JPH088462Y2 - 液晶回路基板用検査装置 - Google Patents

液晶回路基板用検査装置

Info

Publication number
JPH088462Y2
JPH088462Y2 JP1309190U JP1309190U JPH088462Y2 JP H088462 Y2 JPH088462 Y2 JP H088462Y2 JP 1309190 U JP1309190 U JP 1309190U JP 1309190 U JP1309190 U JP 1309190U JP H088462 Y2 JPH088462 Y2 JP H088462Y2
Authority
JP
Japan
Prior art keywords
circuit board
liquid crystal
crystal circuit
moving table
mounting base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1309190U
Other languages
English (en)
Japanese (ja)
Other versions
JPH03106467U (enrdf_load_stackoverflow
Inventor
文雄 松本
公男 大橋
Original Assignee
株式会社小坂研究所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社小坂研究所 filed Critical 株式会社小坂研究所
Priority to JP1309190U priority Critical patent/JPH088462Y2/ja
Publication of JPH03106467U publication Critical patent/JPH03106467U/ja
Application granted granted Critical
Publication of JPH088462Y2 publication Critical patent/JPH088462Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Liquid Crystal (AREA)
  • Measuring Leads Or Probes (AREA)
JP1309190U 1990-02-15 1990-02-15 液晶回路基板用検査装置 Expired - Lifetime JPH088462Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1309190U JPH088462Y2 (ja) 1990-02-15 1990-02-15 液晶回路基板用検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1309190U JPH088462Y2 (ja) 1990-02-15 1990-02-15 液晶回路基板用検査装置

Publications (2)

Publication Number Publication Date
JPH03106467U JPH03106467U (enrdf_load_stackoverflow) 1991-11-01
JPH088462Y2 true JPH088462Y2 (ja) 1996-03-06

Family

ID=31516530

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1309190U Expired - Lifetime JPH088462Y2 (ja) 1990-02-15 1990-02-15 液晶回路基板用検査装置

Country Status (1)

Country Link
JP (1) JPH088462Y2 (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH03106467U (enrdf_load_stackoverflow) 1991-11-01

Similar Documents

Publication Publication Date Title
CN102095900B (zh) 检测系统
US6150833A (en) LCD panel power-up test fixture and method of using
JP3592831B2 (ja) プローブユニット及びその調節方法
EP1209473A2 (en) Unit with inspection probe blocks mounted thereon in parallel
JPH088462Y2 (ja) 液晶回路基板用検査装置
JP2846176B2 (ja) プリント基板検査方法および検査装置
TWI404935B (zh) 檢查裝置
KR101902966B1 (ko) 기판 고정장치
JPH0658978A (ja) 移動式プローバ機構
JP3711169B2 (ja) 表示パネル基板の検査装置
US7230416B2 (en) Inspecting apparatus for liquid crystal displays
KR20230111888A (ko) 평판 디스플레이 패널 검사용 프로브 유닛
JP2769372B2 (ja) Lcdプローブ装置
JP2000180807A (ja) 液晶基板の検査装置
JP2630352B2 (ja) 基板の検査装置
KR19990055293A (ko) 액정 패널의 패드와 점등 검사 장치간의 연결구조 및 이를 이용한 테스트 지그
JP3100228B2 (ja) 検査装置
KR100490056B1 (ko) 기판검사장치
JP3307166B2 (ja) 回路基板の検査装置
JPH0452690Y2 (enrdf_load_stackoverflow)
JPH05113460A (ja) 液晶デイスプレイ基板の検査装置
JP4794065B2 (ja) 被処理物の支持装置
JP3637150B2 (ja) 表示パネル基板の検査方法および装置
JPH0682539U (ja) マルチブロック液晶検査装置
KR19980018312U (ko) Tft lcd 패널 테스트 카메라

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term