JP2908296B2 - Inspection method of storage device - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a storage device inspection method, and more particularly, to a storage device inspection method for simultaneously inspecting a plurality of storage devices.

[0002]

2. Description of the Related Art Conventionally, this type of storage device inspection system is based on:
For example, as disclosed in Japanese Patent Application Laid-Open No. 61-153882, it is used for efficiently determining whether a storage device is good or bad.

Referring to FIG. 5, which is a block diagram showing an example of a conventional test method for a storage device, the conventional method is as follows.
A magnetic disk medium 7 for storing data, a head unit 8 for reading / writing the data from / to the magnetic disk medium 7, and a head unit 8 positioned at a predetermined position on the magnetic disk medium 7; A magnetic disk drive 6 including a head control circuit 9 for performing a verification check or the like for writing and reading the data on the magnetic disk medium 7 and comparing the written data with the read data; A control unit 10 for designating a cylinder to be inspected in the magnetic disk medium 7 and controlling an inspection method, and sequentially writes data in a plurality of cylinders provided in the magnetic disk medium 7 in cylinder units. When the writing is completed, the written data is read and a verify check is performed to thereby check the magnetic disk. And to determine the good or bad of the device 6.

[0004]

In the above-described conventional inspection method of a storage device, the magnetic disk device 6 as a storage device is inspected one by one. In addition, there is a problem that the counting of the inspection results is manually performed, so that a counting error occurs and the counting takes time.

[0005] An object of the present invention is to eliminate such a conventional drawback, so that even if the number of inspections is large, inspection can be performed in the inspection time of one storage device, and the total of inspection results can be accurately and timely calculated. It is an object of the present invention to provide a storage device inspection method which can be performed without multiplying the storage device.

[0006]

According to the present invention, there is provided an inspection method of a storage device, wherein a plurality of storage devices capable of writing and reading data and storing the data, and an adjacent storage device among the plurality of storage devices are provided. A plurality of comparison units provided between the corresponding storage devices and calculating the respective data read from the adjacent storage devices and outputting the calculation results; and After the data is written, the data is read, and the read data is calculated by the comparison unit provided between the adjacent storage devices, and the pass / fail of the plurality of storage devices is determined from the calculation result. a control unit for outputting a determination result of Sico, the
An inspection method of a storage device provided, wherein the control unit includes:
Whether the storage device is good or bad is temporarily determined based on the operation result of the comparing unit.
After the determination, the storage device temporarily determined to be defective
Reading the data and storing the read data and the storage
By comparing the written data to the device,
The pass / fail of the storage device is determined.

[0007]

Further, the control unit of the storage device inspection method of the present invention instructs each of the plurality of storage devices to execute the data writing method and the data reading method. I have.

In the storage device inspection method according to the present invention, the comparing section stores one of the data read from each of the adjacent storage devices having the comparing section therebetween. A first buffer, a second buffer for storing the other of the respective data, and calculating the one data stored in the first buffer and the other data stored in the second buffer And a reporting unit that obtains the calculation result of the calculation unit and reports the calculation result to the control unit.

[0010]

Next, an embodiment of the present invention will be described with reference to the drawings.

FIG. 1 is a block diagram showing one embodiment of a test method of a storage device according to the present invention.

In this embodiment shown in FIG. 1, a plurality of storage devices 11 which can write and read data and store the data, such as a magnetic disk device and an optical disk device, are provided.
From the plurality of storage devices 11 to the storage device 1N (here, 2 ≦ N ≦ 100 or less, preferably 20).
N of the plurality of comparison units 21 provided between adjacent storage devices of N and comparing the respective data read from the respective storage devices of these adjacent storage devices and outputting the comparison result. Here, M = N-1)
And writing the data from the plurality of storage devices 11 to the respective storage devices of the storage device 1N and then reading the data from the plurality of storage devices 11 to the respective storage devices of the adjacent storage devices among the storage devices 1N. The respective data read from the devices are compared by the comparing unit 21 to the comparing unit 2M provided between the adjacent storage devices, and based on the result of the comparison, the plurality of storage devices 11 to the storage devices 1N The control unit 3 determines a defect and outputs the result of the determination. The plurality of storage devices 1
Each of the storage devices 1 to 1N includes a storage medium 111 for storing the data, a head unit 112 for reading and writing the data on the storage medium 111, and a head unit 112 for storing the data on the storage medium 111. And a head controller for reading / writing the data from / to the storage medium by the head 112.

Next, the operation of the inspection method of the storage device of the present invention will be described in detail with reference to FIGS. 2, 3 and 4.

FIG. 2 is a diagram showing a configuration of a comparison unit of the inspection system of the storage device according to the present invention, wherein the comparison unit stores the respective storages of the two adjacent storage devices provided with the comparison unit therebetween. The data read from the storage device P (here, 11 ≦ P ≦ 1N−1) among the respective data read from the device is stored in the first buffer 211 and read from the storage device P + 1. The data stored in the second buffer 212 is stored in the second buffer 212, and the data stored in the first buffer 211 is stored in the second buffer 212.
The data stored in No. 2 is compared by the calculation unit 213, and whether the respective data match or mismatch is output from the report unit 214 to the control unit 3 as a comparison result.

FIG. 3 is a diagram showing a tentative determination method of the storage device. Based on the respective comparison results of the successive comparison sections 2Q and 2R, a continuous comparison section is provided between these sections. This shows a temporary good / bad determination method for the storage devices 1Q, 1R, and 1T (where 2 ≦ M, and Q, R, and T are each 1 ≦ Q).
.Ltoreq.M-1, R = Q + 1, T = Q + 2). Note that M
In the case of = 1, the comparison unit is only the comparison unit 21, and the storage devices are the storage device 11 and the storage device 12.
When the comparison result of 1 indicates a match, both the storage devices 11 and 12 are good, and when the comparison result of the comparison unit 21 indicates a mismatch, both the storage device 11 and the storage device 12 are defective.

FIG. 4 is a flowchart showing the operation of the inspection method of the storage device according to the present invention.

As shown in FIG. 4, when the test is started, the control unit 3 writes the data to be written from the storage device 11 to each storage device of the storage device 1N and the data to be written in each of the storage devices to write this data. The cylinder number indicating the cylinder provided in the storage medium 111 and the position in the cylinder indicated by the cylinder number are output (S1). The storage device 1N from the storage device 11 inputs the data output in step 1 (S1), the cylinder number, and the position in the cylinder, and stores the input data in the cylinder indicated by the cylinder number. (S2).

Here, the data shown in the step 1 (S1) and the step 2 (S2) is, for example, 16
Indicated by decimal numbers are inspection data such as 55H, FFH, and AAH. In the above-described step 1 (S1) and step 2 (S2), when writing the data to the storage device, the control unit 3 writes the data, the cylinder number, and the cylinder indicated by the cylinder number. The data is written in a certain position of one cylinder by outputting the position in the storage device to the storage device. However, it is not necessary to be particular about this, and the control unit 3 controls all the positions of one cylinder, It is also possible to output all positions of several cylinders continuous from a certain cylinder, all positions of all cylinders, etc., and write the data in the storage device in accordance with this instruction.

Next, from the storage device 11 to the storage device 1N
It is checked whether or not the writing of the data to all the storage areas has been completed (S3). If the checked result indicates that the writing has not been completed, the control is continued following the step 1 (S1). On the other hand, if the result of the check in step 3 (S3) indicates that the writing has been completed, the control unit 3 controls the cylinder for reading the data written from the storage device 11 to each storage device of the storage device 1N. Is output (S4). The storage device 11
The storage device 1N receives the output cylinder number and reads the data from the cylinder indicated by the cylinder number (S5).

Next, as shown in FIG. 2, each of the comparators 21 to 2M is read from the cylinders of two storage devices adjacent to each other with the comparator interposed therebetween. Data is collectively input to the first buffer and the second buffer in units of cylinders, respectively, and these data are compared by the arithmetic unit 213. A comparison result indicating a match or a mismatch is obtained. The result is output from the report unit 214 to the control unit 3 (S6).

In the step 5 (S5) and the step 6 (S6), the data is read out in units of cylinders and stored in the buffers. However, if the storage capacity of each buffer is small, a unit smaller than the unit of cylinders is used. The processing of the data may be performed at the same time, and when the storage capacity of each buffer is large, the processing of the data may be performed in units of several cylinders.

Next, the control unit 3 receives the comparison results from the respective comparison units, and temporarily identifies a defective storage device based on the comparison results as shown in FIG. 3 (S7). In the process of tentatively specifying a defective device, if a storage device is determined to be defective even once, the device is tentatively specified as a defective device.

Next, it is checked whether or not the comparison of the data with respect to all the storage areas of the respective storage devices has been completed (S8). If the result of the comparison indicates that the comparison of the data has not been completed, the step S8 is executed. 4 (S4) and control is continued. On the other hand, if the result of the check in step 8 (S8) indicates that the comparison of the data has been completed, the control unit 3 re-reads the data from all the storage devices temporarily specified as defective in step 7 (S7). Is read and compared with the written data, and when the comparison result does not match, the storage device is determined as a defective device (S9), and the inspection result indicating the good / bad determination is made into a list or the like. The number of storage devices inspected up to this point and the number of good / defective devices are reported to the host device in a table or the like (S10).

[0024]

As described above, according to the storage device test method of the present invention, the data stored in a plurality of storage devices can be compared in parallel by a plurality of comparison units.
Even if the number of storage devices to be inspected is large, the inspection can be performed in the inspection time of one storage device, and the control results are totaled by the control unit 3, so that the totaling of the inspection results can be performed accurately and without taking much time. Can be done.

[Brief description of the drawings]

FIG. 1 is a block diagram showing one embodiment of a storage device inspection method according to the present invention.

FIG. 2 is a diagram illustrating a configuration of a comparison unit of an inspection method of a storage device according to the present invention.

FIG. 3 is a diagram illustrating a temporary determination method of a storage device.

FIG. 4 is a flowchart showing the operation of the inspection method of the storage device of the present invention.

FIG. 5 is a block diagram illustrating an example of a conventional storage device inspection method.

[Explanation of symbols]

 Reference Signs List 3 control unit 6 magnetic disk device 7 magnetic disk medium 8 head unit 9 head unit control circuit 10 control device 11 to 1N storage device 21 to 2M comparison unit 111 storage medium 112 head unit 113 head unit control unit 211 first buffer 212 first Second buffer 213 Operation unit 214 Report unit

Continued on the front page (51) Int.Cl. ⁶ Identification code FI G11B 20/18 572 G11B 20/18 572F

Claims (3)

(57) [Claims] 1. A plurality of storage devices capable of writing and reading data and storing the data, and a plurality of storage devices provided between adjacent storage devices of the plurality of storage devices. A plurality of comparison units for calculating the respective data read from the device and outputting the calculation results, and reading and then reading the data after writing the data in each of the plurality of storage devices A control unit that causes the comparison unit provided between the adjacent storage devices to calculate the data, determines good / bad of the plurality of storage devices from the calculated result, and outputs the determination result;
An inspection method of the storage device including: the control unit , wherein the control unit determines the storage device based on a calculation result of the comparison unit.
After tentatively determining whether the device is good or bad, it was tentatively determined to be defective.
Read the data from the storage device and read the data
Check the data against the data written to the storage device
A storage device inspection method for determining whether the storage device is good or defective . 2. The storage device according to claim 1, wherein the control unit instructs a method of writing the data and a method of reading the data to each of the plurality of storage devices. Inspection method. A first buffer for storing one of the respective data read from the respective storage devices of the adjacent storage devices provided with the comparison unit between the first buffer and the first buffer; A second buffer that stores the other of the data, an operation unit that operates the one data stored in the first buffer, and the other data stored in the second buffer, The storage device inspection method according to claim 1, further comprising: a report unit that obtains a calculation result and reports the calculation result to the control unit.