JPH1019930A - Conductive contact - Google Patents
Conductive contactInfo
- Publication number
- JPH1019930A JPH1019930A JP8188198A JP18819896A JPH1019930A JP H1019930 A JPH1019930 A JP H1019930A JP 8188198 A JP8188198 A JP 8188198A JP 18819896 A JP18819896 A JP 18819896A JP H1019930 A JPH1019930 A JP H1019930A
- Authority
- JP
- Japan
- Prior art keywords
- conductive
- needle
- coil spring
- conductive contact
- inductance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、特に半導体素子の
ウェハやウェハから切り出されたベアチップの電気テス
トを行う際に用いるのに適する導通検査用のコンタクト
プローブに用いられる導電性接触子に関するものであ
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a conductive contact used for a contact probe for continuity inspection, which is particularly suitable for use in conducting an electrical test of a semiconductor device wafer or a bare chip cut from the wafer. is there.
【0002】[0002]
【従来の技術】従来、プリント配線板の導体パターンや
電子素子などの電気的検査を行うためのコンタクトプロ
ーブに用いられる導電性接触子には、ホルダ内に圧縮コ
イルばねを同軸的に受容すると共に、一対の導電性接触
子をホルダの軸線方向両端部にてそれぞれ出没自在に支
持し、それら両導電性針状体と圧縮コイルばねの両端部
とをそれぞれ半田付けして接続したものがある。そし
て、一方の導電性針状体から入力した電気信号を導電性
の圧縮コイルばねを介して他方の導電性針状体に伝達す
るようにしている。2. Description of the Related Art Conventionally, a conductive coil used for a contact probe for conducting an electrical inspection of a conductor pattern or an electronic element of a printed wiring board receives a compression coil spring in a holder coaxially. In some cases, a pair of conductive contacts are supported at both ends in the axial direction of the holder so as to be freely retractable, and both conductive needles are connected to both ends of the compression coil spring by soldering. Then, an electric signal input from one conductive needle is transmitted to the other conductive needle via a conductive compression coil spring.
【0003】しかしながら、上記導電性接触子に流れる
電気信号が高周波信号である場合には、コイル状の導体
に電流が流れることになり、悪影響が生じる。すなわ
ち、コイル状の導体に高周波信号を流すと、インダクタ
ンスが増加し、検出信号に対する抵抗となる。However, when the electric signal flowing through the conductive contact is a high-frequency signal, a current flows through the coil-shaped conductor, which has an adverse effect. That is, when a high-frequency signal is passed through the coil-shaped conductor, the inductance increases and the resistance to the detection signal is obtained.
【0004】[0004]
【発明が解決しようとする課題】近年、半導体素子のウ
ェハ状態でのテストでは、テスト信号周波数が高速化さ
れ、数百MHzのものも使用されるようになっている。し
たがって、そのような高周波数の電気信号を伝えるテス
ト用コンタクトプローブに適用される導電性接触子にあ
っては、低インダクタンス化及び低抵抗化をより一層促
進することが要求される。In recent years, in a test of a semiconductor device in a wafer state, a test signal frequency has been increased, and a test signal having a frequency of several hundred MHz has been used. Therefore, it is required that the conductive contact applied to the test contact probe for transmitting such a high-frequency electric signal further promotes a reduction in inductance and resistance.
【0005】[0005]
【課題を解決するための手段】このような課題を解決し
て、高周波数に対応するべく低インダクタンス化及び低
抵抗化可能な導電性接触子を実現するために、本発明に
於いては、絶縁性支持部材に設けられた貫通孔に互いに
相反する向きの突出方向にそれぞれ抜け止めされかつ出
没自在に支持された一対の導電性針状体と、前記各導電
性針状体を前記突出方向に弾発付勢するべく前記貫通孔
内に受容されかつ前記両導電性針状体と一体的に結合さ
れた導電性コイルばねとを有し、前記コイルばねの一部
に他の部分よりも比較的粗いピッチの粗巻き部を設けた
ものとした。SUMMARY OF THE INVENTION In order to solve such a problem and to realize a conductive contact capable of reducing the inductance and the resistance so as to cope with a high frequency, the present invention provides: A pair of conductive needles which are retained in the through-holes provided in the insulating support member in projecting directions opposite to each other and supported so as to be able to protrude and retract, respectively; A conductive coil spring that is received in the through hole and is integrally coupled with the conductive needle-like bodies so as to resiliently urge the spring. A coarse winding portion having a relatively coarse pitch was provided.
【0006】[0006]
【発明の実施の形態】以下に添付の図面に示された具体
例に基づいて本発明の実施の形態について詳細に説明す
る。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below in detail with reference to specific examples shown in the accompanying drawings.
【0007】図1は、本発明が適用された両端可動型の
導電性接触子1の1例を示す模式的縦断面図である。こ
の導電性接触子1は、例えば図における上側の検査装置
に取り付けられた状態で、下側に配設された被検査対象
に接触させて、電気的検査を行う際に用いるのに適し、
図では1本の導電性接触子のみを示しているが、端子の
数に応じて複数を並列に配設されている。なお、図では
軸線方向長さに対して半径方向長さを極端に長くして図
示しているが、実際には極めて細長いものである。FIG. 1 is a schematic longitudinal sectional view showing an example of a conductive contact 1 of a movable double-ended type to which the present invention is applied. This conductive contact 1 is suitable for use in performing an electrical inspection by, for example, being attached to an inspection apparatus on the upper side in the drawing and being brought into contact with an object to be inspected arranged on the lower side,
Although only one conductive contact is shown in the figure, a plurality of conductive contacts are arranged in parallel according to the number of terminals. In the figure, the length in the radial direction is shown to be extremely long with respect to the length in the axial direction, but it is actually extremely elongated.
【0008】本導電性接触子1のホルダは、図1に示さ
れるように比較的厚い中間絶縁体2と、その中間絶縁体
2を間に挟むように上下に積層された上側絶縁体3及び
下側絶縁体4とにより構成されている。中間絶縁体2に
はその厚さ方向に貫通する中間孔2aが形成されてお
り、上側及び下側の各絶縁体3・4には、中間孔2aよ
りも若干縮径された各支持孔3a・4aがそれぞれ厚さ
方向に貫通して形成されており、中間孔2a及び各支持
孔3a・4aが互いに同軸的に整合するように各絶縁体
2〜4が積層されかつ図示されない締結手段により固定
されている。なお、これら各絶縁体2・3・4は、合成
樹脂材または金属材であって良く、金属材の場合には孔
の内周面を絶縁コーティングする。As shown in FIG. 1, the holder of the present conductive contact 1 has a relatively thick intermediate insulator 2 and an upper insulator 3 which is vertically stacked with the intermediate insulator 2 interposed therebetween. The lower insulator 4 is used. The intermediate insulator 2 is formed with an intermediate hole 2a penetrating in the thickness direction thereof. Each of the upper and lower insulators 3 and 4 has a support hole 3a slightly smaller in diameter than the intermediate hole 2a. 4a are formed so as to penetrate in the thickness direction, and the insulators 2 to 4 are laminated so that the intermediate hole 2a and the support holes 3a and 4a are coaxially aligned with each other, and are fastened by fastening means (not shown). Fixed. Each of the insulators 2, 3, 4 may be a synthetic resin material or a metal material. In the case of a metal material, the inner peripheral surface of the hole is coated with an insulating material.
【0009】本導電性接触子1は、前記したように両端
可動型であり、上下の各支持孔3a・4aにより、上側
及び下側の各導電性針状体5・6が軸線方向に変位自在
に支持されている。各導電性針状体5・6は、その各突
出先端部をそれぞれ各支持孔3a・4aから外方に突出
する方向に先鋭にされ、それぞれ抜け止め用に各支持孔
3a・4aよりも拡径されて中間孔2a内に受容された
拡径部5a・6aを有している。The conductive contact 1 is of a movable type at both ends as described above, and the upper and lower conductive needles 5 and 6 are displaced in the axial direction by the upper and lower support holes 3a and 4a. It is freely supported. Each of the conductive needle-shaped members 5 and 6 has its protruding tip portion sharpened in the direction of protruding outward from each of the support holes 3a and 4a, and is expanded beyond each of the support holes 3a and 4a for retaining. It has enlarged portions 5a and 6a which are diametrically received and received in the intermediate hole 2a.
【0010】中間孔2aには両導電性針状体5・6間に
介装された導電性コイルばね7が同軸的に受容されてお
り、そのコイルばね7の両端部が、上記各導電性針状体
5・6の中間孔2a内に受容された各拡径部5a・6a
から互いに対向して突設されたピン状の各結合部5b・
6bに、巻き付きまたは半田付けにて結合されている。A conductive coil spring 7 interposed between the conductive needles 5 and 6 is coaxially received in the intermediate hole 2a, and both ends of the coil spring 7 are connected to the respective conductive needles. Each enlarged diameter portion 5a, 6a received in the intermediate hole 2a of the needle-like body 5, 6.
Pin-shaped coupling portions 5b projecting from each other
6b is connected by winding or soldering.
【0011】このようにして構成された導電性接触子1
をウェハテストに使用する場合には、例えば図に示され
るように予め検査装置側の基板8に絶縁性支持部材とし
ての絶縁体2・3・4を図示されないねじなどで固設し
ておく。基板8の絶縁体3を固設される面(図における
下面)には回路の一部として設けられた内部回路導電体
8aの端部が露出している。The conductive contact 1 thus constructed
Is used for a wafer test, for example, as shown in the figure, insulators 2, 3, and 4 as insulating support members are fixed to a substrate 8 on the inspection apparatus side in advance by screws or the like (not shown). The end of the internal circuit conductor 8a provided as a part of the circuit is exposed on the surface of the substrate 8 on which the insulator 3 is fixed (the lower surface in the figure).
【0012】上記したように導電性接触子1を基板8に
固設することにより、その内部回路導電体8aの露出部
に一方の導電性針状体5が弾発的に衝当し、両者が電気
的に接続される(図1)。そして、他方の導電性針状体
6をテスト対象のワーク9のワークパッド9aに接触さ
せて、ワーク9と検査装置側の基板8とを電気的に接続
し、ウェハテストを行う。By fixing the conductive contact 1 to the substrate 8 as described above, one of the conductive needles 5 resiliently strikes the exposed portion of the internal circuit conductor 8a. Are electrically connected (FIG. 1). Then, the other conductive needle-shaped body 6 is brought into contact with the work pad 9a of the work 9 to be tested, and the work 9 and the substrate 8 on the inspection apparatus side are electrically connected to perform a wafer test.
【0013】ところで、コイルばねを導体とする場合、
その巻き数NとインダクタンスHとの間には、係数をA
とし、ばね長さをLとすると、H=A・N2/Lの関係
があり、低インダクタンス化のためにはNを極力少なく
することが重要である。しかしながら、弾発的に接触さ
せて使用する場合にはある程度のたわみ代も必要であ
り、十巻き前後から数十巻き必要である。When the coil spring is used as a conductor,
The coefficient is A between the number of turns N and the inductance H.
Assuming that the spring length is L, there is a relationship of H = A · N 2 / L, and it is important to reduce N as much as possible to reduce inductance. However, when used in a resilient manner, a certain amount of deflection is required, and about ten to several tens of turns are required.
【0014】本発明によるコイルばね7は、比較的ピッ
チの細かい定常巻き部7aと、その定常巻き部7aに対
して比較的ピッチの粗い粗巻き部7bとを設けるように
巻回され形成されている。ここで、定常巻き部7aより
も粗巻き部7bのばね定数が大きい。The coil spring 7 according to the present invention is wound and formed so as to provide a steady winding portion 7a having a relatively fine pitch and a coarse winding portion 7b having a relatively coarse pitch with respect to the steady winding portion 7a. I have. Here, the spring constant of the coarsely wound portion 7b is larger than that of the steady wound portion 7a.
【0015】従って、前記したように導電性接触子1を
基板8に固設した場合には、内部回路導電体8aに一方
の導電性針状体5が当接して、まず定常巻き部7aがた
わんで密着状態になる。次に、他方の導電性針状体6を
ワークパッド9aに接触させるべく図2に示されるよう
に導電性接触子1をワーク9に近接させた位置で固定状
態にすると、粗巻き部7bがたわむようになる。Therefore, when the conductive contact 1 is fixed to the substrate 8 as described above, one conductive needle 5 comes into contact with the internal circuit conductor 8a, and the stationary winding portion 7a first It sags and comes into close contact. Next, as shown in FIG. 2, when the conductive contact 1 is brought into a fixed state at a position close to the work 9 in order to bring the other conductive needle-shaped body 6 into contact with the work pad 9 a, the coarsely wound portion 7 b becomes To bend.
【0016】このようにすることにより、例えば粗巻き
部7bを数巻きとすることにより、定常巻き部7aが密
接した状態にあっては、粗巻き部7bのみがコイル状の
導体部分になり、ばね部の全長にわたってコイル状に電
気が伝わる場合に対してインダクタンスを小さくするこ
とができる。そのときのインダクタンスHとしては、例
えば粗巻き部7bを1巻きとした場合には上記式のNに
1を代入した結果になるため、インダクタンスを極めて
小さくすることができる。さらに、1巻き以下にするこ
ともでき、より一層低インダクタンス化し得る。By doing so, for example, by making the coarsely wound portion 7b several turns, when the steady wound portion 7a is in close contact, only the coarsely wound portion 7b becomes a coil-shaped conductor portion, The inductance can be reduced as compared with the case where electricity is transmitted in a coil shape over the entire length of the spring portion. As the inductance H at that time, for example, in the case where the coarsely wound portion 7b is set to one turn, the result is obtained by substituting 1 into N in the above equation, so that the inductance can be extremely reduced. Furthermore, the number of turns can be reduced to one or less, and the inductance can be further reduced.
【0017】また、粗巻き部7bのたわみ代を被接触体
としてのワークパッド9aの加工誤差などによる高さ違
いに対するたわみ量を吸収し得る程度に設定することに
より、コイルばね7の実質の巻き数を極力少なくするこ
とができる。例えば上記したように粗巻き部7bの1巻
き分で高さの違いを吸収することができるように設定す
ると、図3に示されるように、ワークパッド9a・9b
・9cの種々の高さの違いに対して、コイル部分はいず
れも1巻きであり、インダクタンスに対してはばね長さ
Lのみの違いでしかなく、高さ違いによる影響は極めて
小さい。Further, by setting the deflection allowance of the coarsely wound portion 7b to such an extent that the amount of deflection against a difference in height due to a processing error of the work pad 9a as a contacted body can be absorbed, a substantial winding of the coil spring 7 can be achieved. The number can be minimized. For example, as described above, when setting is made such that a difference in height can be absorbed by one turn of the coarsely wound portion 7b, the work pads 9a and 9b are set as shown in FIG.
-Regarding the various height differences of 9c, each coil portion has one turn, and the inductance is only a difference of the spring length L, and the influence of the height difference is extremely small.
【0018】また、抵抗値が高くなるコイル部分である
粗巻き部7bが略1巻きであれば、十数巻きや数十巻き
のものに対して抵抗値が相対的に低く、導電性接触子1
に流せる許容電流を大きくすることができ、大電流対応
可能になる。If the coarsely wound portion 7b, which is a coil portion having a higher resistance value, has approximately one turn, the resistance value is relatively lower than that of tens or tens of turns, and the conductive contact 1
The allowable current that can be supplied to the power supply can be increased, and a large current can be handled.
【0019】[0019]
【発明の効果】このように本発明によれば、導電性針状
体を弾発付勢する導電性コイルばねに粗巻き部を設けた
ことから、たわみ代を粗巻き部により吸収することがで
き、巻き数を増やすことなくたわみ代を確保して、低イ
ンダクタンス化及び低抵抗化を向上して高周波数に対応
できる。As described above, according to the present invention, since the coarse coil portion is provided on the conductive coil spring that resiliently urges the conductive needle-shaped member, the bending allowance can be absorbed by the coarse coil portion. Thus, it is possible to secure a deflection allowance without increasing the number of windings, improve low inductance and low resistance, and cope with high frequencies.
【図1】本発明が適用された導電性接触子を示す模式的
縦断面図。FIG. 1 is a schematic longitudinal sectional view showing a conductive contact to which the present invention is applied.
【図2】導電性接触子をワークパッドに接触させた状態
を示す模式的縦断面図。FIG. 2 is a schematic longitudinal sectional view showing a state where a conductive contact is brought into contact with a work pad.
【図3】たわみ量の違いに応じた導電性接触子の状態を
示す模式的縦断面図。FIG. 3 is a schematic longitudinal sectional view showing a state of a conductive contact according to a difference in the amount of deflection.
1 導電性接触子 2 中間絶縁体 3 上側絶縁体 4 下側絶縁体 2a 中間孔 3a・4a 支持孔 5・6 導電性針状体 5a・6a 拡径部 7 コイルばね 7a 定常巻き部 7b 粗巻き部 8 基板 8a 内部回路導電体 9 ワーク 9a・9b・9c ワークパッド DESCRIPTION OF SYMBOLS 1 Conductive contact 2 Intermediate insulator 3 Upper insulator 4 Lower insulator 2a Intermediate hole 3a / 4a Support hole 5.6 Conductive needle-shaped body 5a / 6a Large diameter portion 7 Coil spring 7a Regular winding portion 7b Coarse winding Part 8 substrate 8a internal circuit conductor 9 work 9a, 9b, 9c work pad
Claims (1)
いに相反する向きの突出方向にそれぞれ抜け止めされか
つ出没自在に支持された一対の導電性針状体と、前記各
導電性針状体を前記突出方向に弾発付勢するべく前記貫
通孔内に受容されかつ前記両導電性針状体と一体的に結
合された導電性コイルばねとを有し、前記コイルばねの
一部に他の部分よりも比較的粗いピッチの粗巻き部を設
けたことを特徴とする導電性接触子。1. A pair of conductive needles which are retained in through holes provided in an insulating support member in projecting directions opposite to each other and supported so as to be able to protrude and retract, respectively, and each of said conductive needles A conductive coil spring that is received in the through hole and is integrally connected to the conductive needle-shaped bodies to resiliently urge the body in the projecting direction; A conductive contact comprising a coarsely wound portion having a relatively coarse pitch than other portions.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18819896A JP3634074B2 (en) | 1996-06-28 | 1996-06-28 | Conductive contact |
US08/884,100 US5990697A (en) | 1996-06-28 | 1997-06-27 | Electroconductive contact unit having compression spring with normally and coarsely wound segments |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18819896A JP3634074B2 (en) | 1996-06-28 | 1996-06-28 | Conductive contact |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH1019930A true JPH1019930A (en) | 1998-01-23 |
JP3634074B2 JP3634074B2 (en) | 2005-03-30 |
Family
ID=16219495
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18819896A Expired - Fee Related JP3634074B2 (en) | 1996-06-28 | 1996-06-28 | Conductive contact |
Country Status (2)
Country | Link |
---|---|
US (1) | US5990697A (en) |
JP (1) | JP3634074B2 (en) |
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999004274A1 (en) * | 1997-07-14 | 1999-01-28 | Nhk Spring Co., Ltd. | Conductive contact |
WO2000073805A1 (en) * | 1999-05-28 | 2000-12-07 | Nhk Spring Co., Ltd. | Conductive contact |
EP1102071A1 (en) * | 1998-07-30 | 2001-05-23 | Nhk Spring Co.Ltd. | Holder of electroconductive contactor, and method for producing the same |
JP2001318107A (en) * | 2000-05-01 | 2001-11-16 | Nhk Spring Co Ltd | Conductive contactor |
US6323667B1 (en) | 1996-12-27 | 2001-11-27 | Nhk Spring Co., Ltd. | Contact probe unit |
JP2002538435A (en) * | 1999-02-25 | 2002-11-12 | フォームファクター,インコーポレイテッド | High bandwidth passive integrated circuit tester probe card assembly |
KR100720122B1 (en) * | 2005-03-30 | 2007-05-22 | 주식회사 세지 | Probe device of semiconductor wafer inspector |
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