JPH0620125Y2 - 工業材料の顕微鏡観察用治具 - Google Patents
工業材料の顕微鏡観察用治具Info
- Publication number
- JPH0620125Y2 JPH0620125Y2 JP1986140152U JP14015286U JPH0620125Y2 JP H0620125 Y2 JPH0620125 Y2 JP H0620125Y2 JP 1986140152 U JP1986140152 U JP 1986140152U JP 14015286 U JP14015286 U JP 14015286U JP H0620125 Y2 JPH0620125 Y2 JP H0620125Y2
- Authority
- JP
- Japan
- Prior art keywords
- curvature
- thin
- sample
- micro sample
- jig
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986140152U JPH0620125Y2 (ja) | 1986-09-12 | 1986-09-12 | 工業材料の顕微鏡観察用治具 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986140152U JPH0620125Y2 (ja) | 1986-09-12 | 1986-09-12 | 工業材料の顕微鏡観察用治具 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6347256U JPS6347256U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1988-03-30 |
| JPH0620125Y2 true JPH0620125Y2 (ja) | 1994-05-25 |
Family
ID=31046731
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986140152U Expired - Lifetime JPH0620125Y2 (ja) | 1986-09-12 | 1986-09-12 | 工業材料の顕微鏡観察用治具 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0620125Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5139852Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1972-06-29 | 1976-09-29 | ||
| JPS5819472Y2 (ja) * | 1978-11-27 | 1983-04-21 | 昭和電線電纜株式会社 | 試料成型装置 |
| JPS6015043U (ja) * | 1983-07-11 | 1985-02-01 | 日産自動車株式会社 | シ−トベルトリトラクタのロツク阻止装置 |
| JPS60233530A (ja) * | 1984-05-02 | 1985-11-20 | Seiko Epson Corp | 電子顕微鏡観察分析用試料の包埋方法 |
-
1986
- 1986-09-12 JP JP1986140152U patent/JPH0620125Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6347256U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1988-03-30 |
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