JPH06224445A - Static-induction semiconductor device - Google Patents

Static-induction semiconductor device

Info

Publication number
JPH06224445A
JPH06224445A JP891593A JP891593A JPH06224445A JP H06224445 A JPH06224445 A JP H06224445A JP 891593 A JP891593 A JP 891593A JP 891593 A JP891593 A JP 891593A JP H06224445 A JPH06224445 A JP H06224445A
Authority
JP
Japan
Prior art keywords
region
unit cell
semiconductor device
static
unit cells
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP891593A
Other languages
Japanese (ja)
Inventor
Masahiko Suzumura
正彦 鈴村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP891593A priority Critical patent/JPH06224445A/en
Publication of JPH06224445A publication Critical patent/JPH06224445A/en
Pending legal-status Critical Current

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  • Thyristors (AREA)
  • Junction Field-Effect Transistors (AREA)

Abstract

PURPOSE:To shorten the development time of the title semiconductor device by easily designing a mask without lowering an electric characteristic. CONSTITUTION:A static-induction semiconductor device 1 is constituted in such a way that a plurality of unit cells 3 are arranged on a semiconductor substrate 2 so as to be adjacent in the plane direction, that the inner side is used as cathode regions 11 in the surface part of the individual unit cells and that the outer side is used as gate regions 12. In the static-induction semiconductor device, shapes as viewed from the surface side of the substrate of the individual unit cells are equilateral triangles, and the gate regions surround the cathode regions.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、表面ゲート型構造を
有する静電誘導半導体装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a static induction semiconductor device having a surface gate type structure.

【0002】[0002]

【従来の技術】表面ゲート型構造を有する静電誘導半導
体装置として、従来、図7に示す構成の表面ゲート型の
静電誘導サイリスタがある。静電誘導サイリスタ51
は、半導体基板52に複数の単位セル60,60・・が
面方向に隣接して配置されており、各単位セル60の一
側の表面部分では内側がカソード領域(n+ 領域)61
であって外側がゲート領域(p+ 領域)62となってい
て、他側の表面部分がアノード領域(p+ 領域)63と
なっており、カソード領域61とアノード領域63の間
は電流通路となる高比抵抗領域(n- 領域)64であ
る。
2. Description of the Related Art As a static induction semiconductor device having a surface gate type structure, there is a surface gate type static induction thyristor having a structure shown in FIG. Static induction thyristor 51
, A plurality of unit cells 60, 60, ... Are arranged adjacent to each other in the surface direction on the semiconductor substrate 52, and the inner surface of one side of each unit cell 60 is a cathode region (n + region) 61.
And the outside is a gate region (p + region) 62, and the other surface portion is an anode region (p + region) 63. Between the cathode region 61 and the anode region 63 is a current path. Is a high specific resistance region (n region) 64.

【0003】単位セル60の基板表面側よりみた形状
(表面形状)は、図8にみるように、長方形であり、内
側のカソード領域61の両側に外側のゲート領域62が
平行に配置されたストライプ状の形となっている。この
静電誘導サイリスタ51は、オン電圧が低く、ゲート領
域とゲート電極とが半導体基板52の表面でコンタクト
しているためゲート抵抗も低くターンオフ時の高速動作
を可能とする特徴をもちパワーデバイスとしての適性の
ある半導体素子ということができる。特に、カソード領
域の単位面積当たりでみた電流容量が大きくて小さなカ
ソード面積で低オン電圧あるいは大電流容量化の実現が
可能である。
As shown in FIG. 8, the unit cell 60 has a rectangular shape (surface shape) as viewed from the substrate surface side, and stripes in which outer gate regions 62 are arranged in parallel on both sides of an inner cathode region 61. It is shaped like a shape. The static induction thyristor 51 has a low on-voltage and a low gate resistance because the gate region and the gate electrode are in contact with each other on the surface of the semiconductor substrate 52, and is capable of high-speed operation at turn-off. It can be said that the semiconductor device is suitable for. In particular, the current capacity per unit area of the cathode region is large, and it is possible to realize a low on-voltage or a large current capacity with a small cathode area.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、従来の
静電誘導サイリスタ51の場合、製造過程でゲート領域
やカソード領域を作り込む際に使用するマスクの設計が
困難である。単位セル60の表面部分でのカソード領域
とゲート領域の形が平行のストライプ状の形態の場合に
は、単位セル集合域(活性領域)の端部の処理や電極パ
ッド部での処理が困難なのである。このマスク設計の困
難性は最近のCADを用いる設計技術によっても解消さ
れない。静電誘導サイリスタの電流容量を変える場合は
単位セル集合域の違うマスクが必要となるが、この時の
マスク設計も簡単ではなくかなり困難である。
However, in the case of the conventional electrostatic induction thyristor 51, it is difficult to design the mask used for forming the gate region and the cathode region in the manufacturing process. In the case where the cathode region and the gate region on the surface of the unit cell 60 are in the form of parallel stripes, it is difficult to treat the end portion of the unit cell aggregation region (active region) or the electrode pad portion. is there. This mask design difficulty cannot be solved even by the recent design technology using CAD. When changing the current capacity of the electrostatic induction thyristor, a mask with a different unit cell assembly area is required, but the mask design at this time is also not easy and quite difficult.

【0005】この発明は、上記事情に鑑み、静電誘導半
導体装置の特徴である電気的特性の低下を伴わずにマス
クの設計が容易となり開発時間の短縮が図れる静電誘導
半導体装置を提供することを課題とする。
In view of the above circumstances, the present invention provides an electrostatic induction semiconductor device in which the mask design can be facilitated and the development time can be shortened without deteriorating the electrical characteristics that are characteristic of the electrostatic induction semiconductor device. This is an issue.

【0006】[0006]

【課題を解決するための手段】前記課題を解決するた
め、この発明の静電誘導半導体装置は、半導体基板に複
数の単位セルが面方向に隣接して配置されており、各単
位セルの表面部分では内側がカソード領域であって外側
がゲート領域である静電誘導半導体装置において、前記
単位セルの基板表面側よりみた形状が正三角形であって
ゲート領域がカソード領域を囲むように形成されている
ことを特徴とする。
In order to solve the above-mentioned problems, in the electrostatic induction semiconductor device of the present invention, a plurality of unit cells are arranged adjacent to each other in a plane direction on a semiconductor substrate, and the surface of each unit cell is In the electrostatic induction semiconductor device, in which the inside is a cathode region and the outside is a gate region, the unit cell has an equilateral triangle when viewed from the substrate surface side, and the gate region is formed so as to surround the cathode region. It is characterized by being

【0007】この発明の静電誘導半導体装置の種類とし
ては、静電誘導サイリスタの他、静電誘導トランジスタ
もあり、トランジスタの場合、普通、カソードはソース
と称し、アノードはドレインと称す。
The electrostatic induction semiconductor device of the present invention includes an electrostatic induction thyristor and an electrostatic induction transistor. In the case of a transistor, the cathode is usually called the source and the anode is called the drain.

【0008】[0008]

【作用】静電誘導半導体装置では、各単位セルの間は隙
間があるとチップサイズや特性上の不都合があるため、
基板の表面方向に隙間なく隣接させて並べてゆける形状
であることが肝要である。隙間なく並べられることが可
能となる単位セルの形状としては、基板表面側よりみた
形状が正三角形、正四角形、正六角形の3種類の形状が
ある。この発明の場合、単位セルの基板表面側よりみた
形状は正三角形であるため、基板の表面方向に隙間なく
隣接させて並べてゆけるため何ら不都合はない。
In the electrostatic induction semiconductor device, if there is a gap between the unit cells, there is a disadvantage in terms of chip size and characteristics.
It is important that the substrates have such a shape that they can be arranged side by side without any gap in the surface direction of the substrate. As the shapes of the unit cells that can be arranged without a gap, there are three kinds of shapes, namely, a regular triangle, a regular quadrangle, and a regular hexagon when viewed from the substrate surface side. In the case of the present invention, since the shape of the unit cells viewed from the substrate surface side is an equilateral triangle, the unit cells can be arranged adjacent to each other without a gap in the surface direction of the substrate.

【0009】そして、単位セルの表面部分ではカソード
領域はゲート領域により取り囲まれているため単位セル
集合域の端部での処理やパット部での処理は容易であ
る。図8の如く、単位セルの表面部分でカソード領域が
ゲート領域で完全に囲まれていない場合、単位セル集合
域の端部での処理やパット部での処理は容易でないので
ある。
Since the cathode region is surrounded by the gate region on the surface portion of the unit cell, the treatment at the end portion of the unit cell assembly region and the treatment at the pad portion are easy. As shown in FIG. 8, when the cathode region is not completely surrounded by the gate region on the surface of the unit cell, the treatment at the end of the unit cell assembly region and the treatment at the pad portion are not easy.

【0010】電流容量の変更の際も、各単位セルをつな
ぐだけで単位セル集合域の端部の状態は殆ど同じで問題
のない状態で単位セル集合域の大きさを変更し電流容量
を変えられるため、電流容量変更の際のマスクの設計は
容易である。図3〜図5は、上記の3種類の形の単位セ
ル3の表面形状をそれぞれあらわす。図6にみるよう
に、従来の単位セルの表面でのカソード領域61の幅を
WGとし、ゲート領域62の幅をXJ,長さをWG+2
XJとし、カソード領域61が単位セルの表面部分の全
面積中で占める割合を1とする。一方、図3〜5にみる
ように、上記の3種類の形の単位セル3の表面での内接
円と同心円で各辺からの距離がXJの円の内側がカソー
ド領域11であり、その外側がゲート領域12である時
のカソード領域11が単位セル3の表面部分の全面積中
で占める割合を図6の場合と比較すると以下のようにな
る。
Even when the current capacity is changed, the state of the end of the unit cell assembly area is almost the same by simply connecting the unit cells, and the size of the unit cell assembly area is changed without any problem to change the current capacity. Therefore, it is easy to design the mask when changing the current capacity. 3 to 5 respectively show the surface shapes of the unit cells 3 of the above-mentioned three types. As shown in FIG. 6, the width of the cathode region 61 on the surface of the conventional unit cell is WG, the width of the gate region 62 is XJ, and the length is WG + 2.
XJ, and the ratio of the cathode region 61 to the entire surface area of the unit cell is 1. On the other hand, as shown in FIGS. 3 to 5, the inside of a circle concentric with the inscribed circle on the surface of the unit cell 3 of the above-mentioned three types and whose distance from each side is XJ is the cathode region 11, and The ratio of the cathode region 11 to the entire surface area of the unit cell 3 when the outside is the gate region 12 is as follows when compared with the case of FIG.

【0011】図6の場合:図3の場合:図4の場合:図
5の場合=1:1.2 :1.6 :1.8 となるのである。つま
り、図4や図5の正四角形、正六角形の場合は従来の場
合に比べ50%以上の変動があり特性の低下を伴う心配
があるが、この発明の図3の正三角形の場合、図6の従
来の場合に比べて約20%の変動だけであるから特性の
低下を伴う心配はない。
In the case of FIG. 6: In the case of FIG. 3: In the case of FIG. 4: In the case of FIG. 5 = 1: 1.2: 1.6: 1.8. That is, in the case of the regular quadrangle and the regular hexagon of FIGS. 4 and 5, there is a possibility that the fluctuation may be 50% or more as compared with the conventional case and the characteristic may be deteriorated. However, in the case of the regular triangle of FIG. Compared to the conventional case of No. 6, there is only a fluctuation of about 20%, so there is no fear of deterioration of the characteristics.

【0012】[0012]

【実施例】続いて、この発明の実施例を、図面を参照し
ながら説明する。この発明は、下記の実施例に限らない
ことは言うまでもない。図1は、実施例の静電誘導サイ
リスタの単位セル集合域を基板表面よりみた状態をあら
わす。図2は、図1の一点鎖線で図示した位置での断面
をあらわす。
Embodiments of the present invention will now be described with reference to the drawings. It goes without saying that the present invention is not limited to the following embodiments. FIG. 1 shows a state where the unit cell assembly region of the electrostatic induction thyristor of the embodiment is viewed from the substrate surface. FIG. 2 shows a cross section at the position shown by the alternate long and short dash line in FIG.

【0013】実施例の静電誘導サイリスタ1の半導体基
板2では、多数の単位セル3,3・・が面方向に隣接し
て配置されている。各単位セル3,3・・は基板表面側
よりみた形状が正三角形であって隙間なく並んでいる。
各単位セル3の表側の表面部分では内側がカソード領域
(n+ 領域)11であって外側がゲート領域(p+
域)12となっていて、裏側の表面部分がアノード領域
(p+ 領域)13となっており、カソード領域11とア
ノード領域13の間は電流通路となる高比抵抗領域(n
- 領域)14である。そして、各単位セル3の表面部分
では内側のカソード領域11が外側のゲート領域12で
囲まれた状態となっている。
In the semiconductor substrate 2 of the electrostatic induction thyristor 1 of the embodiment, a large number of unit cells 3, 3, ... Are arranged adjacent to each other in the plane direction. The shape of each unit cell 3, 3, ... Is an equilateral triangle when viewed from the substrate surface side, and they are arranged without gaps.
On the front surface of each unit cell 3, the inside is a cathode region (n + region) 11 and the outside is a gate region (p + region) 12, and the back surface is an anode region (p + region). 13 between the cathode region 11 and the anode region 13 and serves as a high specific resistance region (n
- area) is 14. In the surface portion of each unit cell 3, the inner cathode region 11 is surrounded by the outer gate region 12.

【0014】マスク設計の際には、単位セル3の形状を
そのプロセスの微細レベルや装置の電気特性に応じて予
め準備しておき、仕様の電気特性あるいはプロセス微細
化技術のレベルに合わせて適切な単位セル3の形状を選
択し、マスクの設計を行うようにする。この発明は、上
記実施例に限らない。図2において、アノード領域のp
+ 型領域がn+ 型領域となったものが、静電誘導トラン
ジスタの場合の実施例として挙げることが出来る。
In designing a mask, the shape of the unit cell 3 is prepared in advance according to the fine level of the process and the electrical characteristics of the device, and is appropriate according to the electrical characteristics of the specifications or the level of the process miniaturization technology. The shape of the unit cell 3 is selected to design the mask. The present invention is not limited to the above embodiment. In FIG. 2, p in the anode region
The case where the + type region becomes the n + type region can be given as an example in the case of the static induction transistor.

【0015】[0015]

【発明の効果】この発明にかかる静電誘導半導体装置で
は、単位セルの基板表面側よりみた形状が正三角形であ
るため、単位セルを隙間なく隣接させて並べてゆける
上、単位セルの表面部分ではカソード領域がゲート領域
で取り囲まれているため単位セル集合域の端部での処理
やパット部での処理は容易であるから、マスクの設計は
容易で開発時間の短縮が図れ、しかも、カソード領域が
単位セルの表面部分の全面積中で占める割合が従来とさ
ほど変わらないため、特性の低下を伴う心配もなく、し
たがって、この発明は非常に有用である。
In the electrostatic induction semiconductor device according to the present invention, since the shape of the unit cells viewed from the substrate surface side is an equilateral triangle, the unit cells can be arranged side by side without any gap, and at the surface portion of the unit cell. Since the cathode area is surrounded by the gate area, it is easy to process at the edge of the unit cell assembly area and at the pad area, so the mask design is easy and development time can be shortened. Since the ratio of the surface area of the unit cell in the total area is not so different from the conventional one, there is no fear of deterioration of characteristics, and therefore the present invention is very useful.

【図面の簡単な説明】[Brief description of drawings]

【図1】実施例の静電誘導サイリスタの単位セル集合域
をあらわす平面図。
FIG. 1 is a plan view showing a unit cell assembly area of an electrostatic induction thyristor of an embodiment.

【図2】図1の断面図。FIG. 2 is a sectional view of FIG.

【図3】この発明における単位セルの平面形状例を示す
平面図。
FIG. 3 is a plan view showing an example of a planar shape of a unit cell according to the present invention.

【図4】参考用の単位セルの平面形状例を示す平面図。FIG. 4 is a plan view showing an example of a planar shape of a reference unit cell.

【図5】参考用の単位セルの平面形状例を示す平面図。FIG. 5 is a plan view showing a planar shape example of a reference unit cell.

【図6】従来の単位セルの平面形状例を示す平面図。FIG. 6 is a plan view showing an example of a planar shape of a conventional unit cell.

【図7】従来の静電誘導サイリスタの要部構成を示す断
面図。
FIG. 7 is a cross-sectional view showing a main part configuration of a conventional electrostatic induction thyristor.

【図8】図7の静電誘導サイリスタの単位セルの平面形
状を示す平面図。
8 is a plan view showing a planar shape of a unit cell of the electrostatic induction thyristor of FIG.

【符号の説明】[Explanation of symbols]

1 静電誘導サイリスタ 2 半導体基板 3 単位セル 11 カソード領域 12 ゲート領域 13 アノード領域 14 高比抵抗領域 1 electrostatic induction thyristor 2 semiconductor substrate 3 unit cell 11 cathode region 12 gate region 13 anode region 14 high resistivity region

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 半導体基板に複数の単位セルが面方向に
隣接して配置されており、各単位セルの表面部分では内
側がカソード領域であって外側がゲート領域である静電
誘導半導体装置において、前記単位セルの基板表面側よ
りみた形状が正三角形であってゲート領域がカソード領
域を囲むように形成されていることを特徴とする静電誘
導半導体装置。
1. A static induction semiconductor device in which a plurality of unit cells are arranged adjacent to each other in a plane direction on a semiconductor substrate, and inside of a surface portion of each unit cell is a cathode region and outside is a gate region. An electrostatic induction semiconductor device, wherein the unit cell has a shape of an equilateral triangle when viewed from the substrate surface side, and the gate region is formed so as to surround the cathode region.
JP891593A 1993-01-22 1993-01-22 Static-induction semiconductor device Pending JPH06224445A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP891593A JPH06224445A (en) 1993-01-22 1993-01-22 Static-induction semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP891593A JPH06224445A (en) 1993-01-22 1993-01-22 Static-induction semiconductor device

Publications (1)

Publication Number Publication Date
JPH06224445A true JPH06224445A (en) 1994-08-12

Family

ID=11705960

Family Applications (1)

Application Number Title Priority Date Filing Date
JP891593A Pending JPH06224445A (en) 1993-01-22 1993-01-22 Static-induction semiconductor device

Country Status (1)

Country Link
JP (1) JPH06224445A (en)

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