JPH0634657A - Electricity supply device - Google Patents

Electricity supply device

Info

Publication number
JPH0634657A
JPH0634657A JP10852992A JP10852992A JPH0634657A JP H0634657 A JPH0634657 A JP H0634657A JP 10852992 A JP10852992 A JP 10852992A JP 10852992 A JP10852992 A JP 10852992A JP H0634657 A JPH0634657 A JP H0634657A
Authority
JP
Japan
Prior art keywords
supply device
terminal
electronic component
electricity supply
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10852992A
Other languages
Japanese (ja)
Inventor
Yasuhiko Miki
安彦 三木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Tektronix Corp filed Critical Sony Tektronix Corp
Priority to JP10852992A priority Critical patent/JPH0634657A/en
Publication of JPH0634657A publication Critical patent/JPH0634657A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent oscillation and noise which are generated at a terminal of an electronic component to be measured, when a voltage or a current is supplied to the electronic component. CONSTITUTION:In an electricity supply device 10, a ferrite member 20 having an opening is passed through the main body 14 of the electricity supply device and fitted in the vicinity of a contact terminal 12. As for the fitting of this ferrite member 20, it may be fixed also by covering it with an elastic member 22. According to this constitution, the impedance at the time when the contact terminal 12 of the electricity supply device 10 comes into contact with a terminal of an electronic component changes, and therefore oscillation and noise can be prevented.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】電子部品の電気特性を測定する際
に、被測定電子部品に電流又は電圧を供給することによ
って生じる電子部品の発振及びノイズを防止することが
できる電気供給装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electric power supply device capable of preventing oscillation and noise of an electronic part caused by supplying a current or a voltage to an electronic part to be measured when measuring electric characteristics of the electronic part.

【0002】[0002]

【従来の技術】電子部品の電気特性を測定するために
は、カーブトレーサやパラメータ・アナライザなどの測
定機器が使用される。これら測定機器は、測定したい被
測定電子部品の所望のいくつかの端子に電圧又は電流を
供給し、そのときの電圧値及び電流値を被測定電子部品
の電気特性として表示することができる。被測定電子部
品に電圧又は電流を供給するために、図2に示すよう
に、測定機器30と電気的に接続された電気供給装置1
0を使用することがあり、この場合、その接触端子(ク
リップ)12を被測定電子部品の所望の端子に接触させ
る。これは、被測定電子部品の端子間隔が狭いときに用
いられる方法である。図1及び2に示した電気供給装置
10は、グラバー・チップとも呼ばれ、通常は電気試験
プローブとして用いられているもので、押圧部18を電
気供給装置本体14に対して押し込むと、クリップ12
が本体14の先端からをでてくると共に左右に開き、押
圧部18を押すのを止めるとクリップ12は閉じる。こ
れを利用すれば、被測定電子部品の端子を挟むことがで
き、こうして被測定電子部品の端子と測定機器30は電
気的に接続される。例えば、トランジスタならば、その
ベース、エミッタ及びコレクタの3端子を電気供給装置
10のクリップ12で挟んで接触させ、それぞれに電圧
又は電流を供給すれば、3端子間の電圧値及び電流値等
の関係を調べることができる。
2. Description of the Related Art Measuring instruments such as a curve tracer and a parameter analyzer are used to measure the electrical characteristics of electronic components. These measuring devices can supply voltage or current to some desired terminals of the measured electronic component to be measured, and can display the voltage value and current value at that time as the electrical characteristics of the measured electronic component. As shown in FIG. 2, an electric power supply device 1 electrically connected to a measuring device 30 in order to supply a voltage or a current to an electronic device under test.
0 is sometimes used, and in this case, the contact terminal (clip) 12 is brought into contact with a desired terminal of the measured electronic component. This is the method used when the terminal spacing of the measured electronic component is narrow. The electricity supply device 10 shown in FIGS. 1 and 2 is also called a grabber tip and is usually used as an electric test probe. When the pressing portion 18 is pushed into the electricity supply device body 14, the clip 12 is pressed.
Comes out from the tip of the main body 14 and opens left and right, and when the pushing of the pressing portion 18 is stopped, the clip 12 is closed. If this is utilized, the terminal of the measured electronic component can be sandwiched, and thus the terminal of the measured electronic component and the measuring device 30 are electrically connected. For example, in the case of a transistor, if the three terminals of the base, the emitter and the collector are sandwiched by the clips 12 of the electric power supply device 10 and brought into contact with each other, and a voltage or a current is supplied to each of them, the voltage value and the current value between the three terminals, etc. You can look up relationships.

【0003】電子部品等の特性試験では、被測定電子部
品に電圧を印加して電流値を測定したり、その逆に、電
流を供給して電圧値を測定する。このとき、被測定電子
部品の端子に電圧又は電流を供給すると、被測定電子部
品に発振及びノイズが発生することがある。この現象
は、供給する電圧又は電流の変化がゆっくりとした、ほ
ぼ直流であっても、つまり、高周波でなくとも起きる。
この1つの原因は、被測定電子部品の隣接する端子間に
容量等があるためである。また1つの原因は、被測定部
品に電圧又は電流を供給する測定機器30とが離れてお
り、両者を電気的に接続している導線が、その長さのた
めに浮遊容量やインダクタンス等を有するためである。
よって、電子部品に電流を供給すると発振及びノイズが
発生し、このままでは正確な電気特性の測定ができな
い。
In a characteristic test of an electronic component or the like, a voltage is applied to a measured electronic component to measure a current value, or conversely, a current is supplied to measure a voltage value. At this time, if voltage or current is supplied to the terminals of the measured electronic component, oscillation and noise may occur in the measured electronic component. This phenomenon occurs even when the supplied voltage or current changes slowly and is almost direct current, that is, not at high frequency.
One of the causes for this is that there is a capacitance or the like between the adjacent terminals of the measured electronic component. Further, one cause is that the measuring device 30 that supplies voltage or current to the component under measurement is separated, and the conductor wire that electrically connects the two has stray capacitance, inductance, etc. due to its length. This is because.
Therefore, when a current is supplied to the electronic component, oscillation and noise occur, and accurate electrical characteristics cannot be measured as they are.

【0004】従来、このような場合の1つの対策とし
て、非結晶性の酸化鉄であるフェライトに開口を設けた
フェライト部材を次のように用いていた。即ち、被測定
電子部品の端子にフェライト部材を通したり、フェライ
ト部材を通した導線を端子に接触させたりして発振及び
ノイズを止めていた。あるいは、板状のフェライトに複
数の穴をあけ、これら穴に電子部品の端子を通すことに
より発振を止めていた。これらは、フェライトがコイル
と同じようにインダクタンスを有するため、被測定電子
部品の端子、測定機器及び導線等を含めたインピーダン
スが変化することを利用している。このように発振及び
ノイズを防止した上で、電気特性を測定していた。
Conventionally, as one countermeasure against such a case, a ferrite member having openings formed in ferrite, which is amorphous iron oxide, has been used as follows. That is, oscillation and noise have been stopped by passing a ferrite member through the terminal of the electronic component to be measured or by contacting a lead wire passing through the ferrite member with the terminal. Alternatively, oscillation is stopped by making a plurality of holes in a plate-shaped ferrite and inserting terminals of electronic parts into these holes. Since these ferrites have the same inductance as a coil, they utilize the fact that the impedance of the measured electronic components, including the terminals, measuring equipment, and conductors, changes. In this way, the electrical characteristics were measured after preventing the oscillation and noise.

【0005】[0005]

【発明が解決しようとする課題】被測定電子部品に電圧
又は電流を供給することにより、被測定電子部品の端子
間に発振及びノイズが発生することがある。これを防止
するために、被測定電子部品の端子にフェライト部材を
挿入したり、フェライト部材を通した導線を被測定電子
部品の端子に接触させたりすることは、非常に煩雑であ
る。また、フェライト部材は、わずかに導電性を有す
る。よって、端子間隔が短い場合にフェライト部材を端
子に挿入すると、フェライト部材を介して端子と端子が
短絡しまうことがあった。
When a voltage or current is supplied to the electronic device under test, oscillation and noise may occur between the terminals of the electronic device under test. In order to prevent this, it is very complicated to insert a ferrite member into the terminal of the electronic component to be measured or to bring a conductor passing through the ferrite member into contact with the terminal of the electronic component to be measured. Further, the ferrite member is slightly conductive. Therefore, if the ferrite member is inserted into the terminal when the terminal interval is short, the terminals may short-circuit with each other via the ferrite member.

【0006】そこで本発明の目的は、煩雑な手続きを必
要とせず、端子と端子を短絡させる恐れがなく、被測定
電子部品に電圧又は電流を供給するときに被測定電子部
品の端子に発生する発振及びノイズを効果的に防止し
て、電気特性の測定に使用できる電気供給装置を提供す
ることである。また、本発明の他の目的は、安価且つ簡
易な構成で、被測定電子部品に電圧又は電流を供給する
ときに被測定電子部品の端子に発生する発振及びノイズ
を効果的に防止して、電気特性の測定に使用できる電気
供給装置を提供することである。
Therefore, an object of the present invention is to generate a voltage or current at a terminal of a measured electronic component when supplying a voltage or a current to the measured electronic component, without requiring complicated procedures, fear of short-circuiting the terminals. An object of the present invention is to provide an electricity supply device that can effectively prevent oscillation and noise and can be used for measuring electrical characteristics. Another object of the present invention is an inexpensive and simple configuration, which effectively prevents oscillation and noise generated at the terminals of the measured electronic component when a voltage or current is supplied to the measured electronic component, An object of the present invention is to provide an electricity supply device that can be used for measuring electrical characteristics.

【0007】[0007]

【課題を解決するための手段】本発明の電気供給装置
は、被測定電子部品の電気特性を測定する測定機器30
が供給する電圧又は電流を被測定電子部品の端子に供給
するもので、この端子に接触させる接触端子12を有し
ている。このとき、開口を有するフェライト部材20を
電気供給装置本体14に通して接触端子12付近に装着
している。フェライトを筒状にしたフェライト部材20
はインダクタンスを有するので、被測定電子部品に電圧
又は電流を供給するときに被測定電子部品の端子に発生
する発振及びノイズを防止することができる。
SUMMARY OF THE INVENTION The electricity supply device of the present invention is a measuring device 30 for measuring the electrical characteristics of an electronic component to be measured.
Is supplied to the terminal of the electronic device under test, and has a contact terminal 12 for contacting this terminal. At this time, the ferrite member 20 having an opening is passed through the main body 14 of the electricity supply device and mounted near the contact terminal 12. Ferrite member 20 in which ferrite is cylindrical
Has an inductance, it is possible to prevent oscillation and noise generated at the terminals of the measured electronic component when a voltage or current is supplied to the measured electronic component.

【0008】[0008]

【実施例】図1は、本発明の電気供給装置10の一実施
例を示す図である。従来と同じく、接触端子(クリッ
プ)12で被測定電子部品の端子を挟み、これによって
被測定電子部品の所望の端子に電圧又は電流を供給す
る。フェライト部材20は、電気供給装置10の本体1
4のクリップ12の近くに装着される。図1に用いたフ
ェライト部材20は、電気供給装置本体14を挿入でき
るように筒状になっている。フェライト部材20には長
さの短いものを用い、必要なインダクタンスを得るため
に複数個用いるようにするのが好ましい。こうすれば、
フェライト部材20の使用個数によって得るインダクタ
ンスを可変できる。電気供給装置本体14にフェライト
部材20を装着するために、弾性部材22でフェライト
部材20を覆う。また、フェライト部材20の装着方法
は、単に接着剤で接着するだけでも良い。通常の使用で
は問題ないが、フェライト部材20による短絡が起きな
いようにするため、弾性部材22は絶縁性部材であるこ
とが好ましい。本発明の効果を得るためには、電気供給
装置10に容易に取り付けることができ、インピーダン
スを変えることができれば良いので、フェライト部材に
限る必要はない。例えば、コイルをプローブ本体14に
巻き付けても良い。
DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a diagram showing an embodiment of an electric power supply device 10 of the present invention. As in the conventional case, the terminals of the electronic component to be measured are sandwiched by the contact terminals (clips) 12, thereby supplying a voltage or current to a desired terminal of the electronic component to be measured. The ferrite member 20 is the main body 1 of the electricity supply device 10.
4 is attached near the clip 12. The ferrite member 20 used in FIG. 1 has a tubular shape so that the electricity supply device body 14 can be inserted therein. It is preferable to use a ferrite member 20 having a short length and use a plurality of ferrite members 20 in order to obtain a required inductance. This way
The obtained inductance can be changed depending on the number of the ferrite members 20 used. In order to mount the ferrite member 20 on the electricity supply device body 14, the ferrite member 20 is covered with the elastic member 22. Further, the ferrite member 20 may be attached by simply adhering it with an adhesive. Although there is no problem in normal use, the elastic member 22 is preferably an insulating member in order to prevent a short circuit due to the ferrite member 20. In order to obtain the effect of the present invention, it is sufficient that it can be easily attached to the electricity supply device 10 and the impedance can be changed, and therefore, it is not limited to the ferrite member. For example, a coil may be wound around the probe body 14.

【0009】[0009]

【発明の効果】従来ある電気供給装置に簡単で、安価な
改良を加えるだけで、被測定電子部品に電圧又は電流を
供給するときに被測定電子部品の端子に発生する発振及
びノイズを防止することができる。また、どのような電
気供給装置にも容易に応用できる。さらに、発振及びノ
イズ防止のために、被測定電子部品の端子にフェライト
部材を通したり、フェライト部材を通した導線を端子に
接触させたりといった煩雑な手続きが不要となり、通常
の電気供給装置の測定操作のままで、発振及びノイズ防
止し、被測定電子部品の電気特性を測定できる。さら
に、電気供給装置本体にフェライト部材を装着したの
で、隣接する端子間隔の狭い電子部品の端子にフェライ
ト部材を通す場合に起こった短絡の心配がない。
EFFECT OF THE INVENTION By simply and simply improving the conventional electric power supply device, it is possible to prevent oscillation and noise generated at the terminals of the electronic device under test when a voltage or current is supplied to the electronic device under test. be able to. Further, it can be easily applied to any electricity supply device. Furthermore, in order to prevent oscillation and noise, complicated procedures such as passing a ferrite member through the terminal of the electronic device under test or contacting the lead wire through the ferrite member with the terminal are not required, and the measurement of a normal electric power supply device is eliminated. It is possible to measure the electrical characteristics of the electronic component under test while preventing oscillation and noise without changing the operation. Further, since the ferrite member is attached to the main body of the electricity supply device, there is no fear of a short circuit which occurs when the ferrite member is passed through the terminals of the electronic components adjacent to each other and having a narrow terminal gap.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の電気供給装置の一実施例を示す図であ
る。
FIG. 1 is a diagram showing an embodiment of an electricity supply device of the present invention.

【図2】従来の電気供給装置の一実施例を示す図であ
る。
FIG. 2 is a diagram showing an example of a conventional electricity supply device.

【符号の説明】[Explanation of symbols]

10 電気供給装置 12 接触端子 14 電気供給装置本体 20 フェライト部材 10 Electric Supply Device 12 Contact Terminal 14 Electric Supply Device Main Body 20 Ferrite Member

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 被測定電子部品の電気特性を測定する測
定機器が供給する電圧又は電流を上記被測定電子部品の
端子に供給するために、該端子に接触させる接触端子を
有する電気供給装置において、 開口を有するフェライト部材を上記電気供給装置の本体
に上記開口を介して通し、上記フェライト部材を上記本
体の上記接触端子付近に装着することにより、上記被測
定電子部品に電圧又は電流を供給するときに上記被測定
電子部品の端子に発生する発振及びノイズを防止するこ
とを特徴とする電気供給装置。
1. An electric power supply device having a contact terminal for contacting a terminal of the electronic device under test, in order to supply a voltage or current supplied by a measuring device for measuring the electrical characteristics of the electronic device under test to the terminal of the electronic device under test. A ferrite member having an opening is passed through the main body of the electricity supply device through the opening, and the ferrite member is mounted in the vicinity of the contact terminal of the main body to supply a voltage or a current to the electronic device under test. An electric supply device which prevents oscillation and noise that sometimes occur at the terminals of the measured electronic component.
JP10852992A 1992-04-01 1992-04-01 Electricity supply device Pending JPH0634657A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10852992A JPH0634657A (en) 1992-04-01 1992-04-01 Electricity supply device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10852992A JPH0634657A (en) 1992-04-01 1992-04-01 Electricity supply device

Publications (1)

Publication Number Publication Date
JPH0634657A true JPH0634657A (en) 1994-02-10

Family

ID=14487118

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10852992A Pending JPH0634657A (en) 1992-04-01 1992-04-01 Electricity supply device

Country Status (1)

Country Link
JP (1) JPH0634657A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6235268B2 (en) * 1979-10-01 1987-07-31 Hitachi Ltd
JPH02141680A (en) * 1988-11-22 1990-05-31 Nec Yamagata Ltd Contact probe for semiconductor element

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6235268B2 (en) * 1979-10-01 1987-07-31 Hitachi Ltd
JPH02141680A (en) * 1988-11-22 1990-05-31 Nec Yamagata Ltd Contact probe for semiconductor element

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