JP2000210626A - Defective article detector, and adjusting jig and adjusting method therefor - Google Patents
Defective article detector, and adjusting jig and adjusting method thereforInfo
- Publication number
- JP2000210626A JP2000210626A JP11013590A JP1359099A JP2000210626A JP 2000210626 A JP2000210626 A JP 2000210626A JP 11013590 A JP11013590 A JP 11013590A JP 1359099 A JP1359099 A JP 1359099A JP 2000210626 A JP2000210626 A JP 2000210626A
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- Prior art keywords
- light
- light receiving
- receiving means
- defective
- amount
- Prior art date
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- Investigating Or Analysing Materials By Optical Means (AREA)
- Sorting Of Articles (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、検査対象物として
の粒状体群を検出用の存在予定箇所において長尺の帯状
に存在させるように構成され、前記存在予定箇所を照明
する照明手段と、前記存在予定箇所の長手方向に沿って
分解能を有する状態で前記存在予定箇所側からの光を受
光する受光手段と、前記受光手段の受光方向であって前
記存在予定箇所の背部側箇所に設置されて、前記検査対
象物のうちの適正物からの検出光と同一又は略同一の明
るさの光を前記受光手段に向けて投射する長尺の帯状の
投射面と、前記検査対象物からの検出光及び前記投射面
からの投射光を受光する前記受光手段の受光情報に基づ
いて、その受光量が前記検査対象物のうちの適正物から
の検出光に対する適正光量範囲を外れたか否かの判別を
行う判別手段とが設けられた不良物検出装置、並びに、
その調整治具及び調整方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an illuminating means for illuminating a particle group as an object to be inspected in a long band at a point where the particle is to be detected. A light-receiving means for receiving light from the expected existence location side in a state having a resolution along the longitudinal direction of the expected existence location; and a light-receiving direction of the light-receiving means, which is installed at a location on the back side of the expected existence location. A long band-shaped projection surface for projecting light having the same or substantially the same brightness as detection light from a proper one of the inspection objects toward the light receiving means, and detecting the light from the inspection object. Based on light receiving information of the light receiving unit that receives light and the light projected from the projection surface, it is determined whether or not the amount of received light is out of a proper light amount range for detection light from a proper one of the inspection objects. The determination means for performing Vignetting defective product detecting device, and,
The present invention relates to an adjusting jig and an adjusting method.
【0002】[0002]
【従来の技術】上記不良物検出装置では、例えば特開平
9‐239330号公報に示すように、検査対象物とし
ての粒状体群例えば米粒群が横方向に広がった状態で移
送されて検出用の存在予定箇所に達すると、その存在予
定箇所の長手方向に沿って長尺の帯状状態で存在する米
粒群が蛍光灯等の照明光源にて照明されるとともに、C
CDラインセンサ等の受光手段の受光方向であって上記
存在予定箇所の背部側箇所に配置した投射面としての反
射面が上記光源にて照明されて、その反射面から受光手
段に向けて米粒群のうちの適正物からの検出光と同一又
は略同一の明るさの光が反射される。そして、米粒群で
反射し又は米粒群を透過した検出光及び上記反射面から
の反射光を受光した受光手段において、上記存在予定箇
所の長手方向に沿って所定分解能で並べた複数の受光部
夫々の受光量が予め設定した適正物に対する適正光量範
囲を外れると、着色米等の不良米や石・プラスチック・
ガラス等の不良物が存在すると判別して、上記存在予定
箇所の位置よりも下手側箇所に移送された米粒群中の不
良物に対して、複数並置させた噴出ノズル中の所定のノ
ズルからエアーを吹き付けて、適正物と異なる経路に分
離させるようにしている。2. Description of the Related Art In the above-mentioned defective object detecting device, as shown in, for example, Japanese Patent Application Laid-Open No. 9-239330, a group of particles, for example, a group of rice, as inspection objects is transported in a state of being spread in a lateral direction and used for detection. When the expected location is reached, the rice grains present in a long strip along the longitudinal direction of the expected location are illuminated by an illumination light source such as a fluorescent lamp, and C
A reflection surface as a projection surface, which is arranged in a light receiving direction of the light receiving means such as a CD line sensor and located on the back side of the expected existence position, is illuminated by the light source, and the rice grain group is directed from the reflection surface to the light receiving means. The light having the same or substantially the same brightness as the detection light from the appropriate object is reflected. Then, in the light receiving unit that receives the detection light reflected by or transmitted through the rice grain group and the reflection light from the reflection surface, the plurality of light receiving units arranged at a predetermined resolution along the longitudinal direction of the expected existence position are respectively provided. If the amount of received light is out of the appropriate light amount range for the appropriate object set in advance, defective rice such as colored rice, stone, plastic,
It is determined that a defect such as glass is present, and air is discharged from a predetermined nozzle among a plurality of jutting nozzles juxtaposed with respect to the defect in the rice grain group transferred to a position on the lower side of the expected position. Is sprayed to separate the path from the proper one.
【0003】説明を加えると、前記受光手段には透過光
式と反射光式とがあり、透過光式の受光手段に対しては
透過光用の反射面が設けられ、反射光式の受光手段に対
しては反射光用の反射面が設けられる。そして、実際の
装置では、両方の受光手段を設けたり、透過光式又は反
射光式のいずれか一方の受光手段を設けている。又、反
射光式の受光手段では、反射光用の反射面(米粒群で
は、米粒の明るさに合わせた白色面)を細い帯状に形成
するとともに、その反射面の幅方向の両側に近接させて
異なる反射率の領域(黒色面)を形成し、その黒色領域
からの反射光が透明なガラス片等の異物で屈折した光を
反射光式の受光手段にて受光して、上記ガラス片等の異
物を的確に検出するようにしている(前記した特開平9
‐239330号公報参照)。In addition, there are a transmitted light type and a reflected light type as the light receiving means, and a reflection surface for transmitted light is provided for the transmitted light type light receiving means, and a reflected light type light receiving means is provided. Is provided with a reflection surface for reflected light. In an actual apparatus, both light receiving means are provided, or one of a transmitted light type and a reflected light type is provided. Further, in the reflected light type light receiving means, a reflecting surface for reflected light (for a group of rice grains, a white surface corresponding to the brightness of the rice grains) is formed in a narrow band shape, and the reflecting surface is brought close to both sides in the width direction of the reflecting surface. Regions having different reflectivities (black surfaces) are formed, and light reflected from the black regions is refracted by a foreign substance such as a transparent glass piece by a reflected light type light receiving means. (See Japanese Patent Application Laid-Open No.
-239330).
【0004】ここで、米粒群が長尺の帯状に存在する上
記存在予定箇所に対して、CCDラインセンサの受光位
置つまりライン状の検出範囲が位置ずれしていると、存
在予定箇所において不良物の存否を判別し又その判別に
基づいて経路下手側において不良物をエアによって分離
させる動作が適切にできなくなるので、従来では、上記
存在予定箇所と受光位置との調整を行うために、存在予
定箇所に米粒群の存在位置を示す部材、例えば、先端部
で米粒群の存在位置を示す細い棒を存在予定箇所の長手
方向に交差する状態で配置して、CCDラインセンサの
受光信号を観察しながら、その受光信号に上記棒の先端
部の検出波形が現れるように状態になるように、受光手
段を光軸回りに回動調整したり、存在予定箇所に沿う軸
回りに揺動調整するようにしていた。上記調整によっ
て、反射面の幅が広い場合には、反射面に対する受光手
段(CCDラインセンサ)の受光位置の調整は不要であ
るが、前記したような狭い幅の反射面では、その反射面
内に受光手段の受光位置が位置していないおそれがある
ので、狭幅の反射面に対しては受光手段の受光位置の調
整が必要になる。そして、この反射面に対する受光位置
の調整は、CCDラインセンサの受光信号が反射面長手
方向の全幅において一定レベル以上になるように調整す
る。Here, if the light receiving position of the CCD line sensor, that is, the line-shaped detection range is displaced from the above-mentioned expected location where the rice grain group is present in a long strip shape, a defective object is expected at the expected existence location. In the prior art, it is not possible to properly determine whether or not there is a defect, and based on the determination, it is not possible to appropriately perform an operation of separating a defective object by air on the downstream side of the route. A member that indicates the location of the rice grain group at the location, for example, a thin rod that indicates the location of the rice grain group at the tip is disposed in a state that intersects the longitudinal direction of the location where the rice grain group is to be located, and the light receiving signal of the CCD line sensor is observed. Meanwhile, the light receiving means is rotated around the optical axis or swinged around the axis along the expected location so that the detected signal at the tip of the rod appears in the received light signal. It was way. If the width of the reflecting surface is wide due to the above adjustment, it is not necessary to adjust the light receiving position of the light receiving means (CCD line sensor) with respect to the reflecting surface. There is a possibility that the light receiving position of the light receiving means may not be located at the first position. Therefore, it is necessary to adjust the light receiving position of the light receiving means for the narrow reflecting surface. The adjustment of the light receiving position with respect to the reflection surface is performed so that the light reception signal of the CCD line sensor is equal to or higher than a certain level over the entire width in the longitudinal direction of the reflection surface.
【0005】[0005]
【発明が解決しようとする課題】しかしながら、上記従
来技術では、手作業によって、米粒群の存在位置を示す
部材(細い棒等)を存在予定箇所に位置させて調整を行
っていたので、その部材の設置が面倒であるという不具
合があった。又、前記狭い幅の反射面では、CCDライ
ンセンサの受光信号が反射面長手方向の全幅において一
定レベル以上になるように調整しているだけであるの
で、CCDラインセンサの受光位置が反射面の幅方向で
の端位置に調整されている場合には、運転時の振動等に
よって受光位置が反射面から外れて、適正な検出動作が
できなくなるおそれがあり、又、上記調整時において
は、CCDラインセンサの受光信号が低下していても、
ずれの方向が判らないので、受光位置の調整が容易でな
いという不具合もあった。因みに、前記存在予定箇所に
対して受光手段の受光位置を適正位置に調整することに
より、存在予定箇所での受光手段の受光情報に基づい
て、存在予定箇所よりも経路下手側において前記複数の
エア噴出ノズルを噴出作動させるタイミングは適正状態
になるが、前記のように、上記存在予定箇所に対する受
光手段の受光位置の調整後、さらに反射面に対して受光
位置の調整を行った場合には、上記タイミングが適正状
態からずれるので、そのずれを調整する必要がある。However, in the above-mentioned prior art, a member (a thin rod or the like) indicating the position where the rice grain cluster is present is manually positioned and adjusted at the expected position. Installation was troublesome. Also, with the narrow reflecting surface, the light receiving position of the CCD line sensor is merely adjusted so that the light receiving signal of the CCD line sensor is equal to or higher than a certain level over the entire width in the longitudinal direction of the reflecting surface. If the position is adjusted to the end position in the width direction, the light receiving position may deviate from the reflecting surface due to vibrations during operation or the like, and a proper detecting operation may not be performed. Even if the light reception signal of the line sensor is low,
Since the direction of the shift is not known, there is a problem that the adjustment of the light receiving position is not easy. Incidentally, by adjusting the light receiving position of the light receiving means to the appropriate position with respect to the expected existence location, based on the light receiving information of the light receiving means at the expected existence location, the plurality of air is located on the lower side of the route than the expected existence location. The timing of the ejection operation of the ejection nozzle is in an appropriate state, but as described above, after adjusting the light reception position of the light receiving means with respect to the expected existence position, if the light reception position is further adjusted with respect to the reflection surface, Since the above timing deviates from the proper state, it is necessary to adjust the deviation.
【0006】本発明は、上記実情に鑑みてなされたもの
であって、その目的は、上記従来技術の不具合を解消さ
せるべく、前記長尺帯状の投射面と受光手段の受光位置
とが投射面の幅方向において適正に位置調整されている
か否かを容易且つ迅速に判別することができる不良物検
出装置を提供し、並びに、存在予定箇所に対する受光手
段の受光位置の調整その他の調整を容易に行うことがで
きる調整治具、及び、存在予定箇所に対する受光手段の
受光位置の調整後、投射面に対する受光位置の調整を行
った場合に、受光手段の受光情報に基づいて複数のエア
噴出部を噴出作動させるタイミングを適正値に調整する
ための調整方法を提供することにある。SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances, and an object of the present invention is to solve the above-mentioned disadvantages of the prior art by setting the long strip-shaped projection surface and the light receiving position of the light receiving means to the projection surface. To provide a defective object detection device that can easily and quickly determine whether or not the position is properly adjusted in the width direction of the device, and easily adjust the light receiving position of the light receiving means with respect to the expected location. After the adjustment jig that can be performed, and after adjusting the light receiving position of the light receiving means with respect to the expected location, when adjusting the light receiving position with respect to the projection surface, a plurality of air ejecting portions are formed based on the light receiving information of the light receiving means. It is an object of the present invention to provide an adjustment method for adjusting the timing of the ejection operation to an appropriate value.
【0007】[0007]
【課題を解決するための手段】(請求項1の構成)請求
項1では、検査対象物としての粒状体群を検出用の存在
予定箇所において長尺の帯状に存在させるように構成さ
れ、前記存在予定箇所を照明する照明手段と、前記存在
予定箇所の長手方向に沿って分解能を有する状態で前記
存在予定箇所側からの光を受光する受光手段と、前記受
光手段の受光方向であって前記存在予定箇所の背部側箇
所に設置されて、前記検査対象物のうちの適正物からの
検出光と同一又は略同一の明るさの光を前記受光手段に
向けて投射する長尺の帯状の投射面と、前記検査対象物
からの検出光及び前記投射面からの投射光を受光する前
記受光手段の受光情報に基づいて、その受光量が前記検
査対象物のうちの適正物からの検出光に対する適正光量
範囲を外れたか否かの判別を行う判別手段とが設けられ
た不良物検出装置であって、前記投射面の長手方向にお
ける複数箇所に、前記投射面の幅方向における中央位置
であることを前記受光手段によって読み取り可能な表示
部分が形成されている。According to a first aspect of the present invention, there is provided an image processing apparatus, wherein a granular material group as an object to be inspected is present in a long band shape at a predetermined location for detection. Illuminating means for illuminating the expected existence location, light receiving means for receiving light from the expected existence location side with a resolution along the longitudinal direction of the expected existence location, and a light receiving direction of the light receiving means, A long strip-shaped projection that is installed at a location on the back side of the expected location and projects light having the same or substantially the same brightness as detection light from a proper one of the inspection objects toward the light receiving unit. Surface, based on the light receiving information of the light receiving means for receiving the detection light from the inspection object and the projection light from the projection surface, the amount of light received with respect to the detection light from the proper one of the inspection object Whether it is out of the appropriate light amount range And a discriminating means for discriminating the position, wherein the light receiving means can read at a plurality of locations in the longitudinal direction of the projection surface, the central position in the width direction of the projection surface. A display portion is formed.
【0008】(請求項1の作用)検査対象物としての粒
状体群が長尺の帯状に存在する検出用の存在予定箇所が
照明手段にて照明され、前記存在予定箇所の長手方向に
沿って分解能を有する状態で前記存在予定箇所側からの
光を受光する受光手段によって、上記検査対象物からの
検出光と、その受光手段の受光方向であって上記存在予
定箇所の背部側箇所に設置されて、上記検査対象物のう
ちの適正物からの検出光と同一又は略同一の明るさの光
を受光手段に向けて投射する長尺の帯状の投射面からの
投射光が受光され、上記粒状体群からの検出光及び投射
面からの投射光を受光する受光手段の受光量が、前記検
査対象物のうちの適正物からの検出光に対する適正光量
範囲を外れたか否かの判別が行われる前記不良物検出装
置において、前記投射面の長手方向における複数箇所に
形成されて投射面の幅方向における中央位置であること
を前記受光手段によって読み取り可能な表示部分が受光
手段によって受光される。 (請求項1の効果)従って、上記表示部分を読み取った
受光手段の受光情報に基づいて、前記投射面の幅方向で
の中央位置に受光手段の受光位置が位置しているか否か
を的確に判断することができ、これによって、投射面の
幅方向での中央位置に受光手段の受光位置が位置してい
る適正状態の不良物検出装置を確実に得ることができ
る。(Exemplary Action of the Invention) An expected location for detection in which a group of granular materials as an inspection object is present in a long strip shape is illuminated by illumination means, and along the longitudinal direction of the expected location. By light receiving means for receiving light from the expected existence place side in a state having resolution, the detection light from the inspection object and the light receiving direction of the light receiving means are installed at a position on the back side of the expected existence place. The projection light from a long, strip-shaped projection surface that projects light having the same or substantially the same brightness as the detection light from the proper one of the inspection objects toward the light receiving means is received, and the granular It is determined whether or not the amount of light received by the light receiving unit that receives the detection light from the body group and the projection light from the projection surface is out of the appropriate light amount range for the detection light from the appropriate one of the inspection objects. In the defective object detection device, Possible display part read by the light receiving means to be a central position in the width direction of the projection surface is formed at a plurality of positions in the longitudinal direction of the reflecting surface is received by the light receiving means. (Effect of Claim 1) Therefore, based on the light receiving information of the light receiving means that has read the display portion, it is accurately determined whether or not the light receiving position of the light receiving means is located at the center position in the width direction of the projection surface. This makes it possible to reliably obtain a defective object detection device in a proper state in which the light receiving position of the light receiving means is located at the central position in the width direction of the projection surface.
【0009】(請求項2の構成)請求項2では、請求項
1において、前記表示部分が、前記中央位置に対して前
記幅方向において一端側と他端側のいずれの位置である
かを前記受光手段によって読み取り可能に構成されてい
る。 (請求項2の作用)前記投射面の幅方向における中央位
置に対して幅方向において一端側と他端側のいずれの位
置であるかを前記受光手段によって読み取り可能な表示
部分が受光手段によって受光される。 (請求項2の効果)従って、上記表示部分を読み取った
受光手段の受光情報に基づいて、前記投射面の幅方向で
の中央位置に対して受光手段の受光位置が幅方向の一端
側と他端側のいずれの側に位置ずれしているか否かを判
断することができるので、これに基づいて、上記位置ず
れが小さくなる方向に調整して、投射面の幅方向での中
央位置に受光手段の受光位置が位置する状態に迅速且つ
容易に調整することができ、もって、請求項1の好適な
手段が得られる。(Structure of Claim 2) In Claim 2, in Claim 1, it is determined whether the display portion is located at one end or the other end in the width direction with respect to the center position. It is configured to be readable by light receiving means. According to a second aspect of the present invention, a display portion readable by the light receiving means to determine whether the projection surface is located at one end or the other end in the width direction with respect to the center position in the width direction is received by the light receiving means. Is done. (Effect of Claim 2) Therefore, based on the light receiving information of the light receiving means which has read the display portion, the light receiving position of the light receiving means is different from the one end in the width direction with respect to the center position in the width direction of the projection surface. Since it is possible to determine which side of the end side is misaligned, based on this, it is adjusted in the direction in which the misalignment is reduced, and the light is received at the central position in the width direction of the projection surface. The light receiving position of the means can be quickly and easily adjusted to the position where the light receiving position is located, whereby the preferable means of claim 1 is obtained.
【0010】(請求項3の構成)請求項3では、請求項
1又は2において、前記受光手段が、前記存在予定箇所
の両横外側方をも検出するように構成されると共に、前
記投射面が、前記受光手段にて前記存在予定箇所に対応
して検出される検査用被検出範囲の両横外側方に余剰分
を備えるように構成され、前記表示部分が、前記投射面
における前記余剰分に対応する部分に形成されている。 (請求項3の作用)前記投射面が、前記存在予定箇所の
両横外側方をも検出する受光手段にて前記存在予定箇所
に対応して検出される検査用被検出範囲の両横外側方に
余剰分を備え、前記投射面における前記余剰分に対応す
る部分に形成されている前記表示部分が、受光手段によ
って受光される。 (請求項3の効果)従って、上記表示部分を受光手段の
検査用被検出範囲内に形成した場合には、その表示部分
からの投射光が粒状体群からの検出光に対してノイズ情
報として混入するおそれがあるのに比べて、かかる表示
部分によるノイズ情報の混入を確実に回避させることが
でき、もって、請求項1又は2の好適な手段が得られ
る。(Structure of Claim 3) According to Claim 3, in Claim 1 or 2, the light receiving means is configured to detect both lateral outer sides of the expected location and the projection surface. Is configured to have a surplus on both lateral outer sides of the inspection detection range that is detected in correspondence with the expected location by the light receiving unit, and the display portion includes the surplus on the projection surface. Is formed in a portion corresponding to. According to a third aspect of the present invention, the light receiving means for detecting the projection surface on both sides and the outside of the expected location is also provided on both sides and the outside of the inspection target detection range detected in correspondence with the expected existence location. The display portion formed on a portion corresponding to the surplus on the projection surface is received by light receiving means. (Effect of Claim 3) Therefore, when the display portion is formed within the inspection detection range of the light receiving means, the projection light from the display portion is used as noise information with respect to the detection light from the particulate group. Compared with the possibility of mixing, it is possible to reliably prevent noise information from being mixed in such a display portion, and the preferred means of claim 1 or 2 is obtained.
【0011】(請求項4の構成)請求項4では、請求項
1〜3のいずれか1項において、前記表示部分が、前記
投射面の幅方向に沿って前記中央位置側に突き出る形状
の凸状部分を、前記投射からの投射光量と異なる光量を
投射するように形成することにより構成されている。 (請求項4の作用)前記投射面の幅方向に沿って前記中
央位置側に突き出る形状の凸状部分が、前記投射面から
の投射光量と異なる光量を投射するように形成されてい
る前記表示部分が受光手段によって受光される。 (請求項4の効果)従って、上記凸状部分に形成されて
いる表示部分からの投射光を受光手段が受光すると、そ
の凸状部分での受光光量は投射面での受光光量と異なる
ので、その受光光量の違いによって受光手段が表示部分
を受光していることつまり受光手段の受光位置が中央位
置からずれていることを容易に判別することができ、も
って、請求項1〜3のいずれか1項の好適な手段が得ら
れる。(Structure of Claim 4) In Claim 4, in any one of Claims 1 to 3, the display portion has a convex shape protruding toward the center position along the width direction of the projection surface. The projection is formed by projecting a light amount different from the projection light amount from the projection. According to a fourth aspect of the present invention, in the display, a convex portion having a shape protruding toward the center position along a width direction of the projection surface is formed so as to project an amount of light different from an amount of light projected from the projection surface. The part is received by the light receiving means. (Effect of Claim 4) Therefore, when the light receiving means receives the projection light from the display portion formed in the convex portion, the light receiving amount at the convex portion is different from the light receiving amount at the projection surface. It is possible to easily determine from the difference in the amount of received light that the light receiving means is receiving light at the display portion, that is, that the light receiving position of the light receiving means is deviated from the center position. The preferred means of paragraph 1 is obtained.
【0012】(請求項5の構成)請求項5では、請求項
1〜4のいずれか1項において、前記投射面の幅方向の
両横側部に、前記投射面からの投射光量と異なる光量を
投射する異物検知用投射部が設けられている。 (請求項5の作用)幅方向の両横側部に投射面からの投
射光量と異なる光量を投射する異物検知用投射部が設け
られている投射面に形成された前記表示部分が受光手段
によって受光される。 (請求項5の効果)従って、上記異物検知用投射部から
の光が存在予定箇所に位置する透明なガラス片等によっ
て屈折されて受光されて、異物として検出できるように
するために、幅方向の両横側部に投射面からの投射光量
と異なる光量を投射する異物検知用投射部が近接させて
設けられて、例えば幅が狭く形成されているような投射
面においても、投射面の幅方向の中心位置に受光手段の
受光位置が位置しているか否かを的確に判別することが
でき、もって、請求項1〜4のいずれか1項の好適な手
段が得られる。According to a fifth aspect of the present invention, in any one of the first to fourth aspects, a light amount different from a light amount projected from the projection surface is provided on both lateral sides in the width direction of the projection surface. Is provided with a projection unit for detecting foreign matter. According to a fifth aspect of the present invention, the display portion formed on the projection surface is provided on both lateral sides in the width direction with a projection unit for detecting foreign matter that projects an amount of light different from the amount of light projected from the projection surface. Received. (Effect of Claim 5) Therefore, in order to allow the light from the projection part for foreign matter detection to be refracted and received by a transparent glass piece or the like located at the expected location and to be detected as a foreign matter, A projection unit for detecting foreign matter that projects an amount of light different from the amount of light projected from the projection surface is provided on both lateral sides in close proximity, for example, even in a projection surface having a small width, the width of the projection surface It is possible to accurately determine whether or not the light receiving position of the light receiving means is located at the center position in the direction, so that the suitable means according to any one of claims 1 to 4 can be obtained.
【0013】(請求項6の構成)請求項6では、請求項
1〜5のいずれか1項において、前記受光手段の受光情
報を、前記存在予定箇所の長手方向に沿う各部での受光
情報を視認できるように表示する表示手段が設けられて
いる。 (請求項6の作用)前記受光手段の受光情報が、前記存
在予定箇所の長手方向に沿う各部での受光情報を視認で
きるように表示手段に表示される。 (請求項6の効果)従って、前記存在予定箇所の長手方
向に沿う各部での受光情報を、表示手段の画面等に表示
された表示情報によって視覚的に容易に認識することが
でき、もって、請求項1〜5のいずれか1項の好適な手
段が得られる。(Structure of Claim 6) According to Claim 6, in any one of Claims 1 to 5, the light receiving information of the light receiving means is replaced with the light receiving information of each part along the longitudinal direction of the expected location. Display means for displaying the information so as to be visually recognized is provided. (Function of Claim 6) The light receiving information of the light receiving means is displayed on the display means so that the light receiving information at each part along the longitudinal direction of the expected location can be visually recognized. (Effect of Claim 6) Therefore, it is possible to easily and easily recognize the light receiving information at each part along the longitudinal direction of the expected location by the display information displayed on the screen of the display means, etc. The preferred means of any one of claims 1 to 5 is obtained.
【0014】(請求項7の構成)請求項7では、請求項
1〜6のいずれか1項において、前記受光手段が、前記
受光方向に沿う光軸回りに回動調整自在で、且つ、前記
存在予定箇所の長手方向に沿う軸回りに揺動調整自在に
構成されている。 (請求項7の作用)前記投射面の幅方向での中央位置に
対する受光手段の受光位置の位置ずれを修正するよう
に、受光手段が前記受光方向に沿う光軸回りに回動調整
されるとともに、前記存在予定箇所の長手方向に沿う軸
回りに揺動調整される。 (請求項7の効果)従って、例えば、前記存在予定箇所
の背部側箇所に比較的近接して配置されて防塵構造等が
付設されている投射面を調整自在に構成すると、その調
整構造が複雑になるのに比べて、存在予定箇所から離れ
た位置で比較的フリー状態にある受光手段側を調整自在
に構成することにより、装置全体として構造を簡素化す
ることができ、もって、請求項1〜6のいずれか1項の
好適な手段が得られる。(Structure of Claim 7) According to Claim 7, in any one of Claims 1 to 6, the light receiving means is rotatable and adjustable around an optical axis along the light receiving direction, and It is configured to be swingably adjustable about an axis along the longitudinal direction of the location where it is expected to exist. (Function of Claim 7) The light receiving means is rotated and adjusted about an optical axis along the light receiving direction so as to correct the positional deviation of the light receiving position of the light receiving means with respect to the center position in the width direction of the projection surface. The swing adjustment is performed around the axis along the longitudinal direction of the expected location. (Effect of Claim 7) Therefore, for example, if the projection surface which is disposed relatively close to the back side of the expected location and is provided with a dustproof structure or the like is adjustable, the adjustment structure becomes complicated. The structure of the entire apparatus can be simplified by arranging the light-receiving means in a relatively free state at a position distant from the expected existence position so as to be adjustable. The preferred means according to any one of (1) to (6) is obtained.
【0015】(請求項8の構成)請求項8では、検査対
象物としての粒状体群を検出用の存在予定箇所において
長尺の帯状に存在させるように構成され、前記存在予定
箇所を照明する照明手段と、前記存在予定箇所の長手方
向に沿って分解能を有する状態で前記存在予定箇所側か
らの光を受光する受光手段と、前記受光手段の受光方向
であって前記存在予定箇所の背部側箇所に設置されて、
前記検査対象物のうちの適正物からの検出光と同一又は
略同一の明るさの光を前記受光手段に向けて投射する長
尺の帯状の投射面と、前記検査対象物からの検出光及び
前記投射面からの投射光を受光する前記受光手段の受光
情報に基づいて、その受光量が前記検査対象物のうちの
適正物からの検出光に対する適正光量範囲を外れたか否
かの判別を行う判別手段とが設けられた不良物検出装置
において、前記存在予定箇所に位置されて前記受光手段
にて受光され、その受光情報に基づいて調整を行うとき
に用いる不良物検出装置用の調整治具であって、前記調
整治具の長手方向における複数箇所に、前記存在予定箇
所において帯状に存在する検査対象物の幅方向における
適正位置を表示する適正位置表示部が形成されている。(Structure of Claim 8) In Claim 8, a group of granular materials as an object to be inspected is configured to be present in a long band shape at a location where detection is to be performed, and the planned location is illuminated. Illuminating means, light receiving means for receiving light from the expected existence place side in a state having a resolution along the longitudinal direction of the expected existence place, and light receiving direction of the light receiving means and the back side of the expected existence place Installed at
A long, strip-shaped projection surface that projects light having the same or substantially the same brightness as detection light from a proper one of the inspection objects toward the light receiving unit, and detection light from the inspection object and Based on the light receiving information of the light receiving unit that receives the projection light from the projection surface, it is determined whether or not the amount of received light is out of a proper light amount range for detection light from a proper one of the inspection objects. An adjusting jig for the defective object detection device, which is located at the expected location and is received by the light receiving device, and is used for performing adjustment based on the received light information. An appropriate position display section is provided at a plurality of positions in the longitudinal direction of the adjustment jig to display an appropriate position in the width direction of the inspection object existing in a band shape at the expected location.
【0016】(請求項8の作用)調整治具の長手方向に
おける複数箇所に、前記存在予定箇所において帯状に存
在する検査対象物の幅方向における適正位置を表示する
適正位置表示部が形成されている不良物検出装置用の調
整治具が、前記不良物検出装置において前記存在予定箇
所に位置されて前記受光手段にて受光され、その受光情
報に基づいて調整が行われる。 (請求項8の効果)従って、存在予定箇所に位置された
調整治具を受光手段にて受光して、その治具長手方向に
おける複数箇所に形成されている適正位置表示部の受光
情報に基づいて、存在予定箇所において帯状に存在する
検査対象物の幅方向における適正位置と受光手段の受光
位置との位置関係を判別することができ、この判別に基
づいて存在予定箇所の上記適正位置と受光手段の受光位
置との位置関係を適切に調整することができる調整治具
が得られる。(Advantage of the Invention) An appropriate position display portion for displaying an appropriate position in the width direction of the inspection object existing in a band shape at the expected position is formed at a plurality of positions in the longitudinal direction of the adjusting jig. An adjustment jig for the defective object detection device is located at the expected existence position in the defective object detection device, received by the light receiving means, and is adjusted based on the received light information. (Effect of Claim 8) Therefore, the adjustment jig positioned at the expected location is received by the light receiving means, and the adjustment jig is received based on the light reception information of the appropriate position display portions formed at a plurality of locations in the longitudinal direction of the jig. Thus, it is possible to determine the positional relationship between the appropriate position in the width direction of the inspection object existing in a band shape at the expected location and the light receiving position of the light receiving means. An adjustment jig that can appropriately adjust the positional relationship between the means and the light receiving position is obtained.
【0017】(請求項9の構成)請求項9では、請求項
8において、前記適正位置表示部が、前記適正位置に対
して前記幅方向の一端側と他端側のいずれの位置である
かを表示するように構成されている。 (請求項9の作用)前記検査対象物の幅方向における適
正位置に対して前記幅方向の一端側と他端側のいずれの
位置であるかを表示する前記適正位置表示部が受光手段
によって受光される。 (請求項9の効果)従って、上記適正位置表示部の受光
情報に基づいて、前記適正位置と受光手段の受光位置と
の位置が幅方向の一端側と他端側のいずれの側にずれて
いるか否かが判断することができるので、これに基づい
て、上記位置ずれが小さくなる方向に調整方向を設定し
て迅速且つ容易に調整を行うことができ、もって、請求
項8の好適な手段が得られる。According to a ninth aspect of the present invention, in the ninth aspect, the position of the proper position display portion is one of the one end and the other end in the width direction with respect to the proper position. Is configured to be displayed. (Effect of Claim 9) The proper position display section for displaying which of the one end side and the other end side in the width direction is the proper position in the width direction of the inspection object with the light receiving means. Is done. (Effect of Claim 9) Therefore, based on the light reception information of the proper position display section, the position of the proper position and the light receiving position of the light receiving means are shifted to one of the one end and the other end in the width direction. Since it is possible to determine whether or not there is an error, it is possible to quickly and easily perform the adjustment by setting the adjustment direction in a direction in which the displacement becomes smaller, based on the determination. Is obtained.
【0018】(請求項10の構成)請求項10では、請
求項8又は9において、前記適正位置表示部が、前記適
正位置に対する前記幅方向での位置ずれ量を表示するよ
うに構成されている。 (請求項10の作用)検査対象物の幅方向における適正
位置に対する前記幅方向での位置ずれ量を表示する前記
適正位置表示部が受光手段によって受光される。 (請求項10の効果)従って、上記適正位置表示部の受
光情報に基づいて、前記適正位置と受光手段の受光位置
との位置ずれ量を判断することができるので、これに基
づいて、例えば、上記位置ずれが大きい状態では調整量
を大きくし、上記位置ずれが小さくなるに従って調整量
を小さくするようにして調整を迅速且つ的確に行うこと
ができ、もって、請求項8又は9の好適な手段が得られ
る。(Structure of Claim 10) According to Claim 10, in Claim 8 or 9, the proper position display section is configured to display the amount of displacement in the width direction with respect to the proper position. . (Effect of Claim 10) The proper position display section for displaying the amount of displacement in the width direction with respect to the proper position in the width direction of the inspection object is received by the light receiving means. (Effect of Claim 10) Therefore, it is possible to determine the amount of positional deviation between the proper position and the light receiving position of the light receiving means based on the light receiving information of the proper position display unit. 10. The means according to claim 8 or 9, wherein the adjustment amount is increased in a state where the positional deviation is large, and the adjustment amount is reduced as the positional deviation becomes smaller, so that the adjustment can be performed quickly and accurately. Is obtained.
【0019】(請求項11の構成)請求項11では、請
求項8〜10のいずれか1項において、前記調整治具
に、前記受光手段の焦点位置を調整するときに読み取ら
れる焦点位置調整用表示部が形成されている。 (請求項11の作用)前記焦点位置調整用表示部が受光
手段によって読み取られ、その読み取り情報に基づい
て、受光手段の焦点位置が調整される。 (請求項11の効果)従って、検査対象物の存在予定箇
所に置かれた前記調整治具を直接計測して受光手段の焦
点位置を調整するので、焦点位置の調整を存在予定箇所
を受光するのに適切な状態に精度良く行うことができる
と共に、受光位置の調整を行うのと同じ調整治具を用い
て焦点位置の調整を行うので、受光手段の焦点位置の調
整を受光位置の調整と併せて容易に行うことができ、も
って、請求項8〜10のいずれか1項の好適な手段が得
られる。(Structure of Claim 11) According to Claim 11, in any one of Claims 8 to 10, the adjusting jig is used for adjusting a focal position of the light receiving means. A display is formed. (Function of Claim 11) The focal position adjusting display section is read by the light receiving means, and the focal position of the light receiving means is adjusted based on the read information. (Effect of Claim 11) Therefore, the focus position of the light receiving means is adjusted by directly measuring the adjustment jig placed at the location where the inspection object is supposed to exist. The focus position can be adjusted accurately using the same adjustment jig that adjusts the light receiving position. In addition, the method can be easily performed, and thus the preferable means according to any one of claims 8 to 10 can be obtained.
【0020】(請求項12の構成)請求項12では、請
求項8〜11のいずれか1項において、前記検査対象物
としての粒状体群が、帯状状態で、予定移送経路に沿っ
て前記存在予定箇所とその存在予定箇所の位置よりも経
路下手側の分離箇所とに移送されるとともに、その分離
箇所に移送された前記粒状体群のうちの適正物と不良物
とを異なる経路に分離させるためにエアを噴出する複数
のエア噴出部が前記存在予定箇所の長手方向に並べら
れ、前記複数のエア噴出部に対して位置決めするために
エア噴出部に嵌合される位置決め部が設けられている。 (請求項12の作用)検査対象物としての粒状体群が帯
状状態で予定移送経路に沿って前記存在予定箇所とその
存在予定箇所の位置よりも経路下手側の分離箇所とに移
送され、その分離箇所に移送された粒状体群のうちの適
正物と不良物とを異なる経路に分離させるためにエアを
噴出する複数のエア噴出部が前記存在予定箇所の長手方
向に並べられた不良物検出装置において、位置決め部が
エア噴出部に嵌合されて複数のエア噴出部に対して位置
決めされた調整治具が、前記受光手段にて受光され、そ
の受光情報に基づいて調整が行われる。 (請求項12の効果)従って、検出用の存在予定箇所よ
りも経路下手側の分離箇所に並置される複数の不良物分
離用の噴出部に嵌合状態で確実に位置決めされた調整治
具を用いて、上記存在予定箇所に長尺帯状に存在する粒
状体群を受光する受光手段に対する調整を適正に行うこ
とができ、もって、請求項8〜11のいずれか1項の好
適な手段が得られる。According to a twelfth aspect of the present invention, in the twelfth aspect, the granular material group as the inspection object according to any one of the eighth to eleventh aspects is provided in a belt-like state along the predetermined transport path. While being transported to the planned location and the separation location on the lower side of the route than the location of the expected location, the proper and defective materials in the group of granular materials transported to the separation location are separated into different routes. A plurality of air ejection portions for ejecting air are arranged in the longitudinal direction of the expected location, and a positioning portion fitted to the air ejection portion is provided for positioning with respect to the plurality of air ejection portions. I have. (Effect of Claim 12) A group of granules as an inspection object is transported along a predetermined transport path in a belt-like state to the expected location and a separation point on the lower side of the location from the location of the expected location. Defective object detection in which a plurality of air ejecting portions for ejecting air to separate a proper object and a defective object from the group of granular materials transferred to the separation portion into different paths are arranged in the longitudinal direction of the expected existence portion. In the device, an adjustment jig whose positioning portion is fitted to the air ejection portion and positioned with respect to the plurality of air ejection portions is received by the light receiving means, and adjustment is performed based on the received light information. (Advantage of claim 12) Therefore, an adjusting jig which is reliably positioned in a fitting state with a plurality of defective separating jetting portions which are juxtaposed at a separating position on the lower side of the path from the expected existence position for detection. By using this, it is possible to properly adjust the light receiving means for receiving the group of granular materials present in the elongated band shape at the expected location, and thus the preferable means according to any one of claims 8 to 11 is obtained. Can be
【0021】(請求項13の構成)請求項13では、請
求項12において、前記調整治具に、複数のエア噴出部
に対応する位置を表示する噴出位置表示部が形成されて
いる。 (請求項13の作用)複数のエア噴出部に対応する位置
を表示する噴出位置表示部が形成されている調整治具が
受光手段にて受光される。 (請求項13の効果)従って、上記噴出位置表示部を読
み取った受光情報に基づいて、予定存在箇所の長手方向
における受光手段の各位置と複数の噴出部との位置関係
が適正な状態に設定されるので、つまり、検査対象物の
存在予定箇所に置かれた前記調整治具を直接計測して前
記位置関係の設定を精度良く行うので、予定存在箇所に
おいて粒状体群中の不良物が検出された位置に対応する
噴出部を的確に作動させて、適正物と不良物との分離を
適正に行うことができると共に、受光位置の調整を行う
のと同じ調整治具を用いて前記位置関係の設定を行うの
で、その設定を受光位置の調整と併せて容易に行うこと
ができ、もって、請求項12の好適な手段が得られる。According to a thirteenth aspect, in the thirteenth aspect, the adjustment jig is provided with an ejection position display portion for displaying positions corresponding to a plurality of air ejection portions. (Advantage of the Invention) An adjusting jig provided with an ejection position display portion for displaying positions corresponding to the plurality of air ejection portions is received by the light receiving means. (Effect of Claim 13) Therefore, the positional relationship between each position of the light receiving means and the plurality of ejection portions in the longitudinal direction of the planned existence location is set to an appropriate state based on the light reception information read from the ejection position display portion. In other words, since the setting of the positional relationship is accurately performed by directly measuring the adjustment jig placed at the location where the inspection object is to be inspected, defective objects in the group of granular materials are detected at the expected location. By properly operating the ejection portion corresponding to the set position, it is possible to properly separate the proper object from the defective object, and to use the same adjustment jig as used for adjusting the light receiving position. Is set, the setting can be easily performed together with the adjustment of the light receiving position, so that the suitable means of claim 12 can be obtained.
【0022】(請求項14の構成)請求項14では、請
求項7記載の不良物検出装置において、請求項12又は
13記載の不良物検出装置用の調整治具を用いて、前記
適正位置表示部を読み取った情報に基づいて前記表示手
段の受光位置が前記適正位置に位置するように前記受光
手段の受光方向を調整し、次に、前記投射面の表示部分
を読み取った情報に基づいて前記表示手段の受光位置が
前記中央位置に位置するように前記受光手段の受光方向
を調整し、次に、前記調整治具を用いて前記複数のエア
噴出部夫々に対応する前記受光手段の各受光位置での前
記適正位置からのずれ量を判別して、そのずれ量に基づ
いて、前記予定存在箇所にて不良物の存在が判別された
後、前記複数のエア噴出部を作動させるまでの時間間隔
を、前記複数のエア噴出部夫々について調整して設定す
る。According to a fourteenth aspect of the present invention, in the defective object detecting device according to the seventh aspect, the proper position is displayed by using an adjusting jig for the defective object detecting device according to the twelfth or thirteenth aspect. The light receiving direction of the light receiving means is adjusted so that the light receiving position of the display means is located at the appropriate position based on the information obtained by reading the portion, and then, based on the information obtained by reading the display portion of the projection surface, The light receiving direction of the light receiving means is adjusted so that the light receiving position of the display means is located at the center position, and then each light receiving means of the light receiving means corresponding to each of the plurality of air ejection portions is adjusted using the adjusting jig. The amount of time from determining the amount of deviation from the proper position at the position and determining the presence of a defective object at the expected existence location based on the amount of deviation until activating the plurality of air ejection units. The interval is Adjusted for jet part each be set.
【0023】(請求項14の作用)前記エア噴出部に対
して位置決めされた調整治具の適正位置表示部を読み取
った受光手段の受光情報に基づいて、受光手段の受光位
置と上記エア噴出部との位置関係が適正になるように、
受光手段の受光方向に沿う光軸回りの回動調整と、前記
存在予定箇所の長手方向に沿う軸回りの揺動調整とが行
われ、次に、前記投射面の表示部分を読み取った受光情
報に基づいて前記表示手段の受光位置が前記中央位置に
位置するように、上記受光手段の回動調整と揺動調整と
が行われ、次に、前記エア噴出部に対して位置決めされ
た前記調整治具の適正位置表示部を読み取って、前記エ
ア噴出部夫々に対応する前記受光手段の各受光位置での
前記存在予定箇所の幅方向における適正位置からのずれ
量を判別して、そのずれ量に基づいて、前記予定存在箇
所にて不良物の存在が判別された後、前記複数のエア噴
出部を作動させるまでの時間間隔が、前記複数のエア噴
出部夫々について調整して設定される。 (請求項14の効果)従って、前記存在予定箇所に調整
治具をセットして、その存在予定箇所に長尺の帯状に存
在する粒状体群に対する受光手段の受光位置を、上記存
在予定箇所よりも移送経路下手側の分離箇所に並置され
る複数の不良物分離用のエア噴出部との位置関係を適正
位置に調整した後、投射面の幅方向での中央位置に受光
手段の受光位置が的確に位置するように受光手段の受光
方向を調整した状態で、再度上記存在予定箇所に調整治
具をセットして、存在予定箇所の長手方向における受光
手段の各受光位置が存在予定箇所の幅方向における適正
位置からずれている場合には、その各ずれ量に基づい
て、前記予定存在箇所での不良物の判別後、各エア噴出
部を作動させるまでの時間を調整するので、投射面の幅
方向での中央位置に受光手段の受光位置が位置している
適正状態に調整できるとともに、予定存在箇所において
検出された不良物に対応するエア噴出部を的確なタイミ
ングで噴出作動させて、適正物と不良物との分離を適正
に行うように調整することができる不良物検出装置用の
調整方法が得られる。つまり、エア噴出部を基準として
検査対象物の存在予定箇所に置かれた前記調整治具を直
接計測して、各エア噴出部から受光手段の受光位置まで
の距離の適正距離に対するずれを精度良く求め、そのず
れに基づいて各エア噴出部の噴出タイミングを精度良く
調整することができる。According to a fourteenth aspect of the present invention, the light receiving position of the light receiving means and the air blowing part are determined based on the light receiving information of the light receiving means which reads the proper position display part of the adjusting jig positioned with respect to the air blowing part. So that the positional relationship with
Rotation adjustment about the optical axis along the light receiving direction of the light receiving means and swing adjustment about the axis along the longitudinal direction of the expected location are performed, and then light reception information obtained by reading the display portion of the projection surface The rotation adjustment and the swing adjustment of the light receiving means are performed so that the light receiving position of the display means is located at the central position based on the above, and then the adjustment positioned with respect to the air ejection portion is performed. The appropriate position display portion of the jig is read, and the shift amount from the appropriate position in the width direction of the expected existence position at each light receiving position of the light receiving means corresponding to each of the air ejection portions is determined, and the shift amount is determined. After the presence of a defective object is determined at the expected location based on the above, a time interval until the plurality of air ejection units are activated is adjusted and set for each of the plurality of air ejection units. (Effect of Claim 14) Therefore, an adjusting jig is set at the expected existence position, and the light receiving position of the light receiving means with respect to the group of granular materials existing in a long band shape at the expected existence position is set to be greater than the expected existence position. Also, after adjusting the positional relationship with a plurality of defective air separation parts that are juxtaposed at the separation point on the lower side of the transfer path to the appropriate position, the light receiving position of the light receiving means is located at the center position in the width direction of the projection surface With the light receiving direction of the light receiving means adjusted so as to be located accurately, set the adjusting jig again at the above-mentioned expected existence position, and set each light receiving position of the light receiving means in the longitudinal direction of the expected existence position to the width of the expected existence position. In the case where it is shifted from the appropriate position in the direction, based on the amount of each shift, the time until the air ejection section is operated after the determination of the defective at the expected existence location is adjusted. At the center position in the width direction The light receiving position of the light means can be adjusted to the appropriate position where it is located, and the air ejection section corresponding to the defective object detected at the expected location is ejected at the appropriate timing to separate the appropriate object from the defective object Thus, an adjustment method for a defective object detection device that can be adjusted so as to perform the adjustment properly is obtained. That is, the adjustment jig placed at the location where the inspection object is to be located is directly measured based on the air ejection portion, and the deviation from the appropriate distance of the distance from each air ejection portion to the light receiving position of the light receiving means is accurately determined. It is possible to accurately adjust the ejection timing of each air ejection section based on the deviation.
【0024】[0024]
【発明の実施の形態】以下、本発明に係る不良物検出装
置、並びに、その不良物検出装置用の調整治具及び調整
方法の実施形態を、玄米や精米等の米粒群からなる粒状
体群を検査対象物として、予定移送経路に沿って移送し
ながら、不良物検出及び分離処理を行う場合について図
面に基づいて説明する。BEST MODE FOR CARRYING OUT THE INVENTION An embodiment of a defective object detecting apparatus, an adjusting jig and an adjusting method for the defective object detecting apparatus according to the present invention will be described below. With reference to the drawings, a description will be given of a case where the defective object detection and separation processing is performed while transferring along the scheduled transfer path with the inspection target as an inspection target.
【0025】図1〜図4(尚、図3は、不良物検出及び
分離処理の動作説明図であるために、図1,図2及び図
4とは装置構成の配置が異なる箇所がある)に示すよう
に、広幅の板状のシュータ1が、水平面に対して所定角
度(例えば60度)に傾斜されて設置され、このシュー
タ1の上部側に設けた貯溜タンク7からフィーダ9によ
って搬送・供給された米粒群kが、シュータ1の上面を
一層状態で横方向に広がった状態で流下案内されて移送
されている。ここで、上記シュータ1は、幅方向全幅に
亘って平坦な案内面に形成された平面シュータである。
尚、ここでは、一層状態で移送させることを目的として
いるので、流れ状態により部分的に粒が重なって2層状
態等になっても、一層状態の概念に含まれる。FIGS. 1 to 4 (note that FIG. 3 is an explanatory view of the operation of the defective object detection and separation processing, and therefore, the arrangement of the device configuration is different from that of FIGS. 1, 2 and 4). As shown in FIG. 1, a wide plate-like shooter 1 is installed at a predetermined angle (for example, 60 degrees) with respect to a horizontal plane, and is conveyed by a feeder 9 from a storage tank 7 provided on the upper side of the shooter 1. The supplied rice grain group k is transported while being guided downward in a state where the upper surface of the chute 1 is further spread in the lateral direction. Here, the shooter 1 is a plane shooter formed on a flat guide surface over the entire width in the width direction.
Here, since the purpose is to transfer the particles in a single layer state, even if the particles partially overlap depending on the flow state to form a two-layer state or the like, it is included in the concept of a single layer state.
【0026】貯溜タンク7には、外部の籾摺機から供給
される玄米や精米機から供給される精米等の検査対象物
が貯溜され、又、その外部からの検査対象物を1次選別
処理して得られた適正物又は不良物が再選別するために
貯溜される。タンク7は下端側ほど先細筒状に形成さ
れ、タンク7からフィーダ9上に落下した米粒群kのシ
ュータ1への供給量は、フィーダ9の振動による米粒群
kの搬送速度を変化させて調節される。The storage tank 7 stores inspection objects such as brown rice supplied from an external huller and milled rice supplied from a rice mill, and subjects the inspection objects from outside to a primary sorting process. The proper or defective products obtained in this way are stored for re-sorting. The tank 7 is formed in a tapered cylindrical shape toward the lower end, and the supply amount of the rice grain group k dropped from the tank 7 onto the feeder 9 to the shooter 1 is adjusted by changing the transport speed of the rice grain group k by the vibration of the feeder 9. Is done.
【0027】米粒群kがシュータ1の下端部から流下す
る流下経路中に、米粒群kを長尺の帯状に存在させる直
線状の検出用の存在予定箇所J(以後、検出箇所Jと呼
ぶ)が設定され、その検出箇所Jを照明する照明手段と
しての蛍光灯等からなるライン状光源4A,4Bと、そ
のライン状光源4A,4Bからの照明光が上記検出箇所
Jの米粒群kで反射した反射光を受光する反射用ライン
センサ5Bとが、上記検出箇所Jに対して同じ側に設け
られている。一方、上記検出箇所Jを挟んでライン状光
源4A,4Bの設置位置とは反対側に、ライン状光源4
A,4Bからの照明光が検出箇所Jの米粒群kを透過し
た透過光を受光する透過用ラインセンサ5Aが設けられ
ている。In the flow path in which the rice grain group k flows down from the lower end of the chute 1, a linear detection expected location J (hereinafter, referred to as a detection location J) in which the rice grain group k is present in a long strip shape. Are set, and linear light sources 4A and 4B composed of fluorescent lamps and the like as illumination means for illuminating the detection location J, and illumination light from the linear light sources 4A and 4B is reflected by the rice grain group k at the detection location J. A reflection line sensor 5B for receiving the reflected light is provided on the same side as the detection point J. On the other hand, on the opposite side of the detection position J from the installation position of the linear light sources 4A and 4B,
A transmission line sensor 5A is provided for receiving the transmitted light of the illumination light from A and 4B transmitted through the rice grain group k at the detection location J.
【0028】上記検出箇所Jから流下方向下流側に、上
記検出箇所Jでの受光情報に基づいて不良と判定された
米粒kや異物等に対してエアーを吹き付けて正常な米粒
kの流れ方向から横方向に分離させるためのエアー吹き
付け装置6が設けられ、このエアー吹き付け装置6は、
噴射ノズル6aの複数個(20個)を、粒状体群の全幅
を所定幅で複数個の区画に分割形成した各区画に対応す
る状態で並置させ、不良物が存在する区画の噴射ノズル
6aが作動されるように構成されている。つまり、米粒
群kがシュータ1の下端部から帯状状態で予定移送経路
としての流下経路に沿って前記検出箇所Jとその経路下
手側の分離箇所とに移送されるとともに、その分離箇所
に移送された米粒群kのうちの適正物(正常米)と不良
物とを異なる経路に分離させるためにエアを噴出する複
数のエア噴出部としての噴射ノズル6aが、前記検出箇
所Jの長手方向に並べられている。Air is blown toward the downstream from the detection point J in the downstream direction to the rice grain k or foreign matter determined to be defective based on the light reception information at the detection point J, and the air is blown from the normal flow direction of the rice grain k. An air blowing device 6 for separating in the lateral direction is provided, and the air blowing device 6
A plurality (20) of the injection nozzles 6a are juxtaposed in such a manner that the entire width of the granular material group is divided into a plurality of sections with a predetermined width corresponding to each of the plurality of sections. It is configured to be activated. That is, the rice grain group k is transferred from the lower end of the shooter 1 in a belt-like state to the detection point J and the separation point on the downstream side of the detection point J along the flow-down path as the planned transfer path, and is also transferred to the separation point. Injection nozzles 6a as a plurality of air ejection portions for ejecting air to separate a proper product (normal rice) and a defective product from the rice grain group k into different paths are arranged in the longitudinal direction of the detection location J. Have been.
【0029】そして、噴射ノズル6aからのエアーの吹
き付けを受けずにそのまま進行してくる正常な米粒kを
回収する良米用の受口部2Bと、エアーの吹き付けを受
けて正常な米粒kの流れから横方向に分離した着色米や
胴割れ米等の不良米又は石やガラス片等の異物を回収す
る不良物用の受口部3Bとが設けられ、良米用の受口部
2Bが横幅方向に細長い筒状に形成され、その良米用の
受口部2Bの周囲を囲むように、不良物用の受口部3B
が形成されている。尚、良米用の受口部2Bにて回収さ
れた米粒k、及び、不良物用の受口部3Bにて回収され
た不良物は、再選別等のために、本検査装置のタンク7
又は他の検査装置に搬送される。Then, a receiving portion 2B for good rice which collects normal rice grains k which proceeds without being blown by the air from the injection nozzle 6a, and a normal rice grain k which is blown by the air. A receiving portion 3B for collecting defective rice such as colored rice or cracked rice separated laterally from the flow or a foreign matter such as stone or glass fragments is provided, and a receiving portion 2B for good rice is provided. The defective port 3B is formed in a tubular shape elongated in the width direction and surrounds the good rice port 2B.
Are formed. The rice grains k collected at the good rice receiving portion 2B and the defectives collected at the defective product receiving portion 3B are collected by the tank 7 of the inspection apparatus for re-sorting and the like.
Or, it is transported to another inspection device.
【0030】図6に示すように、上記両ラインセンサ5
A,5Bは、米粒群の各米粒kの大きさよりも小さい範
囲p(例えば米粒kの大きさの10分の1程度)を夫々
の受光対象範囲とする複数個の受光部5aを、直線状の
検出箇所Jの横外側部分を含む範囲に亘って直線状の検
出箇所Jに対応させてライン状に並ぶ状態で備えてい
る。具体的には、複数個の受光部5aとしての受光素子
が直線状に並置されたモノクロタイプのCCDセンサ部
50と、検出箇所Jでの米粒群kの像を上記CCDセン
サの各受光素子上に結像させる光学系51とから構成さ
れている。そして、両ラインセンサ5A,5Bは、例え
ば図3において、検出箇所Jの左端側から右端側に向け
て、各受光部5aから各受光情報が順次取り出される。As shown in FIG.
A and 5B depict a plurality of light receiving portions 5a each having a range p (for example, about one-tenth of the size of rice grain k) smaller than the size of each rice grain k in the rice grain group as a light receiving target range. Are arranged in a line so as to correspond to the linear detection points J over a range including the lateral outer portion of the detection points J. Specifically, a monochrome type CCD sensor unit 50 in which light receiving elements as a plurality of light receiving units 5a are arranged in a straight line, and an image of a rice grain group k at a detection location J are placed on each light receiving element of the CCD sensor. And an optical system 51 for forming an image. In each of the line sensors 5A and 5B, for example, in FIG. 3, each light reception information is sequentially extracted from each light reception unit 5a from the left end to the right end of the detection point J.
【0031】以上より、前記検出箇所Jの長手方向に沿
って分解能を有する状態でその検出箇所J側からの光を
受光する受光手段5が、両ラインセンサ5A,5Bにて
構成されるとともに、両ラインセンサ5A,5Bが前記
検出箇所Jの両横外側方をも検出するように構成され
る。As described above, the light receiving means 5 for receiving light from the detection point J in a state having resolution along the longitudinal direction of the detection point J is constituted by the two line sensors 5A and 5B. The two line sensors 5A and 5B are configured to detect both lateral outer sides of the detection location J.
【0032】前記ライン状光源4A,4Bは、透過用ラ
インセンサ5A並びに反射用ラインセンサ5Bの受光方
向に対して傾いた複数の方向から米粒群kを照明するよ
うに、検出箇所Jを斜め下方から照明する下側光源4A
と、検出箇所Jを斜め上方から照明する上側光源4Bの
2つのライン状光源4A,4Bを備え、この両光源4
A,4Bは、上記傾いた照明角度を維持する状態でフレ
ーム22に保持されている。そして、このように検出箇
所Jを照明光の照明角度を変えて異なる方向から照明し
ているので、米粒kが正常な検出箇所Jから横方向にず
れた場合でも、極力均一な状態で良好に照明できること
になる。The linear light sources 4A and 4B obliquely lower the detection point J so as to illuminate the rice grain group k from a plurality of directions inclined with respect to the light receiving directions of the transmission line sensor 5A and the reflection line sensor 5B. Light source 4A that illuminates from above
And two linear light sources 4A and 4B of an upper light source 4B for illuminating the detection location J from obliquely above.
A and 4B are held by the frame 22 while maintaining the inclined illumination angle. In addition, since the detection point J is illuminated from different directions by changing the illumination angle of the illumination light, even if the rice grain k is shifted from the normal detection point J in the horizontal direction, the detection point J is preferably kept as uniform as possible. You will be able to illuminate.
【0033】前記各ラインセンサ5A,5B受光方向で
あって前記検出箇所Jの背部側箇所に、米粒群kのうち
の適正物(正常米)からの検出光と同一又は略同一の明
るさの光を前記各ラインセンサ5A,5Bに向けて投射
する長尺の帯状の投射面としての反射面hmが設置され
ている。そして、ライン状光源4A,4Bが、上記各反
射面hm,hmを照明するように配置されている。具体
的には、上記反射面hmとして、前記透過用ラインセン
サ5Aの受光方向であって前記検出箇所Jの背部側に、
米粒群kのうちの適正物(正常米)を透過した透過光と
同一又は略同一の明るさの光を透過用ラインセンサ5A
に向けて反射する透過光用反射面hmを備えた透過光用
反射板8Aが設置され、一方、反射用ラインセンサ5B
の受光方向であって前記検出箇所Jの背部側に、米粒群
kのうちの適正物(正常米)で反射した反射光と同一又
は略同一の明るさの光を反射用ラインセンサ5Bに向け
て反射する反射光用反射面hmを備えた反射光用反射板
8Aが設けられている。In the light receiving direction of each of the line sensors 5A and 5B and on the back side of the detection point J, the same or substantially the same brightness as the detection light from a proper one (normal rice) of the rice grain group k is provided. A reflection surface hm is provided as a long band-like projection surface for projecting light toward each of the line sensors 5A and 5B. The linear light sources 4A and 4B are arranged so as to illuminate the reflection surfaces hm and hm. Specifically, as the reflection surface hm, in the light receiving direction of the transmission line sensor 5A and on the back side of the detection point J,
The transmission line sensor 5A transmits light having the same or substantially the same brightness as the transmitted light transmitted through a proper one (normal rice) of the rice grain group k.
A reflection plate for transmitted light 8A provided with a reflection surface for transmitted light hm that reflects toward the light source, while a reflection line sensor 5B is provided.
In the light receiving direction, the light having the same or substantially the same brightness as the light reflected by the proper one (normal rice) of the rice grain group k is directed to the reflection line sensor 5B on the back side of the detection point J. A reflection plate for reflected light 8A having a reflection surface for reflected light hm that reflects the light is provided.
【0034】そして、ライン状光源4A,4Bと、反射
用ラインセンサ5Bと、上記透過光用反射板8Aとが、
一方の収納部13Bに収納され、透過用ラインセンサ5
Aと、反射光用反射板8Bとが、他方の収納部13Aに
収納されている。尚、両収納部13A,13Bは側板が
共通の一体の箱体に形成され、両収納部13A,13B
夫々は、検出箇所Jに面する側に板状の透明なガラスか
らなる光透過用の窓部14A,14Bを備えている。こ
こで、2つの窓部14A,14Bは、下方側ほど互いの
間隔が狭くなる状態(V字状)に配置されている。そし
て、図示しないが、両窓部14A,14Bの表面に長手
方向に沿ってエアを吹き付けて、窓表面に付着した塵等
を除くための清掃ノズル26が設けられている(図5参
照)。The linear light sources 4A and 4B, the reflection line sensor 5B, and the transmitted light reflection plate 8A are
The transmission line sensor 5 is stored in one of the storage portions 13B.
A and the reflection plate for reflected light 8B are stored in the other storage portion 13A. In addition, both storage parts 13A, 13B are formed in an integral box body having a common side plate, and both storage parts 13A, 13B.
Each is provided with light transmitting windows 14A and 14B made of plate-shaped transparent glass on the side facing the detection location J. Here, the two windows 14A and 14B are arranged in a state (V-shape) in which the distance from each other decreases toward the lower side. Although not shown, a cleaning nozzle 26 is provided for blowing air in the longitudinal direction on the surfaces of both windows 14A and 14B to remove dust and the like adhering to the windows (see FIG. 5).
【0035】上記透過光用反射板8Aは、断面L字型で
長尺状に形成されている。そして、断面コの字状で長尺
状に形成されたブラケット22aが光源支持用のフレー
ム22にネジ止め固定されるとともに、そのブラケット
22aにおけるフレーム22への固定部とは反対側の角
部に上記透過用光反射板8Aの角部を当て付けた状態
で,透過光用反射板8Aがブラケット22aにネジ止め
されている。一方、上記反射光用反射板8Bは、図7に
示すように、前記反射面hmとして、米粒kの良米と同
じ反射率の領域8aを上記ライン状光源4A,4Bにて
照明された米粒群kの全幅に対応して長手状に形成し、
且つその長手状の領域8aの両側に黒色の領域8bを形
成するように、板部材の上にシルク印刷等による塗膜と
して形成されている。つまり、前記反射面hmとしての
領域8aの幅方向の両横側部に、前記反射面hmからの
投射光量と異なる光量を投射する異物検知用投射部とし
ての異物検知用反射部8bが設けられ、これによって、
図8に示すように、黒色の異物検知用反射部8bからの
光が、検出箇所Jに位置する透明なガラス片g等によっ
て屈折されて、反射用ラインセンサ5Bにて受光され、
そのガラス片g等を異物として検出できるように構成し
ている。ここで、各反射面hmは、前記各ラインセンサ
5A,5Bにて前記検出箇所Jに対応して検出される検
査用被検出範囲KH(図7参照)の両横外側方に余剰分
を備えるように構成されている。The transmitted light reflecting plate 8A is formed in an elongated shape with an L-shaped cross section. A long bracket 22a having a U-shaped cross section is fixed to the frame 22 for supporting the light source by screws, and the bracket 22a is provided at a corner of the bracket 22a opposite to the fixing portion to the frame 22. The transmitted light reflecting plate 8A is screwed to the bracket 22a with the corners of the transmitting light reflecting plate 8A abutted. On the other hand, as shown in FIG. 7, the reflecting plate for reflected light 8B serves as the reflecting surface hm so that the region 8a having the same reflectance as the good rice of the rice k is illuminated by the linear light sources 4A and 4B. Formed in a longitudinal shape corresponding to the entire width of the group k,
Further, a black coating 8b is formed on the plate member so as to form black regions 8b on both sides of the longitudinal region 8a. That is, on both lateral sides in the width direction of the region 8a as the reflection surface hm, the foreign matter detection reflection portion 8b as a foreign matter detection projection portion that projects an amount of light different from the amount of light projected from the reflection surface hm is provided. ,by this,
As shown in FIG. 8, the light from the black foreign matter detection reflection portion 8b is refracted by a transparent glass piece g or the like located at the detection location J and received by the reflection line sensor 5B.
The glass piece g or the like is configured to be detected as a foreign substance. Here, each reflection surface hm has a surplus portion on both lateral outer sides of the inspection detection range KH (see FIG. 7) detected by the line sensors 5A and 5B corresponding to the detection location J. It is configured as follows.
【0036】さらに、前記反射光用反射面hmの長手方
向における複数箇所に、前記反射面hmの幅方向におけ
る中央位置CLであることを前記反射用ラインセンサ5
Bによって読み取り可能な表示部分HBが形成され、こ
の表示部分HBが、上記中央位置CLに対して前記幅方
向において一端側と他端側のいずれの位置であるかを前
記反射用ラインセンサ5Bによって読み取り可能に構成
されている。具体的には、上記表示部分HBは、前記黒
色の領域8bを利用して、前記反射面hmからの投射光
量と異なる光量を投射して、前記反射面hmの幅方向に
沿って前記中央位置CL側に突き出る形状の凸状部分に
形成されることにより構成されて、前記反射面hmにお
ける前記検査用被検出範囲の両横外側に備えられる余剰
分に対応する部分に形成されている。図7では、中央位
置CLに対して上側に1個の幅広の凸状部分が形成さ
れ、中央位置CLに対して下側に2個の幅狭の凸状部分
が間隔を置いて並べて形成されている。Further, at a plurality of positions in the longitudinal direction of the reflection surface hm for reflected light, it is determined that the central position CL in the width direction of the reflection surface hm is the reflection line sensor 5.
B forms a readable display portion HB, and determines whether the display portion HB is located at one end or the other end in the width direction with respect to the center position CL by the reflection line sensor 5B. It is configured to be readable. Specifically, the display portion HB uses the black region 8b to project an amount of light different from the amount of light projected from the reflection surface hm, and the central portion along the width direction of the reflection surface hm. The reflective surface hm is formed at a portion corresponding to a surplus provided on both lateral outer sides of the inspection detection range on the reflection surface hm. In FIG. 7, one wide convex portion is formed on the upper side with respect to the center position CL, and two narrow convex portions are formed on the lower side with respect to the center position CL with a space therebetween. ing.
【0037】又、上記表示部分HBを読み取った反射用
ラインセンサ5Bの受光情報を、前記検出箇所Jの長手
方向に沿う各部つまり前記各受光部5a での受光情報を
視認できるように表示する表示手段が、後述の操作卓2
1に備えた表示パネル21aを利用して構成されている
(図21参照)。そして、図13〜図16に示すよう
に、反射面hmにおける反射用ラインセンサ5Bの受光
位置jiが中央位置CLに一致している場合には、反射
用ラインセンサ5Bの受光波形はほぼ平坦な波形になり
(図13)、反射用ラインセンサ5Bの受光位置jiが
中央位置CLに対して平行な状態で上側にずれている場
合には、反射用ラインセンサ5Bの受光波形の両端側夫
々に、幅広の凸状部分を読み取って出力値が下がった波
形が表示され(図14)、反射用ラインセンサ5Bの受
光位置jiが中央位置CLに対して平行な状態で下側に
ずれている場合には、反射用ラインセンサ5Bの受光波
形の両端側夫々に、幅狭の凸状部分を読み取って出力値
が下がった波形が表示され(図15)、反射用ラインセ
ンサ5Bの受光位置jiが検出箇所Jの左右一方側では
中央位置CLに対して下側にずれ、他方側では中央位置
CLに対して上側にずれている斜め状態では、反射用ラ
インセンサ5Bの受光波形の一端側に、幅狭の凸状部分
を読み取って出力値が下がった波形が表示され、他端側
に、幅広の凸状部分を読み取って出力値が下がった波形
が表示され(図16)、これによって、反射用ラインセ
ンサ5Bの受光位置jiの反射面hmの中央位置CLに
対する位置ずれの状態が判別される。A display for displaying the received light information of the reflection line sensor 5B, which has read the display portion HB, so that the received light information at each portion along the longitudinal direction of the detection location J, that is, at each of the light receiving portions 5a, can be visually recognized. The means is a console 2 described later.
1 (see FIG. 21). Then, as shown in FIGS. 13 to 16, when the light receiving position ji of the reflection line sensor 5B on the reflection surface hm coincides with the center position CL, the light reception waveform of the reflection line sensor 5B is substantially flat. When the light receiving position ji of the reflection line sensor 5B is shifted upward in a state parallel to the center position CL, the waveform becomes a waveform (FIG. 13). When a wide convex portion is read and a waveform whose output value is lowered is displayed (FIG. 14), and the light receiving position ji of the reflection line sensor 5B is shifted downward in a state parallel to the center position CL. Shows a waveform in which a narrow convex portion is read and the output value is reduced at each end of the light reception waveform of the reflection line sensor 5B (FIG. 15), and the light reception position ji of the reflection line sensor 5B is displayed. Detection location J In an oblique state in which one of the left and right sides is shifted downward with respect to the center position CL and the other side is shifted upward with respect to the center position CL, a narrow projection is formed on one end side of the received light waveform of the reflection line sensor 5B. The waveform whose output value is lowered by reading the shape portion is displayed, and the waveform whose output value is lowered by reading the wide convex portion is displayed on the other end side (FIG. 16), whereby the reflection line sensor 5B is displayed. Of the light receiving position ji with respect to the center position CL of the reflection surface hm is determined.
【0038】そして、図4に示すように、前記検出箇所
Jに面した収納部13Aの外板が、透過光用の検出光を
通過させる開口及び上記反射光用反射板8Bを位置させ
る開口を有する前板部29と、上記反射光用反射板8B
を背部側で受け止めるように上記前板部29に接続され
た後板部28と、前記窓部14Aの下端部を受け止める
ように上記後板部28に接続された窓受け用板部27と
から構成され、先ず、窓部14Aを外した状態で、反射
光用反射板8Bを前記反射面hmが検出箇所Jに向く状
態でセットし、次に、窓受け用板部27で下端部を受け
止められた窓部14Aを反射光用反射板8Bの上に重ね
て、窓部14Aの上端部を収納部13Aの外板にネジ止
めされる板ばね式の止め部25によって固定している。As shown in FIG. 4, the outer plate of the storage portion 13A facing the detection point J has an opening for passing the detection light for transmitted light and an opening for positioning the reflection plate 8B for reflected light. Having a front plate portion 29 and the reflection plate for reflected light 8B
A rear plate portion 28 connected to the front plate portion 29 so as to receive the lower portion of the window portion 14A, and a window receiving plate portion 27 connected to the rear plate portion 28 to receive the lower end portion of the window portion 14A. First, the reflection plate 8B for reflected light is set in a state where the window 14A is removed, and the reflection surface hm faces the detection point J, and then the lower end portion is received by the window receiving plate 27. The window 14A thus formed is superimposed on the reflection plate 8B for reflected light, and the upper end of the window 14A is fixed by a leaf spring type stopper 25 screwed to the outer plate of the housing 13A.
【0039】次に、各ラインセンサ5A,5Bの受光方
向の調整構造について説明する。尚、両ラインセンサ5
A ,5B の調整構造は同様に構成されているので、以
下、反射用ラインセンサ5Bを例として、図9〜図12
によって説明する。前記収納部13Bの底部側にベース
体52がネジ止めされるとともに、このベース体52の
左右両側面にネジ止めされて台形状の一対の縦板53が
立設され、この左右の縦板53に取付けた枢支ピン53
aによって、センサ保持体54が横軸回りに揺動自在に
枢支されている。そして、上記センサ保持体54の中央
部に、前記CCDセンサ部50及び前記光学系51を保
持する円環状の保持枠55が、円周方向に摺動自在な状
態で内嵌されるとともに、その保持枠55をセンサ保持
体54に固定するための固定ピン55aがセンサ保持体
54の上部に螺合されている。つまり、図10に示すよ
うに、固定ピン55aを緩めると保持枠55を摺動させ
ることができ、固定ピン55aを締め込むと保持枠55
が固定される。Next, a structure for adjusting the light receiving direction of each of the line sensors 5A and 5B will be described. In addition, both line sensors 5
Since the adjustment structures of A and 5B are configured in the same manner, the reflection line sensor 5B will be described as an example in FIGS.
It will be explained by. A base body 52 is screwed to the bottom side of the storage portion 13B, and a pair of trapezoidal vertical plates 53 is screwed to left and right side surfaces of the base body 52 to stand upright. Pivot pin 53 attached to
As a result, the sensor holder 54 is pivotally supported so as to be swingable about the horizontal axis. An annular holding frame 55 for holding the CCD sensor unit 50 and the optical system 51 is fitted in the center of the sensor holding body 54 in a circumferentially slidable manner. A fixing pin 55 a for fixing the holding frame 55 to the sensor holder 54 is screwed to the upper part of the sensor holder 54. That is, as shown in FIG. 10, when the fixing pin 55a is loosened, the holding frame 55 can slide, and when the fixing pin 55a is tightened, the holding frame 55 can be slid.
Is fixed.
【0040】又、前記ベース体52の後部側側面にネジ
止めされて縦板56が立設され、この縦板56に、セン
サ保持体54の下部に押し当てられる押し用のボルト5
6aが螺合されるとともに、上下に長孔状に形成された
挿通孔56cを通してセンサ保持体54に螺合された引
き用のボルト56bの頭が、縦板56にて受け止められ
ている。つまり、引き用のボルト56bをセンサ保持体
54に対する締込み方向と逆方向に回しながら、押し用
のボルト56aを締め込むと、図12(イ)のように、
センサ保持体54の上部が後方側に揺動し、一方、引き
用のボルト56bをセンサ保持体54に対する締込み方
向に回しながら、押し用のボルト56aを締込み方向と
逆方向に回すと、図12(ロ)のように、センサ保持体
54の上部が前方側に揺動する。A vertical plate 56 is screwed to the rear side surface of the base body 52 and stands upright. The vertical plate 56 is pressed against a lower portion of the sensor holder 54 by a pushing bolt 5.
6a is screwed, and the head of a pulling bolt 56b screwed to the sensor holder 54 through an insertion hole 56c formed in a vertically long hole shape is received by the vertical plate 56. That is, when the push bolt 56a is tightened while turning the pull bolt 56b in the direction opposite to the tightening direction with respect to the sensor holder 54, as shown in FIG.
When the upper part of the sensor holder 54 swings rearward, while turning the pulling bolt 56b in the tightening direction with respect to the sensor holder 54 and turning the pushing bolt 56a in the opposite direction to the tightening direction, As shown in FIG. 12B, the upper part of the sensor holder 54 swings forward.
【0041】以上より、前記各ラインセンサ5A,5B
が、前記検出箇所Jに向かう受光方向に沿う光軸回りに
回動調整自在で、且つ、前記検出箇所Jの長手方向に沿
う軸回りに揺動調整自在に構成されている。As described above, each of the line sensors 5A and 5B
However, it is configured to be rotatable and adjustable around an optical axis along a light receiving direction toward the detection location J and swingable around an axis along the longitudinal direction of the detection location J.
【0042】次に、出荷時の性能検査及び調整用の調整
治具であって、前記検出箇所J に位置されて前記各ライ
ンセンサ5A,5Bにて受光され、その受光情報に基づ
いて各種の調整を行うときに用いる不良物検出装置用の
調整治具について、図17〜図19によって説明する。
調整治具30は、治具本体30Aと、治具30を前記複
数の噴出ノズル6aに対して位置決めするための位置決
め部30Bとから構成されている。具体的には、図18
及び図19に示すように、位置決め部30Bは、20個
の噴出ノズル6aのうちの左右端部のノズル6aに嵌合
されて取付けられ、治具本体30Aが、その下端部を位
置決め部30B上に載せてその位置決め部30Bの端部
側の曲げ板部にて受け止められ、且つ、上端部を治具表
面が前記シュータ1の面に平行になる状態で立て掛けて
前記検出箇所J に位置するようにセットされる。治具本
体30Aは、図17に示すように、前記ライン状光源4
A,4Bにて照明されたときに、米粒群kの適正物(正
常米)からの検出光と略同一の明るさの光を反射及び透
過するように加工されたすりガラス板をベース材とし
て、その表面に、以下の各種表示部が黒色のシルク印刷
によって形成されている。Next, an adjustment jig for performance inspection and adjustment at the time of shipment, which is located at the detection point J and received by the line sensors 5A and 5B, and various types of light are received based on the received light information. An adjustment jig for the defective object detection device used when performing the adjustment will be described with reference to FIGS.
The adjusting jig 30 includes a jig main body 30A and a positioning portion 30B for positioning the jig 30 with respect to the plurality of ejection nozzles 6a. Specifically, FIG.
19, the positioning portion 30B is fitted and attached to the left and right end nozzles 6a of the 20 ejection nozzles 6a, and the jig body 30A has its lower end positioned above the positioning portion 30B. So that it is received by the bent plate portion on the end side of the positioning portion 30B, and the upper end portion is leaned on the jig surface in parallel with the surface of the shooter 1 so as to be positioned at the detection point J. Is set to The jig main body 30A is, as shown in FIG.
A frosted glass plate processed so as to reflect and transmit light having substantially the same brightness as the detection light from the proper product (normal rice) of the rice grain group k when illuminated by A and 4B is used as a base material. The following various display portions are formed on the surface by black silk printing.
【0043】まず、調整治具30の長手方向における複
数箇所(図では、中央と左右両側の3箇所)に、前記検
出箇所Jにおいて帯状に存在する米粒群kの幅方向にお
ける適正位置(図17において、tiにて示す線の位
置)を表示する適正位置表示部THが形成され、この適
正位置表示部THは、前記適正位置tiに対して前記米
粒群kの幅方向の一端側と他端側のいずれの位置である
かを表示するとともに、前記適正位置tiに対する前記
米粒群kの幅方向での位置ずれ量を表示するように構成
されている。つまり、各箇所の適正位置表示部THは、
真中の直線TH1を挟んで左右対称に位置する一対の斜
め線TH2にて構成され、その左右の斜め線TH2の間
隔が計測される。但し、各ラインセンサ5A,5Bの受
光方向等の設置状態や、受光部5aの位置等のラインセ
ンサ個々のばらつき、及び光学系51の特性等によっ
て、画像情報における画素の幅がばらつく影響を除去す
るために、前記位置ずれによって変化しない上記TH1
とこれに最も近い後述のFHとの間隔値も同時に計測し
て、その直線の間隔値に対する上記斜め線TH2の間隔
値の比によって前記ずれを判別している。つまり、上記
適正位置tiでの上記間隔値の比が適正比として設定さ
れ、ラインセンサ5A,5Bの受光位置が適正位置ti
から図の上側にずれると、上記比が適正比よりも大きく
なり、逆に、受光位置が適正位置tiから図の下側にず
れると、上記比が適正比よりも小さくなることから、前
記幅方向の一端側と他端側のいずれの位置であるかが判
別され、又、上記比と適正比との差から位置ずれ量が判
別される。尚、検査時には、上記比の値が前記表示パネ
ル21aに表示されるので、それを見ながら適正比にな
るように調整する。First, at a plurality of positions in the longitudinal direction of the adjusting jig 30 (three positions at the center and both right and left sides in the figure), the appropriate position in the width direction of the band k of the rice grains k present in the detection position J (FIG. 17). , A proper position display portion TH for displaying the position of the line indicated by ti) is formed. The proper position display portion TH is provided at one end and the other end of the rice grain group k in the width direction with respect to the proper position ti. The position of the rice grain group k with respect to the appropriate position ti in the width direction is displayed, as well as which position of the rice grain group k is displayed. That is, the appropriate position display part TH of each part is
It is composed of a pair of diagonal lines TH2 symmetrically located with respect to the middle straight line TH1, and the interval between the left and right diagonal lines TH2 is measured. However, the influence of the variation of the pixel width in the image information due to the installation state of each line sensor 5A, 5B such as the light receiving direction, the variation of each line sensor such as the position of the light receiving unit 5a, and the characteristics of the optical system 51 is eliminated. The above TH1 which does not change due to the position shift
The distance between the distance and the nearest FH, which will be described later, is also measured at the same time, and the deviation is determined by the ratio of the distance of the oblique line TH2 to the distance of the straight line. That is, the ratio of the interval values at the appropriate position ti is set as an appropriate ratio, and the light receiving positions of the line sensors 5A and 5B are set at the appropriate position ti.
When the light receiving position shifts from the appropriate position ti to the lower side of the figure when the light receiving position shifts from the appropriate position ti to the lower side of the figure, the ratio becomes smaller than the appropriate ratio. It is determined whether the position is at one end or the other end in the direction, and the amount of positional deviation is determined from the difference between the ratio and the appropriate ratio. At the time of inspection, the value of the ratio is displayed on the display panel 21a, and adjustment is made so as to obtain an appropriate ratio while watching the value.
【0044】又、前記治具本体30Aには、各ラインセ
ンサ5A,5Bの焦点位置を調整するときに読み取られ
る焦点位置調整用表示部SHが形成されている。この焦
点位置調整用表示部SHは、具体的には、左右2箇所に
設けた線幅の異なる直線群及びその他の線(前記各線T
H1,TH2や後述のFH等)にて構成される。そし
て、これらの線画像のすべてについて2階微分値を計算
して、その2階微分値が最大になる状態つまり各線画像
のエッジが最もシャープに撮像される状態になるよう
に、各ラインセンサ5A,5Bの焦点位置が調整され
る。The jig main body 30A is provided with a focal position adjusting display SH which is read when adjusting the focal position of each of the line sensors 5A and 5B. Specifically, the focus position adjusting display SH is provided with a group of straight lines having different line widths provided at two positions on the left and right and other lines (each of the lines T).
H1, TH2, and FH described later). Then, the second-order differential value is calculated for all of these line images, and each line sensor 5A is set so that the second-order differential value is maximized, that is, the edge of each line image is imaged sharpest. , 5B are adjusted.
【0045】又、治具本体30Aには、各噴出ノズル6
aに対応する位置を表示する噴出位置表示部FHが形成
され、この噴出位置表示部FHは、前記適正位置表示部
THの真中の直線TH1及び焦点位置調整用表示部SH
の直線をも利用して、各直線の中央位置が各噴出ノズル
6aの境界位置を示す状態で、調整治具30の長手方向
におけるの9箇所に形成されている。尚、治具本体30
Aの下側には、20個の噴出ノズル6aの境界位置を示
す線NKが表示されており、この各線NKを位置決め部
30Bの直ぐ下側に見える各噴出ノズル6aの境界位置
に合わせて治具本体30Aを検出箇所J にセットするこ
とにより、複数の噴出ノズル6aに対して治具本体30
Aの横方向の位置が正確に位置合わせされる。そして、
上記適正位置表示部THの位置、及び、適正位置表示部
THが設けられていない箇所においては、両側の適正位
置表示部THの間を等分(図では3等分)した位置によ
って、各噴出ノズル6aの境界位置が判別され、各噴出
ノズル6aによる排除範囲と各ラインセンサ5A,5B
における受光位置とが対応付けられる。Each of the jet nozzles 6 is provided on the jig body 30A.
a display position FH for displaying a position corresponding to the position a. The discharge position display FH includes a straight line TH1 in the middle of the appropriate position display TH and a display SH for focus position adjustment.
The adjusting jig 30 is formed at nine locations in the longitudinal direction with the center position of each straight line indicating the boundary position of each ejection nozzle 6a by using the straight line of (1). The jig body 30
A line NK indicating the boundary position of the 20 ejection nozzles 6a is displayed below A, and each line NK is adjusted according to the boundary position of each ejection nozzle 6a visible immediately below the positioning portion 30B. By setting the jig main body 30A at the detection location J, the jig main body 30A
The lateral position of A is accurately aligned. And
In the position of the appropriate position display part TH and the place where the appropriate position display part TH is not provided, each ejection is determined by the position equally divided (three equally in the figure) between the appropriate position display parts TH on both sides. The boundary position of the nozzle 6a is determined, and the exclusion range of each ejection nozzle 6a and each line sensor 5A, 5B
Is associated with the light receiving position.
【0046】そして、調整手順として、先ず、前記調整
治具30を用いて、前記透過用ランセンサ5Aによる調
整と反射用ラインセンサ5Bとを順次行う。例えば、先
に、透過用ラインセンサ5Aによる調整を行う場合に
は、前記調整治具30をそのシルク印刷面が透過用ライ
ンセンサ5A側に向く状態で前記検出箇所J にセット
し、前記焦点位置調整用表示部SHを読み取った情報に
基づいて透過用ラインセンサ5Aの焦点位置を調整し、
次に、前記適正位置表示部THを読み取った情報に基づ
いて透過用ラインセンサ5Aの受光位置が前記適正位置
tiに位置するように、その受光方向を調整し(光軸回
りに回動調整及び前記検出箇所Jの長手方向に沿う軸回
りの揺動調整を行い)、さらに、前記噴出位置表示部F
Hを読み取った情報に基づいて、透過用ラインセンサ5
Aの複数のエア噴出ノズル6aに対応する横方向での受
光位置を設定する。As an adjustment procedure, first, the adjustment by the transmission run sensor 5A and the reflection line sensor 5B are sequentially performed using the adjustment jig 30. For example, when the adjustment is first performed by the transmission line sensor 5A, the adjustment jig 30 is set at the detection point J with the silk print surface thereof facing the transmission line sensor 5A, and the focus position is adjusted. The focal position of the transmission line sensor 5A is adjusted based on the information read from the adjustment display section SH,
Next, the light receiving direction of the transmission line sensor 5A is adjusted based on the information read from the appropriate position display portion TH so that the light receiving position of the transmitting line sensor 5A is located at the appropriate position ti (rotation adjustment around the optical axis and Swing adjustment about the axis along the longitudinal direction of the detection point J is performed), and the ejection position display section F
Based on the information obtained by reading H, the transmission line sensor 5
A light receiving position in the horizontal direction corresponding to the plurality of air ejection nozzles 6a of A is set.
【0047】次に、反射用ラインセンサ5Bによる調整
を行うために、前記調整治具30をそのシルク印刷面が
反射用ラインセンサ5B側に向く状態で前記検出箇所J
に再セットし、前記焦点位置調整用表示部SHを読み取
った情報に基づいて反射用ラインセンサ5Bの焦点位置
を調整し、次に、前記適正位置表示部THを読み取った
情報に基づいて反射用ラインセンサ5Bの受光位置が前
記適正位置tiに位置するように、その受光方向を調整
する(光軸回りに回動調整及び前記検出箇所Jの長手方
向に沿う軸回りの揺動調整を行い)。Next, in order to perform adjustment by the reflection line sensor 5B, the adjustment jig 30 is moved to the detection position J with its silk-printed surface facing the reflection line sensor 5B.
The focus position of the reflection line sensor 5B is adjusted based on the information read from the focal position adjustment display section SH, and then the reflection position is adjusted based on the information read from the appropriate position display section TH. The light receiving direction of the line sensor 5B is adjusted so that the light receiving position is located at the proper position ti (rotation adjustment around the optical axis and swing adjustment around the axis along the longitudinal direction of the detection point J). .
【0048】次に、上記調整治具30を検出箇所J から
外して、前記反射面hmの表示部分を読み取った情報に
基づいて前記反射用ラインセンサ5Bの受光位置が前記
中央位置CLに位置するように反射用ラインセンサ5B
の受光方向を調整する(光軸回りに回動調整及び前記検
出箇所Jの長手方向に沿う軸回りの揺動調整を行う)。
ここで、反射光ラインセンサ5Bの受光位置について
は、上記反射面hmに対する調整により、調整治具30
を用いて最初に行った調整状態からずれている場合があ
るので、次に、前記調整治具30を用いて前記複数のエ
ア噴出部6a夫々に対応する前記反射光ラインセンサ5
Bの各受光位置での前記適正位置tiからのずれ量を判
別して、そのずれ量に基づいて、反射光ラインセンサ5
Bによって前記検出箇所Jにて不良物の存在が判別され
た後、前記複数のエア噴出部6aを作動させるまでの時
間間隔を、複数のエア噴出部6a夫々について調整して
設定するようにして、エア噴出のタイミングが調整され
る。具体的には、調整治具30を検出箇所Jにセットす
ると、後述の制御装置10にて、上記反射光ラインセン
サ5Bの各受光位置での前記適正位置tiからのずれ量
が判別され、上記時間間隔が自動設定される。尚、透過
光ラインセンサ5Aの受光情報に基づいて複数のエア噴
出部6aを作動させるまでの時間間隔は、その受光位置
が前記適正位置tiに位置しているときの標準値に設定
される。このとき、さらに、前記噴出位置表示部FHを
読み取った情報に基づいて、反射用ラインセンサ5Bの
複数のエア噴出ノズル6aに対応する横方向での受光位
置を設定する。Next, the adjustment jig 30 is removed from the detection point J, and the light receiving position of the reflection line sensor 5B is located at the center position CL based on the information obtained by reading the display portion of the reflection surface hm. Line sensor for reflection 5B
(The rotation adjustment about the optical axis and the swing adjustment about the axis along the longitudinal direction of the detection point J are performed).
Here, with respect to the light receiving position of the reflected light line sensor 5B, the adjustment jig 30 is adjusted by adjusting the reflection surface hm.
In some cases, the adjustment state may be deviated from the adjustment state performed by using the adjustment jig 30.
B. The amount of deviation from the appropriate position ti at each light receiving position B is determined, and the reflected light line sensor 5
After the presence of a defective object is determined at the detection location J by B, the time interval until the plurality of air ejection portions 6a are activated is adjusted and set for each of the plurality of air ejection portions 6a. The timing of air ejection is adjusted. Specifically, when the adjustment jig 30 is set at the detection position J, the controller 10 described later determines the amount of deviation from the appropriate position ti at each light receiving position of the reflected light line sensor 5B, and The time interval is set automatically. Note that the time interval until the plurality of air ejection portions 6a are activated based on the light receiving information of the transmitted light line sensor 5A is set to a standard value when the light receiving position is located at the appropriate position ti. At this time, a light receiving position in the horizontal direction corresponding to the plurality of air ejection nozzles 6a of the reflection line sensor 5B is set based on the information read from the ejection position display section FH.
【0049】以上の調整を行うことにより、複数のエア
噴出ノズル6aの各位置に対する各ラインセンサ5A,
5Bの長手方向での受光位置、及び、各ラインセンサ5
A,5Bの受光情報に基づく複数のエア噴出ノズル6a
の噴出タイミングが、精度良く設定され、又、各ライン
センサ5A,5Bの焦点位置及び受光位置が精度良く設
定される。By performing the above adjustment, each line sensor 5A,
5B, the light receiving position in the longitudinal direction, and each line sensor 5
A plurality of air ejection nozzles 6a based on light receiving information of A and 5B
Is accurately set, and the focal position and the light receiving position of each of the line sensors 5A and 5B are accurately set.
【0050】次に、不良検出装置の全体の装置構成につ
いて説明する。図1に示すように、ジャッキボルト式の
脚部F0を備えた底板F1上に立設された縦枠F2,F
3,F4が、横枠F5,F6,F7によって連結されて
機枠が構成されている。表側の縦枠F4の上部斜め部分
に、情報の表示及び入力用の操作卓21が設置され、前
記フィーダ9に対する振動発生器9Aが横枠F5上に設
置され、底板F1上には、電源ボックス17と、前記エ
アー吹き付け装置6及び前記清掃ノズル26に対してエ
アを供給するためのエアタンク15とが設置されてい
る。又、箱状の前記収納部13A,13Bが前部側で縦
枠F4に後部側で縦枠F3に夫々支持され、シュート1
が上部側で横枠F6に下部側で収納部13Bに支持さ
れ、制御ボックス16が、横枠F7上に設置されてい
る。装置上部には、警報用の回転灯18(「パトライ
ト」という)が設置され、機枠には、装置外面を覆うカ
バー12が取り付けられている。尚、各ユニットの前面
側のカバー12のカバー上部12Aは、上下方向に開閉
式に構成され、そのカバー上部12Aを持ち上げた状態
で、前記調整治具30のセットや、装置内部の点検等を
行う。Next, the overall device configuration of the defect detection device will be described. As shown in FIG. 1, vertical frames F2, F erected on a bottom plate F1 provided with jack bolt type legs F0.
3, F4 are connected by horizontal frames F5, F6, F7 to form a machine frame. An operation console 21 for displaying and inputting information is installed in the upper oblique portion of the front vertical frame F4, a vibration generator 9A for the feeder 9 is installed on the horizontal frame F5, and a power supply box is installed on the bottom plate F1. 17 and an air tank 15 for supplying air to the air blowing device 6 and the cleaning nozzle 26. The box-shaped storage portions 13A and 13B are supported by the vertical frame F4 on the front side and the vertical frame F3 on the rear side, respectively.
Are supported on the upper side by the horizontal frame F6 and on the lower side by the storage section 13B, and the control box 16 is installed on the horizontal frame F7. A rotary light 18 for alarm (referred to as a "patlight") is installed at the upper part of the apparatus, and a cover 12 that covers the outer surface of the apparatus is attached to the machine frame. The cover upper portion 12A of the cover 12 on the front side of each unit is configured to be openable and closable in the vertical direction. With the cover upper portion 12A lifted, the setting of the adjusting jig 30 and the inspection of the inside of the device are performed. Do.
【0051】不良検出装置は、実際には、図20に示す
ように、4台の検査装置(ユニット)SU1,SU2,
SU3,SU4を横方向に並べて検査システムに構成さ
れ、そのうちの1台SU1に設置した前記操作卓21に
よって、全ユニットについての運転操作を行うように構
成されている。As shown in FIG. 20, the defect detection device is actually composed of four inspection devices (units) SU1, SU2,
The inspection system is configured by arranging SU3 and SU4 in the horizontal direction, and the operation console 21 installed in one of the units SU1 is configured to perform the operation operation for all units.
【0052】前記表示卓21には、図21に示すよう
に、タッチパネルに構成した表示パネル21aと、装置
の電源を入り切りする主電源スイッチ21bと、フィー
ダスイッチ21cと、排除スイッチ21dとが設けられ
ている。ここで、フィーダスイッチ21cを入り操作す
ると、全ユニットのフィーダ9が一括して作動し、排除
スイッチ21dを入り操作すると、全ユニットのエアー
吹き付け装置6が一括して排除作動する。又、各ユニッ
トには、作動中の情報等を表示するためのLEDパネル
20と、各エアタンク15から供給されるエアーの圧力
を示す圧力計32とが設けられている。As shown in FIG. 21, the display console 21 is provided with a display panel 21a formed as a touch panel, a main power switch 21b for turning on / off the power of the apparatus, a feeder switch 21c, and an exclusion switch 21d. ing. Here, when the feeder switch 21c is turned on, the feeders 9 of all units operate collectively, and when the elimination switch 21d is turned on, the air blowing devices 6 of all units operate collectively. Each unit is provided with an LED panel 20 for displaying information during operation and the like, and a pressure gauge 32 indicating the pressure of air supplied from each air tank 15.
【0053】制御構成を説明すると、図5に示すよう
に、マイクロコンピュータ利用の制御装置10が設けら
れ、この制御装置10に、両ラインセンサ5A,5Bか
らの各画像信号と、前記操作卓21からの操作情報とが
入力されている。一方、制御装置10からは、前記操作
卓21及び各LEDパネル20に対する表示用の各駆動
信号と、前記ライン状光源4A,4Bを点灯させる点灯
回路19に対する駆動信号と、前記回転灯18を作動さ
せる駆動信号と、各噴射ノズル6aへの各エアー供給を
オンオフする複数個の電磁弁11に対する駆動信号と、
前記フィーダ用振動発生器9Aに対する駆動信号と、前
記清掃ノズル26に対するエアー供給をオンオフする電
磁弁26Aに対する駆動信号とが出力されている。To explain the control structure, as shown in FIG. 5, a control device 10 using a microcomputer is provided, and the control device 10 includes the image signals from both line sensors 5A and 5B and the console 21 And operation information from is input. On the other hand, from the control device 10, each drive signal for display on the console 21 and each LED panel 20, the drive signal for the lighting circuit 19 for lighting the linear light sources 4A and 4B, and the rotating lamp 18 are operated. A drive signal to be performed, a drive signal to a plurality of electromagnetic valves 11 for turning on and off each air supply to each injection nozzle 6a,
A drive signal for the feeder vibration generator 9A and a drive signal for an electromagnetic valve 26A for turning on and off the air supply to the cleaning nozzle 26 are output.
【0054】そして、上記制御装置10を利用して、前
記米粒群kからの検出光(透過検出光及び反射検出光)
及び前記各反射面hmからの反射光を受光する前記透過
用及び反射用ラインセンサ5A,5Bの受光情報に基づ
いて、その受光量が前記米粒群kのうちの適正物(良
米)からの検出光に対する適正光量範囲を外れたか否か
の判別を行う判別手段100が構成されている。具体的
には、この判別手段100は、透過用ラインセンサ5A
及び反射用ラインセンサ5Bの各受光情報に基づいて、
各ラインセンサ5A,5Bに備えた前記受光部5a夫々
について、各受光部5aの受光量が適正光量範囲(透過
光の場合はΔEt、反射光の場合はΔEh)を外れたか
否かの判別を行う。Then, the control device 10 is used to detect light (transmission detection light and reflection detection light) from the rice grain group k.
Based on the light receiving information of the transmission and reflection line sensors 5A and 5B that receive the reflected light from each of the reflection surfaces hm, the amount of light received is from the proper one (good rice) in the rice grain group k. A determination means 100 is provided for determining whether or not the detection light is out of an appropriate light amount range. Specifically, the determination means 100 is provided with the transmission line sensor 5A.
And each light reception information of the reflection line sensor 5B,
For each of the light receiving sections 5a provided in each of the line sensors 5A and 5B, it is determined whether or not the amount of light received by each of the light receiving sections 5a is out of an appropriate light amount range (ΔEt for transmitted light, ΔEh for reflected light). Do.
【0055】次に、前記適正光量範囲を設定するための
補正処理について説明する。照明光源5A,5Bからの
照明光量が十分に安定した状態で、各ラインセンサ5
A,5Bについて前述の受光位置の調整を行った後、前
記治具本体30Aと同じ外形形状で前記表示部が印刷さ
れていないガラス板、つまり米粒群kの適正物からの検
出光と略同一の明るさの光を反射及び透過するように加
工されたすりガラス板を前記検出箇所Jに位置させて
(図19参照)、各ラインセンサ5A,5Bが受光する
各受光情報を基準受光量情報として求める。つまり、図
24に示すように、各ラインセンサ5A,5Bの各受光
部5a毎に、透過光の基準受光量Siと反射光の基準受
光量Si' (i=0〜〔受光部の数−1〕)を記憶し、
同時に、各基準受光量Si,Si' についての平均値S
m,Sm' を求める(この処理を「リファレンスデータ
作成」と呼ぶ)。Next, a correction process for setting the appropriate light amount range will be described. When the illumination light amounts from the illumination light sources 5A and 5B are sufficiently stable, each line sensor 5
After adjusting the light receiving position for A and 5B, the detection light from the glass plate on which the display unit is not printed in the same outer shape as the jig main body 30A, that is, the detection light from the proper rice grain group k is substantially the same. A frosted glass plate processed so as to reflect and transmit light of the same brightness is positioned at the detection point J (see FIG. 19), and each light reception information received by each line sensor 5A, 5B is used as reference light reception amount information. Ask. That is, as shown in FIG. 24, for each light receiving portion 5a of each of the line sensors 5A and 5B, the reference light receiving amount Si of the transmitted light and the reference light receiving amount Si ′ of the reflected light (i = 0 to [number of light receiving portions− 1))
At the same time, the average value S for each reference light reception amount Si, Si '
m, Sm ′ (this process is called “reference data creation”).
【0056】又、照明光源5A,5Bからの照明光量の
変動を検出する。具体的には、照明光量が十分に安定し
た状態で、図25に示すように、前記反射光用反射板8
Bからの反射光を受光する反射用ラインセンサ5Bの各
受光部5aについて、出力電圧r〔i〕(i=0〜〔受
光部の数−1〕)を基準の照明光量値として計測し、そ
の全受光部についての平均値rmを求めておく(この処
理を「照明光補正データ作成」と呼ぶ)。一方、実際の
検査を行うときの最新の時点で、上記反射用反射板8B
からの反射光を受光する反射用ラインセンサ5Bの各受
光部5aの出力電圧r' 〔i〕を計測し、その全受光部
についての平均値rm' を求め、最初に求めた基準の照
明光量値の平均値rmと最新の照明光量値の平均値r
m' との比(rm' /rm)を照明光量の変化率とす
る。Further, a change in the amount of illumination light from the illumination light sources 5A and 5B is detected. Specifically, when the illumination light amount is sufficiently stable, as shown in FIG.
For each light receiving portion 5a of the reflection line sensor 5B that receives the reflected light from B, the output voltage r [i] (i = 0 to [the number of light receiving portions-1]) is measured as a reference illumination light value, An average value rm for all the light receiving units is obtained (this process is referred to as “illumination light correction data creation”). On the other hand, at the latest time when an actual inspection is performed, the reflection reflector 8B
The output voltage r '[i] of each light receiving portion 5a of the reflection line sensor 5B that receives the reflected light from the light source is measured, the average value rm' of all the light receiving portions is obtained, and the reference illumination light amount obtained first is obtained. Average value rm and average value r of the latest illumination light value
The ratio (rm '/ rm) to m' is defined as a change rate of the illumination light amount.
【0057】尚、上記照明光量の安定状態を得るため
に、出荷調整時等において、点灯後充分な時間が経過し
てから上記調整や基準光量の測定等を行う。又、実際の
検査運転時には、清掃動作を行う時間間隔を設定して
(例えば30分)検査を行い、その清掃間隔の時間が経
過すると、前記清掃ノズル26にて窓部14A,14B
が清掃されるので、その清掃後に、前記照明光量の測定
を行う。In order to obtain a stable state of the illumination light amount, for example, at the time of shipment adjustment, the adjustment, the measurement of the reference light amount, and the like are performed after a sufficient time has elapsed after lighting. In the actual inspection operation, a time interval for performing the cleaning operation is set (for example, 30 minutes), and the inspection is performed. When the time of the cleaning interval elapses, the windows 14A and 14B are opened by the cleaning nozzle 26.
Is cleaned, and after the cleaning, the illumination light amount is measured.
【0058】そして、透過光及び反射光の各センサ出力
電圧jについて、基準受光量の平均値Sm,Sm' に対
する各受光部5aの基準受光量Si,Si' の偏差を打
ち消すために、基準受光量の平均値Sm,Sm' と各受
光部5aの基準受光量Si,Si' の比を掛け、さら
に、照明光量の変動の影響を打ち消すために、前記照明
光量の変化率(rm' /rm)で割るように、下式に基
づいて補正処理して、透過光センサ5Bの補正後の出力
電圧jt(センサ補正出力)、及び反射光センサ5Aの
補正後の出力電圧jh(センサ補正出力)を得る。Then, for each sensor output voltage j of the transmitted light and the reflected light, the reference light receiving amount Si, Si 'of each light receiving section 5a with respect to the average value Sm, Sm' of the reference light receiving amount is canceled out. In order to multiply the average value Sm, Sm 'of the light quantity by the ratio of the reference light receiving quantity Si, Si' of each light receiving section 5a, and further to cancel the influence of the fluctuation of the light quantity, the change rate of the light quantity (rm '/ rm) ), The corrected output voltage jt of the transmitted light sensor 5B (sensor corrected output) and the corrected output voltage jh of the reflected light sensor 5A (sensor corrected output). Get.
【0059】[0059]
【数1】センサ補正出力jt=j×(Sm/Si)×
(rm/rm' ) センサ補正出力jh=j×(Sm' /Si' )×(rm
/rm' )## EQU1 ## Sensor correction output jt = j × (Sm / Si) ×
(Rm / rm ′) Sensor correction output jh = j × (Sm ′ / Si ′) × (rm
/ Rm ')
【0060】次に、上記各センサ補正出力jt,jhに
ついての感度補正処理を行う。ここでは、感度値を標準
値(100)に設定している。尚、実際の検査運転時に
おいては、下式に示すように、感度値を100より大に
(例えば、110)に設定すると、基準受光量の平均値
Sm,Sm' からの各センサ補正出力jt,jhの偏差
(jt−Sm),(jh−Sm' )が大きくなるように
検出受光量が増加補正され、感度値を100より小に
(例えば、90)に設定すると、上記偏差(jt−S
m),(jh−Sm' )が小さくなるように検出受光量
が減少補正された透過光及び反射光の各感度補正出力j
k,jk' が得られる。Next, sensitivity correction processing is performed on the sensor correction outputs jt and jh. Here, the sensitivity value is set to the standard value (100). In the actual inspection operation, when the sensitivity value is set to be larger than 100 (for example, 110) as shown in the following equation, each sensor correction output jt from the average value Sm, Sm 'of the reference light receiving amount is set. , Jh, the detected light receiving amount is corrected to increase so that the deviations (jt−Sm) and (jh−Sm ′) become large, and when the sensitivity value is set to be smaller than 100 (for example, 90), the deviation (jt−Sm) S
m), the sensitivity correction output j of the transmitted light and the reflected light, in which the detected light reception amount is corrected to decrease so that (jh-Sm ') becomes smaller.
k, jk ′ are obtained.
【0061】[0061]
【数2】感度補正出力jk=(感度値/100)×(j
t−Sm)+(Sm) 感度補正出力jk' =(感度値/100)×(jh−S
m' )+(Sm' )## EQU2 ## Sensitivity correction output jk = (sensitivity value / 100) × (j
t−Sm) + (Sm) Sensitivity correction output jk ′ = (sensitivity value / 100) × (jh−S
m ') + (Sm')
【0062】つまり、感度値を100より大きくして上
記受光量を増加させると、増加補正された受光量が適正
光量範囲から外れ易くなって不良判別の感度が高くな
り、一方、感度値を100より小さくして上記受光量を
減少させると、減少補正された受光量が適正光量範囲か
ら外れ難くなって不良判別の感度が低くなるように、透
過光及び反射光の適正光量範囲に対する受光量の感度が
補正される。That is, if the sensitivity value is increased to a value greater than 100 to increase the amount of received light, the increased amount of received light tends to deviate from the appropriate light amount range, thereby increasing the sensitivity of defect determination. When the received light amount is reduced by making the received light amount smaller, the received light amount of the transmitted light and the reflected light with respect to the appropriate light amount range is reduced so that the decreased corrected light amount does not easily deviate from the appropriate light amount range and the sensitivity of defect determination becomes low. The sensitivity is corrected.
【0063】次に、前記適正光量範囲の設定について具
体的に説明すると、前記操作卓21に備えた表示パネル
21aを用いて、各ユニットSU1〜SU4を順番に選
択して上記適正光量範囲の設定操作を行う。先ず、前記
主電源スイッチ21bを入り操作すると、操作パネル2
1aが図22に示す初期画面になり、この初期画面に
は、4つのユニット番号表示60の下に、各ユニットS
U1,2,3,4の処理速度の設定値61、フィーダ9
の流量の設定値62、及び前記感度の設定値63につい
ての現在の状態が示されている。ここで、3つのユニッ
トSU1,2,3は、外部からの検査対象物について、
高速の処理速度で一次選別を行い、その3つのユニット
SU1,2,3による一次選別後の不良物について、良
品を2次選別する処理をユニットSU4で低速の処理速
度で行うように設定されている。又、画面下部に、光源
の使用累積時間の表示箇所65と、現在の運転モードの
表示箇所66が設けられている。尚、排除率の表示箇所
64には、実際に排除動作が行われているときに、その
頻度がバーグラフ表示される。Next, the setting of the appropriate light amount range will be described in detail. The display panel 21a provided on the console 21 is used to sequentially select the units SU1 to SU4 to set the appropriate light amount range. Perform the operation. First, when the main power switch 21b is turned on and operated, the operation panel 2 is turned on.
1a is the initial screen shown in FIG. 22, and the initial screen includes four unit number displays 60 under each unit S.
U1, 2, 3, 4 processing speed set value 61, feeder 9
The current state of the flow rate setting value 62 and the sensitivity setting value 63 is shown. Here, the three units SU1, SU2, and SU3 are used for inspection objects from outside.
The primary sorting is performed at a high processing speed, and the process of secondary sorting of non-defective products after the primary sorting by the three units SU1, SU2, SU3 is set to be performed at a low processing speed by the unit SU4. I have. Further, at the lower part of the screen, a display location 65 of the cumulative use time of the light source and a display location 66 of the current operation mode are provided. In the exclusion rate display area 64, when the exclusion operation is actually performed, the frequency thereof is displayed as a bar graph.
【0064】そして、初期画面の右下の設定変更キー6
7に指等を触れると、図23に示す設定変更画面に切り
換わり、この設定変更画面には、運転モードの切換設定
キー70、前記フィーダ9の流量設定用のフィーダキー
71、フィーダ/排除のON/OFFキー72、時刻調
整用の時計キー73、調整モードの設定キー74、前記
感度の設定キー75、光源安定時間の設定キー76、清
掃間隔の設定キー77、及び手動排除キー78が設けら
れ、画面左下には、元の初期画面に戻すためのモニタ画
面キー79が設けられている。ここで、調整モードキー
74に触れると、前述の各種の調整を行うための調整モ
ード表示画面に切り換わり、又、感度設定キー75に触
れると、感度設定画面に切り換えて、4つのユニットの
感度値を各ユニット毎に設定できる。Then, a setting change key 6 at the lower right of the initial screen
When a finger or the like is touched, the screen changes to a setting change screen shown in FIG. 23. The setting change screen includes an operation mode switching setting key 70, a feeder key 71 for setting the flow rate of the feeder 9, and a feeder / exclusion switch. An ON / OFF key 72, a time adjustment clock key 73, an adjustment mode setting key 74, the sensitivity setting key 75, a light source stabilization time setting key 76, a cleaning interval setting key 77, and a manual exclusion key 78 are provided. In addition, a monitor screen key 79 for returning to the original initial screen is provided at the lower left of the screen. Here, touching the adjustment mode key 74 switches to the adjustment mode display screen for performing the various adjustments described above, and touching the sensitivity setting key 75 switches to the sensitivity setting screen to change the sensitivity of the four units. Values can be set for each unit.
【0065】そこで、上記運転モードに切り換えて、各
ユニットを選択し、所定時間に所定量の米粒群kを流下
させて、前記透過光及び反射光での各受光情報のデータ
群を得る。そして、この受光データについて、前述のセ
ンサ補正出力処理と、標準感度値での感度補正出力処理
とがなされ、その補正後の透過光及び反射光での各受光
データについて、暗側から明側に亘る各受光量に対する
度数分布が求められて、前記表示パネル21aに表示さ
れるので、透過又は反射光の夫々において、各度数分布
表示の上限値と下限値との間の範囲として、透過光の適
正光量範囲ΔEt又は反射光の適正光量範囲ΔEhを設
定する。Then, the mode is switched to the above-mentioned operation mode, each unit is selected, and a predetermined amount of rice grain group k is caused to flow down for a predetermined time to obtain a data group of each light reception information by the transmitted light and the reflected light. The received light data is subjected to the above-described sensor correction output processing and sensitivity correction output processing at the standard sensitivity value, and the received light data of the transmitted light and the reflected light after the correction are changed from the dark side to the light side. Since the frequency distribution for each received light amount is obtained and displayed on the display panel 21a, in each of the transmitted or reflected light, the range between the upper limit and the lower limit of each frequency distribution display is defined as the range of the transmitted light. An appropriate light amount range ΔEt or an appropriate light amount range ΔEh of reflected light is set.
【0066】次に、上記設定した適正光量範囲ΔEt,
ΔEhに基づいて、図26に示すように、実際の不良検
出処理時の判別用データをルックアップテーブルとして
記憶するメモリLUT(透過光用のLUTと透過光用の
LUT)が、下記のようにして作成される。 (1)位置データi(i=0〜〔受光部の数−1〕)で
表した各受光部5a毎に、下式のように、各ラインセン
サ5A,5Bの出力電圧jを、とり得る全ての値(例え
ば、8ビットの信号とすると、256レベル)の範囲で
変化させながら、各値jに、前述の基準受光量の平均値
Sm,Sm' と各受光部5aの基準受光量Si,Si'
の比を掛けるとともに、前記照明光量の変化率(rm'
/rm)で割って出力電圧jの補正値を求め、その値が
前記適正光量範囲ΔEt,ΔEh内であれば、メモリL
UTの該当番地(i,j)に判定出力として「0」を記
憶させ、適正光量範囲ΔEt,ΔEhを外れていれば、
メモリLUTの該当番地(i,j)に判定出力として
「1」を記憶させる。尚、実際の運転時には、照明光量
が最初のものと異なるので、各検査運転時毎に、照明光
量の変化率(rm' /rm)のデータを求め、それに応
じて、上記メモリLUTのデータを書き換えて使用す
る。Next, the appropriate light amount range ΔEt,
Based on ΔEh, as shown in FIG. 26, a memory LUT (a transmitted light LUT and a transmitted light LUT) that stores determination data at the time of actual defect detection processing as a look-up table is as follows. Created. (1) For each light receiving unit 5a represented by position data i (i = 0 to [number of light receiving units-1]), the output voltage j of each line sensor 5A, 5B can be obtained as in the following equation. The average value Sm, Sm 'of the above-mentioned reference light receiving amount and the reference light receiving amount Si of each light receiving unit 5a are added to each value j while changing the value within a range of all values (for example, 256 levels when an 8-bit signal is used). , Si '
And the rate of change of the illumination light quantity (rm ′)
/ Rm) to obtain a correction value for the output voltage j. If the correction value is within the appropriate light amount range ΔEt, ΔEh, the memory L
"0" is stored as the judgment output in the corresponding address (i, j) of the UT, and if the value is out of the appropriate light amount range ΔEt, ΔEh,
“1” is stored as a judgment output at the corresponding address (i, j) of the memory LUT. In the actual operation, the illumination light amount is different from the first one. Therefore, the data of the change rate (rm '/ rm) of the illumination light amount is obtained for each inspection operation, and the data of the memory LUT is changed accordingly. Rewrite and use.
【0067】[0067]
【数3】透過光出力jの補正値=j×(Sm/Si)×
(rm/rm' ) 反射光出力jの補正値=j×(Sm' /Si' )×(r
m/rm' )## EQU3 ## Correction value of transmitted light output j = j × (Sm / Si) ×
(Rm / rm ') Correction value of reflected light output j = j * (Sm' / Si ') * (r
m / rm ')
【0068】(2)そして、上記作成したメモリLUT
に対して、受光部5aの位置データi(i=0〜〔受光
部の数−1〕)と、その位置iでの各ラインセンサ5
A,5Bの出力電圧jとを入力すると、その各受光部5
aについて、正常な米粒のときは判定出力「0」が、不
良物のときは判定出力「1」が夫々出力される。(2) The memory LUT created above
With respect to the position data i (i = 0 to [the number of light receiving units−1]) of the light receiving unit 5a and the line sensors 5 at the position i.
When the output voltage j of each A and 5B is input, each light receiving unit 5
Regarding a, a judgment output “0” is output for a normal rice grain, and a judgment output “1” is output for a defective rice grain.
【0069】次に、透過光用及び反射光用の各ラインセ
ンサ5A,5Bの受光出力における不良物の判別につい
て、具体的に説明する。透過光の場合は、図27の透過
光用ラインセンサ5Aの補正後出力波形に示すように、
各受光部5aの受光量に対応する補正後の出力電圧が米
粒群kに対する適正光量範囲ΔEt内にある場合に正常
な米粒の存在を判別し、設定適正範囲ΔEtを外れた場
合に米粒の不良又は異物の存在を判別する。図中、e0
は、正常米粒からの標準的な透過光に対する出力電圧レ
ベルである。そして、適正光量範囲ΔEtよりも小さい
場合に、正常な米粒よりも透過率が小さい不良の米粒や
異物等(例えば、黒色の石粒)の存在を判別し、適正光
量範囲ΔEtよりも大きい場合に、正常な米粒kよりも
透過率が大きい明側の不良の米粒k又は前記異物の存在
を判別する。この明側の不良の米粒k又は異物の例とし
ては、薄い色付の透明なガラス片等である。図27に
は、受光部5aの出力電圧(受光量)が、米粒kに一部
着色部分が存在する位置や黒色の石等の位置(e1で示
す)、及び、胴割れ部分が存在する位置(e2で示す)
では、上記適正光量範囲ΔEtよりも下側に位置し、
又、正常な米粒よりも透過率が大きい異物等が存在する
場合には、位置e4に示すように適正光量範囲ΔEtよ
りも上側に位置している状態を例示している。Next, a specific description will be given of the determination of a defective object in the light receiving output of each of the line sensors 5A and 5B for transmitted light and reflected light. In the case of transmitted light, as shown in the corrected output waveform of the transmitted light line sensor 5A in FIG.
If the corrected output voltage corresponding to the amount of light received by each light receiving unit 5a is within the appropriate light amount range ΔEt for the rice grain group k, the presence of normal rice grains is determined. Alternatively, the presence of a foreign substance is determined. In the figure, e0
Is the output voltage level for standard transmitted light from normal rice grains. Then, when the light amount is smaller than the appropriate light amount range ΔEt, it is determined whether there is a defective rice grain or a foreign substance (for example, black stone) having a transmittance lower than that of a normal rice particle, and when it is larger than the appropriate light amount range ΔEt. The presence of the defective rice grain k on the light side, which has a higher transmittance than the normal rice grain k, or the presence of the foreign matter is determined. An example of the defective rice grain k or foreign matter on the light side is a thin colored transparent glass piece. In FIG. 27, the output voltage (light reception amount) of the light receiving portion 5a is determined by the position where a part of the rice grain k has a colored portion, the position of a black stone or the like (indicated by e1), and the position where a cracked portion exists. (Indicated by e2)
Is located below the appropriate light amount range ΔEt,
Further, in the case where there is a foreign substance or the like having a transmittance higher than that of normal rice grains, the state is illustrated above the appropriate light amount range ΔEt as shown in a position e4.
【0070】一方、反射光の場合には、図28の反射光
用のラインセンサ5Bの補正後出力波形に示すように、
各受光部5aの受光量に対応する補正後の出力電圧が適
正光量範囲ΔEh内にある場合に正常な米粒の存在を判
別し、適正光量範囲ΔEhを外れた場合に前記米粒の不
良又は前記異物の存在を判別する。図中、e0' は、正
常米粒からの標準的な反射光に対する出力電圧レベルで
ある。図28には、米粒kに一部着色部分が存在する位
置(e1' で示す)や胴割れ部分が存在する位置(e
2' で示す)では、上記適正光量範囲ΔEhから下側に
外れている状態を例示し、又、ガラス片等の異物が存在
する場合には、異物からの強い直接反射光によって位置
e3' に示すように適正光量範囲ΔEhから上側に外れ
ている状態を例示している。図示しないが、黒色の石等
では、反射率が非常に小さいので、波形において適正光
量範囲ΔEhから下側に大きく外れることになり、又、
前記黒色の領域8aからの光がガラス片で屈折して受光
される場合にも、上記適正光量範囲ΔEhから下側に外
れることになる。On the other hand, in the case of the reflected light, as shown in the corrected output waveform of the line sensor 5B for reflected light in FIG.
When the corrected output voltage corresponding to the amount of light received by each light receiving unit 5a is within the appropriate light amount range ΔEh, the presence of a normal rice grain is determined. Is determined. In the figure, e0 'is an output voltage level for standard reflected light from normal rice grains. In FIG. 28, a position (shown by e1 ′) where a part of the rice grain k is present and a position (e1) where a cracked portion exists are shown.
2 ′) illustrates a state deviating downward from the appropriate light amount range ΔEh, and when a foreign substance such as a glass piece exists, the position e3 ′ is moved to the position e3 ′ by strong direct reflected light from the foreign substance. As shown in the figure, a state where the light amount deviates upward from the appropriate light amount range ΔEh is illustrated. Although not shown, the reflectance of a black stone or the like is very small, so that the waveform deviates greatly from the appropriate light amount range ΔEh to the lower side.
Even when the light from the black region 8a is refracted and received by the glass piece, the light deviates from the appropriate light amount range ΔEh to the lower side.
【0071】そして、前記制御装置10は、前記両ライ
ンセンサ5A,5Bの検出箇所Jに移送した米粒群kの
うちで、米粒の不良又は異物の存在が判別された場合に
は、前記調整設定された時間間隔が経過するに伴って、
流下している不良の米粒又は異物に対して、その位置に
対応する区画の各噴射ノズル6aからエアーを吹き付け
て正常な米粒の経路から分離させる。If the controller 10 determines that there is a defective rice grain or the presence of a foreign substance in the rice grain group k transferred to the detection location J of the line sensors 5A and 5B, the controller 10 sets the adjustment setting. As the time interval elapses,
Air is blown from the ejection nozzles 6a of the section corresponding to the defective rice grain or foreign matter flowing down, thereby separating the defective rice grain or foreign matter from the path of the normal rice grain.
【0072】次に、図29及び図30に示すフローチャ
ートに基づいて、不良物の検出及び不良物の分離除去動
作について説明する。出荷調整時(図29)には、装置
の電源をオンした後、照明光量が十分に安定したことを
確認してから、先ず、調整モードに切り換えて、前記調
整治具30を前記検出箇所Jにセットして、各ラインセ
ンサ5A,5Bについて焦点位置の調整及び受光方向の
調整、並びに、透過光ラインセンサ5Aの受光位置と各
ノズル6aの排除範囲とを対応付ける調整を、先に透過
光ラインセンサ5Aについて行い、次に反射光ラインセ
ンサ5Bについて行う順序で行う調整(1)を行い、次
に、前記調整治具30を前記検出箇所Jから外して、反
射光ラインセンサ5Bの受光位置を反射光用反射面hm
の幅方向中央に位置合わせする調整(2)を行い、次
に、調整治具30を前記検出箇所Jに再セットして反射
光ラインセンサ5Bの受光位置と各ノズル6aの排除範
囲とを対応付け、又、反射光ラインセンサ5Bの受光情
報に基づく各噴出ノズル6aの噴出タイミングを調整設
定するための調整(3)を行う。次に、運転モードに切
り換えて、前記「リファレンスデータ作成」を行い、さ
らに、最初の「照明光補正データ作成」の各処理を行っ
てから、所定量の受光データの収集してそれについてセ
ンサ出力補正と感度補正(但し、標準の感度値)を行
い、受光量に対する度数分布を表示する。そして、表示
画面上で適正光量範囲ΔEt,ΔEhに対する各上限値
及び下限値の設定(「しきい値設定」)を行い、この適
正光量範囲ΔEt,ΔEhに基づいてメモリLUTの作
成する。Next, the operation of detecting a defective object and separating and removing the defective object will be described with reference to the flowcharts shown in FIGS. 29 and 30. At the time of shipment adjustment (FIG. 29), after the power of the apparatus is turned on, it is confirmed that the illumination light amount is sufficiently stabilized. First, the mode is switched to the adjustment mode, and the adjustment jig 30 is moved to the detection position J. To adjust the focal position and the light receiving direction of each of the line sensors 5A and 5B, and adjust the light receiving position of the transmitted light line sensor 5A to correspond to the exclusion range of each nozzle 6a. The adjustment (1) is performed for the sensor 5A and then for the reflected light line sensor 5B, and then the adjustment jig 30 is removed from the detection location J to determine the light receiving position of the reflected light line sensor 5B. Reflection surface hm for reflected light
Adjustment (2) is performed to adjust the position to the center in the width direction, and then the adjustment jig 30 is reset to the detection position J to correspond the light receiving position of the reflected light line sensor 5B and the exclusion range of each nozzle 6a. In addition, adjustment (3) for adjusting and setting the ejection timing of each ejection nozzle 6a based on the received light information of the reflected light line sensor 5B is performed. Next, the mode is switched to the operation mode, the above-mentioned “reference data creation” is performed, and further, each process of the first “illumination light correction data creation” is performed. Correction and sensitivity correction (however, a standard sensitivity value) are performed, and the frequency distribution with respect to the received light amount is displayed. Then, the upper limit value and the lower limit value for the appropriate light amount ranges ΔEt and ΔEh are set on the display screen (“threshold value setting”), and a memory LUT is created based on the appropriate light amount ranges ΔEt and ΔEh.
【0073】通常の検査運転時(図30)には、先ず、
装置の電源をオンしてから、前記感度値等の設定を行
い、そして、設定された時間のウオームアップ運転をし
てから、そのときの最新の「照明光補正データ作成」を
行って照明光量の変化率のデータを算出し、その照明光
量の変化率のデータと、前記適正光量範囲ΔEt,ΔE
hとを使って、メモリ内のデータを書き換えてメモリL
UTを作成する。そして、上記修正後のメモリLUTを
用いて、シュート1に米粒群kを供給して検査を開始す
る。そして、設定清掃間隔(例えば30分)経過する
と、米粒群kの供給を止めて検査を停止し、前記清掃ノ
ズル26を作動させて窓部14A,14Bの清掃を行う
とともに、清掃後の「照明光補正データ作成」を行って
照明光量の変化率のデータを算出し、上記と同様に、メ
モリ内のデータを書き換えて、メモリLUTを作成す
る。そして、以後は、この修正後のメモリLUTを用い
て、シュート1に米粒群kを供給して検査を開始する。At the time of normal inspection operation (FIG. 30), first,
After the power of the apparatus is turned on, the sensitivity value and the like are set, and the warm-up operation is performed for a set time, and then the latest “lighting correction data creation” at that time is performed to execute the lighting light quantity. Is calculated, and the data of the change rate of the illumination light amount and the appropriate light amount ranges ΔEt, ΔE
h to rewrite the data in the memory
Create a UT. Then, the inspection is started by supplying the rice grain group k to the chute 1 using the memory LUT after the correction. Then, when the set cleaning interval (for example, 30 minutes) has elapsed, the supply of the rice grain group k is stopped to stop the inspection, the cleaning nozzle 26 is operated to clean the windows 14A and 14B, and the “lighting” after cleaning is performed. The “light correction data creation” is performed to calculate the data of the change rate of the illumination light amount, and the data in the memory is rewritten in the same manner as described above to create the memory LUT. Thereafter, the inspection is started by supplying the rice grain group k to the shoot 1 using the memory LUT after the correction.
【0074】〔別実施形態〕上記実施形態では、反射面
hmの幅方向における中央位置CLを表示する表示部分
HBを、反射面hmの反射率と異なる反射率で、前記反
射面hmの幅方向に沿って前記中央位置側に突き出る形
状の凸状部分に形成する場合に、上側に2個の幅狭の凸
状部分を設け、下側に1個の幅広の凸状部分を設けるよ
うに構成したが、凸状部分の具体構成はこれに限るもの
ではなく、例えば、図31(イ)に例示するように、上
側に3個の幅狭の凸上部分を設け、下側に2個の幅広の
凸状部分を設けるものでもよい。[Alternative Embodiment] In the above embodiment, the display portion HB for displaying the center position CL in the width direction of the reflecting surface hm is provided with a reflectance different from that of the reflecting surface hm in the width direction of the reflecting surface hm. In the case of forming a convex portion having a shape protruding toward the center position side along the line, two narrow convex portions are provided on the upper side, and one wide convex portion is provided on the lower side. However, the specific configuration of the convex portion is not limited to this. For example, as shown in FIG. 31A, three narrow convex upper portions are provided on the upper side, and two convex upper portions are provided on the lower side. A wide convex portion may be provided.
【0075】又、上記表示部分HBを、前記中央位置に
対して前記幅方向において一端側と他端側のいずれの位
置であるかを読み取り可能に構成せずに、例えば、図3
1(ロ)に例示するように、前記中央位置CLに位置さ
せて左右に各1個設けた黒色の小円にて構成するように
してもよい。又、上記表示部分HBを、受光手段(反射
光ラインセンサ5B)にて検出される検査用被検出範囲
KHの両横外側方に備えた余剰分に設けるようにした
が、検査用被検出範囲KHに対応する部分に設けるよう
にしてもよい。Further, the display portion HB is not configured to be able to read either the one end or the other end in the width direction with respect to the center position.
As illustrated in FIG. 1 (b), it may be constituted by small black circles provided at the center position CL and provided on the left and right, respectively. Further, the display portion HB is provided in an extra portion provided on both lateral outer sides of the inspection detection range KH detected by the light receiving means (the reflected light line sensor 5B). You may make it provide in the part corresponding to KH.
【0076】上記実施形態では、反射光用反射面hm
(8a)の幅方向の両横側部に、その反射光用反射面か
らの投射光量と異なる光量を投射する異物検知用投射部
(8b)を設ける、つまり、反射光用反射面hm(8
a)の幅を狭くなるように構成したが、透過光用反射面
においても、上記反射光用反射面と同様に、その幅方向
の両横側部に、その透過光用反射面からの投射光量と異
なる光量を投射する異物検知用投射部を設けて、幅狭の
反射面に構成してもよい。In the above embodiment, the reflecting surface hm for reflected light is used.
On both lateral sides in the width direction of (8a), there is provided a projection unit (8b) for detecting foreign matter that projects an amount of light different from the amount of light projected from the reflecting surface for reflected light, that is, the reflecting surface for reflected light hm (8).
Although the width of a) is configured to be narrow, the reflection surface for transmitted light also projects on both lateral sides in the width direction from the reflection surface for transmitted light, similarly to the reflection surface for reflected light. It is also possible to provide a projection unit for detecting foreign matter that projects a light amount different from the light amount, and configure the reflection unit with a narrow reflecting surface.
【0077】上記実施形態では、存在予定箇所の背部側
箇所に配置される投射面hmを、照明光源にて照明され
て、検査対象物のうちの適正物からの検出光と同一又は
略同一の明るさの光を前記受光手段5に向けて反射する
反射面hmにて構成したが、このような反射面ではな
く、例えば、すりガラスと、そのすりガラスの背部側に
配置した照明光源とを備えて、照明光源からの光をすり
ガラスを透過させて受光手段5に向けて投射させるいわ
ゆるバックライト式に構成してもよい。この場合は、上
記すりガラスの表面が上記投射面hmを構成することに
なる。In the above embodiment, the projection surface hm arranged on the back side of the expected existence position is illuminated by the illumination light source, and is the same or substantially the same as the detection light from the proper one of the inspection objects. Although the reflective surface hm configured to reflect the light of the brightness toward the light receiving unit 5 is provided, the reflective surface hm is not provided with such a reflective surface. A so-called backlight type in which light from an illumination light source is transmitted through frosted glass and projected toward the light receiving means 5 may be used. In this case, the surface of the ground glass constitutes the projection surface hm.
【0078】上記実施形態では、受光手段(反射光ライ
ンセンサ5B)による上記表示部分HBの読み取り情報
に基づいて、その受光手段の受光方向を調整するように
したが、逆に、受光手段の受光方向はそのままで、反射
面hmの位置を動かして調整するようにしてもよい。In the above embodiment, the light receiving direction of the light receiving means is adjusted based on the information read by the light receiving means (reflected light line sensor 5B) on the display portion HB. The direction may be kept as it is, and the position of the reflection surface hm may be moved to be adjusted.
【0079】上記実施形態では、調整治具30を、治具
本体30Aと複数の噴出ノズル6aに対して位置決めす
る位置決め部30Bとの2つの部材にて構成したが、こ
の治具本体30Aと位置決め部30Bとを一体の部材に
て構成してもよい。尚、調整治具30を上記2つの部材
に構成した場合には、前述のように、治具本体30Aに
換えて、位置決め部30Bによってレファレンスデータ
作成用の基準部材を位置決めしてセットすることができ
る利点がある。又、上記実施形態では、位置決め部30
Bを複数のエア噴出部6aに嵌合させて位置決めするよ
うにしたが、嵌合以外の手段でエア噴出部6aに対して
位置決めするようにしてもよい。嵌合させる場合におい
ても、エア噴出部6aに内嵌させるのではなく、エア噴
出部6aを構成する部材の外面部を挟み込む状態で外嵌
させるようにしてもよい。In the above embodiment, the adjusting jig 30 is composed of the jig body 30A and the positioning portion 30B for positioning the plurality of ejection nozzles 6a. The unit 30B and the unit 30B may be formed as an integral member. When the adjustment jig 30 is formed of the above two members, as described above, instead of the jig main body 30A, the positioning member 30B can position and set the reference member for creating reference data. There are advantages that can be done. In the above embodiment, the positioning unit 30
Although B is fitted to the plurality of air ejection portions 6a for positioning, it may be positioned to the air ejection portion 6a by means other than fitting. Also in the case of fitting, instead of being fitted inside the air ejection portion 6a, it may be fitted outside while sandwiching the outer surface of the member constituting the air ejection portion 6a.
【0080】上記実施形態では、調整治具30を存在予
定箇所Jに位置させて調整する場合に、受光手段(ライ
ンセンサ5A,5B)の受光方向を調整するようにした
が、逆に、受光手段(ラインセンサ5A,5B)の受光
位置の前記適正位置tiからのずれに応じて、複数の噴
出ノズル6aの位置を調整するようにしてもよい。In the above embodiment, the light receiving direction of the light receiving means (line sensors 5A, 5B) is adjusted when the adjustment jig 30 is positioned at the expected location J, but the light receiving direction is adjusted. The positions of the plurality of ejection nozzles 6a may be adjusted according to the deviation of the light receiving position of the means (line sensors 5A, 5B) from the appropriate position ti.
【0081】又、上記実施形態では、調整治具30によ
る受光手段(ラインセンサ5A,5B)の受光方向の調
整、及び、反射面hmに対する受光手段(ラインセンサ
5B)の受光位置の調整を、作業者の手動操作によって
行うようにしたが、不良検出装置の自動操作によって、
自動的に調整するようにしてもよい。In the above embodiment, the adjustment of the light receiving direction of the light receiving means (line sensors 5A and 5B) by the adjustment jig 30 and the adjustment of the light receiving position of the light receiving means (line sensor 5B) with respect to the reflection surface hm are described. It was performed manually by the operator, but by the automatic operation of the defect detection device,
The adjustment may be made automatically.
【0082】上記実施形態では、受光手段を、透過光用
の受光手段(透過光ラインセンサ5A)及び反射光用の
手段(反射光ラインセンサ5B)にて構成して、その両
ラインセンサ5A,5Bの受光情報に基づいて不良物の
存否を判別するようにしたが、透過光又は反射光用のい
ずれか一方の受光手段で構成して、その透過又は反射用
ラインセンサ5A,5Bの受光情報に基づいて不良物の
存否を判別するようにしてもよい。尚、ラインセンサ5
A,5Bについても、モノクロタイプのCCDラインセ
ンサ以外に、撮像管式のテレビカメラでもよく、又、モ
ノクロタイプではなく、カラータイプのCCDセンサに
て構成して、色情報R,G,B毎に不良米や異物の存否
をさらに精度良く判別してもよい。In the above embodiment, the light receiving means is constituted by the light receiving means for transmitted light (transmitted light line sensor 5A) and the means for reflected light (reflected light line sensor 5B). The presence / absence of a defective object is determined based on the light reception information of the transmission line 5B. May be used to determine the presence or absence of a defective object. In addition, the line sensor 5
For A and 5B, a TV camera of an image pickup tube type may be used in addition to a monochrome type CCD line sensor, and a color type CCD sensor instead of a monochrome type CCD sensor may be used. The presence or absence of defective rice or foreign matter may be determined with higher accuracy.
【0083】上記実施形態では、検査対象物としての粒
状体群が精米や玄米等の米粒群kである場合について例
示したが、これに限るものではなく、例えば、プラスチ
ック粒群中における異物の検出と排除等にも適用でき
る。In the above-described embodiment, the case where the granular material group as the inspection object is the rice particle group k such as polished rice or brown rice is described. However, the present invention is not limited thereto. And exclusion.
【図1】不良物検出装置の全体側面図FIG. 1 is an overall side view of a defective object detection device.
【図2】同要部側面図FIG. 2 is a side view of the main part.
【図3】同要部斜視図FIG. 3 is a perspective view of the main part.
【図4】同要部側面図FIG. 4 is a side view of the main part.
【図5】制御構成のブロック図FIG. 5 is a block diagram of a control configuration.
【図6】ラインセンサの受光状態を示す図FIG. 6 is a diagram showing a light receiving state of a line sensor.
【図7】反射面を示す正面図FIG. 7 is a front view showing a reflection surface;
【図8】光の屈折を利用した異物検出を説明する側面図FIG. 8 is a side view illustrating foreign object detection using light refraction.
【図9】ラインセンサの受光方向の調整構造を示す斜視
図FIG. 9 is a perspective view showing a structure for adjusting the light receiving direction of the line sensor.
【図10】ラインセンサの受光方向の調整状態を示す正
面図FIG. 10 is a front view showing an adjustment state of a light receiving direction of the line sensor.
【図11】ラインセンサの受光方向の調整構造の一部を
示す側面図FIG. 11 is a side view showing a part of a light receiving direction adjustment structure of the line sensor.
【図12】ラインセンサの受光方向の調整状態を示す側
面図FIG. 12 is a side view showing an adjustment state of a light receiving direction of the line sensor.
【図13】ラインセンサの受光方向の調整状態について
の説明図FIG. 13 is an explanatory diagram of an adjustment state of a light receiving direction of a line sensor.
【図14】ラインセンサの受光方向の調整状態について
の説明図FIG. 14 is a diagram illustrating an adjustment state of a light receiving direction of a line sensor.
【図15】ラインセンサの受光方向の調整状態について
の説明図FIG. 15 is an explanatory diagram of an adjustment state of a light receiving direction of a line sensor.
【図16】ラインセンサの受光方向の調整状態について
の説明図FIG. 16 is an explanatory diagram of an adjustment state of a light receiving direction of a line sensor.
【図17】調整治具の正面図と検出波形図FIG. 17 is a front view and a detection waveform diagram of an adjustment jig.
【図18】調整治具の取付け状態を示す斜視図FIG. 18 is a perspective view showing a mounting state of the adjustment jig.
【図19】調整治具の取付け状態を示す側面図FIG. 19 is a side view showing a mounting state of the adjustment jig.
【図20】検査装置の全体正面図FIG. 20 is an overall front view of the inspection apparatus.
【図21】操作卓の正面図FIG. 21 is a front view of a console.
【図22】操作卓の表示パネルの表示例を示す正面図FIG. 22 is a front view showing a display example of the display panel of the console.
【図23】操作卓の表示パネルの表示例を示す正面図FIG. 23 is a front view showing a display example of the display panel of the console.
【図24】リファレンスデータ作成時の受光手段の出力
波形図FIG. 24 is an output waveform diagram of a light receiving unit when creating reference data.
【図25】照明光量の変化データを示す出力波形図FIG. 25 is an output waveform diagram showing illumination light change data.
【図26】不良判別用のメモリのブロック図FIG. 26 is a block diagram of a memory for determining a defect;
【図27】透過光用ラインセンサの補正後の出力波形図FIG. 27 is an output waveform diagram after correction of the transmitted light line sensor.
【図28】反射光用ラインセンサの補正後の出力波形図FIG. 28 is an output waveform diagram after correction of the reflected light line sensor.
【図29】制御作動のフローチャートFIG. 29 is a flowchart of a control operation.
【図30】制御作動のフローチャートFIG. 30 is a flowchart of a control operation.
【図31】別実施形態の反射面を示す正面図FIG. 31 is a front view showing a reflection surface according to another embodiment;
4 照明手段 5 受光手段 6a エア噴出部 21a 表示手段 100 判別手段 HB 表示部分 hm 投射面 hg 異物検知用投射部 J 存在予定箇所 KH 検査用被検出範囲 TH 適正位置表示部 FH 噴出位置表示部 SH 焦点位置調整用表示部 Reference Signs List 4 illuminating means 5 light receiving means 6a air ejection part 21a display means 100 discrimination means HB display part hm projection surface HG foreign matter detection projection part J expected existence location KH inspection detection range TH proper position display part FH ejection position display part SH focus Display for position adjustment
───────────────────────────────────────────────────── フロントページの続き (72)発明者 池田 直人 大阪府堺市石津北町64番地 株式会社クボ タ堺製造所内 Fターム(参考) 2G059 AA05 BB11 CC20 DD12 EE01 EE02 EE13 FF01 GG03 KK04 MM02 MM03 MM05 MM10 PP04 3F079 AC15 BA05 CA41 CA44 CB25 CB30 CB32 CB33 CB34 CB35 CB38 CC03 DA06 ──────────────────────────────────────────────────の Continuing from the front page (72) Inventor Naoto Ikeda 64 Ishizu-Kitacho, Sakai-shi, Osaka F-term in Kubota Sakai Works Co., Ltd. (Reference) 2G059 AA05 BB11 CC20 DD12 EE01 EE02 EE13 FF01 GG03 KK04 MM02 MM03 MM05 MM10 PP04 3F079 AC15 BA05 CA41 CA44 CB25 CB30 CB32 CB33 CB34 CB35 CB38 CC03 DA06
Claims (14)
存在予定箇所において長尺の帯状に存在させるように構
成され、 前記存在予定箇所を照明する照明手段と、 前記存在予定箇所の長手方向に沿って分解能を有する状
態で前記存在予定箇所側からの光を受光する受光手段
と、 前記受光手段の受光方向であって前記存在予定箇所の背
部側箇所に設置されて、前記検査対象物のうちの適正物
からの検出光と同一又は略同一の明るさの光を前記受光
手段に向けて投射する長尺の帯状の投射面と、 前記検査対象物からの検出光及び前記投射面からの投射
光を受光する前記受光手段の受光情報に基づいて、その
受光量が前記検査対象物のうちの適正物からの検出光に
対する適正光量範囲を外れたか否かの判別を行う判別手
段とが設けられた不良物検出装置であって、 前記投射面の長手方向における複数箇所に、前記投射面
の幅方向における中央位置であることを前記受光手段に
よって読み取り可能な表示部分が形成されている不良物
検出装置。An illumination unit configured to illuminate the expected existence position, wherein a particle group as an inspection object is present in a long band shape at an expected existence position for detection; A light-receiving means for receiving light from the expected existence location side in a state having a resolution along a direction; and A long band-shaped projection surface that projects light having the same or substantially the same brightness as the detection light from the appropriate object toward the light receiving unit, and the detection light from the inspection object and the projection surface Determining means for determining whether or not the amount of received light is out of a proper light amount range for detection light from a proper one of the inspection objects based on light receiving information of the light receiving means for receiving the projection light of Defective inspection provided An apparatus, wherein a plurality of locations in the longitudinal direction of the projection plane, the projection surface defect-detection apparatus to which the display portion is formed readable by said light receiving means to be a central position in the width direction of the.
前記幅方向において一端側と他端側のいずれの位置であ
るかを前記受光手段によって読み取り可能に構成されて
いる請求項1記載の不良物検出装置。2. The light receiving unit according to claim 1, wherein the display portion is configured to be readable by the light receiving means as to which of the one end and the other end in the width direction with respect to the center position. Defective detector.
横外側方をも検出するように構成されると共に、前記投
射面が、前記受光手段にて前記存在予定箇所に対応して
検出される検査用被検出範囲の両横外側方に余剰分を備
えるように構成され、 前記表示部分が、前記投射面における前記余剰分に対応
する部分に形成されている請求項1又は2記載の不良物
検出装置。3. The light receiving means is configured to also detect both lateral outer sides of the expected location, and the projection surface is detected by the light receiving means in correspondence with the expected location. 3. The defect according to claim 1, wherein a surplus portion is provided on both lateral outer sides of the inspection detection range, and the display portion is formed in a portion corresponding to the surplus portion on the projection surface. Object detection device.
沿って前記中央位置側に突き出る形状の凸状部分を、前
記投射面からの投射光量と異なる光量を投射するように
形成することにより構成されている請求項1〜3のいず
れか1項に記載の不良物検出装置。4. A display device according to claim 1, wherein said display portion has a convex portion projecting toward said central position along a width direction of said projection surface so as to project an amount of light different from an amount of light projected from said projection surface. The defective object detection device according to any one of claims 1 to 3, which is configured by:
投射面からの投射光量と異なる光量を投射する異物検知
用投射部が設けられている請求項1〜4のいずれか1項
に記載の不良物検出装置。5. A projection for foreign matter detection which projects an amount of light different from the amount of light projected from the projection surface on both lateral sides in the width direction of the projection surface. The defective object detection device according to the paragraph.
定箇所の長手方向に沿う各部での受光情報を視認できる
ように表示する表示手段が設けられている請求項1〜5
のいずれか1項に記載の不良物検出装置。6. A display means for displaying the light receiving information of said light receiving means so that the light receiving information at each part along the longitudinal direction of said expected location can be visually recognized.
The defective object detection device according to any one of claims 1 to 4.
軸回りに回動調整自在で、且つ、前記存在予定箇所の長
手方向に沿う軸回りに揺動調整自在に構成されている請
求項1〜6のいずれか1項に記載の不良物検出装置。7. The light receiving means is configured to be rotatable and adjustable around an optical axis along the light receiving direction, and to be swingably adjustable around an axis along a longitudinal direction of the expected location. The defective object detection device according to any one of claims 1 to 6.
存在予定箇所において長尺の帯状に存在させるように構
成され、 前記存在予定箇所を照明する照明手段と、 前記存在予定箇所の長手方向に沿って分解能を有する状
態で前記存在予定箇所側からの光を受光する受光手段
と、 前記受光手段の受光方向であって前記存在予定箇所の背
部側箇所に設置されて、前記検査対象物のうちの適正物
からの検出光と同一又は略同一の明るさの光を前記受光
手段に向けて投射する長尺の帯状の投射面と、 前記検査対象物からの検出光及び前記投射面からの投射
光を受光する前記受光手段の受光情報に基づいて、その
受光量が前記検査対象物のうちの適正物からの検出光に
対する適正光量範囲を外れたか否かの判別を行う判別手
段とが設けられた不良物検出装置において、 前記存在予定箇所に位置されて前記受光手段にて受光さ
れ、その受光情報に基づいて調整を行うときに用いる不
良物検出装置用の調整治具であって、 前記調整治具の長手方向における複数箇所に、前記存在
予定箇所において帯状に存在する検査対象物の幅方向に
おける適正位置を表示する適正位置表示部が形成されて
いる不良物検出装置用の調整治具。8. An illuminating means for illuminating the expected existence position, wherein the particle group as the inspection object is present in a long band shape at the expected existence position for detection, and a length of the expected existence position. A light-receiving means for receiving light from the expected existence location side in a state having a resolution along a direction; and A long band-shaped projection surface that projects light having the same or substantially the same brightness as the detection light from the appropriate object toward the light receiving unit, and the detection light from the inspection object and the projection surface Determining means for determining whether or not the amount of received light is out of a proper light amount range for detection light from a proper one of the inspection objects based on light receiving information of the light receiving means for receiving the projection light of Defective inspection provided In the apparatus, an adjustment jig for a defective object detection device which is positioned at the expected existence position and is received by the light receiving means, and is used when performing adjustment based on the received light information, wherein a length of the adjustment jig is An adjustment jig for a defective object detection device, in which an appropriate position display portion for displaying an appropriate position in a width direction of an inspection object existing in a band shape at the expected existence position is formed at a plurality of positions in the direction.
対して前記幅方向の一端側と他端側のいずれの位置であ
るかを表示するように構成されている請求項8記載の不
良物検出装置用の調整治具。9. The defect according to claim 8, wherein the proper position display unit is configured to display which of the one end and the other end in the width direction with respect to the proper position. Adjustment jig for object detection device.
に対する前記幅方向での位置ずれ量を表示するように構
成されている請求項8又は9記載の不良物検出装置用の
調整治具。10. The adjusting jig for a defective object detecting device according to claim 8, wherein said proper position display section is configured to display a positional shift amount in said width direction with respect to said proper position.
きに読み取られる焦点位置調整用表示部が形成されてい
る請求項8〜10のいずれか1項に記載の不良物検出装
置用の調整治具。11. The adjusting jig for a defective object detecting device according to claim 8, wherein a focus position adjusting display portion which is read when adjusting a focal position of said light receiving means is formed. Utensils.
帯状状態で、予定移送経路に沿って前記予定存在箇所と
その予定存在箇所の位置よりも経路下手側の分離箇所と
に移送されるとともに、その分離箇所に移送された前記
粒状体群のうちの適正物と不良物とを異なる経路に分離
させるためにエアを噴出する複数のエア噴出部が前記予
定存在箇所の長手方向に並べられ、 前記複数のエア噴出部に対して位置決めするためにエア
噴出部に嵌合される位置決め部が設けられている請求項
8〜11のいずれか1項に記載の不良物検出装置用の調
整治具。12. The granular material group as the inspection object,
In the belt-like state, while being transported along the planned transfer path to the planned existence point and the separation point on the lower side of the path from the position of the planned existence point, of the granular material group transferred to the separation point A plurality of air ejection portions for ejecting air to separate a proper object and a defective object into different paths are arranged in a longitudinal direction of the planned existence portion, and air ejection is performed for positioning with respect to the plurality of air ejection portions. The adjusting jig for a defective object detection device according to any one of claims 8 to 11, further comprising a positioning portion fitted to the portion.
を表示する噴出位置表示部が形成されている請求項12
記載の不良物検出装置用の調整治具。13. An ejection position display section for displaying positions corresponding to the plurality of air ejection sections.
Adjustment jig for the described defective object detection device.
て、請求項12又は13記載の不良物検出装置用の調整
治具を用いて、前記適正位置表示部を読み取った情報に
基づいて前記表示手段の受光位置が前記適正位置に位置
するように前記受光手段の受光方向を調整し、次に、前
記投射面の表示部分を読み取った情報に基づいて前記表
示手段の受光位置が前記中央位置に位置するように前記
受光手段の受光方向を調整し、次に、前記調整治具を用
いて前記複数のエア噴出部夫々に対応する前記受光手段
の各受光位置での前記適正位置からのずれ量を判別し
て、そのずれ量に基づいて、前記予定存在箇所にて不良
物の存在が判別された後、前記複数のエア噴出部を作動
させるまでの時間間隔を、前記複数のエア噴出部夫々に
ついて調整して設定する不良物検出装置用の調整方法。14. The defective object detecting device according to claim 7, wherein the display is performed based on information obtained by reading the proper position display portion using an adjusting jig for the defective object detecting device according to claim 12. The light receiving direction of the light receiving means is adjusted so that the light receiving position of the means is located at the appropriate position, and then the light receiving position of the display means is set to the central position based on information obtained by reading a display portion of the projection surface. The light receiving direction of the light receiving means is adjusted so as to be located, and then the amount of deviation from the proper position at each light receiving position of the light receiving means corresponding to each of the plurality of air ejection portions using the adjustment jig. After the presence of a defective object is determined at the expected location based on the amount of deviation, the time interval between the activation of the plurality of air ejection units and the time interval between the activation of the plurality of air ejection units are respectively determined by the plurality of air ejection units. Adjust and set Adjustment method for defective object detection device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11013590A JP2000210626A (en) | 1999-01-21 | 1999-01-21 | Defective article detector, and adjusting jig and adjusting method therefor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11013590A JP2000210626A (en) | 1999-01-21 | 1999-01-21 | Defective article detector, and adjusting jig and adjusting method therefor |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2000210626A true JP2000210626A (en) | 2000-08-02 |
Family
ID=11837422
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11013590A Pending JP2000210626A (en) | 1999-01-21 | 1999-01-21 | Defective article detector, and adjusting jig and adjusting method therefor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2000210626A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009050760A (en) * | 2007-08-23 | 2009-03-12 | Satake Corp | Optical grain sorter |
JP2011088096A (en) * | 2009-10-26 | 2011-05-06 | Satake Corp | Color selector |
JP2011214967A (en) * | 2010-03-31 | 2011-10-27 | Canon Inc | Photographing device, optical interference photographing system, program, and method for adjusting photographing device |
JP2019520549A (en) * | 2016-05-03 | 2019-07-18 | ベンタナ メディカル システムズ, インコーポレイテッド | System and method for monitoring reagent concentration |
JP2021142480A (en) * | 2020-03-12 | 2021-09-24 | 住友金属鉱山株式会社 | Nozzle maintenance device and nozzle maintenance method for hue sorter |
CN114985285A (en) * | 2022-05-13 | 2022-09-02 | 北京霍里思特科技有限公司 | Mineral product sorting machine |
JP7521570B2 (en) | 2020-10-15 | 2024-07-24 | 株式会社サタケ | Optical sorting machine |
-
1999
- 1999-01-21 JP JP11013590A patent/JP2000210626A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009050760A (en) * | 2007-08-23 | 2009-03-12 | Satake Corp | Optical grain sorter |
JP2011088096A (en) * | 2009-10-26 | 2011-05-06 | Satake Corp | Color selector |
JP2011214967A (en) * | 2010-03-31 | 2011-10-27 | Canon Inc | Photographing device, optical interference photographing system, program, and method for adjusting photographing device |
JP2019520549A (en) * | 2016-05-03 | 2019-07-18 | ベンタナ メディカル システムズ, インコーポレイテッド | System and method for monitoring reagent concentration |
JP2021142480A (en) * | 2020-03-12 | 2021-09-24 | 住友金属鉱山株式会社 | Nozzle maintenance device and nozzle maintenance method for hue sorter |
JP7342747B2 (en) | 2020-03-12 | 2023-09-12 | 住友金属鉱山株式会社 | Nozzle maintenance equipment and color sorting machine nozzle maintenance method |
JP7521570B2 (en) | 2020-10-15 | 2024-07-24 | 株式会社サタケ | Optical sorting machine |
CN114985285A (en) * | 2022-05-13 | 2022-09-02 | 北京霍里思特科技有限公司 | Mineral product sorting machine |
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