JPH08215964A - Inclination adjusting mechanism for base plate - Google Patents

Inclination adjusting mechanism for base plate

Info

Publication number
JPH08215964A
JPH08215964A JP4510295A JP4510295A JPH08215964A JP H08215964 A JPH08215964 A JP H08215964A JP 4510295 A JP4510295 A JP 4510295A JP 4510295 A JP4510295 A JP 4510295A JP H08215964 A JPH08215964 A JP H08215964A
Authority
JP
Japan
Prior art keywords
plate
adjusting plate
spindle shaft
adjusting
adjustment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4510295A
Other languages
Japanese (ja)
Inventor
Heiji Takizawa
平治 滝沢
Hiroshi Oinuma
博 生沼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RAP MASTER S F T KK
Original Assignee
RAP MASTER S F T KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RAP MASTER S F T KK filed Critical RAP MASTER S F T KK
Priority to JP4510295A priority Critical patent/JPH08215964A/en
Publication of JPH08215964A publication Critical patent/JPH08215964A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To freely adjust the inclination of the upper face of a base plate in a micron unit by dividing an adjusting plate into an upper adjusting plate and a lower adjusting plate in the circumferential direction through a taper plane, and fixedly securing the respective adjusting plates by means of fixing tools mounted on the outer circumference of the adjusting plates. CONSTITUTION: A plurality of fixing parts 10 are formed along the outer circumference of a pair of divided adjusting plates 5a, 5b at regular intervals, fixing tools 11 are threadedly fitted to the respective fixing parts 10, and the upper and lower adjusting plates 5a, 5b are detachably fixed to each other. When the upper and lower adjusting plates 5a, 5b are symmetrically fitted together, the upper face and the lower face are truely in parallel with each other, and when the upper and lower adjusting plates 5a, 5b are fitted together in the same direction, inclination between the upper face and the lower face becomes maximum. Further when the upper and lower adjusting plates are crossingly fitted together, the half inclination is obtained.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、例えば、超LSI等の
基板と成る半導体ウエハのような薄板状で硬質で脆性の
ワークの上面と下面との真平行精度の加工を施すための
ベースプレートの傾き調整機構に関するものであり、更
に、詳細には研削盤、ラップ盤、ポリッシング盤等のベ
ースプレートに実施されるものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a base plate for processing a thin plate-like hard and brittle work such as a semiconductor wafer serving as a substrate for VLSI or the like with a true parallel precision between the upper surface and the lower surface. The present invention relates to a tilt adjusting mechanism, and more specifically, it is applied to a base plate such as a grinding machine, a lapping machine, and a polishing machine.

【0002】[0002]

【従来技術】本発明に係るこの種のワークである半導体
ウエハは、コンピュータ等の電子関連機器、所謂OA機
器等の集積回路に使用されており、その開発は日々進歩
し、機器そのものの小型化に伴う極薄化と、歩留まりの
観点からのより超平行精度、超平坦精度及び超平面精度
と均一化、或いは、作業性の観点からよりいっそうの拡
径化が要求されてきている。
2. Description of the Related Art A semiconductor wafer, which is a work of this type according to the present invention, is used in electronic circuits such as computers, integrated circuits such as so-called OA equipment, and its development is advancing day by day, and the equipment itself is miniaturized. Therefore, there is a demand for ultra-thinning, more uniform ultra-parallel accuracy, ultra-flat accuracy and ultra-planar accuracy from the viewpoint of yield, or further diameter expansion from the viewpoint of workability.

【0003】又、一般にシリコンの半導体ウエハは、先
ず、円柱状のシリコン結晶体を一定の厚さの円板状にス
ライシングし、その円板状の半導体ウエハを所望の厚さ
にするために研削加工を行ない、更に、研削加工後の半
導体ウエハへ超高精度に加工をするためにラッピング、
或いは、ポリッシング等の研磨加工を施しているもので
ある。
In general, a silicon semiconductor wafer is prepared by first slicing a cylindrical silicon crystal into a disk having a constant thickness and grinding the disk-shaped semiconductor wafer to a desired thickness. Processing, and then lapping to process semiconductor wafers after grinding with extremely high precision,
Alternatively, polishing processing such as polishing is performed.

【0004】[0004]

【解決しようとする課題】通常、研削加工はカップホイ
ール型ダイヤモンド砥石によって粗研削、仕上研削等に
分けて行われ、研削加工の後に、更に、昨今要求される
超高精度の加工を施すのために、ラッピング、或いは、
ポリッシングをしているものであるが、各加工工程にお
いて研削装置及び研磨装置そのものの各部品等の製品精
度、環境変化、熟練度等によって半導体ウエハの上面と
下面との平行度に狂いを生じて加工面がテーパーに成る
ことが屡々発生しており、後に半導体チップに加工した
場合に品質の超高精度化、均一化に課題を有していた。
[Problems to be solved] Normally, the grinding process is divided into rough grinding and finish grinding by a cup wheel type diamond grindstone, and after the grinding process, further ultra-high precision machining required recently is performed. Wrapping, or
Although polishing is performed, the parallelism between the upper surface and the lower surface of the semiconductor wafer may be distorted due to product accuracy, environmental changes, proficiency, etc. of each part of the grinding and polishing equipment itself in each processing step. It often happens that the processed surface is tapered, and when the semiconductor chip is processed later, there is a problem in achieving ultra-high precision and uniform quality.

【0005】[0005]

【発明の目的】本発明は上記の課題に鑑みて成されたも
ので、鋭意研鑚の結果、これらの課題を解決するもの
で、研削盤、ラップ盤、ポリッシング盤等で加工後のワ
ークの上面と下面とが非平行状態に加工された場合、つ
まり、テーパー面が生じた場合、真平行状態に研削、研
磨加工するためにベースプレートへ調整用プレートを介
設して、ワークの上面のテーパー面を研削盤、ラップ
盤、ポリッシング盤等の加工装置の水平進行方向に対し
て真平行状態とする傾き調整機構を創達し、これを提供
する目的である。
SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and as a result of diligent research, it solves these problems. A workpiece after being processed by a grinding machine, a lapping machine, a polishing machine, etc. When the upper surface and the lower surface are processed in a non-parallel state, that is, when a tapered surface occurs, the adjustment plate is provided on the base plate to grind and polish in a parallel state, and the taper of the upper surface of the workpiece is performed. It is an object of the present invention to provide and provide an inclination adjusting mechanism that makes a surface in a state of being truly parallel to a horizontal traveling direction of a processing device such as a grinding machine, a lapping machine, or a polishing machine.

【0006】[0006]

【発明の構成】本発明の第1実施例の構成は、基体と、
基体へスピンドル軸ケーシングと、スピンドル軸と、調
整用プレートと、プレート受け台と、凹陥部と、ワーク
をチャックさせるバキューム台と、バキューム連通孔と
を具備したベースプレートにおいて、調整用プレートは
上面と下面とを真平行状態の円板状に形成し、調整用プ
レートをテーパー面を介して上方調整用プレートと下方
調整用プレートとに分割させると共に、調整用プレート
に複数の固着部を形成し、夫々の固着部へ固着具を装着
して夫々の調整用プレートを固着させる構成である。
The structure of the first embodiment of the present invention comprises a substrate,
To the base body, a spindle shaft casing, a spindle shaft, an adjusting plate, a plate receiving base, a recessed portion, a vacuum base for chucking a work, and a vacuum communication hole. In the base plate, the adjusting plate has an upper surface and a lower surface. Are formed in a disk shape in a true parallel state, the adjusting plate is divided into an upper adjusting plate and a lower adjusting plate through a tapered surface, and a plurality of fixing portions are formed on the adjusting plate. It is configured such that a fixing tool is attached to the fixing portion and each adjustment plate is fixed.

【0007】次に、本発明の第2実施例の構成は、基体
と、基体へスピンドル軸ケーシングと、スピンドル軸
と、調整用プレートと、プレート受け台と、液体貼着用
プレートと、液体連通孔とを具備したベースプレートに
おいて、調整用プレートは上面と下面とを真平行状態の
円板状に形成し、調整用プレートをテーパー面を介して
上方調整用プレートと下方調整用プレートとに分割させ
ると共に、調整用プレートに複数の固着部を形成し、夫
々の固着部へ固着具を装着して夫々の調整用プレートを
固着させる構成である。
Next, the structure of the second embodiment of the present invention comprises a base body, a spindle shaft casing for the base body, a spindle shaft, an adjusting plate, a plate receiving base, a liquid sticking plate, and a liquid communication hole. In the base plate provided with, the adjusting plate is formed into a disk shape with the upper surface and the lower surface in a true parallel state, and the adjusting plate is divided into an upper adjusting plate and a lower adjusting plate through a tapered surface. In this configuration, a plurality of fixing parts are formed on the adjusting plate, and fixing tools are attached to the fixing parts to fix the adjusting plates.

【0008】[0008]

【発明の作用】本発明は、調整用プレートを真平行状態
の円板状に形成し、テーパー面を介して分割させて一定
間隔に複数の固着部を形成し固着具を装着させることに
よって、ベースプレートの上面のミクロン単位の傾きを
自在に調整させるものである。
According to the present invention, the adjusting plate is formed in a disk shape in a true parallel state, divided through the tapered surface to form a plurality of fixing portions at regular intervals, and the fixing tool is attached. The inclination of the upper surface of the base plate in units of microns can be adjusted freely.

【0009】[0009]

【発明の実施例】斯る目的を達成した本発明のベースプ
レートの傾き調整機構を以下実施例の図面によって説明
する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The base plate inclination adjusting mechanism of the present invention which achieves the above object will be described below with reference to the drawings of the embodiments.

【0010】図1は本発明の第1実施例のベースプレー
トの傾き調整機構の概要側面図であり、図2は本発明の
第2実施例のベースプレートの傾き調整機構の概要側面
図であり、図3は調整用プレートの要部平面図であり、
図4は上方調整用プレートと下方調整用プレートの側面
図であり、図5は上方調整用プレートと下方調整用プレ
ートとの位置関係を表す側面図であり、図6は更に相違
する位置関係を表す夫々の上方調整用プレートと下方調
整用プレートとの側面図である。
FIG. 1 is a schematic side view of a base plate tilt adjusting mechanism according to a first embodiment of the present invention, and FIG. 2 is a schematic side view of a base plate tilt adjusting mechanism according to a second embodiment of the present invention. 3 is a plan view of a main part of the adjustment plate,
4 is a side view of the upper adjusting plate and the lower adjusting plate, FIG. 5 is a side view showing the positional relationship between the upper adjusting plate and the lower adjusting plate, and FIG. 6 shows a further different positional relationship. It is a side view of each upper adjustment plate and lower adjustment plate shown.

【0011】本発明は、例えば、超LSI等の基板と成
る半導体ウエハのような薄板状で硬質で脆性のワークの
上面と下面との真平行精度の加工を施すためのベースプ
レートの傾き調整機構に関するものであり、更に、詳細
には、研削盤、ラップ盤、ポリッシング盤等のベースプ
レートに実施されるものであり、第1実施例では、基体
と2、基体2へ固定されたスピンドル軸ケーシング3
と、該スピンドル軸ケーシング3へ回転自在に貫設させ
たスピンドル軸4と、該スピンドル軸4の上端へ着脱可
能に固着された調整用プレート5と、該調整用プレート
5の上端へ着脱可能に固着されたプレート受け台6と、
該プレート受け台6の上面の中心辺へ形成した凹陥部7
と、該凹陥部7に嵌入されワークWをチャックするバキ
ューム台8と、該バキューム台8の下方とバキューム機
構とを連通させたバキューム連通孔9とを具備したベー
スプレート1において、前記調整用プレート5は上面5
cと下面5dとを真平行状態の円板状に形成し、該調整
用プレート5の円周方向をテーパー面を介して上方調整
用プレート5aと下方調整用プレート5bとに分割させ
ると共に、夫々の調整用プレート5a.5bの外周に沿
って一定間隔に複数の固着部10.10.…を形成し、
該夫々の固着部10.10.…へ夫々固着具11.1
1.…を装着して夫々の調整用プレート5a.5bを固
着させるものである。
The present invention relates to an inclination adjusting mechanism of a base plate for processing a thin plate-like hard and brittle work such as a semiconductor wafer serving as a substrate of VLSI or the like with a true parallel accuracy between the upper surface and the lower surface. More specifically, it is carried out on a base plate such as a grinding machine, a lapping machine, and a polishing machine. In the first embodiment, the base body 2 and the spindle shaft casing 3 fixed to the base body 2 are used.
A spindle shaft 4 rotatably pierced through the spindle shaft casing 3, an adjustment plate 5 detachably fixed to the upper end of the spindle shaft 4, and an adjustment plate 5 detachably attached to the upper end of the adjustment plate 5. A fixed plate pedestal 6,
Recessed portion 7 formed on the center side of the upper surface of the plate pedestal 6
In the base plate 1 including the vacuum table 8 that is fitted into the recessed portion 7 and chucks the work W, and the vacuum communication hole 9 that communicates the lower part of the vacuum table 8 and the vacuum mechanism, the adjustment plate 5 Is the top 5
c and the lower surface 5d are formed in a disk shape in a true parallel state, and the circumferential direction of the adjusting plate 5 is divided into an upper adjusting plate 5a and a lower adjusting plate 5b via a tapered surface, and Adjusting plate 5a. 5b, a plurality of fixed portions 10.10. Form ...
The respective fixing portions 10.10. ... to the respective fastener 11.1
1. ... and each adjusting plate 5a. 5b is fixed.

【0012】そして、本発明の第2実施例では、基体と
2、基体2へ固定されたスピンドル軸ケーシング3と、
該スピンドル軸ケーシング3へ回転自在に貫設させたス
ピンドル軸4と、該スピンドル軸4の上端へ着脱可能に
固着された調整用プレート5と、該調整用プレート5の
上端へ着脱可能に固着されたプレート受け台6と、該プ
レート受け台6の上端へ着脱可能に固着された通水性部
材で形成した液体貼着用プレート8Aと、該液体貼着用
プレート8Aの下方と通水機構とを連通させた液体連通
孔9Aとを具備したベースプレート1において、前記調
整用プレート5は上面5cと下面5dとを真平行状態の
円板状に形成し、該調整用プレート5の円周方向をテー
パー面を介して上方調整用プレート5aと下方調整用プ
レート5bとに分割させると共に、夫々の調整用プレー
ト5a.5bの外周に沿って一定間隔に複数の固着部1
0.10.…を形成し、該夫々の固着部10.10.…
へ夫々固着具11.11.…を装着して夫々の調整用プ
レート5a.5bを固着させるものである。
In the second embodiment of the present invention, the base 2 and the spindle shaft casing 3 fixed to the base 2,
A spindle shaft 4 rotatably pierced through the spindle shaft casing 3, an adjusting plate 5 removably fixed to the upper end of the spindle shaft 4, and a removably fixed upper end of the adjusting plate 5. And a liquid receiving plate 8A formed of a water-permeable member that is detachably fixed to the upper end of the plate receiving base 6, and the lower part of the liquid attaching plate 8A and the water passage mechanism are communicated with each other. In the base plate 1 having the liquid communication holes 9A, the adjusting plate 5 is formed into a disk shape with the upper surface 5c and the lower surface 5d in a true parallel state, and the adjusting plate 5 has a tapered surface in the circumferential direction. Via the upper adjustment plate 5a and the lower adjustment plate 5b via the adjustment plate 5a. A plurality of fixed portions 1 at regular intervals along the outer periphery of 5b.
0.10. Are formed, and the respective fixed portions 10.10. …
Fasteners 11.11. ... and each adjusting plate 5a. 5b is fixed.

【0013】即ち、本発明のベースプレートの傾き調整
機構の第1実施例に基づいて詳述すると、昨今要求され
ている半導体ウエハであるワークWの上面と下面とを超
高精度の真平行精度で研削及び研磨加工を施すためにベ
ースプレート1の傾きを調整するものであって、研削盤
及び研磨盤等の函状の基体2の上面に貫通孔を穿設し、
該貫通孔に円筒状の外周へフランジ状の固定部を膨出さ
せたスピンドル軸ケーシング3をボルト等によって固定
し、該スピンドル軸ケーシング3へベアリングを介装し
て回転自在にスピンドル軸4を貫設させたものである。
That is, to explain in detail based on the first embodiment of the inclination adjusting mechanism of the base plate of the present invention, the upper surface and the lower surface of the work W which is a semiconductor wafer which has been demanded recently, can be realized with ultra-high accuracy of true parallelism. In order to adjust the inclination of the base plate 1 for performing grinding and polishing, a through hole is formed in the upper surface of a box-shaped base 2 such as a grinding machine and a polishing machine,
A spindle shaft casing 3 in which a flange-shaped fixing portion is bulged to a cylindrical outer periphery is fixed to the through hole by a bolt or the like, and a spindle is rotatably penetrated through the spindle shaft casing 3 through a bearing. It was set up.

【0014】前記スピンドル軸4の中心部へは貫通孔を
穿設しており、該貫通孔は後述するバキューム機構と連
通するバキューム連通孔9と成るものであり、そして、
該スピンドル軸4の下方はモーター(図示せず)等の駆
動源と無端ベルト等で接続された駆動源伝導手段を備え
たものである。
A through hole is formed in the center of the spindle shaft 4, and the through hole serves as a vacuum communication hole 9 which communicates with a vacuum mechanism described later, and
Below the spindle shaft 4 is provided a drive source transmission means connected to a drive source such as a motor (not shown) by an endless belt or the like.

【0015】前記スピンドル軸4の上端は若干膨出させ
て調整用プレート5との載置台を形成しており、その上
方へは調整用プレート5を固着具によって着脱可能に固
着されているものであり、固着手段は適宜な固着用孔を
穿設し、該固着用孔へ固着用具を埋没状態で装着するも
ので、実施例では螺状孔にボルトを埋没状態に螺着させ
て着脱可能としているものである。
The upper end of the spindle shaft 4 is slightly bulged to form a mounting table for the adjusting plate 5, and the adjusting plate 5 is detachably fixed to the upper part thereof by a fixing tool. The fixing means has a suitable fixing hole formed therein, and the fixing tool is mounted in the fixing hole in a buried state. In the embodiment, a bolt is screwed into the screw hole in a buried state so that the fixing means is removable. There is something.

【0016】更に、前記調整用プレート5の上端へはプ
レート受け台6を乗載させるものであり、該調整用プレ
ート5とプレート受け台6とは着脱可能に固着させるも
のであり、該プレート受け台6の上面の中心辺へは円板
状に陥没する凹陥部7を形成しており、該凹陥部7は後
述するバキューム台8を嵌入させるものであり、前記凹
陥部7の底面へはワークWをバキューム台8に吸着させ
るためにバキューム機構と連通させたバキューム連通孔
9をスピンドル軸4に貫通させているものである。
Further, a plate receiving stand 6 is mounted on the upper end of the adjusting plate 5, and the adjusting plate 5 and the plate receiving stand 6 are detachably fixed to each other. A disk-shaped recess 7 is formed on the center side of the upper surface of the base 6, and the vacuum base 8 described later is fitted into the recess 7. The bottom surface of the recess 7 has a workpiece. A vacuum communication hole 9 communicating with the vacuum mechanism for adsorbing W onto the vacuum table 8 is passed through the spindle shaft 4.

【0017】そして、バキューム台8は通気性を有する
ポーラスセラミック等の素材で円板状に形成し、前記プ
レート受け台6の凹陥部7に上面が平坦面と成るように
嵌入して、ワークWを乗載させてバキューム機構を作動
させることによって確りとチャックさせるものである。
The vacuum table 8 is made of a material such as porous ceramic having air permeability and is formed into a disk shape. The vacuum table 8 is fitted into the concave portion 7 of the plate receiving table 6 so that the upper surface thereof becomes a flat surface, and the work W Is carried on and the vacuum mechanism is operated to securely chuck.

【0018】本発明の要部と成る円板状の調整用プレー
ト5は上面5cと下面5dとを真平行状態に形成し、次
いで、該調整用プレート5の円周方向をテーパー面を介
して上方調整用プレート5aと下方調整用プレート5b
とに分割させたものであり、分割させた前記一対の調整
用プレート5a.5bの外周に沿って若干巾を有した内
方に一定間隔をおいて複数の固着部10.10.…を形
成したものであり、該夫々の固着部10.10.…へは
螺条を形成し、該螺条へボルト等の固着具11.11.
…を埋没状態で螺着することによって上方調整用プレー
ト5aと上方調整用プレート5bとを着脱自在に固着し
ているものである。
In the disk-shaped adjusting plate 5 which is the main part of the present invention, the upper surface 5c and the lower surface 5d are formed in a substantially parallel state, and then, the circumferential direction of the adjusting plate 5 is provided with a tapered surface in between. Upper adjustment plate 5a and lower adjustment plate 5b
And the pair of adjustment plates 5a. 5b along the outer periphery of the plurality of fixed portions 10.10. Are formed, and the respective fixed portions 10.10. A thread is formed on the thread, and a fastener 11.11.
The upper adjusting plate 5a and the upper adjusting plate 5b are detachably fixed by screwing the ... In a buried state.

【0019】前記複数の固着部10.10.…は、図3
に図示の如く、一定間隔に12個穿設しているものであ
るが、その数は特に限定しないものであり、上方調整用
プレート5aと上方調整用プレート5bとを合着させた
ときに合致する位置に設けているものである。
The plurality of fixing portions 10.10. ... is shown in Figure 3.
As shown in FIG. 12, 12 holes are provided at regular intervals, but the number is not particularly limited, and they match when the upper adjusting plate 5a and the upper adjusting plate 5b are attached. It is provided at the position where

【0020】つまり、上方調整用プレート5aと上方調
整用プレート5bとを図4に図示の如く対称させて合着
させた場合、上面5cと下面5dとは真平行状態と成
り、図6に図示の如く上方調整用プレート5aと上方調
整用プレート5bとを同一方向に合着させた場合、上面
5cと下面5dとの傾斜は最大と成り、図5に図示の如
くクロスさせて合着させた場合は前記の半分の傾斜と成
るものである。
That is, when the upper adjusting plate 5a and the upper adjusting plate 5b are attached symmetrically as shown in FIG. 4, the upper surface 5c and the lower surface 5d are in a true parallel state and are shown in FIG. When the upper adjusting plate 5a and the upper adjusting plate 5b are attached to each other in the same direction as described above, the inclination of the upper surface 5c and the lower surface 5d becomes the maximum, and the upper and lower plates 5a and 5b are cross-attached as shown in FIG. In this case, the inclination is half the above.

【0021】例えば、本発明の調整用プレート5のテー
パー面の高低差を30ミクロンに設定した場合、上方調
整用プレート5aと下方調整用プレート5bとを回動さ
せて、固着部10.10.…と固定具11.11.…に
よって合着させることによって、上面5cと下面5dと
は真平行状態から最大60ミクロンまで変更することが
可能と成り、従来不可能であった50ミクロン以下の誤
差の修正を5ミクロン程度に修正することを可能とした
ものである。
For example, when the height difference of the tapered surface of the adjusting plate 5 of the present invention is set to 30 μm, the upper adjusting plate 5a and the lower adjusting plate 5b are rotated to fix the fixing portions 10.10. … And fixture 11.11. It becomes possible to change the upper surface 5c and the lower surface 5d from the state of being parallel to a maximum of 60 microns by attaching them by ..., and the error of 50 microns or less, which was impossible in the past, is corrected to about 5 microns. It is possible to do.

【0022】本発明は、図1に図示した状態で加工され
た場合、ワークを取り外して計測し、傾斜を有したワー
クWであれば、調整用プレート5の角度を固着部10.
10.…と固定具11.11.…によって調整して、上
方調整用プレート5aの上面5bを平坦に設定して加工
すると、傾斜状態で加工される当該装置はワークWを平
行状態で加工することを可能とするものである。
In the present invention, when the work is processed in the state shown in FIG. 1, the work is removed and measured, and if the work W has an inclination, the angle of the adjusting plate 5 is set to the fixing portion 10.
10. … And fixture 11.11. When the upper surface 5b of the upper adjustment plate 5a is adjusted to be flat and processed by the adjustment, the apparatus that is processed in an inclined state can process the work W in a parallel state.

【0023】次いで、第2図に図示する第2実施例の本
発明のベースプレート1の傾き調整機構は、所謂、水冷
機構を備えたベースプレート1であり、第1実施例のバ
キューム台8に代えて通水性のポーラスセラミック等で
形成した液体貼着用プレート8Aを備え、更に、凹陥部
7を有したプレート受け台6は上面を平坦なプレート受
け台6に代え、バキューム連通孔9は液体連通孔9Aに
代えたものであり、ワークWを純水等の液体で貼着させ
るものであり、その他の構造及び作用、効果等も第1実
施例と同様なものである。
Next, the inclination adjusting mechanism of the base plate 1 according to the second embodiment of the present invention shown in FIG. 2 is the base plate 1 having a so-called water cooling mechanism, which is used in place of the vacuum table 8 of the first embodiment. The plate is provided with a liquid sticking plate 8A formed of a water-permeable porous ceramic or the like, and the plate receiving base 6 having the recessed portion 7 is replaced with a flat plate receiving base 6 at the upper surface, and the vacuum communication hole 9 is the liquid communication hole 9A. The work W is attached with a liquid such as pure water, and other structures, actions, effects, etc. are the same as those in the first embodiment.

【0024】[0024]

【発明の効果】本発明は、前述の構成から成り、調整用
プレートを真平行状態の円板状に形成し、テーパー面を
介して上方調整用プレートと下方調整用プレートとに分
割させ、一定間隔で複数の固着部を形成して固着具を装
着させ、回動させて夫々の調整用プレートを固着する簡
易な手段によって、ベースプレートの上面の傾きをミク
ロン単位に自在に調整させることを可能としたもので、
半導体ウエハ等のワークの超高精度の平行精度を可能と
したものであり、最終仕上製品の均一化を図れるもので
あり、その貢献性は計り知れないものがあり、極めて有
意義な効果を奏する発明である。
According to the present invention, which has the above-described structure, the adjusting plate is formed into a disk shape in a true parallel state, and is divided into an upper adjusting plate and a lower adjusting plate through a tapered surface, and is fixed. It is possible to freely adjust the inclination of the upper surface of the base plate in micron units by a simple means of forming a plurality of fixing parts at intervals and mounting a fixing tool and rotating and fixing each adjustment plate. I did it,
An invention that enables ultra-high precision parallelism of workpieces such as semiconductor wafers and that makes it possible to make the final finished product uniform, and its contribution is immeasurable and an extremely significant effect. Is.

【図面の簡単な説明】[Brief description of drawings]

【図1】図1は本発明の第1実施例のベースプレートの
傾き調整機構の概要側面図である。
FIG. 1 is a schematic side view of a tilt adjusting mechanism for a base plate according to a first embodiment of the present invention.

【図2】図2は本発明の第2実施例のベースプレートの
傾き調整機構の概要側面図である。
FIG. 2 is a schematic side view of a tilt adjusting mechanism for a base plate according to a second embodiment of the present invention.

【図3】図3は調整用プレートの要部平面図である。FIG. 3 is a plan view of an essential part of an adjustment plate.

【図4】図4は上方調整用プレートと下方調整用プレー
トの側面図である。
FIG. 4 is a side view of an upper adjustment plate and a lower adjustment plate.

【図5】図5は上方調整用プレートと下方調整用プレー
トとの位置関係を表す側面図である。
FIG. 5 is a side view showing a positional relationship between an upper adjustment plate and a lower adjustment plate.

【図6】図6は更に相違する位置関係を表す夫々の上方
調整用プレートと下方調整用プレートとの側面図であ
る。
FIG. 6 is a side view of the upper adjusting plate and the lower adjusting plate showing further different positional relationships.

【符号の説明】[Explanation of symbols]

W ワーク 1 ベースプレート 2 基体 3 スピンドル軸ケーシング 4 スピンドル軸 5 調整用プレート 5a 上方調整用プレート 5b 下方調整用プレート 5c 上面 5d 下面 6 プレート受け台 7 凹陥部 8 バキューム台 8A 液体貼着用プレート 9 バキューム連通孔 9A 液体連通孔 10 固着部 11 固着具 W Work 1 Base plate 2 Base 3 Spindle shaft casing 4 Spindle shaft 5 Adjustment plate 5a Up adjustment plate 5b Down adjustment plate 5c Upper surface 5d Lower surface 6 Plate cradle 7 Recessed portion 8 Vacuum stand 8A Liquid sticking plate 9 Vacuum communication hole 9A Liquid communication hole 10 Fixing part 11 Fixing tool

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】基体と、基体へ固定されたスピンドル軸ケ
ーシングと、該スピンドル軸ケーシングへ回転自在に貫
設させたスピンドル軸と、該スピンドル軸の上端へ着脱
可能に固着された調整用プレートと、該調整用プレート
の上端へ着脱可能に固着されたプレート受け台と、該プ
レート受け台の上面の中心辺へ形成した凹陥部と、該凹
陥部に嵌入されワークをチャックするバキューム台と、
該バキューム台の下方とバキューム機構とを連通させた
バキューム連通孔とを具備したベースプレートにおい
て、前記調整用プレートは上面と下面とを真平行状態の
円板状に形成し、該調整用プレートの円周方向をテーパ
ー面を介して上方調整用プレートと下方調整用プレート
とに分割させると共に、夫々の調整用プレートの外周に
沿って一定間隔に複数の固着部を形成し、該夫々の固着
部へ固着具を装着して夫々の調整用プレートを固着させ
ることを特徴とするベースプレートの傾き調整機構。
1. A base body, a spindle shaft casing fixed to the base body, a spindle shaft rotatably penetrating the spindle shaft casing, and an adjusting plate detachably fixed to the upper end of the spindle shaft. A plate pedestal detachably fixed to the upper end of the adjustment plate, a concave portion formed on the center side of the upper surface of the plate pedestal, and a vacuum table that is fitted into the concave portion and chucks a workpiece,
In a base plate having a vacuum communication hole that communicates the lower side of the vacuum table and a vacuum mechanism, the adjustment plate is formed into a disk shape in which the upper surface and the lower surface are in a true parallel state, and the circle of the adjustment plate. The circumferential direction is divided into an upper adjusting plate and a lower adjusting plate through a tapered surface, and a plurality of fixing portions are formed at regular intervals along the outer circumference of each adjusting plate, and the fixing portions are attached to the respective fixing portions. An inclination adjusting mechanism for a base plate, characterized in that a fixing tool is attached to fix each adjusting plate.
【請求項2】基体と、基体へ固定されたスピンドル軸ケ
ーシングと、該スピンドル軸ケーシングへ回転自在に貫
設させたスピンドル軸と、該スピンドル軸の上端へ着脱
可能に固着された調整用プレートと、該調整用プレート
の上端へ着脱可能に固着されたプレート受け台と、該プ
レート受け台の上端へ着脱可能に固着された通水性部材
で形成した液体貼着用プレートと、該液体貼着用プレー
トの下方と通水機構とを連通させた液体連通孔とを具備
したベースプレートにおいて、前記調整用プレートは上
面と下面とを真平行状態の円板状に形成し、該調整用プ
レートの円周方向をテーパー面を介して上方調整用プレ
ートと下方調整用プレートとに分割させると共に、夫々
の調整用プレートの外周に沿って一定間隔に複数の固着
部を形成し、該夫々の固着部へ固着具を装着して夫々の
調整用プレートを固着させることを特徴とするベースプ
レートの傾き調整機構。
2. A base body, a spindle shaft casing fixed to the base body, a spindle shaft rotatably pierced through the spindle shaft casing, and an adjusting plate detachably fixed to the upper end of the spindle shaft. A plate holder that is detachably fixed to the upper end of the adjustment plate, a liquid sticking plate formed of a water-permeable member that is detachably fixed to the upper end of the plate receiver, and a liquid sticking plate In a base plate having a liquid communication hole that communicates a lower portion with a water passage mechanism, the adjustment plate is formed into a disk shape in which the upper surface and the lower surface are exactly parallel to each other, and the adjustment plate has a circumferential direction. The plate is divided into an upper adjusting plate and a lower adjusting plate via a tapered surface, and a plurality of fixing portions are formed at regular intervals along the outer circumference of each adjusting plate. The base plate of the tilt adjustment mechanism, characterized in wearing the fastener be affixed to adjustment each plate to the fixing portion of the.
JP4510295A 1995-02-10 1995-02-10 Inclination adjusting mechanism for base plate Pending JPH08215964A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4510295A JPH08215964A (en) 1995-02-10 1995-02-10 Inclination adjusting mechanism for base plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4510295A JPH08215964A (en) 1995-02-10 1995-02-10 Inclination adjusting mechanism for base plate

Publications (1)

Publication Number Publication Date
JPH08215964A true JPH08215964A (en) 1996-08-27

Family

ID=12709935

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4510295A Pending JPH08215964A (en) 1995-02-10 1995-02-10 Inclination adjusting mechanism for base plate

Country Status (1)

Country Link
JP (1) JPH08215964A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010012540A (en) * 2008-07-02 2010-01-21 Koyo Mach Ind Co Ltd Inclination angle adjusting device and workpiece attaching device
JP2010012539A (en) * 2008-07-02 2010-01-21 Koyo Mach Ind Co Ltd Inclination angle adjusting device and workpiece attaching device
WO2011092744A1 (en) * 2010-01-29 2011-08-04 エヌ・ティ・ティ・アドバンステクノロジ株式会社 Optical fiber polishing apparatus
JP2013212571A (en) * 2012-03-06 2013-10-17 Tokyo Seimitsu Co Ltd Grinding device
KR101407708B1 (en) * 2012-03-06 2014-06-13 도쿄 세이미츄 코퍼레이션 리미티드 A grinding machine
JP2020099955A (en) * 2018-12-20 2020-07-02 ファナック株式会社 Rotary table

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010012540A (en) * 2008-07-02 2010-01-21 Koyo Mach Ind Co Ltd Inclination angle adjusting device and workpiece attaching device
JP2010012539A (en) * 2008-07-02 2010-01-21 Koyo Mach Ind Co Ltd Inclination angle adjusting device and workpiece attaching device
US8403731B2 (en) 2008-07-02 2013-03-26 Koyo Machine Industries Co., Ltd. Inclination angle adjusting device and workpiece attaching device
US8403732B2 (en) 2008-07-02 2013-03-26 Koyo Machine Industries Co., Ltd. Inclination angle adjusting device and workpiece attaching device
WO2011092744A1 (en) * 2010-01-29 2011-08-04 エヌ・ティ・ティ・アドバンステクノロジ株式会社 Optical fiber polishing apparatus
JP2013212571A (en) * 2012-03-06 2013-10-17 Tokyo Seimitsu Co Ltd Grinding device
KR101407708B1 (en) * 2012-03-06 2014-06-13 도쿄 세이미츄 코퍼레이션 리미티드 A grinding machine
JP2020099955A (en) * 2018-12-20 2020-07-02 ファナック株式会社 Rotary table

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