JPH0660561A - Inspection system for magnetic disk device - Google Patents

Abstract

PURPOSE:To provide an inspection system making the analog inspection of a head disk assembly(HDA) efficient. CONSTITUTION:An initializing command is issued to the control circuit 5a of an HDD 5 by an evaluation inspecting device 7, respective sectors S0 to S(m-1) are selected in sequence by a write command, an analog testing signal is written into the DATA parts of the selected sectors and the ID parts of the non-selected sectors are stored in a memory as defect. Then, by a read command, the ID parts and the DATA parts of the respective selected sectors are read, the processing of the reading signals of the ID parts is inhibited by imparting an inhibit command to the evaluation inspecting device, an analog inspection is operated for the testing signals read from the DATA parts and the inspection is carried out for each track of each disk in sequence. Thus, the period of the analog inspection for the HDA is shortened greater than before.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection method for a magnetic disk device, and more particularly to an analog inspection method for a magnetic disk driver having a magnetic disk pack mounted thereon.

[0002]

2. Description of the Related Art Hard magnetic disks used in computer systems are subjected to various inspections during the manufacturing process. 2 (a), the track T _R of a number of concentric circles on the hard magnetic disk (hereinafter simply referred to as disk) 1
And a track format is set for each track T _R. The track format is each track T
_R starts from the index (IND) and the gap G
Is divided into a plurality of m sectors S _{0 to} S (m-1). Roughly speaking procedure verification setting the track format of the disk, the first veneer inspection apparatus, an analog test signal for each track T _R of the disk 1 is a write / read, and the signal waveform missing, Errors such as springs (extra) and modulation are checked in an analog manner. As shown in FIG. 2B, a disk for which the single-plate inspection has been completed is formed by stacking a plurality of n disks to form a disk pack 2, and a head disk assembly (HD disk) is formed by the magnetic head group 3 corresponding to each disk.
A) 4 is constructed. The disk pack 2 is mounted on the spindle 5a of the hard disk driver (HDD) 5 and rotates, and analog test signals are written / read to / from each disk in the same manner as in the above-described single plate test, and the HDA 4 is tested in an analog manner. It When this is completed, the evaluation inspection device initializes the track format for each track T _{R of} each disk. FIG. 2 (c) shows a developed view of the track format, in which each sector S ₀
Each of S to S (m-1) is composed of an ID section that stores an ID code for identification such as a sector number and a control signal, and a data (DATA) section that stores data.
Digital test data is written / read to / from the ATA unit, and a final digital evaluation test is performed on the HDA 4.

In the above-described analog inspection of the HDA4, initially, the evaluation / inspection device can directly write / read the analog test signal to / from the HDA4, and the inspection is performed without any problem. However, in the recent HDD 5, the control becomes a heavy load on the host computer due to the higher density of the disk and the faster access time of data, and in order to reduce this, the SCSI (Small Computer System)・
Interface) and other international standards have been established. In accordance with this standard, the HDD 5 is provided with a control circuit composed of a small computer (microprocessor) to make the interface so-called intelligent, and a macro command command is given to the control circuit rather than a host computer to perform fine control. The method in which the control circuit shares is adopted. Therefore, writing / reading of the test signal cannot be performed easily. That is, since the command command for writing / reading data is limited to only writing / reading for the DATA part of the selected sector, writing / reading for the ID part is not possible, and therefore the analog inspection for the entire circumference of the track is performed. Can not be done.

In order to solve the above problems, the inventor of the present invention filed a patent application for an inspection method for performing an analog inspection on the entire circumference of a truck, which was filed on October 17, 1988, 63-249.
No. 978, Inspection method of magnetic disk device "has been published. An outline of the inspection method according to the above patent publication will be described with reference to FIG. In FIG. 3A, the HDD 5 is made intelligent by providing the control circuit (CONT) 5b described above. In the analog inspection, instead of the host computer (H.CPU) 6 for the HDD 5, the evaluation inspection device 7 is connected to the bus. H attached to HDD5
Since the DA4 and CONT5b are already connected by a cable, the HDA4 for extracting the IND signal of each disk
The wiring F is connected to the evaluation / inspection device 7. The evaluation / inspection device 7 issues a write command to the CONT 5b according to the input IND signal, and each sector S shown in (b).
_An analog test signal is written in the DATA section of _{0 to} S (m-1), a read command is issued in the next one revolution of the disk, and this is read to perform the first analog inspection (# 1 test in the figure). . Next, a delayed IND signal is generated by delaying an appropriate number of bytes from the time when the above IND signal is detected, and a write command and a read command are issued to write / write an analog signal to / from the ID part and the DATA part adjacent thereto. Reading is performed and an analog test (# 2 test in the figure) is performed. Since the inspection areas # 1 and # 2 overlap each other, the entire circumference of the track is inspected without omission.

[0005]

In response to the recent increase in demand for magnetic disk devices, it is required to review the above inspection method and improve the inspection efficiency.
On the other hand, when the conventional inspection procedure is examined, each disk is subjected to the analog inspection by the single plate inspection.
A second analog test for DA4 seems to be duplicated. However, the latter includes the HDA 4 including the magnetic head group 3.
This is a test for evaluating the analog characteristics of, and there are some differences between the two. However, upon further examination, if the sector can be selected by the write command or the read command command, the ID part should be correct. If the sector cannot be selected, the ID part of the sector may have an error. Therefore, when a sector is selected, analog inspection is performed on the DATA portion.
If the sector cannot be selected, the analog inspection is omitted because there is an error in the ID part. It is an object of the present invention to provide a test method that makes the HDA analog test more efficient, based on the above idea.

[0006]

SUMMARY OF THE INVENTION The present invention is a magnetic disk device inspection method that achieves the above object, wherein an evaluation inspection device issues an initialization command to a control circuit of an HDD in which a disk pack is mounted. Then, the track format including a plurality of sectors is initialized for each disc. After this is completed, each sector is sequentially selected by a write command command, an analog test signal is written in the DATA section of the selected sector, and the ID section of the unselected sector is stored as a defect in the memory. Then, in the next one revolution of the disc, the read command command reads the ID part and DATA part of each sector selected above,
An inhibit command is given to the evaluation / inspection device to inhibit the processing of the read signal from the ID section, and an analog test is performed on the test signal read from the DATA section.

[0007]

In the above inspection method, for each disk of the disk pack mounted on the HDD, the control circuit sequentially selects each track by the initialization command command from the evaluation and inspection device to initialize the track format. . When this is completed, the control circuit sequentially selects each sector of the track format by the write command command, and the analog test signal is written in the DATA section of the selected sector. If there is a sector that is not selected, it is determined that there is an error in the ID section and the sector is stored in the memory. Then, in the next one revolution of the disk, the read command command reads the ID part and DATA part of each of the selected sectors. The evaluation inspection apparatus processes the read signal of the ID part by the inhibit command command. Is prohibited, the analog test is performed only on the analog test signal read from the DATA section. As described above, the analog inspection time for the HDA is significantly shortened as compared with the conventional case.

[0008]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows an embodiment of the present invention, (a) is a schematic block diagram for analog inspection, and (b) is an explanatory diagram of an inspection range and an inspection procedure. In Fig. 1 (a), H
The DD 5 and the H.CPU 6 are the same as those shown in FIG. 3 (a), and similarly, the evaluation inspection device 7 is connected to the bus line instead of the H.CPU 6. However, in this case, it is not necessary to change the connection of the wiring F in FIG. In the analog inspection on the HDA 4, each of the disks 1-1, 1-2, to 1-n of the disk pack 2 mounted on the HDD 5 (Fig. 2 (b))
In response to an initialization command from the evaluation / inspection device 7, the control circuit 5b successively selects each track T _R to initialize the track format. When this is completed, the write command causes the control circuit 5b to cause each sector S _{0 to} S (m-
1) are sequentially selected. Assuming that the sector S ₀ is selected in FIG. 1B, the analog test signal sent from the evaluation / inspection device 7 is written to the DATA portion of S ₁ . On the other hand, if the next S ₁ is not selected, it is determined that the ID part has an error, the sector number S ₁ is stored in the memory 7a, and the writing of the test signal to the DATA part is omitted. Writing such a test signal and storing a defective sector is a
The rotation is sequentially performed for each sector S _{0 to} S (m-1). Then, in the next one rotation of the disk, the ID portion and the DATA portion of each sector selected above are read out and transferred to the evaluation inspection device 7 by the control of the control circuit 5b by the read command. In the evaluation / inspection device 7, processing of the read signal of the ID section is prohibited by the inhibit instruction, and an analog test is performed on the analog test signal read from the DATA section. The above analog inspection is sequentially performed for each track of each disk, the number of the defective sector is stored, and the inspection is omitted.
By performing only the analog inspection on the DATA portion of the good sector, the inspection time for the HDA 4 can be significantly shortened compared to the conventional case.

[0009]

As described above, in the inspection method according to the present invention, since each disk mounted on the intelligent HDD has a defective ID portion of the track format set for each track, it is The sector number is stored, the inspection is omitted, and only the analog inspection is performed on the DATA portion to greatly reduce the inspection time as compared with the conventional case, and there is a great contribution to the analog inspection for the HDA.

[Brief description of drawings]

FIG. 1 shows an embodiment of the present invention, (a) is a schematic block configuration diagram of an inspection circuit, and (b) is an explanatory diagram of an inspection range and an inspection procedure.

2A is a configuration diagram of tracks and sectors set on a magnetic disk, FIG. 2B is a configuration diagram of a head disk assembly (HDA) and a hard disk driver (HDD), and FIG. 2C is a development view of a track format. Is.

3A is a schematic configuration diagram of an inspection method of a magnetic disk device according to the patent publication, and FIG. 3B is an explanatory diagram of an inspection procedure for FIG.

[Explanation of symbols]

1, 1-1, ... 1-n, ... hard magnetic disk, disk,
2 ... Magnetic disk pack, disk pack, 3 ... Magnetic head group, 4 ... Head disk assembly (HDA) 5 ... Disk driver (HDD), 5a ... Spindle,
5b ... Control circuit (CONT), 6 ... Host computer (H / CPU), 7 ... Evaluation / inspection device, 7a ... Memory.

Claims (1)

[Claims] 1. A control circuit for controlling an input / output interface according to a command command from a host computer, and in an evaluation inspection of a disk driver having a magnetic disk pack mounted, an evaluation inspection device initializes the control circuit. A command is issued to the tracks of each magnetic disk of the magnetic disk pack to initialize a track format consisting of a plurality of sectors, and after the initialization is completed, a write data command is issued from the evaluation / inspection device to execute each of the above. Sectors are sequentially selected, an analog test signal is written in the data section of the selected sector, the ID section of the unselected sector is stored as a defect in the memory, and then,
In the next one rotation of the magnetic disk, the read data command command reads the ID part and the data part of each of the selected sectors, and gives an inhibit command to the evaluation and inspection device to read the ID part. A test method for a magnetic disk device, characterized in that processing of a signal is prohibited and an analog test is performed on the test signal read from the data section.