JP2013175861A - Substrate module and manufacturing method of the same - Google Patents

Substrate module and manufacturing method of the same Download PDF

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JP2013175861A
JP2013175861A JP2012038246A JP2012038246A JP2013175861A JP 2013175861 A JP2013175861 A JP 2013175861A JP 2012038246 A JP2012038246 A JP 2012038246A JP 2012038246 A JP2012038246 A JP 2012038246A JP 2013175861 A JP2013175861 A JP 2013175861A
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resin
circuit component
substrate
circuit
module
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JP5706357B2 (en
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Hiroshi Makino
寛 牧野
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Fujifilm Corp
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Abstract

PROBLEM TO BE SOLVED: To improve the durability of an imaging module.SOLUTION: An image pickup device 20 and multiple circuit components 8 are mounted on a lower surface 1B of a substrate 1. The image pickup device 20 and the multiple circuit components 8 are divided by a dam tape 9, and the divided area is covered by a heat radiation plate 12. A peripheral region of the image pickup device 20 is sealed by resins 11 and 13, and peripheral regions of the multiple circuit components 8 are sealed by a resin 10. When the dam tape 9 is removed, a space 9A communicating with the exterior of a substrate module is formed. This structure prevents contact failure of an electric connection part that is caused by expansion etc. of a cavity due to module external air pressure changes and improves the durability.

Description

この発明は,基板の同一面上に第1の回路部品と第2の回路部品とが実装されている基板モジュールおよびその製造方法に関する。   The present invention relates to a substrate module in which a first circuit component and a second circuit component are mounted on the same surface of a substrate, and a manufacturing method thereof.

小型化を目的として,撮像素子とFPC(Flexible printed circuits)基板とをフリップチップ接続した撮像モジュールが実用化されている。FPC基板を利用すると折り曲げられるので実装面積を実質的に小型化できる。また,撮像素子近傍には,小型電子部品(レギュレータ,抵抗など)などの発熱部材が存在するので,撮像素子に熱が伝わりノイズが発生し,画質が低下してしまうことがある。このために,撮像素子の裏面に放熱部材を取り付け,放熱するものもある。さらに,撮像モジュールには防水対策の要求が高まっている。とくに,内視鏡に使用される場合には,防水以外に滅菌環境に耐えうる撮像モジュールが必要とされている。   For the purpose of downsizing, an imaging module in which an imaging element and an FPC (Flexible printed circuits) substrate are flip-chip connected has been put into practical use. Since the FPC board can be bent, the mounting area can be substantially reduced. In addition, since there are heat generating members such as small electronic components (regulators, resistors, etc.) in the vicinity of the image sensor, heat is transmitted to the image sensor and noise is generated, which may degrade the image quality. For this reason, there are some which dissipate heat by attaching a heat dissipating member to the back surface of the image sensor. Furthermore, there is an increasing demand for waterproofing measures for imaging modules. In particular, when used in an endoscope, there is a need for an imaging module that can withstand a sterilization environment in addition to waterproofing.

滅菌環境は,洗浄液による滅菌以外にEOG滅菌も一般的に実施されている。EOG滅菌とは,EOガスとCO2ガスとを一定の比率が混合した雰囲気に滅菌対象物を曝して滅菌する方法である。オートクレーブ(高温高圧蒸気により滅菌させる方法)よりも滅菌対象物の変質,変形が少ない。   As for the sterilization environment, EOG sterilization is generally carried out in addition to sterilization with a cleaning solution. EOG sterilization is a method of sterilizing an object to be sterilized by exposing it to an atmosphere in which EO gas and CO2 gas are mixed in a certain ratio. Compared to autoclaves (methods of sterilization with high-temperature and high-pressure steam), the sterilization target is less altered and deformed.

図13は,撮像モジュールの底面図である。   FIG. 13 is a bottom view of the imaging module.

基板1の下面には,撮像素子20が実装されている。この撮像素子20の右側には回路部品8が実装されている。回路部品8の周囲は,樹脂10によって封止されている。また,撮像素子20の周囲は,樹脂14によって封止され,防水構造となっている。   An image sensor 20 is mounted on the lower surface of the substrate 1. A circuit component 8 is mounted on the right side of the image sensor 20. The periphery of the circuit component 8 is sealed with a resin 10. Further, the periphery of the image sensor 20 is sealed with a resin 14 and has a waterproof structure.

回路部品8の周囲に樹脂10を塗布して硬化させ,その後,撮像素子20の周囲に樹脂14を塗布して硬化させることにより,回路部品8の周囲および撮像素子20の周囲を封止するので,樹脂14が樹脂10に流れ,樹脂10と樹脂14とが接した後に硬化することとなる。樹脂10および樹脂14により撮像素子20の周囲および回路部品8の周囲が封止された撮像モジュールの裏面は放熱板により覆われるので,基板1,放熱板,樹脂10および樹脂14で囲まれ,撮像モジュールの外部と通気しない空洞15が形成される。   Since the resin 10 is applied and cured around the circuit component 8 and then the resin 14 is applied and cured around the image sensor 20, the periphery of the circuit component 8 and the image sensor 20 are sealed. The resin 14 flows into the resin 10 and is cured after the resin 10 and the resin 14 come into contact with each other. Since the back surface of the imaging module in which the periphery of the imaging element 20 and the circuit component 8 are sealed with the resin 10 and the resin 14 is covered with the heat sink, the substrate 1 is surrounded by the heat sink, the resin 10 and the resin 14, and the imaging is performed. A cavity 15 that does not vent to the outside of the module is formed.

また,簡易な構造で製造コストを安くする固体撮像素子モジュール(特許文献1),画質を向上させる固体撮像モジュールの製造方法(特許文献2)などもある。   There are also a solid-state imaging device module (Patent Document 1) that reduces the manufacturing cost with a simple structure, a manufacturing method of a solid-state imaging module that improves image quality (Patent Document 2), and the like.

特開2001-16486号公報JP 2001-16486 特開平9-186308号公報JP-A-9-186308

EOG滅菌では,対象物が加減圧(減圧)環境に曝される。対象物が加減圧環境に曝されると,従来の撮像モジュールの構造では,樹脂の変形,変質により放熱部材が後方に引っ張られる(フリップチップ接続部がせん断方向に引っ張られる)。図13に示すように,樹脂10および14近傍の空洞15の圧縮や膨張によるによる体積変化,空洞15を防水樹脂で封止した場合も、樹脂の硬化収縮や部材の熱膨張差による放熱部材への応力が増加するなどの理由からフリップチップ接続部が接触不良を起こし,映像が映らなくなることがある。このように耐久性が低くなるという問題については,引用文献1,2のいずれにおいても全く考えられていない。   In EOG sterilization, the object is exposed to a pressurized / reduced (decompressed) environment. When the object is exposed to a pressurized / reduced pressure environment, in the conventional imaging module structure, the heat radiating member is pulled backward due to the deformation and alteration of the resin (the flip chip connecting portion is pulled in the shear direction). As shown in FIG. 13, the volume change due to compression and expansion of the cavity 15 in the vicinity of the resins 10 and 14, and even when the cavity 15 is sealed with a waterproof resin, it becomes a heat radiating member due to resin curing shrinkage and the difference in thermal expansion of the member For example, the flip chip connection may cause poor contact due to the increase in stress, and the video may not be displayed. Such a problem that durability is lowered is not considered at all in either of the cited documents 1 and 2.

この発明は,撮像モジュールのような基板モジュールの耐久性を向上させることを目的とする。   An object of the present invention is to improve the durability of a substrate module such as an imaging module.

この発明による基板モジュールの製造方法は,第1の回路部品と第2の回路部品とが同一面上に実装されている基板において,第1の回路部品と第2の回路部品との間に第1の回路部品の周囲領域と第2の回路部品の周囲領域とが接しないように分ける区分け部材を設け,第1の回路部品の周囲領域に第1の樹脂(たとえば,防水樹脂)を塗布し,第2の回路部品の周囲領域に第2の樹脂(たとえば,防水樹脂)を塗布し,区分け部材を取り除くことを特徴とする。撮像モジュールに放熱部材を貼り付けた後に区分け部材を取り除くようにしてもよいし,区分け部材を取り除いた後に,撮像モジュールに放熱部材を貼り付けてもよい。   According to the substrate module manufacturing method of the present invention, the first circuit component and the second circuit component are mounted on the same surface, and the first module and the second circuit component are arranged between the first circuit component and the second circuit component. A dividing member is provided so that the peripheral area of the first circuit component and the peripheral area of the second circuit component are not in contact with each other, and a first resin (for example, waterproof resin) is applied to the peripheral area of the first circuit component. The second resin (for example, waterproof resin) is applied to the peripheral area of the second circuit component, and the sorting member is removed. The separating member may be removed after the heat radiating member is attached to the imaging module, or the heat radiating member may be attached to the imaging module after the separating member is removed.

この発明によると,第1の回路部品と第2の回路部品とが実装されている基板の同一面上において,第1の回路部品と第2の回路部品との間に,第1の回路部品の周囲領域と第2の回路部品の周囲領域とを分ける区分け部材が設けられる。第1の回路部品の周囲領域に第1の樹脂が塗布され,第2の回路部品の周囲領域に第2の樹脂が塗布される。次いで,必要に応じて放熱部材を貼り付け,区分け部材が取り除かれる。区分け部材は,第1の回路部品の周囲領域と第2の回路部品の周囲領域とが接しないように分けるものであるから,第1の樹脂と第2の樹脂とが接してしまうことが未然に防止される。また,第1の樹脂と第2の樹脂とで囲まれる空洞も形成されないので,撮像モジュールの外気圧変化に伴う空洞の膨張等による電気接続部の接触不良も防止され,耐久性が向上する。   According to the present invention, the first circuit component is disposed between the first circuit component and the second circuit component on the same surface of the substrate on which the first circuit component and the second circuit component are mounted. A dividing member for separating the surrounding area of the second circuit component and the surrounding area of the second circuit component is provided. The first resin is applied to the peripheral region of the first circuit component, and the second resin is applied to the peripheral region of the second circuit component. Next, if necessary, a heat radiating member is attached, and the sorting member is removed. Since the sorting member separates the surrounding area of the first circuit component from the surrounding area of the second circuit component, the first resin and the second resin may be in contact with each other. To be prevented. In addition, since a cavity surrounded by the first resin and the second resin is not formed, contact failure of the electrical connection portion due to expansion of the cavity due to a change in the external pressure of the imaging module is prevented, and durability is improved.

第1の樹脂および第2の樹脂は,たとえば,硬化性樹脂であり,第1の回路部品の周囲領域への第1の絶縁性樹脂の塗布および第2の回路部品の周囲領域への第2の樹脂の塗布後に必要に応じて放熱部材を貼り付け,第1の樹脂および第2の樹脂を硬化させ,第1の樹脂および第2の樹脂の硬化後に区分け部材を取り除くようにしてもよい。   The first resin and the second resin are, for example, curable resins, and the first insulating resin is applied to the peripheral area of the first circuit component and the second resin is applied to the peripheral area of the second circuit component. After applying the resin, a heat radiating member may be attached as necessary, the first resin and the second resin are cured, and the sorting member may be removed after the first resin and the second resin are cured.

第2の回路部品は,複数の回路部品からなる部品群であり,それぞれ接しないように,各回路部品の周囲,とくに半田等による電気接続部に第2の樹脂を塗布することが好ましい。   The second circuit component is a group of components composed of a plurality of circuit components, and it is preferable to apply the second resin around each circuit component, in particular, to an electrical connection portion by solder or the like so as not to contact each other.

第1の樹脂および第2の樹脂の硬度は,たとえば,A20からD80までのものが好ましい。   The hardness of the first resin and the second resin is preferably, for example, from A20 to D80.

区分け部材は,たとえば,ダム・テープである。   The sorting member is, for example, a dam tape.

第1の回路部品および第2の回路部品において,基板に実装されている面と対向する面上に放熱部材を取り付けることが好ましい。   In the first circuit component and the second circuit component, it is preferable to attach a heat radiating member on the surface facing the surface mounted on the substrate.

この発明は,基板モジュールも提供している。すなわち,基板モジュールは,第1の回路部品と第2の回路部品とが同一面上に実装されている基板,第1の回路部品の周囲領域に塗布されている第1の樹脂,および第1の樹脂と非接触となるように,第1の樹脂との間に空間が空けられて,第2の回路部品の周囲領域に塗布されている第2の樹脂を備えている。   The present invention also provides a substrate module. That is, the substrate module includes a substrate on which the first circuit component and the second circuit component are mounted on the same surface, a first resin applied to a peripheral region of the first circuit component, and a first resin. A second resin applied to the peripheral region of the second circuit component is provided with a space between the first resin and the first resin so as to be in non-contact with the first resin.

この発明によると,基板の同一面上には第1の回路部品と第2の回路部品とが実装されており,かつ第1の回路部品の周囲領域には第1の樹脂が,第2の回路部品の周囲領域には第2の樹脂が封止されている。第1の樹脂と第2の樹脂とは非接触となるように,第1の樹脂と第2の樹脂との間には空間が空けられている。第1の樹脂と第2の樹脂とで囲まれた空洞は形成されていないので,上述のように耐久性が向上する。   According to the present invention, the first circuit component and the second circuit component are mounted on the same surface of the substrate, and the first resin is provided in the peripheral region of the first circuit component. A second resin is sealed in a peripheral region of the circuit component. A space is provided between the first resin and the second resin so that the first resin and the second resin are not in contact with each other. Since the cavity surrounded by the first resin and the second resin is not formed, the durability is improved as described above.

第1の樹脂と第2の樹脂とが非接触となるように第1の樹脂と第2の樹脂との間に形成される空間は基板モジュールの外部とつながっている。   The space formed between the first resin and the second resin is connected to the outside of the substrate module so that the first resin and the second resin are not in contact with each other.

第2の回路部品は,たとえば,複数の回路部品からなる部品群であり,それぞれが接しないように,各回路部品の周囲,特に半田等による電気接続部に第2の樹脂を塗布することが好ましい。   The second circuit component is, for example, a group of components composed of a plurality of circuit components, and the second resin may be applied to the periphery of each circuit component, in particular, to the electrical connection portion by solder or the like so as not to contact each other. preferable.

第1の樹脂および第2の樹脂は,たとえば,硬度がA20からD80までのものが好ましい。   For example, the first resin and the second resin preferably have a hardness of A20 to D80.

第1の回路部品および第2の回路部品において,基板に実装されている面と対向する面上に取り付けられている放熱部材をさらに備える。   The first circuit component and the second circuit component further include a heat radiating member attached on a surface facing the surface mounted on the substrate.

実施例1における説明図であり,(A)は,基板の底面図,(B)は,図1(A)のIB−IB線から見た断面図である。2A and 2B are explanatory diagrams of Example 1, in which FIG. 1A is a bottom view of a substrate, and FIG. 1B is a cross-sectional view taken along line IB-IB in FIG. 実施例1における説明図であり,(A)は,基板の底面図,(B)は,図2(A)のIIB−IIB線から見た断面図である。2A and 2B are explanatory diagrams in Example 1, in which FIG. 2A is a bottom view of the substrate, and FIG. 2B is a cross-sectional view taken along line IIB-IIB in FIG. 実施例1における説明図であり,(A)は,基板の底面図,(B)は,図3(A)のIIIB−IIIB線から見た断面図である。FIG. 3 is an explanatory diagram of Example 1, (A) is a bottom view of the substrate, and (B) is a cross-sectional view taken along line IIIB-IIIB in FIG. 3 (A). 実施例1における説明図であり,(A)は,基板の底面図,(B)は,図4(A)のIVB−IVB線から見た断面図である。4A and 4B are explanatory views of Example 1, in which FIG. 4A is a bottom view of the substrate, and FIG. 4B is a cross-sectional view taken along line IVB-IVB in FIG. 実施例1における説明図であり,(A)は,基板の底面図,(B)は,図5(A)のVB−VB線から見た断面図である。2A and 2B are explanatory diagrams in Example 1, in which FIG. 5A is a bottom view of the substrate, and FIG. 5B is a cross-sectional view taken along line VB-VB in FIG. 実施例1における説明図であり,(A)は,基板の断面図,(B)は,図6(A)のVIB−VIB線から見た断面図である。2A and 2B are explanatory views in Example 1, in which FIG. 6A is a cross-sectional view of a substrate, and FIG. 6B is a cross-sectional view taken along line VIB-VIB in FIG. 実施例1における説明図であり,放熱板が取り除かれた撮像モジュールの底面図である。It is explanatory drawing in Example 1, and is a bottom view of the imaging module from which the heat sink was removed. 実施例2における説明図であり,(A)は,基板の底面図,(B)は,図8(A)のVIIIB−VIIIB線から見た断面図である。It is explanatory drawing in Example 2, (A) is a bottom view of a board | substrate, (B) is sectional drawing seen from the VIIIB-VIIIB line | wire of FIG. 8 (A). 実施例2における説明図であり,(A)は,基板の底面図,(B)は,図9(A)のIXB−IXB線から見た断面図である。It is explanatory drawing in Example 2, (A) is a bottom view of a board | substrate, (B) is sectional drawing seen from the IXB-IXB line | wire of FIG. 9 (A). 実施例2における説明図であり,(A)は,基板の底面図,(B)は,図10(A)のXB−XB線から見た断面図である。It is explanatory drawing in Example 2, (A) is a bottom view of a board | substrate, (B) is sectional drawing seen from the XB-XB line | wire of FIG. 10 (A). 実施例2における説明図であり,(A)は,基板の底面図,(B)は,図11(A)のXIB−XIB線から見た断面図である。It is explanatory drawing in Example 2, (A) is a bottom view of a board | substrate, (B) is sectional drawing seen from the XIB-XIB line | wire of FIG. 11 (A). 実施例2における説明図であり,放熱板が取り除かれた撮像モジュールの底面図である。It is explanatory drawing in Example 2, and is a bottom view of the imaging module from which the heat sink was removed. 従来の撮像モジュールであって,放熱板が取り除かれた撮像モジュールの底面図である。FIG. 6 is a bottom view of an imaging module that is a conventional imaging module with a heat sink removed.

図1(A)は基板1の底面図であり,図1(B)は,図1(A)のIB−IB線から見た断面図である。   1A is a bottom view of the substrate 1, and FIG. 1B is a cross-sectional view taken along line IB-IB in FIG. 1A.

主として,図1(B)を参照して,基板1には開口2が形成されている。この開口2に対応する基板1の下面1Bの位置に,受光面が上部となるように位置決めされている撮像素子20が樹脂7によって取り付けられている。基板1の下面1Bには配線パターン(図示略)が形成されており,その配線パターンと撮像素子20とがバンプ5を介し電気的に接続されている。   Referring mainly to FIG. 1B, an opening 2 is formed in the substrate 1. An image sensor 20 positioned with the light receiving surface at the top is attached by a resin 7 at a position of the lower surface 1B of the substrate 1 corresponding to the opening 2. A wiring pattern (not shown) is formed on the lower surface 1 </ b> B of the substrate 1, and the wiring pattern and the image sensor 20 are electrically connected via the bumps 5.

基板1に形成されている開口2には,矩形のガラス板3が嵌め込められている。このガラス板3は,樹脂4によって基板1の上面1Aに固定されている。ガラス板3の下面と撮像素子3の上面との間にはスペーサ6が挟まれている。また,撮像素子20の下面の全体には,両面テープ21が貼られている。   A rectangular glass plate 3 is fitted into the opening 2 formed in the substrate 1. The glass plate 3 is fixed to the upper surface 1A of the substrate 1 by a resin 4. A spacer 6 is sandwiched between the lower surface of the glass plate 3 and the upper surface of the image sensor 3. A double-sided tape 21 is attached to the entire lower surface of the image sensor 20.

主として図1(A)を参照して,基板1の下面1Bの右側には複数の回路部品8が実装されている。これらの複数の回路部品8は互いに間隔があけられている。   Referring mainly to FIG. 1A, a plurality of circuit components 8 are mounted on the right side of the lower surface 1B of the substrate 1. The plurality of circuit components 8 are spaced from each other.

次に述べるように,まず,ダム・テープ9が基板1に貼り付けられる。   As described below, first, the dam tape 9 is attached to the substrate 1.

図2(A)は,基板1の底面図であり,図2(B)は図2(A)のIIB−IIB線から見た断面図である。   2A is a bottom view of the substrate 1, and FIG. 2B is a cross-sectional view taken along the line IIB-IIB in FIG. 2A.

主として,図2(A)を参照して,撮像素子3(図2においては両面テープ21が見えているので撮像素子3は見えない)の周囲領域31と回路部品8の周囲領域32とが分けられるように,基板1の裏面1Bにおいて撮像素子3と回路部品8との間に基板1の対向する辺を突き抜けるようにダム・テープ9が貼られる。ダム・テープ9によって,撮像素子3の周囲領域31と回路部品8の周囲領域32とが接しないようになる。   Referring mainly to FIG. 2A, the peripheral region 31 of the image sensor 3 (the image sensor 3 cannot be seen because the double-sided tape 21 is visible in FIG. 2) and the peripheral region 32 of the circuit component 8 are separated. As shown, a dam tape 9 is stuck between the imaging element 3 and the circuit component 8 on the back surface 1 </ b> B of the substrate 1 so as to penetrate through the opposite sides of the substrate 1. The dam tape 9 prevents the surrounding area 31 of the image sensor 3 from contacting the surrounding area 32 of the circuit component 8.

つづいて,回路部品8の周囲領域32等に樹脂が塗布される。   Subsequently, a resin is applied to the peripheral region 32 and the like of the circuit component 8.

図3(A)は,基板1の底面図であり,図3(B)は,図3(A)のIIIB−IIIB線から見た断面図である。   3A is a bottom view of the substrate 1, and FIG. 3B is a cross-sectional view taken along line IIIB-IIIB in FIG. 3A.

主として,図3(A)を参照して,回路部品8の周囲領域32に硬化性の樹脂10が塗布される。複数の回路部品8のそれぞれの間にも樹脂10が塗布されることとなる。また,撮像素子3の周囲領域31のうち,ダム・テープ9に接する部分にも硬化性の樹脂11が塗布される。ダム・テープ9があるので,樹脂10と樹脂11とが接することなく,完全に区切られている。   Referring mainly to FIG. 3A, a curable resin 10 is applied to the peripheral region 32 of the circuit component 8. The resin 10 is also applied between each of the plurality of circuit components 8. Further, a curable resin 11 is also applied to a portion of the surrounding area 31 of the image pickup device 3 that is in contact with the dam tape 9. Since there is a dam tape 9, the resin 10 and the resin 11 are completely separated without contact.

つづいて,放熱板12が貼り付けられる。   Subsequently, the heat sink 12 is pasted.

図4(A)は,基板1の底面図であり,図4(B)は,図4(A)のIVB−IVB線から見た断面図である。   4A is a bottom view of the substrate 1, and FIG. 4B is a cross-sectional view taken along line IVB-IVB in FIG. 4A.

主として,図4(B)を参照して,基板1とほぼ同じ形状の放熱板12が用意される。用意された放熱板12が撮像素子20の裏面に貼られている両面テープ21によって撮像素子20に貼り付けられる。放熱板12と基板1との間に樹脂11,ダム・テープ9および樹脂10が挟まれるようになる。   Referring mainly to FIG. 4B, a heat radiating plate 12 having substantially the same shape as the substrate 1 is prepared. The prepared heat radiating plate 12 is attached to the image pickup device 20 by a double-sided tape 21 attached to the back surface of the image pickup device 20. The resin 11, the dam tape 9 and the resin 10 are sandwiched between the heat sink 12 and the substrate 1.

つづいて,撮像素子20の周囲領域のうち,樹脂11が塗布されていない部分に樹脂が塗布される。   Subsequently, a resin is applied to a portion of the surrounding area of the image sensor 20 where the resin 11 is not applied.

図5(A)は,基板1の底面図であり,図5(B)は,図5(A)のVB−VB線から見た断面図である。   5A is a bottom view of the substrate 1, and FIG. 5B is a cross-sectional view taken along the line VB-VB in FIG. 5A.

基板1と放熱板12とで挟まれた撮像素子20の周囲領域31に樹脂13が塗布されると,撮像素子20の周りは,樹脂13および樹脂11によって囲まれることとなる。基板1と放熱板12との間に塗布された樹脂13,11および10は硬化させられる。樹脂13,11および10が熱硬化樹脂であれば,加熱されることにより硬化されられることとなろう。   When the resin 13 is applied to the peripheral region 31 of the image pickup device 20 sandwiched between the substrate 1 and the heat radiating plate 12, the image pickup device 20 is surrounded by the resin 13 and the resin 11. The resins 13, 11 and 10 applied between the substrate 1 and the heat sink 12 are cured. If the resins 13, 11 and 10 are thermosetting resins, they will be cured by heating.

撮像素子20の周囲領域31に塗布された樹脂13および11ならびに回路部品8の周囲領域32に塗布された樹脂10が硬化させられると,ダム・テープ9が取り除かれる。   When the resins 13 and 11 applied to the peripheral region 31 of the image pickup device 20 and the resin 10 applied to the peripheral region 32 of the circuit component 8 are cured, the dam tape 9 is removed.

図6(A)は,基板1の底面図であり,図6(B)は,図6(A)のVIB−VIB線から見た断面図である。図7は,放熱板12が取り除かれた基板1の底面図である。   6A is a bottom view of the substrate 1, and FIG. 6B is a cross-sectional view taken along line VIB-VIB in FIG. 6A. FIG. 7 is a bottom view of the substrate 1 with the heat sink 12 removed.

ダム・テープ9が取り除かれると,取り除かれた場所に,基板モジュールの外部とつながっている空間9Aが形成される。回路部品8の周囲領域32に充填されている樹脂10と,撮像素子20の周囲領域31に充填されている樹脂13または11との間に空間9Aが形成されることとなる。   When the dam tape 9 is removed, a space 9A connected to the outside of the substrate module is formed at the removed place. A space 9 </ b> A is formed between the resin 10 filled in the peripheral region 32 of the circuit component 8 and the resin 13 or 11 filled in the peripheral region 31 of the imaging element 20.

樹脂10と,樹脂11および13と,で囲まれた空洞がある場合には,外部の気圧変化による空洞の圧縮,膨張が生じると,基板1と撮像素子20との接続部または基板1と回路部品8との接続部が外れてしまい接触不良が起きることがある。この実施例では,樹脂で囲まれた空洞が無いので,そのような接触不良も防止できる。   In the case where there is a cavity surrounded by the resin 10 and the resins 11 and 13, when the cavity is compressed or expanded due to a change in the external atmospheric pressure, the connection portion between the substrate 1 and the image sensor 20 or the substrate 1 and the circuit A connection portion with the component 8 may be disconnected, resulting in poor contact. In this embodiment, since there is no cavity surrounded by resin, such contact failure can be prevented.

本実施例は実施例1とほぼ同様である為,上述した実施例と同一物については同一符号を付し,重複する箇所は詳細な説明を省略する。   Since the present embodiment is substantially the same as the first embodiment, the same components as those in the above-described embodiment are denoted by the same reference numerals, and detailed description of the overlapping portions is omitted.

図8(A)は,基板1の底面図であり,図8(B)は,図8(A)のVIIIB−VIIIB線から見た断面図である。   8A is a bottom view of the substrate 1, and FIG. 8B is a cross-sectional view taken along the line VIIIB-VIIIB in FIG. 8A.

撮像素子20の周囲領域31のうち,ダム・テープ9に接する部分および電子部品8のそれぞれの周辺のみに樹脂11および10Aが塗布されている。図3(A)における樹脂10に比べると,電子部品8周辺に塗布した樹脂10Aの面積が格段に少なくなっている。   Resins 11 and 10A are applied only to the portion of the peripheral region 31 of the image sensor 20 that is in contact with the dam tape 9 and the periphery of the electronic component 8. Compared with the resin 10 in FIG. 3A, the area of the resin 10A applied around the electronic component 8 is significantly reduced.

図9は(A)は,基板1の底面図であり,図9(B)は,図9(A)のIXB−IXB線から見た断面図である。   9A is a bottom view of the substrate 1, and FIG. 9B is a cross-sectional view taken along line IXB-IXB in FIG. 9A.

樹脂10Aおよび11が塗布されると,図8の基板1とほぼ同じ形状の放熱板12が下方から貼り付けられている。   When the resins 10A and 11 are applied, a heat radiating plate 12 having substantially the same shape as the substrate 1 of FIG. 8 is attached from below.

図10(A)は,基板1の底面図であり,図10(B)は,図10(A)のXB−XB線から見た断面図である。   FIG. 10A is a bottom view of the substrate 1, and FIG. 10B is a cross-sectional view taken along line XB-XB in FIG.

基板1と放熱板12とで挟まれた撮像素子20の周囲領域31に樹脂13が塗布されている。撮像素子20の周りは,樹脂13および樹脂11によって囲まれる。   A resin 13 is applied to a peripheral region 31 of the imaging element 20 sandwiched between the substrate 1 and the heat radiating plate 12. The periphery of the image sensor 20 is surrounded by the resin 13 and the resin 11.

図11(A)は,基板1の底面図であり,図11(B)は,図11(A)のXIB−XIB線から見た断面図である。   11A is a bottom view of the substrate 1, and FIG. 11B is a cross-sectional view taken along the line XIB-XIB in FIG. 11A.

基板1と放熱板12との間に塗布された樹脂13,11および10が硬化した後,ダム・テープ9が取り除かれている。   After the resins 13, 11 and 10 applied between the substrate 1 and the heat sink 12 are cured, the dam tape 9 is removed.

図12は,放熱板12が取り除かれた基板1の底面図である。図7と比較し,回路部品8周辺の樹脂塗布面積が格段に少なくなっている。   FIG. 12 is a bottom view of the substrate 1 with the heat sink 12 removed. Compared with FIG. 7, the resin application area around the circuit component 8 is remarkably reduced.

本実施例では,樹脂で囲まれた空洞が無く,かつ回路部品8周辺に塗布した樹脂を最小面積に抑制している。これにより,モジュール外部の気圧変化による空洞の圧縮,膨張による前述の接触不良を防止すると共に,熱膨張差や樹脂の変形により放熱部材を介して電気的接合部へ加わる引っ張り等の外力による同様の接触不良も防止できる。   In this embodiment, there is no cavity surrounded by resin, and the resin applied around the circuit component 8 is suppressed to the minimum area. This prevents the above-mentioned poor contact due to the compression and expansion of the cavity due to the atmospheric pressure change outside the module, and the same due to external forces such as tension applied to the electrical joint through the heat dissipation member due to thermal expansion difference or resin deformation. Contact failure can also be prevented.

上述の樹脂10,11および13は,エポキシ樹脂,シリコーン樹脂を利用でき,たとえば,デュロメータ硬さでA20からD80程度となるものが好ましい。   As the above-mentioned resins 10, 11 and 13, an epoxy resin or a silicone resin can be used. For example, a resin whose durometer hardness is about A20 to D80 is preferable.

上述の実施例においては,基板1に撮像素子20と複数の回路部品8が実装されているが,撮像素子20以外の回路部品が実装されているものでもよい。また,複数の回路部品8が実装されているが,複数でなくともよい。また,放熱板12が撮像素子20の下面に貼り付けられる前に樹脂10および11が塗布され,放熱板12が撮像素子20の下面に貼り付けられた後に樹脂13が塗布されているが,撮像素子20の周囲領域31に充填される樹脂11および13と回路部品8の周囲領域32に充填される樹脂10とが接しなければ,塗布の順序は問わない。   In the above-described embodiment, the image pickup device 20 and the plurality of circuit components 8 are mounted on the substrate 1, but circuit components other than the image pickup device 20 may be mounted. Further, although the plurality of circuit components 8 are mounted, the number may not be plural. Also, the resins 10 and 11 are applied before the heat sink 12 is attached to the lower surface of the image sensor 20, and the resin 13 is applied after the heat sink 12 is attached to the lower surface of the image sensor 20. The order of application is not limited as long as the resins 11 and 13 filled in the peripheral region 31 of the element 20 and the resin 10 filled in the peripheral region 32 of the circuit component 8 do not contact each other.

1 基板
8 回路(第2の回路部品)
9 ダム・テープ(区分け部材)
10 防水樹脂(第2の樹脂)
11,13 防水樹脂(第1の樹脂)
12 放熱板(放熱部材)
20 撮像素子(第1の回路部品)
1 Substrate 8 Circuit (second circuit component)
9 Dam tape (partitioning material)
10 Waterproof resin (second resin)
11, 13 Waterproof resin (first resin)
12 Heat sink (heat dissipation member)
20 Image sensor (first circuit component)

Claims (11)

第1の回路部品と第2の回路部品とが同一面上に実装されている基板において,第1の回路部品と第2の回路部品との間に第1の回路部品の周囲領域と第2の回路部品の周囲領域とが接しないように分ける区分け部材を設け,
第1の回路部品の周囲領域に第1の樹脂を塗布し,
第2の回路部品の周囲領域に第2の樹脂を塗布し,
区分け部材を取り除く,
基板モジュールの製造方法。
In the substrate on which the first circuit component and the second circuit component are mounted on the same surface, the area around the first circuit component and the second region are between the first circuit component and the second circuit component. A dividing member is provided so that it does not touch the surrounding area of the circuit parts.
First resin is applied to the peripheral area of the first circuit component,
Apply the second resin to the area around the second circuit component,
Remove the sorting member,
A method for manufacturing a substrate module.
第1の樹脂および第2の樹脂は,硬化性樹脂であり,
第1の回路部品の周囲領域への第1の樹脂の塗布および第2の回路部品の周囲領域への第2の樹脂の塗布後に,第1の樹脂および第2の樹脂を硬化させ,
第1の樹脂および第2の樹脂の硬化後に区分け部材を取り除く,
請求項1に記載の基板モジュールの製造方法。
The first resin and the second resin are curable resins,
After the application of the first resin to the peripheral area of the first circuit component and the application of the second resin to the peripheral area of the second circuit component, the first resin and the second resin are cured,
Removing the separating member after the first resin and the second resin are cured;
The manufacturing method of the board | substrate module of Claim 1.
第2の回路部品は,複数の回路部品からなる部品群であり,それぞれの回路部品同士が接しないように,複数の回路部品それぞれの周囲に第2の樹脂を塗布する,
請求項1または2に記載の基板モジュールの製造方法。
The second circuit component is a group of components composed of a plurality of circuit components, and a second resin is applied around each of the plurality of circuit components so that the circuit components do not contact each other.
The manufacturing method of the board | substrate module of Claim 1 or 2.
第1の樹脂および第2の樹脂の硬度がA20からD80までのものである,
請求項1から3のうち,いずれか一項に記載の基板モジュールの製造方法。
The hardness of the first resin and the second resin is from A20 to D80,
The manufacturing method of the board | substrate module as described in any one of Claims 1-3.
区分け部材はダム・テープである,請求項1から4のうち,いずれか一項に記載の基板モジュールの製造方法。   The method of manufacturing a substrate module according to any one of claims 1 to 4, wherein the sorting member is a dam tape. 第1の回路部品および第2の回路部品において,基板に実装されている面と対向する面上に放熱部材を取り付ける,
請求項1から5のうち,いずれか一項に記載の基板モジュールの製造方法。
In the first circuit component and the second circuit component, a heat dissipating member is attached on the surface facing the surface mounted on the substrate.
The manufacturing method of the board | substrate module as described in any one of Claims 1-5.
第1の回路部品と第2の回路部品とが同一面上に実装されている基板,
第1の回路部品の周囲領域に塗布されている第1の樹脂,および
第1の樹脂と非接触となるように,第1の樹脂との間に空間が空けられて,第2の回路部品の周囲領域に塗布されている第2の樹脂,
を備えた基板モジュール。
A substrate on which the first circuit component and the second circuit component are mounted on the same surface;
The first circuit applied to the peripheral area of the first circuit component, and the second circuit component having a space between the first resin and the first resin so as not to contact the first circuit component. A second resin applied to the surrounding area of
Board module with.
第1の樹脂と第2の樹脂とが非接触となるように第1の樹脂と第2の樹脂との間に形成される空間は基板モジュールの外部とつながっている,
請求項7に記載の基板モジュール。
The space formed between the first resin and the second resin is connected to the outside of the substrate module so that the first resin and the second resin are not in contact with each other;
The board module according to claim 7.
第2の回路部品は,複数の回路部品からなる部品群であり,それぞれの回路部品同士が接しないように,複数の回路部品それぞれの周囲に第2の樹脂を塗布する,
請求項7または8に記載の基板モジュール。
The second circuit component is a group of components composed of a plurality of circuit components, and a second resin is applied around each of the plurality of circuit components so that the circuit components do not contact each other.
The board module according to claim 7 or 8.
第1の樹脂および第2の樹脂は硬度がA20からD80までのものである,
請求項7から9のうち,いずれか一項に記載の基板モジュール。
The first resin and the second resin have a hardness of A20 to D80.
The substrate module according to any one of claims 7 to 9.
第1の回路部品および第2の回路部品において,基板に実装されている面と対向する面上に取り付けられている放熱部材,
をさらに備えた請求項7から10のうち,いずれか一項に記載の基板モジュール。
In the first circuit component and the second circuit component, the heat dissipating member attached on the surface facing the surface mounted on the substrate,
The substrate module according to any one of claims 7 to 10, further comprising:
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JP6293391B1 (en) * 2016-05-19 2018-03-14 オリンパス株式会社 Imaging unit and endoscope
WO2019163175A1 (en) * 2018-02-20 2019-08-29 オリンパス株式会社 Image pickup unit and endoscope
US11863851B2 (en) 2018-02-20 2024-01-02 Olympus Corporation Imaging unit and endoscope

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