JPH066444Y2 - 試料ステージ - Google Patents
試料ステージInfo
- Publication number
- JPH066444Y2 JPH066444Y2 JP13954187U JP13954187U JPH066444Y2 JP H066444 Y2 JPH066444 Y2 JP H066444Y2 JP 13954187 U JP13954187 U JP 13954187U JP 13954187 U JP13954187 U JP 13954187U JP H066444 Y2 JPH066444 Y2 JP H066444Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- case
- vacuum chamber
- moving
- moving mechanism
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13954187U JPH066444Y2 (ja) | 1987-09-11 | 1987-09-11 | 試料ステージ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13954187U JPH066444Y2 (ja) | 1987-09-11 | 1987-09-11 | 試料ステージ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6444556U JPS6444556U (enExample) | 1989-03-16 |
| JPH066444Y2 true JPH066444Y2 (ja) | 1994-02-16 |
Family
ID=31402894
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13954187U Expired - Lifetime JPH066444Y2 (ja) | 1987-09-11 | 1987-09-11 | 試料ステージ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH066444Y2 (enExample) |
-
1987
- 1987-09-11 JP JP13954187U patent/JPH066444Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6444556U (enExample) | 1989-03-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8307665B2 (en) | Sample cooling apparatus | |
| GB2197752A (en) | Scanning tunneling microscope installed in electron microscope | |
| US20150144789A1 (en) | Vacuum chamber with base plate | |
| US4977544A (en) | Ultrasonic microscope | |
| JPH066444Y2 (ja) | 試料ステージ | |
| EP0244470B1 (en) | Ruggedized compact interferometer requiring minimum isolation from mechanical vibrations | |
| JPH0628776Y2 (ja) | 試料ステージ | |
| JP2007537411A (ja) | 振動減衰器又は絶縁器 | |
| JPH0215008B2 (enExample) | ||
| JP3398186B2 (ja) | 真空内駆動装置 | |
| US4362355A (en) | Operating microscope assembly | |
| JPH06176729A (ja) | 走査型電子顕微鏡およびその類似装置 | |
| JP2913064B2 (ja) | 能動制振台 | |
| JPH0128686Y2 (enExample) | ||
| JPH0973872A (ja) | 荷電粒子ビーム装置 | |
| JP2821837B2 (ja) | 加速度フィードバック付き微動位置決め装置 | |
| JPH03187143A (ja) | 試料ステージ | |
| JP2546365Y2 (ja) | 荷電粒子ビーム装置 | |
| JPS618479A (ja) | 真空装置 | |
| JPH0332178B2 (enExample) | ||
| JPH0635171Y2 (ja) | 熱分析装置 | |
| NL2007423C2 (en) | Vacuum chamber with base plate. | |
| JPH0125475Y2 (enExample) | ||
| JP3175864B2 (ja) | 分析及び観察装置用案内棒装置 | |
| JPH0333037Y2 (enExample) |