JPH075426Y2 - 温度特性試験槽 - Google Patents
温度特性試験槽Info
- Publication number
- JPH075426Y2 JPH075426Y2 JP1988011234U JP1123488U JPH075426Y2 JP H075426 Y2 JPH075426 Y2 JP H075426Y2 JP 1988011234 U JP1988011234 U JP 1988011234U JP 1123488 U JP1123488 U JP 1123488U JP H075426 Y2 JPH075426 Y2 JP H075426Y2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- air
- characteristic test
- test
- temperature characteristic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 title claims description 40
- 230000003028 elevating effect Effects 0.000 claims description 6
- 238000009423 ventilation Methods 0.000 claims description 6
- 239000003507 refrigerant Substances 0.000 description 7
- 239000004020 conductor Substances 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000001816 cooling Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988011234U JPH075426Y2 (ja) | 1988-02-01 | 1988-02-01 | 温度特性試験槽 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988011234U JPH075426Y2 (ja) | 1988-02-01 | 1988-02-01 | 温度特性試験槽 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01118379U JPH01118379U (enExample) | 1989-08-10 |
| JPH075426Y2 true JPH075426Y2 (ja) | 1995-02-08 |
Family
ID=31219606
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988011234U Expired - Lifetime JPH075426Y2 (ja) | 1988-02-01 | 1988-02-01 | 温度特性試験槽 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH075426Y2 (enExample) |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2610373C3 (de) * | 1975-04-02 | 1981-09-17 | Tyler Refrigeration Corp., 49120 Niles, Mich. | Kühltruhe |
| JPS58141175U (ja) * | 1982-03-17 | 1983-09-22 | 株式会社東芝 | オ−プンシヨ−ケ−ス |
| JPS613378U (ja) * | 1984-06-13 | 1986-01-10 | 日本建鐵株式会社 | 冷凍冷蔵オ−プンシヨ−ケ−ス |
| JPH0652147B2 (ja) * | 1984-10-26 | 1994-07-06 | 三菱電機株式会社 | オープンショーケース |
| JPS61203281U (enExample) * | 1985-06-07 | 1986-12-20 | ||
| JPS62169063A (ja) * | 1986-01-21 | 1987-07-25 | Kumamoto Nippon Denki Kk | 環境試験装置 |
| JPH01196583A (ja) * | 1988-02-01 | 1989-08-08 | Takamisawa Cybernetics Co Ltd | 温度特性試験槽 |
-
1988
- 1988-02-01 JP JP1988011234U patent/JPH075426Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01118379U (enExample) | 1989-08-10 |
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