JPH07140489A - Liquid crystal display device - Google Patents
Liquid crystal display deviceInfo
- Publication number
- JPH07140489A JPH07140489A JP28935693A JP28935693A JPH07140489A JP H07140489 A JPH07140489 A JP H07140489A JP 28935693 A JP28935693 A JP 28935693A JP 28935693 A JP28935693 A JP 28935693A JP H07140489 A JPH07140489 A JP H07140489A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- liquid crystal
- display device
- crystal display
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、薄膜トランジスタ(T
FT)を用いた液晶表示装置に関する。The present invention relates to a thin film transistor (T
The present invention relates to a liquid crystal display device using FT).
【0002】[0002]
【従来の技術】従来から、高精細大型の液晶表示装置と
して、非単結晶シリコンを使用した薄膜トランジスタ
(以降TFTと記す)をスイッチング素子として用い
た、いわゆるアクティブ方式液晶表示装置が提案され既
に実用化されている。2. Description of the Related Art Conventionally, as a high-definition large-sized liquid crystal display device, a so-called active type liquid crystal display device using a thin film transistor (hereinafter referred to as a TFT) using non-single crystal silicon as a switching element has been proposed and put into practical use. Has been done.
【0003】アクティブ方式液晶表示装置においては、
データ線を通して書き込んだ印加電圧を次の書き込みま
での時間保持するため、液晶と並列に容量を作り込む必
要がある。In the active type liquid crystal display device,
In order to hold the applied voltage written through the data line until the next writing, it is necessary to build a capacitor in parallel with the liquid crystal.
【0004】この液晶と並列に接続する容量の形成法に
は、既に付加容量方式と蓄積容量方式が提案されてい
る。As a method of forming a capacitor connected in parallel with the liquid crystal, an additional capacity method and a storage capacity method have already been proposed.
【0005】図4に、この2方式を示す。FIG. 4 shows these two methods.
【0006】図4(a)は付加容量方式で、ゲート線と
画素電極の重なりを容量として利用する方式である。FIG. 4A shows an additional capacitance system in which the overlap between the gate line and the pixel electrode is used as a capacitance.
【0007】一方図4(b)は、蓄積容量方式で、容量
の対向電極は別途形成する方式である。On the other hand, FIG. 4 (b) shows a storage capacitance method in which a counter electrode for the capacitance is separately formed.
【0008】図4において、6は半導体層、19はTF
Tのゲート電極、20は画素電極、11′は付加容量、
11は蓄積容量である。In FIG. 4, 6 is a semiconductor layer and 19 is a TF.
T gate electrode, 20 pixel electrode, 11 'additional capacitance,
Reference numeral 11 is a storage capacity.
【0009】ゲート線容量の増大を抑え、開口率を上げ
るには、蓄積容量方式が有利である。The storage capacitance method is advantageous for suppressing the increase in the gate line capacitance and increasing the aperture ratio.
【0010】この蓄積容量方式は、容量の対向電極をゲ
ート線とは別の端子として引き出すものであり、蓄積容
量形成用電極をゲート電極と同じ材料で作る方法と透明
電極で作る方法の2通りがある。In this storage capacity method, the counter electrode of the capacity is drawn out as a terminal different from the gate line, and there are two methods: a method of forming the storage capacity forming electrode with the same material as the gate electrode and a method of forming it with a transparent electrode. There is.
【0011】[0011]
【発明が解決しようとする課題】しかしながら、上記蓄
積容量方式の対向電極を形成する従来の2方法には次の
ような欠点があった。However, the two conventional methods of forming the counter electrode of the storage capacitance system have the following drawbacks.
【0012】(1)対向電極とゲート電極が同じ材料の
場合 TFTのゲート電極は、Al,Cr,Ta,Ti等の金
属を材料としているため、対向電極にゲート電極と同じ
材料を用いると、対向電極が遮光層となり、画素電極の
開口率が低下する。(1) When the counter electrode and the gate electrode are made of the same material Since the gate electrode of the TFT is made of a metal such as Al, Cr, Ta, and Ti, if the counter electrode is made of the same material as the gate electrode, The counter electrode serves as a light shielding layer, and the aperture ratio of the pixel electrode decreases.
【0013】(2)対向電極が透明電極の場合 透明電極を用いるので、開口率の低下はないが、透明電
極は比抵抗が大きく(スパッタのITOで(2) When the counter electrode is a transparent electrode Since the transparent electrode is used, the aperture ratio does not decrease, but the transparent electrode has a large specific resistance (sputtered ITO is used).
【0014】[0014]
【外1】 程度、一方Alは3×10-6Ω・cm、Crは5×10
-5Ω・cm)対向電極は一定電位に保持するため、抵抗
の低い金属配線がさらに必要となる。[Outer 1] On the other hand, Al is 3 × 10 −6 Ω · cm, Cr is 5 × 10
-5 Ω · cm) Since the counter electrode is held at a constant potential, metal wiring with low resistance is further required.
【0015】一方、アクティブ方式液晶表示装置では、
ゲート配線の抵抗がCR成分としてゲート線の遅延に影
響を与える。特に画素数が増え、ゲート線の数が増える
につれ、ゲート書き込み時間が短くなり、ゲート配線の
抵抗が問題となっている。On the other hand, in the active type liquid crystal display device,
The resistance of the gate wiring affects the delay of the gate line as a CR component. In particular, as the number of pixels increases and the number of gate lines increases, the gate writing time becomes shorter and the resistance of the gate wiring becomes a problem.
【0016】しかし、ここで単に配線の厚さを増加させ
てシート抵抗の低減を計ると、配線部の段差により、カ
バレージ不良が発生するという問題が生じてしまう。However, if the thickness of the wiring is simply increased to reduce the sheet resistance, a step of the wiring portion causes a problem of coverage failure.
【0017】[0017]
【課題を解決するための手段】本発明の液晶表示装置
は、薄膜トランジスタをスイッチング素子に用いた液晶
表示装置において、液晶と並列に接続される蓄積容量部
の対向電極が透明電極と、該透明電極上の一部に形成さ
れた金属配線の2層構成からなり、前記薄膜トランジス
タのゲート電極が、対向電極とそれぞれ共通の透明電極
と金属配線による電極からなる2層構成からなることを
特徴とするものである。According to another aspect of the present invention, there is provided a liquid crystal display device using a thin film transistor as a switching element, wherein a counter electrode of a storage capacitor portion connected in parallel with liquid crystal is a transparent electrode, and the transparent electrode is a transparent electrode. It has a two-layer structure of metal wiring formed in a part of the upper part, and the gate electrode of the thin film transistor has a two-layer structure of a transparent electrode common to the counter electrode and an electrode made of metal wiring. Is.
【0018】本発明の液晶表示装置によれば、高い開口
率を保ちながら、蓄積容量を形成することが可能にな
り、さらにゲート線の配線抵抗を下げることも可能にな
る。According to the liquid crystal display device of the present invention, it is possible to form a storage capacitor while maintaining a high aperture ratio, and it is also possible to reduce the wiring resistance of the gate line.
【0019】[0019]
(実施例1)本発明の第1の実施例の液晶表示装置の1
画素分の平面図を図1に示し、図1のAA′部の断面図
を図2に示す。(Embodiment 1) 1 of the liquid crystal display device of the first embodiment of the present invention
A plan view of pixels is shown in FIG. 1, and a cross-sectional view of the AA 'portion in FIG. 1 is shown in FIG.
【0020】図1,図2において、裏側に偏光板2を有
するガラス基板1上にITO等の透明電極からなる厚さ
100mm第1ゲート電極3(a),第1対向電極3
(b)が形成され、さらにその上部に、Al,Cr等の
金属からなる厚さ100mmの第2ゲート電極4
(a),第2対向電極4(b)が形成されている。第1
ゲート電極3(a)と第1対向電極3(b)、及び第2
ゲート電極4(a)と第2対向電極4(b)はそれぞれ
共通な材料で形成されている。In FIGS. 1 and 2, a glass substrate 1 having a polarizing plate 2 on the back side has a thickness of 100 mm, which is a transparent electrode such as ITO, a first gate electrode 3 (a), and a first counter electrode 3.
(B) is formed, and a second gate electrode 4 made of a metal such as Al or Cr and having a thickness of 100 mm is further formed on the upper side.
(A), 2nd counter electrode 4 (b) is formed. First
The gate electrode 3 (a), the first counter electrode 3 (b), and the second
The gate electrode 4 (a) and the second counter electrode 4 (b) are made of a common material.
【0021】また本実施例では、開口率を確保するた
め、金属の第2対向電極4(b)は、第1対向電極3
(b)の一部の上に形成されている。Further, in this embodiment, in order to secure the aperture ratio, the metal second counter electrode 4 (b) is replaced by the first counter electrode 3
It is formed on a part of (b).
【0022】TFT部10ではその上に厚さ300nm
のプラズマCVDで形成したSiN膜よりなるゲート絶
縁膜5が対向電極の絶縁層と共通で形成され、その上に
島状に厚さ300nmのアモルファスSiよりなる半導
体層6、厚さ100nmのアモルファス、あるいは微結
晶のn+Siよりなるオーミックコンタクト層7、さら
にAlよりなるドレイン電極8(a)、ソース電極8
(b)が形成されている。一方蓄積容量部11では、対
向電極の上にゲート絶縁層5を介して透明電極からなる
画素電極9が形成されている。本実施例では、図1,図
2でわかるように画素電極の一部の所に蓄積容量部11
を形成している。画素電極11は、TFTのソース電極
8(b)と接続されている。その上部にSiNx膜等か
らなるパッシベーション層12を形成してある。In the TFT section 10, a thickness of 300 nm is formed on the TFT section 10.
A gate insulating film 5 made of SiN film formed by plasma CVD in common with the insulating layer of the counter electrode, on which a semiconductor layer 6 made of amorphous Si having a thickness of 300 nm, an amorphous semiconductor having a thickness of 100 nm, Alternatively, the ohmic contact layer 7 made of microcrystalline n + Si, the drain electrode 8 (a) and the source electrode 8 made of Al.
(B) is formed. On the other hand, in the storage capacitor portion 11, the pixel electrode 9 made of a transparent electrode is formed on the counter electrode via the gate insulating layer 5. In this embodiment, as shown in FIGS. 1 and 2, the storage capacitor portion 11 is provided at a part of the pixel electrode.
Is formed. The pixel electrode 11 is connected to the source electrode 8 (b) of the TFT. A passivation layer 12 made of a SiN x film or the like is formed on top of it.
【0023】この時、TFT部10のゲート電極を構成
する第2のゲート電極4(a)は、第1のゲート電極3
(a)よりも幅が広く、かつ少なくとも上部に半導体層
のあるTFT部では、第1のゲート電極の全面を覆うよ
うに形成されているので、ゲート電極の段差は、2層合
計の段差とはならず、各層の膜厚に基づく段差ですむ。At this time, the second gate electrode 4 (a) forming the gate electrode of the TFT section 10 is the first gate electrode 3
In the TFT portion which is wider than (a) and has the semiconductor layer at least in the upper portion, since it is formed so as to cover the entire surface of the first gate electrode, the step of the gate electrode is equal to the step of the total of two layers. However, a step difference based on the film thickness of each layer is sufficient.
【0024】本実施例では、配線部での段差は1000
Åとなるので、カバレージ不良の発生は見られなかっ
た。In this embodiment, the step difference in the wiring portion is 1000
Since it was Å, no occurrence of poor coverage was seen.
【0025】本実施例の液晶表示装置は、図2に示すと
おり背面(外側)に偏光板18、液晶側にカラーフィル
ター15、TFT10及びドレイン、ゲートのバスライ
ン上部のブラックマトリクス16、さらにその上にIT
O等の透明電極からなる共通電極14、ガラス基板17
と液晶13を配して構成した。As shown in FIG. 2, the liquid crystal display device of this embodiment has a polarizing plate 18 on the back surface (outside), a color filter 15 on the liquid crystal side, a TFT 10 and a drain, and a black matrix 16 above the bus line of the gate, and further above it. To IT
Common electrode 14 made of transparent electrode such as O, glass substrate 17
And the liquid crystal 13 are arranged.
【0026】(実施例2)図3に第2の実施例のセルの
1部分の模式図を示す。ここではガラス基板からパッシ
ベーション膜までの断面図が示されている。(Embodiment 2) FIG. 3 shows a schematic view of a part of the cell of the second embodiment. Here, a cross-sectional view from the glass substrate to the passivation film is shown.
【0027】図2と共通の部分には、図2と同じ番号を
つけている。The same parts as in FIG. 2 are assigned the same numbers as in FIG.
【0028】図3において、TFT部10のゲート配線
は、透明電極からなる第1のゲート電極3(a)よりも
金属からなる第2のゲート電極4(a)の方が幅が小さ
く形成されている。しかしTFTのチャネル部は、全て
金属の第2のゲート電極上に形成されており、TFTの
スレシュホールド電圧Vthのずれは実質的にない。In FIG. 3, the gate wiring of the TFT section 10 is formed such that the width of the second gate electrode 4 (a) made of metal is smaller than that of the first gate electrode 3 (a) made of a transparent electrode. ing. However, the channel portion of the TFT is formed entirely on the metal second gate electrode, and there is substantially no deviation in the threshold voltage Vth of the TFT.
【0029】その他の構成は図2と同様とした。The other structure is similar to that shown in FIG.
【0030】[0030]
【発明の効果】以上説明したように、液晶と並列に接続
する蓄積容量の画素電極に対する対向電極を、透明電極
と透明電極上の一部に形成された金属配線の2層構造と
し、対向電極と共通の2層の電極材でTFTのゲート電
極を構成(2層のゲート電極材は、どちらか一方が、他
方の電極の内側に配置した構成)することにより、高い
画素の開口率を保ちながら、蓄積容量を形成することが
できる。さらには、ゲート電極の段差を大きくしないで
ゲート電極の配線抵抗を下げることができ、大面積、高
精細の液晶表示装置においても、明るく応答の良好な液
晶表示装置を提供することができる。As described above, the counter electrode for the pixel electrode of the storage capacitor connected in parallel with the liquid crystal has a two-layer structure of the transparent electrode and the metal wiring formed on a part of the transparent electrode, and the counter electrode By forming the gate electrode of the TFT with the same two-layer electrode material as the above (one of the two-layer gate electrode material is arranged inside the other electrode), a high pixel aperture ratio is maintained. However, a storage capacitor can be formed. Further, the wiring resistance of the gate electrode can be reduced without increasing the step of the gate electrode, and a liquid crystal display device having a large area and high definition and having a bright response can be provided.
【図1】本発明の液晶表示装置の1例を示す模式図FIG. 1 is a schematic view showing an example of a liquid crystal display device of the present invention.
【図2】図1のA−A′断面を示す図FIG. 2 is a view showing a cross section taken along the line AA ′ of FIG.
【図3】本発明の他の1例を示す模式図FIG. 3 is a schematic diagram showing another example of the present invention.
【図4】従来の液晶表示装置を示す模式図FIG. 4 is a schematic diagram showing a conventional liquid crystal display device.
1,17 ガラス 3(a) 第1ゲート電極 3(b) 第1対向電極 4(a) 第2ゲート電極 4(b) 第2対向電極 10 TFT部 11 蓄積容量部 9 画素電極 1,17 glass 3 (a) first gate electrode 3 (b) first counter electrode 4 (a) second gate electrode 4 (b) second counter electrode 10 TFT section 11 storage capacitor section 9 pixel electrode
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 G09G 3/36 H01L 29/786 ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Internal reference number FI Technical display location G09G 3/36 H01L 29/786
Claims (3)
用いた液晶表示装置において、 液晶と並列に接続される蓄積容量部の対向電極が透明電
極と、該透明電極上の一部に形成された金属配線の2層
構成からなり、 前記薄膜トランジスタのゲート電極が、対向電極とそれ
ぞれ共通の透明電極と金属配線による電極からなる2層
構成からなることを特徴とする液晶表示装置。1. A liquid crystal display device using a thin film transistor as a switching element, wherein a counter electrode of a storage capacitor portion connected in parallel with liquid crystal is a transparent electrode, and a metal wiring formed on a part of the transparent electrode. A liquid crystal display device having a layered structure, wherein the gate electrode of the thin film transistor has a two-layered structure including a counter electrode, a common transparent electrode, and an electrode formed of metal wiring.
ト電極は、互いに幅が異なり、一方の電極が他方の電極
の内側に形成されている請求項1の液晶表示装置。2. The liquid crystal display device according to claim 1, wherein the gate electrodes of the two-layer structure of the thin film transistor have different widths, and one electrode is formed inside the other electrode.
間に、ゲート絶縁膜と共通の絶縁膜が形成されている請
求項1の液晶表示装置。3. The liquid crystal display device according to claim 1, wherein an insulating film common to the gate insulating film is formed between the counter electrode of the storage capacitor section and the pixel electrode.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28935693A JP3423380B2 (en) | 1993-11-18 | 1993-11-18 | Liquid crystal display |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28935693A JP3423380B2 (en) | 1993-11-18 | 1993-11-18 | Liquid crystal display |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH07140489A true JPH07140489A (en) | 1995-06-02 |
JP3423380B2 JP3423380B2 (en) | 2003-07-07 |
Family
ID=17742149
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP28935693A Expired - Fee Related JP3423380B2 (en) | 1993-11-18 | 1993-11-18 | Liquid crystal display |
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JP (1) | JP3423380B2 (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10142630A (en) * | 1996-11-13 | 1998-05-29 | Mitsubishi Electric Corp | Liquid crystal display device and manufacture thereof |
KR100336887B1 (en) * | 1998-08-24 | 2003-06-02 | 주식회사 현대 디스플레이 테크놀로지 | LCD Display |
KR100409259B1 (en) * | 2000-07-24 | 2003-12-18 | 마쯔시다덴기산교 가부시키가이샤 | Liquid crystal apparatus |
KR100456137B1 (en) * | 2001-07-07 | 2004-11-08 | 엘지.필립스 엘시디 주식회사 | Array Substrate of Liquid Crystal Display and Fabricating Method Thereof |
KR100462381B1 (en) * | 1997-12-29 | 2005-06-07 | 비오이 하이디스 테크놀로지 주식회사 | Manufacturing method of liquid crystal display device |
CN100454124C (en) * | 2005-11-04 | 2009-01-21 | 北京京东方光电科技有限公司 | Array architecture of thin film transistor of bottom grid electrode, and fabricating method |
WO2010106920A1 (en) * | 2009-03-18 | 2010-09-23 | コニカミノルタホールディングス株式会社 | Method for manufacturing thin film transistor, and thin film transistor |
JP2011029310A (en) * | 2009-07-23 | 2011-02-10 | Mitsubishi Electric Corp | Tft substrate and method of manufacturing the same |
JP2017152714A (en) * | 2009-03-05 | 2017-08-31 | 株式会社半導体エネルギー研究所 | Display device |
-
1993
- 1993-11-18 JP JP28935693A patent/JP3423380B2/en not_active Expired - Fee Related
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10142630A (en) * | 1996-11-13 | 1998-05-29 | Mitsubishi Electric Corp | Liquid crystal display device and manufacture thereof |
KR100462381B1 (en) * | 1997-12-29 | 2005-06-07 | 비오이 하이디스 테크놀로지 주식회사 | Manufacturing method of liquid crystal display device |
KR100336887B1 (en) * | 1998-08-24 | 2003-06-02 | 주식회사 현대 디스플레이 테크놀로지 | LCD Display |
KR100409259B1 (en) * | 2000-07-24 | 2003-12-18 | 마쯔시다덴기산교 가부시키가이샤 | Liquid crystal apparatus |
KR100456137B1 (en) * | 2001-07-07 | 2004-11-08 | 엘지.필립스 엘시디 주식회사 | Array Substrate of Liquid Crystal Display and Fabricating Method Thereof |
CN100454124C (en) * | 2005-11-04 | 2009-01-21 | 北京京东方光电科技有限公司 | Array architecture of thin film transistor of bottom grid electrode, and fabricating method |
JP2017152714A (en) * | 2009-03-05 | 2017-08-31 | 株式会社半導体エネルギー研究所 | Display device |
JP2018195836A (en) * | 2009-03-05 | 2018-12-06 | 株式会社半導体エネルギー研究所 | Display device |
JP2020038965A (en) * | 2009-03-05 | 2020-03-12 | 株式会社半導体エネルギー研究所 | Display device |
WO2010106920A1 (en) * | 2009-03-18 | 2010-09-23 | コニカミノルタホールディングス株式会社 | Method for manufacturing thin film transistor, and thin film transistor |
JP2011029310A (en) * | 2009-07-23 | 2011-02-10 | Mitsubishi Electric Corp | Tft substrate and method of manufacturing the same |
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