JPH06251001A - Search device for arrangement problem - Google Patents

Abstract

PURPOSE:To prevent duplication of check to efficiently check the generated arrangement result by not checking check items, whose check completion is recorded by a check completion recording means, and checking check items in accordance with a prescribed check order. CONSTITUTION:Arrangement places passing a specific check item are preliminarily obtained for arrangement objects, and arrangement objects are arranged in respective places; and when an arrangement pattern is generaed, check completion of this specific check item is set by a check completion setting means 9. The check order of check items is generated by a check order generating means 6 and is stored in a check order recording means 8. A check means 3 takes the arrangement pattern from a generating means 2 as the input and does not check the check items, whose check completion is recorded in a check completion recording means 1, and checks check items in accordance with the check order of the check order recording means 8. The arrangement pattern which passes all check items is inputted to an evaluating means 4 to calculate an evaluation value, and a solution storing means 5 stores the arrangement pattern and the evaluation value in a solution recording means 11.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for performing a search in a layout problem of a given problem, and in particular, by utilizing information obtained when generating a layout result, eliminating duplication of checks and generating a generated layout. The present invention relates to a placement problem search device capable of extremely efficiently checking results.

[0002]

2. Description of the Related Art In recent years, research and development of various expert systems have been actively promoted in various fields.
Some of them have been announced as having increased processing capacity to the level of practical use, and their effectiveness is being recognized in various fields.

By the way, the placement problem of the given problem is a problem of finding the placement result with the best evaluation value for all placed objects in the place where they can be placed while satisfying the given constraints. In this case, the evaluation value is, for example, L
In the case of the SI arrangement problem, it is the length of the wiring connecting the LSIs. Further, when solving the placement problem, in order to obtain the placement result with the best evaluation value, it is necessary to generate the placement locations of all the combinations and obtain the evaluation value.

However, in reality, the number of all combinations is too large, and it takes too much time to obtain them all.

Therefore, giving up on obtaining the placement result having the best evaluation value, the combination cases to be generated are restricted so that the calculation time is within the required time, and regarding the restricted combination cases, Generation, inspection, and evaluation are performed, and the placement result with the best evaluation value among them is taken as the solution to the problem.

However, since it is complicated to limit the cases of combinations to be generated, the generation means and the inspection means are independent of each other, and even if they are generated in consideration of a certain matter at the time of generation, when they are inspected, All the inspection items are inspected, disregarding the matters considered at the time of generation.

Therefore, even if only an inspection item that passes a certain inspection item at the time of generation is generated, the inspection item that is known to pass at the time of inspection is also inspected. Since the matters taken into consideration when limiting the case are not used for inspection, duplication of inspection occurs and the efficiency of generation / inspection cannot be improved.

Further, in the conventional method, the generated layout result is inspected for all inspection items, and the order of the inspection items is constant. Therefore, no consideration is given to efficiently calculating the inspection by using the information obtained when generating the placement result during the inspection.

[0009]

As described above, conventionally, there is a problem that the generated placement result cannot be efficiently inspected.

An object of the present invention is to provide an apparatus for searching a placement problem, which can check the generated placement result extremely efficiently by using the information obtained when the placement result is generated to eliminate the duplication of the check. To provide.

[0011]

In order to achieve the above-mentioned object, in the present invention, in an apparatus for performing a search in a placement problem of a given problem, an inspection order recording means for holding the inspection order of inspection items, and Checked recording means for keeping a record of the checked items, solution recording means for recording the solution, problem input means for inputting the problem to be solved, and solution of the problem input by the problem input means And an inspection for inspecting the arrangement pattern generated by the generation means according to the inspection order of the inspection order recording means without inspecting the inspection items that have been inspected by the inspected recording means. Means, an evaluation means for calculating the evaluation value of the arrangement pattern that passes all the inspection items in the inspection means, and an arrangement for which the evaluation value is calculated in the evaluation means. The pattern is constituted by a solution storage means for storing the solution storage means.

According to another aspect of the invention for achieving the above object, in an apparatus for performing a search in a placement problem of a given problem, an inspection order generation knowledge recording means for holding generation knowledge about the order of inspection items, The inspection order recording means for holding the inspection order of the inspection items, the inspection recording means for holding the inspection completed record for each inspection item, the solution recording means for recording the solution, and the problem to be solved are input. The problem input means, the generating means for generating an arrangement pattern as a solution of the problem input by the problem input means, and the arrangement pattern generated by the generating means are inspected in the inspection recording means. Without inspection, the inspection means for inspecting according to the inspection order of the inspection order recording means, and the evaluation of the arrangement pattern that passes all the inspection items in the inspection means From the evaluation means for calculating, the solution storage means for storing the arrangement pattern for which the evaluation value is calculated in the evaluation means in the solution recording means, and the arrangement object and the arrangement location of the arrangement pattern generated by the generation means, This was taken into consideration when the inspection order of the inspection items is generated by using the inspection order generation knowledge of the generation knowledge recording means and the inspection order generation means for storing the inspection order in the inspection order recording means and the arrangement place for the arrangement object by the generation means. The inspection item is configured to include an inspection completion setting unit that records the inspection item in the inspection completion recording unit.

Here, in particular, as the above-mentioned generation means, there are an arrangement object selecting means for selecting and deciding an arrangement object from a question input by the question input means, and a place for arranging the arrangement object selected by the arrangement object selecting means. Select with a given knowledge,
Arrangement location selecting means for recording these arrangement locations in the arrangement location recording means, and an arrangement pattern for generating an arrangement pattern in which the arrangement object selected by the arrangement object selecting means is placed in the arrangement location recorded in the arrangement location recording means. It comprises a generation means and an arrangement location recording means for recording the arrangement location selected by the arrangement location selecting means.

As the inspection means, the inspection pattern read means for inputting the arrangement pattern generated by the generation means and reading the next inspection item from the inspection order recording means, and the inspection read by the inspection item read means. Input the inspected inspection means for checking whether or not the item is recorded in the inspected recording means, and the layout pattern generated by the generation means, and use the inspection knowledge for inspection items that have not been inspected by the inspected inspection means. And an inspection performing means for performing inspection.

[0015]

Therefore, in the placement problem searching apparatus of the present invention, when the placement pattern is created by the creating means, the placement location that passes the specific inspection item is found in advance for the placement object, When the arrangement pattern is generated by arranging the arrangement object at the location, the specific inspection item is inspected by the inspection completion setting means.
Then, the inspection order generation means generates the inspection order of the inspection items from the information on the arrangement objects and arrangement locations of the arrangement pattern and the inspection order generation knowledge, and stores the inspection order in the inspection order recording means.

Further, the inspection means inputs the arrangement pattern from the generation means, does not inspect the inspection items which have been inspected by the inspected recording means, and inspects them according to the inspection order of the inspection order recording means. Further, the layout pattern that has passed all the inspection items is input to the evaluation means and the evaluation value is calculated. Then, the solution storage means stores the pair of the arrangement pattern and its evaluation value in the solution recording means.

With this, the efficiency of the inspection of the generated placement result can be improved by utilizing the information obtained when the placement result is generated.

[0018]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described in detail below with reference to the drawings.

FIG. 1 is a block diagram showing an example of the overall configuration of a search device for a placement problem according to the present invention.

That is, as shown in FIG. 1, the placement problem search device of this embodiment has a problem input means 1 and a generation means 2.
An inspection means 3, an evaluation means 4, a solution storage means 5, an inspection order generation means 6, an inspection order generation knowledge recording means 7,
The inspection sequence recording means 8, the inspection completed setting means 9, the inspection completed recording means 10, and the solution recording means 11 are included.

Here, the problem input means 1 is for inputting a problem to be solved.

The generating means 2 is for generating an arrangement pattern as a solution to the problem input from the problem inputting means 1.

Further, the inspection means 3 does not inspect the arrangement pattern generated by the generation means 2 for the inspection items which have been inspected by the inspected recording means 10, but according to the inspection order of the inspection order recording means 8. It is something to inspect.

On the other hand, the evaluation means 4 calculates the evaluation value of the layout pattern which has passed all the inspection items in the inspection means 3.

Further, the solution storage means 5 stores the arrangement pattern for which the evaluation value is calculated by the evaluation means 4 in the solution recording means 11
To be stored in.

Further, the inspection order generation means 6 uses the inspection order generation knowledge of the inspection order generation knowledge recording means 7 from the arrangement objects and the arrangement locations of the arrangement pattern generated by the generation means 3 to inspect the inspection order of the inspection items. Is generated and stored in the inspection order recording means 8.

On the other hand, the inspection sequence generation knowledge recording means 7 holds the generation knowledge regarding the sequence of inspection items.

The inspection order recording means 8 holds the inspection order of inspection items.

Further, the inspected setting means 9 records in the inspected recording means 10 the inspection items taken into consideration when the generating means 2 obtains the placement location for the placed object.

The inspected recording means 10 is for holding an inspected record for each inspection item.

Furthermore, the solution recording means 11 is for recording the arrangement pattern as a solution.

FIG. 2 is a block diagram showing a detailed configuration example of the generating means 2.

That is, as shown in FIG. 2, the present generating means 2 includes an arrangement object selecting means 21 and an arrangement place selecting means 22.
An arrangement pattern generating means 23 and an arrangement location recording means 2
It consists of 4 and.

Here, the placement object selecting means 21 selects and determines the placement object from the questions input by the question inputting means 1.

The placement location selecting means 22 determines the location where the placement object selected by the placement object selecting means 21 is placed.
The predetermined knowledge, that is, the desired knowledge 25 of the airline company and the spotable spot knowledge 26, for example, are used for selection, and their arrangement locations are recorded in the arrangement location recording means 24.

Further, the arrangement pattern generating means 23 is for generating an arrangement pattern in which the arrangement object selected by the arrangement object selecting means 21 is placed at the arrangement location recorded in the arrangement location recording means 24.

Furthermore, the arrangement place recording means 24 records the arrangement place selected by the arrangement place selecting means 22.

FIG. 3 is a block diagram showing a detailed configuration example of the inspection means 3.

That is, the inspection means 3 comprises an inspection item reading means 31, an inspected inspection means 32, and an inspection execution means 33, as shown in FIG.

Here, the inspection item reading means 31 inputs the arrangement pattern generated by the generating means 2,
The next inspection item is read from the inspection order recording means 8.

The inspected inspection means 32 checks whether or not the inspection item read by the inspection item reading means 31 is recorded in the inspected recording means 10.

Further, the inspection execution means 33 is the generation means 2
By inputting the arrangement pattern generated by, the inspection knowledge 34 is used to inspect the inspection items that have not been inspected by the inspected inspection means 32.

Next, the operation of the search apparatus for the placement problem of the present embodiment configured as described above will be explained using FIG. 4 to FIG. A spot allocation system will be described as a specific example.

FIG. 4 is a diagram showing a specific example of the question given to the question inputting means 1. FIG. 4 shows a flight schedule at the airport. That is, the scheduled departure time of Flight A1 at Spot 3 is delayed, and the schedule of Flight A2 scheduled to park at Spot 3 after that flight overlaps. The problem is to create a new allocation result that eliminates this overlap.

Now, when the flight schedule as shown in FIG. 4 is input from the problem input means 1 to the generation means 2, the placement object selection means 21 finds a defect from the flight schedule in FIG. In this case, the parking schedules for the A1 and A2 flights at Spot 3 overlap. Then, if either of these two flights is moved, the overlap is eliminated. The placement object selecting means 21 first selects the flight A1 as a placement item.

Next, the placement location selecting means 22 finds the spot to which the flight A1, which is the placement object, is moved. Since the spots that can be parked are limited depending on the size of the A1 flight, there are spots that cannot be parked depending on the flight. In addition, the placement location selection means 22 determines a spot where the A1 flight can park in the size of the book, the spot knowledge 2 that can park the spot.
All are obtained from 6 and recorded in the arrangement location recording means 24.

FIG. 5 shows an example of the parkable spot knowledge 26. As a result, the arrangement location recording means 24 becomes as shown in FIG.

Further, in the placement location selecting means 22, the A1
Since the spots that can be parked were selected for the sizes of the flights, as long as the A1 flight is placed at these spots, the inspection of the sizes of the flights is unnecessary. Therefore, the placement location selection unit 22 outputs the “machine size” as the inspected inspection item to the inspected setting unit 9.

As a result, the inspected setting means 9 records the "machine size" in the inspected recording means 10.

FIG. 7 shows an example of recorded contents in the inspected recording means 10.

Next, the placement object determining unit 21 outputs the placement item “A1 flight” to the inspection order generating unit 6.

As a result, the inspection order generation means 6 uses the rules shown in FIG. 8 written in the inspection order knowledge 7 and the default inspection order knowledge shown in FIG. To generate.

Here, the meaning of the rule in FIG. 8 is "if there is a request from the airline company, make the inspection item first". Further, it can be understood from the request knowledge 25 of the airline company as shown in FIG. 10 that the A1 flight is a flight of the A company and there is a request of the A company (request of the airline company). Therefore, the inspection item of "request of airline" is first. The order of the remaining inspection items follows the default order as shown in FIG. FIG. 11 shows an example of the order of inspection items for flight A1 obtained as a result.

Next, in the arrangement pattern generating means 23, a pattern in which the A1 flight selected by the arrangement selecting means 21 is arranged in the spots recorded in the arrangement location recording means 24 is sequentially made, and the inspection means 3 is used. Output to. in this case,
Since the first value "3" spot of the arrangement location recording means 24 as shown in FIG. 6 is the spot where the A1 flight is currently scheduled to be parked, the arrangement pattern for the 3rd spot is not created, and the following 4 An arrangement pattern arranged in the spot number is generated.

FIG. 12 shows an example of the arrangement pattern. As shown in FIG. 12, the arrangement pattern is composed of a pair of a flight number and a spot name which is an arrangement place.

Next, the inspection means 3 performs the following processing.

That is, the inspection item reading means 31 sequentially reads the inspection items from the inspection order recording means 8.
At this point, the inspection order record is as shown in, for example, FIG. 11, and the first “request of the airline company” is read and output to the inspected inspection means 32.

Next, the inspected inspection means 32 refers to the inspected recording means 10 to check whether or not the input inspection item "request of airline company" has been inspected. In this case, since the inspected recording means 10 records only the “size of the aircraft” as shown in FIG. 7, it can be seen that the “request of the airline company” has not been inspected. Therefore, the inspected inspection means 32 outputs the “request of the airline company” to the inspection execution means 33.

Next, the inspection execution means 33 inspects the inputted "request of the airline company". In this case, the spots where the flights of company A can be parked are obtained from, for example, the request knowledge 25 of the airline as shown in FIG. 10, and the spots of the arrangement pattern shown in FIG. Find out if it is a possible spot. In this case, the spot No. 4 is the spot requested by the company A, so the inspection of "request of airline" is passed.

Next, in the inspection item reading means 31,
Read out the size of the machine. In this case, in the inspected inspection means 32, since the "machine size" is recorded in the inspected recording means 8 as shown in FIG. 7, the inspection item of "machine size" has been inspected. I understand.

Next, the inspection item reading means 31 reads the inspection item "overlap". In this case, in the inspected inspection means 32, since "overlap" is not recorded in the inspected recording means 8 shown in FIG. 7, it can be seen that the inspection item of "overlap" has not been inspected yet. , And outputs the inspection item “overlap” to the inspection execution means 33.

As a result, in the inspection execution means 33, as shown in FIG.
The inspection of the inspection item “overlap” is performed on the arrangement pattern as shown in FIG. In this case, when the A1 flight of the 3rd spot is moved to the 4th spot in FIG. 4, for example, it becomes as shown in FIG. 13, and since the overlap does not occur, the inspection of “overlap” is passed.

When all the inspection items are passed in this way, the arrangement pattern as shown in FIG. 12 is output to the evaluation means 4.

Next, the evaluation means 4 calculates an evaluation value for the layout pattern that has passed all the inspection items. That is, here, the evaluation value is calculated from the time interval between the preceding and following flights at the new destination spot of the flight A1 which is the arrangement object. In this case, there is a standard time interval as a time interval between flights parked at the spot, and the evaluation value is increased as the time interval between the flights before and after is closer to the standard time interval.

That is, the calculation formula is as follows: st = standard time interval t1 = time interval with previous flight, and evaluation value e1 of time interval with previous flight
Is e1 = t1 / st (0 ≦ t1 ≦ st) st / t1 (st <t1) Similarly, the evaluation value e2 of the time interval with the rear flight is t2 = the time interval with the rear flight. , E2 = t2 / st (0 ≦ t2 ≦ st) st / t2 (st <t2) Then, the evaluation value is the evaluation value = e1 + e2.

The calculation formula of this evaluation value is such that the evaluation value becomes maximum when the time interval is equal to the standard time interval both before and after, and as the time interval becomes smaller and larger than the standard time interval, The evaluation value becomes smaller.

Finally, in the solution storage means 5, a pair of the arrangement pattern and the evaluation value as shown in FIG.
It will be stored in 1.

As described above, the placement problem search apparatus of this embodiment uses the problem input means 1 for inputting the problem to be solved and the placement pattern as the solution of the problem input from the problem input means 1. An inspection in which the generation unit 2 to be generated and the arrangement pattern generated by the generation unit 2 are inspected according to the inspection order of the inspection order recording unit 8 without inspecting the inspection items that have been inspected in the inspection completed recording unit 10. The means 3, the evaluation means 4 for calculating the evaluation value of the arrangement pattern that passes all the inspection items in the inspection means 3, and the arrangement pattern for which the evaluation value is calculated in the evaluation means 4
Solution storage means 5 to be stored in solution recording means 11 and generation means 3
The inspection order of the inspection items is generated from the arrangement object and the arrangement place of the arrangement pattern generated by the inspection order generation knowledge recording means 7 using the inspection order generation knowledge, and is stored in the inspection order recording means 8. Means 6, inspection order generation knowledge recording means 7 for holding generation knowledge about the order of inspection items, inspection order recording means 8 for holding inspection order of inspection items, and generation means 2 for arrangement objects. Inspected setting means 9 for recording inspected recording means 10 the inspection items taken into consideration when determining the placement location, inspected recording means 10 for holding an inspected record for each inspection item, and as a solution. And the solution recording means 11 for recording the arrangement pattern.

Therefore, the inspection items taken into consideration when generating the arrangement pattern are recorded so that the inspection items are not inspected in the inspection of the generated arrangement pattern, that is, the information obtained when generating the arrangement result is used. Since it is possible to omit the duplication of the inspection, it is possible to inspect the generated placement result extremely efficiently.

In the above embodiment, the inspection order generation means 6, the inspection order generation knowledge recording means 7, and the inspection completion setting means 9 are used.
However, these elements are not essential to the present invention and may be provided as necessary.

In the above embodiment, the case where the present invention is applied to the spot allocation system has been described, but it goes without saying that the present invention is not limited to this.

[0072]

As described above, according to the present invention, the inspection order recording means for holding the inspection order of the inspection items, the inspection completed recording means for holding the inspection completed record for each inspection item, and the solution recording A solution recording means for solving the problem, a problem input means for inputting a problem to be solved, a generating means for generating an arrangement pattern as a solution of the problem input by the problem input means, and an arrangement pattern generated by the generating means. The inspection means that does not inspect the inspection items that have been inspected by the inspected recording means, and inspects the inspection pattern according to the inspection order of the inspection order recording means, and the evaluation value of the arrangement pattern that passes all the inspection items in the inspection means. The evaluation means for calculating and the solution storing means for storing the arrangement pattern for which the evaluation value is calculated by the evaluating means are stored in the solution recording means, and further, if necessary, the inspection pattern is detected. From the inspection order generation knowledge recording means that holds the generation knowledge about the order of the items, and the arrangement object and the arrangement location of the arrangement pattern generated by the generation means, the inspection order generation knowledge of the inspection order generation knowledge recording means is used to inspect the inspection items. Inspection order generating means for generating the inspection order of and storing it in the inspection order recording means, and the inspection setting for recording the inspection items taken into consideration when obtaining the arrangement location for the arrangement object by the generating means in the inspection completed recording means. Since it is configured by including a means, a placement problem search device capable of performing inspection of the generated placement result extremely efficiently by using the information obtained at the time of generation of the placement result to eliminate duplication of the check. Can be provided.

[Brief description of drawings]

FIG. 1 is a block diagram showing an embodiment of a placement problem searching apparatus according to the present invention.

FIG. 2 is a block diagram showing a detailed configuration example of a generation unit in the embodiment.

FIG. 3 is a block diagram showing a detailed configuration example of an inspection unit in the embodiment.

FIG. 4 is a diagram showing a specific example of a flight schedule given to the problem inputting means in the embodiment.

FIG. 5 is a diagram showing an example of parking spot knowledge in the embodiment.

6 is a diagram showing an example of an arrangement location recording unit in FIG.

7 is a diagram showing an example of an inspected recording means in FIG.

FIG. 8 is a diagram showing an example of a rule which is a means of inspection order generation knowledge in the embodiment.

FIG. 9 is a diagram showing an example of a default inspection order, which is one means of inspection order generation knowledge in the embodiment.

FIG. 10 is a diagram showing an example of knowledge required by an airline company in the embodiment.

FIG. 11 is a diagram showing an example of an inspection order recording unit in the embodiment.

FIG. 12 is a diagram showing an example of an arrangement pattern in the embodiment.

13 is a diagram showing an example of an allocation result which is a solution in which the arrangement pattern of FIG. 12 is reflected in the flight schedule of FIG.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 ... Question input means, 2 ... Generation means, 21 ... Arrangement selection means, 22 ... Arrangement location selection means, 23 ... Arrangement pattern generation means, 24 ... Arrangement location recording means, 25 ... Aircraft company required knowledge, 26 ... Parking Opportunity spot knowledge, 3 ... Inspection means, 3
1 ... inspection item reading means, 32 ... inspected investigation means,
33 ... Inspection execution means, 4 ... Evaluation means, 5 ... Solution storage means,
6 ... Inspection order generation means, 7 ... Inspection order generation knowledge recording means, 8 ... Inspection order recording means, 9 ... Inspected setting means, 1
0 ... Inspected recording means, 11 ... Solution recording means.

Claims (4)

[Claims] 1. An apparatus for performing a search in a placement problem of a given problem, an inspection order recording means for holding an inspection order of inspection items, and an inspected recording means for holding an inspected record for each inspection item, Solution recording means for recording a solution, problem input means for inputting a problem to be solved, generation means for generating an arrangement pattern as a solution of the problem input by the problem input means, and generation means for the generation means An inspection unit that inspects the arranged pattern according to the inspection order of the inspection order recording unit without inspecting the inspection items that have been inspected by the inspection completed recording unit, and all the inspection items in the inspection unit. The evaluation means for calculating the evaluation value of the passed layout pattern, and the layout pattern for which the evaluation value is calculated by the evaluation means are recorded as the solution record. Searching device placement problem that characterized in that it comprises a solution storing means for storing the stage, the. 2. An apparatus for performing a search in a placement problem of a given problem, an inspection order generation knowledge recording means for holding generation knowledge about an inspection item order, and an inspection order recording means for holding an inspection order of inspection items. , An inspection recording means for holding a record of inspection for each inspection item, a solution recording means for recording a solution, a problem input means for inputting a problem to be solved, and an input by the problem input means A generation unit that generates an arrangement pattern as a solution to the problem, and the arrangement pattern generated by the generation unit is not inspected for the inspection items that have been inspected in the inspection recording unit, and the inspection sequence recording unit Inspecting means for inspecting in accordance with the inspection order, and evaluating means for calculating the evaluation value of the arrangement pattern that passes all the inspection items in the inspecting means. The inspection sequence generation knowledge is obtained from a solution storage unit that stores an arrangement pattern whose evaluation value is calculated by the evaluation unit in the solution recording unit, and an arrangement object and an arrangement location of the arrangement pattern generated by the generation unit. The inspection order of the inspection items is generated by using the inspection order generation knowledge of the recording means, and the inspection order generation means for storing the inspection order in the inspection order recording means and the case where the generation means obtains the arrangement place for the arrangement object are considered. An arrangement problem searching device, comprising: an inspection setting means for recording inspection items in the inspection recording means. 3. The arrangement means includes an arrangement object selecting means for selecting and determining an arrangement object from a question input by the question inputting means, and a place for arranging the arrangement object selected by the arrangement object selecting means. Arrangement location selecting means for selecting these arrangement locations in the arrangement location recording means by using predetermined knowledge, and an arrangement recorded in the arrangement location recording means for the arrangement selected by the arrangement object selecting means. 3. The arrangement pattern generating means for generating an arrangement pattern placed at a place, and the arrangement location recording means for recording the arrangement location selected by the arrangement location selecting means, according to claim 1 or 2. A search device for placement problems. 4. The inspection means inputs the arrangement pattern generated by the generation means,
Inspection item reading means for reading out the next inspection item from the inspection sequence recording means, and inspected inspection means for checking whether or not the inspection item read out by the inspection item reading means is recorded in the inspected recording means. , Input the arrangement pattern generated by the generation means,
The apparatus for searching a placement problem according to claim 1 or 2, further comprising: an inspection execution unit that executes inspection using inspection knowledge for inspection items that have not been inspected by the inspected inspection unit.