JPH07321148A - Mounting method and structure for semiconductor device - Google Patents

Mounting method and structure for semiconductor device

Info

Publication number
JPH07321148A
JPH07321148A JP11254694A JP11254694A JPH07321148A JP H07321148 A JPH07321148 A JP H07321148A JP 11254694 A JP11254694 A JP 11254694A JP 11254694 A JP11254694 A JP 11254694A JP H07321148 A JPH07321148 A JP H07321148A
Authority
JP
Japan
Prior art keywords
semiconductor device
conductive adhesive
circuit board
mounting
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11254694A
Other languages
Japanese (ja)
Other versions
JP3255796B2 (en
Inventor
Yoshihiro Bessho
芳宏 別所
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP11254694A priority Critical patent/JP3255796B2/en
Publication of JPH07321148A publication Critical patent/JPH07321148A/en
Application granted granted Critical
Publication of JP3255796B2 publication Critical patent/JP3255796B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods
    • H01L2224/118Post-treatment of the bump connector
    • H01L2224/1182Applying permanent coating, e.g. in-situ coating
    • H01L2224/11822Applying permanent coating, e.g. in-situ coating by dipping, e.g. in a solder bath
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/321Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives

Abstract

PURPOSE:To provide a semiconductor device mounting structure and a method, wherein a semiconductor device can be mounted on a circuit board high in productivity and reliability with conductive adhesive agent. CONSTITUTION:A thermoplastic conductive agent film is formed on a support board and then transferred onto the projecting contact points 4 of a semiconductor device 3 as kept in a plastic state by heating. Keeping conductive adhesive agent 8 transferred to the projecting contact points 4 in a plastic state, the projecting contact points 4 are brought into contact with the connecting electrodes 7 of a circuit board 6, and then conductive adhesive agent 8 is cured. Therefore, as thermoplastic conductive adhesive agent is quickly cured by cooling, a semiconductor device mounting process can be improved in productivity. A heating temperature required in a mounting operation is comparatively low, so that thermal stress caused by a difference in thermal expansion coefficient between a semiconductor device and a circuit board is very small, and a semiconductor module composed of them is enhanced in reliability.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体装置の実装方法
及び半導体装置の実装体に係り、特にフェースダウンで
導電性接着剤により半導体装置を実装する技術の改良に
関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device mounting method and a semiconductor device mounting body, and more particularly to improvement of a technique for mounting a semiconductor device face down with a conductive adhesive.

【0002】[0002]

【従来の技術】従来、フェースダウンによる半導体装置
の回路基板への実装方法としては、あらかじめメッキ技
術により半導体装置の電極パッド上に半田用合金からな
る突出接点を形成しておき、この突出接点を回路基板の
接続電極に半田付けする方法が用いられていたが、近年
では導電性接着剤を用いて半導体装置を回路基板に接続
する方法が用いられつつある。
2. Description of the Related Art Conventionally, as a method of mounting a semiconductor device on a circuit board by face down, a protruding contact made of a soldering alloy is previously formed on an electrode pad of the semiconductor device by a plating technique, and this protruding contact is used. The method of soldering to the connection electrode of the circuit board has been used, but in recent years, a method of connecting the semiconductor device to the circuit board using a conductive adhesive is being used.

【0003】このような導電性接着剤を用いた半導体装
置の実装方法として、例えば米国特許第4661192
号公報に開示されるように、導電性接着剤を用いてフェ
ースダウンにより半導体装置を回路基板に簡易的に接続
する技術がある。以下、図面を参照しながら、従来の半
導体装置の実装技術について説明する。
As a method of mounting a semiconductor device using such a conductive adhesive, for example, US Pat. No. 4,661,192 is used.
As disclosed in the publication, there is a technique for simply connecting a semiconductor device to a circuit board by face down using a conductive adhesive. Hereinafter, a conventional mounting technique of a semiconductor device will be described with reference to the drawings.

【0004】図3は、半導体装置の実装工程の一部を示
し、半導体装置の突出接点に導電性接着剤を転写する工
程を示す図である。また、図4は、上述の工程によって
形成される半導体装置の実装体の要部断面図である。
FIG. 3 is a diagram showing a part of the mounting process of the semiconductor device, showing the process of transferring the conductive adhesive to the protruding contacts of the semiconductor device. Further, FIG. 4 is a cross-sectional view of a main part of a semiconductor device package formed by the above-described process.

【0005】図3および図4において、9は半導体装
置、10は半導体装置9上の所定部位に形成された端子
電極、11は該端子電極10上に形成された突出接点、
12は導電性エポキシ樹脂を塗布してなる塗膜、13は
支持基体、14は回路基板、15は該回路基板14上の
接続電極、16は導電性エポキシ樹脂を突出接点10に
転写してなる転写部である。
In FIGS. 3 and 4, 9 is a semiconductor device, 10 is a terminal electrode formed on a predetermined portion of the semiconductor device 9, 11 is a protruding contact formed on the terminal electrode 10,
Reference numeral 12 is a coating film formed by applying a conductive epoxy resin, 13 is a supporting substrate, 14 is a circuit board, 15 is a connecting electrode on the circuit board 14, and 16 is a conductive epoxy resin transferred to the protruding contact 10. It is a transfer part.

【0006】以上のように構成された従来の導電性接着
剤を用いた半導体装置の実装方法およびその実装体につ
いて、以下その概略を説明する。
The outline of a conventional semiconductor device mounting method using the above-described conductive adhesive and its mounting body will be described below.

【0007】まず、支持基体13の上に導電性エポキシ
樹脂の塗膜10を形成しておき、図3に示すように、こ
の支持基体13の上方から、半導体装置9を突出接点1
1を下方にした状態で下降させて、両者を接触させる。
そして、半導体装置9の突出接点11の先端を支持基体
13上に形成した導電性エポキシ樹脂の塗膜12に接触
させることにより、突出接点11に導電性エポキシ樹脂
を転写する。
First, a conductive epoxy resin coating film 10 is formed on a support base 13, and the semiconductor device 9 is connected to the protruding contact 1 from above the support base 13 as shown in FIG.
1 is lowered and the two are brought into contact with each other.
Then, the tip of the protruding contact 11 of the semiconductor device 9 is brought into contact with the coating film 12 of the conductive epoxy resin formed on the support base 13 to transfer the conductive epoxy resin to the protruding contact 11.

【0008】その後、突出接点11上に導電性エポキシ
樹脂の転写部16を付着した半導体装置9を、回路基板
14上の接続電極15に位置合わせして積載した後、導
電性エポキシ樹脂を硬化させることにより、図4に示す
ように、導電性エポキシ樹脂を用いた半導体装置9の実
装体を得るものである。
After that, the semiconductor device 9 in which the transfer portion 16 of the conductive epoxy resin is attached on the protruding contact 11 is aligned with the connection electrode 15 on the circuit board 14 and stacked, and then the conductive epoxy resin is cured. As a result, as shown in FIG. 4, a mounting body of the semiconductor device 9 using the conductive epoxy resin is obtained.

【0009】[0009]

【発明が解決しようとする課題】しかしながら、上記の
ような半導体装置の実装方法とその実装体においては、
導電性接着剤として導電性エポキシ樹脂を用いるため、
半導体装置9を回路基板14に積載した後に導電性エポ
キシ樹脂を硬化するのに必要な時間が長く、半導体装置
9の実装体の生産性に欠けるという問題があった。すな
わち、一般的に、導電性エポキシ樹脂の硬化には150
℃程度の熱と1時間以上の時間が必要となるからであ
る。
However, in the mounting method of the semiconductor device and the mounting body thereof as described above,
Since a conductive epoxy resin is used as a conductive adhesive,
There is a problem that the time required to cure the conductive epoxy resin after the semiconductor device 9 is loaded on the circuit board 14 is long, and the productivity of the package of the semiconductor device 9 is low. That is, in general, 150 is required to cure the conductive epoxy resin.
This is because heat of about ° C and time of 1 hour or more are required.

【0010】本発明は上記の課題に鑑みてなされたもの
であり、その目的とするところは、半導体装置を回路基
板に生産性良く簡易的に実装することのできる半導体装
置の実装方法と半導体装置の実装体を提供することにあ
る。
The present invention has been made in view of the above problems, and an object of the present invention is to provide a semiconductor device mounting method and a semiconductor device capable of easily mounting the semiconductor device on a circuit board with high productivity. It is to provide the implementation body of.

【0011】[0011]

【課題を解決するための手段】上記目的を達成するた
め、本発明の講じた解決手段は、導電性接着剤を構成す
る樹脂として熱可塑性の導電性接着剤を用いることにあ
る。
In order to achieve the above object, the means for solving the problems of the present invention is to use a thermoplastic conductive adhesive as a resin constituting the conductive adhesive.

【0012】具体的に、請求項1の発明の講じた手段
は、突出接点を有する半導体装置をフェースダウンで導
電性接着剤を用いて回路基板に実装する半導体装置の実
装方法として、熱可塑性の導電性接着剤の塗膜を支持基
体上に形成する工程と、上記支持基体上の導電性接着剤
を加熱して可塑状態に維持しながら、上記半導体装置の
突出接点を上記支持基体上の導電性接着剤の塗膜に接触
させて、突出接点に熱可塑性の導電性接着剤を転写する
工程と、上記工程で形成された導電性接着剤の転写部を
可塑状態に維持しながら半導体装置の突出接点と回路基
板の接続電極とを接触させる工程と、上記半導体装置の
突出接点を回路基板の接続電極とを接触させた状態で導
電性接着剤を冷却して両者を接着する工程とを設けた方
法である。
[0012] Specifically, the means taken by the invention of claim 1 is a thermoplastic method as a semiconductor device mounting method for mounting a semiconductor device having a protruding contact face down on a circuit board using a conductive adhesive. Forming a coating film of a conductive adhesive on the supporting substrate; and heating the conductive adhesive on the supporting substrate to keep it in a plastic state while making the protruding contacts of the semiconductor device conductive on the supporting substrate. Of the semiconductor device by contacting the coating film of the conductive adhesive to transfer the thermoplastic conductive adhesive to the protruding contact and maintaining the transfer portion of the conductive adhesive formed in the above process in the plastic state. Provided are a step of bringing the protruding contact into contact with the connecting electrode of the circuit board, and a step of cooling the conductive adhesive with the protruding contact of the semiconductor device in contact with the connecting electrode of the circuit board to bond the two. It is a method.

【0013】請求項2の発明の講じた手段は、請求項1
の発明において、上記半導体装置の突出接点に導電性接
着剤を転写する工程では、半導体装置を導電性接着剤が
可塑状態となる温度以上の温度に加熱する方法である。
The means taken by the invention of claim 2 is defined by claim 1.
In the invention, the step of transferring the conductive adhesive to the protruding contact of the semiconductor device is a method of heating the semiconductor device to a temperature equal to or higher than a temperature at which the conductive adhesive becomes in a plastic state.

【0014】請求項3の発明の講じた手段は、請求項1
又は2の発明において、上記半導体装置の突出接点を回
路基板の接続電極に接触させる工程では、半導体装置を
導電性接着剤が可塑状態となる温度以上の温度に加熱す
る方法である。
The means taken by the invention of claim 3 is the method of claim 1.
Alternatively, in the second aspect of the present invention, the step of bringing the protruding contact of the semiconductor device into contact with the connection electrode of the circuit board is a method of heating the semiconductor device to a temperature equal to or higher than a temperature at which the conductive adhesive is in a plastic state.

【0015】請求項4の発明の講じた手段は、請求項1
又は2の発明において、半導体装置の突出接点を回路基
板の接続電極に接触させる工程では、回路基板を導電性
接着剤が可塑状態となる温度以上の温度に加熱する方法
である。
The means taken by the invention of claim 4 is defined by claim 1.
Alternatively, in the second aspect of the invention, the step of bringing the protruding contact of the semiconductor device into contact with the connection electrode of the circuit board is a method of heating the circuit board to a temperature at which the conductive adhesive is in a plastic state or higher.

【0016】請求項5の発明の講じた手段は、請求項
1,2,3又は4の発明において、上記導電性接着剤
に、少なくとも熱可塑性樹脂と導電性フィラーとを含ま
せる方法である。
According to the invention of claim 5, in the invention of claim 1, 2, 3 or 4, the conductive adhesive contains at least a thermoplastic resin and a conductive filler.

【0017】請求項6の発明の講じた手段は、請求項
1,2,3,4又は5の発明において、上記半導体装置
の突出接点を二段突出形状とする方法である。
According to the invention of claim 6, in the invention of claim 1, 2, 3, 4 or 5, the protruding contact of the semiconductor device has a two-step protruding shape.

【0018】請求項7の発明の講じた手段は、突出接点
を有する半導体装置を回路基板に実装してなる半導体装
置の実装体を対象とする。そして、上記半導体装置の端
子電極の上に導電性材料からなる突出接点を、上記回路
基板の所定部位に導電性材料からなる接続電極をそれぞ
れ設け、上記半導体装置の突出接点が熱可塑性の導電性
接着剤により上記回路基板の接続電極に固着されている
ように構成したものである。
The means of the invention as set forth in claim 7 is intended for a semiconductor device mounting body in which a semiconductor device having protruding contacts is mounted on a circuit board. A protruding contact made of a conductive material is provided on the terminal electrode of the semiconductor device, and a connection electrode made of a conductive material is provided at a predetermined portion of the circuit board, and the protruding contact of the semiconductor device is made of a thermoplastic conductive material. It is configured to be fixed to the connection electrode of the circuit board with an adhesive.

【0019】請求項8の発明の講じた手段は、請求項7
の発明において、上記半導体装置の突出接点を二段突出
形状としたものである。
The means taken by the invention of claim 8 is the method of claim 7.
In the invention, the protruding contact of the semiconductor device has a two-step protruding shape.

【0020】請求項9の発明の講じた手段は、請求項7
又は8の発明において、上記導電性接着剤に、少なくと
も熱可塑性樹脂と導電性フィラーとを含ませるように構
成したものである。
The means taken by the invention of claim 9 is defined by claim 7.
Alternatively, in the eighth invention, the conductive adhesive is configured to include at least a thermoplastic resin and a conductive filler.

【0021】[0021]

【作用】以上の方法又は装置により、請求項1の発明で
は、半導体装置の突出接点に転写された導電性接着剤を
介して、半導体装置の突出接点と回路基板の接続電極と
が固着される。その際、導電性接着剤が熱可塑性樹脂で
構成されているので、単に冷却するだけで導電性接着剤
が硬化し、両者が接着される。したがって、熱硬化性樹
脂のごとく反応による硬化に長時間を要することがな
く、工程に要する時間が短縮される。しかも、熱可塑性
樹脂を可塑状態に維持するためには、熱硬化性樹脂を硬
化させる時ほどの高温に維持する必要がないので、半導
体装置と回路基板との熱膨張率の差に起因する熱応力も
極めて小さくなり、実装された半導体装置の信頼性が向
上する。
According to the first aspect of the present invention, the protruding contact of the semiconductor device and the connection electrode of the circuit board are fixed to each other through the conductive adhesive transferred to the protruding contact of the semiconductor device. . At that time, since the conductive adhesive is made of a thermoplastic resin, the conductive adhesive is hardened by simply cooling and the both are bonded. Therefore, unlike a thermosetting resin, it does not take a long time to cure due to a reaction, and the time required for the process is shortened. Moreover, in order to maintain the thermoplastic resin in the plastic state, it is not necessary to maintain the temperature as high as when the thermosetting resin is cured, so that the thermal expansion caused by the difference in the coefficient of thermal expansion between the semiconductor device and the circuit board The stress is also extremely small, and the reliability of the mounted semiconductor device is improved.

【0022】請求項2の発明では、半導体装置の突出接
点に導電性接着剤を転写する際、半導体装置が可塑状態
となる温度以上に加熱されることで、突出接点が熱可塑
性の導電性接着剤を転写可能な温度に維持され、転写が
円滑に行われる。
According to the second aspect of the present invention, when the conductive adhesive is transferred to the protruding contact of the semiconductor device, the protruding contact is heated to a temperature at which the semiconductor device is in a plastic state or higher, so that the protruding contact has a thermoplastic conductive adhesive. The temperature is maintained at a temperature at which the agent can be transferred, and transfer is smoothly performed.

【0023】請求項3又は4の発明では、半導体装置の
突出接点と回路基板の接続電極とを接触させる際、半導
体装置又は回路基板が熱可塑温度以上に加熱されること
で、熱可塑性の導電性接着剤が可塑状態に維持され、接
続電極側にも接着剤が付着する。その際、半導体装置を
吸着するツールや回路基板の支持部材を利用して加熱を
行うことが可能となり、装置の構成が簡素化される。
According to the invention of claim 3 or 4, when the protruding contact of the semiconductor device and the connection electrode of the circuit board are brought into contact with each other, the semiconductor device or the circuit board is heated to a temperature not lower than the thermoplastic temperature, so that the thermoplastic conductive material The adhesive agent is maintained in a plastic state, and the adhesive agent also adheres to the connection electrode side. At that time, it is possible to perform heating by using a tool for adsorbing the semiconductor device or a support member for the circuit board, and the structure of the device is simplified.

【0024】請求項5の発明では、熱可塑性樹脂と導電
性フィラーとによって導電性接着剤の機能が簡易に確保
される。
According to the invention of claim 5, the function of the conductive adhesive is easily ensured by the thermoplastic resin and the conductive filler.

【0025】請求項6の発明では、突出接点が二段突出
形状を有することで、熱可塑性の導電性接着剤の冷却が
より短時間に完了することになる。
According to the sixth aspect of the invention, since the protruding contact has the two-step protruding shape, the cooling of the thermoplastic conductive adhesive is completed in a shorter time.

【0026】請求項7の発明では、フェースダウンで実
装される半導体装置において、熱可塑性の導電性接着剤
により半導体装置が回路基板に実装されているので、半
導体装置の実装工程の所要時間が短縮され、生産性が向
上するとともにコストが低減する。また、実装工程にお
ける加熱温度が低くなるので、半導体装置と回路基板の
熱膨張係数の差に起因する熱応力も極めて小さく抑制さ
れ、信頼性が向上する。
According to the invention of claim 7, in the semiconductor device mounted face down, the semiconductor device is mounted on the circuit board by the thermoplastic conductive adhesive, so that the time required for the mounting process of the semiconductor device is shortened. As a result, productivity is improved and cost is reduced. Further, since the heating temperature in the mounting process is lowered, the thermal stress caused by the difference in thermal expansion coefficient between the semiconductor device and the circuit board is suppressed to a very small level, and the reliability is improved.

【0027】請求項8,請求項9の発明では、それぞれ
上記請求項6,請求項5の発明と同様の作用が得られ
る。
In the inventions of claims 8 and 9, the same actions as those of the inventions of claims 6 and 5 can be obtained.

【0028】[0028]

【実施例】以下、本発明の実施例に係る半導体装置の実
装工程とその結果得られる半導体装置の実装体とについ
て、図面を参照しながら説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A semiconductor device mounting process according to an embodiment of the present invention and a semiconductor device mounting body obtained as a result will be described below with reference to the drawings.

【0029】図1(a)〜(c)は実施例における半導
体装置の実装方法を説明する工程図、図2は上記図1の
実装方法により作製される半導体装置の実装体の要部断
面図である。
FIGS. 1A to 1C are process drawings for explaining a method of mounting a semiconductor device according to an embodiment, and FIG. 2 is a cross-sectional view of a main part of a semiconductor device package manufactured by the mounting method of FIG. Is.

【0030】図1および図2において、1は可塑状態に
ある熱可塑性の導電性接着剤の塗膜、2は加熱された支
持基体、3は半導体装置、4は半導体装置の端子電極上
に形成された突出接点、5は半導体装置3を加熱および
吸着するための加熱・吸着ツール、6は回路基板、7は
回路基板6の上の接続電極、8は熱可塑性の導電性接着
剤の転写部である。ここで、上記熱可塑性の導電性接着
剤1は、ポリエステル樹脂などの熱可塑性樹脂にAgな
どの導電フィラーを含んだものである。
In FIGS. 1 and 2, 1 is a coating film of a thermoplastic conductive adhesive in a plastic state, 2 is a heated support base, 3 is a semiconductor device, and 4 is formed on a terminal electrode of the semiconductor device. The protruding contact 5 is a heating / sucking tool for heating and sucking the semiconductor device 3, 6 is a circuit board, 7 is a connecting electrode on the circuit board 6, and 8 is a transfer portion of a thermoplastic conductive adhesive. Is. Here, the thermoplastic conductive adhesive 1 is a thermoplastic resin such as a polyester resin containing a conductive filler such as Ag.

【0031】以上のように構成された半導体装置の実装
方法とその実装体について、以下図面を用いて説明す
る。
A method of mounting the semiconductor device configured as described above and a mounting body thereof will be described below with reference to the drawings.

【0032】まず、図1(a)に示すように、支持基体
2上に可塑化した熱可塑性の導電性接着剤からなる塗膜
1を形成する。このとき、支持基体2は、熱可塑性の導
電性接着剤が可塑状態となる温度以上の温度に加熱され
ている。
First, as shown in FIG. 1A, a coating film 1 made of a plasticized thermoplastic conductive adhesive is formed on a supporting substrate 2. At this time, the support substrate 2 is heated to a temperature equal to or higher than the temperature at which the thermoplastic conductive adhesive becomes in a plastic state.

【0033】そして、図1(b)に示すように、突出接
点4を有する半導体装置3を加熱・吸着ツール5により
吸着しながら、突出接点4を可塑状態にある導電性接着
剤の塗膜1に接触させる。そのとき、加熱・吸着ツール
2によって半導体装置3は導電性接着剤が可塑状態とな
る温度以上の温度まで加熱されている。その後、半導体
装置3を加熱・吸着ツール5により引き上げると、突出
接点4上に熱可塑性の導電性接着剤の一部が転写され、
転写部8が形成される。
Then, as shown in FIG. 1 (b), while the semiconductor device 3 having the protruding contact 4 is adsorbed by the heating / adsorption tool 5, the protruding contact 4 is in a plastic state with the conductive adhesive coating film 1 Contact. At that time, the semiconductor device 3 is heated by the heating / adsorption tool 2 to a temperature equal to or higher than the temperature at which the conductive adhesive is in a plastic state. After that, when the semiconductor device 3 is pulled up by the heating / suction tool 5, a part of the thermoplastic conductive adhesive is transferred onto the protruding contact 4,
The transfer portion 8 is formed.

【0034】つぎに、図1(c)に示すように、加熱・
吸着ツール5で半導体装置3を吸着しながら半導体装置
3を下方に下降させ、先端に導電性接着剤の転写部8が
形成された突出接点4を、回路基板6上の接続電極7に
位置合わせして両者を接触させる。このとき、導電性接
着剤の転写部8は加熱され可塑状態であるので、導電性
接着剤が接続電極7の表面に付着する。
Next, as shown in FIG. 1 (c), heating and
The semiconductor device 3 is lowered while sucking the semiconductor device 3 with the suction tool 5, and the protruding contact 4 having the transfer portion 8 of the conductive adhesive formed on the tip is aligned with the connection electrode 7 on the circuit board 6. And contact them. At this time, since the conductive adhesive transfer portion 8 is heated and in a plastic state, the conductive adhesive adheres to the surface of the connection electrode 7.

【0035】その後、加熱・吸着ツール5を半導体装置
3から離すと、熱可塑性の導電性接着剤の転写部8が冷
却されて硬化し、図2に示すように、半導体装置3の突
出接点4と回路基板6の接続電極7とが熱可塑性の導電
性接着剤の転写部8によって接着される。つまり、半導
体装置の実装体が得られる。
After that, when the heating / suction tool 5 is separated from the semiconductor device 3, the transfer portion 8 of the thermoplastic conductive adhesive is cooled and hardened, and as shown in FIG. And the connection electrode 7 of the circuit board 6 are adhered to each other by the transfer portion 8 of the thermoplastic conductive adhesive. That is, a semiconductor device package is obtained.

【0036】上記実施例では、あらかじめ可塑化された
熱可塑性の導電性接着剤を用いて半導体装置と回路基板
を接合するために、半導体装置を回路基板に実装する際
に導電性接着剤を短時間で硬化させることができる。し
たがって、導電性接着剤を用いた半導体装置の実装体の
生産性が向上するとともにコストが低減する。
In the above-described embodiment, since the semiconductor device and the circuit board are bonded by using the thermoplastic conductive adhesive that has been plasticized in advance, the conductive adhesive is short when the semiconductor device is mounted on the circuit board. Can be cured in time. Therefore, the productivity of the package of the semiconductor device using the conductive adhesive is improved and the cost is reduced.

【0037】また、このように半導体装置を回路基板に
導電性接着剤を用いて実装するために、半導体装置と回
路基板の熱膨張係数の差により生ずる熱応力を極めて小
さく抑制することができ、信頼性の高い半導体装置の実
装体を得ることができる。
Since the semiconductor device is mounted on the circuit board by using the conductive adhesive as described above, the thermal stress caused by the difference in the thermal expansion coefficient between the semiconductor device and the circuit board can be suppressed to an extremely small level. It is possible to obtain a highly reliable semiconductor device package.

【0038】なお、本実施例では、回路基板6へ半導体
装置3を実装する際に、加熱・吸着ツール5によって半
導体装置3を加熱するようにしたが、吸着ツールによっ
て半導体装置3を加熱することなく吸着するのみとして
もよい。その場合、回路基板6を加熱してもよく、さら
に、赤外線を照射する等他の加熱手段によって熱可塑性
の導電性接着剤を加熱することも可能である。
In this embodiment, when the semiconductor device 3 is mounted on the circuit board 6, the semiconductor device 3 is heated by the heating / suction tool 5, but the semiconductor device 3 is heated by the suction tool. Instead, it may be adsorbed only. In that case, the circuit board 6 may be heated, and it is also possible to heat the thermoplastic conductive adhesive by other heating means such as irradiation with infrared rays.

【0039】また、上記実施例では、熱可塑性の導電性
接着剤として、ポリエステル樹脂にAgなどの導電フィ
ラーを含んだものを用いたが、本発明の導電性接着剤は
かかる実施例に限定されるものではなく、熱可塑性と導
電性とを有するものであればいかなるものでもよい。
Further, in the above-mentioned embodiment, as the thermoplastic conductive adhesive, a polyester resin containing a conductive filler such as Ag is used, but the conductive adhesive of the present invention is not limited to this embodiment. However, any material may be used as long as it has thermoplasticity and conductivity.

【0040】さらに、上記実施例では、突出接点4の形
状は単純な円柱状としたが、特に二段形状とすること
で、導電性接着剤の転写部8をより迅速に冷却させるこ
とができ、硬化時間を短縮することができる。
Further, in the above-mentioned embodiment, the protruding contact 4 has a simple cylindrical shape. However, if the protruding contact 4 has a two-step shape, the transfer portion 8 of the conductive adhesive can be cooled more quickly. The curing time can be shortened.

【0041】[0041]

【発明の効果】以上説明したように、本発明の半導体装
置の実装方法によれば、あらかじめ可塑状態に維持した
熱可塑性の導電性接着剤を用いて半導体装置と回路基板
を接合するために、半導体装置を回路基板に実装する際
に導電性接着剤を短時間で硬化することができ、よっ
て、導電性接着剤を用いた半導体装置の実装体の生産性
の向上を図ることができる。
As described above, according to the method of mounting a semiconductor device of the present invention, in order to bond the semiconductor device and the circuit board by using the thermoplastic conductive adhesive which is maintained in the plastic state in advance, The conductive adhesive can be cured in a short time when the semiconductor device is mounted on the circuit board, and thus the productivity of the semiconductor device mounting body using the conductive adhesive can be improved.

【0042】さらに、本発明の半導体装置の実装体は、
半導体装置と回路基板との接着に熱可塑性の導電性接着
剤が用いられるので、半導体装置と回路基板の熱膨張係
数の差により生ずる熱応力の影響がほとんどなく、信頼
性の高い半導体装置の実装体を得ることができる。
Further, the package of the semiconductor device of the present invention is
Since a thermoplastic conductive adhesive is used to bond the semiconductor device and the circuit board, there is almost no effect of thermal stress caused by the difference in thermal expansion coefficient between the semiconductor device and the circuit board, and highly reliable mounting of the semiconductor device is achieved. You can get the body.

【図面の簡単な説明】[Brief description of drawings]

【図1】実施例である半導体装置の実装工程における半
導体装置等の状態を示す部分断面図である。
FIG. 1 is a partial cross-sectional view showing a state of a semiconductor device or the like in a mounting process of a semiconductor device according to an embodiment.

【図2】実施例における半導体装置の実装体の部分断面
図である。
FIG. 2 is a partial cross-sectional view of a mounted body of a semiconductor device in an example.

【図3】従来の半導体装置の実装方法における半導体装
置の突出接点に導電性接着剤を転写する際の状態を示す
部分断面図である。
FIG. 3 is a partial cross-sectional view showing a state when a conductive adhesive is transferred to a protruding contact of a semiconductor device in a conventional semiconductor device mounting method.

【図4】従来の半導体装置の実装方法で得られる実装体
の部分断面図である。
FIG. 4 is a partial cross-sectional view of a mounting body obtained by a conventional semiconductor device mounting method.

【符号の説明】[Explanation of symbols]

1 塗膜 2 支持基体 3 半導体装置 4 突出接点 5 加熱・吸着ツール 6 回路基板 7 接続電極 8 転写部 9 半導体装置 10 端子電極 11 突出接点 12 塗膜 13 支持基体 14 回路基板 15 接続電極 16 転写部 DESCRIPTION OF SYMBOLS 1 coating 2 support base 3 semiconductor device 4 protruding contact 5 heating / adsorption tool 6 circuit board 7 connection electrode 8 transfer part 9 semiconductor device 10 terminal electrode 11 protruding contact 12 coating 13 support base 14 circuit board 15 connection electrode 16 transfer part

Claims (9)

【特許請求の範囲】[Claims] 【請求項1】 突出接点を有する半導体装置をフェース
ダウンで導電性接着剤を用いて回路基板に実装する半導
体装置の実装方法において、 熱可塑性の導電性接着剤の塗膜を支持基体上に形成する
工程と、 上記支持基体上の導電性接着剤を加熱して可塑状態に維
持しながら、上記半導体装置の突出接点を上記支持基体
上の導電性接着剤の塗膜に接触させて、突出接点に導電
性接着剤を転写する工程と、 上記工程で形成された導電性接着剤の転写部を可塑状態
に維持しながら半導体装置の突出接点と回路基板の接続
電極とを接触させる工程と、 上記半導体装置の突出接点を回路基板の接続電極とを接
触させた状態で導電性接着剤を冷却して両者を接着する
工程とを備えたことを特徴とする半導体装置の実装方
法。
1. A method of mounting a semiconductor device having a protruding contact on a circuit board face down using a conductive adhesive, wherein a coating film of a thermoplastic conductive adhesive is formed on a supporting substrate. And the conductive adhesive on the supporting substrate is heated and kept in a plastic state while the protruding contact of the semiconductor device is brought into contact with the coating film of the conductive adhesive on the supporting substrate to form a protruding contact. A step of transferring a conductive adhesive to the step of contacting the protruding contact of the semiconductor device with the connection electrode of the circuit board while maintaining the transfer part of the conductive adhesive formed in the step in a plastic state, And a step of cooling the conductive adhesive in a state where the protruding contacts of the semiconductor device are in contact with the connection electrodes of the circuit board and adhering the two together.
【請求項2】 請求項1記載の半導体装置の実装方法に
おいて、 上記半導体装置の突出接点に導電性接着剤を転写する工
程では、半導体装置を導電性接着剤が可塑状態となる温
度以上の温度に加熱することを特徴とする半導体装置の
実装方法。
2. The method for mounting a semiconductor device according to claim 1, wherein in the step of transferring the conductive adhesive to the protruding contact of the semiconductor device, the semiconductor device is heated to a temperature equal to or higher than a temperature at which the conductive adhesive is in a plastic state. A method for mounting a semiconductor device, comprising:
【請求項3】 請求項1又は2記載の半導体装置の実装
方法において、 上記半導体装置の突出接点を回路基板の接続電極に接触
させる工程では、半導体装置を導電性接着剤が可塑状態
となる温度以上の温度に加熱することを特徴とする半導
体装置の実装方法。
3. The method for mounting a semiconductor device according to claim 1, wherein in the step of bringing the protruding contact of the semiconductor device into contact with the connection electrode of the circuit board, the semiconductor device is heated to a temperature at which the conductive adhesive is in a plastic state. A method for mounting a semiconductor device, comprising heating to the above temperature.
【請求項4】 請求項1又は2記載の半導体装置の実装
方法において、 半導体装置の突出接点を回路基板の接続電極に接触させ
る工程では、回路基板を導電性接着剤が可塑状態となる
温度以上の温度に加熱することを特徴とする半導体装置
の実装方法。
4. The method for mounting a semiconductor device according to claim 1, wherein in the step of bringing the protruding contact of the semiconductor device into contact with the connection electrode of the circuit board, the temperature of the circuit board is equal to or higher than a temperature at which the conductive adhesive is in a plastic state. A method for mounting a semiconductor device, which comprises heating the semiconductor device to the temperature of.
【請求項5】 請求項1,2,3又は4記載の半導体装
置の実装方法において、 上記導電性接着剤は、少なくとも熱可塑性樹脂と導電性
フィラーとを含むことを特徴とする半導体装置の実装方
法。
5. The method for mounting a semiconductor device according to claim 1, 2, 3 or 4, wherein the conductive adhesive contains at least a thermoplastic resin and a conductive filler. Method.
【請求項6】 請求項1,2,3,4又は5記載の半導
体装置の実装方法において、 上記半導体装置の突出接点は、二段突出形状を有するこ
とを特徴とする半導体装置の実装方法。
6. The method of mounting a semiconductor device according to claim 1, 2, 3, 4 or 5, wherein the protruding contact of the semiconductor device has a two-step protruding shape.
【請求項7】 半導体装置を回路基板に実装してなる半
導体装置の実装体において、 上記半導体装置の端子電極の上に形成され導電性材料か
らなる突出接点と、 上記回路基板の所定部位に形成され導電性材料からなる
接続電極とを備え、 上記半導体装置の突出接点が、熱可塑性の導電性接着剤
により上記回路基板の接続電極に固着されていることを
特徴とする半導体装置の実装体。
7. A semiconductor device mounting body in which a semiconductor device is mounted on a circuit board, wherein a protruding contact made of a conductive material is formed on a terminal electrode of the semiconductor device, and formed on a predetermined portion of the circuit board. And a connection electrode made of a conductive material, wherein the protruding contact of the semiconductor device is fixed to the connection electrode of the circuit board with a thermoplastic conductive adhesive.
【請求項8】 請求項7記載の半導体装置の実装体にお
いて、 上記半導体装置の突出接点は、二段突出形状を有するこ
とを特徴とする半導体装置の実装体。
8. The semiconductor device mounting body according to claim 7, wherein the protruding contact of the semiconductor device has a two-step protruding shape.
【請求項9】 請求項7又は8記載の半導体装置の実装
体において、 上記導電性接着剤は、少なくとも熱可塑性樹脂と導電性
フィラーとを含むことを特徴とする半導体装置の実装
体。
9. The semiconductor device package according to claim 7, wherein the conductive adhesive contains at least a thermoplastic resin and a conductive filler.
JP11254694A 1994-05-26 1994-05-26 Semiconductor device mounting method Expired - Fee Related JP3255796B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11254694A JP3255796B2 (en) 1994-05-26 1994-05-26 Semiconductor device mounting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11254694A JP3255796B2 (en) 1994-05-26 1994-05-26 Semiconductor device mounting method

Publications (2)

Publication Number Publication Date
JPH07321148A true JPH07321148A (en) 1995-12-08
JP3255796B2 JP3255796B2 (en) 2002-02-12

Family

ID=14589368

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP3255796B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6452280B1 (en) 1996-03-06 2002-09-17 Matsushita Electric Industrial Co., Ltd. Flip chip semiconductor apparatus with projecting electrodes and method for producing same
US6981317B1 (en) 1996-12-27 2006-01-03 Matsushita Electric Industrial Co., Ltd. Method and device for mounting electronic component on circuit board

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6452280B1 (en) 1996-03-06 2002-09-17 Matsushita Electric Industrial Co., Ltd. Flip chip semiconductor apparatus with projecting electrodes and method for producing same
US6981317B1 (en) 1996-12-27 2006-01-03 Matsushita Electric Industrial Co., Ltd. Method and device for mounting electronic component on circuit board

Also Published As

Publication number Publication date
JP3255796B2 (en) 2002-02-12

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