KR960706627A - Fixture for device appearance inspection and automatic device appearance inspection device using this illuminator - Google Patents

Fixture for device appearance inspection and automatic device appearance inspection device using this illuminator

Info

Publication number
KR960706627A
KR960706627A KR1019960702964A KR19960702964A KR960706627A KR 960706627 A KR960706627 A KR 960706627A KR 1019960702964 A KR1019960702964 A KR 1019960702964A KR 19960702964 A KR19960702964 A KR 19960702964A KR 960706627 A KR960706627 A KR 960706627A
Authority
KR
South Korea
Prior art keywords
light emitting
illuminator
processing unit
camera
image
Prior art date
Application number
KR1019960702964A
Other languages
Korean (ko)
Inventor
아리토모 기쿠치
히사오 하야마
Original Assignee
오오우라 히로시
가부시키가이샤 아드반테스트
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오오우라 히로시, 가부시키가이샤 아드반테스트 filed Critical 오오우라 히로시
Publication of KR960706627A publication Critical patent/KR960706627A/en

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Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0813—Controlling of single components prior to mounting, e.g. orientation, component geometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Image Input (AREA)

Abstract

소형이고 정밀한 디바이스의 외관검사를 하는 경우에 알맞은 조명기와, 이 조명기를 사용한 디바이스 외관자동검사장치를 제공한다.Provided is an illuminator suitable for the appearance inspection of a compact and precise device, and an automatic device appearance inspection apparatus using the illuminator.

카메라렌즈의 주위에 휘도제어가능한 다수개의 발광소자를 배열한 조명용 프레임과, 각 발광소자의 휘도조정을 하는 조명용 제어부를 가지는 조명기를 준비하고, 이 조명기와, CCD 카메라같은 촬상화면을 화소데이타로 변환하여 출력하는 카메라와, 화소테이타를 화상데이타로 변환처리하는 화상처리부와, 피시험 디바이스의 외관의 특정부분의 치수, 위치 등을 계측하는 연산처리부와, 상기 화성처리부로부터의 화상데이타를 수신하여 대응하는 화상을 표시하는 표시장치로 디바이스 외관자동검사장치를 구성한다. 상기 카메라에 의한 촬상결과에 따라서 상기 조명용 제어부를 동작시키어 개개의 발광소자의 휘도를 제어하고, 피시험 디바이스의 특정부분에 대한 조명을 최적으로 함으로써, 고정밀도의 외관검사를 용이하게 할 수 있다.A lighting frame having a plurality of light emitting devices capable of controlling luminance, and an illumination control unit for adjusting brightness of each light emitting device are prepared. The illuminator and a captured image such as a CCD camera are converted into pixel data. A camera for converting and outputting a pixel data, an image processing unit for converting pixel data into image data, an arithmetic processing unit for measuring dimensions, positions, etc. of a specific portion of the external appearance of the device under test, and image data from the conversion processing unit A device appearance automatic inspection device is constituted by a display device for displaying an image. According to the imaging result of the camera, the illumination control unit is operated to control the brightness of each light emitting element and to optimize illumination of a specific portion of the device under test, thereby facilitating high-precision visual inspection.

Description

디바이스 외관검사용 조명기 및 이 조명기를 사용한 디바이스 외관자동검사장치Fixture for device appearance inspection and automatic device appearance inspection device using this illuminator

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 이 발명에 의한 디바이스 외관검사용 조명기의 하나의 실시예를 나타내는 개략 사시도이다. 제2도는 제1도의 디바이스 외관검사용 조명기를 구비한 이 발명에 의한 디바이스 외관자동검사장치의 하나의 실시예를, 피시험 IC와 동시에 나타내는 개략 구성도이다. 제3도는 제1도의 디바이스 외관검사용 조명기를 사용하여 촬상한 IC의 1개의 리드핀 조명상태를 나타내고, (A)는 양품의 리드핀을 나타내는 측면도, (B)는 (A)를 촤측면에서 본 사시도, (C)는 불량품의 리드핀을 나타내는 측면도, (D)는 (C)를 좌측면에서 본 사시도이다. 제4도는 이 발명에 의한 디바이스 외관자동검사장치에 의한 검사방법의 일례를 설명하기 위한 플로차트이다, 제5도는 종래의 화상처리장치의 일례의 화상 데이터의 흐름을 설명하기 위한 개략 구성도이다.1 is a schematic perspective view showing one embodiment of the illuminator for inspecting the device appearance according to the present invention. FIG. 2 is a schematic block diagram showing an embodiment of the automatic device appearance inspection apparatus according to the present invention, which includes the illuminator for device appearance inspection of FIG. FIG. 3 shows one lead pin illumination state of the IC imaged using the device visual inspection illuminator of FIG. 1, (A) is a side view showing a good lead pin, and (B) is a side view of (A) This perspective view, (C) is a side view which shows the lead pin of a defective article, (D) is a perspective view which looked at (C) from the left side. 4 is a flowchart for explaining an example of an inspection method by the automatic device appearance inspection apparatus according to the present invention. FIG. 5 is a schematic configuration diagram for explaining the flow of image data of an example of a conventional image processing apparatus.

Claims (3)

대략 중앙에 카메라를 배치하거나 오퍼레이터의 눈을 배치하기 위한 개구부가 형성된 조명용 프레임과, 이 조명용 프레임의 개구부의 주위에 배열된 다수개의 휘도제어가능한 발광소자와, 상기 각 발광소자의 휘도를 선택적으로 제어할 수 있는 조명용 제어부를 구비하는 것을 특징으로 하는 디바이스 외관검사용 조명기.An illumination frame having an opening for arranging a camera or an operator's eye in a substantially center, a plurality of luminance controllable light emitting elements arranged around the opening of the illumination frame, and selectively controlling the luminance of each of the light emitting elements Illuminator for inspecting the device appearance, characterized in that it comprises a control unit for illumination. 제1항에 있어서, 상기 발광소자는 LED 발광소자인 것을 특징으로 하는 디바이스 외관검사용 조명기.The illuminator for inspecting the device appearance of claim 1, wherein the light emitting element is an LED light emitting element. 대략 중앙에 카메라를 배치하거나 오퍼레이터의 눈을 배치하기 위한 개구부가 형성된 조명용 프레임과, 이 조명용 프레임의 개구부의 주위에 배열된 다수개의 휘도제어 가능한 발광소자와, 상기 각 발광소자의 휘도를 선택적으로 제어할 수 있는 조명용 제어부를 구비하는 디바이스 외관검사용 조명기와, 피시험 디바이스를 촬상하고, 그 촬상화면을 다수의 화소데이타로 변환하여 출력하는 카메라와, 이 카메라로부터 입력된 화소데이타를 처리하여 화상데이타로 변환하는 화상처리부와, 미리 설정된 검사항목에 따라서 피시험 디바이스의 외관을 계측하는 연산처리부와, 상기 화상처리부로부터 입력되는 화상데이타에 따른 화상을 표시하는 표시장치를 구비하는 것을 특징으로 하는 디바이스 외관자동검사장치.An illumination frame having an opening for arranging a camera or an operator's eyes in a substantially center, a plurality of luminance controllable light emitting elements arranged around the opening of the illumination frame, and selectively controlling the luminance of each light emitting element A device for inspecting the external appearance of a device having an illumination control unit capable of lighting, a camera which photographs a device under test, converts the captured screen into a plurality of pixel data, and outputs the pixel data input from the camera. And an image processing unit for converting the data into an image processing unit, an arithmetic processing unit for measuring the external appearance of the device under test according to a preset inspection item, and a display device for displaying an image according to the image data inputted from the image processing unit. Automatic inspection device. ※참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: It is to be disclosed based on the initial application.
KR1019960702964A 1994-10-06 1995-10-05 Fixture for device appearance inspection and automatic device appearance inspection device using this illuminator KR960706627A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP6268229A JPH08105722A (en) 1994-10-06 1994-10-06 Illuminator for inspecting device external appearance and device external appearance automatic inspecting apparatus using the illuminator
JP94-268229 1994-10-06
PCT/JP1995/002043 WO1996011377A1 (en) 1994-10-06 1995-10-05 Illuminator for inspecting appearance of device and automatic apparatus for inspecting appearance of device using the illumination device

Publications (1)

Publication Number Publication Date
KR960706627A true KR960706627A (en) 1996-12-09

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Application Number Title Priority Date Filing Date
KR1019960702964A KR960706627A (en) 1994-10-06 1995-10-05 Fixture for device appearance inspection and automatic device appearance inspection device using this illuminator

Country Status (4)

Country Link
JP (1) JPH08105722A (en)
KR (1) KR960706627A (en)
CN (1) CN1138897A (en)
WO (1) WO1996011377A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6303916B1 (en) 1998-12-24 2001-10-16 Mitutoyo Corporation Systems and methods for generating reproducible illumination
EP1455179A1 (en) * 2003-03-07 2004-09-08 MV Research Limited A machine vision inspection system and method
JP6155900B2 (en) * 2013-06-26 2017-07-05 富士通株式会社 Lighting adjustment apparatus, lighting adjustment method, and lighting adjustment program
CN104280118A (en) * 2013-07-11 2015-01-14 华为技术有限公司 Low illumination level testing tool and control method thereof
CN104534983A (en) * 2014-12-05 2015-04-22 苏州佳祺仕信息科技有限公司 Automatic detection process method of workpiece assembling quality
CN114223321B (en) * 2019-08-05 2023-07-11 株式会社富士 Light source device
CN113257696A (en) * 2021-04-02 2021-08-13 晶澳（扬州）太阳能科技有限公司 Photovoltaic module EL detection system and test method thereof

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Publication number Priority date Publication date Assignee Title
JPS55132082A (en) * 1979-04-03 1980-10-14 Toshiba Corp Light input/output device
JP2892464B2 (en) * 1990-08-29 1999-05-17 マツダ株式会社 Surface defect inspection apparatus and surface defect inspection method
JPH04329344A (en) * 1991-05-01 1992-11-18 Elmo Co Ltd Mounted board inspecting device
JPH04337404A (en) * 1991-05-14 1992-11-25 Toshiba Corp Position measurement device
JPH04364404A (en) * 1991-06-11 1992-12-16 Matsushita Electric Ind Co Ltd Method for illuminating electronic parts

Also Published As

Publication number Publication date
CN1138897A (en) 1996-12-25
WO1996011377A1 (en) 1996-04-18
JPH08105722A (en) 1996-04-23

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