JPH06268364A - Method for bonding parts with solder - Google Patents

Method for bonding parts with solder

Info

Publication number
JPH06268364A
JPH06268364A JP7610593A JP7610593A JPH06268364A JP H06268364 A JPH06268364 A JP H06268364A JP 7610593 A JP7610593 A JP 7610593A JP 7610593 A JP7610593 A JP 7610593A JP H06268364 A JPH06268364 A JP H06268364A
Authority
JP
Japan
Prior art keywords
solder
hole
point
melting point
dam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7610593A
Other languages
Japanese (ja)
Inventor
Ryoji Koiso
磯 良 治 小
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Funai Electric Co Ltd
Original Assignee
Funai Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Funai Electric Co Ltd filed Critical Funai Electric Co Ltd
Priority to JP7610593A priority Critical patent/JPH06268364A/en
Publication of JPH06268364A publication Critical patent/JPH06268364A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0094Filling or covering plated through-holes or blind plated vias, e.g. for masking or for mechanical reinforcement
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3421Leaded components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457Solder materials or compositions; Methods of application thereof
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/40Forming printed elements for providing electric connections to or between printed circuits
    • H05K3/42Plated through-holes or plated via connections

Landscapes

  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PURPOSE:To prevent solder from escaping downstream in a through-hole and from stopping downstream in the lower part of a through-hole by forming a damn for substantially filling relatively high-citing-point solder in the through- hole of a printed wiring board and then bonding a solder land in the upper end of a through-hole to the lead terminal of chip parts with relatively low- melting-point solder. CONSTITUTION:Solder A of relatively high melting-point Tp is used to form a dam 20 for substantially filling the solder in the through-hole 22 of a printed wiring board 3 at the temperature of the melting-point, and after that, solder B of relatively low melting-point Tr is used to bond a solder land 4 in the upper end of the through-hole 22 to the source electrode 2 of an FET chip 1 at the temperature of the melting-point. Thereby, the solder of low melting point stops on the dam 20, that is, between the solder land 4 and the lead terminal of parts without escaping downstream in the lower part of the through-hole 22, thereby being able to surely bond them in a predetermined position.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、部品のハンダ接着方法
とりわけリフロー処理によるチップ部品のハンダ接着方
法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a solder bonding method for parts, and more particularly to a solder bonding method for chip parts by reflow processing.

【0002】[0002]

【従来の技術】マイクロ波用の高い周波数の素子、例え
ばガリウム砒素FETチップをプリント配線板にハンダ
接着する場合、図3(a)の従来のハンダ接着方法の説
明図に示すように、FETチップ1のソース電極2をそ
の根本でアースに落とすべく、全面アース6と接続され
たスルーホール孔5上端のハンダランド4とソース電極
2の根本とをハンダ接着するのが一般的である。
2. Description of the Related Art When a high frequency element for microwaves, for example, a gallium arsenide FET chip is solder-bonded to a printed wiring board, as shown in the explanatory view of the conventional solder bonding method of FIG. In order to drop the source electrode 2 of No. 1 to the ground at the root, the solder land 4 at the upper end of the through hole 5 connected to the entire surface ground 6 and the root of the source electrode 2 are generally bonded by solder.

【0003】このとき図3(b)、(c)に示すよう
に、ソース電極2の少くともFETチップ本体1に近い
エリアBを含んでハンダ接着されねばならない。図3
(b)はハンダ7がハンダランド4の上に理想的に拡が
り、ハンダ接着された場合を示しており、通常はクリー
ム半田によるリフローで処理されてハンダ付けされる様
になっている。
At this time, as shown in FIGS. 3B and 3C, the source electrode 2 must be solder-bonded including at least the area B close to the FET chip body 1. Figure 3
(B) shows a case where the solder 7 ideally spreads over the solder land 4 and is soldered thereto, and is usually processed by reflow with cream solder and soldered.

【0004】[0004]

【発明が解決しようとする課題】しかしながらクリーム
半田によるリフローで処理では、図3(d)、(e)の
ようにハンダ7の一部がスルーホール孔5を流下して逸
散するか、スルーホール孔5の下部に流下停留してハン
ダ8を形成する場合がある。
However, in the reflow process using cream solder, as shown in FIGS. 3D and 3E, a part of the solder 7 flows down through the through-hole hole 5 and escapes or passes through. There is a case where the solder 8 is formed at the lower part of the hole hole 5 by stopping to flow down.

【0005】とりわけ図3(e)のようにFETチップ
本体1から遠いエリアAでのみハンダ接着がなされ、エ
リアBでのアース接続に失敗すると、等価的に寄生イン
ダクタンスLが発生する結果、発振や利得低下の原因に
なることがあった。
In particular, as shown in FIG. 3E, when solder bonding is performed only in the area A far from the FET chip body 1 and the ground connection in the area B fails, parasitic inductance L is equivalently generated, resulting in oscillation or oscillation. This could cause a decrease in gain.

【0006】この対応策として、流下分を見越して過剰
量のクリーム半田を塗布したリフロー処理が試みられた
が、電極間や回路パターン間の短絡が発生するなど問題
があった。
As a countermeasure against this, a reflow process has been attempted in which an excessive amount of cream solder is applied in anticipation of the flow-down amount, but there is a problem such as a short circuit between electrodes or between circuit patterns.

【0007】本発明の方法はこのような課題や欠点を解
決するためなされたもので、その目的はリフロー処理に
おいて、ハンダのスルーホール孔流下による逸散やスル
ーホール孔下部での流下停留を防止でき、しかも電極間
や回路パターン間の短絡を生じることのないチップ部品
のハンダ接着方法を提供することにある。
The method of the present invention has been made to solve such problems and drawbacks, and its purpose is to prevent the escape of solder due to the flow-through of the through-holes and the retention of the flow-down at the bottom of the through-holes in the reflow process. Another object of the present invention is to provide a soldering method for a chip component, which is capable of preventing a short circuit between electrodes and between circuit patterns.

【0008】[0008]

【課題を解決するための手段】前記課題を解決するため
この発明に係る部品のハンダ接着方法は、第1の溶融点
を有するハンダを用い、該溶融点の温度にてプリント配
線板のスルーホール孔を略充填するダムを形成し、この
後、前記ハンダの溶融点より低い第2の溶融点のハンダ
を用い、該溶融点の温度にて前記スルーホール孔上端の
ハンダランドと部品のリード端子とを接着するように構
成されている。
In order to solve the above-mentioned problems, a method for soldering components according to the present invention uses a solder having a first melting point, and a through hole of a printed wiring board at a temperature of the melting point. After forming a dam that substantially fills the hole, a solder having a second melting point lower than the melting point of the solder is used, and at the temperature of the melting point, the solder land at the upper end of the through hole and the lead terminal of the component are formed. It is configured to bond and.

【0009】[0009]

【作用】比較的高溶融点のハンダにてプリント配線板の
スルーホール孔を略充填するダムを形成したのち、比較
的低溶融点のハンダを用いて、該低溶融点の温度にて前
記スルーホール孔上端のハンダランドと部品のリード端
子とを接着するが、このとき低溶融点の温度ゆえ前記ダ
ムは溶融しない。よって低溶融点のハンダはスルーホー
ル孔下方に流下逸散することなく該ダム上、即ち、ハン
ダランドと部品のリード端子の間に停留して、該ハンダ
ランドと部品のリード端子とを所定の位置にて確実に接
着する。
[Function] After forming a dam that substantially fills the through hole of the printed wiring board with a solder having a relatively high melting point, the solder having a relatively low melting point is used to perform the above-mentioned through at a temperature of the low melting point. The solder land at the upper end of the hole is bonded to the lead terminal of the component, but the dam does not melt at this time because of the low melting point temperature. Therefore, the solder having a low melting point stays on the dam, that is, between the solder land and the lead terminal of the component without flowing down to the lower portion of the through hole, and the solder land and the lead terminal of the component are separated by a predetermined amount. Securely adhere at the position.

【0010】[0010]

【実施例】以下、本発明の実施例を添付図面に基づいて
説明する。図1は本発明に係る、部品のハンダ接着方法
の処理過程流れ図、図2は図1の処理過程に対応する状
態の説明図である。まず、処理過程S1(以下、S1と
略記する。S2〜S9についても同様)にてリフロー温
度摂氏Tp度でのプレリフロー処理を開始する。
Embodiments of the present invention will be described below with reference to the accompanying drawings. FIG. 1 is a process flow chart of a method for soldering components according to the present invention, and FIG. 2 is an explanatory diagram of a state corresponding to the process of FIG. First, in the processing step S1 (hereinafter, abbreviated as S1; the same applies to S2 to S9), pre-reflow processing at a reflow temperature of Tp degrees Celsius is started.

【0011】次に、溶融点摂氏Tp度の甲ハンダ(クリ
ーム半田)をプリント配線板3に塗布し、チップ部品を
マウントせず、プリント配線板3だけをプレリフロー処
理する(図2(a))。
Next, the instep solder (cream solder) having a melting point of Tp degrees Celsius is applied to the printed wiring board 3 and the printed wiring board 3 is pre-reflow processed without mounting the chip parts (FIG. 2 (a)). ).

【0012】このプレリフロー処理の結果、スルーホー
ル孔22内に甲ハンダによるダム20が形成される(S
3)。すなわち、スルーホール孔22内は甲ハンダによ
って、ほぼ充填される。これにてプレリフロー処理が終
了する(S4)。
As a result of this pre-reflow treatment, the dam 20 is formed in the through hole 22 by the instep solder (S).
3). That is, the inside of the through hole 22 is almost filled with the instep solder. This completes the pre-reflow process (S4).

【0013】ついで、前記のリフロー温度摂氏Tp度よ
りも低い加熱温度摂氏Tr度で、リフロー処理を開始す
る(S5)。溶融点摂氏Tr度の乙ハンダ(クリーム半
田)をプリント配線板3に塗布し、FETチップ1をマ
ウントしてリフロー処理する(S6)。
Then, the reflow treatment is started at a heating temperature of Tr degrees Celsius lower than the reflow temperature of Tp degrees Celsius (S5). Second solder (cream solder) having a melting point of Tr degrees Celsius is applied to the printed wiring board 3, the FET chip 1 is mounted, and a reflow process is performed (S6).

【0014】このリフロー処理は加熱温度摂氏Tr度で
進行するから、乙ハンダは溶融するが甲ハンダは溶融し
ない。したがって、スルーホール孔22内に形成された
ダム20は溶融せず、よってスルーホール孔22まわり
の溶融乙ハンダはスルーホール孔に流入することなく、
ハンダランド上に停留する(S7)。
Since this reflow process proceeds at a heating temperature of Tr degrees Celsius, the second solder melts but the instep solder does not melt. Therefore, the dam 20 formed in the through-hole hole 22 does not melt, so that the molten solder B around the through-hole hole 22 does not flow into the through-hole hole,
Stop on the solder land (S7).

【0015】かくしてハンダランド4上に停留した溶融
乙ハンダは、ハンダランド4とソース電極(リード端
子)2を、エリアBを含んだ範囲でハンダ接着(S8)
して、このリフロー処理を終了する(S9)。21は乙
ハンダによる接着部である。
In this way, the molten second solder retained on the solder land 4 is soldered to the solder land 4 and the source electrode (lead terminal) 2 in a range including the area B (S8).
Then, the reflow process is finished (S9). Reference numeral 21 is a bonding portion made by solder B.

【0016】図2(a)はプリント配線板3のスルーホ
ール孔22に甲ハンダによるダム20が形成された状態
を示し、図1のS4に対応する。図2(b)と(c)は
リフロー処理終了(S9)での状態を示すもので、
(b)は乙ハンダによる接着部21が理想的に形成され
た状態である。一方、図2(c)はエリアBにおいてソ
ース電極2とハンダランド4とがハンダ付けされている
状態を示す図である。
FIG. 2A shows a state in which the dam 20 is formed by the instep solder in the through hole 22 of the printed wiring board 3, and corresponds to S4 in FIG. 2B and 2C show the state at the end of the reflow process (S9).
(B) is a state in which the adhesive portion 21 made of the second solder is ideally formed. On the other hand, FIG. 2C is a diagram showing a state in which the source electrode 2 and the solder land 4 are soldered in the area B.

【0017】本発明の方法によれば、処理後も甲ハンダ
によるダム20がスルーホール孔22内に残るから、温
度摂氏Tr度で再加熱することで乙ハンダを溶融除去す
れば、未溶融のダムが明らかに残存するのを確認でき
る。よって本発明の適用の有無を容易に立証できる利点
もある。
According to the method of the present invention, since the dam 20 made of the instep solder remains in the through hole hole 22 even after the treatment, if the second solder is melted and removed by reheating at a temperature of Tr degrees Celsius, the unmelted solder is not melted. You can see the dam clearly remains. Therefore, there is also an advantage that it is possible to easily prove whether or not the present invention is applied.

【0018】[0018]

【発明の効果】以上説明したようにこの発明に係る部品
のハンダ接着方法は、まず比較的高溶融点のハンダにて
プリント配線板のスルーホール孔を略充填するダムを形
成したのち、ついで比較的低溶融点のハンダを用いて、
該低溶融点の温度にて前記スルーホール孔上端のハンダ
ランドとチップ部品のリード端子とを接着するから、低
溶融点の温度ゆえ前記ダムは溶融せず、よって低溶融点
のハンダはスルーホール孔下方に流下逸散することなく
該ダム上のハンダランドと部品のリード端子の間に停留
して、該ハンダランドと部品のリード端子とを確実に接
着する。この結果、リード端子のチップ本体に近い側が
接着されるゆえ寄生インダクタンスの発生を回避でき、
よって均一な性能の回路生産が可能になる。
As described above, according to the solder bonding method for components according to the present invention, first, a dam that substantially fills a through-hole of a printed wiring board is formed with solder having a relatively high melting point, and then a comparison is made. Using a low melting point solder,
Since the solder land at the upper end of the through hole is bonded to the lead terminal of the chip component at the temperature of the low melting point, the dam does not melt due to the temperature of the low melting point, and therefore the solder at the low melting point is through hole. The solder land on the dam and the lead terminal of the component are stopped without flowing down to the bottom of the hole to securely bond the solder land and the lead terminal of the component. As a result, the side close to the chip body of the lead terminal is bonded, so that the occurrence of parasitic inductance can be avoided,
Therefore, it is possible to produce circuits with uniform performance.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のハンダ接着方法の処理過程を示す流れ
図である。
FIG. 1 is a flowchart showing a processing process of a solder bonding method of the present invention.

【図2】図1の処理過程に対応する状態の説明図であ
る。
FIG. 2 is an explanatory diagram of a state corresponding to the processing process of FIG.

【図3】従来のハンダ接着方法による状態の説明図であ
る。
FIG. 3 is an explanatory view of a state by a conventional solder bonding method.

【符号の説明】[Explanation of symbols]

1 FETチップ 2 ソース電極(リード端子) 3 プリント配線板 4 ハンダランド 22 スルーホール孔 20 甲ハンダによるダム 21 乙ハンダによる接着部 A,B エリア Tp 甲ハンダ溶融点(摂氏) Tr 乙ハンダ溶融点(摂氏) 1 FET chip 2 Source electrode (lead terminal) 3 Printed wiring board 4 Solder land 22 Through-hole hole 20 Dam by solder A 21 Bonded part by solder A A, B area Tp Solder melting point (celsius) Tr Solder melting point (celsius) Celsius)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 第1の溶融点を有するハンダを用い、該
溶融点の温度にてプリント配線板のスルーホール孔を略
充填するダムを形成し、この後、前記ハンダの溶融点よ
り低い第2の溶融点のハンダを用い、該溶融点の温度に
て前記スルーホール孔上端のハンダランドと部品のリー
ド端子とを接着することを特徴とする部品のハンダ接着
方法。
1. A solder having a first melting point is used to form a dam which substantially fills a through-hole hole of a printed wiring board at a temperature of the melting point, and thereafter, a dam lower than the melting point of the solder is formed. 2. A solder bonding method for a component, comprising using the solder having a melting point of 2 and bonding the solder land at the upper end of the through hole to the lead terminal of the component at a temperature of the melting point.
JP7610593A 1993-03-10 1993-03-10 Method for bonding parts with solder Pending JPH06268364A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7610593A JPH06268364A (en) 1993-03-10 1993-03-10 Method for bonding parts with solder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7610593A JPH06268364A (en) 1993-03-10 1993-03-10 Method for bonding parts with solder

Publications (1)

Publication Number Publication Date
JPH06268364A true JPH06268364A (en) 1994-09-22

Family

ID=13595616

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7610593A Pending JPH06268364A (en) 1993-03-10 1993-03-10 Method for bonding parts with solder

Country Status (1)

Country Link
JP (1) JPH06268364A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5822856A (en) * 1996-06-28 1998-10-20 International Business Machines Corporation Manufacturing circuit board assemblies having filled vias
JP2006098145A (en) * 2004-09-28 2006-04-13 Nippon Chemicon Corp Measuring device of electrolytic capacitor, its measuring method and measuring program
JP2010230688A (en) * 2010-07-06 2010-10-14 Nippon Chemicon Corp Method for measuring electrolytic capacitor and measurement program

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5822856A (en) * 1996-06-28 1998-10-20 International Business Machines Corporation Manufacturing circuit board assemblies having filled vias
US6127025A (en) * 1996-06-28 2000-10-03 International Business Machines Corporation Circuit board with wiring sealing filled holes
US6138350A (en) * 1996-06-28 2000-10-31 International Business Machines Corporation Process for manufacturing a circuit board with filled holes
JP2006098145A (en) * 2004-09-28 2006-04-13 Nippon Chemicon Corp Measuring device of electrolytic capacitor, its measuring method and measuring program
JP2010230688A (en) * 2010-07-06 2010-10-14 Nippon Chemicon Corp Method for measuring electrolytic capacitor and measurement program

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