JPS60163379U - Vibration testing equipment for electronic components - Google Patents
Vibration testing equipment for electronic componentsInfo
- Publication number
- JPS60163379U JPS60163379U JP5219284U JP5219284U JPS60163379U JP S60163379 U JPS60163379 U JP S60163379U JP 5219284 U JP5219284 U JP 5219284U JP 5219284 U JP5219284 U JP 5219284U JP S60163379 U JPS60163379 U JP S60163379U
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- hollow package
- voltage
- voltage drop
- conductor case
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は、中空金属ケースコンデンサの構造を。
示す図、第２図は従来の電子部品の振動試験装置を示す
図、第３図はこの考案による電子部品の振動試験装置を
示す図、第４図は、この考案に夫る電子部品の振動試験
装置を使用した時の検出波形図である。
図中１は金属ケース、２はリード、３は絶縁体、４，５
はコンデンサ素子の電極、６は誘電 □体、７は空隙、
８はコンデンサ、９は加振器、１０はコンデンサ８を加
振器に取や付ける治具、１１はピックアップ、１２は制
御装置、１３は検出器、１４はピックアップ、１５は表
示器、１６は検出器である。図中同一あるいは相当部分
には同一符号を示しである。Figure 1 shows the structure of a hollow metal case capacitor. 2 is a diagram showing a conventional vibration testing device for electronic components, FIG. 3 is a diagram showing a vibration testing device for electronic components according to this invention, and FIG. 4 is a diagram showing a vibration testing device for electronic components according to this invention. It is a detection waveform diagram when using a test device. In the figure, 1 is a metal case, 2 is a lead, 3 is an insulator, 4, 5
is the electrode of the capacitor element, 6 is the dielectric body, 7 is the air gap,
8 is a capacitor, 9 is an exciter, 10 is a jig for attaching the capacitor 8 to the exciter, 11 is a pickup, 12 is a control device, 13 is a detector, 14 is a pickup, 15 is an indicator, 16 is a It is a detector. Identical or corresponding parts in the figures are denoted by the same reference numerals.
Claims (1)
中空パッケージに封入され、両端にリード線゛がそれぞ
れ接続された電子部品素子、上記導体ケースと上記リー
ド線との間を絶縁し、かつ固定する絶縁体とを有し、上
記電子部品素子と中空パッケージとの間に空隙が形成さ
れた一体化構造の電子部品に機械的振動を与える加振器
と、交流電源、電圧降下用抵抗および上記電子部品とに
より電気回路を形成し、上記電子部品のリード線の断線
を上記電圧降下用抵抗の電圧有無により検出する断線有
無検出器とを備えた電子部品の振動試験装置において、
上記電子部品素子と中空パッケージ間に電圧を印加する
交流電源と、上記導体ケースと中空パッケージ間の空隙
に起因する浮遊容量の変化に比例した前記交流電源の電
流を検出す、る電圧降下抵抗と、この電圧降下抵抗の電
圧を観測するオシロスコープとから構成された検出器を
設け、中空パッケージ内部の電子部品素子の機械的共振
を電気的信号変化として確認できるようにしたことを特
徴とする電子部品の振動試験装置。A conductor case having a hollow package, an electronic component element sealed in the hollow package of the conductor case and having lead wires connected to both ends thereof, and an insulator for insulating and fixing between the conductor case and the lead wires. an exciter that applies mechanical vibration to an electronic component having an integrated structure in which a gap is formed between the electronic component element and the hollow package, an AC power supply, a voltage drop resistor, and the electronic component; In a vibration testing device for electronic components, the electronic component vibration testing device is provided with a disconnection detection device that forms an electric circuit and detects disconnection of the lead wire of the electronic component based on the presence or absence of voltage of the voltage drop resistor.
an AC power supply that applies a voltage between the electronic component element and the hollow package; and a voltage drop resistor that detects a current of the AC power supply that is proportional to a change in stray capacitance caused by the gap between the conductor case and the hollow package. An electronic component characterized in that it is equipped with a detector consisting of an oscilloscope that observes the voltage of this voltage drop resistor, and the mechanical resonance of the electronic component element inside the hollow package can be confirmed as an electrical signal change. vibration test equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5219284U JPS60163379U (en) | 1984-04-10 | 1984-04-10 | Vibration testing equipment for electronic components |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5219284U JPS60163379U (en) | 1984-04-10 | 1984-04-10 | Vibration testing equipment for electronic components |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS60163379U true JPS60163379U (en) | 1985-10-30 |
Family
ID=30571925
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5219284U Pending JPS60163379U (en) | 1984-04-10 | 1984-04-10 | Vibration testing equipment for electronic components |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60163379U (en) |
-
1984
- 1984-04-10 JP JP5219284U patent/JPS60163379U/en active Pending
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