JPH09186308A - Manufacture of solid-state image pickup module - Google Patents

Manufacture of solid-state image pickup module

Info

Publication number
JPH09186308A
JPH09186308A JP7343385A JP34338595A JPH09186308A JP H09186308 A JPH09186308 A JP H09186308A JP 7343385 A JP7343385 A JP 7343385A JP 34338595 A JP34338595 A JP 34338595A JP H09186308 A JPH09186308 A JP H09186308A
Authority
JP
Japan
Prior art keywords
solid
state image
image pickup
curable resin
image sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7343385A
Other languages
Japanese (ja)
Inventor
Hiroyuki Hirai
浩之 平井
Yoshitaka Fukuoka
義孝 福岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP7343385A priority Critical patent/JPH09186308A/en
Publication of JPH09186308A publication Critical patent/JPH09186308A/en
Pending legal-status Critical Current

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  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a functional and highly reliable solid-state image pickup module with which the quality of picture can be improved. SOLUTION: A solid-state image pickup element 8 is mounted and arranged on the glass substrate 7 where a wiring circuit 7a, containing an input/output connection terminal and an active circuit element, is provided on one main surface excluding a specific region in such a manner that light-receiving surfaces are opposed, and the terminal 8a of the solid-state image pickup element 8 and one of the connection terminals of the glass substrate 7 surface are electrically connected. Pertaining to the solid-state image pickup element 8, at least the circumferential part excluding the light-receiving surface is covered by high viscosity ultraviolet ray hardening resin 12b, and the region where the active circuit element 11 is mounted is covered by low viscosity ultraviolet ray hardening resin 12a. Ultraviolet rays are made to irradiate on the above- mentioned ultraviolet ray hardening resin layers 12a and 12b and they are sealed by hardening.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、CCD (Carge Copul
ed Device)と呼称される固体撮像素子( CCDチップ)を
本体とする内視鏡用などに適する固体撮像モジュールの
製造方法に関する。
TECHNICAL FIELD The present invention relates to a CCD (Carge Copul
The present invention relates to a method for manufacturing a solid-state imaging module suitable for an endoscope having a solid-state imaging device (CCD chip) called an ed device) as a main body.

【0002】[0002]

【従来の技術】たとえば監視装置もしくは胃内を検診す
る内視鏡装置は、一般的に、少なくとも固体撮像モジュ
ールを液密に封装して成る撮像ヘッド部と、前記撮像ヘ
ッド部の入出力信号の導入出を行う信号導入出部と、前
記信号導入出部での入出力信号を制御する入出力信号制
御部とを具備した構成を採っている。そして、この種の
内視鏡装置などにおいては、一般に、図4に要部構造を
断面的に示すように構成された固体撮像モジュールが使
用されている。
2. Description of the Related Art For example, a monitoring device or an endoscopic device for examining the inside of the stomach generally has an image pickup head portion formed by sealing at least a solid-state image pickup module in a liquid-tight manner, and an input / output signal of the image pickup head portion. It employs a configuration including a signal introducing / extracting section for introducing / extracting and an input / output signal control section for controlling an input / output signal in the signal introducing / extracting section. In addition, in this type of endoscope apparatus and the like, generally, a solid-state imaging module configured to have a cross-sectional view of a main part structure is used in FIG.

【0003】図4において、1は、たとえば薄膜プロセ
スで、所要の導体パッド(配線導体を含む)を有する配
線導体1aを一主面に設けた厚さ約 0.5mm,幅約 6mm,長
さ約9mmガラス基板、2は前記ガラス基板1の一主面に
搭載,配置された固体撮像素子、たとえば画素数数10万
個の CCDチップである。また、3は前記固体撮像素子2
の端子2aとガラス基板1の導体パッドとの間を電気的に
接続するたとえばAu製バンプ(接続部)であり、In半田
4の併用でマイクロソケット方式で接続されている。こ
こで、固体撮像素子2は受光能を上げるため、受光面
(撮像能動面)を成す各能動領域ごとに、集光用マイク
ロレンズ2bを備えた構成とし、かつその集光用マイクロ
レンズ2b形成面を、ガラス基板1面に対向させて搭載,
配置する構成を採っている。
In FIG. 4, reference numeral 1 denotes, for example, a thin film process, in which a wiring conductor 1a having a required conductor pad (including a wiring conductor) is provided on one main surface. The thickness is about 0.5 mm, the width is about 6 mm, and the length is about 6 mm. A 9 mm glass substrate 2 is a solid-state image sensor mounted and arranged on one main surface of the glass substrate 1, for example, a CCD chip having 100,000 pixels. Further, 3 is the solid-state image sensor 2
Is a bump (connecting portion) made of, for example, Au for electrically connecting the terminal 2a and the conductor pad of the glass substrate 1, and is connected by a micro socket method by using the In solder 4 together. Here, in order to improve the light-receiving ability, the solid-state imaging device 2 has a configuration in which a condensing microlens 2b is provided for each active region forming a light-receiving surface (imaging active surface), and the condensing microlens 2b is formed. Mounted with the surface facing the glass substrate 1 surface,
It has a configuration to arrange.

【0004】さらに、5は前記ガラス基板1面の導体パ
ッドを含む配線導体1a中、配線導体部に介挿された能動
型の回路部品、6は前記固体撮像素子2および能動型の
回路部品5の搭載,配置領域で、固体撮像素子2および
能動型の回路部品5の周辺部、さらにはガラス基板1面
との隙間をモールド封止する透明な封止樹脂層(たとえ
ばシリコーン系樹脂など熱硬化性樹脂)である。
Further, 5 is an active type circuit component inserted in the wiring conductor portion in the wiring conductor 1a including the conductor pad on the surface of the glass substrate 1, and 6 is the solid-state image sensor 2 and the active type circuit component 5. In the mounting / arrangement area of, the transparent encapsulating resin layer (for example, a thermosetting resin such as a silicone resin) that mold-seals the peripheral portion of the solid-state image pickup element 2 and the active type circuit component 5 and the gap with the surface of the glass substrate 1 is molded. Resin).

【0005】[0005]

【発明が解決しようとする課題】しかし、上記構成の固
体撮像モジュールにおいては、次のような不都合が認め
られる。すなわち、前記構成の場合、固体撮像素子( C
CDチップ)2は、受光能を上げるため、受光面(撮像能
動面)を成す各能動領域ごとに、集光用マイクロレンズ
2bを備えた構成としている。そして、その集光用マイク
ロレンズ形成面を、ガラス基板1面に対向させて搭載,
配置する構成を採っている。
However, the following disadvantages are recognized in the solid-state image pickup module having the above structure. That is, in the case of the above configuration, the solid-state image sensor (C
The CD chip 2 has a condensing microlens for each active area forming a light-receiving surface (imaging active surface) in order to enhance the light-receiving ability.
It is configured with 2b. Then, the condensing microlens forming surface is mounted so as to face the glass substrate 1 surface,
It has a configuration to arrange.

【0006】このような構成においては、固体撮像素子
2の受光面とガラス基板1面との隙間が、透明な封止樹
脂層でモールド封止されているため、集光用マイクロレ
ンズ2bの作用・効果が損なわれ易く、期待される高画質
の撮像が得られないことが生じる。特に、医療機器や産
業用監視装置などの用途において、固体撮像モジュール
の小形化,高性能化,さらには高信頼性が要求されてい
る現状では、前記高画質の撮像を得られ難という問題は
由々しいことである。
In such a structure, the gap between the light receiving surface of the solid-state image pickup device 2 and the surface of the glass substrate 1 is mold-sealed by the transparent sealing resin layer, so that the action of the condensing microlens 2b is achieved. -The effect is likely to be impaired, and the expected high-quality imaging may not be obtained. In particular, in applications such as medical equipment and industrial monitoring devices, in the current situation where miniaturization, high performance, and high reliability of solid-state imaging modules are required, it is difficult to obtain high-quality imaging. It's a great thing.

【0007】本発明は、上記事情に対処してなされたも
ので、画質の向上および機能的な高信頼性化などが図ら
れた固体撮像モジュールの製造方法を提供することを目
的とする。
The present invention has been made in consideration of the above circumstances, and an object of the present invention is to provide a method of manufacturing a solid-state image pickup module in which image quality is improved and functional reliability is improved.

【0008】[0008]

【課題を解決するための手段】請求項1の発明は、一主
面に所要の入・出力接続端子および能動型の回路素子を
含む配線回路が一定の領域を除いて設けられたガラス基
板に、前記一定の領域に受光面を対向させて固体撮像素
子を搭載,配置する工程と、前記固体撮像素子の端子お
よびガラス基板面の一方の接続端子間を電気的に接続す
る工程と、前記固体撮像素子については受光面以外の少
なくとも周辺部を高粘度の紫外線硬化性樹脂で被覆する
工程と、前記能動型の回路素子を実装した領域部分を低
粘度の紫外線硬化性樹脂で被覆する工程と、前記被覆し
た紫外線硬化性樹脂層に紫外線を照射して硬化封止する
工程とを有することを特徴とする固体撮像モジュールの
製造方法である。
According to a first aspect of the present invention, there is provided a glass substrate on one main surface of which a wiring circuit including required input / output connection terminals and active type circuit elements is provided except a certain region. A step of mounting and arranging a solid-state image sensor with a light-receiving surface facing the fixed region, a step of electrically connecting a terminal of the solid-state image sensor and one connection terminal of a glass substrate surface, For the image pickup device, a step of coating at least the peripheral portion other than the light-receiving surface with a high-viscosity ultraviolet curable resin, and a step of coating a region portion on which the active circuit element is mounted with a low-viscosity ultraviolet curable resin, A step of irradiating the coated ultraviolet curable resin layer with ultraviolet rays to cure and seal the layer, and a method for manufacturing a solid-state imaging module.

【0009】請求項2の発明は、一主面に所要の入・出
力接続端子および能動型の回路素子を含む配線回路が一
定の領域を除いて設けられたガラス基板に、前記一定の
領域に受光面を対向させて固体撮像素子を搭載,配置す
る工程と、前記固体撮像素子の端子およびガラス基板面
の一方の接続端子間を電気的に接続する工程と、前記固
体撮像素子については受光面以外の少なくとも周辺部を
室温での粘度が50000cp以上の紫外線硬化性樹脂で被覆
する工程と、前記能動型の回路素子を実装した領域部分
を室温での粘度が1500cp以下の紫外線硬化性樹脂で被覆
する工程と、前記被覆した紫外線硬化性樹脂層に紫外線
を照射して硬化封止する工程とを有することを特徴とす
る固体撮像モジュールの製造方法である。
According to a second aspect of the present invention, a glass substrate is provided on one main surface thereof with a wiring circuit including a required input / output connection terminal and an active type circuit element excluding a certain area. Mounting and disposing the solid-state image sensor with the light-receiving surfaces facing each other; electrically connecting the terminals of the solid-state image sensor and one of the connection terminals on the glass substrate surface; and the light-receiving surface for the solid-state image sensor. Other than the step of coating at least the peripheral portion with a UV curable resin having a viscosity at room temperature of 50,000 cp or more, and covering the area where the active circuit element is mounted with a UV curable resin having a viscosity at room temperature of 1500 cp or less And a step of irradiating the coated ultraviolet-curable resin layer with ultraviolet rays to cure and seal the layer, and a method of manufacturing a solid-state imaging module.

【0010】請求項3の発明は、請求項1もしくは請求
項2記載の固体撮像モジュールの製造方法において、紫
外線硬化性樹脂を被覆する固体撮像素子部および能動型
の回路素子部の少なくともいずれか一方に外枠体を固定
配置することを特徴とする。すなわち、本発明は撮像能
動面の保護やフィルターなどの機能もなすガラス基板面
に、固体撮像素子( CCDチップ)および能動型の回路部
品を、いわゆるフリップ・チップの形態で実装した構成
を採り、かつ撮像エリアに対する影響を可及的に低減・
排除しながらモールド封止して、コンパクト性および高
画質の撮像を行えるようにした固体撮像モジュールの製
造方法である。
According to a third aspect of the present invention, in the method of manufacturing a solid-state image pickup module according to the first or second aspect, at least one of a solid-state image pickup element portion coated with an ultraviolet curable resin and an active type circuit element portion. It is characterized in that the outer frame is fixedly arranged on the. That is, the present invention adopts a configuration in which a solid-state image sensor (CCD chip) and an active type circuit component are mounted in the form of a so-called flip chip on a glass substrate surface that also functions as a filter for protecting an active image capturing surface and a filter. And the influence on the imaging area is reduced as much as possible.
This is a method for manufacturing a solid-state image pickup module that is molded while being eliminated to enable compactness and high-quality image pickup.

【0011】また、上記固体撮像モジュールの構成にお
いては、固体撮像素子の受光面に、いわゆる集光用マイ
クロレンズを配設して受光性能を向上させた形態を採り
ながら、さらには、撮像エリアの耐環境性の保護・向上
を図っている。すなわち、固体撮像素子の受光面と対向
するガラス基板面との間を所要の受光が適正に確保され
るように確実に空隙化しながら、耐環境性の保護・向上
も図られように構成されている。
Further, in the structure of the solid-state image pickup module described above, a so-called condensing microlens is arranged on the light-receiving surface of the solid-state image pickup element to improve the light-receiving performance. We are working to protect and improve environmental resistance. That is, the solid-state image sensor is configured to protect and improve environmental resistance while reliably forming a gap between the light-receiving surface of the solid-state image sensor and the surface of the glass substrate facing the solid-state image sensor so as to properly secure required light reception. There is.

【0012】なお、本発明において、モールド封止樹脂
として、特に、紫外線硬化性樹脂を選択しているは、固
体撮像モジュールの製造過程で、固体撮像素子および能
動型の回路部品が受け易い熱的な悪影響を低減・回避す
るためである。また、要すれば、前記固体撮像素子や能
動型の回路部品における樹脂の被覆・充填領域に固定配
置する外枠体は、たとえばエポキシ樹脂系などの熱硬化
型接着性フィルムなどが好ましい。
In the present invention, the ultraviolet ray-curable resin is selected as the mold sealing resin. However, in the manufacturing process of the solid-state image pickup module, the solid-state image pickup element and the active type circuit component are easily subjected to thermal This is to reduce or avoid such adverse effects. Further, if necessary, the outer frame body fixedly arranged in the resin coating / filling region of the solid-state image pickup device or the active type circuit component is preferably a thermosetting adhesive film such as epoxy resin.

【0013】請求項1の発明では、固体撮像素子の受光
面以外の少なくとも周辺部を高粘度の紫外線硬化性樹脂
で被覆し、また能動型の回路素子を実装した領域部分を
低粘度の紫外線硬化性樹脂で被覆する。つまり、流動・
充填性の低い樹脂と流動・充填性の高い樹脂とを使い分
け、流動・充填性の低い高粘度樹脂を堰として機能させ
て、先ず、固体撮像素子の所要の受光が適正に確保され
る。
According to the invention of claim 1, at least the peripheral portion other than the light-receiving surface of the solid-state image pickup device is covered with a high-viscosity UV-curable resin, and the region portion where the active type circuit element is mounted is cured with a low-viscosity UV-ray. Coating with a polar resin. In other words, flow
A resin having a low filling property and a resin having a high filling property are used properly, and the high-viscosity resin having a low filling property is made to function as a weir, so that the required light reception of the solid-state imaging device is properly secured.

【0014】一方、受光面領域に対する樹脂の充填・封
止を防止しながら、耐環境性の保護など要求される能動
型の回路素子を実装した領域部分を緻密に樹脂封止する
ことになる。しかも、前記樹脂としては、紫外線の照射
で硬化する紫外線硬化型樹脂を使用するため、製造過程
で固体撮像素子が熱的な悪影響を受ける恐れも回避さ
れ、性能的にすぐれた固体撮像モジュールが歩留まりよ
く製造される。
On the other hand, while preventing the light-receiving surface region from being filled and sealed with resin, the region portion where the active type circuit element required to protect the environment is mounted is precisely sealed with resin. Moreover, as the resin, an ultraviolet curable resin that is cured by irradiation of ultraviolet rays is used, so that the solid-state image pickup element is also prevented from being adversely affected by heat in the manufacturing process, and a solid-state image pickup module having excellent performance is produced. Well manufactured.

【0015】請求項2の発明では、高粘度の紫外線硬化
性樹脂として室温での粘度が 50000cp以上の紫外線硬化
性樹脂を、また、低粘度の紫外線硬化性樹脂として室温
での粘度が1500cp以下の紫外線硬化性樹脂をそれぞれ選
択したことによって、前記請求項1の場合の作用が、よ
り効率的に達成される。
According to the second aspect of the present invention, the high-viscosity UV-curable resin has a viscosity of 50,000 cp or more at room temperature, and the low-viscosity UV-curable resin has a viscosity of 1500 cp or less at room temperature. By selecting each of the ultraviolet curable resins, the action in the case of claim 1 can be achieved more efficiently.

【0016】請求項3の発明では、紫外線硬化性樹脂を
充填・被覆する固体撮像素子部および能動型の回路素子
部の少なくともいずれか一方に外枠体を固定配置し、充
填・被覆する紫外線硬化性樹脂が外方に流出するのを防
止するため、前記請求項1もしくは請求項2の場合の作
用が、さらに効果的に行われる。
According to the third aspect of the present invention, the outer frame is fixedly arranged on at least one of the solid-state image pickup device section and the active type circuit element section, which are filled and covered with the ultraviolet curable resin, and the ultraviolet cure is carried out and filled and covered. In order to prevent the functional resin from flowing out, the action in the case of claim 1 or claim 2 is more effectively performed.

【0017】[0017]

【発明の実施の形態】以下図1,図2および図3を参照
して実施例を説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment will be described below with reference to FIGS. 1, 2 and 3.

【0018】図1は、第1の実施例で製造された固体撮
像モジュールの要部構成を示す断面図である。
FIG. 1 is a sectional view showing the structure of the main part of the solid-state image pickup module manufactured in the first embodiment.

【0019】先ず、たとえば薄膜プロセスで、所要の端
子を含む配線導体7aを一主面に設けた厚さ約 0.5mm,幅
約 6mm,長さ約 9mmガラス基板7と、前記ガラス基板7
の一主面に搭載,配置される固体撮像素子8、たとえば
画素数数10万個の CCDチップとを用意する。なお、固体
撮像素子8の端子8aには、たとえばAu製バンプ(接続
部)9が積層的に設けられており、ガラス基板7の配線
導体7aに含まれている端子との間をIn半田10の併用でマ
イクロソケット方式で電気的に接続するように構成され
ている。また、固体撮像素子8は受光能を上げるため、
受光面(撮像能動面)を成す各能動領域ごとに、集光用
マイクロレンズ8bを備えた構成となっている。
First, for example, in a thin film process, a wiring substrate 7a including required terminals is provided on one main surface to have a thickness of about 0.5 mm, a width of about 6 mm, and a length of about 9 mm, and the glass substrate 7 described above.
A solid-state image sensor 8 mounted and arranged on one main surface is prepared, for example, a CCD chip having 100,000 pixels. It should be noted that, for example, Au bumps (connecting portions) 9 are laminated on the terminals 8a of the solid-state imaging device 8, and the In solder 10 is provided between the terminals 8a and the terminals included in the wiring conductor 7a of the glass substrate 7. It is configured to be electrically connected by a microsocket method when used together. Further, since the solid-state image sensor 8 enhances the light receiving ability,
Each active area forming a light receiving surface (imaging active surface) is provided with a condensing microlens 8b.

【0020】次に、前記ガラス基板7の所定位置(受光
領域)に、固体撮像素子8を、その集光用マイクロレン
ズ8b形成面をガラス基板7面に対向させて搭載,配置す
る一方、Au製バンプ(接続部)9を介して端子8aを配線
導体7aの端子部に電気的に接続・実装する。さらに、配
線導体7aの所定位置に、能動型の回路部品11を搭載接続
し、所要の電子回路を形成して、固体撮像モジュール本
体化する。
Next, at the predetermined position (light receiving area) of the glass substrate 7, the solid-state image pickup device 8 is mounted and arranged with the condensing microlens 8b forming surface facing the glass substrate 7 surface. The terminals 8a are electrically connected to and mounted on the terminal portions of the wiring conductor 7a via the bumps (connection portions) 9 made of metal. Further, the active type circuit component 11 is mounted and connected at a predetermined position of the wiring conductor 7a to form a required electronic circuit to form a solid-state imaging module body.

【0021】その後、前記固体撮像モジュール本体の、
能動型の回路部品11を搭載・実装した領域を、たとえば
室温粘度が1000cp程度の紫外線硬化性樹脂 12aで被覆・
充填する。また、前記搭載・実装した固体撮像素子8の
受光面領域を除いて周辺部を、たとえば室温粘度が 600
00cp程度の紫外線硬化性樹脂 12bで被覆・充填する。こ
のように、固体撮像素子8の受光面領域を、高粘度で流
動し難い紫外線硬化性樹脂 12bで区画化する。つまり、
固体撮像素子8の撮像エリアを空隙化した形に、固体撮
像素子8の周辺部を一時的に封止する。
Then, in the solid-state image pickup module body,
The area where the active circuit component 11 is mounted and mounted is covered with, for example, an ultraviolet curable resin 12a having a room temperature viscosity of about 1000 cp.
Fill. In addition, except for the light-receiving surface area of the mounted / mounted solid-state imaging device 8, the peripheral portion has, for example, a room temperature viscosity of 600.
Cover and fill with 00cp UV curable resin 12b. In this way, the light-receiving surface area of the solid-state image sensor 8 is partitioned by the ultraviolet curable resin 12b which has high viscosity and is hard to flow. That is,
The peripheral area of the solid-state image sensor 8 is temporarily sealed so that the imaging area of the solid-state image sensor 8 is voided.

【0022】次いで、前記固体撮像素子8および能動型
回路部品11をそれぞれ被覆・充填した紫外線硬化性樹脂
12a, 12bに、紫外線を照射して硬化することにより、
図1に断面的に図示したごとき、構成を採った固体撮像
モジュールが製造される。
Next, an ultraviolet-curing resin coated and filled with the solid-state image pickup device 8 and the active circuit component 11, respectively.
By irradiating 12a and 12b with ultraviolet rays to cure them,
A solid-state image pickup module having a structure as shown in FIG. 1 is manufactured.

【0023】図2 (a), (b)は第2の実施例の実施態様
を示す模式図で、図2 (a)は紫外線硬化性樹脂 12a, 1
2bを硬化させる前の状態の平面図、図2 (b)は紫外線硬
化性樹脂 12a, 12bの硬化後における状態の断面図であ
る。
2 (a) and 2 (b) are schematic views showing an embodiment of the second embodiment, and FIG. 2 (a) is an ultraviolet curable resin 12a, 1
2B is a plan view of the state before curing 2b, and FIG. 2B is a sectional view of the state after curing the ultraviolet curable resins 12a and 12b.

【0024】第2の実施例の場合は、厚さが固体撮像素
子8下面とガラス基板7上面との間隔程度で、かつ固体
撮像素子8の外形寸法よりも大きい方形環状の枠体(た
とえば接着製樹脂フィルム製)13を、固体撮像素子8を
平面的に包囲する形に固定配置した外は、前記第1の実
施例の場合と同様の手段によって、高品質の画像を撮像
できる固体撮像モジュールを製造できる。
In the case of the second embodiment, a rectangular annular frame body (for example, an adhesive) having a thickness which is about the distance between the lower surface of the solid-state image sensor 8 and the upper surface of the glass substrate 7 and which is larger than the outer dimension of the solid-state image sensor 8. A solid-state image pickup module capable of picking up a high-quality image by the same means as in the first embodiment except that the resin film 13 is fixedly arranged so as to surround the solid-state image pickup element 8 in a plane. Can be manufactured.

【0025】さらに、図3 (a), (b)は第3の実施例の
実施態様を示す模式図で、図3 (a)は紫外線硬化性樹脂
12a, 12bを硬化させる前の状態の平面図、図3 (b)は
紫外線硬化性樹脂 12a, 12bの硬化後における状態の断
面図である。
Further, FIGS. 3 (a) and 3 (b) are schematic views showing an embodiment of the third embodiment, and FIG. 3 (a) is an ultraviolet curable resin.
FIG. 3B is a cross-sectional view of the state before curing the ultraviolet curable resins 12a and 12b, and FIG. 3B is a plan view of the state before curing 12a and 12b.

【0026】第3の実施例の場合は、固体撮像素子8お
よび能動型の回路部品11と、これらをそれぞれ被覆・充
填する紫外線硬化性樹脂 12a, 12b領域都を露出するよ
うな窓が開けられた(開口している)絶縁性フィルム14
を、前記搭載・実装面に貼着した外は、前記第1の実施
例の場合と同様の手段によって、比較的短時間の紫外線
照射で封止樹脂 12a, 12bも硬化し、高品質の画像を撮
像できる固体撮像モジュールを製造できる。
In the case of the third embodiment, a window is opened so as to expose the solid-state image pickup element 8 and the active type circuit component 11 and the ultraviolet curable resins 12a and 12b for covering and filling them. Insulating film (open) 14
Except for being attached to the mounting / mounting surface, the sealing resin 12a, 12b is also cured by ultraviolet irradiation for a relatively short time by the same means as in the case of the first embodiment, and a high quality image is obtained. It is possible to manufacture a solid-state image pickup module capable of picking up images.

【0027】本発明は上記実施例に限定されるものでな
く、発明の趣旨を逸脱しない範囲でいろいろの変形を採
り得る。たとえば、固体撮像素子やガラス基板の寸法形
状など、固体撮像モジュールの用途,規格などに応じて
適宜選択設定してもよい。
The present invention is not limited to the above embodiments, and various modifications can be made without departing from the spirit of the invention. For example, the size and shape of the solid-state imaging device or the glass substrate may be appropriately selected and set according to the application, standard, etc. of the solid-state imaging module.

【0028】[0028]

【発明の効果】請求項1の発明によれば、流動・充填性
の低い樹脂と流動・充填性の高い樹脂とを使い分け、流
動・充填性の低い高粘度樹脂を堰として機能させ、受光
面領域に対する樹脂の充填・封止を防止しながら、耐環
境性の保護など要求される能動型の回路素子を実装した
領域部分を緻密に樹脂封止することができる。しかも、
前記封止用樹脂は、紫外線の照射で硬化するため、固体
撮像素子が熱的な悪影響を受ける恐れも回避され、性能
的にすぐれた固体撮像モジュールを歩留まりよく提供で
きる。
According to the invention of claim 1, a resin having a low fluidity / filling property and a resin having a high fluidity / filling property are selectively used, and a high viscosity resin having a low fluidity / filling property is made to function as a weir, and a light receiving surface is obtained. While preventing the resin from being filled and sealed in the area, it is possible to densely seal the area in which the active circuit element required to protect the environment is mounted. Moreover,
Since the encapsulating resin is cured by irradiation with ultraviolet rays, the solid-state imaging device can be prevented from being adversely affected by heat, and a solid-state imaging module with excellent performance can be provided with high yield.

【0029】請求項2の発明によれば、高粘度の紫外線
硬化性樹脂として、室温での粘度が50000cp以上に、ま
た、低粘度の紫外線硬化性樹脂として、室温での粘度が
1500cp以下に、それぞれ選択したことによって、より容
易に性能的にすぐれた固体撮像モジュールを歩留まりよ
く提供できる。
According to the second aspect of the invention, the high-viscosity UV-curable resin has a viscosity at room temperature of not less than 50,000 cp, and the low-viscosity UV-curable resin has a viscosity at room temperature.
By selecting each to 1500cp or less, it is possible to easily provide a solid-state imaging module having excellent performance with high yield.

【0030】請求項3の発明によれば、封止用樹脂を充
填・被覆する少なくともいずれか一つの領域部に、外枠
体を固定配置して充填・被覆する樹脂の外方への流出を
防止できるので、さらに容易に性能的にすぐれた固体撮
像モジュールを歩留まりよく提供できる。
According to the third aspect of the present invention, the outer frame body is fixedly arranged in at least one of the regions where the sealing resin is filled and coated so that the resin that is filled and coated flows out. Since this can be prevented, it is possible to easily provide a solid-state imaging module having excellent performance with high yield.

【図面の簡単な説明】[Brief description of the drawings]

【図1】第1の実施例で製造した固体撮像モジュールの
要部構成を示す断面図。
FIG. 1 is a cross-sectional view showing a configuration of a main part of a solid-state image pickup module manufactured in a first embodiment.

【図2】第2の実施例の実施態様における固体撮像モジ
ュールの構成状態を示すもので、 (a)は封止樹脂が硬化
する前の平面図、 (b)は封止樹脂を硬化させた後の断面
図。
2A and 2B show a configuration state of a solid-state imaging module according to an embodiment of a second embodiment, FIG. 2A is a plan view before the sealing resin is cured, and FIG. Later sectional view.

【図3】第3の実施例の実施態様における固体撮像モジ
ュールの構成状態を示すもので、 (a)は封止樹脂が硬化
する前の平面図、 (b)は封止樹脂を硬化させた後の断面
図。
3A and 3B show a constitutional state of a solid-state imaging module according to an embodiment of a third embodiment, FIG. 3A is a plan view before the sealing resin is cured, and FIG. 3B is a curing state of the sealing resin. Later sectional view.

【図4】従来の固体撮像モジュールの要部構成を示す断
面図。
FIG. 4 is a cross-sectional view showing a configuration of a main part of a conventional solid-state imaging module.

【符号の説明】[Explanation of symbols]

1,7……ガラス基板 1a,7a……配線導体 2,8……固体撮像素子( CCDチップ) 2a,8a……固体撮像素子の端子 2b,8b……固体撮像素子の集光用マイクロレンズ 3,9……Auバンプ 4,10……In半田 5,11……能動型の回路部品 6……モールド封止樹脂層 12a……低粘度紫外線硬化性樹脂 12b……高粘度紫外線硬化性樹脂 13……接着性樹脂枠体 14……絶縁性フィルム 1, 7 ...... Glass substrate 1a, 7a ...... Wire conductors 2,8 ...... Solid-state image sensor (CCD chip) 2a, 8a ...... Solid-state image sensor terminals 2b, 8b ...... Solid-state image sensor focusing microlens 3,9 ...... Au bump 4,10 ...... In solder 5,11 ...... Active type circuit component 6 ...... Mold sealing resin layer 12a ...... Low viscosity UV curable resin 12b ...... High viscosity UV curable resin 13 …… Adhesive resin frame 14 …… Insulating film

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 一主面に所要の入・出力接続端子および
能動型の回路素子を含む配線回路が一定の領域を除いて
設けられたガラス基板に、前記一定の領域に受光面を対
向させて固体撮像素子を搭載,配置する工程と、 前記固体撮像素子の端子およびガラス基板面の一方の接
続端子間を電気的に接続する工程と、 前記固体撮像素子については受光面以外の少なくとも周
辺部を高粘度の紫外線硬化性樹脂で被覆する工程と、 前記能動型の回路素子を実装した領域部分を低粘度の紫
外線硬化性樹脂で被覆する工程と、 前記被覆した紫外線硬化性樹脂層に紫外線を照射して硬
化封止する工程とを有することを特徴とする固体撮像モ
ジュールの製造方法。
1. A light receiving surface is opposed to a predetermined area on a glass substrate on a main surface of which a wiring circuit including required input / output connection terminals and active type circuit elements is provided excluding a predetermined area. Mounting and arranging the solid-state image sensor by means of the above, electrically connecting the terminals of the solid-state image sensor and one of the connection terminals on the glass substrate surface, and at least the peripheral portion other than the light-receiving surface for the solid-state image sensor. A step of coating with a high-viscosity UV-curable resin, a step of coating the area portion where the active circuit element is mounted with a low-viscosity UV-curable resin, and an ultraviolet ray to the coated UV-curable resin layer. A step of irradiating and curing and encapsulating the solid-state imaging module.
【請求項2】 一主面に所要の入・出力接続端子および
能動型の回路素子を含む配線回路が一定の領域を除いて
設けられたガラス基板に、前記一定の領域に受光面を対
向させて固体撮像素子を搭載,配置する工程と、 前記固体撮像素子の端子およびガラス基板面の一方の接
続端子間を電気的に接続する工程と、 前記固体撮像素子については受光面以外の少なくとも周
辺部を室温での粘度が50000cp以上の紫外線硬化性樹脂
で被覆する工程と、 前記能動型の回路素子を実装した領域部分を室温での粘
度が1500cp以下の紫外線硬化性樹脂で被覆する工程と、 前記被覆した紫外線硬化性樹脂層に紫外線を照射して硬
化封止する工程とを有することを特徴とする固体撮像モ
ジュールの製造方法。
2. A light receiving surface is opposed to a glass substrate on one main surface of which a wiring circuit including required input / output connection terminals and active type circuit elements is provided except for a certain area. Mounting and arranging the solid-state image sensor by means of the above, electrically connecting the terminals of the solid-state image sensor and one of the connection terminals on the glass substrate surface, and at least the peripheral portion other than the light-receiving surface for the solid-state image sensor. A step of coating with a UV curable resin having a viscosity at room temperature of 50000 cp or more, and a step of coating the area portion where the active circuit element is mounted with a UV curable resin having a viscosity of 1500 cp or less at room temperature, And a step of irradiating the coated ultraviolet curable resin layer with ultraviolet rays to cure and seal the layer.
【請求項3】 紫外線硬化性樹脂を被覆する固体撮像素
子部および能動型の回路素子部の少なくともいずれか一
方に外枠体を固定配置することを特徴とする請求項1も
しくは請求項2記載の固体撮像モジュールの製造方法。
3. The outer frame body is fixedly arranged on at least one of a solid-state image pickup element portion and an active type circuit element portion which are coated with an ultraviolet curable resin. Manufacturing method of solid-state imaging module.
JP7343385A 1995-12-28 1995-12-28 Manufacture of solid-state image pickup module Pending JPH09186308A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7343385A JPH09186308A (en) 1995-12-28 1995-12-28 Manufacture of solid-state image pickup module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7343385A JPH09186308A (en) 1995-12-28 1995-12-28 Manufacture of solid-state image pickup module

Publications (1)

Publication Number Publication Date
JPH09186308A true JPH09186308A (en) 1997-07-15

Family

ID=18361110

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7343385A Pending JPH09186308A (en) 1995-12-28 1995-12-28 Manufacture of solid-state image pickup module

Country Status (1)

Country Link
JP (1) JPH09186308A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000196014A (en) * 1998-12-25 2000-07-14 Texas Instr Japan Ltd Semiconductor chip and semiconductor device mounted with the semiconductor chip
JP2003060114A (en) * 2001-08-17 2003-02-28 Sony Corp Semiconductor device and solid-state image pickup device
JP2005191492A (en) * 2003-12-26 2005-07-14 Sony Corp Solid imaging element and its manufacturing method
JP2007523473A (en) * 2004-01-15 2007-08-16 オプトパック、インコーポレイテッド Photo image sensor electronic package in mobile phone camera module and its manufacture and assembly
JP2008512851A (en) * 2004-09-02 2008-04-24 オプトパック、インコーポレイテッド Method for manufacturing camera module at wafer level
WO2012026457A1 (en) * 2010-08-27 2012-03-01 株式会社ニコン Imaging device
JP2013175861A (en) * 2012-02-24 2013-09-05 Fujifilm Corp Substrate module and manufacturing method of the same

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000196014A (en) * 1998-12-25 2000-07-14 Texas Instr Japan Ltd Semiconductor chip and semiconductor device mounted with the semiconductor chip
JP2003060114A (en) * 2001-08-17 2003-02-28 Sony Corp Semiconductor device and solid-state image pickup device
JP2005191492A (en) * 2003-12-26 2005-07-14 Sony Corp Solid imaging element and its manufacturing method
JP4534484B2 (en) * 2003-12-26 2010-09-01 ソニー株式会社 Solid-state imaging device and manufacturing method thereof
JP2007523473A (en) * 2004-01-15 2007-08-16 オプトパック、インコーポレイテッド Photo image sensor electronic package in mobile phone camera module and its manufacture and assembly
JP2008512851A (en) * 2004-09-02 2008-04-24 オプトパック、インコーポレイテッド Method for manufacturing camera module at wafer level
WO2012026457A1 (en) * 2010-08-27 2012-03-01 株式会社ニコン Imaging device
CN103038884A (en) * 2010-08-27 2013-04-10 株式会社尼康 Imaging device
JP2013175861A (en) * 2012-02-24 2013-09-05 Fujifilm Corp Substrate module and manufacturing method of the same

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