JPH05285807A - Ultra-precision processing method - Google Patents

Ultra-precision processing method

Info

Publication number
JPH05285807A
JPH05285807A JP11848292A JP11848292A JPH05285807A JP H05285807 A JPH05285807 A JP H05285807A JP 11848292 A JP11848292 A JP 11848292A JP 11848292 A JP11848292 A JP 11848292A JP H05285807 A JPH05285807 A JP H05285807A
Authority
JP
Japan
Prior art keywords
grinding
ultra
precision
polishing
grindstone
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP11848292A
Other languages
Japanese (ja)
Inventor
Nobuo Yasunaga
暢男 安永
Kozo Abe
耕三 阿部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP11848292A priority Critical patent/JPH05285807A/en
Publication of JPH05285807A publication Critical patent/JPH05285807A/en
Withdrawn legal-status Critical Current

Links

Landscapes

  • Grinding Of Cylindrical And Plane Surfaces (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)

Abstract

(57)【要約】 【目的】 研削と研磨と同一の装置で行い高能率化、低
コスト化を目的とする。 【構成】 研削砥石ヘッドの回転ブレ及び加工体を担持
するターンテーブルの回転ブレを0.1μm以下とした
超精密研削装置において、研削砥石を用いて鏡面に近い
表面粗さまで超精密研削を行い、続いて研削砥石をはず
して研磨工具と交換して超精密研削と同一方式で鏡面研
磨を行う超精密加工法。又同一超精密研削装置に同一砥
石ヘッドを2組並列させ、一方に研削砥石を、他方に研
磨工具を装着し、研削終了後加工物を移動させて研磨を
行う超精密加工法。
(57) [Summary] [Purpose] Aiming at high efficiency and low cost by performing grinding and polishing with the same equipment. [Structure] In an ultra-precision grinding device with a rotational wobble of a grinding wheel head and a rotational wobble of a turntable carrying a processed body of 0.1 μm or less, ultra-precision grinding is performed using a grinding wheel to a surface roughness close to a mirror surface, Next, an ultra-precision machining method that removes the grinding wheel and replaces it with a polishing tool to perform mirror polishing in the same way as ultra-precision grinding. An ultra-precision machining method in which two sets of the same grindstone heads are arranged in parallel in the same super-precision grinder, a grinding grindstone is mounted on one side, and a polishing tool is mounted on the other side, and after finishing grinding, the workpiece is moved to perform polishing.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体ウエハ、ハードデ
ィスク、石英基板、水晶振動子などの電子材料用あるい
はその他の硝子用、セラミックス用、金属用の研磨方法
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing method for electronic materials such as semiconductor wafers, hard disks, quartz substrates, and crystal oscillators, or for other glass, ceramics, and metals.

【0002】[0002]

【従来の技術】シリコーンウエーハ、ハードディスク、
石英基板、水晶振動子などの電子材料の研削加工表面仕
上げ、その他硝子、セラミックスあるいは金属素材の研
削加工、表面仕上に研磨砥石が汎く用いられている。研
削研磨に要求されているのは高研磨速度、低ダメージ、
低コストであるが近年の光学機器、電子機器の技術的進
歩に伴い、硝子素材の需要も増大し、より迅速な研磨、
より精密な仕上げの要求が高まっている。
2. Description of the Related Art Silicone wafers, hard disks,
Abrasive grindstones are generally used for grinding surface finishing of electronic materials such as quartz substrates and crystal oscillators, grinding of glass, ceramics or metal materials, and surface finishing. Grinding and polishing requires high polishing rate, low damage,
Although the cost is low, the demand for glass materials has increased with the recent technological advances of optical equipment and electronic equipment.
The demand for more precise finishing is increasing.

【0003】ところで研削と研磨は全く異った装置で夫
々行われている。段取替の時間手間が大きく、精度保障
も困難であった。また粗研削と精密研削を2ヘッドで行
う方法は既に知られているがこれも研削同士の間でしか
ない。
By the way, grinding and polishing are performed by completely different devices. It took a lot of time and trouble to change the setup, and it was difficult to guarantee accuracy. A method of performing rough grinding and precision grinding with two heads is already known, but this is also only between grinding.

【0004】[0004]

【発明が解決しようとする課題】本発明は研削と研磨を
同一の装置で行い高能率化、低コスト化をはかろうとす
ることを目的とする。
SUMMARY OF THE INVENTION It is an object of the present invention to carry out grinding and polishing in the same device to improve efficiency and reduce cost.

【0005】[0005]

【課題を解決するための手段】砥石保持部材の軸の回転
ブレ及び被加工体を担持するターンテーブルの回転ブレ
を0.1μm以下とした研削装置において、研削砥石を
用いて鏡面に近い表面粗さまで超精密研削を行い、続い
て研削砥石に替えて研磨工具を装着し超精密研削と同一
方式で鏡面研磨を行うことを特徴とする超精密加工方法
でもある。
[Means for Solving the Problems] In a grinding device in which the rotational shake of a shaft of a grindstone holding member and the rotary shake of a turntable carrying a work piece are set to 0.1 μm or less, a surface roughness close to a mirror surface is obtained by using a grinding grindstone. It is also an ultra-precision processing method characterized by performing ultra-precision grinding, then replacing the grinding wheel with a polishing tool and performing mirror-surface polishing in the same manner as ultra-precision grinding.

【0006】又前記同一超精密研削装置に同一砥石ヘッ
ドを2組並列させ、一方に研削砥石を、他方に研磨工具
を装着し、研削終了後下の被加工体を担持するターンテ
ーブルを配置した加工物を移動させて研磨を行うことを
特徴とする超精密加工方法。
Further, two sets of the same grindstone heads are arranged in parallel in the same super-precision grinding device, a grinding grindstone is mounted on one side, and a polishing tool is mounted on the other side, and a turntable for carrying a lower work piece after grinding is arranged. An ultra-precision machining method characterized in that a workpiece is moved and polished.

【0007】なお研磨工具としては研磨用砥粒を含む研
削砥石状の研磨砥石でも、シート状の研磨布を研削砥石
状の基板に貼付したものでもよい。後者の場合は必要に
応じて微細砥粒を含む研磨剤を供給する。
The polishing tool may be a grinding stone in the form of a grinding stone containing abrasive grains, or a sheet-shaped polishing cloth attached to a substrate in the form of a grinding stone. In the latter case, an abrasive containing fine abrasive grains is supplied as needed.

【0008】[0008]

【作用】本発明について図面を示して説明する。図1に
おいて、2の研削砥石は砥石ヘッド(研削砥石)保持部
1に保持され昇降自在になっている。
The present invention will be described with reference to the drawings. In FIG. 1, a grinding wheel 2 is held by a wheel head (grinding wheel) holder 1 and can be raised and lowered.

【0009】砥石ヘッドは各種類の研削砥石を交換保持
でき、図示しないが駆動モータで回転するようになって
いる。砥石ヘッドを降下せしめて、研削砥石を回転して
ターンテーブル4上に担持した加工物3の表面に切り込
ませて研削する。
The grindstone head is capable of exchanging and holding various kinds of grindstones, and is rotated by a drive motor (not shown). The grindstone head is lowered and the grinding grindstone is rotated to cut into the surface of the workpiece 3 carried on the turntable 4 for grinding.

【0010】ターンテーブル4は移動スライド5に固定
され、スライドベース6の上を移動できる。この場合粗
研削から仕上研削、研磨、と砥石を交換することにより
最終研磨まで一つの装置で行うことができる。
The turntable 4 is fixed to the moving slide 5 and can move on the slide base 6. In this case, the rough grinding, the finish grinding, the polishing, and the final grinding can be performed by one apparatus by exchanging the grindstone.

【0011】図2の場合は上記と同一の砥石ヘッド1を
並列に並べて設置し、二つの砥石ヘッドに共通のスライ
ド7と一つの加工物移動スライド5にターンテーブル4
を配置し、加工物をターンテーブル4に担持する。この
場合、一方に研削砥石を、他方に研磨工具を装着し、研
削終了後被加工物を移動させて研磨を行うものである。
In the case of FIG. 2, the same grindstone heads 1 as described above are installed side by side in parallel, and the slide 7 common to the two grindstone heads and the turntable 4 to one workpiece moving slide 5 are arranged.
Is placed, and the workpiece is supported on the turntable 4. In this case, a grinding wheel is attached to one side and a polishing tool is attached to the other side, and after finishing the grinding, the workpiece is moved to perform the polishing.

【0012】本発明に於て研削砥石と研磨砥石を同一の
研削装置に装着使用できるのは、この研削装置のターン
テーブル、砥石ヘッドの各々の回転ブレが0.1μm以
下であるためである。このような装置を使用することに
よって研削後に研磨砥石あるいは研削砥石状基板にシー
ト状の研磨布を貼付して研磨液を使用して精密な研磨が
可能となる。
In the present invention, the grinding grindstone and the polishing grindstone can be mounted and used in the same grinder because the rotational shake of each of the turntable and grindstone head of this grinder is 0.1 μm or less. By using such a device, it is possible to attach a sheet-like polishing cloth to a polishing grindstone or a grinding grindstone-like substrate after grinding and perform precise polishing using a polishing liquid.

【0013】以上説明したように加工体を一旦ターンテ
ーブルに担持すれば最終研磨まで加工体を脱着させずに
加工でき、高い加工精度が得られると同時に能率も極め
て高い。
As described above, once the processed body is carried on the turntable, it can be processed until the final polishing without detaching the processed body, so that high processing accuracy can be obtained and at the same time the efficiency is extremely high.

【0014】[0014]

【実施例】【Example】

(実施例1)砥石ヘッドを1セットのみ有する超精密研
削装置において、砥石ヘッドにカップ形の#2000ビ
トリファイドボンドダイヤモンド砥石(外径200m
m,作用面幅3mm)を装着し、砥石ヘッドを下降さ
せ、2000rpmで回転させる。
(Example 1) In an ultra-precision grinding machine having only one set of grinding wheel heads, a cup-shaped # 2000 vitrified bond diamond grinding wheel (outer diameter 200 m)
m, working surface width 3 mm), the grindstone head is lowered and rotated at 2000 rpm.

【0015】ターンテーブルに設置され、500rpm
で回転する直径150mmのSiウエハの回転中心を砥
石作用面のほぼ中央付近が通過するような配置で砥石を
Siウエハに接触させ、10μm/分の切り込み速度で
降下させて2分間研削したところ、表面あらさRmax
0.2μmの疑似鏡面が得られた。
Installed on the turntable, 500 rpm
When the grinding wheel is brought into contact with the Si wafer in such a position that the rotation center of the Si wafer having a diameter of 150 mm passing through the grinding stone approximately the center of the grinding wheel working surface is passed and the grinding speed is lowered at a cutting speed of 10 μm / min for 2 minutes, Surface roughness Rmax
A pseudo mirror surface of 0.2 μm was obtained.

【0016】次ぎに砥石を交換し、粒径3μmのBaC
3 粉末を体積比50%で含有するSiウエハ用研磨砥
石を装着し、上記研削と同様の手順で、但し1μm/分
の切り込み速度で砥石ヘッドを降下させて2分間研磨し
たところRmax5nmの無歪鏡面がえられた。しかも
ウエハ全体の平坦度も0.8μmと良好であった。
Next, the grindstone was exchanged, and BaC having a particle diameter of 3 μm was used.
A Si wafer polishing grindstone containing O 3 powder in a volume ratio of 50% was attached, and the procedure was similar to the above grinding, except that the grindstone head was lowered at a cutting speed of 1 μm / min to polish for 2 minutes. A distorted mirror surface was obtained. Moreover, the flatness of the entire wafer was as good as 0.8 μm.

【0017】(実施例2)砥石ヘッドを2セット有する
超精密研削装置において、第1の砥石ヘッドにカップ形
の#2000ビトリファイドボンドダイヤモンド砥石
(外径200mm作用面幅3mm)を装着し、第2の砥
石ヘッドにカップ形研削砥石と同形状・同寸法(但し作
用面幅は50mm)のアルミニウム合金製ベースの作用
面に不織布ポリシングクロスを貼付けた研磨工具を装着
する。
(Embodiment 2) In an ultra-precision grinding machine having two sets of grinding wheel heads, a cup-shaped # 2000 vitrified bond diamond grinding wheel (outer diameter 200 mm, working surface width 3 mm) was mounted on the first grinding wheel head, and A polishing tool in which a non-woven cloth polishing cloth is attached to the working surface of an aluminum alloy base having the same shape and size as the cup-shaped grinding wheel (however, the working surface width is 50 mm) is mounted on the whetstone head.

【0018】直径150mmのSiウエハを設置したタ
ーンテーブルは移動スライド上に設置され、スライドベ
ース上を移動して第1砥石ヘッドと第2砥石ヘッドの両
ヘッドで同じ加工を実施できる。
A turntable on which a Si wafer having a diameter of 150 mm is installed is installed on a moving slide, and moves on a slide base so that the same processing can be performed by both the first grinding wheel head and the second grinding wheel head.

【0019】先ず第1の砥石ヘッドで上記(実施例1)
で行ったと同じ方法で研削を行い、Rmax0.2μm
の疑似鏡面を得た。次ぎにターンテーブルを第2の砥石
ヘッドの下へ移動し、研削のときと同じ位置関係になる
ようにSiウエハを配置し、コロイダルシリカ研磨剤を
流量5リットル/分でSiウエハ表面に供給しながら1
μm/分の切り込み速度で2分間研磨したところ、Rm
ax7nmの無歪鏡面が得られた。ウエハ全体の平坦度
も0.9μmと良好であった。
First, the first grindstone head is used for the above (Example 1).
Grinded in the same way as done in Rmax 0.2 μm
I got a pseudo mirror surface. Next, the turntable is moved to below the second grindstone head, the Si wafer is arranged so as to have the same positional relationship as that at the time of grinding, and colloidal silica abrasive is supplied to the surface of the Si wafer at a flow rate of 5 liters / minute. While 1
After polishing for 2 minutes at a cutting speed of μm / min, Rm
A strain-free mirror surface of ax 7 nm was obtained. The flatness of the entire wafer was as good as 0.9 μm.

【0020】[0020]

【発明の効果】同一研削装置で研削と研磨を連続して行
うので、従来の別々の装置で行うのと比較して高能率
化、省力化、高精度化、低コストが可能となる。
Since grinding and polishing are continuously performed by the same grinding apparatus, higher efficiency, labor saving, higher accuracy, and lower cost can be achieved as compared with the case where separate conventional apparatuses are used.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明方法に使用する研磨装置FIG. 1 is a polishing apparatus used in the method of the present invention.

【図2】本発明方法に使用する研磨装置の他の例FIG. 2 is another example of a polishing apparatus used in the method of the present invention.

【符号の説明】[Explanation of symbols]

1 研削砥石保持部 2 研削砥石 3 加工物 4 ターンテーブル 5 移動スライド 6 スライドベース 1 Grinding grindstone holding part 2 Grinding grindstone 3 Workpiece 4 Turntable 5 Moving slide 6 Slide base

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 研削砥石ヘッドの回転ブレ及び加工体を
担持するターンテーブルの回転ブレを0.1μm以下と
した超精密研削装置において、研削砥石を用いて鏡面に
近い表面粗さまで超精密研削を行い、続いて研削砥石を
はずして研磨工具と交換して超精密研削と同一方式で鏡
面研磨を行うことを特徴とする超精密加工法。
1. In an ultra-precision grinding apparatus in which the rotational shake of a grinding wheel head and the rotational shake of a turntable carrying a workpiece are 0.1 μm or less, ultra-precision grinding is performed using a grinding wheel to a surface roughness close to a mirror surface. An ultra-precision machining method characterized in that the grinding wheel is removed and then replaced with a polishing tool to perform mirror surface polishing in the same manner as ultra-precision grinding.
【請求項2】 請求項1記載と同一超精密研削装置に同
一砥石ヘッドを2組並列させ、一方に研削砥石を、他方
に研磨工具を装着し、研削終了後加工物を移動させて研
磨を行うことを特徴とする超精密加工法。
2. The same ultra-precision grinding apparatus as in claim 1, two sets of the same grindstone heads are arranged in parallel, a grinding grindstone is mounted on one side, and a polishing tool is mounted on the other side. Ultra-precision processing method characterized by performing.
【請求項3】 研磨工具としては研磨砥粒を含む研削砥
石状の研磨砥石、シート状の研磨布を研削砥石状の基板
に貼付け必要に応じ微細砥粒を含む研磨剤を供給するも
のを使用する請求項1、請求項2記載の超精密加工法。
3. As the polishing tool, a grinding stone in the form of a grinding stone containing abrasive grains, or a sheet-shaped polishing cloth attached to a substrate in the form of a grinding stone to supply an abrasive containing fine abrasive grains as needed is used. The ultra-precision processing method according to claim 1 or 2.
JP11848292A 1992-04-13 1992-04-13 Ultra-precision processing method Withdrawn JPH05285807A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11848292A JPH05285807A (en) 1992-04-13 1992-04-13 Ultra-precision processing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11848292A JPH05285807A (en) 1992-04-13 1992-04-13 Ultra-precision processing method

Publications (1)

Publication Number Publication Date
JPH05285807A true JPH05285807A (en) 1993-11-02

Family

ID=14737771

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11848292A Withdrawn JPH05285807A (en) 1992-04-13 1992-04-13 Ultra-precision processing method

Country Status (1)

Country Link
JP (1) JPH05285807A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6343978B1 (en) 1997-05-16 2002-02-05 Ebara Corporation Method and apparatus for polishing workpiece
US6354922B1 (en) 1999-08-20 2002-03-12 Ebara Corporation Polishing apparatus
US6413156B1 (en) 1996-05-16 2002-07-02 Ebara Corporation Method and apparatus for polishing workpiece
US6595831B1 (en) 1996-05-16 2003-07-22 Ebara Corporation Method for polishing workpieces using fixed abrasives
US6682408B2 (en) 1999-03-05 2004-01-27 Ebara Corporation Polishing apparatus
JP2010023163A (en) * 2008-07-17 2010-02-04 Disco Abrasive Syst Ltd Processing device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6413156B1 (en) 1996-05-16 2002-07-02 Ebara Corporation Method and apparatus for polishing workpiece
US6595831B1 (en) 1996-05-16 2003-07-22 Ebara Corporation Method for polishing workpieces using fixed abrasives
US7011569B2 (en) 1996-05-16 2006-03-14 Ebara Corporation Method and apparatus for polishing workpiece
US6343978B1 (en) 1997-05-16 2002-02-05 Ebara Corporation Method and apparatus for polishing workpiece
US6682408B2 (en) 1999-03-05 2004-01-27 Ebara Corporation Polishing apparatus
US6878044B2 (en) 1999-03-05 2005-04-12 Ebara Corporation Polishing apparatus
US7632378B2 (en) 1999-03-05 2009-12-15 Ebara Corporation Polishing apparatus
US6354922B1 (en) 1999-08-20 2002-03-12 Ebara Corporation Polishing apparatus
JP2010023163A (en) * 2008-07-17 2010-02-04 Disco Abrasive Syst Ltd Processing device

Similar Documents

Publication Publication Date Title
JP3363587B2 (en) Method and apparatus for processing brittle material
JP3909619B2 (en) Apparatus and method for mirror processing of magnetic disk substrate
JPH09168947A (en) Work periphery grinding method by ultrasonic micro vibration
JPH05285807A (en) Ultra-precision processing method
JPH09168953A (en) Semiconductor wafer edge polishing method and device
JPH08197400A (en) Method for polishing chamfered portion of semiconductor wafer
JP2002252189A (en) Polishing liquid for semiconductor wafer
JP2013094924A (en) Grinding method for ceramic substrate with through electrode
JP2001300856A (en) Super abrasive grain tool
JP2001007064A (en) Grinding method of semiconductor wafer
JPH03104567A (en) Grinding wheel and grinding method
JP2565385B2 (en) Combined processing method and apparatus of electrolytic dressing grinding method and polishing method using conductive whetstone as tool
JP3128164B2 (en) Grinding wheel for electrolytic dressing with mechanochemical action
JPH11285973A (en) Machining method and device for semiconductor wafer
JP6812068B2 (en) Processing method
JP2000190199A (en) Plane correcting method for surface plate
WO2000024548A1 (en) Polishing apparatus and a semiconductor manufacturing method using the same
JP2020110906A (en) Processing method of work piece
EP1782916A1 (en) Methods and apparatus for grinding discrete mirrors
US20240091900A1 (en) Polishing apparatus and polishing method
JP3014693B1 (en) Diamond dressing and dressing method
JP7317441B2 (en) chamfering machine
JPH05285850A (en) Grinding polishing wheel and grinding polishing method
JP3671250B2 (en) Diamond grinding wheel and its truing device
JP2004202656A (en) Truing method of polisher for polishing

Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 19990706