JPH06163673A - Substrate processing apparatus - Google Patents

Substrate processing apparatus

Info

Publication number
JPH06163673A
JPH06163673A JP5166465A JP16646593A JPH06163673A JP H06163673 A JPH06163673 A JP H06163673A JP 5166465 A JP5166465 A JP 5166465A JP 16646593 A JP16646593 A JP 16646593A JP H06163673 A JPH06163673 A JP H06163673A
Authority
JP
Japan
Prior art keywords
substrate
processing
chuck
cassette
substrate transfer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5166465A
Other languages
Japanese (ja)
Other versions
JP2864326B2 (en
Inventor
Yusuke Muraoka
祐介 村岡
Junichi Yonemura
潤一 米村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP5166465A priority Critical patent/JP2864326B2/en
Publication of JPH06163673A publication Critical patent/JPH06163673A/en
Application granted granted Critical
Publication of JP2864326B2 publication Critical patent/JP2864326B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To prevent contamination of a processed substrate with the substrate chuck of a substrate conveying robot when the substrate is conveyed between a substrate mounting part and a substrate processing part with the substrate conveying robot. CONSTITUTION:A pair of substrate chucks 49 have a plurality of substrate aligning and holding grooves 52 and 53 at plural sets of chuck facing surfaces 50 and 51 and are constituted as follows. One set of the chuck facing surfaces 50 and the other chuck facing surfaces 51 of the substrate chucks 49 can be switched so as to face each other. The chuck facing surfaces of the substrate chucks 49 are switched and separately used for the conveyance of the uprocessed substrate 9 and the processed substrate 9. Thus, contamination of the processed substrate 9 with the substrate chucks 49 of a substrate conveying robot 4 is prevented.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体基板、ガラス基
板等の基板(以下、単に「基板」という)を処理する基
板処理装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate processing apparatus for processing substrates such as semiconductor substrates and glass substrates (hereinafter simply referred to as "substrate").

【0002】[0002]

【従来技術】基板処理装置の従来技術として図12及び
図13に示すものがある。これは、図12に示すよう
に、複数の基板109を収容したカセット108から基
板109を取り出し又はそのカセット108内に複数の
基板109を装填する基板移載部103と、複数の基板
109を一括して処理する基板処理部105と、基板移
載部103と基板処理部105との間で複数の基板10
9を一括保持して搬送する基板搬送ロボット104とを
具備して成るものである。尚、図12において、符号1
11はカセット載置テーブル、114は回転駆動装置、
115はカセット108の下開口部、116は受け渡し
具挿通孔、117は基板受け渡し具、118は基板受け
渡し具の基板載置部である。また図13において、10
1はカセット搬出入ステージ、102はカセット搬送ロ
ボット、106は基板乾燥部、107はカセット洗浄
部、110は搬入位置、112は搬出位置である。
2. Description of the Related Art A conventional substrate processing apparatus is shown in FIGS. 12 and 13. As shown in FIG. 12, this is performed by removing the substrate 109 from the cassette 108 accommodating the plurality of substrates 109 or loading the plurality of substrates 109 into the cassette 108, and the plurality of substrates 109 at once. Substrate processing unit 105 for performing processing by the plurality of substrates 10 between the substrate transfer unit 103 and the substrate processing unit 105.
And a substrate transfer robot 104 that collectively holds 9 and transfers them. In FIG. 12, reference numeral 1
11 is a cassette mounting table, 114 is a rotary drive device,
Reference numeral 115 is a lower opening of the cassette 108, 116 is a transfer tool insertion hole, 117 is a substrate transfer tool, and 118 is a substrate mounting portion of the substrate transfer tool. Further, in FIG.
1 is a cassette loading / unloading stage, 102 is a cassette transfer robot, 106 is a substrate drying unit, 107 is a cassette cleaning unit, 110 is a loading position, and 112 is a loading position.

【0003】この種の基板処理装置では、基板移載部1
03でカセット108から取り出した未処理基板109
を基板搬送ロボット104で基板処理部105に搬送
し、基板処理部105で処理した基板109は、基板搬
送ロボット104で基板乾燥部106に搬送し、乾燥を
終えた処理済み基板109は基板搬送ロボット104で
基板移載部103に搬送し、ここで洗浄済みカセット1
08に収容する。
In this type of substrate processing apparatus, the substrate transfer section 1
Untreated substrate 109 taken out from cassette 108 in 03
Substrate is transferred to the substrate processing unit 105 by the substrate transfer robot 104, the substrate 109 processed by the substrate processing unit 105 is transferred to the substrate drying unit 106 by the substrate transfer robot 104, and the processed substrate 109 that has been dried is the substrate transfer robot. At 104, the substrate is transferred to the substrate transfer section 103, where the cleaned cassette 1
It is accommodated in 08.

【0004】ところで、この基板処理装置では、基板搬
送ロボット104は、走行部本体146に一対の基板チ
ャック149を設け、この基板チャック149の対向面
150同士に基板整列保持溝152を設けた構造となっ
ており、未処理基板109の搬送と処理済み基板109
の搬送を、いずれも基板109を同一の基板整列保持溝
152に保持して行うようになっている。また、走行部
本体146は昇降自在となっており、走行部本体146
の下降により、未処理基板109を基板チャック149
で保持したまま、基板処理部105の処理槽174に浸
漬するようになっている。
By the way, in this substrate processing apparatus, the substrate transfer robot 104 has a structure in which a pair of substrate chucks 149 are provided on the traveling unit main body 146, and substrate alignment holding grooves 152 are provided on the facing surfaces 150 of the substrate chucks 149. The transfer of the unprocessed substrate 109 and the processed substrate 109
In both cases, the substrate 109 is held in the same substrate alignment holding groove 152. The traveling unit body 146 is movable up and down, and the traveling unit body 146 is movable.
Lowering the untreated substrate 109 causes the substrate chuck 149
The substrate is kept immersed in the processing bath 174 of the substrate processing unit 105 while being held.

【0005】[0005]

【発明が解決しようとする課題】上記従来技術では、次
の問題がある。 未処理基板109の搬送と処理済み基板109の搬送
を、いずれも基板チャック対向面150の同一の基板整
列保持溝152で基板109を保持して行うようになっ
ているため、未処理基板109に付着していた汚染物質
が当該基板整列保持溝152を介して処理済み基板10
9に付着する。このため処理済み基板109が汚染され
る。また、酸化拡散工程の前処理洗浄においては、既に
洗浄された基板を洗浄することになるので、基板はある
程度きれいで、上記のような汚染の問題はないが、洗浄
後の濡れた基板を保持した基板チャック49で乾いた基
板を保持すると、基板の種類によりウォータマークが付
着するという弊害が生ずる。上記基板の汚染やウォータ
マークの付着は、いずれも製品の歩留まりを低下させ
る。
The above-mentioned conventional techniques have the following problems. The unprocessed substrate 109 and the processed substrate 109 are both carried by holding the substrate 109 by the same substrate alignment holding groove 152 on the substrate chuck facing surface 150. The contaminants attached to the processed substrate 10 through the substrate alignment holding groove 152.
Attach to 9. Therefore, the processed substrate 109 is contaminated. Also, in the pre-treatment cleaning of the oxidation diffusion step, the already cleaned substrate is cleaned, so the substrate is clean to some extent and there is no contamination problem as described above, but the wet substrate after cleaning is retained. When a dry substrate is held by the substrate chuck 49, the problem that the watermark adheres depending on the type of the substrate occurs. Both the contamination of the substrate and the attachment of the watermark decrease the yield of products.

【0006】未処理基板109を基板チャック149
で保持したまま、基板処理部105の処理槽174に浸
漬するようになっているため、基板チャック149に付
着した汚染物質が処理槽174内に持ち込まれる。その
うえ、基板チャック149を下降させて基板受け渡し具
117との間で基板109を受け渡し、また、基板チャ
ック149を処理槽174に深く侵入させる必要から、
基板チャック149の垂下寸法が比較的長くなるため、
基板搬送中に基板チャック149が振動しやすく、基板
109と基板整列保持溝152との摺動でパーティクル
が発生し、これが処理槽174に侵入する。このため、
処理槽174内が汚染され、製品の歩留まりが低下す
る。
The unprocessed substrate 109 is attached to the substrate chuck 149.
Since it is soaked in the processing bath 174 of the substrate processing unit 105 while being held at 1, contaminants attached to the substrate chuck 149 are brought into the processing bath 174. In addition, since it is necessary to lower the substrate chuck 149 to transfer the substrate 109 to and from the substrate transfer tool 117, and to deeply penetrate the substrate chuck 149 into the processing bath 174,
Since the hanging dimension of the substrate chuck 149 becomes relatively long,
The substrate chuck 149 is apt to vibrate during the transfer of the substrate, particles are generated by the sliding of the substrate 109 and the substrate alignment holding groove 152, and the particles enter the processing bath 174. For this reason,
The inside of the processing tank 174 is contaminated, and the product yield is reduced.

【0007】本発明はこのような不都合を解消するため
になされてもので、請求項1の発明では、基板搬送ロボ
ットの基板チャックによる処理済み基板の汚染を防止
し、あるいはウォータマークの付着を防止できる基板処
理装置を提供することをその課題とする。また、請求項
2の発明では、上記課題に加え、基板搬送ロボットの基
板チャックによる基板処理槽内の汚染を防止できる基板
処理装置を提供することをその課題とする。
The present invention has been made to solve such inconvenience. Therefore, in the invention of claim 1, the processed substrate is prevented from being contaminated by the substrate chuck of the substrate transfer robot or the attachment of the watermark is prevented. It is an object of the present invention to provide a substrate processing apparatus capable of performing the processing. In addition to the above problems, it is an object of the present invention to provide a substrate processing apparatus capable of preventing contamination in the substrate processing tank by the substrate chuck of the substrate transfer robot.

【0008】[0008]

【課題を解決するための手段】[Means for Solving the Problems]

(請求項1の発明)複数の基板を収容したカセットから
基板を取り出し又はそのカセット内に複数の基板を装填
する基板移載部と、複数の基板を一括して処理する基板
処理部と、上記基板移載部と上記基板処理部との間で複
数の基板を一括保持して搬送する基板搬送ロボットとを
具備して成る基板処理装置において、次のようにしたこ
とを特徴とする。
(Invention of Claim 1) A substrate transfer section for taking out a substrate from a cassette accommodating a plurality of substrates or loading a plurality of substrates in the cassette; a substrate processing unit for collectively processing a plurality of substrates; A substrate processing apparatus including a substrate transfer robot that collectively holds and transfers a plurality of substrates between the substrate transfer unit and the substrate processing unit is characterized by the following.

【0009】上記基板搬送ロボットは、走行部本体と、
この走行部本体から略水平に突出した左右一対のアーム
回転軸と、この一対のアーム回転軸を回転させる軸回転
手段と、各アーム回転軸に固定された基板チャックとを
備えている。そして、上記一対の基板チャックは複数組
のチャック対向面を有し、各組のチャック対向面は複数
の基板整列保持溝を有し、各組のチャック対向面で基板
を起立整列状態で一括保持するように構成するととも
に、アーム回転軸の回転により基板チャックのチャック
対向面を切り換え可能に構成する。
The substrate transfer robot includes a traveling unit body,
It is provided with a pair of left and right arm rotation shafts that project substantially horizontally from the traveling unit main body, shaft rotation means for rotating the pair of arm rotation shafts, and a substrate chuck fixed to each arm rotation shaft. The pair of substrate chucks have a plurality of sets of chuck facing surfaces, each set of chuck facing surfaces has a plurality of substrate alignment holding grooves, and the sets of chuck facing surfaces collectively hold the substrates in an upright aligned state. In addition to the above, the chuck facing surface of the substrate chuck can be switched by the rotation of the arm rotation shaft.

【0010】(請求項2の発明)上記第1発明の基板処
理装置において、次の手段を備える。上記基板移載部は
基板受け渡し具を備え、この基板受け渡し具は、基板を
保持する基板載置部を昇降駆動する昇降駆動装置を備
え、この昇降駆動装置により、上記基板載置部で保持し
た基板を、上記基板搬送ロボットに受け渡すための第一
の基板受け渡し位置と、上記カセット内に収容する基板
収容位置との間で昇降可能に構成する。上記基板処理部
は、処理槽と、基板を支持する処理基板載置具と、この
処理基板載置具を昇降駆動する昇降駆動手段とを備え、
この昇降駆動手段で、上記処理基板載置具で支持した基
板を、上記基板搬送ロボットに受け渡すための第二の基
板受け渡し位置と、上記処理槽内に浸漬してその処理を
行う基板処理位置との間で昇降可能に構成する。
(Invention of Claim 2) In the substrate processing apparatus of the first invention, the following means are provided. The substrate transfer unit includes a substrate transfer tool, and the substrate transfer tool includes an up-and-down drive device that drives the substrate mounting unit that holds the substrate up and down, and the substrate transfer unit holds the substrate on the substrate mounting unit. The substrate can be moved up and down between a first substrate transfer position for transferring the substrate to the substrate transfer robot and a substrate storage position for storing the substrate in the cassette. The substrate processing unit includes a processing tank, a processing substrate mounting tool that supports a substrate, and an elevating drive unit that drives the processing substrate mounting tool up and down.
A second substrate transfer position for transferring the substrate supported by the processing substrate mounting tool to the substrate transfer robot by the elevating and lowering drive means, and a substrate processing position for immersing the substrate in the processing tank to perform the processing. It is configured to be able to move up and down between and.

【0011】[0011]

【発明の作用】[Operation of the invention]

(請求項1の発明)例えば、未処理基板を搬送する場合
には、基板チャックの複数のチャック対向面のうちの一
組のチャック対向面で基板を保持し、処理済み基板を搬
送する場合には、別の一組のチャック対向面で基板を保
持する。つまり、未処理基板の搬送と処理済み基板の搬
送とで、基板を保持するチャック対向面を使い分ける。
あるいは、濡れた基板を搬送する場合と、乾燥した基板
を搬送する場合とで、基板を保持するチャック対向面を
使い分ける。
(Invention of Claim 1) For example, in the case of transporting an unprocessed substrate, when the substrate is held by one set of chuck facing surfaces of the plurality of chuck facing surfaces of the substrate chuck and the processed substrate is transported. Holds the substrate with another set of chuck facing surfaces. That is, the chuck-opposing surface holding the substrate is selectively used for carrying the unprocessed substrate and carrying the processed substrate.
Alternatively, the chuck facing surface holding the substrate is used properly depending on whether the wet substrate is transported or the dry substrate is transported.

【0012】(請求項2の発明)上記請求項1の発明の
作用に加え、次のように作用する。先ず、カセット内に
収容する未処理基板を基板受け渡し具で保持し、これを
上昇させて基板搬送ロボットに受け渡す。次いで、この
未処理基板を基板搬送ロボットで基板処理部まで搬送
し、上昇してきた処理基板載置具に未処理基板を受け渡
す。引き続き処理基板載置具を下降させて、未処理基板
を処理槽の基板処理位置に位置させ、処理液に浸漬して
処理を行う。そして、処理槽での基板処理が終了する
と、処理基板載置具を上昇させて、処理済み基板を第二
の基板受け渡し位置に位置させて、基板搬送ロボットに
受け渡す。次いで、この処理済み基板を基板搬送ロボッ
トで第一の基板受け渡し位置まで搬送し、上昇してきた
基板受け渡し具の基板載置部で保持させ、引き続きこれ
を下降させて、処理済み基板を洗浄済みカセット内に収
容する。
(Invention of Claim 2) In addition to the operation of the invention of Claim 1, the following operation is performed. First, the unprocessed substrate accommodated in the cassette is held by the substrate transfer tool, and is raised to be transferred to the substrate transfer robot. Next, this unprocessed substrate is transferred to the substrate processing unit by the substrate transfer robot, and the unprocessed substrate is transferred to the elevated processing substrate mounting tool. Then, the processing substrate holder is lowered to position the unprocessed substrate at the substrate processing position of the processing tank, and the substrate is immersed in the processing liquid for processing. Then, when the substrate processing in the processing tank is completed, the processing substrate holder is raised to position the processed substrate at the second substrate transfer position and transfers it to the substrate transfer robot. Then, the processed substrate is transferred to the first substrate transfer position by the substrate transfer robot, held by the substrate placing part of the substrate transfer tool that has risen, and then lowered, and the processed substrate is cleaned in the cassette. House inside.

【0013】[0013]

【発明の効果】【The invention's effect】

(請求項1の発明)未処理基板の搬送と処理済み基板の
搬送とで、基板搬送チャックのチャック対向面を切り替
えることにより、未処理基板に付着した汚染物質が基板
搬送チャックを介して処理済み基板に転移することによ
る処理済み基板の汚染を防止することができる。あるい
は、乾いた基板と濡れた基板とでチャック対抗面を使い
分けることにより、上記のようなウォータマークによる
弊害を有効に防止することができる。これにより製品の
歩留まりを高めることができる。
(Invention of Claim 1) By switching the chuck facing surface of the substrate transfer chuck between the transfer of the unprocessed substrate and the transfer of the processed substrate, contaminants adhering to the unprocessed substrate are processed through the substrate transfer chuck. Contamination of the treated substrate due to transfer to the substrate can be prevented. Alternatively, by selectively using the chuck opposing surface for a dry substrate and a wet substrate, the above-mentioned harmful effects of the watermark can be effectively prevented. As a result, the yield of products can be increased.

【0014】(請求項2の発明)請求項1の発明の効果
に加え、次の効果を奏する。未処理基板を基板処理部の
処理基板載置具に保持して昇降させることにより、基板
を保持する基板搬送ロボットの基板チャックを処理槽の
処理液に浸漬する必要がなくなり、基板チャックに付着
した汚染物質が処理槽内に持ち込まれることがない。そ
のうえ、基板チャックを処理槽に侵入させる必要がない
ため、基板チャックの寸法を短くでき、基板搬送中に基
板チャックが振動しにくくなり、基板と基板チャックの
基板整列保持溝との摺動によるパーティクルの発生が軽
減され、処理槽へのパーティクルの侵入が軽減される。
これにより、処理槽内の汚染が軽減され、基板の処理状
態が良好になり、製品の歩留まりが一層高まる。
(Invention of Claim 2) In addition to the effect of the invention of Claim 1, the following effect is exhibited. By holding the unprocessed substrate on the processing substrate holder of the substrate processing unit and moving it up and down, it is not necessary to immerse the substrate chuck of the substrate transfer robot that holds the substrate in the processing liquid of the processing tank, and the substrate is attached to the substrate chuck. No contaminants are brought into the processing tank. Moreover, since it is not necessary to intrude the substrate chuck into the processing tank, the dimension of the substrate chuck can be shortened, the substrate chuck is less likely to vibrate during the transfer of the substrate, and particles caused by sliding between the substrate and the substrate alignment holding groove of the substrate chuck are generated. The occurrence of particles is reduced, and the intrusion of particles into the processing tank is reduced.
Thereby, the contamination in the processing tank is reduced, the processing condition of the substrate is improved, and the product yield is further improved.

【0015】[0015]

【実施例】本発明の実施例を図面に基づいて説明する。
図11に示すように、この実施例に係る基板処理装置
は、カセット搬出入ステージ1と、カセット搬送ロボッ
ト2と、基板移載部3と、基板搬送ロボット4と、基板
処理部5と、基板乾燥部6と、カセット洗浄部7とを備
えている。この実施例で用いるカセット8は、内部に基
板整列収容溝を備え、複数の基板9を起立整列状態で収
容できるようになっている。以下、各部の構成について
説明する。
Embodiments of the present invention will be described with reference to the drawings.
As shown in FIG. 11, the substrate processing apparatus according to this embodiment includes a cassette loading / unloading stage 1, a cassette transfer robot 2, a substrate transfer unit 3, a substrate transfer robot 4, a substrate processing unit 5, and a substrate. A drying unit 6 and a cassette cleaning unit 7 are provided. The cassette 8 used in this embodiment has a substrate alignment accommodating groove therein so that a plurality of substrates 9 can be accommodated in an upright alignment state. The configuration of each unit will be described below.

【0016】この基板処理装置では、基板処理装置外か
ら未処理基板9を収容したカセット8がカセット搬出入
ステージ1の搬入位置10に搬入されると、このカセッ
ト8を二個、カセット搬送ロボット2で基板移載部3の
カセット載置テーブル11に搬送し、ここでカセット8
二個分の未処理基板9を、後述する基板受け渡し具17
を介してカセット8内から取り出し、基板搬送ロボット
4に引き渡す。
In this substrate processing apparatus, when the cassette 8 accommodating the unprocessed substrate 9 is carried into the loading position 10 of the cassette loading / unloading stage 1 from the outside of the substrate processing apparatus, the two cassettes 8 and the cassette transport robot 2 are loaded. The substrate 8 is transferred to the cassette mounting table 11 of the substrate transfer unit 3, and the cassette 8
Two unprocessed substrates 9 are transferred to a substrate transfer tool 17 described later.
It is taken out from the cassette 8 via the and transferred to the substrate transfer robot 4.

【0017】基板搬送ロボット4は、受け取った未処理
基板9を基板処理部5に搬送し、基板処理部5で処理
し、処理済み基板9を再び基板搬送ロボット4で基板乾
燥部6に搬送して乾燥させ、再び基板搬送ロボット4で
基板移載部3に搬送する。一方、先に基板移載部3で未
処理基板9を取り出された空のカセット8は、カセット
搬送ロボット2でカセット洗浄部7に搬送して洗浄す
る。そして、この洗浄済みカセット8はカセット搬送ロ
ボット2で基板移載部3のカセット載置テーブル11に
搬送する。基板移載部3では、処理済み基板9を洗浄済
みカセット8に移載し、このカセット8をカセット搬送
ロボット2でカセット搬出入ステージ1の搬出位置12
に搬送し、ここから基板処理装置外に搬出する。
The substrate transfer robot 4 transfers the received unprocessed substrate 9 to the substrate processing unit 5, processes it in the substrate processing unit 5, and transfers the processed substrate 9 again to the substrate drying unit 6 by the substrate transfer robot 4. Then, the substrate is transferred to the substrate transfer section 3 by the substrate transfer robot 4 again. On the other hand, the empty cassette 8 from which the unprocessed substrate 9 has been taken out by the substrate transfer unit 3 is transferred to the cassette cleaning unit 7 by the cassette transfer robot 2 and cleaned. Then, the cleaned cassette 8 is transferred to the cassette mounting table 11 of the substrate transfer section 3 by the cassette transfer robot 2. In the substrate transfer unit 3, the processed substrate 9 is transferred to the cleaned cassette 8 and the cassette 8 is transferred by the cassette transfer robot 2 to the transfer position 12 of the cassette transfer stage 1.
To the outside of the substrate processing apparatus.

【0018】このように、この基板処理装置では、カセ
ット搬送ロボット2により、カセット8をカセット搬出
入ステージ1とカセット載置テーブル11との間で搬送
するようにしてあるが、図2に示すように、カセット搬
出入ステージ1で搬出入姿勢をとるカセット8内では、
基板9の収容姿勢が基板処理部5での基板9の処理姿勢
に対して平面視で直交する方向になっている。また、カ
セット搬送ロボット2は、カセット載置テーブル11と
カセット搬出入ステージ1との間でカセット8を180
゜反転させて搬送する機構のものを用いている。
As described above, in this substrate processing apparatus, the cassette transfer robot 2 transfers the cassette 8 between the cassette loading / unloading stage 1 and the cassette mounting table 11, as shown in FIG. In the cassette 8 which is in the loading / unloading posture at the cassette loading / unloading stage 1,
The accommodation attitude of the substrate 9 is a direction orthogonal to the processing attitude of the substrate 9 in the substrate processing section 5 in a plan view. Further, the cassette transfer robot 2 moves the cassette 8 between the cassette mounting table 11 and the cassette loading / unloading stage 1 by 180.
Uses a mechanism that reverses and conveys.

【0019】このため、基板処理前に、カセット搬出入
ステージ1の搬入位置10で搬入姿勢をとるカセット8
をカセット搬送ロボット2でカセット載置テーブル11
に搬送すると、カセット載置テーブル11上のカセット
8内の未処理基板9の収容姿勢が処理姿勢に対して平面
視で直交する姿勢になり、このままの姿勢では基板9を
処理姿勢と平行な姿勢に保持して搬送を行う基板搬送ロ
ボット4に未処理基板9を受け渡すことができない。ま
た、基板処理後に、カセット搬送ロボット2でカセット
8をカセット載置テーブル11からカセット搬出入ステ
ージ1の搬出位置12に搬送する際、搬出位置12でカ
セット8が搬出姿勢となるようにするためには、カセッ
ト載置テーブル11上のカセット8を搬出姿勢に対して
180゜反転した姿勢にしておく必要があるが、このよ
うな姿勢でカセット載置テーブル11上に洗浄済みカセ
ット8を載置した場合には、洗浄済みカセット8の基板
収容方向が処理姿勢に対して平面視で直交する方向にな
るため、このままの姿勢では基板9を処理姿勢と平行な
姿勢に保持して搬送を行う基板搬送ロボット4から洗浄
済みカセット8に処理済み基板9を受け入れることがで
きない。
For this reason, before the substrate processing, the cassette 8 is set in the loading position 10 of the cassette loading / unloading stage 1.
The cassette loading table 11 by the cassette transfer robot 2.
When the substrate 9 is conveyed to, the storage posture of the unprocessed substrate 9 in the cassette 8 on the cassette mounting table 11 becomes a posture orthogonal to the processing posture in plan view, and in this posture, the substrate 9 is parallel to the processing posture. The unprocessed substrate 9 cannot be delivered to the substrate transfer robot 4 which is held and transferred. In addition, when the cassette 8 is transferred from the cassette mounting table 11 to the carry-out position 12 of the cassette carry-in stage 1 by the cassette carrying robot 2 after the substrate processing, the cassette 8 has a carry-out posture at the carry-out position 12. Requires the cassette 8 on the cassette mounting table 11 to be in a posture that is 180 ° inverted with respect to the carrying-out posture. In this posture, the cleaned cassette 8 is placed on the cassette mounting table 11. In this case, since the substrate accommodation direction of the cleaned cassette 8 is orthogonal to the processing posture in a plan view, the substrate 9 is conveyed while holding the substrate 9 in a posture parallel to the processing posture in this posture. The processed substrate 9 cannot be received from the robot 4 into the cleaned cassette 8.

【0020】このため、この基板処理装置では、基板移
載部3のカセット載置テーブル11にターンテーブル1
3を設けてある。基板移載部3の構成は次の通りであ
る。すなわち、図2に示すように、カセット載置テーブ
ル11の二箇所のカセット載置箇所に二個のターンテー
ブル13を設け、このターンテーブル13を後述する回
転駆動装置14に連動連結して、このターンテーブル1
3を90゜だけ回転させるようにしてある。図1に示す
ように、このターンテーブル13の中央部にはカセット
8の下開口部15に臨む受け渡し具挿通孔16をあけ、
この受け渡し具挿通孔16の下方に基板受け渡し具17
を起立状に設け、この基板受け渡し具17の上端部に複
数の基板9を起立整列状態で保持する基板載置部18を
設けている。この基板受け渡し具17は、昇降駆動手段
85(昇降駆動モータ)に連動した縦送りネジ軸19に
連動連結した昇降台20上に設け、基板受け渡し具17
の昇降により、基板載置部18で複数の基板9を起立整
列状態のまま保持して、カセット8内と基板搬送ロボッ
ト4との間で複数の基板9を一括して受け渡し可能に構
成してある。
Therefore, in this substrate processing apparatus, the turntable 1 is mounted on the cassette mounting table 11 of the substrate transfer unit 3.
3 is provided. The structure of the substrate transfer unit 3 is as follows. That is, as shown in FIG. 2, two turntables 13 are provided at two cassette mounting positions of the cassette mounting table 11, and the turntables 13 are interlockingly connected to a rotary drive device 14 which will be described later. Turntable 1
3 is rotated by 90 °. As shown in FIG. 1, a transfer tool insertion hole 16 facing the lower opening 15 of the cassette 8 is formed in the center of the turntable 13,
A board transfer tool 17 is provided below the transfer tool insertion hole 16.
Is provided in an upright shape, and a substrate placing portion 18 for holding a plurality of substrates 9 in an upright alignment state is provided at an upper end portion of the substrate transfer tool 17. The substrate transfer tool 17 is provided on the lift table 20 that is interlocked with the vertical feed screw shaft 19 that is interlocked with the lifting drive means 85 (elevation drive motor).
By raising and lowering, the plurality of substrates 9 are held in the upright aligned state on the substrate mounting portion 18, and the plurality of substrates 9 can be collectively transferred between the cassette 8 and the substrate transfer robot 4. is there.

【0021】この基板移載部3では、図2に示すよう
に、基板処理前に、カセット搬出入ステージ1の搬入位
置10からカセット搬送ロボット2でターンテーブル1
3に搬送されてきたカセット8の姿勢を、ターンテーブ
ル13のa方向の回転により90゜方向変換し、カセッ
ト8内の未処理基板9の収容姿勢を基板処理部5での基
板9の処理姿勢と平行として、図1に示す、基板受け渡
し具17の上昇により、基板載置部18に未処理基板9
を保持した状態で、カセット8上方に未処理基板9を取
り出し、基板受け渡し具17を回転させることなしに、
カセット8内の未処理基板9を基板搬送ロボット4に引
き渡す。
In the substrate transfer section 3, as shown in FIG. 2, the turntable 1 is moved by the cassette transfer robot 2 from the loading position 10 of the cassette loading / unloading stage 1 before the substrate processing.
The orientation of the cassette 8 transferred to the substrate 3 is changed by 90 ° by the rotation of the turntable 13 in the a direction, so that the accommodation orientation of the unprocessed substrate 9 in the cassette 8 is the orientation of processing the substrate 9 in the substrate processing unit 5. In parallel with the above, as the substrate transfer tool 17 shown in FIG.
In the state where the substrate is held, the unprocessed substrate 9 is taken out above the cassette 8 and the substrate transfer tool 17 is not rotated.
The unprocessed substrate 9 in the cassette 8 is delivered to the substrate transfer robot 4.

【0022】また、基板処理及び乾燥後には、図11に
示すカセット洗浄部7からカセット搬送ロボット2でタ
ーンテーブル13に搬送されてきた洗浄済みカセット8
を、図2の図示の姿勢からターンテーブル13のa方向
の回転により90゜方向変換し、その基板収容方向を処
理姿勢と平行として、図1に示すように、洗浄済みカセ
ット8の下方に位置させた基板受け渡し具17の基板載
置部18を上昇させて、基板搬送ロボット4で搬送され
てきた処理済み基板9を保持させ、この状態で基板受け
渡し具17を下降させて、基板受け渡し具17を回転さ
せることなしに、処理済み基板9を洗浄済みカセット8
内に受け渡す。そして、図2に示すように、処理済み基
板9を収容した洗浄済みカセット8を、ターンテーブル
13のb方向の回転により90゜方向変換して、図示の
姿勢にし、カセット搬送ロボット2でカセット搬出入ス
テージ1の搬出位置12に搬送すると、このカセット8
が搬出位置12で搬出姿勢となる。
After the substrate processing and drying, the cleaned cassette 8 transferred from the cassette cleaning unit 7 shown in FIG. 11 to the turntable 13 by the cassette transfer robot 2.
2 is rotated by 90 ° from the position shown in FIG. 2 by rotating the turntable 13 in the direction a, and the substrate accommodation direction is set parallel to the processing position, and is positioned below the cleaned cassette 8 as shown in FIG. The substrate placing portion 18 of the substrate transfer tool 17 thus raised is raised to hold the processed substrate 9 transferred by the substrate transfer robot 4, and in this state, the substrate transfer tool 17 is lowered to move the substrate transfer tool 17 The processed substrate 9 is cleaned without rotating the cassette 8.
Hand it over. Then, as shown in FIG. 2, the cleaned cassette 8 accommodating the processed substrate 9 is changed in direction by 90 ° by rotating the turntable 13 in the direction b, and brought into the posture shown in the drawing, and the cassette transfer robot 2 carries the cassette out. When the cassette 8 is conveyed to the carry-out position 12 of the input stage 1.
Is in the carry-out position at the carry-out position 12.

【0023】このように、この基板移載部3では、図1
に示すように、基板9をカセット8内と基板搬送ロボッ
ト4との間で受け渡すに当たり、基板受け渡し具17を
回転させる必要がないので、基板受け渡し具17の基板
載置部18に保持した基板9の姿勢がずれない。そのう
え、基板9の向きを替えるに当たっては、基板9をカセ
ット8に安定に収容保持したまま、ターンテーブル13
を回転させることにより行うので、基板9の姿勢のずれ
をおそれることなくターンテーブル13の回転速度を高
く設定できる。
As described above, in the substrate transfer section 3, as shown in FIG.
As shown in FIG. 5, when transferring the substrate 9 between the cassette 8 and the substrate transfer robot 4, it is not necessary to rotate the substrate transfer tool 17, so that the substrate held by the substrate mounting part 18 of the substrate transfer tool 17 is not used. The posture of 9 does not shift. In addition, when changing the direction of the substrate 9, the turntable 13 is held while the substrate 9 is stably accommodated and held in the cassette 8.
The rotation speed of the turntable 13 can be set high without fear of the posture of the substrate 9 deviating.

【0024】この基板移載部3のターンテーブル13及
びその回転駆動装置14の具体的構成は次のとおりであ
る。図3(A)に示すように、ターンテーブル13はカ
セット載置テーブル11のベース板21にベアリング2
2を介して回転自在に取り付けてある。このターンテー
ブル13を回転させる回転駆動装置14には、回転駆動
モータを用い、この出力軸23に固定したピニオンギヤ
24をターンテーブル13に外嵌固定したリングギヤ2
5に噛み合わせ、図3(C)に示すように、回転角度を
90゜に設定して、ターンテーブル13を回転させるよ
うにしてある。
The concrete structure of the turntable 13 of the substrate transfer section 3 and its rotation driving device 14 is as follows. As shown in FIG. 3 (A), the turntable 13 has a base plate 21 of the cassette mounting table 11 and a bearing 2
It is rotatably attached via 2. A rotary drive motor is used as a rotary drive device 14 for rotating the turntable 13, and a ring gear 2 in which a pinion gear 24 fixed to the output shaft 23 is externally fitted and fixed to the turntable 13.
5, the turntable 13 is rotated by setting the rotation angle to 90 ° as shown in FIG. 3 (C).

【0025】また、図3(B)に示すように、ターンテ
ーブル13上には、矩形の受け渡し具挿通孔16の周縁
の三方に沿ってカセット位置決め枠26を平面視でコの
状に形成するとともに、この周縁の残り一方にカセット
クランプ27を設け、ターンテーブル13上でカセット
8を適性位置に位置決め固定できるようにしてある。こ
の実施例では、回転駆動装置14に回転駆動モータを用
いているが、これに代えて、図3(D)・(E)に示す
ように、回転駆動装置14に回転駆動用エアシリンダを
用いてもよい。図3(D)のものでは、回転駆動用シリ
ンダのピストン28にラックギヤ29を取り付け、この
ラックギヤ29をターンテーブル13に外嵌固定したリ
ングギヤ25に噛み合わせてある。また図3(E)のも
のでは、回転駆動用エアシリンダのピストン28をター
ンテーブル13に外嵌固定したリング30に枢着してあ
る。
Further, as shown in FIG. 3B, a cassette positioning frame 26 is formed on the turntable 13 along the three sides of the periphery of the rectangular transfer tool insertion hole 16 in a U shape in plan view. At the same time, a cassette clamp 27 is provided on the other side of the peripheral edge so that the cassette 8 can be positioned and fixed on the turntable 13 at an appropriate position. In this embodiment, a rotary drive motor is used for the rotary drive device 14, but instead of this, as shown in FIGS. 3D and 3E, a rotary drive air cylinder is used for the rotary drive device 14. May be. In FIG. 3D, a rack gear 29 is attached to the piston 28 of the rotary drive cylinder, and the rack gear 29 is meshed with the ring gear 25 fitted and fixed to the turntable 13. In FIG. 3 (E), the piston 28 of the air cylinder for rotational drive is pivotally attached to the ring 30 fitted and fixed to the turntable 13.

【0026】上記基板受け渡し具17は、図4(A)に
示すように、パイプ支持台31に立設したパイプ32の
上端部に箱体33を取り付け、基板載置部18は上記箱
体33の上面に設けられている。この基板載置部18
は、それぞれ複数の基板を起立整列状態で保持する昇降
載置部38と固定載置部39とから構成されている。そ
して、昇降載置部38は二個部分により、また、固定載
置部39は三個の部分により構成されている。固定載置
部39は箱体33の上面の中央及び両側に固定した三個
の固定座34を取り付け、昇降載置部38は上記固定座
34同士の間に配置した二個の昇降座35に取り付けて
ある。
As shown in FIG. 4 (A), the substrate transfer tool 17 has a box 33 attached to the upper end of a pipe 32 standing on a pipe support 31, and the substrate mounting part 18 has the box 33. Is provided on the upper surface of. This substrate rest 18
Is composed of an elevating and lowering mount 38 and a fixed mount 39 which respectively hold a plurality of substrates in an upright alignment state. Further, the elevating and placing part 38 is composed of two parts, and the fixed placing part 39 is composed of three parts. The fixed mounting part 39 has three fixed seats 34 fixed to the center and both sides of the upper surface of the box body 33, and the elevating mounting part 38 has two elevating seats 35 arranged between the fixed seats 34. It is attached.

【0027】この昇降座35は、パイプ32内を貫通さ
せた昇降杆36の上端部に固定し、昇降杆36はパイプ
支持台31に取り付けた昇降駆動装置37に連動連結し
てある。この昇降駆動装置37には昇降用シリンダを用
いている。つまり、基板載置部18を構成する二個の昇
降載置部38は、固定載置部39の上方位置に突出する
上昇位置と、固定載置部39より低い位置に沈む下降位
置とに切り替え可能にしてある。例えば図1において、
カセット8内から基板搬送ロボット4に未処理基板9を
受け渡す場合には、昇降載置部38を上昇位置とし、基
板搬送ロボット4から洗浄済みカセット8内に処理済み
基板9を受け渡す場合には、昇降載置部38を下降位置
とする。
The elevating seat 35 is fixed to the upper end of an elevating rod 36 penetrating the inside of the pipe 32, and the elevating rod 36 is interlocked with an elevating drive device 37 attached to the pipe support 31. A lift cylinder is used for the lift drive device 37. That is, the two elevating and lowering parts 38 constituting the substrate placing part 18 are switched between an ascending position protruding above the fixed placing part 39 and a descending position sinking to a position lower than the fixed placing part 39. It is possible. For example, in FIG.
When the unprocessed substrate 9 is transferred from the cassette 8 to the substrate transfer robot 4, the elevating / lowering unit 38 is set to the raised position and the processed substrate 9 is transferred from the substrate transfer robot 4 into the cleaned cassette 8. Sets the elevating and lowering mount 38 to the lowered position.

【0028】上記構成によれば、未処理基板9の受け渡
しに際しては、未処理基板9が昇降載置部38に保持さ
れ、固定載置部39に触れないので、固定載置部39が
未処理基板9に付着している汚染物質で汚染されること
がない。そして、処理済み基板9の受け渡しに際して
は、汚染されていない固定載置部分39に処理済み基板
9が保持されるので、処理済み基板9の汚染が防止され
る。逆に、昇降載置部38を下降位置として固定載置部
39で未処理基板9を受け渡し、昇降載置部38を上昇
位置として処理済み基板9を受け渡すことも可能であ
り、この場合にも同様に処理済み基板9の汚染を防止す
ることができる。
According to the above structure, when the unprocessed substrate 9 is delivered, the unprocessed substrate 9 is held by the elevating and lowering mount 38 and does not touch the fixed mount 39, so that the fixed mount 39 is not processed. It will not be contaminated with the contaminants adhering to the substrate 9. When the processed substrate 9 is delivered, the processed substrate 9 is held on the non-contaminated fixed mounting portion 39, so that the processed substrate 9 is prevented from being contaminated. On the contrary, it is also possible to transfer the unprocessed substrate 9 to the fixed mounting part 39 with the elevating and lowering part 38 in the lowered position and to transfer the processed substrate 9 with the elevating and lowering part 38 to the elevated position. Similarly, it is possible to prevent the treated substrate 9 from being contaminated.

【0029】なお、昇降載置部38及び固定載置部39
には、図4(C)に示すように、そこに載置する基板9
の主面方向(同図4における紙面に平行な方向)にカセ
ット8が有する基板整列収容溝と同一ピッチの基板整列
保持溝90が設けられており、また、この基板整列保持
溝90の解放上側縁部92は、基板の保持を円滑にする
ためハの字状の面取りがしてある。また、二個の昇降載
置部38と三個の固定載置部39は、図4(B)に示す
ように、一体加工された通常の基板載置部18を鎖線部
分で切断することにより容易に製作できる。
Incidentally, the elevating and lowering mounting portion 38 and the fixed mounting portion 39
As shown in FIG. 4 (C), the substrate 9 placed on the
Is provided with a substrate alignment holding groove 90 having the same pitch as the substrate alignment holding groove of the cassette 8 in the main surface direction (the direction parallel to the paper surface in FIG. 4), and the upper side of the release of the substrate alignment holding groove 90. The edge portion 92 is chamfered in a V shape to facilitate the holding of the substrate. In addition, as shown in FIG. 4B, the two lifting / lowering mounting portions 38 and the three fixed mounting portions 39 are formed by cutting the integrally processed normal substrate mounting portion 18 at the chain line portion. Easy to make.

【0030】上記昇降載置部38と固定載置部39に
は、図4(B)で示すように、そこに保持する基板9の
外周に沿う形状の上記基板整列保持溝90が切設されて
おり、この基板整列保持溝90は、基板9のオリエンテ
ーションフラットに対応する直線部95とそれ以外の湾
曲部96とから成る。即ち、中央の固定載置部39とそ
の両側の昇降載置部38・38とにかけて、基板9のオ
リエンテーションフラットに対応する直線部95が切設
され、当該昇降載置部38からその外側の固定載置部3
9にかけて湾曲部96が切設されている。つまり、昇降
載置部38・38が直線部分95と湾曲部96とを有
し、かつ固定載置部39が直線部分95と湾曲部96と
を有することにより、昇降載置部分38又は固定載置部
分39のいずれかにより基板9を保持した場合であって
も、基板9の回転を防止することができる。
As shown in FIG. 4B, the substrate aligning and holding groove 90 having a shape along the outer periphery of the substrate 9 held therein is cut in the elevating and lowering mounting portion 38 and the fixed mounting portion 39. The substrate alignment holding groove 90 is composed of a straight line portion 95 corresponding to the orientation flat of the substrate 9 and a curved portion 96 other than the straight line portion 95. That is, a straight line portion 95 corresponding to the orientation flat of the substrate 9 is cut between the fixed mounting portion 39 in the center and the elevating mounting portions 38, 38 on both sides thereof, and the elevating mounting portion 38 is fixed to the outside thereof. Placement part 3
A curved portion 96 is cut through to 9. That is, the elevating and lowering mounting portions 38, 38 have the straight line portion 95 and the curved portion 96, and the fixed mounting portion 39 has the straight line portion 95 and the curved portion 96, so that the elevating and lowering mounting portion 38 or the fixed mounting portion 38 is fixed. Even when the substrate 9 is held by any of the placing portions 39, the rotation of the substrate 9 can be prevented.

【0031】なお、上記実施例では、基板受け渡し具1
7の基板載置部18が、昇降載置部38と固定載置部3
9とから成り、昇降載置部38が昇降して固定載置部3
9が固定されたものとして説明したが、両者を昇降可能
に構成することもできる。
In the above embodiment, the substrate transfer tool 1
The substrate mounting part 18 of FIG.
9, and the elevating and lowering part 38 moves up and down to move the fixed mounting part 3
Although the description has been made assuming that 9 is fixed, both can be configured to be movable up and down.

【0032】ところで、図5に示すように、この基板受
け渡し具17は、二個のカセット8内と基板搬送ロボッ
ト4との間で基板9の受け渡しを行うため、二個設けら
れており、この二個の基板受け渡し具17は幅寄せ装置
42で幅寄せ可能にしてある。この幅寄せ装置42の構
成は次の通りである。図6(A)に示すように、両パイ
プ支持台31を昇降台20上のガイドレール43にスラ
イド自在に支持し、両パイプ支持台31を幅寄せリンク
機構44で連結してある。幅寄せリンク機構44は、図
6(A)に示すように、昇降台20の中央部から垂設し
た支軸82にリンクアーム83の中央部を枢着し、リン
クアーム83の両端部と両パイプ支持台31との間にリ
ンクロッド84を介設して構成してある。そして、図6
(B)に示すように、昇降台20に取り付けた幅寄せ駆
動用シリンダ45に一方のパイプ支持台31を連動連結
してある。
By the way, as shown in FIG. 5, two substrate transfer tools 17 are provided to transfer the substrates 9 between the two cassettes 8 and the substrate transfer robot 4. The two substrate transfer tools 17 can be width-shifted by the width-shifting device 42. The structure of the width aligning device 42 is as follows. As shown in FIG. 6 (A), both pipe support bases 31 are slidably supported by guide rails 43 on the lifting base 20, and both pipe support bases 31 are connected by a width-shifting link mechanism 44. As shown in FIG. 6 (A), the width-shifting link mechanism 44 pivotally attaches the center portion of the link arm 83 to a support shaft 82 vertically extending from the center portion of the elevating table 20, and connects both end portions of the link arm 83 and both ends. A link rod 84 is provided between the pipe support 31 and the pipe support 31. And FIG.
As shown in (B), one pipe support base 31 is interlockingly connected to the width-shifting drive cylinder 45 attached to the lift base 20.

【0033】この幅寄せ装置42では、幅寄せ駆動用シ
リンダ45を縮小させると、これに連結した一方のパイ
プ支持台31が昇降台20の中央側に寄ると同時に、幅
寄せリンク機構44を介して他方のパイプ支持台31も
昇降台20の中央側に寄り、双方の基板受け渡し具17
が幅寄せされる。また、幅寄せ駆動用シリンダ45を伸
長させると、双方の基板受け渡し具17が相互に遠ざか
る。この幅寄せ装置42では、図5に示すように、基板
処理前に、二個のカセット8内から二群の未処理基板9
を基板搬送ロボット4に受け渡すに当たり、二個の基板
受け渡し具17の基板載置部18にそれぞれ各群の未処
理基板9を保持させ、双方の基板受け渡し具17を幅寄
せにより近づけ、二群の未処理基板9の間に大きな隙間
を作ることなく、これらを基板搬送ロボット4に受け渡
す。また、基板処理後に、カセット8二個分の処理済み
基板9を基板搬送ロボット4から二個の洗浄済みカセッ
ト8に受け渡すに当たり、基板搬送ロボット4で搬送さ
れてきた処理済み基板9を、カセット8の上方で幅寄せ
しておいた二個の基板受け渡し具17の両基板載置部1
8に保持させ、両基板受け渡し具17を遠ざけて、処理
済み基板9を二群に分離し、各群を二個の洗浄済みカセ
ット8に収容する。
In the width-shifting device 42, when the width-shifting drive cylinder 45 is contracted, one pipe support 31 connected to the width-shifting cylinder 45 approaches the center of the lift table 20 and at the same time, the width-shifting link mechanism 44 is used. And the other pipe support 31 is also closer to the center of the lift table 20, and both board transfer tools 17
Are width-shifted. Further, when the width-shifting drive cylinder 45 is extended, both substrate transfer tools 17 are moved away from each other. In the width aligning device 42, as shown in FIG. 5, two groups of unprocessed substrates 9 from inside the two cassettes 8 are processed before substrate processing.
In transferring the substrate to the substrate transfer robot 4, the unprocessed substrates 9 of each group are respectively held by the substrate mounting portions 18 of the two substrate transfer tools 17, and both the substrate transfer tools 17 are moved closer to each other, and the two groups are transferred. These are delivered to the substrate transfer robot 4 without forming a large gap between the untreated substrates 9. In addition, after transferring the processed substrates 9 for two cassettes 8 from the substrate transfer robot 4 to the two cleaned cassettes 8 after the substrate processing, the processed substrates 9 transferred by the substrate transfer robot 4 are transferred to the cassettes. Both substrate mounting parts 1 of the two substrate transfer tools 17 that have been width-shifted above 8
8, the substrate transfer tools 17 are moved away from each other, the processed substrates 9 are separated into two groups, and each group is housed in the two cleaned cassettes 8.

【0034】次に、基板搬送ロボット4の構成を説明す
る。図1に示すように、この基板搬送ロボット4は、走
行部本体46と、この走行部本体46から略水平に突出
した左右一対のアーム回転軸47と、この一対のアーム
回転軸47を回転させる軸回転手段48と、各アーム回
転軸47に固定された一対の基板チャック49とを備え
ている。一対の基板チャック49は、一対のチャック対
向面50同士と、その裏面のチャック対向面51同士と
に、それぞれカセット8の基板整列収容溝の配列ピッチ
と同一の基板整列保持溝52・53が形成され、アーム
回転軸47の回転により、基板チャック49をその一対
のチャック対向面50同士及びその裏面のチャック対向
面51同士がそれぞれ対向する逆ハの字状の基板保持姿
勢に切り替え可能に構成してある。なお、チャック対向
面50・51の基板整列保持溝52・53の配列ピッチ
は、カセット8の基板整列収容溝の配列ピッチと必ずし
も同一にしなくとも良く、カセット8の当該配列ピッチ
の1/2の配列ピッチにしても良い。カセット8から取
り出した基板9を配列ピッチ変換装置等で1/2に変換
する場合が考えられるからである。
Next, the structure of the substrate transfer robot 4 will be described. As shown in FIG. 1, the substrate transfer robot 4 rotates a traveling unit main body 46, a pair of left and right arm rotating shafts 47 protruding substantially horizontally from the traveling unit main body 46, and the pair of arm rotating shafts 47. It is provided with a shaft rotating means 48 and a pair of substrate chucks 49 fixed to each arm rotating shaft 47. In the pair of substrate chucks 49, the substrate alignment holding grooves 52 and 53 having the same pitch as the arrangement pitch of the substrate alignment accommodation grooves of the cassette 8 are formed on the pair of chuck facing surfaces 50 and on the back surface of the chuck facing surfaces 51. By rotating the arm rotation shaft 47, the substrate chuck 49 can be switched to the inverted C-shaped substrate holding attitude in which the pair of chuck facing surfaces 50 and the chuck facing surfaces 51 on the back surface thereof face each other. There is. The arrangement pitch of the substrate alignment holding grooves 52, 53 of the chuck facing surfaces 50, 51 does not necessarily have to be the same as the arrangement pitch of the substrate alignment holding grooves of the cassette 8, and is 1/2 the arrangement pitch of the cassette 8. The arrangement pitch may be used. This is because it is conceivable that the substrate 9 taken out from the cassette 8 may be converted into ½ by an array pitch conversion device or the like.

【0035】この基板搬送ロボット4では、未処理基板
9を搬送する場合には、基板チャック49の一対のチャ
ック対向面50同士が対向する姿勢にし、処理済み基板
9を搬送する場合には、裏面のチャック対抗面51同士
が対向する姿勢に切り替えて使い分ける。このようにす
ると、未処理基板9の搬送に際しては、裏面のチャック
対抗面51の基板整列保持溝53が未処理基板9に付着
した汚染物質で汚染されることがなく、処理済み基板9
の搬送に際して、処理済み基板9の汚染が防止される。
In this substrate transfer robot 4, when the unprocessed substrate 9 is transferred, the pair of chuck facing surfaces 50 of the substrate chuck 49 are placed in a posture in which they face each other, and when the processed substrate 9 is transferred, the back surface is returned. The chuck opposing surfaces 51 are switched to a posture in which they oppose each other and are used properly. In this way, when the unprocessed substrate 9 is transported, the substrate alignment holding groove 53 of the chuck opposing surface 51 on the back surface is not contaminated by the contaminants adhering to the unprocessed substrate 9, and the processed substrate 9 is processed.
The contamination of the processed substrate 9 is prevented during the transportation of the.

【0036】なお、本発明に係る基板洗浄装置は、酸化
拡散工程の前処理洗浄装置として適用することも可能で
あり、その場合には、既に洗浄された基板を洗浄するこ
とになるので、基板はある程度きれいで、クロスコンタ
ミネーションもないから、汚染の防止というよりも、後
述するように洗浄処理の前後、つまり乾いた基板の保持
と濡れた基板の保持とで基板チャック49を使い分ける
こともできる。
The substrate cleaning apparatus according to the present invention can also be applied as a pretreatment cleaning apparatus for the oxidation diffusion step. In that case, the already cleaned substrate will be cleaned. Is clean to some extent and has no cross-contamination, so rather than preventing contamination, the substrate chuck 49 can be selectively used before and after the cleaning process, that is, holding a dry substrate and holding a wet substrate as described later. .

【0037】基板チャック49の具体的構成は次の通り
である。図7(A)に示すように、基板チャック49
は、板状のチャック本体54の両端にエンドプレート5
5を備え、チャック本体54の中央部とエンドプレート
55の中央部とにアーム回転軸47を挿通して固定して
ある。エンドプレート55間には一対の補強パイプ59
を平行に架設し、これをチャック本体54内に挿通して
固定してある。図7(B)に示すように、チャック本体
54の基板整列保持溝52・53は、いずれも基板9の
周縁に沿う円弧状に形成してある。また、図7(C)に
示すように、この基板整列保持溝52・53の解放縁部
57はハの字状に面取りしてある。この基板チャック4
9は、図7(D)・(E)に示すように、基板整列保持溝5
2・53を等ピッチで周設した溝形成パイプ58を補強
パイプ59に外嵌して構成してもよい。この場合、補強
パイプ59にエンドプレート55をネジ止めすることに
より、両エンドプレート55間で溝形成パイプ58を挟
圧固定することができる。
The specific structure of the substrate chuck 49 is as follows. As shown in FIG. 7A, the substrate chuck 49
Is attached to both ends of the plate-shaped chuck body 54.
5, the arm rotation shaft 47 is inserted through and fixed to the central portion of the chuck body 54 and the central portion of the end plate 55. A pair of reinforcing pipes 59 is provided between the end plates 55.
Are installed in parallel, and are inserted and fixed in the chuck body 54. As shown in FIG. 7B, the substrate alignment holding grooves 52, 53 of the chuck body 54 are both formed in an arc shape along the peripheral edge of the substrate 9. Further, as shown in FIG. 7C, the release edge portions 57 of the substrate alignment holding grooves 52 and 53 are chamfered in a V shape. This substrate chuck 4
9 is a substrate alignment holding groove 5 as shown in FIGS.
The groove forming pipe 58 in which 2 and 53 are provided at equal pitches may be externally fitted to the reinforcing pipe 59. In this case, by screwing the end plate 55 to the reinforcing pipe 59, the groove forming pipe 58 can be clamped and fixed between the end plates 55.

【0038】また、図8(A)に示すように、アーム回
転軸47を回転させる軸回転手段48には、一対の軸回
転用モータを用いている。この軸回転用モータは走行部
本体46に固定し、各出力軸60にアーム回転軸47を
軸継ぎ手61で連結し、両アーム回転軸47をそれぞれ
個別に回転連動するようにしてある。また、走行部本体
46の走行駆動手段62には、走行駆動モータを用いて
いる。この走行駆動モータは、固定機枠63に固定し、
その出力軸64に駆動プーリ65を取り付け、固定機枠
63に枢着した遊動プーリ(図外)と駆動プーリ65と
の間に連動ベルト66を巻き掛け、この連動ベルト66
に走行部本体46を取り付けてある。また、図8(B)
に示すように、走行部本体46は、固定機枠63上に設
けたガイドレール67上にスライド自在に取り付けてあ
る。
Further, as shown in FIG. 8A, a pair of shaft rotating motors are used as the shaft rotating means 48 for rotating the arm rotating shaft 47. This shaft rotating motor is fixed to the traveling unit main body 46, the arm rotating shaft 47 is connected to each output shaft 60 by the shaft joint 61, and both arm rotating shafts 47 are individually rotatably interlocked. A travel drive motor is used as the travel drive means 62 of the travel section main body 46. This traveling drive motor is fixed to the stationary machine frame 63,
A drive pulley 65 is attached to the output shaft 64, and an interlocking belt 66 is wound between an idler pulley (not shown) pivotally attached to the stationary machine frame 63 and the drive pulley 65.
The traveling unit body 46 is attached to the. In addition, FIG. 8 (B)
As shown in, the traveling unit main body 46 is slidably mounted on a guide rail 67 provided on the stationary machine frame 63.

【0039】この基板搬送ロボット4は、図8(C)に
示すように、軸回転手段48に一個の軸回転用モータを
用い、その出力軸60に取り付けた駆動ギヤ68に反転
ギヤ69を噛み合わせ、一方のアーム回転軸47に取り
付けた入力ギヤ70を駆動ギヤ68に、他方のアーム回
転軸47に取り付けた入力ギヤ71を反転ギヤ69にそ
れぞれ噛み合わせる構成としてもよい。また、図8
(D)に示すように、走行駆動手段62である走行駆動
モータを走行部本体46に取り付け、その出力軸64に
取り付けたピニオンギヤ72を固定機枠63に取り付け
たラックギヤ73に噛み合わせ、走行部本体46を自走
式にしてもよい。
As shown in FIG. 8C, the substrate transfer robot 4 uses a single shaft rotating motor as the shaft rotating means 48, and a drive gear 68 attached to the output shaft 60 of the substrate rotating robot 4 meshes a reversing gear 69. In addition, the input gear 70 attached to one arm rotation shaft 47 may be engaged with the drive gear 68, and the input gear 71 attached to the other arm rotation shaft 47 may be engaged with the reversing gear 69. Also, FIG.
As shown in (D), a traveling drive motor, which is the traveling drive means 62, is attached to the traveling portion main body 46, and the pinion gear 72 attached to the output shaft 64 of the traveling portion is engaged with the rack gear 73 attached to the stationary machine frame 63. The body 46 may be self-propelled.

【0040】図9(A)〜(D)は、基板チャック49
の変形例を示す。同図(A)の変形例は乾いた基板の保
持と濡れた基板の保持とで基板チャック49を使い分け
る場合を考慮したもので、図7(A)中の前記チャック
本体54の上下両端部に前後方向へ走る液止め溝54a
を凹入形成したものである。この変形例によれば、後述
する基板処理部5で浸漬処理を終えた基板9を保持した
際に、基板9に付着した液滴が基板整列保持溝53を伝
ってこの液止め溝54a内に導入される。従って、他方
の一対のチャック対向面50で乾いた基板9を保持する
際に、この液止め溝54aは上方に位置することとなる
が、この液止め溝54a内では、その液滴が自らの表面
張力により流下するのを阻止し、乾いた基板9に付着す
るのを防止する。なお、この液止め溝54aは、図9
(B)〜(D)の変形例においても同様に形成されてい
る。
FIGS. 9A to 9D show the substrate chuck 49.
A modification of is shown. The modified example of FIG. 7A considers the case where the substrate chuck 49 is selectively used for holding a dry substrate and holding a wet substrate, and the upper and lower end portions of the chuck body 54 in FIG. Liquid stop groove 54a running in the front-back direction
Is formed by recessing. According to this modification, when the substrate 9 that has undergone the dipping process is held by the substrate processing unit 5 to be described later, the droplets attached to the substrate 9 travel along the substrate alignment holding groove 53 and enter the liquid stop groove 54a. be introduced. Therefore, when the dry substrate 9 is held by the other pair of chuck facing surfaces 50, the liquid stop groove 54a is positioned above, but the liquid drop groove 54a has its own liquid drop inside the liquid stop groove 54a. It is prevented from flowing down by the surface tension and is prevented from adhering to the dry substrate 9. The liquid stop groove 54a is shown in FIG.
The modified examples of (B) to (D) are similarly formed.

【0041】同図(B)の変形例は、チャック本体54
を図7(A)中の板部材に替えて断面略四角形状の棒部
材で構成したもので、アーム回転軸47を後述するアク
チュエータ47aで相互に離間させるとともに、アーム
回転軸47を回転させてチャック対抗面50a・50b
を切り替えるように構成してある。同図(C)の変形例
は、チャック本体54を上記図8(B)のものに替えて
基板9を中央部で保持するように構成したもので、その
他の点は図8(B)と同様に構成してある。また、同図
(D)の変形例は、チャック本体54を上記図8(A)
〜(C)のものに替えて断面略三角形状の棒部材で構成
し、三組のチャック対抗面50a・50b・50cを切
り替えるようにしたもので、その他の点は図8(B)と
同様に構成してある。
A modified example of FIG. 6B is a chuck body 54.
7A instead of the plate member in FIG. 7A, and is configured by a bar member having a substantially square cross section. The arm rotation shafts 47 are separated from each other by an actuator 47a described later, and the arm rotation shafts 47 are rotated. Chuck facing surface 50a, 50b
Is configured to be switched. The modified example of FIG. 8C is configured such that the chuck body 54 is replaced with that of FIG. 8B and the substrate 9 is held in the central portion. It is similarly configured. Further, in the modified example of FIG. 8D, the chuck main body 54 is replaced with the one shown in FIG.
8 (C) is composed of a rod member having a substantially triangular cross section, and three sets of chuck opposing surfaces 50a, 50b, 50c are switched, and other points are the same as in FIG. 8 (B). Is configured.

【0042】図10はアーム回転軸47を離間及び回転
させる手段を示す斜視図である。上記一対のアーム回転
軸47は、図10で示すように、それぞれ左右一対の基
台46b・46bに設けられ、各基台46bはそれぞれ
左右一対のアクチュエータ48b・48bにより、走行
部本体46の上に設けた前後一対のガイドレール67b
に沿って移動可能に設けられている。その他の点は、図
8(A)と同様に構成されている。
FIG. 10 is a perspective view showing means for separating and rotating the arm rotation shaft 47. As shown in FIG. 10, the pair of arm rotation shafts 47 are respectively provided on a pair of left and right bases 46b and 46b, and each base 46b is mounted on the traveling unit main body 46 by a pair of left and right actuators 48b and 48b. Front and rear guide rails 67b provided on the
It is provided so as to be movable along. The other points are configured similarly to FIG. 8 (A).

【0043】基板処理部5は、図1・図2及び図11に
示すように、三個の処理槽74を備え、これらの処理槽
74は、いわゆる1浴処理を可能とするオーバーフロー
槽として構成されている。各処理槽74にはそれぞれ基
板9を支持する処理基板載置具75が付設されている。
この処理基板載置具75は、図2または図11に示す昇
降駆動手段76に連動連結して、昇降可能としてある。
すなわち、図1に示すように、前記基板移載部3におい
て基板移し替え具17の基板載置部18に保持した基板
9を基板搬送ロボット4に受け渡す位置を第一の基板受
け渡し位置77とし、各処理槽74の処理基板載置具7
5に保持した基板9を基板搬送ロボット4に受け渡す位
置を第二の基板受け渡し位置78(図1においては、中
央の処理槽74について図示している)とすると、処理
基板載置具75の昇降により、ここに保持した基板9
を、第二の基板受け渡し位置78と、処理槽74内に浸
漬してその処理を行う基板処理位置79との間で昇降で
きるようにしてある。そして、前記基板搬送ロボット4
は、第一の基板受け渡し位置77と第二の基板受け渡し
位置78との間で走行させるようにしてある。
As shown in FIGS. 1, 2 and 11, the substrate processing section 5 is provided with three processing baths 74, and these processing baths 74 are constructed as overflow baths which enable so-called one bath processing. Has been done. Each of the processing baths 74 is provided with a processing substrate mounting tool 75 that supports the substrate 9.
The processing substrate platform 75 can be moved up and down by interlocking with the up-and-down drive means 76 shown in FIG. 2 or 11.
That is, as shown in FIG. 1, the first substrate transfer position 77 is a position at which the substrate 9 held by the substrate transfer unit 17 of the substrate transfer unit 17 in the substrate transfer unit 3 is transferred to the substrate transfer robot 4. , Processing substrate placement tool 7 of each processing tank 74
Assuming that the substrate 9 held on the substrate 5 is transferred to the substrate transfer robot 4 at a second substrate transfer position 78 (in FIG. 1, the central processing tank 74 is shown), Substrate 9 held here by raising and lowering
Can be moved up and down between a second substrate transfer position 78 and a substrate processing position 79 where the substrate is immersed in the processing bath 74 to perform the processing. Then, the substrate transfer robot 4
Runs between the first substrate transfer position 77 and the second substrate transfer position 78.

【0044】なお、前述した実施例では、基板搬送ロボ
ット4を一対のガイドレール67に沿って水平方向にの
み走行させているが、基板移載部3や基板処理部5等の
配置に応じて、第一の基板受け渡し位置と第二の基板受
け渡し位置との間を、垂直方向をも含めた二軸あるいは
三軸方向に移動させることも可能である。この明細書で
いう走行とは、このような二軸あるいは三軸方向の移動
をも含む概念である。
In the above-described embodiment, the substrate transfer robot 4 is run only in the horizontal direction along the pair of guide rails 67. However, depending on the arrangement of the substrate transfer section 3, the substrate processing section 5, etc. It is also possible to move the first substrate transfer position and the second substrate transfer position in biaxial or triaxial directions including the vertical direction. Traveling in this specification is a concept including such biaxial or triaxial movement.

【0045】この基板処理部5では、基板搬送ロボット
4で搬送してきた未処理基板9を、上昇してきた処理基
板載置部75に引き渡し、処理基板載置部75を下降さ
せて、未処理基板9を処理槽74の基板処理位置79に
位置させ、処理液80に浸漬して処理を行う。処理槽7
4での基板処理が終了すると、処理基板載置部75を上
昇させて、基板搬送ロボット4に引き渡す。このよう
に、未処理基板9を基板処理部5の処理基板載置部75
で保持して昇降させることにより、基板9を保持する基
板搬送ロボット4の基板チャック49を処理槽74の処
理液80に浸漬する必要がなくなり、基板チャック49
に付着した汚染物質が処理槽74内に持ち込まれること
がない。そのうえ、基板チャック49を処理槽74に侵
入させる必要がないため、基板チャック49の垂下寸法
を短くでき、基板搬送中に基板チャック49が振動しに
くくなり、基板9と基板チャック49の基板整列保持溝
52・53との摺動によるパーティクルの発生が軽減さ
れ、処理槽74へのパーティクルの侵入が軽減される。
In this substrate processing unit 5, the unprocessed substrate 9 transferred by the substrate transfer robot 4 is delivered to the raised processing substrate mounting unit 75, and the processed substrate mounting unit 75 is lowered to move the unprocessed substrate. 9 is positioned at the substrate processing position 79 of the processing tank 74, and is immersed in the processing liquid 80 for processing. Processing tank 7
When the substrate processing in 4 is completed, the processing substrate platform 75 is raised and delivered to the substrate transfer robot 4. In this way, the unprocessed substrate 9 is transferred to the processed substrate placing portion 75 of the substrate processing unit 5.
The substrate chuck 49 of the substrate transfer robot 4 that holds the substrate 9 does not need to be immersed in the processing liquid 80 in the processing bath 74 by holding the substrate chuck 49 up and down.
The contaminants adhered to are not brought into the processing tank 74. Moreover, since it is not necessary to intrude the substrate chuck 49 into the processing bath 74, the hanging dimension of the substrate chuck 49 can be shortened, the substrate chuck 49 is less likely to vibrate during the substrate transfer, and the substrate 9 and the substrate chuck 49 are aligned and held. Generation of particles due to sliding with the grooves 52 and 53 is reduced, and intrusion of particles into the processing bath 74 is reduced.

【0046】以下、本実施例装置の一連の動作を簡単に
説明する。先ず、複数の未処理基板Wを収納した2個の
カセット8は、カセット搬出入ステージ1の搬入位置1
0へ搬入されている。カセット搬送ロボット2が上記2
個のカセット8を基板移載部3のターンテーブル13上
に移載する。ターンテーブル13が90゜回転した後、
基板移し替え具17が上昇してカセットCから基板9を
取り出す。このとき、基板移し替え具17の基板載置部
18が昇降載置部38に切り替えられて未処理基板を保
持し、処理済み基板の汚染を防止する。
A series of operations of the apparatus of this embodiment will be briefly described below. First, the two cassettes 8 storing a plurality of unprocessed substrates W are loaded at the loading position 1 of the cassette loading / unloading stage 1.
It has been shipped to 0. The cassette transfer robot 2 has the above 2
The individual cassettes 8 are transferred onto the turntable 13 of the substrate transfer unit 3. After the turntable 13 has rotated 90 degrees,
The substrate transfer tool 17 moves up to take out the substrate 9 from the cassette C. At this time, the substrate platform 18 of the substrate transfer tool 17 is switched to the elevating platform 38 to hold the unprocessed substrate and prevent the processed substrate from being contaminated.

【0047】基板搬送ロボット4はカセット8から取り
出された未処理基板9を受け取り、基板処理部5に搬送
する。このとき、処理済み基板の汚染を防止するため、
基板搬送ロボット4の基板チャック49のチャック対抗
面50・51を前記のように未処理基板と処理済み基板
とで使い分け、処理済み基板の汚染を防止する。基板処
理部5では、基板搬送ロボット4で搬送されてきた基板
9を処理基板載置具75で受け取り、所定の基板処理槽
74に順次浸漬して表面処理をする。表面処理された基
板Wは基板搬送ロボット4により基板乾燥部6に搬送す
る。基板乾燥部6では、搬送されてきた基板9を前記基
板移し替え具17と同様のリフター(図示せず)で受け
取り、遠心式乾燥機61内で乾燥処理する。
The substrate transfer robot 4 receives the unprocessed substrate 9 taken out from the cassette 8 and transfers it to the substrate processing section 5. At this time, in order to prevent contamination of the processed substrate,
As described above, the chuck opposing surfaces 50 and 51 of the substrate chuck 49 of the substrate transfer robot 4 are used separately for the unprocessed substrate and the processed substrate, thereby preventing contamination of the processed substrate. In the substrate processing unit 5, the substrate 9 transferred by the substrate transfer robot 4 is received by the processing substrate placement tool 75, and sequentially immersed in a predetermined substrate processing bath 74 to perform surface treatment. The surface-treated substrate W is transferred to the substrate drying unit 6 by the substrate transfer robot 4. In the substrate drying unit 6, the transported substrate 9 is received by a lifter (not shown) similar to the substrate transfer tool 17, and is dried in the centrifugal dryer 61.

【0048】一方、基板の表面処理の間に、カセット搬
送ロボット2は空になった2個のカセット8をカセット
洗浄部7に搬送する。カセット洗浄部7では、搬送され
てきた2個のカセット8をカセットリフタ(図示せず)
で受け取り、カセット洗浄槽内に浸漬して洗浄処理をす
るとともに、洗浄終了後は排水してヒータ(図示せず)
で乾燥する。つまり、基板9の表面処理とカセット8の
洗浄処理とを並行して行うことにより、全体として処理
効率を高めるのである。
On the other hand, during the surface treatment of the substrate, the cassette transfer robot 2 transfers the two empty cassettes 8 to the cassette cleaning section 7. In the cassette cleaning unit 7, the two cassettes 8 that have been transported are cassette lifters (not shown).
Received in the cassette cleaning tank and immersed in the cleaning tank for cleaning, and drained after cleaning, heater (not shown)
To dry. That is, by performing the surface treatment of the substrate 9 and the cleaning treatment of the cassette 8 in parallel, the treatment efficiency as a whole is improved.

【0049】カセット搬送ロボット2は、乾燥を終えた
カセット8を再び基板移載部3のターンテーブル13上
に移載する。乾燥を終えた基板7は基板搬送ロボット4
により基板移載部3に搬送されてくる。基板移載部3で
は基板移し替え具17を介して処理済み基板9を洗浄済
みカセット8内に収容する。このとき、基板移し替え具
17の基板載置部18が固定載置部39に切り替えられ
て処理済み基板を保持し、処理済み基板の汚染を防止す
る。カセット搬送ロボット2は基板9を収容した2個の
カセット8をカセット搬出入ステージ1の搬出部12に
搬送する。以上で一連の動作が終了する。
The cassette transfer robot 2 transfers the dried cassette 8 onto the turntable 13 of the substrate transfer section 3 again. The dried substrate 7 is the substrate transfer robot 4
Are transported to the substrate transfer section 3. In the substrate transfer section 3, the processed substrate 9 is accommodated in the cleaned cassette 8 via the substrate transfer tool 17. At this time, the substrate mounting part 18 of the substrate transfer tool 17 is switched to the fixed mounting part 39 to hold the processed substrate and prevent the processed substrate from being contaminated. The cassette transfer robot 2 transfers the two cassettes 8 containing the substrates 9 to the unloading section 12 of the cassette unloading stage 1. With that, a series of operations is completed.

【0050】なお、本発明に係る基板洗浄装置は、前記
のように酸化拡散工程の前処理洗浄装置として適用する
ことも可能であり、この場合には、基板の汚染は問題に
ならないので、基板受け渡し具17の昇降載置部38と
固定載置部39との切り替えは不要である。むしろ洗浄
処理の前後や乾燥の前後、つまり乾いた基板を保持する
場合と濡れた基板を保持する場合とで基板チャック49
のチャック対抗面50・51を使い分けることが必要に
なる。基板の種類によっては、乾燥状態で濡れた基板チ
ャック49に接触すると、ウォータマークと称するしみ
が発生することがあるからである。上記のようにチャッ
ク対抗面50・51を使い分けることにより、ウォータ
マークの発生を防止することができる。なお、洗浄処理
の前に濡れた基板チャックで基板を保持しても、ウォー
タマークによる影響は問題とはならない。その後に洗浄
処理を行うからである。
The substrate cleaning apparatus according to the present invention can also be applied as a pretreatment cleaning apparatus for the oxidation diffusion step as described above. In this case, the contamination of the substrate does not pose a problem, so It is not necessary to switch between the elevating and lowering mount 38 and the fixed mount 39 of the delivery tool 17. Rather, the substrate chuck 49 is used before and after the cleaning process and before and after the drying process, that is, when the dry substrate is held and when the wet substrate is held.
It is necessary to properly use the chuck opposing surfaces 50 and 51. This is because, depending on the type of substrate, when it comes into contact with the substrate chuck 49 that is wet in a dry state, a stain called a watermark may occur. By properly using the chuck opposing surfaces 50 and 51 as described above, it is possible to prevent the generation of the watermark. Even if the substrate is held by the wet substrate chuck before the cleaning process, the influence of the watermark does not pose a problem. This is because the cleaning process is performed after that.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例に係る基板処理装置の縦断正面
図である。
FIG. 1 is a vertical sectional front view of a substrate processing apparatus according to an embodiment of the present invention.

【図2】図1の基板処理装置の平面図である。FIG. 2 is a plan view of the substrate processing apparatus of FIG.

【図3】図1の基板処理装置で用いるターンテーブルの
説明図で、同図(A)は縦断面図、同図(B)は平面
図、同図(C)は同図(A)のC−C線断面図、同図
(D)はターンテーブルの回転駆動機構の第1変更例の
同図(C)相当図、同図(E)はターンテーブルの回転
駆動機構の第2変更例の同図(C)相当図である。
3A and 3B are explanatory views of a turntable used in the substrate processing apparatus of FIG. 1, where FIG. 3A is a vertical sectional view, FIG. 3B is a plan view, and FIG. C-C line sectional drawing, the same figure (D) the same figure (C) equivalent figure of the 1st modification of the rotary drive mechanism of the turntable, the same figure (E) the 2nd modification of the rotary drive mechanism of the turntable. It is a figure equivalent to the same figure (C).

【図4】図1の基板処理装置で用いる基板受け渡し具を
説明する図で、同図(A)は縦断面図、同図(B)は基
板受け渡し具の基板載置部の製作例の説明図、同図
(C)は基板載置部の一部断面図である。
4A and 4B are diagrams illustrating a substrate transfer tool used in the substrate processing apparatus of FIG. 1, FIG. 4A is a vertical cross-sectional view, and FIG. 4B is a description of an example of manufacturing a substrate mounting portion of the substrate transfer tool. FIG. 1C is a partial cross-sectional view of the substrate mounting portion.

【図5】図1のV−V線断面図である。5 is a sectional view taken along line VV of FIG.

【図6】図1の基板処理装置で用いる幅寄せリンク機構
の説明図で、同図(A)は縦断面図、同図(B)は平面
図である。
6A and 6B are explanatory views of a width-shifting link mechanism used in the substrate processing apparatus of FIG. 1, where FIG. 6A is a vertical sectional view and FIG. 6B is a plan view.

【図7】図1の基板処理装置で用いる基板搬送ロボット
の基板チャックを説明する図で、同図(A)は斜視図、
同図(B)は同図(A)のB−B線断面図、同図(C)
は同図(B)のC−C線断面図、同図(D)は基板チャ
ックの変更例の縦断面図、同図(E)は同図(D)のE
−E線断面図である。
7 is a diagram illustrating a substrate chuck of a substrate transfer robot used in the substrate processing apparatus of FIG. 1, FIG.
FIG. 3B is a sectional view taken along line BB of FIG.
Is a cross-sectional view taken along the line CC of FIG. 6B, FIG. 6D is a vertical cross-sectional view of a modified substrate chuck, and FIG.
It is a -E line sectional view.

【図8】図1の基板処理装置で用いる基板搬送ロボット
の基板チャック回転機構と走行部本体の走行機構を説明
する図で、同図(A)は斜視図、同図(B)は同図
(A)の側面図、同図(C)は変更例の斜視図、同図
(D)は同図(C)の側面図である。
8A and 8B are views for explaining a substrate chuck rotating mechanism and a traveling mechanism of a traveling unit main body of a substrate transfer robot used in the substrate processing apparatus of FIG. 1, in which FIG. 8A is a perspective view and FIG. (A) is a side view, (C) is a perspective view of a modification, and (D) is a side view of (C).

【図9】(A)(B)(C)(D)は、それぞれ基板チャックの
変形例を示す正面図である。
9A, 9B, 9C and 9D are front views showing modified examples of the substrate chuck.

【図10】図9(B)(C)(D)に示す基板チャックの離間
及び回転機構を示す図8図(A)に相当する斜視図であ
る。
10 is a perspective view corresponding to FIG. 8 (A) showing a separation and rotation mechanism of the substrate chuck shown in FIGS. 9 (B) (C) (D).

【図11】図1の基板処理装置の斜視図である。11 is a perspective view of the substrate processing apparatus of FIG.

【図12】従来技術に係る基板処理装置の図1相当図で
ある。
FIG. 12 is a diagram corresponding to FIG. 1 of a substrate processing apparatus according to a conventional technique.

【図13】図12の基板処理装置の平面図である。13 is a plan view of the substrate processing apparatus of FIG.

【符号の説明】[Explanation of symbols]

3…基板移載部、 4…基板搬送ロ
ボット、5…基板処理部、 8…カ
セット、9…基板、 17…基
板受け渡し具、18…基板載置部、
46…走行部本体、47…アーム回転軸、
48…軸回転手段、49…基板チャック、
50・51…チャック対向面、52・53…基
板整列保持溝、 62…走行駆動装置、74…処
理槽、 75…処理基板載置具、
76…処理基板載置具の昇降駆動手段、77…第一の基
板受け渡し位置、78…第二の基板受け渡し位置、
79…基板処理位置、81…基板収容位置、
85…基板受け渡し具の昇降駆動手段。
3 ... Substrate transfer section, 4 ... Substrate transfer robot, 5 ... Substrate processing section, 8 ... Cassette, 9 ... Substrate, 17 ... Substrate transfer tool, 18 ... Substrate placement section,
46 ... traveling body, 47 ... arm rotation axis,
48 ... Axial rotating means, 49 ... Substrate chuck,
50/51 ... Chuck facing surface, 52/53 ... Substrate alignment holding groove, 62 ... Traveling drive device, 74 ... Processing tank, 75 ... Processing substrate mounting tool,
76 ... Elevating / lowering driving means for processing substrate placement tool, 77 ... First substrate delivery position, 78 ... Second substrate delivery position,
79 ... Substrate processing position, 81 ... Substrate accommodation position,
85 ... Elevating and lowering drive means for the substrate transfer tool.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 複数の基板を収容したカセットから基板
を取り出し又はそのカセット内に複数の基板を装填する
基板移載部と、複数の基板を一括して処理する基板処理
部と、上記基板移載部と上記基板処理部との間で複数の
基板を一括保持して搬送する基板搬送ロボットとを具備
して成る基板処理装置において、 上記基板搬送ロボットは、走行部本体と、この走行部本
体から略水平に突出した左右一対のアーム回転軸と、こ
の一対のアーム回転軸を回転させる軸回転手段と、各ア
ーム回転軸に固定された基板チャックとを備えて成り、 上記一対の基板チャックは複数組のチャック対向面を有
し、各組のチャック対向面は複数の基板整列保持溝を有
し、各組のチャック対向面で基板を起立整列状態で一括
保持するように構成するとともに、アーム回転軸の回転
により基板チャックのチャック対向面を切り換え可能に
構成したことを特徴とする基板処理装置の基板搬送装
置。
1. A substrate transfer section for taking out a substrate from a cassette accommodating a plurality of substrates or loading a plurality of substrates in the cassette, a substrate processing section for collectively processing the plurality of substrates, and the substrate transfer section. In a substrate processing apparatus including a substrate transfer robot that collectively holds and transfers a plurality of substrates between a mounting unit and the substrate processing unit, the substrate transfer robot includes a traveling unit body and the traveling unit body. And a pair of left and right arm rotation shafts that project substantially horizontally from each other, a shaft rotation unit that rotates the pair of arm rotation shafts, and a substrate chuck fixed to each arm rotation shaft. It has a plurality of sets of chuck facing surfaces, and each set of chuck facing surfaces has a plurality of substrate alignment holding grooves. The chuck facing surfaces of each set are configured to collectively hold the substrates in an upright alignment state, and Substrate transfer apparatus of the substrate processing apparatus, characterized in that the can configure switching the chuck facing surface of the substrate chuck by the rotation of the rotary shaft.
【請求項2】 複数の基板を収容したカセットから基板
受け渡し具を介して基板を取り出し又はそのカセット内
に複数の基板を装填する基板移載部と、複数の基板を一
括して処理する基板処理部と、上記基板移載部と上記基
板処理部との間で複数の基板を一括保持して搬送する基
板搬送ロボットとを具備して成る基板処理装置におい
て、 上記基板搬送ロボットは、走行部本体と、この走行部本
体から略水平に突出した左右一対のアーム回転軸と、こ
の一対のアーム回転軸を回転させる軸回転手段と、各ア
ーム回転軸に固定された基板チャックとを備えて成り、 上記一対の基板チャックは複数組のチャック対向面を有
し、各組のチャック対向面は複数の基板整列保持溝を有
し、各組のチャック対向面で基板を起立整列状態で一括
保持するように構成するとともに、アーム回転軸の回転
により上記基板チャックのチャック対向面を切り換え可
能に構成し、 上記基板移載部の基板受け渡し具は、基板を保持する基
板載置部を昇降駆動する昇降駆動装置を備え、この昇降
駆動装置により、上記基板載置部で保持した基板を、上
記基板搬送ロボットに受け渡すための第一の基板受け渡
し位置と、上記カセット内に収容する基板収容位置との
間で昇降可能に構成し、 上記基板処理部は、処理槽と、基板を支持する処理基板
載置具と、この処理基板載置具を昇降駆動する昇降駆動
手段とを備え、この昇降駆動手段で、上記処理基板載置
具で支持した基板を、上記基板搬送ロボットに受け渡す
ための第二の基板受け渡し位置と、上記処理槽内に浸漬
してその処理を行う基板処理位置との間で昇降可能に構
成したことを特徴とする基板処理装置。
2. A substrate transfer section for taking out a substrate from a cassette containing a plurality of substrates via a substrate transfer tool or loading a plurality of substrates in the cassette, and a substrate processing for collectively processing the plurality of substrates. And a substrate transfer robot that collectively holds and transfers a plurality of substrates between the substrate transfer unit and the substrate processing unit, wherein the substrate transfer robot is a traveling unit body. And a pair of left and right arm rotation shafts protruding substantially horizontally from the traveling unit main body, shaft rotation means for rotating the pair of arm rotation shafts, and a substrate chuck fixed to each arm rotation shaft, The pair of substrate chucks have a plurality of sets of chuck facing surfaces, and each set of chuck facing surfaces has a plurality of substrate alignment holding grooves, so that the substrates of the pair of chuck facing surfaces can be collectively held in a standing alignment state. To The substrate transfer tool of the substrate transfer section is configured to be capable of switching the chuck facing surface of the substrate chuck by rotation of the arm rotation shaft, and the substrate transfer tool for raising and lowering the substrate mounting section that holds the substrate. With the lifting drive device, between the first substrate transfer position for transferring the substrate held by the substrate mounting part to the substrate transfer robot and the substrate storage position for storing in the cassette. It is configured to be able to move up and down, and the substrate processing unit includes a processing tank, a processing substrate mounting tool that supports a substrate, and an elevating driving means that elevates and drives the processing substrate mounting tool. The substrate supported by the processing substrate holder can be moved up and down between the second substrate transfer position for transferring the substrate to the substrate transfer robot and the substrate processing position where the substrate is immersed in the processing tank to perform the processing. A substrate processing apparatus having the above structure.
JP5166465A 1992-09-25 1993-06-10 Substrate cleaning equipment Expired - Fee Related JP2864326B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5166465A JP2864326B2 (en) 1992-09-25 1993-06-10 Substrate cleaning equipment

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP28094292 1992-09-25
JP4-280942 1992-09-25
JP5166465A JP2864326B2 (en) 1992-09-25 1993-06-10 Substrate cleaning equipment

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP5930198A Division JP2864376B2 (en) 1992-09-25 1998-03-11 Substrate processing equipment

Publications (2)

Publication Number Publication Date
JPH06163673A true JPH06163673A (en) 1994-06-10
JP2864326B2 JP2864326B2 (en) 1999-03-03

Family

ID=26490832

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5166465A Expired - Fee Related JP2864326B2 (en) 1992-09-25 1993-06-10 Substrate cleaning equipment

Country Status (1)

Country Link
JP (1) JP2864326B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6138695A (en) * 1997-03-07 2000-10-31 Dainippon Screen Mfg. Co., Ltd. Substrate processing apparatus
JP2004514270A (en) * 2000-04-28 2004-05-13 東京エレクトロン株式会社 Variable gap stop that can be used in semiconductor processing equipment
KR100459335B1 (en) * 2002-04-08 2004-12-03 한국디엔에스 주식회사 Method and system for wafer array
KR100466296B1 (en) * 2002-07-18 2005-01-13 한국디엔에스 주식회사 Transfer robot and wafer array system using this robot
KR101395574B1 (en) * 2013-12-10 2014-05-16 정서화 Settling apparatus for removing photoresist

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63184350A (en) * 1987-01-26 1988-07-29 Mitsubishi Electric Corp Wafer transfer treatment device
JPH0276227A (en) * 1988-09-12 1990-03-15 Sugai:Kk Method and device for cleaning and drying substrate

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63184350A (en) * 1987-01-26 1988-07-29 Mitsubishi Electric Corp Wafer transfer treatment device
JPH0276227A (en) * 1988-09-12 1990-03-15 Sugai:Kk Method and device for cleaning and drying substrate

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6138695A (en) * 1997-03-07 2000-10-31 Dainippon Screen Mfg. Co., Ltd. Substrate processing apparatus
WO2004075285A1 (en) * 1997-03-07 2004-09-02 Takuya Shibao Substrate treating device
JP2004514270A (en) * 2000-04-28 2004-05-13 東京エレクトロン株式会社 Variable gap stop that can be used in semiconductor processing equipment
KR100459335B1 (en) * 2002-04-08 2004-12-03 한국디엔에스 주식회사 Method and system for wafer array
KR100466296B1 (en) * 2002-07-18 2005-01-13 한국디엔에스 주식회사 Transfer robot and wafer array system using this robot
KR101395574B1 (en) * 2013-12-10 2014-05-16 정서화 Settling apparatus for removing photoresist

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