JPH069492Y2 - Wafer cleaning / drying equipment - Google Patents

Wafer cleaning / drying equipment

Info

Publication number
JPH069492Y2
JPH069492Y2 JP1987047291U JP4729187U JPH069492Y2 JP H069492 Y2 JPH069492 Y2 JP H069492Y2 JP 1987047291 U JP1987047291 U JP 1987047291U JP 4729187 U JP4729187 U JP 4729187U JP H069492 Y2 JPH069492 Y2 JP H069492Y2
Authority
JP
Japan
Prior art keywords
wafer
cleaning
vacuum
drying
semiconductor wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1987047291U
Other languages
Japanese (ja)
Other versions
JPS63153529U (en
Inventor
史麻呂 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1987047291U priority Critical patent/JPH069492Y2/en
Publication of JPS63153529U publication Critical patent/JPS63153529U/ja
Application granted granted Critical
Publication of JPH069492Y2 publication Critical patent/JPH069492Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【考案の詳細な説明】 〔産業上の利用分野〕 本考案は半導体ウェハの洗浄乾燥装置、特にダイシング
を終了したウェハを一枚毎に処理する洗浄乾燥装置に関
する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to a cleaning / drying apparatus for semiconductor wafers, and more particularly to a cleaning / drying apparatus for processing each wafer after dicing.

〔従来の技術〕[Conventional technology]

従来の洗浄乾燥装置は、テーブル上にウェハを供給し、
真空吸着を行いテーブルを回転させながら洗浄,乾燥を
行った後、テーブル面よりエアーを吹き出し、ウェハを
吹き上げ、ウェハがテーブルより浮いた状態にしてウェ
ハを搬送パッドあるいはピンセットで取り出していた。
Conventional cleaning and drying equipment supplies wafers on the table,
After performing vacuum suction and cleaning and drying while rotating the table, air was blown from the table surface to blow up the wafer so that the wafer floated above the table and the wafer was taken out by a transfer pad or tweezers.

〔考案が解決しようとする問題点〕[Problems to be solved by the invention]

上述した従来のウェハ洗浄乾燥装置はウェハをテーブル
上より取り出す際にテーブル面からエアーを吹き出し、
ウェハを浮かした状態で行っており、その姿勢が規制さ
れないため、テーブルからウェハが浮いた場合、ウェハ
がテーブル上をすべり、ピンセット等によるウェハの取
り出し作業がやりにくく、かつウェハが割れやいすため
に慎重な取り扱いが要求され、作業性が非常に悪いとい
う問題がある。また、テーブルより取り出されたウェハ
の裏面に付着した水滴を徐々に乾燥する時ゴミがウェハ
裏面に付着したり、またカセットに収納された時に、付
着した水滴が別のウェハ表面に落下しゴミ、汚れ等の発
生要因の一つとなっている。
The conventional wafer cleaning / drying apparatus described above blows air from the table surface when the wafer is taken out from the table.
Since the wafer is floated and its posture is not regulated, when the wafer floats from the table, the wafer slips on the table, making it difficult to take out the wafer with tweezers, etc. However, there is a problem that the workability is very poor because it requires careful handling. Also, when water droplets attached to the back surface of the wafer taken out of the table are gradually dried, dust is attached to the back surface of the wafer, or when stored in a cassette, the attached water droplets fall onto another wafer surface and dust, It is one of the factors that cause dirt and the like.

本考案の目的は前記問題点を解消したウェハ洗浄乾燥装
置を提供することにある。
An object of the present invention is to provide a wafer cleaning / drying apparatus that solves the above problems.

〔考案の従来技術に対する相違点〕[Differences from the Prior Art of Invention]

上述した従来のウェハ洗浄乾燥装置に対し、本考案は半
導体ウェハの周縁を支えて保持することによりウェハの
姿勢を規制するという独創的内容を有する。
In contrast to the conventional wafer cleaning / drying apparatus described above, the present invention has an original content of supporting the peripheral edge of a semiconductor wafer and holding it to regulate the attitude of the wafer.

本考案のウェハ洗浄乾燥装置は、テーブルに複数箇所設
けた真空孔からの真空引きによりダイシング加工後の半
導体ウェハを該テーブルに真空保持して該ウェハを洗
浄、乾燥するウェハ洗浄乾燥装置であって、上記テーブ
ルの真空孔を真空引き装置とエアー吹出装置とに切替可
能に接続し、さらに、エアー圧を受けて上記テーブルよ
り分離した半導体ウェハの周縁を保持して該ウェハをテ
ーブルの真空孔に対し上方位置に引き上げる保持部を装
備し、前記保持部によって上記半導体ウェハがテーブル
の真空孔に対して上方位置に引き上げられている期間に
上記テーブルは上記複数個設けた真空孔からエアーを吹
出しながら回転し前記ウェハの表面を乾燥させることを
特徴とすることを特徴とする。
The wafer cleaning / drying apparatus of the present invention is a wafer cleaning / drying apparatus for cleaning and drying a semiconductor wafer after dicing by holding the semiconductor wafer after the dicing process in vacuum on the table by evacuation from vacuum holes provided at a plurality of locations on the table. , The vacuum hole of the table is switchably connected to an evacuation device and an air blowing device, and further, the peripheral edge of the semiconductor wafer separated from the table by receiving air pressure is held and the wafer is used as the vacuum hole of the table. On the other hand, a holding unit for pulling up to an upper position is provided, and while the semiconductor wafer is being pulled up to a position above the vacuum hole of the table by the holding unit, the table blows air from the plurality of vacuum holes provided. It is characterized by rotating and drying the surface of the said wafer.

〔実施例〕〔Example〕

以下、本考案の実施例を図により説明する。 Embodiments of the present invention will be described below with reference to the drawings.

(実施例1) 第1図,第2図は本考案の第1の実施例を示す図であ
る。
(Embodiment 1) FIGS. 1 and 2 are views showing a first embodiment of the present invention.

第1図,第2図において、テーブル2を支持台7上に垂
直軸のまわりに回転可能に支持し、該テーブル2のテー
ブル面内に複数の真空孔5,5…を開口し、真空孔5をエ
アー経路5aにより真空引き装置8とエアー吹出装置9と
に弁10a,10bを介してそれぞれ切替可能に接続する。さ
らに、テーブル2の外周に位置させて4本のシリンダ3,
3…を垂直に植設し、テーブル2の切欠き2aに嵌合して
ウェハ1の裏面を支えるL字型アッパーブロック4を各
シリンダ3のロッド3aに取付ける。
1 and 2, the table 2 is rotatably supported on a support base 7 about a vertical axis, and a plurality of vacuum holes 5, 5 ... Are opened in the table surface of the table 2 to form vacuum holes. 5 is connected to the vacuuming device 8 and the air blowing device 9 by an air path 5a so as to be switchable via valves 10a and 10b. Furthermore, the four cylinders 3, which are located on the outer periphery of the table 2,
3 are vertically planted, and the L-shaped upper block 4 that fits into the notch 2a of the table 2 and supports the back surface of the wafer 1 is attached to the rod 3a of each cylinder 3.

ダイシングを終了したウェハ1はピンセットにてテーブ
ル2上にセットされる。この場合、弁10aを開いて真空
引き装置8によりテーブル2の真空孔5を真空引きして
該ウェハ1をテーブル2に真空吸着し、低速及び高速で
テーブル2を回転しながら洗浄,乾燥を行う。作業終了
後、テーブル2を停止させてから、弁10aを閉じ、弁10b
を開いてエアー吹出装置9よりテーブル2の真空孔5に
低圧エアーを供給して吹き出し、ウェハ1をテーブル2
より分離させる。この状態でシリンダ3を動作させ、ロ
ッド3aに取付けられたアッパーブロック4によりウェハ
1の裏面を支えテーブル2の真空孔5に対し上方位置に
持ち上げる。次に、テーブル2の真空孔5から高圧エア
ーを吹き出しながらテーブル2を回転させ、ウェハ裏面
の乾燥を行い、乾燥終了後、ウェハをピンセットで取り
出す。
The wafer 1 that has completed the dicing is set on the table 2 with tweezers. In this case, the valve 10a is opened, and the vacuum hole 8 of the table 2 is evacuated by the vacuuming device 8 to vacuum-adsorb the wafer 1 to the table 2, and cleaning and drying are performed while rotating the table 2 at low speed and high speed. . After the work is completed, stop the table 2 and then close the valve 10a and the valve 10b.
And low pressure air is supplied from the air blowing device 9 to the vacuum holes 5 of the table 2 to blow the wafer 1 onto the table 2
Make it more separated. In this state, the cylinder 3 is operated so that the back surface of the wafer 1 is supported by the upper block 4 attached to the rod 3a and lifted to a position above the vacuum hole 5 of the table 2. Next, the table 2 is rotated while blowing high-pressure air from the vacuum holes 5 of the table 2 to dry the back surface of the wafer, and after completion of the drying, the wafer is taken out with tweezers.

(実施例2) 第3図は本考案の第2の実施例を示す側面図である。(Embodiment 2) FIG. 3 is a side view showing a second embodiment of the present invention.

本実施例はテーブル2より持ち上げられたウェハ1を搬
送パッド6を用いて吸着し、テーブル2上より搬出して
これをカセットに収納するものである。
In this embodiment, the wafer 1 lifted from the table 2 is sucked by using the transfer pad 6, carried out from the table 2 and stored in a cassette.

この実施例ではウェハ1をテーブル2より持ち上げた状
態で搬送パッド6をもって真空吸着するため、安定した
ウェハの搬送を可能とし、かつウェハ割れを低減でき
る。
In this embodiment, the wafer 1 is lifted from the table 2 and vacuum-adsorbed by the transfer pad 6, so that stable wafer transfer can be performed and wafer cracking can be reduced.

〔考案の効果〕[Effect of device]

以上説明したように本考案はウェハの洗浄乾燥作業を終
了後、テーブル上からのウェハ取り出しに際して、ウェ
ハをテーブルより持ち上げ保持することにより、ウェハ
の取り出し時のウェハ割れをなくし、作業を容易に行う
ことができる。また、ウェハ裏面に付着した水滴をウェ
ハを持ち上げた時点で乾燥することにより、裏面に付着
するゴミを少なくすることができ、かつカセット等に収
納された時に他のウェハ表面への水滴の落下によるゴ
ミ、汚れをなくすことができる効果を有するものであ
る。
As described above, according to the present invention, after the wafer cleaning / drying work is completed, when the wafer is taken out from the table, the wafer is lifted from the table and held, so that the wafer cracking at the time of taking out the wafer is eliminated and the work is easily performed. be able to. Also, by drying the water droplets that have adhered to the back surface of the wafer when the wafer is lifted, dust that adheres to the back surface can be reduced, and when stored in a cassette, etc., water droplets may drop onto other wafer surfaces. It has the effect of eliminating dust and dirt.

【図面の簡単な説明】[Brief description of drawings]

第1図は本考案のウェハ洗浄乾燥装置のステージ部の平
面図、第2図は第1図の側面図、第3図は本考案の第2
の実施例に係るウェハ洗浄乾燥装置のステージ部を示す
平面図である。 1……ウェハ、2……テーブル 3……シリンダ、4……アッパーブロック 5……真空孔、6……搬送パッド 8……真空引き装置、9……エアー吹出装置
1 is a plan view of a stage portion of a wafer cleaning / drying apparatus of the present invention, FIG. 2 is a side view of FIG. 1, and FIG. 3 is a second view of the present invention.
FIG. 3 is a plan view showing a stage portion of the wafer cleaning / drying apparatus according to the example of FIG. 1 ... Wafer, 2 ... Table 3 ... Cylinder, 4 ... Upper block 5 ... Vacuum hole, 6 ... Conveying pad 8 ... Vacuating device, 9 ... Air blowing device

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】テーブルに複数箇所設けた真空孔からの真
空引きによりダイシング加工後の半導体ウェハを該テー
ブルに真空保持して該ウェハを洗浄、乾燥するウェハ洗
浄乾燥装置であって、前記テーブルの真空孔を真空引き
装置とエアー吹出装置とに切替可能に接続し、さらに、
エアー圧を受けて前記テーブルより分離した半導体ウェ
ハの周縁を保持して該ウェハをテーブルの真空孔に対し
上方位置に引き上げる保持部を装備し、前記保持部によ
って前記半導体ウェハがテーブルの真空孔に対し上方位
置に引き上げられている期間に前記テーブルは前記複数
個設けた真空孔からエアーを吹出しながら回転し前記ウ
ェハの表面を乾燥させることを特徴とすることを特徴と
するウェハ洗浄乾燥装置。
1. A wafer cleaning / drying apparatus for cleaning and drying a semiconductor wafer after dicing by holding the vacuumed semiconductor wafer on the table by evacuation from a plurality of vacuum holes provided on the table. The vacuum hole is switchably connected to the vacuuming device and the air blowing device.
A holding unit for holding the peripheral edge of the semiconductor wafer separated from the table under air pressure and pulling the wafer to a position above the vacuum hole of the table is provided, and the semiconductor wafer is turned into the vacuum hole of the table by the holding unit. On the other hand, while the table is being raised, the table is rotated while blowing air from the plurality of vacuum holes to dry the surface of the wafer.
JP1987047291U 1987-03-30 1987-03-30 Wafer cleaning / drying equipment Expired - Lifetime JPH069492Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987047291U JPH069492Y2 (en) 1987-03-30 1987-03-30 Wafer cleaning / drying equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987047291U JPH069492Y2 (en) 1987-03-30 1987-03-30 Wafer cleaning / drying equipment

Publications (2)

Publication Number Publication Date
JPS63153529U JPS63153529U (en) 1988-10-07
JPH069492Y2 true JPH069492Y2 (en) 1994-03-09

Family

ID=30867759

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987047291U Expired - Lifetime JPH069492Y2 (en) 1987-03-30 1987-03-30 Wafer cleaning / drying equipment

Country Status (1)

Country Link
JP (1) JPH069492Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5727244B2 (en) * 2011-01-28 2015-06-03 リンテック株式会社 Support apparatus and support method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5932056B2 (en) * 1979-01-30 1984-08-06 松下電器産業株式会社 Manufacturing method of semiconductor device
JPS56118347A (en) * 1980-02-22 1981-09-17 Hitachi Ltd Drying device
JPS57188347U (en) * 1981-05-22 1982-11-30

Also Published As

Publication number Publication date
JPS63153529U (en) 1988-10-07

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