JPH082628Y2 - Ic試験装置 - Google Patents
Ic試験装置Info
- Publication number
- JPH082628Y2 JPH082628Y2 JP1211990U JP1211990U JPH082628Y2 JP H082628 Y2 JPH082628 Y2 JP H082628Y2 JP 1211990 U JP1211990 U JP 1211990U JP 1211990 U JP1211990 U JP 1211990U JP H082628 Y2 JPH082628 Y2 JP H082628Y2
- Authority
- JP
- Japan
- Prior art keywords
- power supply
- group
- fan unit
- board
- unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims description 26
- 238000000034 method Methods 0.000 description 17
- 238000001816 cooling Methods 0.000 description 9
- 239000000463 material Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
- Cooling Or The Like Of Electrical Apparatus (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1211990U JPH082628Y2 (ja) | 1990-02-09 | 1990-02-09 | Ic試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1211990U JPH082628Y2 (ja) | 1990-02-09 | 1990-02-09 | Ic試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH03104878U JPH03104878U (en, 2012) | 1991-10-30 |
JPH082628Y2 true JPH082628Y2 (ja) | 1996-01-29 |
Family
ID=31515609
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1211990U Expired - Fee Related JPH082628Y2 (ja) | 1990-02-09 | 1990-02-09 | Ic試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH082628Y2 (en, 2012) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014048202A (ja) * | 2012-08-31 | 2014-03-17 | Advantest Corp | 電子部品試験装置 |
-
1990
- 1990-02-09 JP JP1211990U patent/JPH082628Y2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH03104878U (en, 2012) | 1991-10-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |