JPH07107604B2 - Resist development method - Google Patents

Resist development method

Info

Publication number
JPH07107604B2
JPH07107604B2 JP60177498A JP17749885A JPH07107604B2 JP H07107604 B2 JPH07107604 B2 JP H07107604B2 JP 60177498 A JP60177498 A JP 60177498A JP 17749885 A JP17749885 A JP 17749885A JP H07107604 B2 JPH07107604 B2 JP H07107604B2
Authority
JP
Japan
Prior art keywords
resist
substrate
developing
immersed
ultrasonic wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60177498A
Other languages
Japanese (ja)
Other versions
JPS6238457A (en
Inventor
進 宮部
貴 佐藤
Original Assignee
旭化成工業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 旭化成工業株式会社 filed Critical 旭化成工業株式会社
Priority to JP60177498A priority Critical patent/JPH07107604B2/en
Publication of JPS6238457A publication Critical patent/JPS6238457A/en
Publication of JPH07107604B2 publication Critical patent/JPH07107604B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03CPHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES; PHOTOGRAPHIC PROCESSES, e.g. CINE, X-RAY, COLOUR, STEREO-PHOTOGRAPHIC PROCESSES; AUXILIARY PROCESSES IN PHOTOGRAPHY
    • G03C5/00Photographic processes or agents therefor; Regeneration of such processing agents
    • G03C5/18Diazo-type processes, e.g. thermal development, or agents therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、レジストパターンの現像残りを少なくして良
好に現像を行うレジストの現像方法に関するものであ
る。
Description: TECHNICAL FIELD The present invention relates to a resist developing method for performing favorable development by reducing the undeveloped residue of a resist pattern.

[従来の技術] 一般に、基板上にレジストパターンを形成するにあた
り、基板上にレジストを一様に被着し、その上にパター
ンマスクをあてて露光を行い、レジストをパターンに従
って硬化させ、ついで、現像処理において、硬化したレ
ジストを残し、未硬化部分のレジストを除去し、以て、
レジストパターンを形成している。
[Prior Art] Generally, in forming a resist pattern on a substrate, a resist is uniformly deposited on the substrate, a pattern mask is placed on the resist to perform exposure, and the resist is cured according to the pattern. In the development process, the cured resist is left, and the uncured resist is removed.
A resist pattern is formed.

このような現像工程において、レジストパターンの現像
残りを少なくして良好に現像を行うべく、従来は現像液
に超音波をかけたり、レジストパターンの形成されてい
る基板を揺動したりすることが行われている。超音波は
有効ではあるが、現像むら、すなわち現像の不十分な個
所ができやすいので、超音波を長時間かける必要があ
り、その結果、硬化部分のレジストが剥離することがあ
った。揺動を行う場合には、揺動だけでは現像残りを皆
無にすることは到底不可能であり、しかも超音波をかけ
たときに比べ現像されたレジスト層のエッジ部に鈍りが
あった。
In such a developing process, in order to reduce the undeveloped portion of the resist pattern and perform good development, conventionally, ultrasonic waves are applied to the developing solution or the substrate on which the resist pattern is formed is shaken. Has been done. Although ultrasonic waves are effective, uneven development, that is, areas where development is insufficient, is likely to occur, so it is necessary to apply ultrasonic waves for a long time, and as a result, the resist in the cured portion may peel off. In the case of rocking, it is impossible to completely eliminate the development residue only by rocking, and moreover, the edge portion of the developed resist layer is dull as compared with the case of applying ultrasonic waves.

[発明が解決しようとする問題点] そこで、本発明の目的は、上述したような欠点を除去し
て、現像を良好に行うレジストの現像方法を提供するこ
とにある。
[Problems to be Solved by the Invention] Accordingly, an object of the present invention is to provide a resist developing method which eliminates the above-mentioned drawbacks and favorably develops the resist.

[問題を解決するための手段] このような目的を達成するために、本発明は、露光ずみ
レジスト層の形成されている基板を現像液中に浸漬して
現像処理を施すレジスト現像方法において、前記基板を
前記現像液に浸漬している時間の前半において浸漬して
いる全時間の1/20〜1/2にわたって超音波を前記基板に
かけると共に、前記基板を前記現像液に浸漬している間
にわたって、前記基板を揺動させることを特徴とする。
[Means for Solving the Problem] In order to achieve such an object, the present invention provides a resist developing method in which a substrate on which an exposed resist layer is formed is immersed in a developing solution to perform a developing treatment. The substrate is immersed in the developing solution while applying ultrasonic waves to the substrate for 1/20 to 1/2 of the entire time in which the substrate is immersed in the developing solution in the first half. It is characterized in that the substrate is rocked over a period of time.

ここで、超音波印加時間を全浸漬時間のうちの1/20〜1/
2とするのが好ましく、特に1/15〜1/4とするのがより良
好である。また、基板の浸漬後直ちに超音波を印加する
のが好適である。
Here, the ultrasonic wave application time is 1/20 to 1 / of the total immersion time.
It is preferably 2 and more preferably 1/15 to 1/4. It is also preferable to apply ultrasonic waves immediately after the immersion of the substrate.

[作用] 本発明によれば、レジストのうち硬化させた部分が剥離
することなく未硬化部分をほぼ完全に除去でき、以てレ
ジストのエッジ部分をシャープにしてレジストパターン
を形成することができ、良好なレジスト現像を行うこと
ができる。
[Operation] According to the present invention, the uncured portion can be almost completely removed without peeling off the cured portion of the resist, and thus the resist edge portion can be sharpened to form a resist pattern, Good resist development can be performed.

[実施例] 以下に、図面を参照して本発明を詳細に説明する。[Examples] Hereinafter, the present invention will be described in detail with reference to the drawings.

第1図は、本発明により現像を行う場合に、露光ずみレ
ジスト層の形成されている基板1を浸漬する現像液槽2
を示し、この槽2内には超音波振動子3を配設して、基
板1に対して所定方向に超音波を伝播させる。4は基板
1を所定方向に揺動させる揺動装置である。
FIG. 1 shows a developer tank 2 in which a substrate 1 on which an exposed resist layer is formed is immersed when development is performed according to the present invention.
The ultrasonic transducer 3 is arranged in the tank 2 to propagate the ultrasonic wave to the substrate 1 in a predetermined direction. Reference numeral 4 is a rocking device for rocking the substrate 1 in a predetermined direction.

本発明では、現像中にレジス基板1に超音波振動子3よ
り超音波をかけ、およびその超音波と組合せて、揺動装
置4により基板1を揺動させる。その場合に、超音波を
印加する時間については、現像の後段階で超音波をかけ
ると、レジストの硬化部分の剥離が多くなるので、好ま
しくは、現像工程の時間のうち1/2より前に超音波を印
加する。より好ましくは、前工程の1/4より前、さらに
好ましくは現像の最初の時点から超音波の印加を開始す
る。本発明では、レジストに対して超音波を均一に作用
させるために、超音波の伝わる方向とほぼ同じ方向に基
板1を機械的に揺動する。かかる揺動のピッチは、超音
波の波長より長い範囲で、なるべく小さくすることが層
2の効率上好ましい。好ましくは、 (波長)≦揺動ピッチ≦(波長)×20 とする。より好ましくは、 2×(波長)≦揺動ピッチ≦(波長)×10 とする。たとえば、波長1.3cmに対して揺動ピッチを5cm
とする。
In the present invention, ultrasonic waves are applied to the resist substrate 1 from the ultrasonic oscillator 3 during development, and in combination with the ultrasonic waves, the substrate 1 is swung by the swinging device 4. In that case, for the time of applying the ultrasonic wave, when the ultrasonic wave is applied in the latter stage of the development, peeling of the cured portion of the resist increases, so it is preferable that the time is less than 1/2 of the time of the developing step. Apply ultrasonic waves. More preferably, the application of ultrasonic waves is started before 1/4 of the previous step, and further preferably from the first point of development. In the present invention, in order to uniformly apply the ultrasonic wave to the resist, the substrate 1 is mechanically swung in the same direction as the ultrasonic wave is transmitted. From the viewpoint of the efficiency of the layer 2, it is preferable that the pitch of the rocking is as small as possible within a range longer than the wavelength of the ultrasonic waves. Preferably, (wavelength) ≦ oscillation pitch ≦ (wavelength) × 20. More preferably, 2 × (wavelength) ≦ oscillation pitch ≦ (wavelength) × 10. For example, a swing pitch of 5 cm for a wavelength of 1.3 cm
And

揺動速度は、基板1に負荷をかけない範囲で可及的速い
方がよい。好ましくは、 2cm/sec≦揺動線速度≦50cm/sec とする。より好ましくは、 5cm/sec≦揺動線速度≦25cm/sec とする。
The rocking speed is preferably as high as possible within the range where no load is applied to the substrate 1. Preferably, 2 cm / sec ≦ oscillation linear velocity ≦ 50 cm / sec. More preferably, 5 cm / sec ≦ oscillation linear velocity ≦ 25 cm / sec.

さらにまた、超音波の強さや移動を変えたり、超音波源
3の位置を移動させることなども現像を良好に行うのに
有効であるが、槽2の構造などをも考慮すると、超音波
現像と揺動とを併用するのが最も好ましい。
Further, changing the strength and movement of ultrasonic waves, or moving the position of the ultrasonic source 3 is also effective for good development, but considering the structure of the tank 2 and so on, ultrasonic development It is most preferable to use both and rocking together.

次に本発明の態様を一層明確にするために実施例をあげ
て説明するが、本発明は以下の実施例にのみ限定される
ものではなく、種々の変形が可能であること勿論であ
る。
Next, examples will be described to further clarify the aspects of the present invention, but the present invention is not limited to the following examples, and it is needless to say that various modifications can be made.

厚さ80μmで、寸法650×400の銅箔上に「ナガセネガテ
ィブレジスト747」を、硬化後の厚みが4μmになるよ
うに塗布し、ついでその上をマスクパターンで覆って露
光し、このレジストを硬化させた。その後、上述のレジ
ストについての専用の現像液を用いて3つの槽において
以下の条件で現像した。
"Nagase negative resist 747" is applied on a copper foil with a thickness of 80 μm and dimensions of 650 × 400 so that the thickness after curing becomes 4 μm, and then it is exposed by covering it with a mask pattern and exposing Cured. Then, it was developed under the following conditions in three tanks by using a dedicated developer for the above resist.

第1〜第3槽のいずれにおいても、基板を底面と垂直方
向に固定し、縦方向にストローク10cm、線速度15cm/sec
で揺動しながら3分間浸漬した。第1槽の下部に超音波
発振子を設け、50KHzの超音波を上方向へ伝搬させた。
この超音波の発信時間は、基板を浸漬した直後から実施
例順に0.5、1、3分間とした。液温は25℃とした。パ
ターンとしては線幅30μmで、6本/mmの縞状パターン
を用いた。ここで、第1槽では最初の1分間だけ超音波
をかけ、第1〜第3槽のいずれも3分間全体にわたった
揺動を行った。基板は第1槽から順次に第3槽まで各3
分間浸漬した。
In any of the first to third tanks, the substrate is fixed vertically to the bottom surface, the vertical stroke is 10 cm, and the linear velocity is 15 cm / sec.
It was immersed for 3 minutes while rocking. An ultrasonic oscillator was provided in the lower part of the first tank to propagate an ultrasonic wave of 50 KHz upward.
The ultrasonic wave transmission time was set to 0.5, 1 and 3 minutes in the order of Examples immediately after the substrate was immersed. The liquid temperature was 25 ° C. As the pattern, a striped pattern with a line width of 30 μm and 6 lines / mm was used. Here, ultrasonic waves were applied in the first tank only for the first minute, and all of the first to third tanks were shaken over the entire 3 minutes. Substrates are 3 each from the first tank to the third tank in order.
Soaked for a minute.

本発明の実施例と共に、比較例として、超音波印加時間
および揺動時間を種々変えた場合および揺動ストローク
を短くした場合の結果を次の第1表に示す。
In addition to the examples of the present invention, the following Table 1 shows results as comparative examples when the ultrasonic wave application time and the rocking time were variously changed and when the rocking stroke was shortened.

このように、本発明によれば、レジスト硬化部分の剥離
個所も、レジスト未硬化部分の現像残りの個所もない状
態でレジストパターンが現像された銅箔を得ることがで
きた。ここで、超音波の印加と揺動とを同時に行う時間
は、全浸漬時間1/20〜1/2とするのが好ましく、特に1/1
5〜1/4がよりさらに揺動ピッチは波長より長い方が好ま
しいことがわかった。
As described above, according to the present invention, it was possible to obtain a copper foil having a resist pattern developed in a state where there is no peeling portion of the resist cured portion and no development residual portion of the resist uncured portion. Here, the time for simultaneously applying and shaking the ultrasonic waves is preferably 1/20 to 1/2 of the total immersion time, and particularly 1/1
It was found that the oscillation pitch of 5 to 1/4 is more preferable to be longer than the wavelength.

[発明の効果] 以上から明らかなように、本発明によれば、レジストの
うち硬化させた部分が剥離することなく未硬化部分をほ
ぼ完全に除去でき、以てレジストのエッジ部分をシャー
プにしてレジストパターンを形成することができ、良好
なレジスト現像を行うことができる。
[Effects of the Invention] As is apparent from the above, according to the present invention, the uncured portion of the resist can be almost completely removed without peeling off the cured portion, thereby sharpening the edge portion of the resist. A resist pattern can be formed and good resist development can be performed.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明を実施する現像液槽を示す線図である。 1……レジスト基板、2……現像液槽、3……超音波振
動子、4……揺動装置。
FIG. 1 is a diagram showing a developer tank for carrying out the present invention. 1 ... Resist substrate, 2 ... Developer tank, 3 ... Ultrasonic vibrator, 4 ... Oscillating device.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】露光ずみレジスト層の形成されている基板
を現像液中に浸漬して現像処理を施すレジスト現像方法
において、前記基板を前記現像液に浸漬している時間の
前半において浸漬している全時間の1/20〜1/2の時間に
わたって超音波を前記基板にかけると共に、前記基板を
前記現像液に浸漬している間にわたって、前記基板を揺
動させることを特徴とするレジスト現像方法。
1. A resist developing method in which a substrate on which an exposed resist layer is formed is immersed in a developing solution to perform a developing treatment, in which the substrate is immersed in the developing solution in the first half of the time. Ultrasonic waves are applied to the substrate for a period of 1/20 to 1/2 of the total time during which the substrate is shaken while the substrate is immersed in the developing solution. Method.
【請求項2】特許請求の範囲第1項記載のレジスト現像
方法において、 前記超音波をかける時間が前記基板を前記現像液に浸漬
している全時間の1/15〜1/4であることを特徴とするレ
ジスト現像方法。
2. The resist developing method according to claim 1, wherein the time of applying the ultrasonic wave is 1/15 to 1/4 of the total time of immersing the substrate in the developing solution. A method for developing a resist, comprising:
【請求項3】特許請求の範囲第1項または第2項に記載
のレジスト現像方法において、前記基板を前記現像液に
浸漬した直後から前記超音波を前記基板にかけることを
特徴とするレジスト現像方法。
3. The resist developing method according to claim 1 or 2, wherein the ultrasonic wave is applied to the substrate immediately after the substrate is immersed in the developing solution. Method.
【請求項4】特許請求の範囲第1項ないし第3項のいず
れかに記載のレジスト現像方法において、前記基板の揺
動を基板の長手方向に行うと共に、この揺動方向と前記
超音波の伝達方向をほぼ同じに設定することを特徴とす
るレジスト現像方法。
4. The resist developing method according to claim 1, wherein the substrate is rocked in a longitudinal direction of the substrate, and the rocking direction and the ultrasonic wave are changed. A resist developing method characterized in that the transmission directions are set to be substantially the same.
JP60177498A 1985-08-14 1985-08-14 Resist development method Expired - Lifetime JPH07107604B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60177498A JPH07107604B2 (en) 1985-08-14 1985-08-14 Resist development method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60177498A JPH07107604B2 (en) 1985-08-14 1985-08-14 Resist development method

Publications (2)

Publication Number Publication Date
JPS6238457A JPS6238457A (en) 1987-02-19
JPH07107604B2 true JPH07107604B2 (en) 1995-11-15

Family

ID=16031953

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60177498A Expired - Lifetime JPH07107604B2 (en) 1985-08-14 1985-08-14 Resist development method

Country Status (1)

Country Link
JP (1) JPH07107604B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02106757A (en) * 1988-10-14 1990-04-18 Matsushita Electric Ind Co Ltd Method for development processing of color filter

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5267975A (en) * 1975-12-03 1977-06-06 Shimada Rika Kogyo Kk Method of photoetching
JPS54136908A (en) * 1978-04-14 1979-10-24 Hitachi Ltd Device for development and etching
JPS584143A (en) * 1981-06-30 1983-01-11 Fujitsu Ltd Developing method for positive resist film
JPS5844441A (en) * 1981-09-11 1983-03-15 Toyobo Co Ltd Manufacture of screen printing plate
JPS5930913U (en) * 1982-08-23 1984-02-25 トヨタ自動車株式会社 Grommet for tapping screw
JPS60178449A (en) * 1984-02-27 1985-09-12 Canon Electronics Inc Method for developing resist

Also Published As

Publication number Publication date
JPS6238457A (en) 1987-02-19

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