JPH0650786Y2 - Ｉｃ試験装置 - Google Patents

Ｉｃ試験装置

Info

Publication number
JPH0650786Y2
JPH0650786Y2 JP10402887U JP10402887U JPH0650786Y2 JP H0650786 Y2 JPH0650786 Y2 JP H0650786Y2 JP 10402887 U JP10402887 U JP 10402887U JP 10402887 U JP10402887 U JP 10402887U JP H0650786 Y2 JPH0650786 Y2 JP H0650786Y2
Authority
JP
Japan
Prior art keywords
terminal
current
under test
switching circuit
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP10402887U
Other languages
English (en)
Japanese (ja)
Other versions
JPS648676U (enrdf_load_stackoverflow
Inventor
宜昭 島崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP10402887U priority Critical patent/JPH0650786Y2/ja
Publication of JPS648676U publication Critical patent/JPS648676U/ja
Application granted granted Critical
Publication of JPH0650786Y2 publication Critical patent/JPH0650786Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP10402887U 1987-07-06 1987-07-06 Ｉｃ試験装置 Expired - Lifetime JPH0650786Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10402887U JPH0650786Y2 (ja) 1987-07-06 1987-07-06 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10402887U JPH0650786Y2 (ja) 1987-07-06 1987-07-06 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPS648676U JPS648676U (enrdf_load_stackoverflow) 1989-01-18
JPH0650786Y2 true JPH0650786Y2 (ja) 1994-12-21

Family

ID=31335383

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10402887U Expired - Lifetime JPH0650786Y2 (ja) 1987-07-06 1987-07-06 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JPH0650786Y2 (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2866750B2 (ja) * 1991-01-28 1999-03-08 三菱電機株式会社 半導体試験装置および半導体装置の試験方法
JP2005265756A (ja) * 2004-03-22 2005-09-29 Yokogawa Electric Corp Ｉｃテスタ

Also Published As

Publication number Publication date
JPS648676U (enrdf_load_stackoverflow) 1989-01-18

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