JPH08105722A - Illuminator for inspecting device external appearance and device external appearance automatic inspecting apparatus using the illuminator - Google Patents

Illuminator for inspecting device external appearance and device external appearance automatic inspecting apparatus using the illuminator

Info

Publication number
JPH08105722A
JPH08105722A JP6268229A JP26822994A JPH08105722A JP H08105722 A JPH08105722 A JP H08105722A JP 6268229 A JP6268229 A JP 6268229A JP 26822994 A JP26822994 A JP 26822994A JP H08105722 A JPH08105722 A JP H08105722A
Authority
JP
Japan
Prior art keywords
camera
illuminator
illumination
light emitting
dut
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP6268229A
Other languages
Japanese (ja)
Inventor
Aritomo Kikuchi
有朋 菊池
Hisao Hayama
久夫 葉山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP6268229A priority Critical patent/JPH08105722A/en
Priority to CN95191197A priority patent/CN1138897A/en
Priority to KR1019960702964A priority patent/KR960706627A/en
Priority to PCT/JP1995/002043 priority patent/WO1996011377A1/en
Publication of JPH08105722A publication Critical patent/JPH08105722A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0813Controlling of single components prior to mounting, e.g. orientation, component geometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Image Input (AREA)

Abstract

PURPOSE: To eliminate the illuminance unevenness, to carefully illuminate an object to be inspected and to precisely inspect the external appearance of a microminiaturized device by arranging many light emitting elements in which luminance is adjustable at a CCD camera as a center, and controlling the luminance of the elements based on an observation result. CONSTITUTION: A window frame for a camera 9 is provided at the center of a rectangular illumination frame 10, and light emitting elements made of LEDs are regularly arranged with the frame as a center. An illumination controller initializes the illumination, and corrects the illumination from the measured result. In order to automatically inspect the external appearance by using this apparatus, a DUT 20 of a VLSI, etc., is fixedly placed on a rotary stage 21 on a measuring base 22, rotated at 90 degrees at each one side measurement, and measured at the four sides. The camera 9 and the illuminator are oppositely disposed at a predetermined distance, and pixel data from the camera 9 is sent to an image processor 12. The processor 12 strengthens the light and shade of the density, displays it in a window as image data on a display unit 18, and decides the propriety, etc., of a lead pin.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、デバイス外観検査時
に用いる照明器及びこの照明器を用いたデバイス外観自
動検査装置であって、特に表面実装用LSI(高密度集
積回路)の外観検査時に用いる照明器及びデバイス外観
自動検査装置に関する。この照明器は人間による目視検
査時であっても、画像処理部を有する自動検査装置によ
る検査時にでも用いられるが、本明細書ではデバイス外
観自動検査装置を中心にして説明する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an illuminator used at the time of visual inspection of a device and an automatic device visual inspection apparatus using the illuminator, which is particularly used at the time of visual inspection of a surface mounting LSI (high density integrated circuit). The present invention relates to an illuminator and a device appearance automatic inspection device. This illuminator is used both during visual inspection by humans and during inspection by an automatic inspection apparatus having an image processing unit. In this specification, the device appearance automatic inspection apparatus will be mainly described.

【0002】[0002]

【従来の技術】従来のデバイス外観検査時に用いる照明
は、測定されるDUT(Device UnderTest )の全体を
一定の明るさにする照明であった。従って上方や斜め上
から、あるいは側面からの光源で一定の照明を行ってい
た。従来のデバイスは、デバイスの入出力ピン数が少な
く、しかもピン間隔が比較的広かったので、目視検査で
も自動検査でも上記の一定照明で充分であった。
2. Description of the Related Art Conventionally, the illumination used in the visual inspection of the device is an illumination which makes the entire DUT (Device Under Test) to be measured a constant brightness. Therefore, constant illumination is performed by a light source from above or obliquely above or from the side. In the conventional device, the number of input / output pins of the device was small, and the pin interval was relatively wide. Therefore, the above constant illumination was sufficient for both visual inspection and automatic inspection.

【0003】外観自動検査装置には一般的に画像処理装
置に準じた画像処理部を有する。図5に画像処理装置に
於ける一例の画像データのフロー(流れ)図を示す。カ
メラユニット50ではカメラで撮影された画像を、例え
ば横軸に624画素、縦軸に484画素で計30万2千
画素のデジタル画素データに変換して処理する。その画
素データを直接画像メモリ51に記憶したり、一度LU
T(Look Up Table )53を通して画像メモリ51に記
憶する。LUT53はTVモニタ18などで表示する色
を選択するための変換テーブルであり、入力データの値
をそのアドレスとし、入力データに対応した出力データ
が予め書き込まれたメモリである。このLUT53のデ
ータ変換機能を用いて2値化や濃淡画像の前処理や表示
画像の変換処理などを行う。
The automatic appearance inspection apparatus generally has an image processing unit conforming to the image processing apparatus. FIG. 5 shows an example of a flow chart of image data in the image processing apparatus. In the camera unit 50, for example, an image captured by the camera is converted into digital pixel data having a total of 302,000 pixels with 624 pixels on the horizontal axis and 484 pixels on the vertical axis for processing. The pixel data can be directly stored in the image memory 51,
The image is stored in the image memory 51 through the T (Look Up Table) 53. The LUT 53 is a conversion table for selecting a color to be displayed on the TV monitor 18 or the like, and is a memory in which the value of input data is used as its address and output data corresponding to the input data is written in advance. The data conversion function of the LUT 53 is used to perform binarization, preprocessing of grayscale images, conversion processing of display images, and the like.

【0004】フィルタ52は、例えば測定するDUTの
周辺がぼやけているときそのエッジを強調し、前処理す
る機能を有している。ウインドメモリ55はTVモニタ
18の画面にウインドを描画するために使用するメモリ
である。グラフィックメモリ56は計測結果の表示をグ
ラフィカルに行ったり、作業領域として使用するメモリ
である。キャラクタメモリ57は主に文字を表示するメ
モリであり、プログラムの編集や集計結果の表示などに
も使用したりする。
The filter 52 has a function of emphasizing the edge of the DUT to be measured and pre-processing it when the periphery of the DUT is blurred, for example. The window memory 55 is a memory used to draw a window on the screen of the TV monitor 18. The graphic memory 56 is a memory for graphically displaying the measurement result and used as a work area. The character memory 57 is a memory that mainly displays characters, and is also used for editing a program, displaying a counting result, and the like.

【0005】表示制御部54は、カメラユニット50か
らの画素データを直接あるいは画像メモリ51を介して
画素データを処理し、TVモニタ18に画像を表示する
制御部である。このとき命令によってはウインドメモリ
55、グラフィックメモリ56やキャラクタメモリ57
のデータを用いて表示する。このようなカメラを用いた
画像処理装置によるデバイス外観自動検査装置において
も、従来のデバイスでは、一定の照明で、明るさを自動
調整すれば可能であった。
The display control unit 54 is a control unit for processing the pixel data from the camera unit 50 directly or via the image memory 51 to display the image on the TV monitor 18. At this time, depending on the command, the window memory 55, the graphic memory 56 or the character memory 57.
Display using the data of. Even in the device appearance automatic inspection apparatus by the image processing apparatus using such a camera, it is possible in the conventional device by automatically adjusting the brightness with constant illumination.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、近年の
市場の要求により、機器の小型化、部品の高密度実装が
進み、デバイスも表面実装のパッケージが多くなってき
た。特に超LSIのQFP(Quad Flat Package )で
は、縦横の大きさが、10mm×10mmから30mm
×30mmで、四辺にリードピンが配置され、一辺のリ
ードピン数は8本から76本と非常に多くなっている。
そしてリードピッチ幅は0.3mmから0.8mmと非
常に狭くなり、厚さは2mmから10mm程度である。
However, due to recent market demands, downsizing of equipment and high-density mounting of components have been advanced, and the number of surface-mount packages of devices has increased. Especially in the QFP (Quad Flat Package) of VLSI, the vertical and horizontal dimensions are from 10 mm × 10 mm to 30 mm.
The lead pins are arranged on four sides with a size of 30 mm, and the number of lead pins on one side is extremely large, from 8 to 76.
The lead pitch width is very narrow, 0.3 mm to 0.8 mm, and the thickness is about 2 mm to 10 mm.

【0007】これらのQFPやSOP(Small Alignmen
t Package )のような表面実装用パッケージは、プリン
ト配線基板の表面に直接ハンダ付けするので、その底辺
は平坦でなければならないし、しかもリードピッチ幅が
一定の間隔でなければならない。このように微細で正確
性を必要とする外観検査には、従来の一定の照明では不
充分となり、きめ細かな照明が要求されてきた。リード
ピンの光反射状況の違いが有っても正しく測定する必要
があるからである。
These QFP and SOP (Small Alignmen)
Since the surface mounting package such as t Package) is directly soldered to the surface of the printed wiring board, its base must be flat and the lead pitch width must be constant. For such a fine and precise appearance inspection, the conventional constant illumination is not sufficient, and fine illumination has been required. This is because accurate measurement is required even if there is a difference in the light reflection status of the lead pin.

【0008】[0008]

【課題を解決するための手段】上記目的を達成するため
に、この発明は中央部にカメラ、あるいは視線の窓枠を
有する照明用フレームを設け、この照明用フレームの内
部に多数の発光素子を配列してDUTを照明する。この
とき、全体の照明にムラが有る場合には、個々の発光素
子の輝度を調整して、ムラを無くすようにする。輝度調
整とは点灯や消灯も含む。それは手動的にでも自動的に
でも行ってよい。また、DUTによっては、やや下方か
らの照明の方が被測定箇所を良く反射するものであれ
ば、上方の発光素子を消灯し、下方の発光素子のみを点
灯したりする。この逆の場合でもよい。以下詳細に説明
する。
To achieve the above object, the present invention provides a camera or an illuminating frame having a window frame of the line of sight in the central portion, and a large number of light emitting elements inside the illuminating frame. Arrange and illuminate the DUT. At this time, if there is unevenness in the overall illumination, the brightness of each light emitting element is adjusted to eliminate the unevenness. Brightness adjustment includes turning on and off. It can be done manually or automatically. Depending on the DUT, if the illumination from the lower side reflects the measured portion better, the upper light emitting element is turned off and only the lower light emitting element is turned on. The opposite case is also possible. This will be described in detail below.

【0009】照明用フレームはDUTが横長であれば横
長に、縦長であれば縦長に、相似の四辺形がよい。照明
をDUTの全面に行き渡らせるためである。中央部の窓
枠は視線あるいはカメラのレンズが入る程度でよい。大
きさはDUTの大きさによって決める。
It is preferable that the illumination frame be a horizontally long rectangle if the DUT is horizontally long, and a vertically long rectangle if the DUT is vertically long, and a similar quadrangle. This is because the lighting is spread over the entire surface of the DUT. The window frame at the center may be a line of sight or a lens of a camera. The size depends on the size of the DUT.

【0010】発光素子はLED(Light Emitting Diod
e)や蛍光管や白色ランプ等の小型の物であればいずれ
でもよい。この発光素子を照明用フレームの一定範囲に
配列する。配列は行及び列に規則正しく配列した方が照
明の均一性が得られ、また制御もし易い。光の反射に特
定の性質を有するDUTの場合には上下あるいは左右で
の発光素子の個数を変えるとよい。各発光素子は電圧あ
るいは電流で明るさを調整できるのが望ましい。
The light emitting element is an LED (Light Emitting Diode).
Any small object such as e), a fluorescent tube or a white lamp may be used. The light emitting elements are arranged in a certain range of the illumination frame. When the arrangement is regular in rows and columns, the uniformity of illumination can be obtained and the control is easy. In the case of a DUT having a specific property of reflecting light, it is advisable to change the number of light emitting elements vertically or horizontally. It is desirable that the brightness of each light emitting element can be adjusted by voltage or current.

【0011】上記の発光素子を発光させる照明用制御部
は、個々の発光素子の点灯や消灯を含めて輝度の制御を
行う。当初は全発光素子を同一輝度で点灯させ、被測定
面で光度のムラがあるときには、行単位、列単位あるい
はブロック単位で発光輝度を制御して、ムラを無くすよ
うにする。ブロックは複数の発光素子で構成する。最後
に個々に発光素子毎に制御してもよい。この制御は主動
でも自動でも可能である。自動の場合は一定の制御シ−
ケンスで行い、最適値でストップするようにするとよ
い。この照明用制御部は照明用フレームに隣接して設け
てもよいし、別場所に設置してもよい。このようにし
て、照明の均一性が得られるし、また特定の位置に強い
照明を与えることもできる照明器である。次にデバイス
外観自動検査装置について説明する。
The illumination control section for causing the above light emitting elements to emit light controls the brightness including turning on and off the individual light emitting elements. Initially, all the light emitting elements are turned on with the same brightness, and when there is unevenness in the luminous intensity on the surface to be measured, the emission brightness is controlled in row units, column units, or block units to eliminate the unevenness. The block is composed of a plurality of light emitting elements. Finally, each light emitting element may be individually controlled. This control can be active or automatic. In the case of automatic, a certain control sequence
It is good to do it with a can and stop at the optimum value. The lighting control unit may be provided adjacent to the lighting frame or may be installed at another place. In this way, it is an illuminator that can provide uniform illumination and can also provide strong illumination to a specific position. Next, the device appearance automatic inspection apparatus will be described.

【0012】カメラはCCD(Charge Coupled Device
)カメラが望ましい。A/D(アナログ・デジタル)
変換が容易だからであるが、一般のカメラでも可能であ
る。A/D変換はカメラ内で行うのがよい。感度は高感
度が望まれる。光反射の明暗を鮮明に捕らえたいからで
ある。そしてカメラのレンズを上記照明用フレームの中
央部にある窓枠内にDUTに対向して設置する。
The camera is a CCD (Charge Coupled Device)
) A camera is preferable. A / D (analog / digital)
This is because the conversion is easy, but it is possible with a general camera. A / D conversion is preferably performed in the camera. High sensitivity is desired. This is because we want to clearly capture the light and darkness of light reflection. Then, the lens of the camera is installed facing the DUT in the window frame in the center of the illumination frame.

【0013】カメラで得られた画素データを画像処理部
で処理する。画像処理部は従来の画像処理装置でよい
が、内部に前記の照明用制御部を設置した方がよい。照
明の制御を画像処理部で処理した画像デ−タ及び演算処
理部での演算データで行うからである。演算処理部では
画像データに基づいて各種の演算処理を行い出力する。
画像データと必要に応じて演算処理結果のデータをTV
モニタに送付する。TVモニタではDUTの画像を表示
する。演算処理部及び画像処理部では、初めに設定され
ている測定項目に従って各種の計測を行い、測定結果出
力端子より出力し、表示や印刷を行う。上述のようにT
Vモニタにも表示する。測定項目は測定されるDUTに
より異なるが、例えば前述のQFPのLSIではリード
ピン数やリードピッチ幅やリードピンの平坦度等であ
る。以下実施例について説明する。
The image processing unit processes the pixel data obtained by the camera. The image processing unit may be a conventional image processing apparatus, but it is better to install the illumination control unit inside. This is because the illumination is controlled by the image data processed by the image processing unit and the calculation data by the calculation processing unit. The arithmetic processing unit performs various arithmetic processing based on the image data and outputs the result.
The image data and, if necessary, the data of the arithmetic processing result are displayed on the TV.
Send to monitor. The TV monitor displays the DUT image. The arithmetic processing unit and the image processing unit perform various measurements according to the initially set measurement items, output the results from the measurement result output terminal, and display and print. T as described above
Also displayed on the V monitor. The measurement items differ depending on the DUT to be measured, but in the above-described QFP LSI, for example, the number of lead pins, the lead pitch width, the flatness of the lead pins, and the like are used. Examples will be described below.

【0014】[0014]

【実施例】図1に本発明のデバイス外観検査用照明器の
一実施例の斜視図を、図2にこの照明器を用いたデバイ
ス外観自動検査装置の一実施例の構成図を示す。測定さ
れるDUTは前述のQFPの超LSIであり、特にリー
ドピンに関して測定する。始めに図1を用いて、デバイ
ス外観検査用照明器について説明する。10は照明用フ
レームである。四辺形の照明用フレーム10の中央部に
カメラ9用の窓枠が有り、この窓枠を中心にして多くの
発光素子19を配列している。照明用フレーム10は、
DUT20が横長であるので、横長の矩形の形状として
いる。
FIG. 1 is a perspective view of an embodiment of a device appearance inspection illuminator of the present invention, and FIG. 2 is a block diagram of an embodiment of a device appearance automatic inspection apparatus using this illuminator. The DUT to be measured is the above-mentioned QFP VLSI, and particularly the lead pin is measured. First, the illuminator for device visual inspection will be described with reference to FIG. Reference numeral 10 is a frame for illumination. There is a window frame for the camera 9 at the center of the quadrilateral illumination frame 10, and many light emitting elements 19 are arranged around this window frame. The lighting frame 10 is
Since the DUT 20 is horizontally long, it has a horizontally long rectangular shape.

【0015】発光素子19にはLED発光素子を用い、
行及び列に規則正しく配列し、上辺付近は間引きした配
列にしている。規則正しく配列した方が輝度の制御が容
易であることと、上辺付近の発光素子19を少なくした
のは、この実施例ではやや下方から強い光をDUT20
に照射した方が検査し易いからである。このように発光
素子19の配列はDUT20を考慮して配列するとよ
い。またLED1個の明るさは約2000mcd(ミリ
・カンデラ)であるので、LEDの数はDUT20の大
きさ、距離や試験項目、試験精度等を考慮して決めると
よい。通常は40から60有れば充分である。発光色
は、カメラの感度が良い色がいい。
An LED light emitting element is used as the light emitting element 19,
The rows and columns are regularly arranged, and the upper side is thinned out. It is easier to control the brightness when arranged regularly, and the number of the light emitting elements 19 near the upper side is reduced in this embodiment.
This is because it is easier to inspect if it is irradiated on the skin. Thus, the light emitting elements 19 may be arranged in consideration of the DUT 20. Since the brightness of one LED is approximately 2000 mcd (millimeter candela), the number of LEDs may be determined in consideration of the size of the DUT 20, distance, test items, test accuracy, and the like. Usually, 40 to 60 is sufficient. The emission color should be a color with good camera sensitivity.

【0016】11は照明用制御部であり、照明の初期設
定並びに測定結果による照明の修正を行う。つまり、初
期設定ではこの照明器前方の一定の測定位置にキャリブ
レーション・ターゲットを置いて照明し、画像が良けれ
がその値を最適値とし、悪ければ予め決められた一定の
シーケェンスでそれぞれの発光素子の消灯、点灯を含む
輝度調整を行なって最適値でストップさせる制御を行
う。個々のDUT20の測定結果においても不具合が生
じたときには、その都度測定できるように再調整の制御
を行うこともできる照明器である。
Reference numeral 11 denotes a lighting control unit, which performs initial setting of lighting and correction of lighting based on measurement results. In other words, in the initial setting, a calibration target is placed at a certain measurement position in front of the illuminator to illuminate, and if the image is good, the value is set to the optimum value, and if bad, each light emitting element is set at a predetermined constant sequence. The control is performed to adjust the brightness including turning off and turning on and stop at the optimum value. This is an illuminator that can also perform readjustment control so that measurement can be performed each time a problem occurs in the measurement result of each DUT 20.

【0017】次に図2を用いて、この照明器を用いたデ
バイス外観自動検査装置について説明する。DUT20
は測定台22上の回転ステージ21に乗せられ固定され
る。DUT20がQFPのLSIであり、四辺にリード
ピン25が出ているので四辺とも測定する必要があり、
回転ステージ21は一辺測定毎に90度回転して四辺を
測定する。
Next, a device appearance automatic inspection apparatus using this illuminator will be described with reference to FIG. DUT20
Is fixed on the rotary stage 21 on the measuring table 22. Since the DUT 20 is a QFP LSI and the lead pins 25 are provided on all four sides, it is necessary to measure all four sides.
The rotary stage 21 rotates 90 degrees for each side measurement and measures four sides.

【0018】カメラ9と前記の照明器は、DUT20と
対向し、一定距離を置いて設置されている。照明器は前
記の要領でDUT20に適切な照明を行い、カメラ9は
画素データを画像処理部12に送付する。カメラ9はC
CDカメラであり、直ちにA/D変換して、484×6
24点の画素データを得る。距離分解能はカメラ9とD
UT20との距離やレンズの倍率を適当に選び、例えば
DUT20の10mm間隔を100画素で撮像すると、
0.1mm/画素の分解能を得る。つまりDUT20を
0.1mm間隔で外観検査することができる。
The camera 9 and the illuminator are opposed to the DUT 20 and are installed at a fixed distance. The illuminator appropriately illuminates the DUT 20 as described above, and the camera 9 sends the pixel data to the image processing unit 12. Camera 9 is C
CD camera, A / D conversion immediately, 484 x 6
Pixel data of 24 points is obtained. Distance resolution is camera 9 and D
If the distance to the UT 20 and the magnification of the lens are appropriately selected, for example, if the 10 mm interval of the DUT 20 is imaged with 100 pixels,
A resolution of 0.1 mm / pixel is obtained. That is, the DUT 20 can be visually inspected at intervals of 0.1 mm.

【0019】画像処理部12ではカメラ9から送付され
た画素データを画像の濃淡を強くさせるように処理す
る。この処理によって測定の位置判断を容易にさせる。
一例を図3で説明する。20はDUTであり、25は良
品のリードピン、26は不良品のリードピンである。図
3(A)に示す良リードピン25の横面図では底辺が平
坦になっており、この正面図を図3(B)に示す。照明
をやや下方から強く照射すると、リードピン25の先端
から強い反射光がカメラ9に入射し、TVモニタ18で
は黒く鮮明に表示される。この黒い部分の画素数により
リードピン25の幅が求められ、またその中心点の位置
も求められる。また図3には示していないが、隣のリー
ドピンとの間隔、つまりリードピッチ幅も求められる。
The image processing unit 12 processes the pixel data sent from the camera 9 so as to increase the density of the image. This process facilitates the determination of the measurement position.
An example will be described with reference to FIG. 20 is a DUT, 25 is a non-defective lead pin, and 26 is a defective lead pin. In the lateral view of the good lead pin 25 shown in FIG. 3A, the bottom is flat, and this front view is shown in FIG. 3B. When the illumination is strongly radiated from slightly below, strong reflected light enters the camera 9 from the tip of the lead pin 25, and is displayed in black and clear on the TV monitor 18. The width of the lead pin 25 is obtained from the number of pixels in this black portion, and the position of the center point thereof is also obtained. Although not shown in FIG. 3, the distance between adjacent lead pins, that is, the lead pitch width is also obtained.

【0020】図3(C)は不良リードピン26の一例で
ある。先端が曲がってやや上向きで平坦でない。この正
面図は図3(D)のようになり、不良リードピン26の
先端の反射光はカメラ9に入射されずにTVモニタ18
では白く表示される。従ってその位置の判断がつかな
い。よって不良品と判断されるが、それでもその位置を
知りたい場合がある。このとき照明用制御部11を駆動
して、やや上部からの照明を強くする。よって強い反射
光がカメラ9に入射されて、画像処理部12においても
不良リードピン26の先端位置が確認される。そして良
リードピン25の位置との平坦度(段差)も求められ
る。
FIG. 3C shows an example of the defective lead pin 26. The tip is bent and slightly upward and not flat. This front view is as shown in FIG. 3D, and the reflected light from the tip of the defective lead pin 26 does not enter the camera 9 and the TV monitor 18
Is displayed in white. Therefore, the position cannot be determined. Therefore, it is judged as a defective product, but there is still a case where the user wants to know the position. At this time, the illumination control unit 11 is driven to slightly intensify the illumination from above. Therefore, strong reflected light is incident on the camera 9, and the tip position of the defective lead pin 26 is also confirmed in the image processing unit 12. The flatness (step) with respect to the position of the good lead pin 25 is also required.

【0021】画像処理部12は上述のようにカメラ9か
らの画素データを処理して画像データとし、濃淡を強調
させたり、LUT53を通して任意の測定部を任意のカ
ラー表示に変更したり、ウィンドウ表示させたり、文字
表示させたりして、TVモニタ18に画像表示する。演
算処理部14では、この画像データでもって、リードピ
ン25の良、不良を判断したり、リードピン幅やリード
ピッチ幅や平坦度(段差)を計測する。演算結果をTV
モニタ18に表示したり、測定結果出力端子16から外
部に出力したりする。
The image processing unit 12 processes the pixel data from the camera 9 as the image data as described above to emphasize the shading, to change an arbitrary measuring unit to an arbitrary color display through the LUT 53, and to display a window display. An image is displayed on the TV monitor 18 by displaying or displaying characters. The arithmetic processing unit 14 determines whether the lead pin 25 is good or bad, and measures the lead pin width, the lead pitch width, and the flatness (step) based on this image data. TV calculation result
It is displayed on the monitor 18 or output from the measurement result output terminal 16 to the outside.

【0022】また測定項目や処理方法の手順は設定入力
端子15からシステムの全体制御も行う演算処理部14
に入力する。演算処理部14自体に設定ボタンやテン・
キーを設けて、ここより入力してもよい。照明用制御部
11も演算処理部14内に設けた方が都合がよい。
In addition, the measurement processing unit 14 that also controls the entire system from the setting input terminal 15 for the measurement item and the procedure of the processing method
To enter. There are setting buttons and
You may provide a key and input from here. It is more convenient to provide the illumination control unit 11 in the arithmetic processing unit 14 as well.

【0023】図4は測定手順の内で特に外観不良DUT
の場合の一例の流れ図である。DUT20が回転ステー
ジ21上に固定され、計測開始30の信号で測定が始ま
る。予め設定されている測定点が、つまり全ピンが計測
できたか31の判定でYesなら、そのDUT20は計
測結果出力32して終了33する。NOであるなら、照
明用制御部11が駆動して発光素子19の輝度制御を行
う。例えばLEDの点灯位置を変化させる34。そして
計測不可のピンに対して再計測35し、測定できたか3
6の判定でYesなら計測結果出力32して終了33す
る。Noであるば、再び34のLEDの点灯位置を変化
させるに戻り、再計測35する。この再計測は例えば3
回までとし、3回より大か小かを判定38して、大なら
ば計測不可39として終了40する。
FIG. 4 shows a DUT having a poor appearance particularly in the measurement procedure.
6 is a flowchart of an example of the case. The DUT 20 is fixed on the rotary stage 21, and the measurement is started by the signal of the measurement start 30. If the preset measurement point, that is, whether all the pins have been measured, is Yes in the determination of 31, the DUT 20 outputs the measurement result 32 and ends 33. If NO, the illumination control unit 11 is driven to control the brightness of the light emitting element 19. For example, the lighting position of the LED is changed 34. And re-measured 35 for the pin that cannot be measured and measured 3
If the result of the determination in 6 is Yes, the measurement result is output 32 and the process ends 33. If No, it returns to changing the lighting position of the LED of 34 again, and remeasurement 35 is performed. This remeasurement is, for example, 3
Up to three times, it is judged 38 whether it is larger or smaller than three times.

【0024】[0024]

【発明の効果】以上詳細に説明したように、この発明は
近年の非常に小型化し、高精度化し、微細化してきたデ
バイスの外観検査を容易にできるようにした。デバイス
外観検査用照明器では、DUT20を観測する例えばカ
メラを中心に輝度調整可能な発光素子19を多数配列
し、観測結果で個々の発光素子19の輝度を制御できる
ので、照明ムラを無くすことができ、また特定方向から
の照射も容易にできるのでDUT20の特定部分への照
射や観測が正しくできる。微細部分の観測には不可欠の
照明器である。
As described above in detail, the present invention makes it possible to easily perform the visual inspection of a device which has been extremely miniaturized, highly accurate, and miniaturized in recent years. In the device visual inspection illuminator, a large number of light-emitting elements 19 whose brightness can be adjusted centered around a camera for observing the DUT 20 can be arranged, and the brightness of each light-emitting element 19 can be controlled by the observation result, so uneven illumination can be eliminated. Moreover, since irradiation from a specific direction can be easily performed, irradiation and observation of a specific portion of the DUT 20 can be correctly performed. It is an essential illuminator for observing minute parts.

【0025】この照明器を用いたデバイス外観自動検査
装置では、DUT20の測定部分を任意に照射できる照
射器により、カメラで撮像した測定部の濃淡が鮮明にな
り、自動測定が容易になった。また画像デ−タの画素数
を多くすることにより、距離分解能を0.1mm/画素
以下にでき、超精密測定ができる。このように本発明
は、デバイスの微細化した外観検査には最適なもので、
その技術的効果は大である。
In the device appearance automatic inspection apparatus using this illuminator, the illuminator capable of arbitrarily irradiating the measurement portion of the DUT 20 makes the contrast of the measurement portion imaged by the camera clear and facilitates automatic measurement. Further, by increasing the number of pixels of the image data, the distance resolution can be set to 0.1 mm / pixel or less, and ultra-precision measurement can be performed. As described above, the present invention is most suitable for the miniaturized appearance inspection of the device,
Its technical effect is great.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例であるデバイス外観検査用照
明器の斜視図である。
FIG. 1 is a perspective view of a device visual inspection illuminator that is an embodiment of the present invention.

【図2】本発明の一実施例のデバイス外観自動検査装置
の構成図である。
FIG. 2 is a configuration diagram of a device appearance automatic inspection apparatus according to an embodiment of the present invention.

【図3】DUTであるQFPのリードピンの説明図であ
る。
FIG. 3 is an explanatory diagram of lead pins of a QFP that is a DUT.

【図4】本発明の測定法の一例の流れ図である。FIG. 4 is a flow chart of an example of the measuring method of the present invention.

【図5】画像処理装置での画像データの一例の流れ図で
ある。
FIG. 5 is a flowchart of an example of image data in the image processing device.

【符号の説明】[Explanation of symbols]

9 カメラ 10 照明用フレーム 11 照明用制御部 12 画像処理部 13a 画素データ入力端子 13b 照明器制御データ出力端子 14 演算処理部 15 設定入力端子 16 測定結果出力端子 17 TV画像出力端子 18 TVモニタ 19 発光素子 20 被測定DUT 21 回転ステージ 22 測定台 25 良リードピン 26 不良リードピン 9 camera 10 lighting frame 11 lighting control unit 12 image processing unit 13a pixel data input terminal 13b illuminator control data output terminal 14 arithmetic processing unit 15 setting input terminal 16 measurement result output terminal 17 TV image output terminal 18 TV monitor 19 light emission Element 20 Measured DUT 21 Rotary stage 22 Measuring stand 25 Good lead pin 26 Bad lead pin

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 中央部にカメラ(9)のレンズを挿入す
る窓枠を有する照明用フレーム(10)と、 上記照明用フレーム(10)内部に行及び列方向に一定
の間隔をおいて配列された複数の発光素子(19)と、 任意の上記発光素子(19)の輝度を制御する照明用制
御部(11)と、を具備することを特徴とするデバイス
外観検査用照明器。
1. An illumination frame (10) having a window frame into which a lens of a camera (9) is inserted in a central part, and arranged inside the illumination frame (10) at regular intervals in row and column directions. An illuminator for inspecting a device appearance, comprising: a plurality of light emitting elements (19) that are provided; and an illumination control unit (11) that controls the brightness of any of the light emitting elements (19).
【請求項2】 複数の発光素子はLED発光素子である
請求項1記載のデバイス外観検査用照明器。
2. The illuminator for device visual inspection according to claim 1, wherein the plurality of light emitting elements are LED light emitting elements.
【請求項3】 請求項1記載のデバイス外観検査用照明
器と、 被測定DUT(20)を撮影するカメラ(9)と、 上記カメラ(9)からの画素データを入力して画像デー
タに処理する画像処理部(12)と、 設定された検査項目に従って測定されるDUT(20)
の外観を計測する演算処理部(14)と、 上記画像処理部(12)からの画像データを入力し画像
を表示するTVモニタ(18)と、を具備することを特
徴とするデバイス外観自動検査装置。
3. A device appearance inspection illuminator according to claim 1, a camera (9) for photographing a DUT (20) to be measured, and pixel data from the camera (9) are input and processed into image data. Image processing unit (12) to perform, and DUT (20) measured according to the set inspection item
A device appearance automatic inspection, comprising: an arithmetic processing unit (14) for measuring the appearance of the device; and a TV monitor (18) for inputting image data from the image processing unit (12) and displaying an image. apparatus.
JP6268229A 1994-10-06 1994-10-06 Illuminator for inspecting device external appearance and device external appearance automatic inspecting apparatus using the illuminator Withdrawn JPH08105722A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP6268229A JPH08105722A (en) 1994-10-06 1994-10-06 Illuminator for inspecting device external appearance and device external appearance automatic inspecting apparatus using the illuminator
CN95191197A CN1138897A (en) 1994-10-06 1995-10-05 Illuminator for inspecting appearance of device and automatic appts. for inspecting appearance of device using the illumination device
KR1019960702964A KR960706627A (en) 1994-10-06 1995-10-05 Fixture for device appearance inspection and automatic device appearance inspection device using this illuminator
PCT/JP1995/002043 WO1996011377A1 (en) 1994-10-06 1995-10-05 Illuminator for inspecting appearance of device and automatic apparatus for inspecting appearance of device using the illumination device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6268229A JPH08105722A (en) 1994-10-06 1994-10-06 Illuminator for inspecting device external appearance and device external appearance automatic inspecting apparatus using the illuminator

Publications (1)

Publication Number Publication Date
JPH08105722A true JPH08105722A (en) 1996-04-23

Family

ID=17455709

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6268229A Withdrawn JPH08105722A (en) 1994-10-06 1994-10-06 Illuminator for inspecting device external appearance and device external appearance automatic inspecting apparatus using the illuminator

Country Status (4)

Country Link
JP (1) JPH08105722A (en)
KR (1) KR960706627A (en)
CN (1) CN1138897A (en)
WO (1) WO1996011377A1 (en)

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US6303916B1 (en) 1998-12-24 2001-10-16 Mitutoyo Corporation Systems and methods for generating reproducible illumination
EP1455179A1 (en) * 2003-03-07 2004-09-08 MV Research Limited A machine vision inspection system and method
CN104280118A (en) * 2013-07-11 2015-01-14 华为技术有限公司 Low illumination level testing tool and control method thereof
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JP2892464B2 (en) * 1990-08-29 1999-05-17 マツダ株式会社 Surface defect inspection apparatus and surface defect inspection method
JPH04329344A (en) * 1991-05-01 1992-11-18 Elmo Co Ltd Mounted board inspecting device
JPH04337404A (en) * 1991-05-14 1992-11-25 Toshiba Corp Position measurement device
JPH04364404A (en) * 1991-06-11 1992-12-16 Matsushita Electric Ind Co Ltd Method for illuminating electronic parts

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JP2015011364A (en) * 2013-06-26 2015-01-19 富士通株式会社 Illumination adjustment apparatus, illumination adjustment method, and illumination adjustment program
CN104534983A (en) * 2014-12-05 2015-04-22 苏州佳祺仕信息科技有限公司 Automatic detection process method of workpiece assembling quality

Also Published As

Publication number Publication date
WO1996011377A1 (en) 1996-04-18
CN1138897A (en) 1996-12-25
KR960706627A (en) 1996-12-09

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