JPH086259Y2 - 直線位置検出装置 - Google Patents
直線位置検出装置Info
- Publication number
- JPH086259Y2 JPH086259Y2 JP1990113955U JP11395590U JPH086259Y2 JP H086259 Y2 JPH086259 Y2 JP H086259Y2 JP 1990113955 U JP1990113955 U JP 1990113955U JP 11395590 U JP11395590 U JP 11395590U JP H086259 Y2 JPH086259 Y2 JP H086259Y2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- scale
- reference point
- output
- magnetic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000001514 detection method Methods 0.000 claims description 77
- 238000012790 confirmation Methods 0.000 claims description 34
- 230000008859 change Effects 0.000 claims description 14
- 238000007493 shaping process Methods 0.000 description 34
- 238000010276 construction Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 238000011000 absolute method Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 230000003247 decreasing effect Effects 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000010791 quenching Methods 0.000 description 1
- 230000000171 quenching effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 238000005496 tempering Methods 0.000 description 1
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990113955U JPH086259Y2 (ja) | 1990-10-30 | 1990-10-30 | 直線位置検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990113955U JPH086259Y2 (ja) | 1990-10-30 | 1990-10-30 | 直線位置検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0471114U JPH0471114U (enrdf_load_stackoverflow) | 1992-06-24 |
| JPH086259Y2 true JPH086259Y2 (ja) | 1996-02-21 |
Family
ID=31861590
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1990113955U Expired - Lifetime JPH086259Y2 (ja) | 1990-10-30 | 1990-10-30 | 直線位置検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH086259Y2 (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP4417942A1 (de) * | 2023-02-17 | 2024-08-21 | Sick Ag | Verfahren und vorrichtung zur kalibrierung eines geräts zur positionsmessung sowie gerät zur positionsmessung |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5461311A (en) * | 1992-12-24 | 1995-10-24 | Kayaba Kogyo Kabushiki Kaisha | Rod axial position detector including plural scales wherein nonmagnetized portions have differing spacing and differing depths and means for calculating the absolute position are provided |
| JP4702509B2 (ja) * | 2001-07-23 | 2011-06-15 | 株式会社安川電機 | 絶対位置検出エンコーダおよびその原点検出方法 |
| US6683543B1 (en) * | 2003-01-30 | 2004-01-27 | Agilent Technologies, Inc. | Absolute encoder based on an incremental encoder |
| JP4628815B2 (ja) * | 2005-02-18 | 2011-02-09 | 株式会社小松製作所 | シリンダの位置計測装置 |
| US7333913B2 (en) * | 2005-06-27 | 2008-02-19 | General Electric Company | Clearance measurement system and method of operation |
| DE102006010780A1 (de) * | 2006-03-08 | 2007-09-13 | Liebherr-France Sas | Positionsmeßsystem für Hydraulikzylinder |
| JP5550213B2 (ja) * | 2008-03-04 | 2014-07-16 | ハイデンハイン株式会社 | 光学式アブソリュートエンコーダ |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3334398C1 (de) * | 1983-09-23 | 1984-11-22 | Dr. Johannes Heidenhain Gmbh, 8225 Traunreut | Messeinrichtung |
| JPS60187802A (ja) * | 1984-03-07 | 1985-09-25 | Sumitomo Electric Ind Ltd | 角度検出回路 |
| JPS6367818U (enrdf_load_stackoverflow) * | 1986-10-20 | 1988-05-07 | ||
| JPS6474411A (en) * | 1987-09-16 | 1989-03-20 | Yamaha Corp | Position detector |
| JPH0612267B2 (ja) * | 1988-03-18 | 1994-02-16 | 富士電機株式会社 | パルスエンコーダのパルス読み込み回路 |
-
1990
- 1990-10-30 JP JP1990113955U patent/JPH086259Y2/ja not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP4417942A1 (de) * | 2023-02-17 | 2024-08-21 | Sick Ag | Verfahren und vorrichtung zur kalibrierung eines geräts zur positionsmessung sowie gerät zur positionsmessung |
| DE102023104006A1 (de) * | 2023-02-17 | 2024-08-22 | Sick Ag | Verfahren und Vorrichtung zur Kalibrierung eines Geräts zur Positionsmessung sowie Gerät zur Positionsmessung |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0471114U (enrdf_load_stackoverflow) | 1992-06-24 |
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