JPH07502143A - コロナ放電イオン源 - Google Patents
コロナ放電イオン源Info
- Publication number
- JPH07502143A JPH07502143A JP5509968A JP50996893A JPH07502143A JP H07502143 A JPH07502143 A JP H07502143A JP 5509968 A JP5509968 A JP 5509968A JP 50996893 A JP50996893 A JP 50996893A JP H07502143 A JPH07502143 A JP H07502143A
- Authority
- JP
- Japan
- Prior art keywords
- corona discharge
- electrode
- ion source
- corona
- potential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 150000002500 ions Chemical class 0.000 claims description 122
- 239000000126 substance Substances 0.000 claims description 8
- 230000001419 dependent effect Effects 0.000 claims description 3
- 230000037230 mobility Effects 0.000 description 18
- 238000001228 spectrum Methods 0.000 description 11
- 239000000523 sample Substances 0.000 description 10
- 239000000463 material Substances 0.000 description 8
- 230000002285 radioactive effect Effects 0.000 description 8
- 238000000926 separation method Methods 0.000 description 8
- 229920000049 Carbon (fiber) Polymers 0.000 description 7
- 239000004917 carbon fiber Substances 0.000 description 7
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 7
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 239000000835 fiber Substances 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- 229910001369 Brass Inorganic materials 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- 239000010951 brass Substances 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 239000003610 charcoal Substances 0.000 description 2
- 238000004587 chromatography analysis Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005264 electron capture Effects 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 238000005513 bias potential Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000013043 chemical agent Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000000539 dimer Substances 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000005686 electrostatic field Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000001871 ion mobility spectroscopy Methods 0.000 description 1
- 230000005865 ionizing radiation Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 210000003127 knee Anatomy 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- PXHVJJICTQNCMI-RNFDNDRNSA-N nickel-63 Chemical compound [63Ni] PXHVJJICTQNCMI-RNFDNDRNSA-N 0.000 description 1
- -1 nickel-63 ion Chemical class 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000012857 radioactive material Substances 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/622—Ion mobility spectrometry
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Plasma & Fusion (AREA)
- Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Electrochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Sources, Ion Sources (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.コロナ放電電極(20、20′、28′、54、58)とターゲット電極( 14、14′、52)と、このコロナ放電電極とターゲット電極との2電極間に コロナ放電を発生させて放電領域内に導入されたイオン化物質をイオン化させる 為の電位差を与える装置とを有するコロナ放電イオン源。 2.前記電位差は事実上一定である請求項1記載のコロナ放電イオン源。 3.前記電位差はパルス化されている請求項1記載のコロナ放電イオン源。 4.前記電位差はそれ自体ではコロナ放電を生じるのに不十分なほぼ一定の成分 とパルス成分を加えたものである請求項1記載のコロナ放電イオン源。 5.パルス成分は一定成分に対して正方向または負方向成分の両者を有する請求 項4記載のコロナ放電イオン源(図6)。 6.パルス周波数および/または振幅を調節する装置を含む請求項3乃至5のい ずれか1項記載のコロナ放電イオン源。 7.ターゲット電極(14、14′、52)はほぼ円筒状でコロナ放電電極(2 0、20′、28′、54、58)を包囲している請求項1乃至6項のいずれか 1項記載のコロナ放電イオン源。 8.コロナ放電電極は尖端電極(20、20′、28′、54、58)の端末部 を有する請求項1乃至7項のいずれか1項記載のコロナ放電イオン源。 9.尖端電極がターゲット電極(14、14′、52)の長手軸に直角に延びて いる請求項7に従属した場合の請求項8記載のコロナ放電イオン源。 10.コロナ放電電極(20、20′、28′、54、58)は調節可能ホルダ ー(24、24′、30′)に取り付けられ、コロナ放電電極の位置はターゲッ ト電極(14、14′、52)に対して変化可能である請求項1乃至9項のいず れか1項記載のコロナ放電イオン源。 11.別のコロナ放電電極(28′、58)と、この別のコロナ放電電極に電位 を加える装置とを有する請求項1乃至10項のいずれか1項記載のコロナ放電イ オン源。 12.ほぼ一定の電位が別のコロナ放電電極(28′、58)に印加される請求 項11記載のコロナ放電イオン源。 13.別のコロナ放電電極(28′、58)に印加される電位はターゲット電極 の電位に関してコロナ放電電極(20′、54)に印加された電位とは反対の符 号のものである請求項12記載のコロナ放電イオン源。 14.別のコロナ放電電極は尖端電極(28′、58)の端末を有する請求項1 1乃至13のいずれか1項記載のコロナ放電イオン源。 15.別のコロナ放電電極を構成する尖端電極(28′、58)はターゲット電 極(14′、52)の長手軸にほぼ平行に延びる請求項9に従属した場合の請求 項14記載のコロナ放電イオン源。 16.別のコロナ放電電極(58)の近傍に対電極(60)を有し、また対電極 に電位を加える装置が含まれる請求項11乃至15のいずれか1項記載のコロナ 放電イオン源。 17.対電極(60)に印加される電位はターゲット電極(52)の電位に関し て別のコロナ放電電極(58)に印加される電位と反対の符号を有する請求項1 6記載のコロナ放電イオン源。 18.対電極(60)はリング状である請求項16または請求項17記載のコロ ナ放電イオン源。 19.対電極(60)は少なくとも部分的に別のコロナ放電電極を包囲している 請求項16乃至18のいずれか1項記載のコロナ放電イオン源。 20.放電領域内で形成されたイオンをイオン源から流出するのを選択的に放置 しまたは防止するゲート装置(66)を有する請求項1乃至19項のいずれか1 項記載のコロナ放電イオン源。 22.請求項1乃至20項のいずれか1項記載のコロナ放電イオン源を有するイ オン検出機。 23.請求項1乃至21のいずれか1項記載のコロナ放電イオン源を有するイオ ン移動度スペクトロメーター。 24.イオンゲート(44)と、コロナ放電の開始後所定の時間後にゲートを操 作する装置(45)とを有する請求項23記載のイオン移動度スペクトロメータ ー。 25.前記所定の時間を変化させるように配列された制御装置(45)を有する 請求項24記載のイオン移動度スペクトロメーター。
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9125709.7 | 1991-12-03 | ||
GB919125709A GB9125709D0 (en) | 1991-12-03 | 1991-12-03 | Ionisation source |
GB929213180A GB9213180D0 (en) | 1992-06-22 | 1992-06-22 | Ionisation source |
GB9213180.4 | 1992-06-22 | ||
PCT/GB1992/002242 WO1993011554A1 (en) | 1991-12-03 | 1992-12-03 | Corona discharge ionisation source |
US08/624,132 US5684300A (en) | 1991-12-03 | 1996-03-29 | Corona discharge ionization source |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH07502143A true JPH07502143A (ja) | 1995-03-02 |
JP3096986B2 JP3096986B2 (ja) | 2000-10-10 |
Family
ID=27265953
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP05509968A Expired - Lifetime JP3096986B2 (ja) | 1991-12-03 | 1992-12-03 | コロナ放電イオン源 |
Country Status (7)
Country | Link |
---|---|
US (1) | US5684300A (ja) |
EP (1) | EP0615655B1 (ja) |
JP (1) | JP3096986B2 (ja) |
CA (1) | CA2124344C (ja) |
DE (1) | DE69219618T2 (ja) |
IL (1) | IL103963A (ja) |
WO (1) | WO1993011554A1 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005004989A (ja) * | 2003-06-09 | 2005-01-06 | Hamamatsu Photonics Kk | イオン移動度検出器 |
JP2005134382A (ja) * | 2003-10-10 | 2005-05-26 | Wilson Greatbatch Technologies Inc | 埋め込み型エネルギ蓄積装置に対する密閉された筐体の漏れを検出する方法 |
JP2016527666A (ja) * | 2013-06-21 | 2016-09-08 | スミスズ ディテクション モントリオール インコーポレイティド | 被覆したコロナイオン化源のための方法及び装置 |
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GB2296369A (en) * | 1994-12-22 | 1996-06-26 | Secr Defence | Radio frequency ion source |
FR2738345B1 (fr) * | 1995-09-06 | 1997-11-14 | Ateq | Procede et dispositif pour la detection et l'analyse de gaz contaminants contenus dans une atmosphere |
GB2324875B (en) * | 1996-02-02 | 2000-06-21 | Graseby Dynamics Ltd | Corona discharge ion source for analytical instruments |
GB9602158D0 (en) * | 1996-02-02 | 1996-04-03 | Graseby Dynamics Ltd | Corona discharge ion sources for analytical instruments |
DE19609582C1 (de) * | 1996-03-12 | 1997-05-28 | Bruker Saxonia Analytik Gmbh | Photoionisations-Ionenmobilitätsspektrometrie |
US6100698A (en) * | 1997-06-17 | 2000-08-08 | Raytheon Co | Ion mobility sensors and spectrometers having a corona discharge ionization source |
US6032513A (en) * | 1997-06-30 | 2000-03-07 | Texas Instruments Incorporated | Apparatus and method for measuring contaminants in semiconductor processing chemicals |
JP2000028579A (ja) | 1998-07-08 | 2000-01-28 | Hitachi Ltd | 試料ガス採取装置及び危険物探知装置 |
US6407382B1 (en) | 1999-06-04 | 2002-06-18 | Technispan Llc | Discharge ionization source |
WO2000075953A2 (en) * | 1999-06-04 | 2000-12-14 | Technispan Llc | Discharge ionization source |
US6690005B2 (en) * | 2000-08-02 | 2004-02-10 | General Electric Company | Ion mobility spectrometer |
GB2369487A (en) * | 2000-11-24 | 2002-05-29 | Secr Defence | Radio frequency ion source |
DE10120336C2 (de) * | 2001-04-26 | 2003-05-08 | Bruker Saxonia Analytik Gmbh | Ionenmobilitätsspektrometer mit nicht-radioaktiver Ionenquelle |
US7095019B1 (en) | 2003-05-30 | 2006-08-22 | Chem-Space Associates, Inc. | Remote reagent chemical ionization source |
US6822225B2 (en) | 2002-09-25 | 2004-11-23 | Ut-Battelle Llc | Pulsed discharge ionization source for miniature ion mobility spectrometers |
US7112785B2 (en) * | 2003-04-04 | 2006-09-26 | Jeol Usa, Inc. | Method for atmospheric pressure analyte ionization |
US6949741B2 (en) | 2003-04-04 | 2005-09-27 | Jeol Usa, Inc. | Atmospheric pressure ion source |
ITMI20041523A1 (it) * | 2004-07-27 | 2004-10-27 | Getters Spa | Spettrometro di mobilita' ionica comprendente un elemento ionizzante a scarica a corona |
WO2007018575A2 (en) * | 2004-11-12 | 2007-02-15 | Thorrn Micro Technologies, Inc. | Ion generation by the temporal control of gaseous dielectric breakdown |
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US7138626B1 (en) | 2005-05-05 | 2006-11-21 | Eai Corporation | Method and device for non-contact sampling and detection |
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DE102005028930A1 (de) * | 2005-06-22 | 2007-01-04 | Technische Universität München | Vorrichtung für die Spektroskopie mit geladenen Analyten |
US7576322B2 (en) | 2005-11-08 | 2009-08-18 | Science Applications International Corporation | Non-contact detector system with plasma ion source |
US8026477B2 (en) | 2006-03-03 | 2011-09-27 | Ionsense, Inc. | Sampling system for use with surface ionization spectroscopy |
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JP2009539114A (ja) | 2006-05-26 | 2009-11-12 | イオンセンス インコーポレイテッド | 表面イオン化技術で用いるための固体を保持する器具 |
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JPS63193454A (ja) * | 1987-02-03 | 1988-08-10 | Hitachi Ltd | 質量分析装置 |
US5070240B1 (en) * | 1990-08-29 | 1996-09-10 | Univ Brigham Young | Apparatus and methods for trace component analysis |
US5162652A (en) * | 1991-08-07 | 1992-11-10 | Pcp, Inc. | Method and apparatus for rapid detection of contraband and toxic materials by trace vapor detection using ion mobility spectrometry |
-
1992
- 1992-12-03 DE DE69219618T patent/DE69219618T2/de not_active Expired - Lifetime
- 1992-12-03 IL IL10396392A patent/IL103963A/en not_active IP Right Cessation
- 1992-12-03 WO PCT/GB1992/002242 patent/WO1993011554A1/en active IP Right Grant
- 1992-12-03 JP JP05509968A patent/JP3096986B2/ja not_active Expired - Lifetime
- 1992-12-03 CA CA002124344A patent/CA2124344C/en not_active Expired - Lifetime
- 1992-12-03 EP EP92923960A patent/EP0615655B1/en not_active Expired - Lifetime
-
1996
- 1996-03-29 US US08/624,132 patent/US5684300A/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005004989A (ja) * | 2003-06-09 | 2005-01-06 | Hamamatsu Photonics Kk | イオン移動度検出器 |
JP2005134382A (ja) * | 2003-10-10 | 2005-05-26 | Wilson Greatbatch Technologies Inc | 埋め込み型エネルギ蓄積装置に対する密閉された筐体の漏れを検出する方法 |
JP2016527666A (ja) * | 2013-06-21 | 2016-09-08 | スミスズ ディテクション モントリオール インコーポレイティド | 被覆したコロナイオン化源のための方法及び装置 |
Also Published As
Publication number | Publication date |
---|---|
EP0615655B1 (en) | 1997-05-07 |
IL103963A (en) | 1996-03-31 |
EP0615655A1 (en) | 1994-09-21 |
CA2124344C (en) | 2001-04-10 |
DE69219618T2 (de) | 1997-09-04 |
DE69219618D1 (de) | 1997-06-12 |
JP3096986B2 (ja) | 2000-10-10 |
US5684300A (en) | 1997-11-04 |
WO1993011554A1 (en) | 1993-06-10 |
CA2124344A1 (en) | 1993-06-10 |
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