted light and the reflected light, the reference light receiving amount Si, Si 'of each light receiving section 5a with respect to the average value Sm, Sm' of the reference light receiving amount is cancelled. In order to multiply the average value Sm, Sm 'of the light quantity by the ratio of the reference light receiving quantity Si, Si' of each light receiving section 5a, and to cancel the influence of the fluctuation of the light quantity, the change rate of the light quantity (rm '/ rm) ), The corrected output voltage jt of the transmitted light sensor 5B (sensor correction output) and the corrected output voltage jh of the reflected light sensor 5A (sensor correction output) Get.

【0047】[0047]

【数1】センサ補正出力jt=j×(Sm/Si)×
(rm/rm' ) センサ補正出力jh=j×(Sm' /Si' )×(rm
/rm' )
## EQU1 ## Sensor correction output jt = j × (Sm / Si) ×
(Rm / rm ′) Sensor correction output jh = j × (Sm ′ / Si ′) × (rm
/ Rm ')

【0048】次に、上記各センサ補正出力jt,jhに
ついての感度補正処理を行う。ここでは、感度値を標準
値(100)に設定する。尚、実際の検査運転時におい
て、感度値を100より大に(例えば、110)に設定
すると、基準受光量の平均値Sm,Sm' からの各セン
サ補正出力jt,jhの偏差(jt−Sm),(jh−
Sm' )が大きくなるように検出受光量が増加補正さ
れ、感度値を100より小に(例えば、90)に設定す
ると、上記偏差(jt−Sm),(jh−Sm' )が小
さくなるように検出受光量が減少補正された透過光及び
反射光の各感度補正出力jk,jk' が得られる。
Next, a sensitivity correction process is performed on the sensor correction outputs jt and jh. Here, the sensitivity value is set to a standard value (100). When the sensitivity value is set to a value larger than 100 (for example, 110) during the actual inspection operation, the deviation (jt−Sm) of each sensor correction output jt, jh from the average value Sm, Sm ′ of the reference light receiving amount. ), (Jh-
When the sensitivity value is set to a value smaller than 100 (for example, 90), the deviations (jt-Sm) and (jh-Sm ') are reduced. Then, the sensitivity correction outputs jk and jk 'of the transmitted light and the reflected light whose detection light reception amount is corrected to decrease are obtained.

【0049】[0049]

【数2】感度補正出力jk=(感度値/100)×(j
t−Sm)+(Sm) 感度補正出力jk' =(感度値/100)×(jh−S
m' )+(Sm' )
## EQU2 ## Sensitivity correction output jk = (sensitivity value / 100) × (j
t−Sm) + (Sm) Sensitivity correction output jk ′ = (sensitivity value / 100) × (jh−S
m ') + (Sm')

【0050】つまり、前記制御装置10は、前記透過用
及び反射用ラインセンサ5A,5Bからの受光量(上式
のjt及びjh)を増減させるための補正係数(感度
値)を変更設定して、前記適正光量範囲に対する受光量
の感度を補正するように構成されている。そして、感度
値を100より大きくして上記受光量を増加させると、
増加補正された受光量が適正光量範囲から外れ易くなっ
て不良判別の感度が高くなり、一方、感度値を100よ
り小さくして上記受光量を減少させると、減少補正され
た受光量が適正光量範囲から外れ難くなって不良判別の
感度が低くなるように、透過光及び反射光の適正光量範
囲に対する受光量の感度が補正される。
That is, the controller 10 changes and sets a correction coefficient (sensitivity value) for increasing or decreasing the amount of light received from the transmission and reflection line sensors 5A and 5B (jt and jh in the above equation). , The sensitivity of the received light amount with respect to the appropriate light amount range is corrected. Then, when the sensitivity value is increased to more than 100 and the amount of received light is increased,
The increased amount of received light is likely to be out of the appropriate light amount range, and the sensitivity of defect determination is increased. On the other hand, if the sensitivity value is reduced to less than 100 and the amount of received light is reduced, the decreased corrected amount of received light becomes the appropriate amount of light. The sensitivity of the received light amount to the appropriate light amount range of the transmitted light and the reflected light is corrected so that it is difficult to deviate from the range and the sensitivity of the defect determination is reduced.

【0051】次に、前記適正光量範囲の設定について具
体的に説明すると、前記操作卓21に備えた操作パネル
21aを用いて、各ユニットSU1〜SU4を順番に選
択して上記適正光量範囲の設定操作を行う。先ず、前記
主電源スイッチ21bを入り操作すると、操作パネル2
1aが図17に示す初期画面になり、この初期画面に
は、4つのユニット番号表示60の下に、各ユニットS
U1,2,3,4の処理速度の設定値61、フィーダ9
の流量の設定値62、及び前記感度の設定値63につい
ての現在の状態が示されている。ここで、3つのユニッ
トSU1,2,3は、外部からの検査対象物について、
高速の処理速度で一次選別を行い、その3つのユニット
SU1,2,3による一次選別後の不良物について、良
品を2次選別する処理をユニットSU4で低速の処理速
度で行うように設定されている。又、画面下部に、光源
の使用累積時間の表示箇所65と、現在の運転モードの
表示箇所66(図では、「玄米1」を例示している)が
設けられている。尚、排除率の表示箇所64には、実際
に排除動作が行われているときに、その頻度がバーグラ
フ表示される。
Next, the setting of the appropriate light quantity range will be described in detail. Using the operation panel 21a provided on the console 21, the units SU1 to SU4 are sequentially selected to set the appropriate light quantity range. Perform the operation. First, when the main power switch 21b is turned on and operated, the operation panel 2 is turned on.
1a is the initial screen shown in FIG. 17, and the initial screen includes four unit number displays 60, each unit S
U1, 2, 3, 4 processing speed set value 61, feeder 9
The current state of the set value 62 of the flow rate and the set value 63 of the sensitivity is shown. Here, the three units SU1, SU2, and SU3 are used for inspection objects from outside.
The primary sorting is performed at a high processing speed, and for the defectives after the primary sorting by the three units SU1, SU2, and SU3, the process of secondary sorting of non-defective products is performed at the unit SU4 at a low processing speed. I have. Further, at the lower part of the screen, a display location 65 of the cumulative use time of the light source and a display location 66 of the current operation mode (in the figure, “Brown rice 1” is illustrated) are provided. In the exclusion rate display area 64, when the exclusion operation is actually performed, the frequency of the exclusion operation is displayed as a bar graph.

【0052】そして、初期画面の右下の設定変更キー6
7に指等を触れると、図18に示す設定変更画面に切り
換わり、この設定変更画面には、運転モードの切換設定
キー70、前記フィーダ9の流量設定用のフィーダキー
71、フィーダ/排除のON/OFFキー72、時刻調
整用の時計キー73、前記感度の設定キー74、光源安
定時間の設定キー75、清掃間隔の設定キー75、及び
手動排除キー77が設けられ、画面左下には、元の初期
画面に戻すためのモニタ画面キー78が設けられてい
る。ここで、運転モードキー70に触れると、図19に
示す運転モード設定画面に切り換わる。
Then, a setting change key 6 at the lower right of the initial screen
When a finger or the like is touched on the screen 7, the screen is switched to a setting change screen shown in FIG. 18. The setting change screen includes an operation mode switching setting key 70, a feeder key 71 for setting the flow rate of the feeder 9, and a feeder / exclusion switch. An ON / OFF key 72, a clock key 73 for time adjustment, a key 74 for setting the sensitivity, a key 75 for setting a light source stabilization time, a key 75 for setting a cleaning interval, and a manual exclusion key 77 are provided. A monitor screen key 78 for returning to the original initial screen is provided. Here, when the operation mode key 70 is touched, the screen is switched to an operation mode setting screen shown in FIG.

【0053】運転モード設定画面には、現在の運転モー
ド(図では、「ヤケウチ」モードを例示している)を示
す現在モード表示部80と、変更する運転モードを示す
変更モード表示部81とが設けられ、この変更モード表
示部81の左右両側は設けたアップダウンキー式の表示
変更81a,81bを操作して、変更モード表示部81
を目的の運転モードの表示(図では、「玄米2」を例示
している)を切り換えてから、画面右下の設定キー83
に触れると、変更モード表示部81に表示された運転モ
ードに切り換わる。尚、画面左下のメニューキー82に
触れると、元の設定変更画面に戻る。
On the operation mode setting screen, a current mode display section 80 indicating the current operation mode (in the figure, the “Yakeuchi” mode is illustrated) and a change mode display section 81 indicating the operation mode to be changed are shown. The left and right sides of the change mode display section 81 are operated by operating the up / down key type display changes 81a and 81b provided to change the change mode display section 81.
Is switched to the display of the desired operation mode (“Brown rice 2” is illustrated in the figure), and then the setting key 83 at the lower right of the screen is displayed.
When is touched, the operation mode is switched to the operation mode displayed on the change mode display section 81. If the user touches the menu key 82 at the lower left of the screen, the screen returns to the original setting change screen.

【0054】又、前記設定変更画面(図18)で、感度
の設定キー74に触れると、図20に示す感度値設定画
面に切り換わる。図では、4つのユニットの感度値を標
準の感度値(100)に設定している。尚、この感度値
設定画面には、各ユニットの番号を表示し且つタッチパ
ネルに構成されたユニット表示部34と、各ユニットの
感度値を表示する感度表示部35と、その感度値を増減
させる感度値増減キー36とが設けられている。そし
て、ユニット表示部34に指等を触れて感度値設定する
ユニットを選択すると、表示がポジからネガに反転して
選択されたことが示され、その状態で、感度表示部35
にて感度値を確認しながら感度値増減キー36を操作し
て感度値を変更設定する。尚、画面左下には、前記メニ
ューキー82が設けられ、画面右下には、識別レベルキ
ー84が設けられている。
Touching the sensitivity setting key 74 on the setting change screen (FIG. 18) switches to the sensitivity value setting screen shown in FIG. In the figure, the sensitivity values of the four units are set to the standard sensitivity value (100). The sensitivity value setting screen displays a unit display unit 34 that displays the number of each unit and is configured on a touch panel, a sensitivity display unit 35 that displays the sensitivity value of each unit, and a sensitivity that increases or decreases the sensitivity value. A value increase / decrease key 36 is provided. Then, when the user selects a unit whose sensitivity value is to be set by touching the unit display section 34 with a finger or the like, the display is inverted from positive to negative to indicate that the selection has been made. In this state, the sensitivity display section 35 is displayed.
The sensitivity value is changed and set by operating the sensitivity value increase / decrease key 36 while checking the sensitivity value. The menu key 82 is provided at the lower left of the screen, and the identification level key 84 is provided at the lower right of the screen.

【0055】そして、上記識別レベルキー84に触れる
と、図21に示す識別レベル設定画面に切り換わる。こ
の識別レベル設定画面の上側には、ユニット番号を表示
し且つタッチパネルに構成されたユニット表示部37
と、現在の運転モードの表示部45(図では、「玄米
1」を表示している)と、透過と反射を切り換える透過
/反射キー46が設けられている。画面中央には、受光
データの度数分布(ヒストグラム)hgや、適正光量範
囲の上限値を示す上限値マーク49a及び下限値を示す
下限値マーク48aを表示するグラフィック表示部47
とが設けられている。画面の下側には、フィーダ用のO
Nキー38aとOFFキー38bと、計測キー44と、
設定キー39と、上限値表示部49a及び下限値表示部
48aを移動操作する移動キー48,49が設けられて
いる。
When the identification level key 84 is touched, the screen is switched to an identification level setting screen shown in FIG. A unit number is displayed on the upper side of the identification level setting screen, and a unit display section 37 formed on a touch panel is provided.
, A display unit 45 for the current operation mode (in the figure, "Brown rice 1" is displayed), and a transmission / reflection key 46 for switching between transmission and reflection. In the center of the screen, a graphic display unit 47 displaying a frequency distribution (histogram) hg of the received light data, an upper limit mark 49a indicating the upper limit of the appropriate light amount range, and a lower limit mark 48a indicating the lower limit.
Are provided. At the bottom of the screen is an O for the feeder.
N key 38a, OFF key 38b, measurement key 44,
A setting key 39 and movement keys 48 and 49 for moving the upper limit display 49a and the lower limit display 48a are provided.

【0056】そして、ユニット表示部37にて1つのユ
ニットを選択し、フィーダ用のONキー38aとOFF
キー38bをON/OFF操作して、所定時間に所定量
の米粒群kを流下させながら、計測キー44を押して計
測状態を選択して、前記透過光及び反射光での各受光情
報のデータ群を得る。そして、この受光データについ
て、前述のセンサ補正出力処理と、標準感度値(10
0)での感度補正出力処理とがなされ、その補正後の透
過光及び反射光での各受光データについて、暗側から明
側に亘る各受光量に対する度数分布hgが求められる。
次に、透過/反射キー46にて透過又は反射を選択する
と、透過又は反射光における、横軸が各受光量で縦軸が
各受光量に対する度数を表す上記度数分布hgが、グラ
フィック表示部47に表示される。そこで、前記上限値
マーク(縦線)と下限値マーク(縦線)を移動キー4
8,49にて明側又は暗側に移動させて、度数分布に対
する各マークの位置を適切な位置に調整してから、設定
キー44を押すと、その各マークの位置に対応して、前
記適正光量範囲の上限値と、下限値とが設定される。つ
まり、透過又は反射光の夫々において、上限値マーク4
9aと下限値マーク48aとの間の範囲として、透過光
の適正光量範囲ΔEt又は反射光の適正光量範囲ΔEh
が定まる。
Then, one unit is selected in the unit display section 37, and the feeder ON key 38a and the OFF
By pressing the key 38b ON / OFF to cause a predetermined amount of rice grains k to flow down for a predetermined time, the measurement key 44 is pressed to select a measurement state, and a data group of each light reception information in the transmitted light and the reflected light is selected. Get. Then, for the received light data, the sensor correction output processing described above and the standard sensitivity value (10
A sensitivity correction output process in step 0) is performed, and a frequency distribution hg for each light reception amount from the dark side to the light side is obtained for each light reception data of the transmitted light and the reflected light after the correction.
Next, when transmission or reflection is selected with the transmission / reflection key 46, the frequency distribution hg in which the horizontal axis represents the amount of received light and the vertical axis represents the frequency for each amount of received light in the transmitted or reflected light is represented by the graphic display unit 47. Will be displayed. Then, the upper limit mark (vertical line) and the lower limit mark (vertical line) are
At 8 and 49, the mark is moved to the light side or the dark side to adjust the position of each mark with respect to the frequency distribution to an appropriate position, and then the setting key 44 is pressed. An upper limit value and a lower limit value of the appropriate light amount range are set. That is, in each of the transmitted or reflected light, the upper limit mark 4
9a and the lower limit mark 48a, the appropriate light amount range ΔEt for transmitted light or the appropriate light amount range ΔEh for reflected light
Is determined.

【0057】次に、上記設定した適正光量範囲ΔEt,
ΔEhに基づいて、図22に示すように、実際の不良検
出処理時の判別用データをルックアップテーブルとして
記憶するメモリLUT(透過光用のLUTと透過光用の
LUT)が、下記のようにして作成される。尚、このメ
モリLUT(透過光用のLUTと透過光用のLUT)
は、先ず、運転モードで指定された玄米について作成さ
れるが、同様に、運転モードを精米に切り換えて、精米
についても作成される。 (1)位置データi(i=0〜〔受光部の数−1〕)で
表した各受光部5a毎に、下式のように、各ラインセン
サ5A,5Bの出力電圧jを、とり得る全ての値(例え
ば、8ビットの信号とすると、256レベル)の範囲で
変化させながら、各値jに、前述の基準受光量の平均値
Sm,Sm' と各受光部5aの基準受光量Si,Si'
の比を掛けるとともに、前記照明光量の変化率(rm'
/rm)で割って出力電圧jの補正値を求め、その値が
前記適正光量範囲ΔEt,ΔEh内であれば、メモリL
UTの該当番地(i,j)に判定出力として「0」を記
憶させ、適正光量範囲ΔEt,ΔEhを外れていれば、
メモリLUTの該当番地(i,j)に判定出力として
「1」を記憶させる。尚、実際の運転時には、照明光量
が最初のものと異なるので、各検査運転時毎に、照明光
量の変化率(rm' /rm)のデータを求め、それに応
じて、上記メモリLUTのデータを書き換えて使用す
る。
Next, the appropriate light amount range ΔEt,
Based on ΔEh, as shown in FIG. 22, a memory LUT (a transmitted light LUT and a transmitted light LUT) that stores determination data at the time of actual defect detection processing as a look-up table is as follows. Created. This memory LUT (LUT for transmitted light and LUT for transmitted light)
Is first created for brown rice specified in the operation mode. Similarly, the operation mode is switched to milled rice, and milled rice is also created. (1) For each light receiving unit 5a represented by position data i (i = 0 to [number of light receiving units-1]), the output voltage j of each line sensor 5A, 5B can be obtained as in the following equation. The average value Sm, Sm 'of the above-mentioned reference light receiving amount and the reference light receiving amount Si of each light receiving unit 5a are added to each value j while changing the value within a range of all values (for example, 256 levels when an 8-bit signal is used). , Si '
And the rate of change of the illumination light quantity (rm ′)
/ Rm) to obtain a correction value of the output voltage j. If the correction value is within the appropriate light amount range ΔEt, ΔEh, the memory L
"0" is stored as the judgment output in the corresponding address (i, j) of the UT, and if the value is out of the appropriate light amount range ΔEt, ΔEh,
“1” is stored as a judgment output at the corresponding address (i, j) of the memory LUT. In the actual operation, the illumination light amount is different from the first one. Therefore, the data of the change rate (rm '/ rm) of the illumination light amount is obtained for each inspection operation, and the data of the memory LUT is changed accordingly. Rewrite and use.

【0058】[0058]

【数3】透過光出力jの補正値=j×(Sm/Si)×
(rm/rm' ) 反射光出力jの補正値=j×(Sm' /Si' )×(r
m/rm' )
## EQU3 ## Correction value of transmitted light output j = j × (Sm / Si) ×
(Rm / rm ') Correction value of reflected light output j = j * (Sm' / Si ') * (r
m / rm ')

【0059】(2)そして、上記作成したメモリLUT
に対して、受光部5aの位置データi(i=0〜〔受光
部の数−1〕)と、その位置iでの各ラインセンサ5
A,5Bの出力電圧jとを入力すると、その各受光部5
aについて、正常な米粒のときは判定出力「0」が、不
良物のときは判定出力「1」が夫々出力される。
(2) The memory LUT created above
With respect to the position data i (i = 0 to [the number of light receiving units−1]) of the light receiving unit 5a and the line sensors 5 at the position i.
When the output voltage j of each A and 5B is input, each light receiving unit 5
Regarding a, the judgment output “0” is output for a normal rice grain, and the judgment output “1” is output for a defective rice.

【0060】次に、透過光用及び反射光用の各ラインセ
ンサ5A,5Bの受光出力における不良物の判別につい
て、具体的に説明する。
Next, a specific description will be given of the determination of a defective object in the light receiving output of each of the line sensors 5A and 5B for transmitted light and reflected light.

【0061】透過光の場合は、図23の透過光用ライン
センサ5Aの補正後出力波形に示すように、各受光部5
aの受光量に対応する補正後の出力電圧が米粒群kに対
する適正光量範囲ΔEt内にある場合に正常な米粒の存
在を判別し、設定適正範囲ΔEtを外れた場合に米粒の
不良又は異物の存在を判別する。図中、e0は、正常米
粒からの標準的な透過光に対する出力電圧レベルであ
る。そして、適正光量範囲ΔEtよりも小さい場合に、
正常な米粒よりも透過率が小さい不良の米粒や異物等
(例えば、黒色の石粒)の存在を判別し、適正光量範囲
ΔEtよりも大きい場合に、正常な米粒kよりも透過率
が大きい明側の不良の米粒k又は前記異物の存在を判別
する。この明側の不良の米粒k又は異物の例としては、
薄い色付の透明なガラス片等である。図23には、受光
部5aの出力電圧(受光量)が、米粒kに一部着色部分
が存在する位置や黒色の石等の位置(e1で示す)、及
び、胴割れ部分が存在する位置(e2で示す)では、上
記適正光量範囲ΔEtよりも下側に位置し、又、正常な
米粒よりも透過率が大きい異物等が存在する場合には、
位置e4に示すように適正光量範囲ΔEtよりも上側に
位置している状態を例示している。
In the case of transmitted light, as shown in the corrected output waveform of the transmitted light line sensor 5A in FIG.
When the corrected output voltage corresponding to the received light amount a is within the appropriate light amount range ΔEt for the rice grain group k, the presence of normal rice grains is determined. When the output voltage is out of the set appropriate range ΔEt, defective rice grains or foreign matter is detected. Determine existence. In the figure, e0 is an output voltage level for standard transmitted light from normal rice grains. When the light amount is smaller than the appropriate light amount range ΔEt,
The presence of defective rice grains, foreign matter, etc. (for example, black stones) having a transmittance lower than that of normal rice grains is determined, and if the transmittance is larger than the appropriate light amount range ΔEt, a light having a transmittance higher than that of normal rice grains k. The presence of the defective rice grain k or the foreign matter on the side is determined. Examples of the defective rice grain k or foreign matter on the light side include:
Light colored transparent glass pieces. In FIG. 23, the output voltage (light reception amount) of the light receiving unit 5a is determined by the position where a part of the rice grain k is colored, the position of a black stone or the like (indicated by e1), and the position where a cracked body is present. (Indicated by e2), when there is a foreign substance or the like located below the appropriate light amount range ΔEt and having a transmittance higher than that of normal rice grains,
As shown in a position e <b> 4, a state where the position is located above the appropriate light amount range ΔEt is illustrated.

【0062】一方、反射光の場合には、図24の反射光
用のラインセンサ5Bの補正後出力波形に示すように、
各受光部5aの受光量に対応する補正後の出力電圧が適
正光量範囲ΔEh内にある場合に正常な米粒の存在を判
別し、適正光量範囲ΔEhを外れた場合に前記米粒の不
良又は前記異物の存在を判別する。図中、e0' は、正
常米粒からの標準的な反射光に対する出力電圧レベルで
ある。図24には、米粒kに一部着色部分が存在する位
置(e1' で示す)や胴割れ部分が存在する位置(e
2' で示す)では、上記適正光量範囲ΔEhから下側に
外れている状態を例示し、又、ガラス片等の異物が存在
する場合には、異物からの強い直接反射光によって位置
e3' に示すように適正光量範囲ΔEhから上側に外れ
ている状態を例示している。又、図示しないが、黒色の
石等では、反射率が非常に小さいので、波形において適
正光量範囲ΔEhから下側に大きく外れることになる。
On the other hand, in the case of reflected light, as shown in the corrected output waveform of the line sensor 5B for reflected light in FIG.
When the corrected output voltage corresponding to the amount of light received by each light receiving unit 5a is within the appropriate light amount range ΔEh, the presence of a normal rice grain is determined. Is determined. In the figure, e0 'is an output voltage level for standard reflected light from normal rice grains. FIG. 24 shows a position where a part of the rice grain k has a colored portion (indicated by e1 ') and a position where a cracked portion exists (e1).
2 ′) illustrates a state deviating downward from the appropriate light amount range ΔEh, and when a foreign substance such as a glass piece exists, the position e3 ′ is moved to the position e3 ′ by strong direct reflected light from the foreign substance. As shown in the figure, a state where the light amount deviates upward from the appropriate light amount range ΔEh is illustrated. Although not shown, the reflectance of a black stone or the like is very small, so that the waveform deviates greatly from the appropriate light amount range ΔEh downward.

【0063】そして、前記制御手段101は、前記両ラ
インセンサ5A,5Bの検出位置Jに移送した米粒群k
のうちで、米粒の不良又は異物の存在が判別された場合
には、前記調整された時間間隔が経過するに伴って、流
下している不良の米粒又は異物に対して、その位置に対
応する区画の各噴射ノズル6aからエアーを吹き付けて
正常な米粒の経路から分離させる。
The control means 101 controls the rice grain group k transferred to the detection position J of the line sensors 5A and 5B.
Among them, when it is determined that a defective rice grain or foreign matter is present, as the adjusted time interval elapses, the position of the defective rice grain or foreign matter flowing down corresponds to that position. Air is blown from each spray nozzle 6a in the section to separate the section from the path of normal rice grains.

【0064】次に、図25及び図26に示すフローチャ
ートに基づいて、不良物検出及び不良物除去のための分
離動作について説明する。出荷調整時(図25)には、
装置の電源をオンした後、照明光量が十分に安定したこ
とを確認してから、各検査対象物(精米と玄米)につい
て、以下の各処理を行う。先ず、前記「リファレンスデ
ータ作成」を行い、さらに、最初の「照明光補正データ
作成」の各処理を行う。次に、所定量の受光データの収
集して、それについてセンサ出力補正と感度補正(但
し、標準の感度値)を行い、受光量に対する度数分布を
表示する。そして、表示画面上で適正光量範囲ΔEt,
ΔEhに対する各上限値及び下限値の設定(「しきい値
設定」)を行い、この適正光量範囲ΔEt,ΔEhに基
づいてメモリLUTの作成する。最後に、受光位置Jで
不良物が判別された後、エアー吹き付け装置6の各ノズ
ルを作動させるまでの時間間隔の設定・調整を行う。
Next, a separation operation for detecting a defective object and removing the defective object will be described with reference to flowcharts shown in FIGS. At the time of shipment adjustment (Fig. 25),
After turning on the power of the apparatus, after confirming that the illumination light amount is sufficiently stable, the following processing is performed for each inspection object (polished rice and brown rice). First, the above-mentioned “reference data creation” is performed, and further, each process of the first “illumination light correction data creation” is performed. Next, a predetermined amount of received light data is collected, sensor output correction and sensitivity correction (standard sensitivity value) are performed on the collected data, and a frequency distribution with respect to the received light amount is displayed. Then, the appropriate light amount range ΔEt,
The upper limit value and the lower limit value for ΔEh are set (“threshold value setting”), and a memory LUT is created based on the appropriate light amount ranges ΔEt and ΔEh. Finally, after a defective object is determined at the light receiving position J, a time interval until each nozzle of the air blowing device 6 is operated is set and adjusted.

【0065】通常の検査運転時(図25)には、先ず、
装置の電源をオンしてから、検査する対象物(精米又は
玄米等)に応じて、前記運転モードや、感度値等の各種
の設定を行い、そして、設定された時間のウオームアッ
プ運転をしてから、そのときの最新の「照明光補正デー
タ作成」を行って照明光量の変化率のデータを算出し、
その照明光量の変化率のデータと、前記適正光量範囲Δ
Et,ΔEhとを使って、メモリ内のデータを書き換え
てメモリLUTを作成する。そして、上記修正後のメモ
リLUTを用いて、シュート1に米粒群kを供給して検
査を開始する。そして、設定清掃間隔(例えば30分)
経過すると、米粒群kの供給を止めて検査を停止し、前
記ワイパー23を作動させて窓部14A,14Bの清掃
を行うとともに、清掃後の「照明光補正データ作成」を
行って照明光量の変化率のデータを算出し、上記と同様
に、メモリ内のデータを書き換えて、メモリLUTを作
成する。そして、以後は、この修正後のメモリLUTを
用いて、再び、シュート1に米粒群kを供給して検査を
開始する。
At the time of normal inspection operation (FIG. 25), first,
After turning on the power of the device, various settings such as the operation mode and the sensitivity value are performed according to the inspection object (polished rice or brown rice, etc.), and the warm-up operation is performed for the set time. After that, perform the latest "illumination light correction data creation" at that time to calculate the data of the change rate of the illumination light amount,
The change rate data of the illumination light amount and the appropriate light amount range Δ
The data in the memory is rewritten using Et and ΔEh to create a memory LUT. Then, the inspection is started by supplying the rice grain group k to the chute 1 using the memory LUT after the correction. And the set cleaning interval (for example, 30 minutes)
After the lapse of time, the supply of the rice grain group k is stopped to stop the inspection, the wiper 23 is operated to clean the windows 14A and 14B, and "cleaning of illumination light correction data" after cleaning is performed to reduce the amount of illumination light. The data of the change rate is calculated, and the data in the memory is rewritten in the same manner as described above to create a memory LUT. Then, thereafter, the inspection is started by supplying the rice grain group k to the shoot 1 again using the memory LUT after the correction.

【0066】〔別実施形態〕上記実施形態では、複数種
の反射面を備えた着脱自在な反射部材(透過光用反射板
8A)が1個の場合を説明したが、これ以外に、複数個
の反射部材を設けることもできる。例えば、図8(ニ)
に示すように、上記精米用及び玄米用の反射面h1,h
2とは異なる検査対象物を検査するのに使用する反射面
h4を備えた別の反射部材8A' を、上記反射部材8A
と交互に付け換えて設置するようにしたり、あるいは、
上記1つの反射部材8Aに備えた反射面h1,h2を、
さらに2つの反射部材に備えるようにしたり、種々の形
態で実施することができる。つまり、これらの場合に
は、複数種の反射面h1,h2,h4のうちで、互いに
異なる種類の反射面h1,h2,h4を各別に備える複
数の反射部材8A,8A' が、前記複数種の反射面h
1,h2,h4を択一的に使用状態に切換えるように、
択一的に設置自在に設けられている。
[Alternative Embodiment] In the above-described embodiment, a case is described in which one detachable reflecting member (reflecting plate for transmitted light 8A) having a plurality of types of reflecting surfaces is provided. Can be provided. For example, FIG.
As shown in the figure, the reflecting surfaces h1 and h
2 is provided with another reflecting member 8A 'having a reflecting surface h4 used for inspecting an inspection object different from the reflecting member 8A.
Or alternately install it, or
The reflecting surfaces h1 and h2 provided on the one reflecting member 8A are
Further, it can be provided in two reflecting members or can be implemented in various forms. That is, in these cases, among the plurality of types of reflecting surfaces h1, h2, and h4, the plurality of reflecting members 8A and 8A 'each having different types of reflecting surfaces h1, h2, and h4 are used. Reflective surface h
So that 1, h2 and h4 can be switched to the use state alternatively.
Alternatively, it is provided to be freely installed.

【0067】上記実施形態では、透過光用の反射面hm
についてだけ、検査対象物の種類の変更に応じて、異な
る反射面を択一的に使用するように構成したが、反射光
用の反射面hmについても、同様に、検査対象物の種類
の変更に応じて、異なる反射面を択一的に使用するよう
に構成してもよい。
In the above embodiment, the reflection surface hm for transmitted light is used.
Is configured such that different reflecting surfaces are selectively used in accordance with the change in the type of the inspection object. However, the reflection surface hm for the reflected light is similarly changed in the type of the inspection object. May be configured such that different reflecting surfaces are used alternatively.

【0068】上記実施形態では、受光手段として、透過
光受光手段(透過光ラインセンサ5A)及び反射光受光
手段(反射光ラインセンサ5B)にて構成したが、透過
光又は反射光用のいずれかの受光手段で構成してもよ
い。尚、ラインセンサも、モノクロタイプのCCDライ
ンセンサ以外に、撮像管式のテレビカメラでもよい。
又、モノクロタイプではなく、カラータイプのCCDセ
ンサにて構成して、色情報R,G,B毎に不良米や異物
の存否をさらに精度良く判別してもよい。
In the above embodiment, the light receiving means is constituted by the transmitted light receiving means (transmitted light line sensor 5A) and the reflected light receiving means (reflected light line sensor 5B). Of light receiving means. The line sensor may be an image pickup tube type television camera other than the monochrome type CCD line sensor.
Instead of a monochrome type CCD sensor, a color type CCD sensor may be used to determine the presence or absence of defective rice or foreign matter for each of the color information R, G, and B with higher accuracy.

【0069】上記実施形態では、移送手段Hが、検査対
象物としての粒状体群を予定移送経路に沿って横幅方向
に広がった多数列の状態で移送し、これに合わせて、粒
状体群の存在予定箇所を直線状の広幅状態に構成した
が、これに限るものではない。例えば粒状体群を一列状
態で移送させて、その一列状態の粒状体群の存在予定箇
所を狭い幅の状態に構成してもよい。
In the above-described embodiment, the transfer means H transfers the group of granular objects as the inspection object in a state of a large number of rows extending in the width direction along the predetermined transfer path. The expected location is configured in a linear wide state, but is not limited to this. For example, the granular material group may be transported in a single line, and the portion where the single granular material group is expected to exist may be configured to have a narrow width.

【0070】又、上記実施形態では、分離手段を、不良
物に対してエアーを吹き付けて、適正物と異なる経路に
分離させるエアー吹きつけ装置6にて構成したが、これ
に限るものではなく、例えば不良物をエアーで吸引して
分離させる手段でもよい。
Further, in the above embodiment, the separating means is constituted by the air blowing device 6 which blows air to a defective product to separate the defective product into a route different from a proper product. However, the present invention is not limited to this. For example, a means for sucking and separating defectives by air may be used.

【0071】上記実施形態では、制御手段101が、検
査対象物の種類の変更に応じて、切換られる各検査モー
ドで、検査対象物の種類の変更に応じて備える異なる制
御パラメータとして、前述の不良判別後の分離作動させ
るまでの時間間隔や、連結判別処理における受光部の設
定個数の値に限るものではない。
In the above-described embodiment, the control means 101 determines the different control parameters provided in accordance with the change in the type of the inspection object in each of the inspection modes switched in accordance with the change in the type of the inspection object. It is not limited to the time interval until the separation operation after the discrimination or the value of the set number of the light receiving units in the connection discrimination processing.

【0072】次に、前記窓部14A,14Bを清掃する
清掃手段の別実施形態を、図27及び図28に示す。窓
部14A,14Bの夫々の長手方向の一端側から長手方
向に沿ってエアーを吹き付けて、窓部表面の塵等を除去
するための一対のノズル管90が、前記光源4C用の取
付板部材28の延長部に取り付けられている。そして、
上記ノズル管90には、前記エアタンク15からのエア
ーが電磁弁(図示しない)によって断続された後、エア
チューブ91を介して供給され、そのエアーが各ノズル
管90に縦方向に2列状に形成したノズル穴90aから
噴出するように構成されている。
Next, another embodiment of the cleaning means for cleaning the windows 14A and 14B is shown in FIGS. 27 and 28. FIG. A pair of nozzle tubes 90 for blowing air from one end of each of the windows 14A and 14B in the longitudinal direction along the longitudinal direction to remove dust and the like on the surface of the window is a mounting plate member for the light source 4C. It is attached to 28 extensions. And
Air from the air tank 15 is supplied to the nozzle pipes 90 via an air tube 91 after being interrupted by an electromagnetic valve (not shown), and the air is supplied to each nozzle pipe 90 in two rows in the vertical direction. It is configured to eject from the formed nozzle hole 90a.

【0073】上記実施形態では、検査対象物としての粒
状体群が精米や玄米等の米粒群kである場合について例
示したが、これに限るものではなく、例えば、プラスチ
ック粒群等を検査する場合にも適用できる。
In the above embodiment, the case where the granular material group as the inspection object is the rice particle group k such as polished rice or brown rice is exemplified. However, the present invention is not limited to this. Also applicable to

【図面の簡単な説明】[Brief description of the drawings]

【図1】不良物検出装置及び分離装置の全体側面図FIG. 1 is an overall side view of a defective object detection device and a separation device.

【図2】同要部側面図FIG. 2 is a side view of the main part.

【図3】同要部斜視図FIG. 3 is a perspective view of the main part.

【図4】制御構成のブロック図FIG. 4 is a block diagram of a control configuration.

【図5】ラインセンサの受光範囲を示す図FIG. 5 is a diagram showing a light receiving range of a line sensor.

【図6】精米及び玄米の吸光度を示すグラフFIG. 6 is a graph showing the absorbance of polished rice and brown rice.

【図7】反射部材の断面構造を示す側面図FIG. 7 is a side view showing a sectional structure of the reflection member.

【図8】反射面を示す斜視図FIG. 8 is a perspective view showing a reflection surface.

【図9】清掃手段の要部を示す平面図FIG. 9 is a plan view showing a main part of the cleaning unit.

【図10】清掃手段を示す側面図FIG. 10 is a side view showing a cleaning unit.

【図11】検査装置の全体正面図FIG. 11 is an overall front view of the inspection apparatus.

【図12】操作卓の正面図FIG. 12 is a front view of a console.

【図13】受光手段における受光部連結処理の説明図FIG. 13 is an explanatory diagram of a light receiving unit connecting process in a light receiving unit.

【図14】リファレンスデータ作成のための検出配置を
示す側面図
FIG. 14 is a side view showing a detection arrangement for creating reference data.

【図15】リファレンスデータ作成時の出力波形図FIG. 15 is an output waveform diagram when creating reference data.

【図16】照明光量の変化データを示す出力波形図FIG. 16 is an output waveform diagram showing illumination light change data.

【図17】操作卓の表示パネルの表示例を示す正面図FIG. 17 is a front view showing a display example of the display panel of the console.

【図18】表示パネルの表示例を示す正面図FIG. 18 is a front view showing a display example of a display panel.

【図19】表示パネルの表示例を示す正面図FIG. 19 is a front view showing a display example of a display panel.

【図20】表示パネルの表示例を概略図にて示す正面図FIG. 20 is a front view schematically showing a display example of a display panel.

【図21】表示パネルの表示例を概略図にて示す正面図FIG. 21 is a front view schematically showing a display example of a display panel.

【図22】不良判別用のメモリのブロック図FIG. 22 is a block diagram of a memory for determining a defect;

【図23】透過光用ラインセンサの補正後の出力波形図FIG. 23 is an output waveform diagram after correction of the transmitted light line sensor.

【図24】反射光用ラインセンサの補正後の出力波形図FIG. 24 is an output waveform diagram after correction of the reflected light line sensor.

【図25】制御作動のフローチャートFIG. 25 is a flowchart of a control operation.

【図26】制御作動のフローチャートFIG. 26 is a flowchart of a control operation.

【図27】別実施形態の清掃手段を示す側面図FIG. 27 is a side view showing a cleaning unit according to another embodiment.

【図28】別実施形態の清掃手段の作用状態を示す概略
横断平面図
FIG. 28 is a schematic cross-sectional plan view showing an operation state of a cleaning unit of another embodiment.

【符号の説明】[Explanation of symbols]

4 照明手段 5 受光手段 5a 受光部 5A 透過光受光手段 5B 反射光受光手段 6 分離手段 8A 反射部材 8A' 反射部材 100 判別手段 101 制御手段 hm 反射面 hm 反射光用反射面 hm 透過光用反射面 h1 精米用反射面 h2 玄米用反射面 h3 反射面 h4 反射面 H 移送手段 J 存在予定箇所 Reference Signs List 4 illuminating means 5 light receiving means 5a light receiving section 5A transmitted light receiving means 5B reflected light receiving means 6 separating means 8A reflecting member 8A 'reflecting member 100 discriminating means 101 control means hm reflecting surface hm reflecting surface for reflected light hm reflecting surface for transmitted light h1 Reflection surface for rice polishing h2 Reflection surface for brown rice h3 Reflection surface h4 Reflection surface H Means of transport J Planned location

───────────────────────────────────────────────────── フロントページの続き Fターム(参考) 2G051 AA04 AB02 BA01 BA08 BB01 CA03 CA07 CB01 CB02 CC11 DA01 DA05 DA13 EA11 EA12 EA14 EA24 EA26 EB01 EB09 EC01 EC02 EC03 FA01 3F079 AC15 BA06 CA32 CA44 CB25 CB30 CB32 CB33 CB34 CB35 CB38 CC03 CC11 DA06 EA11 EA19  ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 2G051 AA04 AB02 BA01 BA08 BB01 CA03 CA07 CB01 CB02 CC11 DA01 DA05 DA13 EA11 EA12 EA14 EA24 EA26 EB01 EB09 EC01 EC02 EC03 FA01 3F079 AC15 BA06 CA32 CA44 CB25 CB30 CB30 CB32 CB30 CB30 CC11 DA06 EA11 EA19

Claims (10)

【特許請求の範囲】[Claims] 【請求項1】 粒状体群を検査対象物として、その検査
対象物の存在予定箇所を照明する照明手段と、 前記照明手段にて照明された前記検査対象物からの検出
光を受光する受光手段と、 前記受光手段の受光方向であって前記存在予定箇所の背
部側箇所に設置されて、前記検査対象物のうちの適正物
からの検出光と同一又は略同一の明るさの光を前記受光
手段に向けて反射する反射面と、 前記検査対象物からの検出光及び前記反射面からの反射
光を受光する前記受光手段の受光情報に基づいて、その
受光量が前記検査対象物のうちの適正物からの検出光に
対する適正光量範囲を外れたか否かの判別を行う判別手
段とが設けられた不良物検出装置であって、 前記受光手段が、前記検査対象物としての粒状体群の各
粒の大きさよりも小さい範囲を夫々の受光対象範囲とす
る複数個の受光部を前記存在予定箇所の全体に亘って備
えて構成され、 前記判別手段が、前記受光手段に備えさせた前記複数個
の受光部夫々について前記判別を行うように構成され、 前記反射面として、前記検査対象物の種類が変更される
のに応じて変更されて、変更後の検査対象物のうちの適
正物からの検出光と同一又は略同一の明るさの光を前記
受光手段に向けて反射する複数種の反射面が、択一的に
使用自在に設けられている不良物検出装置。
An illumination unit configured to illuminate a portion where the inspection object is expected to be located with the group of granular objects as an inspection object; and a light receiving unit receiving light detected by the illumination object from the inspection object. A light receiving direction of the light receiving unit, which is installed at a position on the back side of the expected existence position, and receives the light having the same or substantially the same brightness as detection light from a proper one of the inspection objects. A reflection surface that reflects toward the means, based on light receiving information of the light receiving unit that receives the detection light from the inspection object and the reflection light from the reflection surface, the amount of received light is included in the inspection object. A determination unit for determining whether or not a proper light amount range for the detection light from the proper object is out of the range, wherein the light receiving unit is configured to detect each of the granular material groups as the inspection object. Range smaller than the size of the grain A plurality of light-receiving sections as respective light-receiving target ranges are provided over the entire expected location; and the determination section performs the determination for each of the plurality of light-receiving sections provided in the light-receiving section. The reflection surface is changed as the type of the inspection object is changed, and is the same or substantially the same as the detection light from the proper object in the changed inspection object. A defective object detection device in which a plurality of types of reflection surfaces for reflecting light of brightness toward the light receiving means are selectively used.
【請求項2】 前記照明手段が、前記検査対象物の種類
が変更されるのに応じて、その照明光の波長を、異なる
波長に変更自在に構成されている請求項1記載の不良物
検出装置。
2. The defective object detection device according to claim 1, wherein the illumination means is configured to be able to change the wavelength of the illumination light to a different wavelength in accordance with a change in the type of the inspection object. apparatus.
【請求項3】 前記複数種の反射面を備えた反射部材
が、前記複数種の反射面を択一的に使用状態に切換える
ように、設置状態を変更自在に設置されている請求項1
又は2記載の不良物検出装置。
3. A reflecting member having a plurality of types of reflecting surfaces is provided so as to be capable of changing an installation state so as to selectively switch the plurality of types of reflecting surfaces to a use state.
Or the defective object detection device according to 2.
【請求項4】前記複数種の反射面のうちで、互いに異な
る種類の反射面を各別に備える複数の反射部材が、前記
複数種の反射面を択一的に使用状態に切換えるように、
択一的に設置自在に設けられている請求項1叉は2記載
の不良物検出装置。
4. A plurality of reflecting members each having a different type of reflecting surface among the plurality of types of reflecting surfaces, so that the plurality of types of reflecting surfaces are selectively switched to a use state.
The defective object detecting device according to claim 1, wherein the defective object detecting device is provided so as to be selectively installed.
【請求項5】前記複数種の反射面のうちで、その一部の
種類のものを備える反射部材が、着脱自在に設置される
と共に、その反射部材の離脱状態において露出する部分
に、前記複数種の反射面のうちで、前記反射部材が備え
る反射面とは異なる種類の反射面が設けられている請求
項1叉は2記載の不良物検出装置。
5. A reflecting member having a part of the plurality of types of reflecting surfaces is detachably installed, and the plurality of reflecting surfaces are provided at portions exposed when the reflecting member is detached. The defective object detection device according to claim 1, wherein a reflection surface of a type different from a reflection surface provided in the reflection member is provided among the types of reflection surfaces.
【請求項6】 請求項1〜5のいずれか1項に記載の不
良物検出装置を備えた分離装置であって、 前記検査対象物としての粒状体群を、予定移送経路に沿
って前記予定存在箇所と、その予定存在箇所の位置より
も経路下手側の分離箇所とに移送する移送手段と、 前記分離箇所に移送された前記粒状体群のうちの適正物
と不良物とを異なる経路に分離させる分離手段と、 前記判別手段の判別情報に基づいて、前記分離手段の作
動を制御する制御手段とが設けられ、 前記制御手段が、前記検査対象物の種類が変更されるの
に応じた異なる制御パラメータを備えた複数の検査モー
ドに、択一的に切換自在に構成されている分離装置。
6. A separating apparatus provided with the defective object detecting device according to claim 1, wherein the particle group as the inspection object is set along the predetermined transfer path. A transfer means for transferring to an existing location and a separation location on the lower side of the route than the location of the planned existing location; and transferring a proper product and a defective product of the group of granular bodies transferred to the separation location to different routes. Separating means for separating, and control means for controlling the operation of the separating means based on the discrimination information of the discriminating means are provided, wherein the control means responds to a change in the type of the inspection object. A separation device configured to be selectively switched to a plurality of inspection modes having different control parameters.
【請求項7】 前記複数の検査モードが備える異なる制
御パラメータとして、前記存在予定箇所にて不良物の存
在が判別された後、前記分離手段を作動させるまでの時
間間隔が含まれている請求項6記載の分離装置。
7. The different control parameters provided in the plurality of inspection modes include a time interval from when the presence of a defective object is determined at the expected location to when the separating unit is operated. 7. The separation device according to 6.
【請求項8】 前記存在予定箇所が直線状に設定される
とともに、前記受光手段に備えた前記複数個の受光部
が、前記直線状の存在予定箇所に対応させてライン状に
並べられ、 前記制御手段は、前記判別手段にて、前記ライン状に並
ぶ設定個数の受光部の受光量が連続して前記適正光量範
囲を外れたことが判別された場合にのみ、不良物の存在
を判別する連結判別処理を行うように構成され、 前記複数の検査モードが備える異なる制御パラメータと
して、前記連結判別処理における受光部の設定個数の値
が含まれている請求項6又は7記載の分離装置。
8. The planned existence position is set in a straight line, and the plurality of light receiving portions provided in the light receiving means are arranged in a line corresponding to the linear planned existence position. The control means determines the presence of a defective object only when the determination means determines that the light receiving amount of the set number of light receiving portions arranged in a line continuously falls outside the appropriate light amount range. The separation device according to claim 6, wherein the connection determination process is performed, and the different control parameters included in the plurality of inspection modes include a value of a set number of light receiving units in the connection determination process.
【請求項9】 前記受光手段として、前記照明手段から
の照明光が前記検査対象物で反射した反射光を受光する
反射光受光手段と、前記照明手段からの照明光が前記検
査対象物を透過した透過光を受光する透過光受光手段と
が設けられ、 前記反射面として、前記反射光受光手段の受光方向であ
って前記存在予定箇所の背部側に、反射光用反射面が設
けられ、且つ、前記透過光受光手段の受光方向であって
前記存在予定箇所の背部側に、透過光用反射面が設けら
れ、 前記判別手段が、前記反射光受光手段及び前記透過光受
光手段の各受光情報に基づいて、前記判別を行うように
構成され、 前記検査対象物としての前記粒状体群が、精米及び玄米
に変更され、 前記透過光用反射面のみが、前記精米及び玄米の夫々に
対応するように形成された精米用反射面と玄米用反射面
とを備えて、それらが択一的に使用自在に構成されてい
る請求項6〜8のいずれか1項に記載の分離装置。
9. A reflection light receiving means for receiving reflected light of the illumination light from the illumination means reflected by the inspection object as the light receiving means, and an illumination light from the illumination means transmitting through the inspection object. Transmitted light receiving means for receiving the transmitted light, and a reflection surface for reflected light is provided as the reflection surface, in the light receiving direction of the reflected light reception means and on the back side of the expected existence position, and A reflection surface for transmitted light is provided in a light receiving direction of the transmitted light receiving unit and on a back side of the expected location; The granular material group as the inspection object is changed to polished rice and brown rice, and only the reflection surface for transmitted light corresponds to each of the polished rice and brown rice. The spirit formed as And a use reflecting surface and brown rice reflecting surface, they are separating apparatus according to any one of claims 6-8, which is configured to freely alternatively used.
【請求項10】 前記制御手段は、前記検査対象物が前
記精米及び玄米に変更されるのに応じて、精米検査モー
ド及び玄米検査モードに夫々切り換えられるとともに、
前記玄米検査モードにおいて且つ前記透過光受光手段に
備えた前記複数個の受光部の受光情報についてのみ、前
記連結判別処理を行うように構成されている請求項9記
載の分離装置。
10. The control means switches to a rice inspection mode and a brown rice inspection mode in response to the inspection object being changed to the milled rice and brown rice, respectively.
10. The separation apparatus according to claim 9, wherein in the brown rice inspection mode, the connection determining process is performed only on light reception information of the plurality of light receiving units provided in the transmitted light receiving unit.
JP10273509A 1998-09-28 1998-09-28 Detector for defective, and separator using same Pending JP2000097866A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10273509A JP2000097866A (en) 1998-09-28 1998-09-28 Detector for defective, and separator using same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10273509A JP2000097866A (en) 1998-09-28 1998-09-28 Detector for defective, and separator using same

Publications (1)

Publication Number Publication Date
JP2000097866A true JP2000097866A (en) 2000-04-07

Family

ID=17528874

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10273509A Pending JP2000097866A (en) 1998-09-28 1998-09-28 Detector for defective, and separator using same

Country Status (1)

Country Link
JP (1) JP2000097866A (en)

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JP2002181736A (en) * 2000-12-15 2002-06-26 Shimadzu Corp Apparatus for inspecting foreign matter
JP2006513402A (en) * 2002-09-13 2006-04-20 ソルテックス リミテッド Quality evaluation method for products flowing in bulk
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CN109142164A (en) * 2018-07-23 2019-01-04 深圳威琳懋生物科技有限公司 A kind of rice germ processing quality detection method
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Publication number Priority date Publication date Assignee Title
JP2002181736A (en) * 2000-12-15 2002-06-26 Shimadzu Corp Apparatus for inspecting foreign matter
JP2006513402A (en) * 2002-09-13 2006-04-20 ソルテックス リミテッド Quality evaluation method for products flowing in bulk
JP2008018419A (en) * 2006-06-15 2008-01-31 Satake Corp Optical body division sorting machine
JP2009018310A (en) * 2006-06-15 2009-01-29 Satake Corp Optical cracked-grain selection method
JP2008209302A (en) * 2007-02-27 2008-09-11 Yanmar Co Ltd Nondestructive inspection device and sorting device
JP2009039642A (en) * 2007-08-08 2009-02-26 Yamamoto Co Ltd Color sorting machine
JP2010078487A (en) * 2008-09-26 2010-04-08 Omron Corp Appearance inspection apparatus and program
JP2011088096A (en) * 2009-10-26 2011-05-06 Satake Corp Color selector
WO2011108160A1 (en) * 2010-03-01 2011-09-09 第一実業ビスウィル株式会社 Exterior inspection device
JP2012096211A (en) * 2010-11-05 2012-05-24 Satake Corp Unit type color sorter
KR20190052399A (en) * 2017-11-08 2019-05-16 주식회사 엠원인터내셔널 Appartus for measuring air pollutant and radiation around of life environmnet
KR101979712B1 (en) 2017-11-08 2019-05-17 주식회사 엠원인터내셔널 Appartus for measuring air pollutant and radiation around of life environmnet
CN109142164A (en) * 2018-07-23 2019-01-04 深圳威琳懋生物科技有限公司 A kind of rice germ processing quality detection method
JP7044150B1 (en) 2020-12-18 2022-03-30 株式会社サタケ Reference member and grain discriminator
WO2022130967A1 (en) * 2020-12-18 2022-06-23 株式会社サタケ Reference member and grain discrimination device
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