JPH0642220Y2 - 電子部品測定電極機構 - Google Patents
電子部品測定電極機構Info
- Publication number
- JPH0642220Y2 JPH0642220Y2 JP2641088U JP2641088U JPH0642220Y2 JP H0642220 Y2 JPH0642220 Y2 JP H0642220Y2 JP 2641088 U JP2641088 U JP 2641088U JP 2641088 U JP2641088 U JP 2641088U JP H0642220 Y2 JPH0642220 Y2 JP H0642220Y2
- Authority
- JP
- Japan
- Prior art keywords
- measuring
- conductive contact
- contact piece
- measuring electrode
- circuit box
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000002159 abnormal effect Effects 0.000 description 4
- 238000009413 insulation Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000007792 addition Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2641088U JPH0642220Y2 (ja) | 1988-02-29 | 1988-02-29 | 電子部品測定電極機構 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2641088U JPH0642220Y2 (ja) | 1988-02-29 | 1988-02-29 | 電子部品測定電極機構 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01132982U JPH01132982U (enrdf_load_html_response) | 1989-09-11 |
| JPH0642220Y2 true JPH0642220Y2 (ja) | 1994-11-02 |
Family
ID=31248007
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2641088U Expired - Lifetime JPH0642220Y2 (ja) | 1988-02-29 | 1988-02-29 | 電子部品測定電極機構 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0642220Y2 (enrdf_load_html_response) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2587280Y2 (ja) * | 1992-04-01 | 1998-12-16 | 株式会社ダイトー | Ｉｃハンドラーのテストヘッド構造 |
-
1988
- 1988-02-29 JP JP2641088U patent/JPH0642220Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01132982U (enrdf_load_html_response) | 1989-09-11 |
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