JPH08318228A - Substrate cleaning method and rotary type substrate cleaning device used therefor - Google Patents

Substrate cleaning method and rotary type substrate cleaning device used therefor

Info

Publication number
JPH08318228A
JPH08318228A JP15216295A JP15216295A JPH08318228A JP H08318228 A JPH08318228 A JP H08318228A JP 15216295 A JP15216295 A JP 15216295A JP 15216295 A JP15216295 A JP 15216295A JP H08318228 A JPH08318228 A JP H08318228A
Authority
JP
Japan
Prior art keywords
cleaning
substrate
cleaning tool
tool
peripheral edge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15216295A
Other languages
Japanese (ja)
Other versions
JP3352565B2 (en
Inventor
Joichi Nishimura
讓一 西村
Tadashi Sasaki
忠司 佐々木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP15216295A priority Critical patent/JP3352565B2/en
Publication of JPH08318228A publication Critical patent/JPH08318228A/en
Application granted granted Critical
Publication of JP3352565B2 publication Critical patent/JP3352565B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Abstract

PURPOSE: To increase cleaning treatment efficiency by rapidly returning a cleaning tool from the peripheral edge part to the center part of rotation on a substrate. CONSTITUTION: In the case of moving a cleaning tool 12 from the stand-by position apart from the upper part of a substrate W to the cleaning position of the center part of rotation of the substrate W and in the case of returning the cleaning tool 12 from the cleaning position of the peripheral edge part of the substrate W to the stand-by position, the cleaning tool 12 is fully raised and lowered so as to exceed a cup 5. In a cleaning process, in the case of returning the cleaning tool 12 from the outer peripheral edge part of the substrate W to the central part of rotation of the substrate, the cleaning tool 12 is raised to such a position as it is not acted on the substrate W. The cleaning tool 12 is raised and lowered at a small stroke of this position and the position acting on the substrate W.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体ウエハ、フォト
マスク用のガラス基板、液晶表示装置用のガラス基板、
光ディスク用の基板等の基板に、純水などの洗浄液を供
給して洗浄処理するために、基板保持手段によって鉛直
方向の軸芯周りで回転可能に保持された基板の上方から
外れた待機位置から基板の回転中心箇所まで洗浄具を移
動させるとともに基板の回転中心箇所で洗浄具を下降す
る洗浄開始工程と、洗浄具を基板に作用させるとともに
基板の外周縁に移動させ、そこから洗浄具を基板に作用
させない位置まで上昇させ、基板の回転中心箇所まで洗
浄具を移動させる洗浄工程と、その洗浄工程を複数回繰
り返した後に、基板の外周縁箇所で洗浄具を上昇させて
から待機位置に戻す洗浄終了工程とから成る基板洗浄方
法およびそれに使用する回転式基板洗浄装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor wafer, a glass substrate for a photomask, a glass substrate for a liquid crystal display device,
In order to supply a cleaning liquid such as pure water to a substrate such as a substrate for an optical disc to perform a cleaning process, a substrate holding unit is rotatably held around a vertical axis from a standby position deviated from above the substrate. The cleaning start step of moving the cleaning tool to the center of rotation of the substrate and lowering the cleaning tool at the center of rotation of the substrate, and causing the cleaning tool to act on the substrate and move it to the outer peripheral edge of the substrate, from which the cleaning tool is moved to the substrate. After repeating the cleaning process that moves the cleaning tool up to the position where it does not affect the substrate to the rotation center position of the substrate and the cleaning process multiple times, raise the cleaning tool at the peripheral edge position of the substrate and then return to the standby position. The present invention relates to a substrate cleaning method including a cleaning end step and a rotary substrate cleaning apparatus used therefor.

【0002】[0002]

【従来の技術】基板を回転させながら、その表面を洗浄
具で洗浄する場合、従来一般に、例えば、実開平1−1
07129号公報に開示されているように、エアシリン
ダによって、洗浄具(洗浄具)を洗浄液の飛散を防止す
るカップの外に位置する待機位置から上昇させ、そこか
ら基板の回転中心箇所の上方まで移動させてから下降
し、基板の外周縁まで基板表面に沿わせて移動させ、そ
の移動時に、基板を鉛直方向の軸芯周りで回転させなが
ら、その基板表面に洗浄液を供給し、基板表面に付着し
たパーティクルやゴミを剥離させるとともに、その剥離
したパーティクルやゴミなどの洗浄除去物を洗浄液とと
もに基板回転による遠心力を利用しながら基板の外方へ
流出させるようにしている。また、洗浄終了後には、洗
浄具を上昇させてから待機位置の上方まで変位させ、し
かる後に、待機位置に下降させるように構成している。
2. Description of the Related Art When cleaning a surface of a substrate with a cleaning tool while rotating the substrate, generally, for example, an actual flat plate 1-1 is used.
As disclosed in Japanese Patent Publication No. 07129, an air cylinder raises a cleaning tool (cleaning tool) from a standby position outside a cup that prevents scattering of cleaning liquid, and from there to a position above the center of rotation of the substrate. After moving, it descends and moves along the substrate surface to the outer peripheral edge of the substrate, and at the time of moving, while supplying the cleaning liquid to the substrate surface while rotating the substrate around the vertical axis, The adhered particles and dust are peeled off, and the cleaned and removed substances such as the peeled particles and dust are made to flow out of the substrate together with the cleaning liquid by utilizing the centrifugal force generated by the rotation of the substrate. Further, after the cleaning is completed, the cleaning tool is lifted and then displaced to a position above the standby position, and thereafter, lowered to the standby position.

【0003】[0003]

【発明が解決しようとする課題】ところで、従来では、
洗浄具を基板の外周縁に移動した後に、その洗浄具を基
板に作用しない位置まで上昇させ、しかる後に、基板の
回転中心箇所まで戻してから下降させ、基板の回転中心
箇所から基板の外周縁まで洗浄具を2〜4回繰り返して
移動させることにより洗浄するようにしている。
By the way, conventionally,
After moving the cleaning tool to the outer peripheral edge of the substrate, raise the cleaning tool to a position where it does not act on the substrate, and then return it to the center of rotation of the substrate and then lower it until the outer peripheral edge of the substrate from the center of rotation of the substrate. The cleaning tool is repeatedly moved 2 to 4 times for cleaning.

【0004】しかしながら、従来では、洗浄具を基板上
で外周縁箇所から回転中心箇所に戻すために昇降させる
のに、基板を待機位置と洗浄位置とにわたって移動する
ときに昇降するエアシリンダを用いるようにしている。
このため、カップを越える必要が無いにもかかわらず、
洗浄具の昇降ストロークが大きく、洗浄具を基板上で外
周縁箇所から回転中心箇所に戻すために時間を要し、洗
浄処理効率が低下する欠点があった。
However, conventionally, an air cylinder that moves up and down when the substrate is moved between the standby position and the cleaning position is used to lift and lower the cleaning tool from the peripheral edge position to the rotation center position on the substrate. I have to.
For this reason, despite not having to cross the cup,
There is a drawback that the lifting stroke of the cleaning tool is large, it takes time to return the cleaning tool from the outer peripheral edge position to the rotation center position on the substrate, and the cleaning processing efficiency decreases.

【0005】本発明は、このような事情に鑑みてなされ
たものであって、請求項1に係る発明の基板洗浄方法
は、洗浄具を基板上で外周縁箇所から回転中心箇所に迅
速に戻すことにより洗浄処理効率を向上できるようにす
ることを目的とし、また、請求項2に係る発明の回転式
基板洗浄装置は、請求項1に係る発明の基板洗浄方法を
実施する上で有効な装置を提供できるようにすることを
目的とする。
The present invention has been made in view of such circumstances, and the substrate cleaning method according to the first aspect of the present invention quickly returns the cleaning tool from the outer peripheral edge portion to the rotation center portion on the substrate. In order to improve the cleaning processing efficiency, the rotary substrate cleaning apparatus of the invention according to claim 2 is an apparatus effective for carrying out the substrate cleaning method of the invention according to claim 1. The purpose is to be able to provide.

【0006】[0006]

【課題を解決するための手段】請求項1に係る発明は、
上述のような目的を達成するために、基板保持手段によ
って鉛直方向の軸芯周りで回転可能に保持された基板の
上方から外れた待機位置から基板の回転中心箇所まで洗
浄具を移動させるとともに基板の回転中心箇所で洗浄具
を下降する洗浄開始工程と、洗浄具を基板に作用させる
とともに基板の外周縁に移動させ、そこから洗浄具を基
板に作用させない位置まで上昇させ、基板の回転中心箇
所まで洗浄具を移動させる洗浄工程と、その洗浄工程を
複数回繰り返した後に、基板の外周縁箇所で洗浄具を上
昇させてから待機位置に戻す洗浄終了工程とから成る基
板洗浄方法において、洗浄工程における洗浄具の昇降ス
トロークを洗浄開始工程および洗浄終了工程それぞれに
おけるよりも小にしたことを特徴としている。
The invention according to claim 1 is
In order to achieve the above-mentioned object, the cleaning tool is moved from a standby position deviated from above the substrate held rotatably around a vertical axis by the substrate holding means to a rotation center position of the substrate and the substrate is rotated. The cleaning start step of lowering the cleaning tool at the center of rotation of the substrate, moving the cleaning tool to the substrate and moving it to the outer peripheral edge of the substrate, and raising the cleaning tool to a position where it does not affect the substrate, and rotating the center of rotation of the substrate. In the substrate cleaning method, a cleaning step of moving the cleaning tool to a cleaning step and a cleaning end step of returning the cleaning tool to the standby position after raising the cleaning tool at the peripheral edge of the substrate after repeating the cleaning step a plurality of times. The lifting stroke of the cleaning tool in step 1 is smaller than that in each of the cleaning start step and the cleaning end step.

【0007】また、請求項2に係る発明の回転式基板洗
浄装置は、上述のような目的を達成するために、基板を
鉛直方向の軸芯周りで回転可能に保持する基板保持手段
と、基板表面を洗浄する洗浄具と、その洗浄具を基板上
の洗浄位置と基板上から外れた待機位置とにわたって変
位する洗浄具移動手段と、洗浄具を、基板に作用させて
洗浄する作用位置と、その作用位置よりも高い非作用位
置とにわたって昇降する洗浄具昇降手段と、基板表面の
洗浄具による洗浄箇所に洗浄液を供給する洗浄液供給手
段とを備えた回転式基板洗浄装置において、洗浄具昇降
手段を、洗浄具を洗浄位置と待機位置とにわたって移動
するときに洗浄具を昇降する第1の洗浄具昇降手段と、
洗浄具が洗浄位置にある状態で第1の洗浄具昇降手段よ
りも小さいストロークで洗浄具を昇降する第2の洗浄具
昇降手段とから構成する。
Further, in order to achieve the above-mentioned object, the rotary substrate cleaning apparatus according to the second aspect of the present invention includes a substrate holding means for holding the substrate rotatably around a vertical axis, and a substrate. A cleaning tool for cleaning the surface, a cleaning tool moving means for displacing the cleaning tool between a cleaning position on the substrate and a standby position off the substrate, and an operating position for cleaning the cleaning tool by acting on the substrate, In a rotary substrate cleaning apparatus including a cleaning tool elevating means for elevating and lowering to a non-acting position higher than its operating position, and a cleaning liquid supply means for supplying a cleaning liquid to a cleaning position on the substrate surface by the cleaning tool, a cleaning tool elevating means A first cleaning tool elevating means for moving the cleaning tool up and down when the cleaning tool is moved between the cleaning position and the standby position,
The second cleaning tool elevating means moves the cleaning tool up and down with a stroke smaller than that of the first cleaning tool elevating means with the cleaning tool in the cleaning position.

【0008】[0008]

【作用】請求項1に係る発明の基板洗浄方法の構成によ
れば、基板の上方から外れた待機位置から基板の回転中
心箇所の洗浄位置まで洗浄具を移動させる場合、およ
び、基板の外周縁箇所の洗浄位置から待機位置に戻す場
合それぞれでは、カップを越えるように洗浄具を十分昇
降させながら、洗浄工程において、基板の外周縁箇所か
ら基板の回転中心箇所まで洗浄具を戻す場合には、カッ
プを越える必要が無いことに着目し、洗浄具を基板に作
用させない位置まで上昇させ、その位置と基板に作用さ
せる位置との小さいストロークで昇降させることができ
る。
According to the structure of the substrate cleaning method of the present invention, when the cleaning tool is moved from the standby position deviated from above the substrate to the cleaning position at the rotation center of the substrate, and the outer peripheral edge of the substrate When returning the cleaning tool from the cleaning position to the standby position in each case, while returning the cleaning tool from the outer peripheral edge position of the substrate to the rotation center position of the substrate in the cleaning process while sufficiently moving the cleaning tool up and down so as to cross the cup, Focusing on the fact that it is not necessary to cross the cup, the cleaning tool can be raised to a position where it does not act on the substrate, and can be raised and lowered with a small stroke between that position and the position where it acts on the substrate.

【0009】また、請求項2に係る発明の回転式基板洗
浄装置の構成によれば、基板の上方から外れた待機位置
から基板の回転中心箇所の洗浄位置まで洗浄具を移動さ
せる場合、および、基板の外周縁箇所の洗浄位置から待
機位置に戻す場合それぞれでは、第1の洗浄具昇降手段
により洗浄具を昇降させてカップを越えさせながら、洗
浄工程において、基板の外周縁箇所から基板の回転中心
箇所まで洗浄具を戻す場合には、第2の洗浄具昇降手段
により、第1の洗浄具昇降手段によるときよりも小さな
ストロークで洗浄具を昇降させることができる。
According to the structure of the rotary type substrate cleaning apparatus of the second aspect of the present invention, the cleaning tool is moved from the standby position deviated from above the substrate to the cleaning position at the center of rotation of the substrate, and In each case of returning from the cleaning position of the outer peripheral edge portion of the substrate to the standby position, the cleaning tool is moved up and down by the first cleaning tool elevating means to move over the cup while rotating the substrate from the outer peripheral edge portion of the substrate in the cleaning step. When returning the cleaning tool to the central portion, the second cleaning tool elevating means can move the cleaning tool up and down with a stroke smaller than that of the first cleaning tool elevating means.

【0010】[0010]

【実施例】次に、本発明の実施例を図面を用いて詳細に
説明する。図1は本発明の回転式基板洗浄装置の第1実
施例を示す要部の概略縦断面図、図2は平面図であり、
電動モータ1の駆動によって鉛直方向の軸芯周りで回転
する回転軸2の上端に、基板Wを真空吸着保持する回転
台3が一体回転可能に取り付けられ、基板Wを鉛直方向
の軸芯周りで回転可能に保持する基板保持手段4が構成
されている。
Embodiments of the present invention will now be described in detail with reference to the drawings. FIG. 1 is a schematic vertical cross-sectional view of an essential part showing a first embodiment of the rotary substrate cleaning apparatus of the present invention, and FIG. 2 is a plan view.
A rotary table 3 for vacuum-holding a substrate W is integrally rotatably attached to an upper end of a rotary shaft 2 that rotates around a vertical axis by driving an electric motor 1 so that the substrate W can be rotated around the vertical axis. Substrate holding means 4 for rotatably holding is configured.

【0011】なお、本実施例においては、回転台3を真
空吸着式のものとして基板保持手段4を構成している
が、これに限られるものではなく、例えば、回転台3上
に基板Wの外縁を支持する基板支持部材を複数設けると
ともに、この基板支持部材の上端に基板Wの水平方向の
位置を規制する位置決めピンを設けて基板保持手段を構
成し、基板Wを回転台3の上面から離間した状態で回転
可能に保持させるようにしてもよい。
In the present embodiment, the substrate holding means 4 is constructed by using the rotary table 3 as a vacuum suction type, but the present invention is not limited to this. For example, the substrate W can be placed on the rotary table 3. A plurality of substrate supporting members that support the outer edge are provided, and a positioning pin that regulates the horizontal position of the substrate W is provided at the upper end of the substrate supporting member to configure the substrate holding means. It may be rotatably held in a separated state.

【0012】基板保持手段4およびそれによって保持さ
れた基板Wの周囲は、昇降駆動機構(図示せず)によっ
て昇降可能なカップ5で覆われている。カップ5の横外
側方に、基板Wの回転中心側に向けて純水あるいは純水
に薬液を混ぜたものなどの洗浄液を噴出供給する洗浄液
供給手段としてのノズル6…が設けられている。
The periphery of the substrate holding means 4 and the substrate W held thereby is covered with a cup 5 which can be moved up and down by an elevating drive mechanism (not shown). Nozzles 6 are provided on the lateral outer side of the cup 5 as cleaning liquid supply means for ejecting a cleaning liquid such as pure water or a mixture of pure water and a chemical liquid toward the center of rotation of the substrate W.

【0013】また、カップ5の横外側方に、図3の一部
切欠全体概略側面図に示すように、アングル形状の支持
アーム7の回転支軸8が、基台9に設けられた支持体1
0に昇降および鉛直方向の第1の軸芯P1周りで(図
1、図2参照)回転可能に設けられるとともに、基台9
に回転のみ可能に設けられた回転筒11に昇降のみ可能
に設けられ、その支持アーム7の先端側アーム部分7a
の下部に、鉛直方向の第2の軸芯P2周りで(図1、図
2参照)回転可能に、基板表面を洗浄する洗浄具12が
設けられている。
Further, on the lateral outer side of the cup 5, a rotary support shaft 8 of an angle-shaped support arm 7 is provided on a base 9 as shown in a schematic side view of a partly cutaway of FIG. 1
0 is rotatably provided around the first axis P1 in the vertical direction and the vertical direction (see FIGS. 1 and 2), and the base 9
A rotary cylinder 11 rotatably attached to the upper end of the support arm 7 has a tip arm portion 7a.
A cleaning tool 12 for cleaning the substrate surface is provided in the lower part of the substrate so as to be rotatable around the second axis P2 in the vertical direction (see FIGS. 1 and 2).

【0014】回転支軸8の下端に第1の洗浄具昇降手段
としての第1のエアシリンダ13が設けられている。ま
た、回転筒11にベルト14を介して電動モータ15が
連動連結されている。図中、16は、洗浄具12が基板
Wの回転中心箇所A、基板Wの外周縁箇所B、および、
基板Wの上方から外れた非洗浄時の待機位置Cのいずれ
にあるかを検出する位置検出機構を示している。
A first air cylinder 13 is provided at the lower end of the rotary support shaft 8 as a first cleaning tool elevating means. An electric motor 15 is linked to the rotary cylinder 11 via a belt 14. In the figure, 16 indicates that the cleaning tool 12 is a rotation center portion A of the substrate W, an outer peripheral edge portion B of the substrate W, and
The position detection mechanism for detecting which one of the standby positions C, which is deviated from above the substrate W and is in the non-cleaning state, is shown.

【0015】支持体10に水平方向の軸芯周りで揺動可
能にバランスアーム17が設けられ、バランスアーム1
7の両端に第1および第2の当たりローラ18,19が
設けられている。
A balance arm 17 is provided on the support 10 so as to be swingable about a horizontal axis, and the balance arm 1
First and second contact rollers 18 and 19 are provided at both ends of 7.

【0016】回転支軸8の途中箇所に受け止め板20が
設けられ、一方、基台9に突設された支柱21に昇降可
能にウェイト台22が設けられるとともに、支柱21に
外嵌する状態でウェイト台22に錘23…が載置されて
いる。受け止め板20の下面に第1の当たりローラ18
が当接され、一方、ウェイト台22の下面に第2の当た
りローラ19が当接されている。錘23…の重量は、回
転支軸8、支持アーム7および洗浄具12等の重量より
やや小に設定されている。
A receiving plate 20 is provided at an intermediate position of the rotary support shaft 8, a weight stand 22 is provided on a support column 21 projecting from the base 9 so as to be able to move up and down, and a weight stand 22 is externally fitted to the support column 21. Weights 23 ... Are placed on the weight base 22. The first contact roller 18 is provided on the lower surface of the receiving plate 20.
While the second contact roller 19 is in contact with the lower surface of the weight base 22. The weight of the weights 23 ... Is set to be slightly smaller than the weight of the rotary support shaft 8, the support arm 7, the cleaning tool 12, and the like.

【0017】基台9に立設された支持部材24に第2の
洗浄具昇降手段としての第2のエアシリンダ25が設け
られ、その第2のエアシリンダ25のシリンダロッド2
5aの先端がウェイト台22の上面に当接されている。
また、支持部材24にストッパー26が設けられ、その
先端がウェイト台22の上面に当接することにより、洗
浄具12が基板Wの回転中心箇所Aから基板Wの外周縁
箇所Bまでの洗浄位置にあるときの最下降位置を設定す
るように構成されている。ストッパー26にはマイクロ
メータ27が付設され、設定すべき最下降位置を調整で
きるように構成されている。
A second air cylinder 25 as a second cleaning tool elevating means is provided on a support member 24 provided upright on the base 9, and the cylinder rod 2 of the second air cylinder 25 is provided.
The tip of 5a is in contact with the upper surface of the weight base 22.
Further, a stopper 26 is provided on the support member 24, and the tip of the stopper 26 comes into contact with the upper surface of the weight base 22, so that the cleaning tool 12 is moved to the cleaning position from the rotation center position A of the substrate W to the outer peripheral position B of the substrate W. It is configured to set the most lowered position at a certain time. A micrometer 27 is attached to the stopper 26 so that the most lowered position to be set can be adjusted.

【0018】図1および図2に示すように、カップ5の
水平方向の横外側方において、待機位置Cにある洗浄具
12の周囲を覆うように待機ポット28が設けられ、そ
の待機ポット28内の対向する一対の隅部の箇所それぞ
れに、待機ポット28内に挿入された洗浄具12に純水
とかそれに薬液を混ぜたものとか更には超音波水などの
洗浄液を供給するノズル29が設けられている。
As shown in FIGS. 1 and 2, a standby pot 28 is provided on the lateral outer side of the cup 5 in the horizontal direction so as to cover the periphery of the cleaning tool 12 at the standby position C, and inside the standby pot 28. Nozzles 29 for supplying a cleaning liquid such as pure water or a mixture of the cleaning liquid 12 to the cleaning tool 12 inserted in the standby pot 28 or a cleaning liquid such as ultrasonic water are provided at each of a pair of opposing corners of the ing.

【0019】前記第1のエアシリンダ13の昇降ストロ
ークは、待機ポット28内に挿入された洗浄具12を、
基板Wの水平横外側方を覆って洗浄液の飛散を防止する
位置まで上昇した状態のカップ5の上端面よりも上方ま
で上昇できるように設定されている。他方、第2のエア
シリンダ25の昇降ストロークは、洗浄具12を基板W
に作用させる位置から、基板Wから上方に離間して作用
しない位置でかつ洗浄具12の下端がカップ5の上端面
よりも下方になる位置まで上昇するに足るように設定さ
れている。
The lifting stroke of the first air cylinder 13 causes the cleaning tool 12 inserted in the standby pot 28 to
It is set so as to be able to rise above the upper end surface of the cup 5 in a state where it covers the horizontal lateral outside of the substrate W and prevents the cleaning liquid from scattering. On the other hand, the lifting stroke of the second air cylinder 25 causes the cleaning tool 12 to move to the substrate W.
It is set so as to be able to rise from the position where it acts on the substrate W to a position where it does not work apart from the substrate W upward and the lower end of the cleaning tool 12 is below the upper end surface of the cup 5.

【0020】次に上記構成の回転式基板処理装置を用い
ての基板洗浄方法につき、図4の動作説明図を用いて説
明する。 (1)洗浄開始工程 図4の(a)に示すように、基板Wの上方から外れた待
機位置Cにおいて、第1のエアシリンダ13を伸長して
待機ポット28内からカップ5を越える位置まで洗浄具
12を上昇させた後、電動モータ15を駆動して洗浄具
12を基板Wの回転中心箇所Aまで移動し、その後に、
第1および第2のエアシリンダ13,25を短縮して基
板Wに作用させる位置まで下降する。
Next, a substrate cleaning method using the rotary substrate processing apparatus having the above structure will be described with reference to the operation explanatory diagram of FIG. (1) Cleaning start step As shown in FIG. 4A, at the standby position C, which is separated from the upper side of the substrate W, the first air cylinder 13 is extended to reach the position beyond the cup 5 from inside the standby pot 28. After raising the cleaning tool 12, the electric motor 15 is driven to move the cleaning tool 12 to the rotation center portion A of the substrate W, and thereafter,
The first and second air cylinders 13 and 25 are shortened and lowered to a position where they act on the substrate W.

【0021】(2)洗浄工程 図4の(b)に示すように、基板Wを回転させながら、
電動モータ15を駆動して洗浄具12を基板Wの回転中
心箇所Aから基板Wの外周縁箇所Bまで移動する。その
後に、図4の(c)に示すように、第2のエアシリンダ
25を伸長して、基板Wから上方に離間して作用しない
位置でかつ洗浄具12の下端がカップ5の上端面よりも
下方になる位置まで洗浄具12を上昇し、そこから、電
動モータ15を駆動して洗浄具12を基板Wの回転中心
箇所Aまで移動し、その後に、第2のエアシリンダ25
を短縮して基板Wに作用させる位置まで下降する。次い
で、前述同様に、図4の(b)に示すように、洗浄具1
2を基板Wの回転中心箇所Aから基板Wの外周縁箇所B
まで移動する。この洗浄具12を基板Wに作用させなが
ら回転中心箇所Aから基板Wの外周縁箇所Bまで移動す
る工程を2〜4回繰り返す。この洗浄工程における回転
中心箇所Aから基板Wの外周縁箇所Bまでの位置を洗浄
位置と称する。
(2) Cleaning Step As shown in FIG. 4B, while rotating the substrate W,
The electric motor 15 is driven to move the cleaning tool 12 from the rotation center portion A of the substrate W to the outer peripheral edge portion B of the substrate W. After that, as shown in FIG. 4 (c), the second air cylinder 25 is extended so that the second air cylinder 25 is spaced apart from the substrate W upward and does not work, and the lower end of the cleaning tool 12 is higher than the upper end surface of the cup 5. Also moves the cleaning tool 12 up to a position where the cleaning tool 12 is moved downward to move the cleaning tool 12 to the rotation center point A of the substrate W, and then the second air cylinder 25.
Is shortened and lowered to a position where it acts on the substrate W. Then, in the same manner as described above, as shown in FIG.
2 from the rotation center portion A of the substrate W to the outer peripheral edge portion B of the substrate W
Move up to. The process of moving the cleaning tool 12 to the substrate W from the rotation center portion A to the outer peripheral edge portion B of the substrate W is repeated 2 to 4 times. The position from the rotation center portion A to the outer peripheral edge portion B of the substrate W in this cleaning step is referred to as a cleaning position.

【0022】(3)洗浄終了工程 図4の(d)に示すように、基板Wの外周縁箇所Bにお
いて、第1および第2のエアシリンダ13,25を伸長
してカップ5を越える位置まで洗浄具12を上昇させた
後、電動モータ15を駆動して洗浄具12を待機位置C
の上方まで移動し、その後に、第1のエアシリンダ13
を短縮して待機ポット28内に挿入する位置まで洗浄具
12を下降する。
(3) Cleaning Finishing Step As shown in FIG. 4D, at the outer peripheral edge portion B of the substrate W, the first and second air cylinders 13 and 25 are extended to a position beyond the cup 5. After raising the cleaning tool 12, the electric motor 15 is driven to move the cleaning tool 12 to the standby position C.
Above the first air cylinder 13
And the cleaning tool 12 is lowered to a position where the cleaning tool 12 is inserted into the standby pot 28.

【0023】以上の構成により、洗浄工程における洗浄
具12の昇降ストロークが小さくなり、前述洗浄工程で
の処理時間を短縮でき、全体としての洗浄処理時間を短
縮できるのである。
With the above construction, the lifting stroke of the cleaning tool 12 in the cleaning process can be shortened, the processing time in the cleaning process can be shortened, and the cleaning process time as a whole can be shortened.

【0024】図5は、第2実施例を示す一部切欠全体側
面図であり、第1実施例と異なるところは次の通りであ
る。
FIG. 5 is a partial cutaway side view showing the second embodiment. The difference from the first embodiment is as follows.

【0025】すなわち、回転支軸8の下端が支持ブラケ
ット30に受け止め支持され、支持ブラケット30がネ
ジ軸31に外嵌螺合されるとともにガイドロッド32に
昇降のみ可能に案内され、そして、ネジ軸31にタイミ
ングベルト33を介して正逆転可能な電動パルスモータ
34が連動連結されている。
That is, the lower end of the rotary support shaft 8 is received and supported by the support bracket 30, the support bracket 30 is externally fitted and screwed to the screw shaft 31, and is guided to the guide rod 32 so that it can only be moved up and down. An electric pulse motor 34 capable of forward and reverse rotation is interlockingly connected to 31 via a timing belt 33.

【0026】電動パルスモータ34にはコントローラ3
5が接続されている。コントローラ35において、大小
の回転数が予め設定されていて、前記洗浄工程では小さ
い方の回転数が電動パルスモータ34に指令され、一
方、前記洗浄開始工程および洗浄終了工程それぞれで
は、大きいほうの回転数が電動パルスモータ34に指令
され、前述第1実施例と同様に、洗浄工程時には小さな
ストロークで洗浄具12を昇降し、一方、洗浄開始工程
時および洗浄終了工程時それぞれには、大きなストロー
クで洗浄具12を昇降するように構成されている。他の
構成は第1実施例と同じであり、同一図番を付すことに
より、その説明は省略する。
The electric pulse motor 34 has a controller 3
5 is connected. In the controller 35, large and small rotation speeds are set in advance, and the smaller rotation speed is commanded to the electric pulse motor 34 in the cleaning step, while the larger rotation speed is given in each of the cleaning start step and the cleaning end step. The number is commanded to the electric pulse motor 34, and the cleaning tool 12 is moved up and down with a small stroke during the cleaning process, and with a large stroke during the cleaning start process and the cleaning end process, respectively, as in the first embodiment. The cleaning tool 12 is configured to move up and down. The other structure is the same as that of the first embodiment, and the description thereof is omitted by giving the same drawing numbers.

【0027】上述した第2実施例における、洗浄開始工
程時および洗浄終了工程時それぞれにおいて大きなスト
ロークで洗浄具12を昇降するように、コントローラ3
5により大きいほうの回転数を電動パルスモータ34に
指令して駆動するための制御構成を第1の洗浄具昇降手
段と称する。また、洗浄工程時において小さなストロー
クで洗浄具12を昇降するように、コントローラ35に
より小さいほうの回転数を電動パルスモータ34に指令
して駆動するための制御構成を第2の洗浄具昇降手段と
称する。
In the above-described second embodiment, the controller 3 is arranged to move the cleaning tool 12 up and down with a large stroke at each of the cleaning start step and the cleaning end step.
The control configuration for instructing and driving the electric pulse motor 34 with the higher rotational speed of 5 is referred to as first cleaning tool elevating means. In addition, a control configuration for instructing and driving the electric pulse motor 34 with a smaller rotation number to the controller 35 so that the cleaning tool 12 is moved up and down with a small stroke during the cleaning process is referred to as second cleaning tool elevating means. To call.

【0028】上記第2実施例において、電動パルスモー
タ34の回転速度を変更し、例えば、基板Wとの衝突に
よる傷付きの問題が無いように、洗浄具12の上昇速度
および待機位置Cでの下降速度それぞれを洗浄工程での
下降速度よりも常に速くし、かつ、洗浄開始に先立って
の基板Wの回転中心箇所Aでの基板Wに近接する所定位
置までの下降速度は速くし、その後に遅い速度にして基
板Wに作用させるように構成しても良い。
In the second embodiment, the rotation speed of the electric pulse motor 34 is changed so that, for example, there is no problem of scratches due to collision with the substrate W, and the rising speed of the cleaning tool 12 and the standby position C are changed. Each of the descending speeds is always faster than the descending speed in the cleaning process, and the descending speed to a predetermined position close to the substrate W at the rotation center point A of the substrate W prior to the start of cleaning is increased, and thereafter, The substrate W may be configured to operate at a low speed.

【0029】上記実施例では、洗浄具12を昇降するの
に、支持アーム7全体を昇降するように構成している
が、洗浄工程時のみ、あるいは、洗浄開始工程時および
洗浄終了工程時それぞれのいずれをも、支持アーム7の
先端で、洗浄具12だけを昇降するように構成しても良
い。
In the above embodiment, the cleaning tool 12 is moved up and down so that the entire support arm 7 is moved up and down. However, only during the cleaning step, or during the cleaning start step and the cleaning end step, respectively. In either case, only the cleaning tool 12 may be lifted and lowered by the tip of the support arm 7.

【0030】上述洗浄具12として、ナイロンブラシや
モヘアブラシやスポンジ製やフェルト製などのように、
軟質材料のものを使用する場合に限らず、プラスチック
製のものを使用する場合にも適用できる。
As the above-mentioned cleaning tool 12, such as nylon brush, mohair brush, sponge, felt, etc.,
Not only when using a soft material, but also when using a plastic material.

【0031】また、上記実施例では、洗浄具12を基板
Wの表面に沿って水平方向に変位するのに、電動モータ
15により支持アーム7を鉛直方向の第1の軸芯P1周
りで回転させるように構成しているが、エアシリンダな
どにより支持アーム7を直線方向に移動させるように構
成しても良く、支持アーム7と電動モータとから成る構
成や支持アーム7とエアシリンダとから成る構成などを
して洗浄具移動手段と総称する。
Further, in the above embodiment, in order to horizontally displace the cleaning tool 12 along the surface of the substrate W, the support arm 7 is rotated by the electric motor 15 around the first axis P1 in the vertical direction. However, the support arm 7 may be moved linearly by an air cylinder or the like, and the support arm 7 and the electric motor may be configured or the support arm 7 and the air cylinder may be configured. Etc. and collectively referred to as a cleaning tool moving means.

【0032】本発明としては、上述実施例のような円形
基板に限らず、角型基板に対する回転式基板洗浄装置に
も適用できる。
The present invention can be applied not only to the circular substrate as in the above-mentioned embodiment but also to a rotary substrate cleaning apparatus for a square substrate.

【0033】[0033]

【発明の効果】以上説明したように、請求項1に係る発
明の基板洗浄方法によれば、洗浄工程において、基板の
外周縁箇所から基板の回転中心箇所まで洗浄具を戻す場
合には、基板を待機位置と洗浄位置とにわたって移動さ
せる場合よりも小さいストロークで洗浄具を昇降するか
ら、洗浄具を基板上で外周縁箇所から回転中心箇所の洗
浄位置に迅速に戻すことができ、洗浄処理効率を向上で
きるようになった。
As described above, according to the substrate cleaning method of the first aspect of the present invention, in the cleaning step, when the cleaning tool is returned from the outer peripheral edge portion of the substrate to the rotation center portion of the substrate, Since the cleaning tool is moved up and down with a stroke smaller than when moving the cleaning tool between the standby position and the cleaning position, the cleaning tool can be quickly returned from the outer peripheral edge position to the rotation center position cleaning position on the substrate, and the cleaning processing efficiency is improved. Can be improved.

【0034】また、請求項2に係る発明の回転式基板洗
浄装置によれば、基板を待機位置と洗浄位置とにわたっ
て移動させる場合の昇降は第1の洗浄具昇降手段によ
り、そして、洗浄工程において、基板の外周縁箇所から
基板の回転中心箇所まで洗浄具を戻す場合の昇降は、第
1の洗浄具昇降手段によるときよりも小さな昇降ストロ
ークに設定した第2の洗浄具昇降手段によりそれぞれ行
わせるから、上述した請求項1に係る発明の基板洗浄方
法を実施する上で便利な装置を提供できるようになっ
た。
According to the rotary type substrate cleaning apparatus of the second aspect of the present invention, when the substrate is moved between the standby position and the cleaning position, the raising and lowering is performed by the first cleaning tool elevating means and in the cleaning step. The raising and lowering when returning the cleaning tool from the peripheral edge portion of the substrate to the rotation center position of the substrate is performed by the second cleaning tool elevating means set to a smaller elevating stroke than that by the first cleaning tool elevating means. Therefore, it is possible to provide a convenient apparatus for carrying out the substrate cleaning method according to the first aspect of the invention.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の回転式基板洗浄装置の第1実施例を示
す要部の概略縦断面図である。
FIG. 1 is a schematic vertical cross-sectional view of essential parts showing a first embodiment of a rotary substrate cleaning apparatus of the present invention.

【図2】平面図である。FIG. 2 is a plan view.

【図3】一部切欠全体概略側面図である。FIG. 3 is a schematic side view of a partially cutaway whole.

【図4】動作説明図である。FIG. 4 is an operation explanatory diagram.

【図5】第2実施例の一部切欠全体概略側面図である。FIG. 5 is a schematic side view of the entire partially cutaway structure of the second embodiment.

【符号の説明】[Explanation of symbols]

4…基板保持手段 6…洗浄液供給手段としてのノズル 12…洗浄具 13…第1のエアシリンダ 15…洗浄具移動手段としての電動モータ 25…第2のエアシリンダ 34…電動パルスモータ 35…コントローラ A…回転中心箇所 B…外周縁箇所 C…待機位置 W…基板 4 ... Substrate holding means 6 ... Nozzle as cleaning liquid supply means 12 ... Cleaning tool 13 ... First air cylinder 15 ... Electric motor as cleaning tool moving means 25 ... Second air cylinder 34 ... Electric pulse motor 35 ... Controller A ... Center of rotation B ... Outer peripheral edge C ... Standby position W ... Substrate

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 基板保持手段によって鉛直方向の軸芯周
りで回転可能に保持された基板の上方から外れた待機位
置から前記基板の回転中心箇所まで洗浄具を移動させる
とともに前記基板の回転中心箇所で前記洗浄具を下降す
る洗浄開始工程と、前記洗浄具を前記基板に作用させる
とともに前記基板の外周縁に移動させ、そこから前記洗
浄具を前記基板に作用させない位置まで上昇させ、前記
基板の回転中心箇所まで前記洗浄具を移動させる洗浄工
程と、その洗浄工程を複数回繰り返した後に、前記基板
の外周縁箇所で前記洗浄具を上昇させてから待機位置に
戻す洗浄終了工程とから成る基板洗浄方法において、 前記洗浄工程における前記洗浄具の昇降ストロークを前
記洗浄開始工程および洗浄終了工程それぞれにおけるよ
りも小にしたことを特徴とする基板洗浄方法。
1. A cleaning tool is moved from a standby position deviated from above a substrate rotatably held about a vertical axis by a substrate holding means to a rotation center position of the substrate and a rotation center position of the substrate. In the cleaning start step of lowering the cleaning tool with, the cleaning tool is moved to the outer peripheral edge of the substrate while acting on the substrate, and then the cleaning tool is raised to a position where it does not act on the substrate, Substrate comprising a cleaning step of moving the cleaning tool to a rotation center position, and a cleaning ending step of returning the cleaning tool to the standby position after raising the cleaning tool at an outer peripheral edge position of the substrate after repeating the cleaning step a plurality of times. In the cleaning method, the lifting stroke of the cleaning tool in the cleaning step is smaller than that in each of the cleaning start step and the cleaning end step. Substrate cleaning method according to symptoms.
【請求項2】 基板を鉛直方向の軸芯周りで回転可能に
保持する基板保持手段と、 基板表面を洗浄する洗浄具と、 前記洗浄具を前記基板上の洗浄位置と前記基板上から外
れた待機位置とにわたって変位する洗浄具移動手段と、 前記洗浄具を、前記基板に作用させて洗浄する作用位置
と、その作用位置よりも高い非作用位置とにわたって昇
降する洗浄具昇降手段と、 基板表面の前記洗浄具による洗浄箇所に洗浄液を供給す
る洗浄液供給手段とを備えた回転式基板洗浄装置におい
て、 前記洗浄具昇降手段を、前記洗浄具を洗浄位置と待機位
置とにわたって移動するときに前記洗浄具を昇降する第
1の洗浄具昇降手段と、 前記洗浄具が洗浄位置にある状態で前記第1の洗浄具昇
降手段よりも小さいストロークで前記洗浄具を昇降する
第2の洗浄具昇降手段と、 から構成してあることを特徴とする回転式基板洗浄装
置。
2. A substrate holding means for holding the substrate rotatably around a vertical axis, a cleaning tool for cleaning the surface of the substrate, and the cleaning tool detached from the cleaning position on the substrate and on the substrate. A cleaning tool moving means that displaces over a standby position; a cleaning tool elevating means that moves up and down across an operating position where the cleaning tool acts on the substrate to clean it; and a non-operating position that is higher than the operating position; and a substrate surface A rotary substrate cleaning apparatus including a cleaning liquid supply means for supplying a cleaning liquid to a cleaning position by the cleaning tool, wherein the cleaning tool elevating means performs the cleaning when the cleaning tool is moved between a cleaning position and a standby position. First cleaning tool elevating means for elevating and lowering the tool, and second cleaning tool elevating and lowering the cleaning tool with a stroke smaller than that of the first cleaning tool elevating means with the cleaning tool in a cleaning position A rotary substrate cleaning apparatus comprising: an elevating means.
JP15216295A 1995-05-25 1995-05-25 Substrate cleaning method and rotary substrate cleaning apparatus used therefor Ceased JP3352565B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15216295A JP3352565B2 (en) 1995-05-25 1995-05-25 Substrate cleaning method and rotary substrate cleaning apparatus used therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15216295A JP3352565B2 (en) 1995-05-25 1995-05-25 Substrate cleaning method and rotary substrate cleaning apparatus used therefor

Publications (2)

Publication Number Publication Date
JPH08318228A true JPH08318228A (en) 1996-12-03
JP3352565B2 JP3352565B2 (en) 2002-12-03

Family

ID=15534384

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15216295A Ceased JP3352565B2 (en) 1995-05-25 1995-05-25 Substrate cleaning method and rotary substrate cleaning apparatus used therefor

Country Status (1)

Country Link
JP (1) JP3352565B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005228961A (en) * 2004-02-13 2005-08-25 Dainippon Screen Mfg Co Ltd Apparatus for cleaning substrate
JP2007295006A (en) * 2007-07-30 2007-11-08 Oki Electric Ind Co Ltd Substrate cleaning method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005228961A (en) * 2004-02-13 2005-08-25 Dainippon Screen Mfg Co Ltd Apparatus for cleaning substrate
JP2007295006A (en) * 2007-07-30 2007-11-08 Oki Electric Ind Co Ltd Substrate cleaning method

Also Published As

Publication number Publication date
JP3352565B2 (en) 2002-12-03

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