JPH084605Y2 - 蛍光ｘ線分析装置のフィルタ交換装置 - Google Patents

蛍光ｘ線分析装置のフィルタ交換装置

Info

Publication number
JPH084605Y2
JPH084605Y2 JP931691U JP931691U JPH084605Y2 JP H084605 Y2 JPH084605 Y2 JP H084605Y2 JP 931691 U JP931691 U JP 931691U JP 931691 U JP931691 U JP 931691U JP H084605 Y2 JPH084605 Y2 JP H084605Y2
Authority
JP
Japan
Prior art keywords
filter substrate
filter
ray
sample
ray tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP931691U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0499062U (enrdf_load_stackoverflow
Inventor
栄司 山田
四郎 桧垣
Original Assignee
理学電機工業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 理学電機工業株式会社 filed Critical 理学電機工業株式会社
Priority to JP931691U priority Critical patent/JPH084605Y2/ja
Publication of JPH0499062U publication Critical patent/JPH0499062U/ja
Application granted granted Critical
Publication of JPH084605Y2 publication Critical patent/JPH084605Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP931691U 1991-01-30 1991-01-30 蛍光ｘ線分析装置のフィルタ交換装置 Expired - Lifetime JPH084605Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP931691U JPH084605Y2 (ja) 1991-01-30 1991-01-30 蛍光ｘ線分析装置のフィルタ交換装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP931691U JPH084605Y2 (ja) 1991-01-30 1991-01-30 蛍光ｘ線分析装置のフィルタ交換装置

Publications (2)

Publication Number Publication Date
JPH0499062U JPH0499062U (enrdf_load_stackoverflow) 1992-08-27
JPH084605Y2 true JPH084605Y2 (ja) 1996-02-07

Family

ID=31741921

Family Applications (1)

Application Number Title Priority Date Filing Date
JP931691U Expired - Lifetime JPH084605Y2 (ja) 1991-01-30 1991-01-30 蛍光ｘ線分析装置のフィルタ交換装置

Country Status (1)

Country Link
JP (1) JPH084605Y2 (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030010004A (ko) * 2001-07-25 2003-02-05 현대자동차주식회사 차콜캐니스터용 에어필터장치
US8915234B2 (en) 2010-10-25 2014-12-23 Briggs & Stratton Corporation Fuel cap

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030010004A (ko) * 2001-07-25 2003-02-05 현대자동차주식회사 차콜캐니스터용 에어필터장치
US8915234B2 (en) 2010-10-25 2014-12-23 Briggs & Stratton Corporation Fuel cap

Also Published As

Publication number Publication date
JPH0499062U (enrdf_load_stackoverflow) 1992-08-27

Similar Documents

Publication Publication Date Title
US5198680A (en) High precision single focus collimator and method for manufacturing high precision single focus collimator
JP3706110B2 (ja) Ｘ線分析装置及びｘ線分析方法
DE60031926T2 (de) Gasanalysator
US9322792B2 (en) X-ray diffraction apparatus and method of measuring X-ray diffraction
JPH084605Y2 (ja) 蛍光ｘ線分析装置のフィルタ交換装置
JP2000504422A (ja) ２つのコリメータマスクを有するｘ線分析装置
JP3703125B2 (ja) Ｘ線装置及びｘ線測定方法
JP2002148220A (ja) Ｘ線回折装置及びｘ線調整方法
JPS6311640Y2 (enrdf_load_stackoverflow)
JP2697154B2 (ja) 原子吸光分光光度計
CN218331992U (zh) 准直口尺寸调节装置及准直器
EP0282029B1 (de) Einrichtung zur Messung der aus dem Halbraum oder Raum kommenden elektromagnetischen Strahlung
JP2001133420A (ja) 全反射蛍光ｘ線分析方法および装置
JP2584946Y2 (ja) 蛍光ｘ線分析装置
JPH0738843Y2 (ja) エネルギー分散型蛍光ｘ線分析装置
JP3569038B2 (ja) Ｘ線ｃｔ装置のスキャナー構造
JP3553362B2 (ja) Ｘ線分析装置
JP2658127B2 (ja) 薄層のｘ線分光分析方法
JPH06235706A (ja) 全反射蛍光ｘ線分析装置
JPH0448560Y2 (enrdf_load_stackoverflow)
JPH0432603Y2 (enrdf_load_stackoverflow)
JP2662524B2 (ja) Ｘ線分析における試料の方位の判定方法および装置
Berry et al. X-Ray Radiation Analyser
JP2001349851A (ja) 蛍光ｘ線分析装置
JPH04370750A (ja) 蛍光ｘ線分析装置の視野制限装置