JPH0731494Y2 - 高周波誘導結合プラズマ質量分析計 - Google Patents

高周波誘導結合プラズマ質量分析計

Info

Publication number
JPH0731494Y2
JPH0731494Y2 JP7232788U JP7232788U JPH0731494Y2 JP H0731494 Y2 JPH0731494 Y2 JP H0731494Y2 JP 7232788 U JP7232788 U JP 7232788U JP 7232788 U JP7232788 U JP 7232788U JP H0731494 Y2 JPH0731494 Y2 JP H0731494Y2
Authority
JP
Japan
Prior art keywords
cooling
spray chamber
sample
mass spectrometer
high frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP7232788U
Other languages
English (en)
Japanese (ja)
Other versions
JPH01176358U (enrdf_load_html_response
Inventor
正 内山
健一 阪田
昌三 小野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP7232788U priority Critical patent/JPH0731494Y2/ja
Publication of JPH01176358U publication Critical patent/JPH01176358U/ja
Application granted granted Critical
Publication of JPH0731494Y2 publication Critical patent/JPH0731494Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)
  • Electron Sources, Ion Sources (AREA)
JP7232788U 1988-05-31 1988-05-31 高周波誘導結合プラズマ質量分析計 Expired - Lifetime JPH0731494Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7232788U JPH0731494Y2 (ja) 1988-05-31 1988-05-31 高周波誘導結合プラズマ質量分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7232788U JPH0731494Y2 (ja) 1988-05-31 1988-05-31 高周波誘導結合プラズマ質量分析計

Publications (2)

Publication Number Publication Date
JPH01176358U JPH01176358U (enrdf_load_html_response) 1989-12-15
JPH0731494Y2 true JPH0731494Y2 (ja) 1995-07-19

Family

ID=31297499

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7232788U Expired - Lifetime JPH0731494Y2 (ja) 1988-05-31 1988-05-31 高周波誘導結合プラズマ質量分析計

Country Status (1)

Country Link
JP (1) JPH0731494Y2 (enrdf_load_html_response)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6835264B2 (ja) * 2018-02-07 2021-02-24 株式会社島津製作所 質量分析装置

Also Published As

Publication number Publication date
JPH01176358U (enrdf_load_html_response) 1989-12-15

Similar Documents

Publication Publication Date Title
US20140224984A1 (en) Plasmas and methods of using them
CN113962396B (zh) 一种分布式离子阱系统
US4965540A (en) Microwave resonant cavity
JP3160050B2 (ja) 質量分析計
JPH0731494Y2 (ja) 高周波誘導結合プラズマ質量分析計
CN116472599A (zh) 用于电感耦合等离子体质谱仪(icp-ms)的空气冷却式接口
JPH0731495Y2 (ja) 高周波誘導結合プラズマ質量分析計
CN216286754U (zh) 一种分布式离子阱系统
JP2956139B2 (ja) 四重極マスフィルタ
JPH04104449A (ja) 高周波誘導プラズマ質量分析計
JP2926949B2 (ja) 高周波誘導結合プラズマ質量分析計
JPS63308857A (ja) 誘導結合プラズマ・質量分析計
JP2792140B2 (ja) 高周波誘導結合プラズマ質量分析計
JPH0521250Y2 (enrdf_load_html_response)
JP3471821B2 (ja) 高周波誘導結合プラズマ分析装置
CN117577505A (zh) 一种用于轻小型tof质谱仪的微型微焦点激发光源装置
JPH0521248Y2 (enrdf_load_html_response)
JPH0638372Y2 (ja) 高周波誘導結合プラズマ質量分析装置
JPH0448628Y2 (enrdf_load_html_response)
JPH02141576A (ja) プラズマプロセス装置
JPH05275056A (ja) 高周波誘導結合プラズマ質量分析計
JPH04124746U (ja) 高周波誘導結合プラズマ質量分析計
JPH0779017B2 (ja) 高周波誘導結合プラズマ質量分析計
OKAMOTO et al. Detection of aqueous fluoride with a high-power microwave-induced helium plasma at atmospheric pressure
JPH05242859A (ja) 高周波誘導結合プラズマ質量分析計