JPH088462Y2 - LCD circuit board inspection device - Google Patents

LCD circuit board inspection device

Info

Publication number
JPH088462Y2
JPH088462Y2 JP1309190U JP1309190U JPH088462Y2 JP H088462 Y2 JPH088462 Y2 JP H088462Y2 JP 1309190 U JP1309190 U JP 1309190U JP 1309190 U JP1309190 U JP 1309190U JP H088462 Y2 JPH088462 Y2 JP H088462Y2
Authority
JP
Japan
Prior art keywords
circuit board
liquid crystal
crystal circuit
moving table
mounting base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1309190U
Other languages
Japanese (ja)
Other versions
JPH03106467U (en
Inventor
文雄 松本
公男 大橋
Original Assignee
株式会社小坂研究所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社小坂研究所 filed Critical 株式会社小坂研究所
Priority to JP1309190U priority Critical patent/JPH088462Y2/en
Publication of JPH03106467U publication Critical patent/JPH03106467U/ja
Application granted granted Critical
Publication of JPH088462Y2 publication Critical patent/JPH088462Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【考案の詳細な説明】 (産業上の利用分野) この考案に係る液晶回路基板用検査装置は、各種表示
装置や小型テレビ画面に使用される液晶への通電用の回
路基板の導通検査を行なう場合に利用する。
DETAILED DESCRIPTION OF THE INVENTION (Industrial field of application) A liquid crystal circuit board inspection device according to the present invention conducts a continuity test of a circuit board for energizing liquid crystal used in various display devices and small television screens. Use in case.

(従来の技術) 各種表示装置は小型テレビ画面に使用される液晶は、
多数の液晶への通電を適当に断接する事で、表示変更等
を行なうが、この様な表示等の変更が確実に行なわれる
為には、上記多数の液晶に通電する為の回路基板が正し
く導通している(断線していない)事と、隣接するパタ
ーン同士が短絡していない事とが必要である。
(Prior Art) The liquid crystal used in various display devices for small TV screens is
The display can be changed by properly connecting and disconnecting the power to a large number of liquid crystals. To ensure that such a display can be changed, make sure that the circuit board for powering the large number of liquid crystals is correct. It is necessary that they are conducted (not broken) and that adjacent patterns are not short-circuited.

この為従来から、組み上がった液晶回路基板を検査装
置に送り込んで検査する事により、不良品(断線してい
るものや短絡しているもの)を見付け出す様にしてい
た。
Therefore, conventionally, a defective product (broken or short-circuited) is found by sending the assembled liquid crystal circuit board to an inspection device and inspecting it.

検査装置による検査は、1対のプローブを液晶回路基
板の端子と液晶とに接触させ、両プローブの間に電圧を
加える事で行ない、導通検査を行なう場合には、両プロ
ーブの間に規定以上の電流が流れた場合には合格(断線
や接触不良がない)とし、反対に規定以上の電流が流れ
ない場合には不合格(断線或は接触不良がある)とす
る。又、短絡検査を行なう場合には、上記両プローブ同
士の間に電流が流れない場合には合格とし、電流が流れ
た場合には不合格とする。
The inspection by the inspection device is carried out by bringing a pair of probes into contact with the terminals of the liquid crystal circuit board and the liquid crystal, and applying a voltage between both probes. If there is no current, it is considered as acceptable (no disconnection or contact failure), and if no current exceeds the specified value, it is rejected (disconnection or contact failure). Further, in the case of performing a short-circuit inspection, the test is passed when no current flows between the two probes, and is rejected when a current flows.

(考案が解決しようとする課題) ところが、実際の液晶回路基板は、第3図に示す様
に、コネクタ等に接続する為の引き出しパターン7、7
のピッチPと、回路パターン8、8のピッチpとが異な
る為、検査作業を能率良く行なう事が出来なかった。
(Problems to be solved by the invention) However, as shown in FIG. 3, the actual liquid crystal circuit board has lead patterns 7 and 7 for connecting to a connector or the like.
Since the pitch P of No. 1 and the pitch p of the circuit patterns 8, 8 are different, the inspection work could not be performed efficiently.

即ち、従来の検査装置の場合、前記1対のプローブ同
士の相対的位置を固定したまま、両プローブと被検査物
である液晶回路基板との相対的位置を変えるのみであっ
た為、一方のプローブを何れかの引き出しパターン7に
当接させても、他方のプローブを何れの回路パターン
8、8にも当接させられない場合が生じる。
That is, in the case of the conventional inspection apparatus, the relative positions of both the probes and the liquid crystal circuit board that is the object to be inspected are only changed while the relative positions of the pair of probes are fixed. Even if the probe is brought into contact with any of the extraction patterns 7, the other probe may not be brought into contact with any of the circuit patterns 8 and 8.

この為従来は、各パターン7、8を形成する為の原版
を変更する事により、検査の際に引き出しパターン7、
7のピッチPと回路パターン8、8のピッチpとを一致
させていたが、実装の際にコネクタ部を変更する等によ
りコストが嵩む原因となる為、好ましくない。
For this reason, conventionally, by changing the original plate for forming the patterns 7 and 8, the drawing pattern 7 and
The pitch P of 7 and the pitch p of the circuit patterns 8 and 8 are made to coincide with each other, but this is not preferable because it causes an increase in cost due to a change in the connector portion at the time of mounting.

本考案の液晶回路基板用検査装置は、上述の様な不都
合を解消するものである。
The liquid crystal circuit board inspection apparatus of the present invention eliminates the above-mentioned inconvenience.

(課題を解決する為の手段) 本考案の液晶回路基板用検査装置は、被検査物である
液晶回路基板を載置して水平方向に移動する移動テーブ
ルと、この移動テーブルの上方に、移動テーブルの移動
方向と直角方向に亙る移動自在に設けられた第一の取付
台と、この第一の取付台に支持され、上記液晶回路基板
の上面に当接自在とされた固定側プローブと、上記移動
テーブルの上方に、上記第一の取付台と同方向の移動自
在に設けられた第二の取付台の上面に、上記移動テーブ
ルの移動方向と同方向に亙る移動自在に支持され、上記
液晶回路基板の上面に当接自在とされた差動側プローブ
とから構成されている。
(Means for Solving the Problems) A liquid crystal circuit board inspecting device of the present invention includes a moving table on which a liquid crystal circuit board, which is an object to be inspected, is placed and which moves in a horizontal direction, and a moving table which moves above the moving table. A first mounting base that is movably provided in a direction perpendicular to the moving direction of the table, and a fixed-side probe that is supported by the first mounting base and is abuttable on the upper surface of the liquid crystal circuit board; Above the moving table, movably supported in the same direction as the moving table, on the upper surface of a second mounting table provided movably in the same direction as the first mounting table, The differential-side probe is configured to come into contact with the upper surface of the liquid crystal circuit board.

(作用) 上述の様に構成される、本考案の液晶回路基板用検査
装置の場合、第二の取付台に対して差動プローブを移動
させる事により、固定側プローブと差動側プローブとの
相対位置を、移動テーブルの移動方向に亙って調節自在
である為、液晶回路基板の引き出しパターンのピッチと
回路パターンのピッチとを異ならせたまま、この液晶回
路基板の検査を行なう事が出来る。
(Operation) In the case of the liquid crystal circuit board inspection device of the present invention configured as described above, the fixed probe and the differential probe are moved by moving the differential probe with respect to the second mounting base. Since the relative position can be adjusted over the moving direction of the moving table, the liquid crystal circuit board can be inspected while the pitch of the drawing pattern of the liquid crystal circuit board and the pitch of the circuit pattern are different. .

(実施例) 次に、図示の実施例を説明しつつ、本考案を更に詳し
く説明する。
(Embodiment) Next, the present invention will be described in more detail with reference to the illustrated embodiment.

第1〜2図は本考案の液晶回路基板用検査装置の実施
例を示しており、第1図は部分切断斜視図、第2図は全
体構成を示す正面図である。
1 and 2 show an embodiment of the liquid crystal circuit board inspecting device of the present invention. FIG. 1 is a partially cutaway perspective view, and FIG. 2 is a front view showing the entire structure.

基台1の上面には互いに平行な1対のX方向案内レー
ル2、2が設けられており、このX方向案内レール2、
2に沿って、水平方向に移動自在な移動テーブル3の上
面に、被検査物である液晶回路基板4を載置自在として
いる。
A pair of X-direction guide rails 2, 2 parallel to each other are provided on the upper surface of the base 1. The X-direction guide rails 2,
A liquid crystal circuit board 4, which is an object to be inspected, can be placed on the upper surface of a movable table 3 that is horizontally movable along the line 2.

この移動テーブル3の上方には、上記X方向案内レー
ル2、2と直角方向に亙って、1対のY方向案内レール
5、5が設けられており、このY方向案内レール5、5
に沿って、水平方向に移動自在な第一、第二の取付台6
a、6bを設けている。
A pair of Y-direction guide rails 5 and 5 are provided above the moving table 3 in a direction perpendicular to the X-direction guide rails 2 and 2. The Y-direction guide rails 5 and 5 are provided.
1st and 2nd mounts 6 that can be moved horizontally along
a and 6b are provided.

各取付台6a、6bの側縁部には切欠き9を形成し、この
切欠き9と、上記移動テーブル3の上面に載置された液
晶回路基板4の上面とを整合自在としている。
A notch 9 is formed in the side edge of each of the mounts 6a and 6b, and the notch 9 and the upper surface of the liquid crystal circuit board 4 placed on the upper surface of the moving table 3 can be aligned with each other.

そして、上記第一、第二の取付台6a、6bの内、中央の
第一の取付台6a(第2図)の上面に支持した固定側プロ
ーブ10、10を、上記切欠き9を通じて取付台6aの下面か
ら垂下し、上記液晶回路基板4の上面に当接自在として
いる。
Then, of the first and second mounting bases 6a, 6b, the fixed side probes 10, 10 supported on the upper surface of the central first mounting base 6a (Fig. 2) are mounted through the cutouts 9. It is hung from the lower surface of 6a and can freely come into contact with the upper surface of the liquid crystal circuit board 4.

一方、上記第一の取付台6aを挟んで設けた、1対の第
二の取付台6b、6bの上面に固定した支持板11の側面に
は、前記X方向案内レール2、2と平行な差動案内レー
ル12を固定しており、この差動案内レール12に差動移動
台13を、移動自在に支持している。そして、この差動移
動台13に固定したプローブホルダ14の下面に、差動側プ
ローブ15を支持している。この差動側プローブ15も、上
記固定側プローブ10と同様に、第二の取付台6bに形成し
た切欠き9を通じて第二の取付台6bの下面から垂下し、
上記液晶回路基板4の上面に当接自在としている。
On the other hand, the side surface of the support plate 11 fixed to the upper surfaces of the pair of second mounting bases 6b and 6b sandwiching the first mounting base 6a is parallel to the X-direction guide rails 2 and 2. The differential guide rail 12 is fixed, and a differential moving base 13 is movably supported on the differential guide rail 12. The differential side probe 15 is supported on the lower surface of the probe holder 14 fixed to the differential moving table 13. Similarly to the fixed side probe 10, the differential side probe 15 also hangs down from the lower surface of the second mount 6b through the notch 9 formed in the second mount 6b.
The upper surface of the liquid crystal circuit board 4 can be freely contacted.

上記差動移動台13と前記移動テーブル3及び第一、第
二の取付台6a、6bとは、ボール螺子機構等、公知の送り
機構によって、X方向案内レール2、2、Y方向案内レ
ール5、5、或いは差動案内レール12に沿って移動自在
としている。又、第一の取付台6aに設けた固定側プロー
ブ10、10も必要に応じて、第二の取付台6bに対して、手
動によって第2図の表裏方向に移動自在とする。
The differential moving base 13, the moving table 3, and the first and second mounting bases 6a and 6b are connected to the X-direction guide rails 2 and 2 and the Y-direction guide rail 5 by a known feed mechanism such as a ball screw mechanism. 5, or movable along the differential guide rail 12. The fixed-side probes 10, 10 provided on the first mounting base 6a are also manually movable in the front-back direction of FIG. 2 with respect to the second mounting base 6b, if necessary.

尚、第一、第二の取付台6a、6bの送り機構は、互いに
独立したものとし、隣り合う第一、第二の取付台6a、6b
の間隔を調節自在とする事で、幅寸法(第2図の左右方
向寸法)の異なる液晶回路基板の検査を行なえる様にし
ている。但し、幅寸法の異なる液晶回路基板を検査する
必要のない場合は、第一、第二の取付台6a、6bを、同期
して移動自在としたり、更には第一、第二の移動台6a、
6bを一体として、移動テーブル3の上方に固定しても良
い。
The feed mechanisms of the first and second mounting bases 6a and 6b are independent of each other, and the adjoining first and second mounting bases 6a and 6b are adjacent to each other.
By making the distance between the two adjustable, it is possible to inspect liquid crystal circuit boards having different widths (horizontal dimension in FIG. 2). However, when it is not necessary to inspect liquid crystal circuit boards having different width dimensions, the first and second mounting bases 6a and 6b can be moved synchronously, and further, the first and second moving bases 6a can be moved. ,
The 6b may be integrated and fixed above the moving table 3.

上述の様に構成される、本考案の液晶回路基板用検査
装置の場合、第二の取付台6bに対して各差動側プローブ
15、15を移動させる事により、固定側プローブ10、10と
差動側プローブ15、15との相対位置を、移動テーブル3
の移動方向(第2図の表裏方向)に亙って調節自在であ
る為、液晶回路基板4の引き出しパターン7、7のピッ
チPと回路パターン8、8のピッチpとを異ならせたま
ま、この液晶回路基板4の検査を行なう事が出来る。
In the case of the liquid crystal circuit board inspection device of the present invention configured as described above, each differential side probe is attached to the second mount 6b.
By moving 15 and 15, the relative positions of the fixed side probes 10 and 10 and the differential side probes 15 and 15 can be changed.
Since it can be adjusted in the moving direction (the front and back direction in FIG. 2), the pitch P of the drawing patterns 7 and 7 of the liquid crystal circuit board 4 and the pitch p of the circuit patterns 8 and 8 are different, The liquid crystal circuit board 4 can be inspected.

即ち、X方向案内レール2、2に沿って移動テーブル
3を、回路パターン8、8のピッチpずつ間欠的に移動
させる事により、固定側プローブ10、10を、液晶回路基
板4の回路パターン8、8に、順番に当接させる。
That is, by intermittently moving the moving table 3 along the X-direction guide rails 2 and 2 by the pitch p of the circuit patterns 8 and 8, the fixed side probes 10 and 10 are moved to the circuit pattern 8 of the liquid crystal circuit board 4. , 8 are brought into contact with each other in order.

これと同時に、第二の取付台6bに対して差動移動台13
を、移動テーブル3の移動方向と同じ方向に、少しずつ
(P−p分ずつ)移動させ、差動側プローブ15、15を、
液晶回路基板4の引き出しパターン7、7に当接させ
る。
At the same time, the differential transfer base 13
Is moved in the same direction as the moving table 3 little by little (by P-p), and the differential side probes 15 and 15 are moved,
The liquid crystal circuit board 4 is brought into contact with the extraction patterns 7, 7.

図示の実施例の場合、固定側プローブ10、10と差動側
プローブ15、15とを、2対ずつ設けている為、液晶回路
基板4の中央に設けた回路パターン8、8と、両側に設
けた引出パターン7、7との導通検査を一挙に行なう事
が出来る。
In the illustrated embodiment, two pairs of fixed-side probes 10 and 10 and differential-side probes 15 and 15 are provided. Therefore, the circuit patterns 8 and 8 provided in the center of the liquid crystal circuit board 4 and both sides thereof are provided. The continuity inspection with the provided extraction patterns 7 and 7 can be performed all at once.

(考案の効果) 本考案の液晶回路基板用検査装置は、以上に述べた通
り構成され作用する為、引き出しパターンのピッチと回
路パターンのピッチとを異ならせたままの状態で、液晶
回路基板の検査を能率良く行なう事が出来る為、液晶回
路基板のコスト低減を図れる。
(Effects of the Invention) Since the liquid crystal circuit board inspection apparatus of the present invention is configured and operates as described above, the liquid crystal circuit board inspection apparatus can be used in a state in which the pitch of the extraction pattern and the pitch of the circuit pattern remain different. Since the inspection can be performed efficiently, the cost of the liquid crystal circuit board can be reduced.

【図面の簡単な説明】[Brief description of drawings]

第1〜2図は本考案の液晶回路基板用検査装置の実施例
を示しており、第1図は部分切断斜視図、第2図は全体
構成を示す正面図、第3図は液晶回路基板の1例を示す
拡大平面図である。 1:基台、2:X方向案内レール、3:移動テーブル、4:液晶
回路基板、5:Y方向案内レール、6a:第一の取付台、6b:
第二の取付台、7:引き出しパターン、8:回路パターン、
9:切欠き、10:固定側プローブ、11:支持板、12:差動案
内レール、13:差動移動台、14:プローブホルダ、15:差
動側プローブ。
1 and 2 show an embodiment of the liquid crystal circuit board inspecting device of the present invention. FIG. 1 is a partially cutaway perspective view, FIG. 2 is a front view showing the whole structure, and FIG. 3 is a liquid crystal circuit board. 3 is an enlarged plan view showing an example of FIG. 1: base, 2: X direction guide rail, 3: moving table, 4: liquid crystal circuit board, 5: Y direction guide rail, 6a: first mounting base, 6b:
2nd mount, 7: drawing pattern, 8: circuit pattern,
9: Notch, 10: Fixed side probe, 11: Support plate, 12: Differential guide rail, 13: Differential moving base, 14: Probe holder, 15: Differential side probe.

Claims (3)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】被検査物である液晶回路基板を載置して水
平方向に移動する移動テーブルと、この移動テーブルの
上方に、移動テーブルの移動方向と直角方向に亙る移動
自在に設けられた第一の取付台と、この第一の取付台に
支持され、上記液晶回路基板の上面に当接自在とされた
固定側プローブと、上記移動テーブルの上方に、上記第
一の取付台と同方向の移動自在に設けられた第二の取付
台の上面に、上記移動テーブルの移動方向と同方向に亙
る移動自在に支持され、上記液晶回路基板の上面に当接
自在とされた差動側プローブとから成る、液晶回路基板
用検査装置。
1. A moving table on which a liquid crystal circuit board, which is an object to be inspected, is placed and which moves in a horizontal direction, and a movable table which is provided above the moving table and movable in a direction perpendicular to the moving direction of the moving table. A first mounting base, a fixed-side probe supported by the first mounting base and capable of abutting contact with the upper surface of the liquid crystal circuit board, and the same as the first mounting base above the moving table. Differential side movably supported in the same direction as the moving direction of the moving table on the upper surface of the second mounting base movably provided in the direction, and abuttable on the upper surface of the liquid crystal circuit board. Inspection device for liquid crystal circuit board consisting of probe.
【請求項2】第一の取付台と第二の取付台とを一体とし
た、請求項1に記載の液晶回路基板用検査装置。
2. The liquid crystal circuit board inspection device according to claim 1, wherein the first mounting base and the second mounting base are integrated.
【請求項3】一体とされた第一、第二の取付台を、移動
テーブルの上方に固定した、請求項2に記載の液晶回路
基板用検査装置。
3. The liquid crystal circuit board inspection device according to claim 2, wherein the integrated first and second mounts are fixed above the moving table.
JP1309190U 1990-02-15 1990-02-15 LCD circuit board inspection device Expired - Lifetime JPH088462Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1309190U JPH088462Y2 (en) 1990-02-15 1990-02-15 LCD circuit board inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1309190U JPH088462Y2 (en) 1990-02-15 1990-02-15 LCD circuit board inspection device

Publications (2)

Publication Number Publication Date
JPH03106467U JPH03106467U (en) 1991-11-01
JPH088462Y2 true JPH088462Y2 (en) 1996-03-06

Family

ID=31516530

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1309190U Expired - Lifetime JPH088462Y2 (en) 1990-02-15 1990-02-15 LCD circuit board inspection device

Country Status (1)

Country Link
JP (1) JPH088462Y2 (en)

Also Published As

Publication number Publication date
JPH03106467U (en) 1991-11-01

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