JPH0628223B2 - Pattern printing method - Google Patents

Pattern printing method

Info

Publication number
JPH0628223B2
JPH0628223B2 JP60181817A JP18181785A JPH0628223B2 JP H0628223 B2 JPH0628223 B2 JP H0628223B2 JP 60181817 A JP60181817 A JP 60181817A JP 18181785 A JP18181785 A JP 18181785A JP H0628223 B2 JPH0628223 B2 JP H0628223B2
Authority
JP
Japan
Prior art keywords
pattern
mask
long
divided
region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60181817A
Other languages
Japanese (ja)
Other versions
JPS6243125A (en
Inventor
洋 新開
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP60181817A priority Critical patent/JPH0628223B2/en
Publication of JPS6243125A publication Critical patent/JPS6243125A/en
Publication of JPH0628223B2 publication Critical patent/JPH0628223B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【発明の詳細な説明】 [発明の分野] 本発明は、パターン焼き付け方法に関し、特に長尺基板
上へのパターンの重ね焼きあるいは分割露光に適したパ
ターン焼き付け方法に関する。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a pattern printing method, and more particularly to a pattern printing method suitable for overprinting or division exposure of a pattern on a long substrate.

[発明の背景] 半導体製造工程のリソグラフィプロセスにおいて、マス
クを用いてパターンを基板上に焼付け転写するパターン
焼付装置が用いられている。近年、基板の大口径化や大
型の液晶表示板の製造に対処するため基板に転写すべき
パターンを分割して露光焼付を行うパターン焼付装置が
開発されている。
BACKGROUND OF THE INVENTION In a lithographic process of a semiconductor manufacturing process, a pattern printing apparatus that prints and transfers a pattern onto a substrate using a mask is used. In recent years, a pattern printing apparatus has been developed which divides a pattern to be transferred onto a substrate and performs exposure printing in order to cope with an increase in the diameter of the substrate and the production of a large-sized liquid crystal display panel.

[従来の技術] 従来の大型液晶表示板電極製造用の長尺パターン焼付装
置の構成を第5図,第6図により説明する。回転テーブ
ル3上に搭載した長尺基板4上に結像光学系2を介して
マスク1aのパターンAを露光し焼付ける(第5図)。次
に、第6図に示すように、マスク1aを別のパターンBが
形成されたマスク1bと交換する。回転テーブル3を180
゜回転し、長尺基板4上のパターンAを焼付けた部分の
隣接部を結像光学系2の光軸上に配置しパターンBを焼
付ける。従来は、このようにして長尺基板4上にパター
ンA,Bを分割して順番に露光焼付けしていた。
[Prior Art] The structure of a conventional long pattern printing apparatus for manufacturing electrodes of a large-sized liquid crystal display panel will be described with reference to FIGS. The pattern A of the mask 1a is exposed and baked on the long substrate 4 mounted on the rotary table 3 through the imaging optical system 2 (FIG. 5). Next, as shown in FIG. 6, the mask 1a is replaced with the mask 1b on which another pattern B is formed. 180 turntable 3
The pattern B is printed by rotating the substrate by an angle of ∘ and arranging an adjacent portion of the pattern A on the long substrate 4 on the optical axis of the imaging optical system 2. Conventionally, the patterns A and B are divided and sequentially exposed and printed on the long substrate 4 in this manner.

しかながら、上記従来のパターン焼付装置においては、
分割したパターンを各別のマスクに形成し、パターン毎
にマスクを交換して露光,焼付を行っていたため、マス
ク交換のための時間を要し生産性を低下させ、またマス
クが複数枚となるためマスク管理も面倒なものであっ
た。
However, in the above conventional pattern printing apparatus,
Since the divided patterns are formed on different masks and the masks are exchanged for each pattern to perform exposure and printing, it takes time for the masks to be replaced, resulting in a decrease in productivity and a plurality of masks. Therefore, mask management was also troublesome.

[発明の目的] 本発明は、前記従来技術の欠点に鑑みなされたものであ
って、分割露光する場合のマスク交換作業を不要として
生産性を向上させかつ1枚のマスク上に分割パターンを
形成可能としてマスク管理を容易にしたパターン焼き付
け方法の提供を目的とする。
[Object of the Invention] The present invention has been made in view of the above-mentioned drawbacks of the prior art, and improves productivity by eliminating the mask replacement work in the case of divided exposure and forms a divided pattern on one mask. It is an object of the present invention to provide a pattern printing method that facilitates mask management as much as possible.

この目的を達成するため本発明では、長尺パターンを長
手方向に関して複数に分割することにより該長尺パター
ンの一部分を成す比較的短い第1分割パターンと第2分
割パターンを用意し、結像光学系により該第1分割パタ
ーンを長尺基板の第1領域に焼き付けた後で該結像光学
系により該第2分割パターンを該長尺基板の長手方向に
関して該第1領域に隣接する第2領域に焼き付ける段階
を含む、長尺基板に長尺パターンを焼き付けるためのパ
ターン焼き付け方法において、前記第1、第2分割パタ
ーンを前記長尺パターンの長手方向に垂直な方向に並べ
たマスクを用い、前記マスクの前記第1分割パターンと
前記長尺基板の前記第1領域の位置合わせを行なって前
記第1分割パターンを前記第1領域に焼き付けた後、前
記マスクを前記長尺パターンの長手方向に垂直な方向に
移動させることにより前記マスクの第2分割パターンと
前記結像光学系の位置合わせを行なうと共に前記マスク
の前記第2分割パターンと前記長尺基板の前記第2領域
の位置合わせを行なって前記第2分割パターンを前記第
2領域に焼き付けることを特徴とする。
To achieve this object, according to the present invention, a relatively short first division pattern and second division pattern that form a part of the long pattern are prepared by dividing the long pattern into a plurality of pieces in the longitudinal direction. A second region adjacent to the first region in the longitudinal direction of the elongated substrate by the imaging optical system after the first segmented pattern is printed on the first region of the elongated substrate by a system. In a pattern printing method for printing a long pattern on a long substrate, including a step of baking, a mask in which the first and second divided patterns are arranged in a direction perpendicular to a longitudinal direction of the long pattern is used. After the first division pattern of the mask and the first region of the long substrate are aligned and the first division pattern is printed on the first region, the mask is formed into the long region. The second division pattern of the mask is aligned with the imaging optical system by moving the pattern in a direction perpendicular to the longitudinal direction of the pattern, and the second division pattern of the mask and the second region of the long substrate. And the second division pattern is printed on the second area.

これによれば、長尺パターンを構成する第1、第2分割
パターンを長尺パターンの長手方向に垂直な方向に並べ
たマスクを用いてパターン焼き付けを行うようにしてい
るため、長尺パターンを構成する各分割パターンを同一
のマスクに形成してもマスクは比較的短いものとなる。
したがって、露光装置を大型化することなく、マスクの
交換が不要となり、あるいはマスク交換の頻度が低減す
る。
According to this, since the pattern is printed using the mask in which the first and second divided patterns forming the long pattern are arranged in the direction perpendicular to the longitudinal direction of the long pattern, the long pattern is formed. Even if each of the constituent divided patterns is formed on the same mask, the mask becomes relatively short.
Therefore, it is not necessary to replace the mask without increasing the size of the exposure apparatus, or the frequency of mask replacement is reduced.

[実施例] 以下、図面により本発明の実施例について説明する。第
1図および第2図に本発明に係るパターン焼き付け方法
を実施するパターン焼付装置の構成を示す。この装置
は、第3図に示すようなパターンA,Bを長尺基板4上
に分割して焼付けるものである。分割したパターンA,
Bを相互に逆向きに同一マスク1上に並列させて形成す
る。このマスク1はマスク台5上に搭載される。マスク
台5の下部には結像光学系2を介して回転テーブル3が
配設される。回転テーブル3上にパターンA,Bを焼付
けるべき長尺基板4が搭載される。マスク5は、ラック
ピニオン機構6を介してモータ7に連結され、矢印Cの
ように、マスク搭載面と平行方向に往復移動可能であ
る。
Embodiments Embodiments of the present invention will be described below with reference to the drawings. 1 and 2 show the configuration of a pattern printing apparatus for carrying out the pattern printing method according to the present invention. This apparatus divides and prints patterns A and B as shown in FIG. 3 on a long substrate 4. Divided pattern A,
B are formed in parallel on the same mask 1 in opposite directions. The mask 1 is mounted on the mask table 5. A rotary table 3 is disposed below the mask table 5 via an imaging optical system 2. The long substrate 4 on which the patterns A and B are to be printed is mounted on the rotary table 3. The mask 5 is connected to the motor 7 via the rack and pinion mechanism 6 and can reciprocate in a direction parallel to the mask mounting surface as indicated by an arrow C.

このようなパターン焼付装置を用いた長尺基板の分割露
光は以下のようにして行われる。まず、第1図に示すよ
うに、パターンAを結像光学系2の露光位置(光軸上)
に合せ、このパターンAを長尺基板4上に露光して焼付
ける。次にモータ7を駆動しラックピニオン機構6を介
してマスク台5を移動し、パターンBを結像光学系2の
露光位置に合せる(第2図)。回転テーブル3を180゜
回転し、長尺基板4のパターンAに隣接した部分を照射
位置に合せこの部分にパターンBを露光して焼付ける。
このようにして、第3図に示すような長尺基板4上への
パターンA,Bの分割露光焼付けが行われる。
Division exposure of a long substrate using such a pattern printing apparatus is performed as follows. First, as shown in FIG. 1, the pattern A is exposed at the exposure position (on the optical axis) of the imaging optical system 2.
The pattern A is exposed and baked on the long substrate 4. Next, the motor 7 is driven to move the mask table 5 via the rack and pinion mechanism 6 to align the pattern B with the exposure position of the image forming optical system 2 (FIG. 2). The rotary table 3 is rotated 180 °, the portion of the long substrate 4 adjacent to the pattern A is aligned with the irradiation position, and the pattern B is exposed and baked on this portion.
In this manner, the divided exposure printing of the patterns A and B on the long substrate 4 as shown in FIG. 3 is performed.

第4図に、本発明に係るパターン焼付装置を用いて重ね
焼きを行う場合の手順を示す。パターン7a,7b,7c(パ
ターン形状は図示しない)が1枚のマスク1上に形成さ
れ、このマスク1がマスク台(図示しない)上に搭載さ
れる。結像光学系2の下方照射位置に長尺基板8が配置
される。最初にパターン7aが長尺基板8上に焼付けられ
る(第4図(a))。次にマスク台を駆動してマスク1
を移動しパターン7bを長尺基板8上に重ねて焼付ける。
(第4図(b))。次にマスク台を駆動してマスク1を
さらに移動しパターン7cを長尺基板8上に重ねて焼付け
る(第4図(c))。このようにして長尺基板の全面一
括焼付を重ね焼きにより行うことができる。
FIG. 4 shows a procedure for carrying out overprinting using the pattern printing apparatus according to the present invention. Patterns 7a, 7b, 7c (pattern shapes are not shown) are formed on one mask 1, and this mask 1 is mounted on a mask table (not shown). The elongated substrate 8 is arranged at the irradiation position below the imaging optical system 2. First, the pattern 7a is printed on the long substrate 8 (FIG. 4 (a)). Next, the mask base is driven to drive the mask 1.
Is moved and the pattern 7b is overlaid on the long substrate 8 and baked.
(Fig. 4 (b)). Next, the mask base is driven to further move the mask 1 and the pattern 7c is overlaid on the long substrate 8 and baked (FIG. 4 (c)). In this way, the entire surface of the long substrate can be collectively baked by the repeated baking.

なお、前記実施例においては、マスク台駆動機構として
モータおよびラックピニオン機構を用いたが他の適当な
手段(シリンダ,ベルト等)を用いてもよい。あるいは
手動でマスク台を移動させてもよい。
In the above embodiment, the motor and the rack and pinion mechanism are used as the mask table driving mechanism, but other suitable means (cylinder, belt, etc.) may be used. Alternatively, the mask table may be moved manually.

[発明の効果] 以上説明したように本発明によれば、長尺パターンを構
成する第1、第2分割パターンを長尺パターンの長手方
向に垂直な方向に並べたマスクを用いてパターン焼き付
けを行うようにしているため、長尺パターンを構成する
各分割パターンを同一のマスクに形成してもマスクを比
較的短くすることができる。したがって、露光装置を大
型化することなく、マスク交換を不要とし、あるいはマ
スク交換の頻度を低減することができる。
[Effects of the Invention] As described above, according to the present invention, pattern printing is performed using a mask in which first and second divided patterns forming a long pattern are arranged in a direction perpendicular to the longitudinal direction of the long pattern. Since this is done, the mask can be made relatively short even if each divided pattern forming the long pattern is formed on the same mask. Therefore, it is possible to eliminate the need for mask replacement without increasing the size of the exposure apparatus, or to reduce the frequency of mask replacement.

【図面の簡単な説明】[Brief description of drawings]

第1図および第2図は各々本発明に係るパターン焼付装
置による分割露光の各別の工程を示す説明図、第3図は
第1図および第2図で示す分割露光工程により形成され
たパターンを有する長尺基板の上面図、第4図は本発明
に係るパターン焼付装置を用いた重ね焼き工程の説明
図、第5図および第6図は各々従来のパターン焼付装置
による分割露光の各別の工程を示す説明図である。 1……マスク、2……結像光学系、3……回転テーブ
ル、4……長尺基板、5……マスク台、6……ラックピ
ニオン機構、7……モータ、8……長尺基板。
FIG. 1 and FIG. 2 are explanatory views showing respective separate steps of divided exposure by the pattern printing apparatus according to the present invention, and FIG. 3 is a pattern formed by the divided exposure step shown in FIG. 1 and FIG. FIG. 4 is a top view of a long substrate having a pattern, FIG. 4 is an explanatory view of an overprinting process using the pattern printing apparatus according to the present invention, and FIGS. It is explanatory drawing which shows the process of. 1 ... Mask, 2 ... Imaging optical system, 3 ... Rotating table, 4 ... Long substrate, 5 ... Mask base, 6 ... Rack and pinion mechanism, 7 ... Motor, 8 ... Long substrate .

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】長尺パターンを長手方向に関して複数に分
割することにより該長尺パターンの一部分を成す比較的
短い第1分割パターンと第2分割パターンを用意し、結
像光学系により該第1分割パターンを長尺基板の第1領
域に焼き付けた後で該結像光学系により該第2分割パタ
ーンを該長尺基板の長手方向に関して該第1領域に隣接
する第2領域に焼き付ける段階を含む、長尺基板に長尺
パターンを焼き付けるためのパターン焼き付け方法にお
いて、前記第1、第2分割パターンを前記長尺パターン
の長手方向に垂直な方向に並べたマスクを用い、前記マ
スクの前記第1分割パターンと前記長尺基板の前記第1
領域の位置合わせを行なって前記第1分割パターンを前
記第1領域に焼き付けた後、前記マスクを前記分割パタ
ーンの長手方向に垂直な方向に移動させることにより前
記マスクの第2分割パターンと前記結像光学系の位置合
わせを行なうと共に前記マスクの前記第2分割パターン
と前記長尺基板の前記第2領域の位置合わせを行なって
前記第2分割パターンを前記第2領域に焼き付けること
を特徴とするパターン焼き付け方法。
1. A relatively short first division pattern and a second division pattern which form a part of the long pattern are prepared by dividing the long pattern into a plurality of pieces in the longitudinal direction, and the first optical pattern is formed by an imaging optical system. Baking the divided pattern on the first region of the long substrate, and then baking the second divided pattern on the second region adjacent to the first region in the longitudinal direction of the long substrate by the imaging optical system. In the pattern printing method for printing a long pattern on a long substrate, a mask in which the first and second divided patterns are arranged in a direction perpendicular to a longitudinal direction of the long pattern is used, and the first of the masks is used. Dividing pattern and the first of the long substrate
After the regions are aligned and the first divided pattern is printed on the first region, the mask is moved in a direction perpendicular to the longitudinal direction of the divided pattern to bond the second divided pattern of the mask with the second divided pattern. The position of the image optical system is aligned and the second divided pattern of the mask and the second region of the long substrate are aligned to print the second divided pattern on the second region. Pattern printing method.
JP60181817A 1985-08-21 1985-08-21 Pattern printing method Expired - Lifetime JPH0628223B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60181817A JPH0628223B2 (en) 1985-08-21 1985-08-21 Pattern printing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60181817A JPH0628223B2 (en) 1985-08-21 1985-08-21 Pattern printing method

Publications (2)

Publication Number Publication Date
JPS6243125A JPS6243125A (en) 1987-02-25
JPH0628223B2 true JPH0628223B2 (en) 1994-04-13

Family

ID=16107343

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60181817A Expired - Lifetime JPH0628223B2 (en) 1985-08-21 1985-08-21 Pattern printing method

Country Status (1)

Country Link
JP (1) JPH0628223B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7362410B2 (en) 2002-10-19 2008-04-22 Lg.Philips Lcd Co., Ltd. Method for designing mask and fabricating panel
KR100698044B1 (en) 2002-10-19 2007-03-23 엘지.필립스 엘시디 주식회사 Method for designing mask and forming panel
JP5066948B2 (en) * 2007-03-06 2012-11-07 株式会社ニコン Mask holding device, mask adjustment method, exposure apparatus and exposure method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS546866B2 (en) * 1971-08-25 1979-04-02
JPS55129333A (en) * 1979-03-28 1980-10-07 Hitachi Ltd Scale-down projection aligner and mask used for this
JPS55132039A (en) * 1979-04-02 1980-10-14 Mitsubishi Electric Corp Forming method for repeated figure
JPS55165629A (en) * 1979-06-11 1980-12-24 Matsushita Electric Ind Co Ltd Manufacture of semiconductor device

Also Published As

Publication number Publication date
JPS6243125A (en) 1987-02-25

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