JPH10249687A - Double surface grinding-polishing machine of sheetlike workpiece - Google Patents
Double surface grinding-polishing machine of sheetlike workpieceInfo
- Publication number
- JPH10249687A JPH10249687A JP5358097A JP5358097A JPH10249687A JP H10249687 A JPH10249687 A JP H10249687A JP 5358097 A JP5358097 A JP 5358097A JP 5358097 A JP5358097 A JP 5358097A JP H10249687 A JPH10249687 A JP H10249687A
- Authority
- JP
- Japan
- Prior art keywords
- grinding
- workpiece
- work
- polishing
- double
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、半導体ウェーハ,磁気
ディスク,ガラス基板等の薄板状工作物を両面研削又は
両面研磨する装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for grinding or polishing both surfaces of a thin work such as a semiconductor wafer, a magnetic disk, and a glass substrate.
【0002】[0002]
【従来の技術】薄板状工作物の両面研削には、金属材料
の研削と同様なSiC,ホワイトアランダム等の砥石を
使用することが多い。たとえば、図1に示すようにカッ
プ砥石1,2の間に工作物3を挟み、工作物3を相対的
に回転させながら両面研磨している。カップ砥石1,2
の外径に比較して工作物3が小さいと、工作物3を保持
するキャリア4に十分な機械的強度を持たせることがで
き、キャリア4を介した工作物3の挿入・取出しも容易
である。また、カップ砥石1,2の内径を外径に対して
小さくすることによりカップ砥石1,2の作用面を大き
くとり、小さな工作物3を多数同時に研削することもで
きる。2. Description of the Related Art Grinding stones such as SiC, white alundum and the like similar to the grinding of metal materials are often used for double-side grinding of a thin plate-like workpiece. For example, as shown in FIG. 1, a work 3 is sandwiched between cup grindstones 1 and 2, and both sides are polished while the work 3 is relatively rotated. Cup whetstone 1,2
When the workpiece 3 is smaller than the outer diameter of the workpiece 3, the carrier 4 holding the workpiece 3 can have sufficient mechanical strength, and the insertion / removal of the workpiece 3 via the carrier 4 is easy. is there. In addition, by making the inner diameter of the cup grindstones 1 and 2 smaller than the outer diameter, the working surface of the cup grindstones 1 and 2 can be made larger, and a large number of small workpieces 3 can be ground simultaneously.
【0003】[0003]
【発明が解決しようとする課題】ところで、半導体ウェ
ーハのように硬質の脆性材料を研削する際には、ダイヤ
モンドを砥粒とした研削ホイールが使用されている。半
導体ウェーハは、厚さが1mm程度であり、しかも大き
な加工面積をもつ。そのため、工作物3よりも薄いキャ
リア4の使用が余儀なくされる両面研削では、キャリア
4による工作物3の保持が不安定になり、加工中に工作
物3の姿勢が変化し易い。加工中に工作物3の姿勢が変
化すると、姿勢の変化分に対応して局部的に大きな切込
が工作物3に与えられ、目的とする平坦度が得られな
い。他方、外径に対して内径が小さい、すなわち作用面
の大きな研削ホイールを使用すると、工作物3の面積が
大きいことから作用砥粒数が多くなり、研削抵抗が増大
する。研磨ホイールの主軸や支持系は、増大した研削抵
抗に耐えられなくなると変形する。その結果、砥粒が工
作物に切り込めず、工作物が研削できなくなる。このこ
とから、半導体ウェーハ等の硬質材料の研削には、外径
に比較して内径の小さな研削ホイールの使用が適してお
らず、ウェーハと研削ホイールとの接触面積を小さくせ
ざるを得ず、加工中のウェーハを不安定にする原因とな
る。When grinding a hard brittle material such as a semiconductor wafer, a grinding wheel using diamond as an abrasive is used. The semiconductor wafer has a thickness of about 1 mm and has a large processing area. Therefore, in the double-side grinding in which the use of the carrier 4 thinner than the workpiece 3 is required, the holding of the workpiece 3 by the carrier 4 becomes unstable, and the posture of the workpiece 3 is easily changed during the processing. If the posture of the workpiece 3 changes during machining, a large cut is locally applied to the workpiece 3 corresponding to the change in the posture, and the desired flatness cannot be obtained. On the other hand, when a grinding wheel having a smaller inner diameter with respect to the outer diameter, that is, a large working surface is used, the number of working abrasive grains increases because the area of the workpiece 3 is large, and the grinding resistance increases. The spindle and support system of the grinding wheel will deform if they cannot withstand the increased grinding force. As a result, the abrasive grains cannot be cut into the workpiece and the workpiece cannot be ground. For this reason, for grinding hard materials such as semiconductor wafers, the use of a grinding wheel with a smaller inner diameter than the outer diameter is not suitable, and the contact area between the wafer and the grinding wheel must be reduced, This may cause the wafer being processed to become unstable.
【0004】しかし、半導体デバイスの普及やチップサ
イズの大型化に伴ってウェーハも大径化する一方であ
る。この傾向に応じ、板厚に比較して加工面積の大きな
薄板状工作物を効率よく両面研磨する方法が従来にも増
して望まれている。このことは、大径化した磁気ディス
クやガラス基板の両面研磨においても同様である。以下
の説明及び請求項の文言では、研磨を包含する意味で研
削を使用している。本発明は、このような要望に応える
べく案出されたものであり、工作物の表面を保持パッド
で押圧しながら研磨することにより、加工面積の大きさ
に拘らず、安定した姿勢で工作物を両面研削又は両面研
磨することを目的とする。However, with the spread of semiconductor devices and the increase in chip size, the diameter of wafers is also increasing. In accordance with this tendency, a method for efficiently polishing both surfaces of a thin plate-shaped workpiece having a large processing area as compared with the plate thickness has been desired more than ever. The same is true for double-side polishing of a magnetic disk or a glass substrate having a large diameter. In the following description and claims, grinding is used to include polishing. The present invention has been devised to meet such a demand, and a workpiece is polished while pressing the surface of the workpiece with a holding pad, regardless of the size of the processing area, and the workpiece is stably positioned. For both-side grinding or both-side polishing.
【0005】[0005]
【課題を解決するための手段】本発明の薄板状工作物両
面研削・研磨装置は、その目的を達成するため、薄板状
工作物を挟んで対向配置される一対の研削主軸と、薄板
状工作物に対向する研削主軸の面に設けられたリング状
の研削ホイールと、研削ホイールの内側に設けられた工
作物保持体とを備え、工作物の中心点を研削ホイールが
通るように工作物に対して研削主軸が位置決めされるこ
とを特徴とする。工作物保持体として通気性及び通水性
のある多孔質セラミックス,多孔質プラスチックス,多
孔性の研磨クロス等を使用し、純水や砥粒分散液等を供
給する給水管及び排気管が研削主軸の内部空洞に設ける
とき、加工中の工作物の押圧保持は勿論、装着,取外し
時の工作物の吸着も可能となる。SUMMARY OF THE INVENTION In order to achieve the object, a double-sided grinding and polishing apparatus for a thin plate-like workpiece according to the present invention comprises: a pair of grinding spindles which are opposed to each other with a thin plate-like workpiece interposed therebetween; A ring-shaped grinding wheel provided on the surface of the grinding spindle facing the workpiece, and a workpiece holder provided inside the grinding wheel, and the workpiece is placed on the workpiece so that the grinding wheel passes through the center point of the workpiece. The grinding spindle is positioned with respect to the grinding spindle. Using porous ceramics, porous plastics, porous polishing cloth, etc., with air permeability and water permeability as the workpiece holder, the water supply pipe and exhaust pipe that supply pure water and abrasive dispersion liquid are the grinding spindle. When it is installed in the internal cavity, not only can the work being processed be pressed and held, but also the work can be sucked when it is mounted or removed.
【0006】[0006]
【実施の形態】本発明に従った両面研削装置を図面を参
照しながら説明するが、両面研磨装置にも同様な構成が
適用できることは勿論である。この両面研削装置は、図
2に示すように、工作物Wを挟んで配置される一対の研
削主軸10,20を備えている。工作物Wは、駆動ロー
ラ31,31で支持されながら回転する。研削主軸1
0,20は、研削ホイール11,21が工作物Wの中心
点Cを通る位置関係で工作物Wに対向配置される。この
位置関係は、研削ホイール21が当接する箇所を点線と
して図2に示している。研削主軸10には、リング状の
研削ホイール11が取り付けられており、研削ホイール
11の内側に工作物保持体12が設けられている。工作
物保持体12で工作物Wの表面大部分が保持される。研
削ホイール11には、一般にレジン,ビトリファイド,
メタルボンド等からなるダイヤモンドホイールが使用さ
れる。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A double-side grinding apparatus according to the present invention will be described with reference to the drawings, but it is needless to say that a similar configuration can be applied to a double-side polishing apparatus. As shown in FIG. 2, the double-sided grinding device includes a pair of grinding spindles 10 and 20 arranged with a workpiece W interposed therebetween. The workpiece W rotates while being supported by the drive rollers 31,31. Grinding spindle 1
Numerals 0 and 20 are arranged opposite to the workpiece W in a positional relationship where the grinding wheels 11 and 21 pass through the center point C of the workpiece W. This positional relationship is shown in FIG. 2 as a dotted line where the grinding wheel 21 contacts. A ring-shaped grinding wheel 11 is attached to the grinding spindle 10, and a workpiece holder 12 is provided inside the grinding wheel 11. Most of the surface of the workpiece W is held by the workpiece holder 12. In general, resin, vitrified,
A diamond wheel made of a metal bond or the like is used.
【0007】工作物保持体12として、通気性及び通水
性のある多孔質セラミックス,多孔質プラスチックス,
多孔性の研磨クロス等を使用できる。この場合、研削主
軸10は、図3に示すように研削ホイール保持用の回転
ユニット15の内部に保持体固定用の回転軸16を挿通
しており、加工液供給源(図示せず)に接続された給水
管13及び真空源(図示せず)に接続された排気管14
が内部に配置されている。工作物保持体12は、たとえ
ばボルトナット等によって回転軸16に固着されてお
り、排気管14を介した真空吸着で工作物Wを保持す
る。他方の研削主軸20も、同様な構造をもっている。
回転軸16は、使用する工作物保持体12の種類に対応
して研削ホイール11の加工作用面17と工作物保持体
12の保持面18との間のギャップ19を調整できるよ
うに、軸方向のスライド機構(図示せず)を具備するこ
とができる。As the workpiece holder 12, porous ceramics, porous plastics,
A porous polishing cloth or the like can be used. In this case, as shown in FIG. 3, the grinding spindle 10 has a rotating shaft 16 for holding the holder inserted through a rotating unit 15 for holding the grinding wheel, and is connected to a working fluid supply source (not shown). Water pipe 13 and exhaust pipe 14 connected to a vacuum source (not shown)
Is arranged inside. The workpiece holder 12 is fixed to the rotating shaft 16 by, for example, a bolt and a nut, and holds the workpiece W by vacuum suction via the exhaust pipe 14. The other grinding spindle 20 has a similar structure.
The rotating shaft 16 is arranged in the axial direction so that the gap 19 between the working surface 17 of the grinding wheel 11 and the holding surface 18 of the work holder 12 can be adjusted according to the type of the work holder 12 to be used. (Not shown).
【0008】回転軸15及び回転軸16は、それぞれ独
立して回転数を設定できるようになっており、実際の加
工に際しては回転軸16を必要に応じて回転数ゼロ、す
なわち停止状態に維持してもよい。なお、図3は、保持
面18が加工作用面17よりも後退した状態となるよう
にギャップ19を設けている。しかし、これに拘束され
ることなく、工作物保持体12として軟質で多孔性の研
磨クロスを用いる場合等では、保持面18が前進した状
態となるようにギャップ19を設定することも可能であ
る。工作物Wの研削に際しては、真空チャック(図示せ
ず)に吸着した工作物Wを駆動ローラ31,31に載
せ、工作物Wの中心点Cに研削ホイール11が来るよう
に片方の研削主軸10に対して位置合わせする。このと
き、回転軸16を前進させておき、保持面18が加工作
用面17よりも突出した状態にしておくことが好まし
い。The rotation speed of the rotation shaft 15 and the rotation shaft 16 can be set independently of each other. In actual machining, the rotation shaft 16 is maintained at a rotation speed of zero, that is, a stopped state, as required. You may. In FIG. 3, the gap 19 is provided so that the holding surface 18 is retracted from the working surface 17. However, without being restricted to this, when a soft and porous polishing cloth is used as the workpiece holder 12, the gap 19 can be set so that the holding surface 18 is in an advanced state. . At the time of grinding the workpiece W, the workpiece W adsorbed on the vacuum chuck (not shown) is placed on the driving rollers 31, and one of the grinding spindles 10 is moved so that the grinding wheel 11 comes to the center point C of the workpiece W. Align to. At this time, it is preferable that the rotating shaft 16 be advanced so that the holding surface 18 projects from the working surface 17.
【0009】次いで、排気管14を介した吸引により、
工作物Wを工作物保持体12に吸着させた後、真空チャ
ックによる工作物Wの吸着を解除する。同様にして、他
方の研削主軸20側も保持面を工作物Wの他面に接触さ
せる。そして、給水管13を介して所定の加工液を工作
物Wの両側から同時に供給する。このとき、工作物Wを
安定に保持するためには、加工液の圧力及び流量を工作
物Wの両側で等しくなるように設定することが好まし
い。加工液には、純水又は必要に応じて砥粒を分散させ
た研磨液が使用される。研削主軸10,20の間の所定
位置に工作物Wを保持した後、工作物W及び研削主軸1
0,20を回転させる。このようにして工作物Wの表面
の大部分が工作物保持体12,22で保持されながら、
研削ホイール11,21により両面研削される。そのた
め、加工中に工作物Wの姿勢が安定に保たれ、高精度な
両面研削が可能となる。研削終了後、給水管13からの
加工液の供給を停止し、排気管14を介した真空吸引に
より片方の研削主軸10に研削済みの工作物Wを吸着さ
せる。そして、他方の研削主軸20を後退させ、工作物
Wを真空チャックに移し取り、次工程に搬送する。Next, by suction through the exhaust pipe 14,
After the workpiece W is attracted to the workpiece holder 12, the suction of the workpiece W by the vacuum chuck is released. Similarly, the holding surface of the other grinding spindle 20 is brought into contact with the other surface of the workpiece W. Then, a predetermined working fluid is simultaneously supplied from both sides of the workpiece W through the water supply pipe 13. At this time, in order to stably hold the workpiece W, it is preferable to set the pressure and the flow rate of the machining fluid to be equal on both sides of the workpiece W. As the working liquid, pure water or a polishing liquid in which abrasive grains are dispersed as necessary is used. After holding the workpiece W at a predetermined position between the grinding spindles 10 and 20, the workpiece W and the grinding spindle 1 are held.
Rotate 0,20. In this way, most of the surface of the workpiece W is held by the workpiece holders 12 and 22,
Both surfaces are ground by the grinding wheels 11 and 21. Therefore, the posture of the workpiece W is kept stable during processing, and high-precision double-side grinding can be performed. After the grinding is completed, the supply of the working fluid from the water supply pipe 13 is stopped, and the ground workpiece W is attracted to one of the grinding spindles 10 by vacuum suction through the exhaust pipe 14. Then, the other grinding spindle 20 is retracted, the workpiece W is transferred to the vacuum chuck, and transported to the next step.
【0010】[0010]
【発明の効果】以上に説明したように、本発明の両面研
削・研磨装置においては、リング状の研磨ホイールの内
側に配置した工作物保持体で工作物の表面大部分を保持
しながら研削するため、加工される工作物の板厚に比較
して面積が大きなものであっても、加工中に工作物の姿
勢が安定に保持される。そのため、大径の工作物であっ
ても高精度な加工が可能となる。As described above, in the double-sided grinding / polishing apparatus of the present invention, the workpiece is ground while holding most of the surface of the workpiece with the workpiece holder disposed inside the ring-shaped grinding wheel. Therefore, even if the area of the workpiece is large compared to the thickness of the workpiece, the posture of the workpiece is stably maintained during the processing. Therefore, high-precision machining is possible even for a large-diameter workpiece.
【図1】 従来のカップ砥石を用いた両面研磨装置FIG. 1 shows a conventional double-side polishing apparatus using a cup grinding wheel.
【図2】 本発明に従った両面研磨装置FIG. 2 shows a double-side polishing apparatus according to the present invention.
【図3】 給水管及び排気管を内蔵した研削主軸Fig. 3 Grinding spindle with built-in water supply pipe and exhaust pipe
10,20:研削主軸 11,21:研削ホイール
12,22:工作物保持体 13:給水管 1
4:排気管 15:回転ユニット 16:回転軸
17:加工作用面 18:保持面 19:ギャッ
プ 31:駆動ローラ W:工作物 C:工作物の中心点10, 20: grinding spindle 11, 21: grinding wheel
12, 22: Work holder 13: Water pipe 1
4: Exhaust pipe 15: Rotating unit 16: Rotating shaft
17: Working surface 18: Holding surface 19: Gap 31: Drive roller W: Workpiece C: Center point of workpiece
Claims (2)
対の研削主軸と、薄板状工作物に対向する研削主軸の面
に設けられたリング状の研削ホイールと、研削ホイール
の内側に設けられた工作物保持体とを備え、工作物の中
心点を研削ホイールが通るように工作物に対して研削主
軸が位置決めされる薄板状工作物の両面研削・研磨装
置。1. A pair of grinding spindles arranged opposite to each other with a thin plate-shaped workpiece interposed therebetween, a ring-shaped grinding wheel provided on a surface of the grinding spindle facing the thin plate-shaped workpiece, and provided inside the grinding wheel. A double-sided grinding / polishing apparatus for a thin plate-shaped workpiece, comprising a workpiece holder and a grinding spindle positioned with respect to the workpiece so that a grinding wheel passes through a center point of the workpiece.
使用し、液体を供給する給水管及び排気管が研削主軸の
内部空洞に設けられている請求項1記載の薄板状工作物
の両面研削・研磨装置。2. The thin plate-shaped workpiece according to claim 1, wherein a water supply pipe and an exhaust pipe for supplying a liquid are provided in an internal cavity of the grinding spindle, using a work holder having air permeability and water permeability. Double-sided grinding and polishing equipment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5358097A JPH10249687A (en) | 1997-03-07 | 1997-03-07 | Double surface grinding-polishing machine of sheetlike workpiece |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5358097A JPH10249687A (en) | 1997-03-07 | 1997-03-07 | Double surface grinding-polishing machine of sheetlike workpiece |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH10249687A true JPH10249687A (en) | 1998-09-22 |
Family
ID=12946788
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5358097A Pending JPH10249687A (en) | 1997-03-07 | 1997-03-07 | Double surface grinding-polishing machine of sheetlike workpiece |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH10249687A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008053421A (en) * | 2006-08-24 | 2008-03-06 | Micro Materials Japan:Kk | Grinding machine and grinding method of wafer pattern for reproducing wafer |
CN102814711A (en) * | 2012-08-13 | 2012-12-12 | 镇江金港磁性元件有限公司(中外合资) | Dual surface grinding machine |
JP2013215813A (en) * | 2012-04-05 | 2013-10-24 | Koyo Mach Ind Co Ltd | Method for carrying workpiece in/out in double disk grinding and double disk grinder |
CN107855850A (en) * | 2017-11-23 | 2018-03-30 | 马鞍山市飞达波纹管制造有限公司 | A kind of metal tube polishing device |
CN114700857A (en) * | 2022-06-06 | 2022-07-05 | 徐州领测半导体科技有限公司 | Semiconductor wafer polishing device capable of completely removing ring-shaped oxide layer |
-
1997
- 1997-03-07 JP JP5358097A patent/JPH10249687A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008053421A (en) * | 2006-08-24 | 2008-03-06 | Micro Materials Japan:Kk | Grinding machine and grinding method of wafer pattern for reproducing wafer |
JP2013215813A (en) * | 2012-04-05 | 2013-10-24 | Koyo Mach Ind Co Ltd | Method for carrying workpiece in/out in double disk grinding and double disk grinder |
CN102814711A (en) * | 2012-08-13 | 2012-12-12 | 镇江金港磁性元件有限公司(中外合资) | Dual surface grinding machine |
CN107855850A (en) * | 2017-11-23 | 2018-03-30 | 马鞍山市飞达波纹管制造有限公司 | A kind of metal tube polishing device |
CN114700857A (en) * | 2022-06-06 | 2022-07-05 | 徐州领测半导体科技有限公司 | Semiconductor wafer polishing device capable of completely removing ring-shaped oxide layer |
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