JPH08313494A - Eddy current test equipment probe - Google Patents

Eddy current test equipment probe

Info

Publication number
JPH08313494A
JPH08313494A JP7142470A JP14247095A JPH08313494A JP H08313494 A JPH08313494 A JP H08313494A JP 7142470 A JP7142470 A JP 7142470A JP 14247095 A JP14247095 A JP 14247095A JP H08313494 A JPH08313494 A JP H08313494A
Authority
JP
Japan
Prior art keywords
probe
cores
flaw detection
eddy current
core
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7142470A
Other languages
Japanese (ja)
Inventor
Maashiyaru Obu Gooringu Roodo
マーシャル オブ ゴーリング ロード
Ryoichi Yamaguchi
良一 山口
Yoshiaki Watanabe
芳哲 渡辺
Yutaka Harada
豊 原田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GENSHIRYOKU ANZEN SYST KENKYUS
GENSHIRYOKU ANZEN SYST KENKYUSHO KK
GENSHIRYOKU ENG KK
Original Assignee
GENSHIRYOKU ANZEN SYST KENKYUS
GENSHIRYOKU ANZEN SYST KENKYUSHO KK
GENSHIRYOKU ENG KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GENSHIRYOKU ANZEN SYST KENKYUS, GENSHIRYOKU ANZEN SYST KENKYUSHO KK, GENSHIRYOKU ENG KK filed Critical GENSHIRYOKU ANZEN SYST KENKYUS
Priority to JP7142470A priority Critical patent/JPH08313494A/en
Publication of JPH08313494A publication Critical patent/JPH08313494A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To enhance detection capacity by further enhancing the merit of the axial flaw detection property of a bobbin coil type probe and also providing the merit of the peripheral flaw detection property of a multicoil type probe and further taking in a mutual induction system. CONSTITUTION: In an eddy current test equipment probe parallelly equipped with a pair of exciting coils 6, 7 wound in a peripheral direction so as to become mutually same in direction, two recessed grooves 8, 9 are formed to a small piece of a ferromagnetic material to form a large number of almost E-shaped cores 10 and exciting coils 6, 7 are fitted in the recessed grooves 8, 9 of the cores 10 to embed the cores 10 in the peripheral surface of a flaw detection part main body 4 so as to almost equally divide them in the peripheral direction of the main body 4 and the central protruding parts 11 of the cores 10 are used as winding cores to wind detection coils 15.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は原子力発電所の熱交換器
の金属細管等において、管に発生したクラック等を検出
するための渦電流探傷プローブに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an eddy current flaw detection probe for detecting cracks or the like generated in a metal thin tube or the like of a heat exchanger of a nuclear power plant.

【0002】[0002]

【従来の技術】熱交換器の細管のように、金属管の外側
からの接近が難しい場合には、プローブを金属管の中に
挿入して探傷するが、そのための内挿型プローブとして
最も汎用的なプローブは、高速探傷が可能で、曲管部へ
の挿入性も良いボビン型プローブである。このボビンコ
イル型プローブは、リード線を円筒状探傷部の周方向に
巻回してECTコイルを形成しているため、渦電流は金
属管の周方向に流れる。即ち、渦電流探傷においては、
プローブ内のコイルにより誘起された金属管内の渦電流
が該管の欠陥によって乱されることにより該欠陥を検出
するものであるが、上記プローブでは金属管のクラック
等の欠陥が該管の周方向に存在した場合、クラックの方
向が前記渦電流の流れの方向と平行になるため、該渦電
流はほとんど乱れず、探傷感度が低いという問題があ
る。
2. Description of the Related Art When it is difficult to approach a metal tube from the outside like a thin tube of a heat exchanger, a probe is inserted into the metal tube for flaw detection. The conventional probe is a bobbin type probe that enables high-speed flaw detection and has good insertability into a curved pipe section. In this bobbin coil type probe, the lead wire is wound in the circumferential direction of the cylindrical flaw detection portion to form the ECT coil, so that the eddy current flows in the circumferential direction of the metal tube. That is, in eddy current flaw detection,
The eddy current in the metal pipe induced by the coil in the probe is disturbed by the defect in the pipe to detect the defect. However, in the above probe, defects such as cracks in the metal pipe are detected in the circumferential direction of the pipe. If present, the crack direction becomes parallel to the flow direction of the eddy current, so that the eddy current is hardly disturbed and there is a problem that the flaw detection sensitivity is low.

【0003】一方、周方向に並んだ複数(多くの場合8
個)のパンケーキコイル(表面コイルともいう)を有す
るマルチコイル型プローブもある。このプローブの上記
パンケーキコイルによる渦電流は、金属管の比較的狭い
範囲ではあるが、管の径方向を対称軸として流れるた
め、周方向のクラックに対し交差して流れる部分があ
り、この点においては前記したボビンコイル型プローブ
に比し探傷感度が高いとの利点がある。
On the other hand, a plurality (in many cases 8
There is also a multi-coil type probe having (an) pancake coil (also referred to as a surface coil). The eddy current due to the pancake coil of this probe is in a relatively narrow range of the metal tube, but since it flows with the tube radial direction as the axis of symmetry, there is a portion that intersects with the circumferential cracks. In the above, there is an advantage that the flaw detection sensitivity is higher than that of the bobbin coil type probe described above.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記マ
ルチコイル型プローブのパンケーキコイルによる渦電流
は、コイルの中心部で強く、中心部から離れる程弱くな
るため、コイルとコイルの中間部付近で感度が低下す
る。即ち、上記マルチコイル型プローブにおいては、パ
ンケーキコイルの巻き形状や付設角度を変更したとして
も、コイルはプローブの全周をカバーする必要があるた
め、必然的にある程度以上の大きさとなり、その間隙に
は上記のように不感帯もしくは感度低下領域が発生す
る。従って、このプローブの不感帯や感度低下領域にお
いては、特に軸方向のクラックや周方向の短いクラック
を見落とす可能性があるため、このような偶然性を考慮
すると、探傷プローブの検出限界が狭くなるとの問題を
招来する。
However, the eddy current due to the pancake coil of the above-mentioned multi-coil type probe is strong in the central part of the coil and becomes weaker as it goes away from the central part. Is reduced. That is, in the above-mentioned multi-coil type probe, even if the winding shape and the attachment angle of the pancake coil are changed, since the coil needs to cover the entire circumference of the probe, it is inevitably a certain size or more. As described above, the dead zone or the sensitivity lowering region is generated in the gap. Therefore, in the dead zone and sensitivity lowering area of this probe, there is a possibility of overlooking cracks in the axial direction and short cracks in the circumferential direction in particular, and in consideration of such an accident, the detection limit of the flaw detection probe becomes narrower. Be invited.

【0005】また、1〜3個程度のパンケーキコイルを
管壁に密着させ、プローブを回転させながら螺旋状に走
査を行う回転コイル型プローブもあるが、このプローブ
においても、パンケーキコイルのピッチ(通常、コイル
径と同じ程度であり、約1mm〜5mm) で上記螺旋状の走
査を行うことから、探傷速度が非常に遅いとの欠点を有
している。
There is also a rotating coil type probe in which about 1 to 3 pancake coils are brought into close contact with the tube wall and scanning is performed in a spiral manner while rotating the probe. In this probe as well, the pitch of the pancake coils is also provided. (Usually, the diameter is about the same as the coil diameter, and about 1 mm to 5 mm), the spiral scanning is performed, so that the flaw detection speed is very slow.

【0006】いずれにしても現状では、金属管に周方向
欠陥の可能性があれば、前記ボビンコイル型プローブだ
けでなく、前記マルチコイル型プローブや上記回転コイ
ル型プローブも併せて使用する必要があり、上記欠陥の
検出に時間やコストが膨大にかかっている。
In any case, at present, if there is a possibility of a circumferential defect in the metal tube, it is necessary to use not only the bobbin coil type probe but also the multi coil type probe and the rotating coil type probe. However, it takes much time and cost to detect the above defects.

【0007】さらに従来の渦電流探傷プローブは自己誘
導方式であり、これは渦電流を発生させる為の励磁と発
生した渦電流の検出を同一コイルで行うものである。
Further, the conventional eddy current flaw detection probe is of a self-induction type, in which excitation for generating an eddy current and detection of the generated eddy current are performed by the same coil.

【0008】一方、本発明で使用するのは相互誘導型で
あるが、これは励磁用の一次コイルと検出用の二次コイ
ルを分離したものであり、一部で使用されている。しか
しながら、従来の相互誘導方式では、金属管が無欠陥で
も検出用の二次コイルにはすでに電圧出力が発生してお
り、欠陥信号はこの無欠陥信号からの変化分として評価
される。したがって、欠陥信号の変化分は無欠陥信号と
比べても非常に微小であり、このため微細な欠陥の信号
の検出を難しくしている。
On the other hand, although the mutual induction type is used in the present invention, this is one in which a primary coil for excitation and a secondary coil for detection are separated, and is used in part. However, in the conventional mutual induction method, a voltage output is already generated in the secondary coil for detection even if the metal tube has no defect, and the defect signal is evaluated as a change from the defect-free signal. Therefore, the amount of change in the defect signal is very small as compared with the defect-free signal, which makes it difficult to detect a signal of a minute defect.

【0009】本発明は上記の如き実状に対処してなされ
たものであり、前記ボビンコイル型プローブの軸方向欠
陥検出性の長所をさらに強化すると共に、前記マルチコ
イル型プローブの周方向欠陥検出性の長所も合わせ持
ち、さらに、相互誘導方式を取り入れ、コイルとコイル
を巧妙に配置することにによって、上記ボビンコイル型
プローブと同じ速度で、しかも検出性を向上せしめて探
傷検査を行うことを目的とするものである。
The present invention has been made in consideration of the above situation, and further enhances the advantage of the axial defect detection of the bobbin coil type probe, and further improves the circumferential defect detection of the multi-coil type probe. It also has advantages, and aims to perform flaw detection inspection at the same speed as the bobbin coil type probe by improving the detectability by adopting the mutual induction method and arranging the coil and the coil skillfully. It is a thing.

【0010】[0010]

【課題を解決するための手段】すなわち、上記目的に適
合する本発明の渦電流探傷プローブの特徴は、筒または
柱状の探傷部本体に、互いに同じ向きとなるように周方
向に巻回した1対の励磁用コイルを並行に具備したプロ
ーブであって、フェライト等の強磁性体の小片に2条の
凹溝を形成して略E字状のコアを多数形成すると共に、
これらコアの上記各凹溝に上記各励磁用コイルを夫々嵌
合せしめて、各コアを上記探傷部本体の周面に周方向に
ほぼ等分して埋設し、かつ上記各コアの中央の凸部を巻
芯として夫々検出用コイルを巻回したところにある。
That is, the feature of the eddy current flaw detection probe of the present invention which meets the above-mentioned object is that the eddy current flaw detection probe of the present invention is wound around a body of a flaw detection portion having a cylindrical or columnar shape in the circumferential direction in the same direction. A probe provided with a pair of exciting coils in parallel, in which two recessed grooves are formed in a small piece of a ferromagnetic material such as ferrite to form a large number of substantially E-shaped cores.
The exciting coils are fitted in the concave grooves of the cores, respectively, and the cores are embedded in the circumferential surface of the flaw detection unit main body in the circumferential direction substantially equally, and the central convex portion of the cores is embedded. Each of the detection coils is wound around the core as a winding core.

【0011】[0011]

【作用】上記本発明のプローブを金属管に挿入した場
合、2つの励磁用コイルが直面する部分の金属管では、
互いに同方向の電流が流れる。また、上記E字状コアの
上下の凸部が直面する部分の金属管では、隣合うコアの
同凸部にかけ電流が蛇行し、軸方向の渦電流成分が発生
する。
When the probe of the present invention is inserted into the metal tube, the metal tube in the portion facing the two exciting coils,
Currents flow in the same direction as each other. In addition, in the metal tube in the portion where the upper and lower convex portions of the E-shaped core face, the electric current meanders between the convex portions of the adjacent cores, and an eddy current component in the axial direction is generated.

【0012】従って、本発明のプローブでは、上記の如
く軸方向の電流成分が発生する為、金属管の円周方向欠
陥に対しても感度がよくなり、しかも円周方向の電流成
分もあることから、従来どおりボビン型コイルと同様に
軸方向欠陥に対しても感度がよい。
Therefore, in the probe of the present invention, since the current component in the axial direction is generated as described above, the sensitivity to the circumferential defect of the metal tube is improved and the current component in the circumferential direction is also present. Therefore, as with the conventional bobbin type coil, the sensitivity to the axial defect is good.

【0013】また、渦電流変化を検出する検出用コイル
は、コアの中央の凸部を巻芯としてパンケーキ状に巻い
ているが、金属管が無欠陥の時、軸方向磁束はコアの上
の凸部から下の凸部に流れる為、この検出用コイル部分
での径方向磁束はほとんど0に近い値となる。一方、欠
陥がコアの上の凸部と中央凸部の間に位置すると、この
径方向磁束のバランスが崩れて、中央凸部と下の凸部の
間を周回する磁束が発生する。欠陥が中央凸部と下の凸
部の間にある時も同じ作用を起こす。
The detection coil for detecting changes in eddy current is wound in a pancake shape with the central convex portion of the core as a winding core. However, when the metal tube is defect-free, the axial magnetic flux is above the core. Since the current flows from the convex portion to the lower convex portion, the radial magnetic flux in the detection coil portion has a value close to zero. On the other hand, when the defect is located between the convex portion on the core and the central convex portion, the balance of the radial magnetic flux is lost, and a magnetic flux circulating between the central convex portion and the lower convex portion is generated. The same effect occurs when the defect is between the central convex portion and the lower convex portion.

【0014】従って、上記欠陥がない時は2つの励磁用
コイルが自己バランスして検出コイルの磁束が0であ
り、欠陥があるときには、この出力電圧がほとんど0の
状態から検出用コイルに磁束が発生し、出力電圧を測定
することができるため検出性能が向上する。
Therefore, when there is no defect, the two exciting coils are self-balanced and the magnetic flux of the detection coil is 0. When there is a defect, the magnetic flux is applied to the detection coil from a state where the output voltage is almost zero. As the output voltage is generated and the output voltage can be measured, the detection performance is improved.

【0015】[0015]

【実施例】以下、さらに添付図面を参照して、本発明の
実施例を説明する。
Embodiments of the present invention will be described below with reference to the accompanying drawings.

【0016】図1は本発明実施例の渦電流探傷プローブ
の探傷部本体を示す一部切欠正面図、図2は図1のX−
X′線断面図、図3は同実施例プローブの正面図、図4
は同プローブのコアを示す分解図、図5は同プローブの
コア部を示す縦断面図であり、図3において、1はプロ
ーブ、2は挿入性をよくするための円すい状ガイド、3
はセンタリングばね、4は探傷部本体、5はフレキシブ
ルチューブを夫々示している。
FIG. 1 is a partially cutaway front view showing a main body of a flaw detection portion of an eddy current flaw detection probe according to an embodiment of the present invention, and FIG.
A sectional view taken along line X ', FIG. 3 is a front view of the probe of the embodiment, and FIG.
5 is an exploded view showing the core of the probe, FIG. 5 is a vertical cross-sectional view showing the core portion of the probe, and in FIG. 3, 1 is a probe, 2 is a conical guide for improving insertability, and 3 is a guide.
Is a centering spring, 4 is a flaw detection unit main body, and 5 is a flexible tube.

【0017】上記探傷部本体4は、図1,図2にも示す
ように、互いに同じ向きとなるように周方向に巻回した
1対のコイル6,7を、筒状の本体4に上下に並行して
具備している。
As shown in FIGS. 1 and 2, the flaw detection unit main body 4 has a pair of coils 6 and 7 wound in the circumferential direction in the same direction as each other on the cylindrical main body 4. It is equipped in parallel with.

【0018】さらに、上記本発明実施例では、図4,図
5に示す如く、フェライトの板状小片に2条の凹溝8,
9を形成してE字状のコア10を多数形成すると共に、
図1,図2にも示す如くこれらコア10の上記各凹溝
8,9に上記上下1対の励磁用コイル6,7を夫々嵌合
せしめて、各コア10を上記探傷部本体4の周面に周方
向に等分して埋設している。そして、上記各E字状コア
10の中央の凸部11の基部周囲に、この凸部11を中
心として(プローブの半径方向を軸として)、夫々検出
用コイル15を巻回している。
Further, in the above-described embodiment of the present invention, as shown in FIGS. 4 and 5, two recessed grooves 8 are formed in the ferrite plate-like small piece.
9 to form a large number of E-shaped cores 10,
As shown in FIG. 1 and FIG. 2, the pair of upper and lower exciting coils 6 and 7 are fitted into the concave grooves 8 and 9 of the cores 10, respectively, and the cores 10 are attached to the peripheral surface of the flaw detection unit body 4. It is buried evenly in the circumferential direction. The detection coils 15 are wound around the base of the central convex portion 11 of each E-shaped core 10 with the convex portion 11 as the center (radial direction of the probe as an axis).

【0019】上記コア10は、この実施例では8個であ
るが、概ね8〜16個ぐらいを上記探傷部本体4の周面
に周方向にほぼ等分的に、また上記と同様に凹溝8,9
が半径方向外向きとなるよう埋設することも可能であ
る。また、コア10の凸部11〜13や柱状部14の断
面はこの実施例では四角であるが、円形やその他形状と
することも可能である。
The number of the cores 10 is eight in this embodiment, but about 8 to 16 cores are circumferentially equally divided into the circumferential surface of the flaw detection unit main body 4, and likewise the concave grooves. 8, 9
It is also possible to bury it so that it faces outward in the radial direction. Further, although the cross sections of the convex portions 11 to 13 and the columnar portion 14 of the core 10 are squares in this embodiment, they may be circular or other shapes.

【0020】また、図6はコアの他の例を示す斜視図で
あり、コア10を、上,中,下の凸部11〜13ごとに
順次同一の周方向にずらせて形成することにより、コア
の数が少なくても、プローブの軸方向欠陥の不感帯をほ
ぼなくすことが可能である。
FIG. 6 is a perspective view showing another example of the core. By forming the core 10 by sequentially shifting the upper, middle, and lower convex portions 11 to 13 in the same circumferential direction, Even with a small number of cores, it is possible to almost eliminate the dead zone of the axial defect of the probe.

【0021】しかして、上記本発明実施例のプローブ1
を金属管Kに挿入すると、図7に示すように、コア10
の凹溝8,9に嵌合された2つの励磁用ボビンコイル
6,7が直面する部分A,A′では、同じ向きの周方向
の電流が流れる。なお、これらボビンコイル6,7に挟
まれたE字状コア10の中央の凸部11が直面する部分
Bでは、上記ボビンコイル6,7が生じる周方向の電流
がわずかに流れる。
Therefore, the probe 1 of the embodiment of the present invention described above.
Is inserted into the metal tube K, as shown in FIG.
In the portions A and A'facing the two exciting bobbin coils 6 and 7 fitted in the concave grooves 8 and 9, the circumferential currents in the same direction flow. In the portion B facing the central convex portion 11 of the E-shaped core 10 sandwiched between the bobbin coils 6 and 7, a slight current in the circumferential direction generated by the bobbin coils 6 and 7 flows.

【0022】また、上記E字状コア10の上下の凸部1
2,13が直面する部分C,C′では、隣合うコアの同
凸部にかけ電流が蛇行する。
The upper and lower convex portions 1 of the E-shaped core 10 are also provided.
In the portions C and C ′ that the two and 13 face, the current meanders over the same convex portion of the adjacent core.

【0023】すなわち、上記本発明実施例のプローブ1
では、上記の如くC,C′エリアに軸方向の電流成分が
発生するため、金属管の円周方向欠陥に対しても感度が
よくなり、かつA,A′エリアの円周方向電流は、コア
10の存在によって従来のボビンコイル型プローブと同
等以上に流れているので、軸方向欠陥に対しても高感度
である。
That is, the probe 1 of the above-mentioned embodiment of the present invention.
Then, since the axial current component is generated in the C and C'areas as described above, the sensitivity to the circumferential defect of the metal tube is improved, and the circumferential current in the A and A'areas is Because of the presence of the core 10, the flow is equal to or higher than that of the conventional bobbin coil type probe, and therefore, it is highly sensitive to axial defects.

【0024】他方、渦電流変化を検出する検出用コイル
15は、コア10の中央の凸部11を巻芯としてパンケ
ーキ状に巻いているが、図8に示すように金属管Kが無
欠陥の時、軸方向磁束はコア10の上の凸部12から下
の凸部13に流れる為、検出用コイル15部分での径方
向磁束はほとんど0に近い値となる。
On the other hand, the detection coil 15 for detecting changes in eddy current is wound in a pancake shape with the central convex portion 11 of the core 10 as a core, but as shown in FIG. At this time, since the axial magnetic flux flows from the upper convex portion 12 of the core 10 to the lower convex portion 13, the radial magnetic flux in the detection coil 15 portion becomes a value close to zero.

【0025】これに対し、図9に示す如く、欠陥K1
コア10の上の凸部12と中央凸部11の間に位置する
と、上記図8に示した径方向磁束のバランスが崩れて図
9に示す如き中央凸部11と上の凸部12の間を周回す
る磁束が発生する。これは欠陥K1 が中央凸部11と下
の凸部13の間にある時も同じである。
On the other hand, as shown in FIG. 9, if the defect K 1 is located between the convex portion 12 on the core 10 and the central convex portion 11, the radial magnetic flux balance shown in FIG. 8 is lost. A magnetic flux circulating between the central convex portion 11 and the upper convex portion 12 as shown in FIG. 9 is generated. This is the same when the defect K 1 is between the central convex portion 11 and the lower convex portion 13.

【0026】従って、本発明実施例のプローブにおいて
は、図8に示す如く上記欠陥K1 がないときは2つの励
磁用コイル6,7が自己バランスして検出用コイル15
の磁束が0であり、欠陥K1 があるときには、図9に示
すように上記検出用コイル15に磁束が発生し、これに
より出力電圧がほぼ0の状態から所定値まで変化するた
め、これを測定することにより従来の相互誘導式プロー
ブより検出性が高まる。
Therefore, in the probe of the embodiment of the present invention, as shown in FIG. 8, when the defect K 1 is not present, the two exciting coils 6 and 7 are self-balanced and the detecting coil 15 is provided.
When the magnetic flux is 0 and there is a defect K 1 , a magnetic flux is generated in the detection coil 15 as shown in FIG. 9, which causes the output voltage to change from a substantially zero state to a predetermined value. The measurement improves the detectability over the conventional mutual induction probe.

【0027】以上、本発明の実施例を説明したが、コア
10はフェライト以外の強磁性体でも形成することが可
能であり、また、コア10とコイル6,7、およびコイ
ル6,7と検出用コイル15との間には、夫々薄い絶縁
体を配設することが好適である。
Although the embodiment of the present invention has been described above, the core 10 can be formed of a ferromagnetic material other than ferrite, and the core 10 and the coils 6, 7 and the coils 6, 7 can be detected. It is preferable to dispose thin insulators between the respective coils 15 and.

【0028】[0028]

【発明の効果】以上説明したように、本発明の渦電流探
傷プローブは、同じ向きとなるよう周方向に巻回した1
対の励磁用コイルを並行に具備したプローブであって、
フェライト等の小片に2条の凹溝を形成して略E字状の
コアを多数形成すると共に、これらコアの上記各凹溝に
上記励磁用コイルを夫々嵌合せしめて、各コアを探傷部
本体の周面に周方向にほぼ等分して埋設し、かつ各コア
の中央の凸部を巻芯として夫々検出用コイルを巻回した
ものであり、上記励磁用コイル部では周方向電流を発生
させる一方、上下の凸部では波状に蛇行する電流を夫々
発生させることが可能で、軸方向の電流成分を発生する
ため、金属管の円周方向欠陥に対して感度がよくなり、
かつ円周方向電流は、コアの存在によって従来のボビン
コイル型プローブと同等以上に流れているため軸方向欠
陥に対しても高感度であり、さらに、金属管に欠陥がな
いときは上記1対の励磁用コイルがバランスして検出コ
イルの磁束をほぼ0となし、かつ欠陥があるときはこの
0バランスからのずれを検出することから、微小欠陥信
号も容易に判別でき、従来の相互誘導式プローブに比べ
ても大幅に検出性が向上するとの顕著な効果を奏するも
のである。
As described above, according to the eddy current flaw detection probe of the present invention, the eddy current flaw detection probe is wound in the circumferential direction so as to have the same direction.
A probe equipped with a pair of exciting coils in parallel,
A large number of substantially E-shaped cores are formed by forming two recessed grooves in a small piece of ferrite or the like, and the exciting coils are fitted in the recessed grooves of these cores, respectively, and each core is subjected to flaw detection part main body. Is embedded in the circumferential surface of the core in a substantially equal manner in the circumferential direction, and the detection coil is wound around each of the convex portions at the center of the cores as winding cores. On the other hand, in the upper and lower convex portions, it is possible to respectively generate a wavy meandering current and generate an axial current component, which improves sensitivity to circumferential defects of the metal tube,
Moreover, since the circumferential current flows at a level equal to or higher than that of the conventional bobbin coil type probe due to the presence of the core, it is highly sensitive to axial defects, and when there is no defect in the metal tube, the above-mentioned pair of The excitation coil balances the magnetic flux of the detection coil to almost zero, and when there is a defect, the deviation from the zero balance is detected, so even a minute defect signal can be easily discriminated. Compared with the above, the remarkable effect that the detectability is significantly improved is exhibited.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明実施例の渦電流探傷プローブの探傷部本
体を示す一部切欠正面図である。
FIG. 1 is a partially cutaway front view showing a flaw detection unit body of an eddy current flaw detection probe according to an embodiment of the present invention.

【図2】図1のX−X′線断面である。FIG. 2 is a sectional view taken along line XX ′ of FIG.

【図3】同実施例プローブの正面図である。FIG. 3 is a front view of the probe of the example.

【図4】同プローブのコアを示す分解図である。FIG. 4 is an exploded view showing a core of the probe.

【図5】同プローブのコア部を示す縦断面図である。FIG. 5 is a vertical cross-sectional view showing a core portion of the probe.

【図6】コアの他の例を示す斜視図てある。FIG. 6 is a perspective view showing another example of the core.

【図7】本発明実施例のプローブによる金属管の電流の
流れを示す図である。
FIG. 7 is a diagram showing a current flow in a metal tube by a probe according to an embodiment of the present invention.

【図8】金属管に欠陥がない場合のコア部の磁束の流れ
を示す断面図である。
FIG. 8 is a cross-sectional view showing the flow of magnetic flux in the core portion when the metal tube has no defect.

【図9】金属管に欠陥がある場合のコア部の磁束の流れ
を示す断面図である。
FIG. 9 is a cross-sectional view showing the flow of magnetic flux in the core portion when the metal tube has a defect.

【符号の説明】[Explanation of symbols]

1 プローブ 2 ガイド 3 センタリング用ばね 4 探傷部本体 5 フレキシブルチューブ 6,7 励磁用コイル 8,9 凹溝 10 コア 11 中央の凸部 12 上側の凸部 13 下側の凸部 14 コアの柱状部 15 検出用コイル DESCRIPTION OF SYMBOLS 1 probe 2 guide 3 spring for centering 4 flaw detection part main body 5 flexible tube 6,7 excitation coil 8,9 concave groove 10 core 11 central convex portion 12 upper convex portion 13 lower convex portion 14 core column portion 15 Detection coil

フロントページの続き (72)発明者 山口 良一 京都府相楽郡精華町大字南稲八妻小字大谷 123番地 株式会社原子力安全システム研 究所内 (72)発明者 渡辺 芳哲 京都府相楽郡精華町大字南稲八妻小字大谷 123番地 株式会社原子力安全システム研 究所内 (72)発明者 原田 豊 大阪市西区土佐堀1丁目3番7号 株式会 社原子力エンジニアリング内Front page continuation (72) Inventor Ryoichi Yamaguchi Oita 123 Minami Inazuma, Seika-cho, Soraku-gun, Kyoto Prefecture In-house, Nuclear Safety System Research Co., Ltd. Ina Yatsuma Sub-print 123 Otani, Nuclear Safety Systems Research Institute (72) Inventor Yutaka Harada 1-3-7 Tosabori, Nishi-ku, Osaka City Stock Company Nuclear Engineering

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 筒または柱状の探傷部本体に、互いに同
じ向きとなるように周方向に巻回した1対の励磁用コイ
ルを並行に具備したプローブであって、フェライト等の
強磁性体の小片に2条の凹溝を形成して略E字状のコア
を多数形成すると共に、これらコアの上記各凹溝に上記
各励磁用コイルを夫々嵌合せしめて、各コアを上記探傷
部本体の周面に周方向にほぼ等分して埋設し、かつ上記
各コアの中央の凸部を巻芯として夫々検出用コイルを巻
回したことを特徴とする渦電流探傷プローブ。
1. A probe having a pair of exciting coils wound in the circumferential direction so as to be in the same direction on a cylindrical or columnar flaw detection unit main body in parallel, and comprising a ferromagnetic material such as ferrite. A large number of substantially E-shaped cores are formed by forming two recessed grooves in the small piece, and the exciting coils are fitted in the recessed grooves of these cores, so that the cores of the flaw detection unit main body An eddy current flaw detection probe characterized in that it is embedded in a circumferential surface in a substantially equal manner in the circumferential direction, and each of the detection coils is wound with the central convex portion of each core as a winding core.
JP7142470A 1995-05-16 1995-05-16 Eddy current test equipment probe Pending JPH08313494A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7142470A JPH08313494A (en) 1995-05-16 1995-05-16 Eddy current test equipment probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7142470A JPH08313494A (en) 1995-05-16 1995-05-16 Eddy current test equipment probe

Publications (1)

Publication Number Publication Date
JPH08313494A true JPH08313494A (en) 1996-11-29

Family

ID=15316073

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7142470A Pending JPH08313494A (en) 1995-05-16 1995-05-16 Eddy current test equipment probe

Country Status (1)

Country Link
JP (1) JPH08313494A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002054721A (en) * 2000-08-08 2002-02-20 Fuji Heavy Ind Ltd Support structure of space for drive shaft
JP2012173121A (en) * 2011-02-21 2012-09-10 Toshiba Corp Eddy current-utilizing flaw detection testing apparatus and testing method of the same
KR101645366B1 (en) * 2016-05-09 2016-08-05 나우 주식회사 Eddy current nondestructive testing device using a non-contact slip ring

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002054721A (en) * 2000-08-08 2002-02-20 Fuji Heavy Ind Ltd Support structure of space for drive shaft
JP2012173121A (en) * 2011-02-21 2012-09-10 Toshiba Corp Eddy current-utilizing flaw detection testing apparatus and testing method of the same
KR101645366B1 (en) * 2016-05-09 2016-08-05 나우 주식회사 Eddy current nondestructive testing device using a non-contact slip ring

Similar Documents

Publication Publication Date Title
US4855676A (en) Ferromagnetic eddy current probe having transmit and receive coil assemblies
JPS6132619B2 (en)
US5623204A (en) Eddy current probe
JP4234761B2 (en) Eddy current flaw detection method and apparatus
CN103575802A (en) Broadband eddy current probe
US7154265B2 (en) Eddy current probe and inspection method
JPH08313494A (en) Eddy current test equipment probe
CN110333284B (en) Series type plane eddy current sensor
JPH08240568A (en) Eddy current flaw detection probe
JP5259511B2 (en) Remote field eddy current testing probe
JPH06186207A (en) Eddy-current flaw detecting probe
JPS6232355A (en) Eddy current flaw inspector
JP7295522B2 (en) Eddy current flaw detection probe and eddy current flaw detection device
JPS61130802A (en) Overcurrent probe with coil oppositely positioned while holding diameter
JP3758315B2 (en) Eddy current flaw detector
JPH0949825A (en) Eddy-current flaw detecting probe
JP7295523B2 (en) Eddy current flaw detection probe and eddy current flaw detection device
JPS62126345A (en) Probe for eddy current flaw detection
JPH05149926A (en) Flaw detecting coil for metallic wire body
RU2745013C1 (en) Non-contact longitudinal magnetizing device for in-pipe defectoscopy of pipelines
JPS6324152A (en) Probe for eddy current flaw detection
JP2002055083A (en) Eddy current flaw detection probe
JPH03118465A (en) Detecting apparatus for defect inside tube
JPS6120530Y2 (en)
JPH10239282A (en) Eddy current flaw-detecting probe