JPH0553937A - System for testing peripheral equipment - Google Patents

Abstract

PURPOSE:To reduce memory capacity required for a test, to omit a processing for preparing an expected value and to reduce processing time for comparing data read from peripheral devices. CONSTITUTION:A peripheral device defining means 21 defines peripheral devices 9a-9d while combining the two devices as one pair and allocates write data areas and read data storage areas to the defined peripheral devices. A use data storage area table 22 stores data area information used for writing and reading data to the peripheral devices. A write data preparing means 23 prepares data to be written in the peripheral devices. A data comparing means 24 compares the data read from the two paired peripheral devices and judges the success or failure of the peripheral devices.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a peripheral device testing method, and more particularly to a peripheral device testing method for writing the same data to a plurality of peripheral devices, reading the data, comparing the data with each other, and testing the plurality of peripheral devices. Regarding test method.

[0002]

2. Description of the Related Art Conventionally, in a test of a peripheral device such as a magnetic disk device, the write data, the read data, and the expected value area of the read data are secured for one peripheral device and the write data The expected value of the read data was created. And
After the input / output processing is completed, the read data of the expected value is compared for each peripheral device to determine the pass / fail.

[0003]

In the above-described conventional peripheral device testing method, write data areas, read data areas, and expected read data areas must be prepared for the number of peripheral devices to be tested. Since a large amount of storage capacity is required and the write data creation and the expected value of the read data are created and the read data and the expected value are compared after the input / output processing, the number of input / output processing is large. It had the drawback of requiring time.

An object of the present invention is to reduce the storage capacity required for the test, omit the process of creating the expected value, and reduce the comparison processing time of the data read from the peripheral device. To provide.

[0005]

A peripheral device test method according to the present invention is a peripheral device test method for simultaneously testing a plurality of peripheral devices used in an information processing system, comprising:
At least one write data area for storing data to be written to the peripheral device, (B) a plurality of read data storage areas for storing data to be read from the peripheral device, (C)
From the peripheral devices, two peripheral devices are taken out to form one set, and the write data area for storing data to be written in the two peripheral devices is determined for each set of the peripheral devices, and Peripheral device defining means for determining, for each set of peripheral devices, the read data storage regions for reading and storing the data read from the write data region and written in the two peripheral devices, (D) the peripheral device Write data creating means for creating data to be written to (E) a used data storage area table for storing test data relating to the peripheral devices defined as peripheral devices forming a set by the peripheral device defining means, (F) ) Data read from a first peripheral device of the set of peripheral devices defined by the peripheral device defining means, and a set of peripheral devices defined by the peripheral device defining means. The second compares the data read from the peripheral device, if the read data does not match, reject the determined data comparing means the peripheral device of the,
Is configured.

[0006]

Embodiments of the present invention will now be described with reference to the drawings.

FIG. 1 is a block diagram showing an embodiment of a test system for a peripheral device according to the present invention. FIG. 2 is an explanatory diagram showing a write data area and a read data storage area set in the storage device shown in FIG. FIG. 3 is an explanatory diagram showing the configuration of the used data storage area table shown in FIG.

As shown in FIG. 1, the peripheral device test method of this embodiment stores data used for testing the information processing device 1 and peripheral devices 9a to 9d having a test program for executing the test. Storage device 4, information processing device 1
Connected to the I / O processor 5 for writing and reading data to and from the peripheral device, and data to the peripheral devices 9a to 9d connected to the I / O processor 5 through the channels 6a and 6b and the channels 6c and 6d. It is composed of peripheral processing units 7 and 8 for writing and reading data.

In addition, the information processing apparatus 1 includes the peripheral devices 9a to 9a.
Two peripheral devices are taken out from 9d to make one set, and 2
The write data areas 27a to 27c shown in FIG. 2 for storing the data to be written in the peripheral devices are determined for each set of peripheral devices, and the two peripheral devices are read from the write data areas 27a to 27c. The peripheral device definition means 21 for determining the read data storage areas 28a to 28f shown in FIG. 2 for each set of peripheral devices for reading and storing the data written to the peripheral devices 9a to 9d is created. 3, the peripheral device numbers 33 and 35 and the group number 3 shown in FIG. 3 defined by the write data creating means 23 and the peripheral device defining means 21.
1, a write data area number 32 for storing data to be written in the test target peripheral device, and read data storage area numbers 34, 3 for storing data read from the test target peripheral device.
6, a data read area from a first peripheral device of the set of peripheral devices defined by the peripheral device defining means 21, and a used data storage area table 22 for storing 6 and the peripheral device defining means 21. Second of a set of peripherals
Data read from the peripheral device, and if the read data do not match, the data comparing means 24 for judging the peripheral device as a failure, the input / output process of writing / reading data to / from the peripheral device It is composed of input / output operation instruction means 25 for instructing the device 5.

Each means constituting the information processing apparatus 1 is realized by the operation of a built-in test program.

The storage device 4 also includes peripheral devices 9a-9d.
And a read data storage area for storing the data read from the peripheral devices 9a to 9d.

Next, the operation will be described.

FIG. 4 is a flow chart showing an example of the processing flow of the information processing apparatus shown in FIG.

Here, a case where a test is performed using the peripheral devices 9a to 9d connected to the input / output processing device 5 will be described.

In FIG. 1, the peripheral device defining means 21 defines two test target peripheral devices among the peripheral devices 9a to 9d to be tested as one set. For example, the first set is a set of peripheral devices 9a and 9b, and the second set is a set of peripheral devices 9c and 9d.

Next, the peripheral device defining means 21 first sets the read data storage area 28a in the first set of peripheral devices 9a.
The read data storage area 28b is assigned to the peripheral device 9b, the read data storage area 28c is assigned to the second set of peripheral devices 9c, and the read data storage area 28d is assigned to the peripheral device 9d.
Assign Similarly, the peripheral device definition means 21
The first set of peripheral devices has a write data area 27a
The write data area 27b is allocated to the peripheral device of the group (step 51 in FIG. 4).

Next, the write data creating means 24 stores the data to be written in the first set of peripheral devices 9a and 9b in the write data area 27a, and the second set of peripheral devices 9c and 9b.
The data to be written in d and the data written in d are respectively created in the write data area 27b (step 52).

Next, the input / output operation instructing means 25 causes the data in the write data area 27a in the first set to be stored in the peripheral device 9a (step 53), and the same data written in the peripheral device 9a to be used in the peripheral device. Write to 9b (step 5)
4) Also in the second set, the data in the write data area 27b is written in the peripheral device 9c (step 53), and the same data written in the peripheral device 9c is also written in the peripheral device 9d (step 54). .. That is, 2 used in the same set
The same data will be written in the peripheral devices of the stand.

Next, in the first set, the data of the peripheral device 9a is read out and transferred to the data storage area 28a by the input / output operation instructing means 25 (step 55), and the data of the peripheral device 9b is read out to store the data. The data of the peripheral device 9c is read and transferred to the data storage region 28c in the second set (step 56), and the data of the peripheral device 9d is transferred to the read data storage region 28d in the second set. (Step 56).

After the transfer from the first set of peripheral devices to the read data storage area is completed, the data comparing means 24 makes the first
In the set, the read data in the read data storage area 27a read from the peripheral device 9a and the read data in the read data storage area 28b read from the peripheral device 9b are compared. In the second set, the read data in the read data storage area 27c read from the peripheral device 9c is compared with the read data in the read data storage area 28d read from the peripheral device 9d (step 57). The pass / fail of the peripheral device to be tested is determined (step 58).

As described above, first, two peripheral devices to be tested are selected to form one set, and the same data is written to the two peripheral devices forming the one set, and then the peripheral devices from each peripheral device are written. By reading and storing data in separate data storage areas and then reading and comparing these data, when testing multiple peripheral devices at once, the storage capacity required for the test can be reduced and the expected value can be reduced. Can be omitted, and the comparison processing time of the data read from the peripheral device can be reduced.

In step 58, when a comparison error occurs and the test ends abnormally, one of the two peripheral devices has an abnormal operation. It is necessary to test each one.

[0023]

As described above, according to the peripheral device test method of the present invention, first, two peripheral devices to be tested are selected to form one set, and the two peripheral devices forming the one set are selected. After writing the same data, read the data from each peripheral device into different data storage areas and store them, and then read and compare these data to reduce the storage capacity required for the test. It is possible to omit the processing for creating the data and to reduce the comparison processing time of the data read from the peripheral device.

[Brief description of drawings]

FIG. 1 is a configuration diagram showing an embodiment of a test system for a peripheral device of the present invention.

FIG. 2 is an explanatory diagram showing a write data area and a read data storage area set in the storage device shown in FIG.

FIG. 3 is an explanatory diagram showing a configuration of a used data storage area table shown in FIG.

FIG. 4 is a flowchart showing an example of a processing flow of the information processing apparatus shown in FIG.

[Explanation of symbols]

 1 Information Processing Device 4 Storage Device 5 Input / Output Processing Device 6a to 6d Channels 7 and 8 Peripheral Processing Device 9a to 9d Peripheral Device 21 Peripheral Device Definition Means 22 Used Data Storage Area Table 23 Write Data Creation Means 24 Data Comparison Means 25 Input Output operation instruction means 27a to 27c Write data area 28a to 28f Read data storage area

Claims (2)

[Claims] 1. A peripheral device test method for simultaneously testing a plurality of peripheral devices used in an information processing system, comprising: (A) at least one write data area for storing data to be written in the peripheral device; ) A plurality of read data storage areas for storing data read from the peripheral device, (C) Two peripheral devices are taken out from the peripheral device to form a set, and the two peripheral devices are written to the two peripheral devices. The read data for determining the write data area for storing the data for each set of the peripheral devices, and reading the data read from the write data area and written in the two peripheral devices and storing the read data, respectively. Peripheral device defining means for determining a storage area for each set of peripheral devices; (D) Write data creating means for creating data to be written in the peripheral device; (E) Peripheral device defining means A usage data storage area table for storing test data relating to the peripheral device defined as a peripheral device forming a group, and (F) a first peripheral device of the set of peripheral devices defined by the peripheral device defining means. Data read from the device,
Data that is compared with the data read from the second peripheral device of the set of peripheral devices defined by the peripheral device defining means, and if the read data do not match, the peripheral device is determined to be unacceptable. Peripheral device test method characterized by comprising a comparison means. 2. The test method for a peripheral device according to claim 1, wherein the test data relating to the peripheral device includes the number and group number of the peripheral device, and the write data in which data to be written to the test target peripheral device is stored. A test method for a peripheral device, comprising: a data area number; and a read data storage area number in which data read from the test target peripheral device is stored.