JPH06314583A - Socket for ic package - Google Patents

Socket for ic package

Info

Publication number
JPH06314583A
JPH06314583A JP10417993A JP10417993A JPH06314583A JP H06314583 A JPH06314583 A JP H06314583A JP 10417993 A JP10417993 A JP 10417993A JP 10417993 A JP10417993 A JP 10417993A JP H06314583 A JPH06314583 A JP H06314583A
Authority
JP
Japan
Prior art keywords
contact
package
spring portion
connecting shaft
spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10417993A
Other languages
Japanese (ja)
Inventor
Nobuaki Kishi
信明 岸
Makoto Hoshi
誠 星
Tetsuya Osawa
哲也 大沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chichibu Fuji Co Ltd
Original Assignee
Chichibu Fuji Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chichibu Fuji Co Ltd filed Critical Chichibu Fuji Co Ltd
Priority to JP10417993A priority Critical patent/JPH06314583A/en
Publication of JPH06314583A publication Critical patent/JPH06314583A/en
Pending legal-status Critical Current

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  • Connecting Device With Holders (AREA)

Abstract

PURPOSE:To provide a socket by which an IC package can be installed and removed under no load and which is excellent in the pressure of contact between a contact and its contact portion, the load of an operation for pushing down a cover, its operational life, and the ability to hold the IC package, etc. CONSTITUTION:A spring portion, which provides the pressure of contact with a package contact P2 by pressing the contact portion 2a of a contact 2 inwards, is formed by a first curved spring portion 2d which is extended upwardly inwards from the inner edge of a flat plate portion 2b and folded back outwards and a second spring portion 2e which is folded back inwards from the end of the first spring portion 2d and joined to the contact portion 2a. A connecting shaft 3 disposed along a line of contacts is provided with a recessed portion 3a for engagement with the protrusion 2g of the second spring portion 2e and a surface portion 3b for engagement with a projecting rear portion 2h. A cover 4 mounted on a base member 1 is provided with an inclined face 4d which makes sliding contact with a support shaft portion 3d at each end of the connecting shaft 3 to turn the connecting shaft 3 outwards. When the cover 4 is pushed down the connecting shaft 3 is turned outwards and displaces the contact portion 2a of the contact 2 outwards against the resilient force of the spring portion.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は製造されたICパッケー
ジの良,不良をテストする際に用いるソケットに関し、
さらに詳しくは、ベース部材に設けた収容スペースの側
辺に沿って、前記収容スペースに収容せるICパッケー
ジの接点との接触部と、該接触部を内側へ付勢して前記
接点との接触圧をうるバネ部とを備えたコンタクトを並
列状に多数配置すると共に、ベース部材に被装したカバ
ーの押し下げ操作で前記接触部を上記バネ部の弾力に抗
し外側へ変異させICパッケージ接点から離間させるよ
うにしたICパッケージ用ソケットに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a socket used for testing whether a manufactured IC package is good or bad,
More specifically, along a side of the accommodation space provided in the base member, a contact portion with a contact of the IC package accommodated in the accommodation space and a contact pressure with the contact by urging the contact portion inward. A large number of contacts each having a spring portion are arranged in parallel, and the contact portion is diverted to the outer side against the elasticity of the spring portion by pushing down the cover mounted on the base member to separate from the IC package contact. The present invention relates to an IC package socket.

【0002】[0002]

【従来の技術】従来、この種ICパッケージ用ソケット
として特開平4-154065号等に代表されるレバーを有する
もの、または特開昭63-307678 号等に代表される直押し
式のものが知られている。
2. Description of the Related Art Conventionally, as this type of IC package socket, a socket having a lever typified by JP-A-4-154065 or a direct-press type socket represented by JP-A-63-307678 is known. Has been.

【0003】レバー式のものは図7に示すように、並列
状に多数配設したコンタクト100 の列に沿ってレバー10
1 を上下回動可能に支持すると共に、該レバー101 の一
端側(外側)に操作部102 を、他端側(内側)にコンタ
クト100 との係合部103 を形成し、カバー104 の押し下
げ操作で前記操作部102 を押し下げるをもってレバー10
1 を下方へ回動させ、接触部105 をバネ部106 の弾力に
抗し外側へ変異させるようになっている。
As shown in FIG. 7, the lever type has a lever 10 arranged along a row of a large number of contacts 100 arranged in parallel.
The lever 101 is rotatably supported, and the operating portion 102 is formed on one end side (outer side) of the lever 101, and the engaging portion 103 with the contact 100 is formed on the other end side (inner side) of the lever 101 to push down the cover 104. Hold down the operation part 102 with the lever 10
1 is rotated downward so that the contact portion 105 is displaced outward against the elasticity of the spring portion 106.

【0004】また直押し式のものは図8に示すように、
並列状に多数配設したコンタクト200 の外側に操作部20
1 を一体に形成し、カバー202 の押し下げ操作で前記操
作部201 を外方へ変異させるをもって接触部203 をバネ
部204 の弾力に抗し外側へ変異させるようになってい
る。
Further, as shown in FIG. 8, the direct push type is as follows.
The operating part 20 is placed on the outside of the contacts 200 arranged in parallel.
1 is integrally formed, and by pushing down the cover 202, the operating portion 201 is displaced outward, and the contact portion 203 is displaced outward against the elasticity of the spring portion 204.

【0005】[0005]

【発明が解決しようとする課題】上記のような構造によ
れば、多数のコンタクト100,200 における夫々の接触部
105,203 をカバー104,202 の押し下げ操作で同時に外側
へ変異させてICパッケージPの着脱を無負荷で行い得
るものの、接点P2に対する接触部105,203 の接触圧力、
カバー104,202 の押し下げ操作の際の操作荷重及びその
操作寿命、さらにはICパッケージPの確実な挟持能力
等に関してなお詳細にその技術内容を検討すると、以下
のような問題点がないとは云えなかった。
According to the structure as described above, the contact portions of the multiple contacts 100, 200 are respectively formed.
Although the IC packages P can be attached / detached with no load by pushing down the covers 104,202 at the same time by pushing down the covers 104,202, the contact pressure of the contact portions 105,203 with respect to the contact P2 is
When the technical contents were examined in more detail with respect to the operating load and the operating life when the covers 104 and 202 were pushed down, and the reliable holding ability of the IC package P, it could be said that there were the following problems. .

【0006】即ち、図7に示すソケットにおいては、コ
ンタクト100 のバネ部106 が図示のような形状であるこ
と、並びにレバー101 の支点107 が定点で且つ接触部10
5 との距離が短いことなどから、接触部105 の変異形態
が同図(b) 中に矢印Y1 で表すような外側へ向かって斜
め上方へほぼ直線的に移動するものになる、換言すれ
ば、ICパッケージPを挟持するための力が同図(c) 中
に矢印Y2 で示す方向になり、ICパッケージPの確実
な挟持にやや不安を残していた。
That is, in the socket shown in FIG. 7, the spring portion 106 of the contact 100 has a shape as shown, and the fulcrum 107 of the lever 101 is a fixed point and the contact portion 10 has a fixed point.
Due to the short distance to 5 and the like, the mutant form of the contact part 105 moves almost linearly upward and outward as indicated by arrow Y1 in FIG. The force for pinching the IC package P is in the direction indicated by the arrow Y2 in FIG. 6C, and there is some concern about the reliable pinching of the IC package P.

【0007】また図8に示すソケットにおいては、接触
部203 が水平方向へ変異する形態のものであることか
ら、ICパッケージPを挟持するための力が同図中に矢
印Zで示す方向になり、ICパッケージの接点P2の変形
不良を発生させる欠点があった。
Further, in the socket shown in FIG. 8, since the contact portion 203 has a form which is displaced in the horizontal direction, the force for holding the IC package P is in the direction indicated by arrow Z in the figure. However, there is a defect that deformation of the contact P2 of the IC package occurs.

【0008】本発明はこのような従来事情に鑑みてなさ
れたものであり、その目的とするところは、多数のコン
タクトにおける夫々の接触部をカバーの押し下げ操作で
同時に外側へ変異させてICパッケージの着脱を無負荷
で行い得ると共に、接点に対する接触部の接触圧力、カ
バーの押し下げ操作の際の操作荷重及びその操作寿命、
ICパッケージの確実な挟持能力等の全てに優れたIC
パッケージ用ソケットを提供することにある。
The present invention has been made in view of such conventional circumstances, and an object thereof is to simultaneously mutate respective contact portions of a large number of contacts to the outside by pushing down the cover, and It can be attached and detached without load, the contact pressure of the contact part with respect to the contact, the operating load when pushing down the cover and its operating life,
An IC that excels in all of the reliable clamping ability of the IC package
To provide a package socket.

【0009】[0009]

【課題を解決するための手段】前述の目的を達成するた
めに、本発明に係るICパッケージ用ソケットは、ベー
ス部材に設けた収容スペースの側辺に沿って、前記収容
スペースに収容せるICパッケージの接点との接触部
と、該接触部を内側へ付勢して前記接点との接触圧をう
るバネ部とを備えたコンタクトを並列状に多数配置する
と共に、それらコンタクトの列に沿って配した連結軸を
各コンタクトに連係せしめ、ベース部材に被装したカバ
ーの押し下げ操作で前記連結軸が回動してコンタクトの
接触部を上記バネ部の弾力に抗し外側へ変異させICパ
ッケージ接点から離間させるようにし、上記コンタクト
はベース部材上に載置せる平板部の内側縁から上方内側
へ延ばし更に外側へ折り返した湾曲状の第1バネ部と、
該第1バネ部先端から内側へ折り返して上記接触部に連
続する第2バネ部と、該第2バネ部の上面に突出する突
起を具備し、他方連結軸は前記突起との係合凹部と、突
起後部との係合面部と、左右両端に突出する支軸部を備
え、さらに上記カバーには前記支軸部に摺接して連結軸
を外側へ回動させる傾斜面を設けてなることを特徴とす
る。
In order to achieve the above-mentioned object, an IC package socket according to the present invention is an IC package which can be accommodated in the accommodating space along a side of the accommodating space provided in the base member. A plurality of contacts each having a contact portion with the contact point and a spring portion for biasing the contact portion inward to obtain a contact pressure with the contact point are arranged in parallel and arranged along the row of the contact points. The connecting shaft is linked to each contact, and the connecting shaft is rotated by pushing down the cover mounted on the base member to mutate the contact portion of the contact to the outside against the elasticity of the spring portion. The contacts are separated from each other, and the contact extends from the inner edge of the flat plate portion that is placed on the base member to the upper inside, and is bent back to the outside.
The second spring part includes a second spring part that is folded back inward from the tip of the first spring part and continues to the contact part, and a protrusion that protrudes on the upper surface of the second spring part, while the connecting shaft is a recessed part that engages with the protrusion. An engaging surface portion for engaging with a rear portion of the protrusion, and a support shaft portion protruding at both left and right ends, and further, the cover is provided with an inclined surface for slidingly contacting the support shaft portion to rotate the connecting shaft to the outside. Characterize.

【0010】[0010]

【作用】上述のコンタクト形状によれば、第1バネ部及
び第2バネ部の弾力が接触部を下方へ押圧する方向に作
用して、接点に対する接触部の接触圧,カバーの押し下
げ操作の際の操作荷重及びその操作寿命等を所定に維持
しつつ、ICパッケージのより確実な挟持能力が得られ
る(図1,図3参照)。
According to the above-mentioned contact shape, the elastic forces of the first spring portion and the second spring portion act in the direction of pressing the contact portion downward, so that the contact pressure of the contact portion against the contact and the operation of pushing down the cover are performed. It is possible to obtain a more reliable sandwiching capability of the IC package while maintaining the operation load and the operation life thereof, etc. at predetermined values (see FIGS. 1 and 3).

【0011】またICパッケージの着脱に際しては、カ
バーの押し下げ操作により傾斜面が支軸部を内側へ押圧
するをもって連結軸が外側へ回動し、これにより係合面
部が突起後部を下方内側へ押圧して第1バネ部を縮小変
形させると同時に、係合凹部が突起を下方外側へ押圧し
て第2バネ部を上方外側へ回動させ、コンタクトの接触
部をバネ部の弾力に抗し外側へ変異させる。その際、変
異初期においては接触部がほぼ垂直方向へ上昇し、その
後に斜め外方へ変異してICパッケージ接点から離間す
るので、ICパッケージ接点の変形不良を引き起こす虞
れなく上記挟持能力を得られる(図2,図4参照)。
When attaching or detaching the IC package, the inclined surface pushes the support shaft portion inward by pushing down the cover and the connecting shaft rotates outward, whereby the engaging surface portion pushes the rear portion of the protrusion downward. Then, at the same time as the first spring portion is contracted and deformed, the engaging concave portion presses the projection downwardly and outwardly to rotate the second spring portion upwardly and outwardly so that the contact portion of the contact resists the elastic force of the spring portion to the outside. Mutate to. At that time, in the initial stage of the mutation, the contact portion rises in a substantially vertical direction, and thereafter, the contact portion is displaced obliquely outward and separated from the IC package contact, so that the above clamping ability can be obtained without causing a deformation defect of the IC package contact. (See FIGS. 2 and 4).

【0012】[0012]

【実施例】以下、本発明に係るICパッケージ用ソケッ
トの一実施例を図1〜6を参照して説明する。図6は本
実施例ソケットの斜視外観図、図5はカバーを外した状
態の同外観図で、図中1はベース部材、2はコンタク
ト、3は連結軸、4はカバーを夫々表す。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of an IC package socket according to the present invention will be described below with reference to FIGS. FIG. 6 is a perspective external view of the socket of this embodiment, and FIG. 5 is an external view of the same with the cover removed. In the drawing, 1 is a base member, 2 is a contact, 3 is a connecting shaft, and 4 is a cover.

【0013】ベース部材1は絶縁材料を用いて成形さ
れ、その中央部分には平面矩形状の隆起部を設けると共
に、その隆起部中央に凹部を形成して該凹部をICパッ
ケージPの収容スペース1aとする。該収容スペース1aの
対抗する二つの側辺に沿っては、多数のコンタクト2を
並列状に配設する。
The base member 1 is formed of an insulating material, and a flat rectangular ridge is provided in the center thereof, and a recess is formed in the center of the ridge to form the recess 1a in which the IC package P is accommodated. And A large number of contacts 2 are arranged in parallel along two opposing sides of the accommodation space 1a.

【0014】コンタクト2は所望の導電材料を用いて図
1に示す形状、即ち、前記収容スペース1aに収容せるI
CパッケージPの接点(リード)P2との接触部2aと、該
接触部2aを内側へ付勢して前記接点P2との接触圧をうる
後述のバネ部とを備えるように一体成形され、下端平板
部2bをベース部材1上面に載置すると共にその平板部2b
から垂下する端子2cをベース部材1の貫通孔1bに嵌挿し
て、ベース部材1上に垂直に立ちあげた状態に固定され
る。
The contact 2 is made of a desired conductive material and has the shape shown in FIG.
A bottom end integrally formed with a contact portion 2a for contacting the contact (lead) P2 of the C package P, and a spring portion described later for urging the contact portion 2a inward to obtain contact pressure with the contact P2. The flat plate portion 2b is placed on the upper surface of the base member 1 and the flat plate portion 2b
The terminal 2c hanging from the base member 1 is fitted into the through hole 1b of the base member 1 and fixed in a state of standing vertically on the base member 1.

【0015】コンタクト2先端は図示のような略C字形
状としてその上端側を上記接触部2aとし、下端側2cはベ
ース部材1の側壁に摺接する位置決めストッパーとして
機能させる。またコンタクト2下端の端子2cは不図示の
テスト回路の端子挿通孔に挿入され、半田等により固定
される。
The tip of the contact 2 has a substantially C shape as shown in the drawing, and the upper end side thereof serves as the contact portion 2a, and the lower end side 2c functions as a positioning stopper which is slidably contacted with the side wall of the base member 1. The terminal 2c at the lower end of the contact 2 is inserted into a terminal insertion hole of a test circuit (not shown) and fixed by soldering or the like.

【0016】上記バネ部は、平板部2bの内側縁から上方
内側へ延ばし更に外側へ折り返した湾曲状の第1バネ部
2dと、該第1バネ部2d先端から内側へ折り返して上記接
触部2aに連続する第2バネ部2eとからなり、該両バネ部
2d,2e の弾力により接触部2aを下方へ付勢して、接点P2
に対する接触部2aの接触圧,カバー4の押し下げ操作の
際の操作荷重及びその操作寿命等を所定に維持しつつ、
ICパッケージPのより確実な挟持能力を得られるよう
になっている。第2バネ部2eにおける第1バネ部2dとの
連結部分2f近傍の上面には突起2gを形成する。
The spring portion is a curved first spring portion which extends upward from the inner edge of the flat plate portion 2b to the inner side and is folded back to the outer side.
2d and a second spring portion 2e which is folded back inward from the tip of the first spring portion 2d and is continuous with the contact portion 2a.
The contact part 2a is urged downward by the elasticity of 2d and 2e, and the contact P2
While maintaining the contact pressure of the contact portion 2a against, the operation load when pressing down the cover 4 and its operation life, etc.
A more reliable holding ability of the IC package P can be obtained. A protrusion 2g is formed on the upper surface of the second spring portion 2e near the connecting portion 2f with the first spring portion 2d.

【0017】上記多数のコンタクト2の列に沿っては連
結軸3を配設する。連結軸3は下面上端側に前記突起2g
との係合凹部3aを設けると共に、該係合凹部3aに連続す
る下面中途部位に突起後部2hとの係合面部3bを備え、且
つ左右両端部3cを下方に延出せしめてその下端部位に支
軸部3dを突設してなるもので、それら支軸部3dを後述す
る傾斜面4cに摺接せしめて上下回動可能に支持される。
A connecting shaft 3 is arranged along the row of the large number of contacts 2. The connecting shaft 3 has the above-mentioned protrusion 2g
Is provided with an engaging concave portion 3a for engaging with the engaging concave portion 3a, and an engaging surface portion 3b for engaging the projection rear portion 2h is provided in a middle portion of the lower surface continuous with the engaging concave portion 3a, and both left and right end portions 3c are extended downward and supported at the lower end portion thereof. The shaft portions 3d are provided so as to project, and the support shaft portions 3d are slidably contacted with an inclined surface 4c described later and supported so as to be vertically rotatable.

【0018】上記支軸部3d、即ち、連結軸3の回動支点
は、コンタクト2における第1バネ部2dと第2バネ部2e
との連結部分2fから所定長さだけ離間せしめて設ける。
The support shaft portion 3d, that is, the rotation support point of the connecting shaft 3 is the first spring portion 2d and the second spring portion 2e of the contact 2.
It is provided so as to be separated from the connecting portion 2f for connecting the and a predetermined length.

【0019】カバー4は上記収容スペース1aに連通する
中央開口4aを備えると共に、その開口4aにおける対抗す
る二つの側辺に沿う部分に上記多数のコンタクト2の列
を覆う被装部4bを設け、且つその被装部4bの左右両側面
を下方に延出せしめて袴部4cを形成し、該袴部4c内面に
外側へ傾斜する傾斜面4dを設けたもので、その傾斜面4d
が上記支軸部3dの外周に摺接するをもってベース部材1
に上方から被せた状態で昇降自在に支持される。上記連
結軸3、カバー4は各々絶縁材にて一体成形する。
The cover 4 has a central opening 4a communicating with the accommodating space 1a, and a mounted portion 4b for covering the row of the large number of contacts 2 is provided at a portion of the opening 4a along two opposing sides. Further, both left and right side surfaces of the mounted portion 4b are extended downward to form a hakama portion 4c, and an inclined surface 4d inclined outward is provided on the inner surface of the hakama portion 4c.
Has a sliding contact with the outer periphery of the support shaft portion 3d, and the base member 1
It is supported so that it can be raised and lowered while being covered from above. The connecting shaft 3 and the cover 4 are integrally formed of an insulating material.

【0020】ICパッケージPは周知な構造のもので、
上述の収容スペース1a内に収容状に載置される本体P1の
側縁に、略Z型に折曲した接点(リード)P2を多数並列
状に備える。
The IC package P has a well-known structure,
A large number of contact points (leads) P2 bent in a substantially Z shape are provided in parallel at the side edge of the main body P1 that is placed in a storage state in the storage space 1a described above.

【0021】而して、以上の構成からなる本実施例ソケ
ットによれば、コンタクト2における第1バネ部2d及び
第2バネ部2eの弾力が接触部2aを下方へ押圧する方向に
作用して、接点P2に対する接触部2aの接触圧,カバー4
の押し下げ操作の際の操作荷重及びその操作寿命等を所
定に維持しつつ、ICパッケージPのより確実な挟持能
力が得られる(図3参照)。
Thus, according to the socket of this embodiment having the above-described structure, the elastic force of the first spring portion 2d and the second spring portion 2e of the contact 2 acts in the direction of pressing the contact portion 2a downward. , Contact pressure of contact part 2a against contact P2, cover 4
A more reliable holding capability of the IC package P can be obtained while maintaining the operating load and the operating life during the pushing down operation of the IC package (see FIG. 3).

【0022】また、ICパッケージPの着脱に際しては
図2に示すように、上記カバー4の押し下げ操作により
傾斜面4dが支軸部3dを下方内側へ押圧し、これにより連
結軸3が外側へ回動し係合面部3bが突起後部2hを下方内
側へ押圧して第1バネ部2dを縮小変形させると同時に、
係合凹部3aが突起2gを下方外側へ押圧して第2バネ部2e
を上方外側へ回動させ、コンタクト2の接触部2aがバネ
部の弾力に抗して外側へ変異するをもってICパッケー
ジPの着脱を無負荷で行い得る(図2参照)。
When the IC package P is attached or detached, as shown in FIG. 2, the inclined surface 4d pushes the support shaft portion 3d downward and inward by pushing down the cover 4, whereby the connecting shaft 3 rotates outward. The engaging surface portion 3b pushes the rear portion 2h of the protrusion downwardly and inwardly to deform the first spring portion 2d, and at the same time,
The engaging recessed portion 3a pushes the protrusion 2g downwardly and outwardly, and the second spring portion 2e
Is rotated upward and outward, and the contact portion 2a of the contact 2 is displaced outward against the elasticity of the spring portion, so that the IC package P can be attached and detached without load (see FIG. 2).

【0023】その際、バネ部が前述の形状であることに
加えて、連結軸3の回動支点(即ち、支軸部3d)が遊点
であることから、図4中に矢印X1 で示すように変異初
期においては接触部2aがほぼ垂直方向へ上昇し、その
後、同図中に矢印X2 で示すように斜め外方へ変異して
ICパッケージP接点P2から離間する。しかもその離間
量W1,W2 は、回動支点が定点である場合(W’)に比
べ長く且つ高くなるので、ICパッケージ接点P2の変形
不良を引き起こすような虞れなく上記挟持能力が得られ
る。
At that time, in addition to the spring portion having the above-mentioned shape, the rotation fulcrum of the connecting shaft 3 (that is, the fulcrum shaft portion 3d) is a free point, so that it is indicated by an arrow X1 in FIG. As described above, in the initial stage of mutation, the contact portion 2a rises in a substantially vertical direction, and thereafter, as shown by an arrow X2 in the figure, the contact portion 2a is obliquely outwardly diverged and separated from the IC package P contact P2. In addition, the distances W1 and W2 are longer and higher than when the rotation fulcrum is a fixed point (W '), so that the clamping ability can be obtained without fear of causing defective deformation of the IC package contact P2.

【0024】また夫々のコンタクト2が、突起2gと係合
凹部3a、突起後部2hと係合面部3bの夫々の係合により連
結軸3に連係することから、例えばそれらコンタクト2
の列の中の任意の1本のバネ特性が低減したとしてもコ
ンタクト2列全体のバネ特性によりその低減を補助し
て、接点P2との接触不良を防止することができる。
Further, since each contact 2 is linked to the connecting shaft 3 by the engagement of the projection 2g and the engagement recess 3a and the engagement of the projection rear portion 2h and the engagement surface portion 3b, for example, the contacts 2
Even if the spring characteristic of any one of the rows is reduced, the spring characteristic of the entire two rows of contacts can assist the reduction and prevent the contact failure with the contact P2.

【0025】[0025]

【発明の効果】本発明に係るICパッケージ用ソケット
は以上説明したように構成したので、コンタクト接触部
を内側下方へ付勢せしめてICパッケージのより確実な
挟持能力を得る。同時に、ICパッケージの着脱に際し
ては、接触部がほぼ垂直方向へ上昇し後に斜め外方へ変
異してICパッケージ接点から離間するので、ICパッ
ケージ接点の変形不良を引き起こす虞れなく前記挟持能
力を得られる。
Since the IC package socket according to the present invention is constructed as described above, the contact contact portion is biased inward and downward to obtain a more reliable holding ability of the IC package. At the same time, when the IC package is attached or detached, the contact portion rises in a substantially vertical direction and then diverges obliquely outward and separates from the IC package contact, so that the sandwiching ability can be obtained without causing a deformation defect of the IC package contact. To be

【0026】従って、多数のコンタクトにおける夫々の
接触部をカバーの押し下げ操作で同時に外側へ変異させ
てICパッケージの着脱を無負荷で行い得ると共に、接
点に対する接触部の接触圧力、カバーの押し下げ操作の
際の操作荷重及びその操作寿命、ICパッケージの確実
な挟持能力等の全ての点に優れた効果を奏するICパッ
ケージ用ソケットを提供し得た。
Therefore, the contact portions of a large number of contacts can be simultaneously outwardly changed by pushing down the cover to attach / detach the IC package without load, and the contact pressure of the contact portion with respect to the contact and the pushing operation of the cover can be suppressed. It has been possible to provide a socket for an IC package, which has excellent effects in all respects, such as the operating load at that time, the operating life thereof, and the reliable gripping ability of the IC package.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明ICパッケージ用ソケットの一実施例に
おける要部の拡大断面図。
FIG. 1 is an enlarged cross-sectional view of a main part of an embodiment of an IC package socket of the present invention.

【図2】図1に示すソケットの待機状態を示す要部拡大
断面図。
FIG. 2 is an enlarged sectional view of an essential part showing a standby state of the socket shown in FIG.

【図3】図1に示すソケットのICパッケージセット状
態を示す要部拡大断面図。
3 is an enlarged cross-sectional view of a main part showing an IC package set state of the socket shown in FIG.

【図4】図3の要部拡大図。FIG. 4 is an enlarged view of a main part of FIG.

【図5】図1に示すソケットのカバーを外して示す外観
斜視図。
5 is an external perspective view showing the socket shown in FIG. 1 with a cover removed.

【図6】図1に示すソケットの外観斜視図。6 is an external perspective view of the socket shown in FIG.

【図7】レバーを有する従来ソケットにおける要部の拡
大断面図。
FIG. 7 is an enlarged cross-sectional view of a main part of a conventional socket having a lever.

【図8】直押し式の従来ソケットにおける要部の拡大断
面図。
FIG. 8 is an enlarged cross-sectional view of a main part of a direct-pressing type conventional socket.

【符号の説明】[Explanation of symbols]

1:ベース部材 1a:収容スペース 2:コンタ
クト 2a:接触部 2b:平板部 2d:第1バ
ネ部 2e:第2バネ部 2g:突起 2h:突起後
部 3:連結軸 3a:係合凹部 3b:係合面
部 3d:支軸部 4:カバー 4d:傾斜面
1: Base member 1a: Storage space 2: Contact 2a: Contact part 2b: Flat plate part 2d: First spring part 2e: Second spring part 2g: Projection 2h: Projection rear part 3: Connection shaft 3a: Engagement recess 3b: Engagement Mating part 3d: Spindle part 4: Cover 4d: Sloping surface

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 ベース部材に設けた収容スペースの側辺
に沿って、前記収容スペースに収容せるICパッケージ
の接点との接触部と、該接触部を内側へ付勢して前記接
点との接触圧をうるバネ部とを備えたコンタクトを並列
状に多数配置すると共に、それらコンタクトの列に沿っ
て配した連結軸を各コンタクトに連係せしめ、ベース部
材に被装したカバーの押し下げ操作で前記連結軸が回動
してコンタクトの接触部を上記バネ部の弾力に抗し外側
へ変異させICパッケージ接点から離間させるようにし
たICパッケージ用ソケットであって、 上記コンタクトはベース部材上に載置せる平板部の内側
縁から上方内側へ延ばし更に外側へ折り返した湾曲状の
第1バネ部と、該第1バネ部先端から内側へ折り返して
上記接触部に連続する第2バネ部と、該第2バネ部の上
面に突出する突起を具備し、他方連結軸は前記突起との
係合凹部と、突起後部との係合面部と、左右両端に突出
する支軸部を備え、さらに上記カバーには前記支軸部に
摺接して連結軸を外側へ回動させる傾斜面を設けてなる
ことを特徴とするICパッケージ用ソケット。
1. A contact portion with a contact of an IC package accommodated in the accommodating space along a side of the accommodating space provided in the base member, and a contact with the contact by urging the contact portion inward. A large number of contacts each having a spring portion capable of exerting pressure are arranged in parallel, and a connecting shaft arranged along the row of the contacts is linked to each contact, and the connection is performed by pushing down a cover mounted on the base member. An IC package socket in which a shaft is rotated to diverge a contact portion of a contact to an outer side against an elastic force of the spring portion so as to be separated from an IC package contact, the contact being placed on a base member. A curved first spring portion that extends upward from the inner edge of the flat plate portion and folds back outward, and a second spring portion that folds inward from the tip of the first spring portion and continues to the contact portion. A projection protruding on the upper surface of the second spring portion, and the other connecting shaft includes an engaging concave portion with the projection, an engaging surface portion with a rear portion of the projection, and a support shaft portion protruding at both left and right ends, An IC package socket, wherein the cover is provided with an inclined surface that is in sliding contact with the support shaft portion to rotate the connecting shaft outward.
JP10417993A 1993-04-30 1993-04-30 Socket for ic package Pending JPH06314583A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10417993A JPH06314583A (en) 1993-04-30 1993-04-30 Socket for ic package

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10417993A JPH06314583A (en) 1993-04-30 1993-04-30 Socket for ic package

Publications (1)

Publication Number Publication Date
JPH06314583A true JPH06314583A (en) 1994-11-08

Family

ID=14373792

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10417993A Pending JPH06314583A (en) 1993-04-30 1993-04-30 Socket for ic package

Country Status (1)

Country Link
JP (1) JPH06314583A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003163063A (en) * 2001-11-26 2003-06-06 Enplas Corp Socket for electric part
KR100513178B1 (en) * 1996-09-30 2005-11-08 에프씨아이 Socket for connecting integrated circuit to printed wiring board

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100513178B1 (en) * 1996-09-30 2005-11-08 에프씨아이 Socket for connecting integrated circuit to printed wiring board
JP2003163063A (en) * 2001-11-26 2003-06-06 Enplas Corp Socket for electric part

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