JPH0743666Y2 - 半導体試験装置 - Google Patents

半導体試験装置

Info

Publication number
JPH0743666Y2
JPH0743666Y2 JP1987068761U JP6876187U JPH0743666Y2 JP H0743666 Y2 JPH0743666 Y2 JP H0743666Y2 JP 1987068761 U JP1987068761 U JP 1987068761U JP 6876187 U JP6876187 U JP 6876187U JP H0743666 Y2 JPH0743666 Y2 JP H0743666Y2
Authority
JP
Japan
Prior art keywords
calibration
semiconductor
driver
calibration circuit
skew
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1987068761U
Other languages
English (en)
Japanese (ja)
Other versions
JPS63177767U (pt-PT
Inventor
慶一 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP1987068761U priority Critical patent/JPH0743666Y2/ja
Publication of JPS63177767U publication Critical patent/JPS63177767U/ja
Application granted granted Critical
Publication of JPH0743666Y2 publication Critical patent/JPH0743666Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1987068761U 1987-05-08 1987-05-08 半導体試験装置 Expired - Lifetime JPH0743666Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987068761U JPH0743666Y2 (ja) 1987-05-08 1987-05-08 半導体試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987068761U JPH0743666Y2 (ja) 1987-05-08 1987-05-08 半導体試験装置

Publications (2)

Publication Number Publication Date
JPS63177767U JPS63177767U (pt-PT) 1988-11-17
JPH0743666Y2 true JPH0743666Y2 (ja) 1995-10-09

Family

ID=30908879

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987068761U Expired - Lifetime JPH0743666Y2 (ja) 1987-05-08 1987-05-08 半導体試験装置

Country Status (1)

Country Link
JP (1) JPH0743666Y2 (pt-PT)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5832178A (ja) * 1981-08-19 1983-02-25 Advantest Corp Ｉｃテスタ
JPS61209370A (ja) * 1985-03-13 1986-09-17 Hitachi Electronics Eng Co Ltd スキユ−補正方式

Also Published As

Publication number Publication date
JPS63177767U (pt-PT) 1988-11-17

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