JPH0743643Y2 - Ｘ線回折測定のための試料加熱装置 - Google Patents

Ｘ線回折測定のための試料加熱装置

Info

Publication number
JPH0743643Y2
JPH0743643Y2 JP1989019568U JP1956889U JPH0743643Y2 JP H0743643 Y2 JPH0743643 Y2 JP H0743643Y2 JP 1989019568 U JP1989019568 U JP 1989019568U JP 1956889 U JP1956889 U JP 1956889U JP H0743643 Y2 JPH0743643 Y2 JP H0743643Y2
Authority
JP
Japan
Prior art keywords
sample
heater block
heater
heating device
diffraction measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1989019568U
Other languages
English (en)
Japanese (ja)
Other versions
JPH02110853U (OSRAM
Inventor
隆 栗山
修 阿久津
Original Assignee
理学電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 理学電機株式会社 filed Critical 理学電機株式会社
Priority to JP1989019568U priority Critical patent/JPH0743643Y2/ja
Publication of JPH02110853U publication Critical patent/JPH02110853U/ja
Application granted granted Critical
Publication of JPH0743643Y2 publication Critical patent/JPH0743643Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP1989019568U 1989-02-23 1989-02-23 Ｘ線回折測定のための試料加熱装置 Expired - Lifetime JPH0743643Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989019568U JPH0743643Y2 (ja) 1989-02-23 1989-02-23 Ｘ線回折測定のための試料加熱装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989019568U JPH0743643Y2 (ja) 1989-02-23 1989-02-23 Ｘ線回折測定のための試料加熱装置

Publications (2)

Publication Number Publication Date
JPH02110853U JPH02110853U (OSRAM) 1990-09-05
JPH0743643Y2 true JPH0743643Y2 (ja) 1995-10-09

Family

ID=31235196

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989019568U Expired - Lifetime JPH0743643Y2 (ja) 1989-02-23 1989-02-23 Ｘ線回折測定のための試料加熱装置

Country Status (1)

Country Link
JP (1) JPH0743643Y2 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005221363A (ja) * 2004-02-05 2005-08-18 Rigaku Corp Ｘ線分析用試料支持装置及びｘ線分析装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5816553U (ja) * 1981-07-24 1983-02-01 理学電機株式会社 Ｘ線小角散乱測定装置用試料加熱装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005221363A (ja) * 2004-02-05 2005-08-18 Rigaku Corp Ｘ線分析用試料支持装置及びｘ線分析装置

Also Published As

Publication number Publication date
JPH02110853U (OSRAM) 1990-09-05

Similar Documents

Publication Publication Date Title
CA2049264A1 (fr) Appareil destine a permettre d'evaluer la brillance d'une surface, en particulier de la peau
JPH0542369Y2 (OSRAM)
JPH0743643Y2 (ja) Ｘ線回折測定のための試料加熱装置
US6927850B1 (en) Infrared integrating sphere
JPS6177728A (ja) 熱電堆型赤外検出素子
JPH0323563Y2 (OSRAM)
JPS6139604B2 (OSRAM)
JP3606505B2 (ja) ガス分析装置
JPH0763717A (ja) 固体の熱物性値測定法及び測定装置並びに測定に使用する試料保持枠
JP5361005B2 (ja) Ｘ線回折・熱分析同時測定装置
JPH02156125A (ja) 温度センサ
JP2573072Y2 (ja) Ｘ線回折装置の液晶試料取り付け装置
EP0223416A2 (en) Determination of heat transfer rates
JPH04236348A (ja) 広範囲ｘ線検出器を備えたｘ線回折装置
JPS623721Y2 (OSRAM)
JPH0326911A (ja) 仰角測定器
JPS5922501Y2 (ja) 放射温度計
JPS6097289A (ja) 吸収エネルギ−分布測定装置
JPH06102208A (ja) Ｘ線回折測定のための試料加熱装置
JPS621750Y2 (OSRAM)
JP2722203B2 (ja) 赤外線検出素子
JPH06109548A (ja) 光ファイバ温度計
KR0132171B1 (ko) 온도측정지그
JPS62174210U (OSRAM)
JPH05288693A (ja) Ｘ線回折装置の試料加熱装置