JPH0731494Y2 - 高周波誘導結合プラズマ質量分析計 - Google Patents
高周波誘導結合プラズマ質量分析計Info
- Publication number
- JPH0731494Y2 JPH0731494Y2 JP7232788U JP7232788U JPH0731494Y2 JP H0731494 Y2 JPH0731494 Y2 JP H0731494Y2 JP 7232788 U JP7232788 U JP 7232788U JP 7232788 U JP7232788 U JP 7232788U JP H0731494 Y2 JPH0731494 Y2 JP H0731494Y2
- Authority
- JP
- Japan
- Prior art keywords
- cooling
- spray chamber
- sample
- mass spectrometer
- high frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000009616 inductively coupled plasma Methods 0.000 title claims description 12
- 239000007921 spray Substances 0.000 claims description 39
- 238000001816 cooling Methods 0.000 claims description 34
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 24
- 229910052782 aluminium Inorganic materials 0.000 claims description 24
- 238000012546 transfer Methods 0.000 claims description 13
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 12
- 229910052710 silicon Inorganic materials 0.000 claims description 12
- 239000010703 silicon Substances 0.000 claims description 12
- 239000006199 nebulizer Substances 0.000 claims description 8
- 230000017525 heat dissipation Effects 0.000 claims description 4
- 239000002245 particle Substances 0.000 claims description 3
- 238000004458 analytical method Methods 0.000 claims 1
- 230000005284 excitation Effects 0.000 claims 1
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 22
- 239000007789 gas Substances 0.000 description 13
- 229910052786 argon Inorganic materials 0.000 description 11
- 150000002500 ions Chemical class 0.000 description 10
- 238000012545 processing Methods 0.000 description 5
- 238000009792 diffusion process Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 239000003921 oil Substances 0.000 description 4
- 239000000498 cooling water Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000000921 elemental analysis Methods 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 238000004949 mass spectrometry Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
Landscapes
- Electron Sources, Ion Sources (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7232788U JPH0731494Y2 (ja) | 1988-05-31 | 1988-05-31 | 高周波誘導結合プラズマ質量分析計 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7232788U JPH0731494Y2 (ja) | 1988-05-31 | 1988-05-31 | 高周波誘導結合プラズマ質量分析計 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01176358U JPH01176358U (enrdf_load_stackoverflow) | 1989-12-15 |
| JPH0731494Y2 true JPH0731494Y2 (ja) | 1995-07-19 |
Family
ID=31297499
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7232788U Expired - Lifetime JPH0731494Y2 (ja) | 1988-05-31 | 1988-05-31 | 高周波誘導結合プラズマ質量分析計 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0731494Y2 (enrdf_load_stackoverflow) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6835264B2 (ja) * | 2018-02-07 | 2021-02-24 | 株式会社島津製作所 | 質量分析装置 |
-
1988
- 1988-05-31 JP JP7232788U patent/JPH0731494Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01176358U (enrdf_load_stackoverflow) | 1989-12-15 |
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