JPH06148238A - Inspection apparatus of circuit board - Google Patents

Abstract

PURPOSE:To realize a circuit board inspection apparatus which can easily inspection circuit boards of different inspection positions and different inspection numbers and easily attach and exchange probes. CONSTITUTION:The apparatus is provided with a board mounting means 16 for mounting a plurality of kinds of inspection circuit boards 7, and a probe holding means 17. A plurality of inspecting pin setting holes 20 are opened in the holding means 17 to repeatedly mount probes 18 (19) corresponding to the inspection points. The holding means 17 holds the probes 18 (19) in the mounting state and brings the probes into touch with the inspection points. The probe 18 has a detecting part consisting of a tubular member of an outer diameter approximately equal to an inner diameter of the setting hole and, a contact pin coupled within the tubular member via an elastic material and brought in touch with the inspection point. The change of the inspection point is detected by the detecting part. Moreover, the probe 18 has also a guiding part with a columnar protrusion of an outer diameter approximately equal to an inner diameter of the tubular member at a predetermined position to take out the change of the inspection point. The guiding part is separated from the detecting part.

Description

Detailed Description of the Invention

[0001]

[Table of Contents] The present invention will be described in the following order. Field of Industrial Application Conventional Technology (FIGS. 5 to 8) Problems to be Solved by the Invention (FIGS. 5 to 8) Means for Solving the Problems (FIGS. 1, 3 and 4) Operation (FIG. 1 , FIG. 3 and FIG. 4) Example (FIGS. 1 to 4) Effect of the invention

[0002]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit board inspecting apparatus, and in particular, it can be applied to an apparatus in which an inspection pin is brought into contact with an inspection point of a circuit board for inspection.

[0003]

2. Description of the Related Art Conventionally, a circuit board such as a printed wiring board or a ceramic wiring board goes through a process of inspecting the continuity of a wiring pattern on the circuit board and the operating state of electronic parts as a manufacturing process. This inspection is a process in which an inspection pin is set up and brought into contact with an inspection point provided on a circuit board, and a predetermined inspection item is checked.

As this inspection pin, a so-called contact probe (hereinafter referred to as probe) 1 as shown in FIGS. 5 and 6 is used. The probe 1 includes a cylindrical outer cylinder 2 and a spring 3 housed inside the outer cylinder 2.
And a pin 4 whose upper part is stored via a spring 3,
The lead wire 5 is connected to the top of the outer cylinder 2, and is attached to a circuit board inspection device (hereinafter referred to as a prober) 6 as an inspection jig as shown in FIG.

In the prober 6, the circuit board 7 has positioning pins 8
It is composed of a stage 9 which is positioned and placed on the prober upper portion 12 which can be moved up and down to the position of the stopper 11 through the pillar 10. The prober upper portion 12 has an inspection point 13 (see FIG. 8) Insert the probe 1 from the top through the probe mounting hole drilled according to
Are attached and fixed by adhesion or the like.

When an actual inspection is carried out with such a configuration, the prober upper part 12 is lowered to the position of the stopper 11, as shown in FIG. All of the pins 4 are brought into contact with the respective inspection points 13 of the circuit board 7 by the action of the spring 3, so that the continuity of the wiring pattern and the operating state of the components on the circuit board 7 can be inspected.

[0007]

By the way, the position and number of the inspection points 13 on the circuit board 7 to be inspected by the prober 6 having such a configuration, and the shape and size of the circuit board 7 depend on the type of the circuit board 7. Depending on. Therefore, every time the type of the circuit board 7 is changed, it is necessary to change the position and the number of the probe mounting holes on the prober upper part 12, and the position of the positioning pin 8 on the stage 9 on which the circuit board 7 is mounted. It is necessary to design and manufacture the dedicated prober 6, and there is a problem that the inspection of the circuit board 7 takes a lot of trouble and time.

Further, in such a prober 6, there is a case where the probe 1 having a different tip shape is changed or the damaged or worn probe 1 is replaced according to the condition of the inspection point 13 of the circuit board 7 during the inspection. Occur.
However, as described above, the probe 1 is the upper part 1 of the prober.
When attached to 2, it is fixed by adhesion, etc.
There is a problem that it is extremely difficult to attach and detach the probe 1.

The present invention has been made in consideration of the above points, and it is possible to easily inspect various circuit boards having different positions and the number of inspection points and to easily attach and replace inspection pins. It is intended to propose a device.

[0010]

In order to solve such a problem, according to the present invention, a board placing means 16 for placing a plurality of types of circuit boards 7 to be inspected and an inspection place 13 of the circuit board 7 are provided. A plurality of test pin mounting holes 20 for repeatedly mounting the test pin 18 (or 19) are formed, and the test pin 18 (or 19) is mounted in the state where the test pin 18 (or 19) is mounted.
(Or 19) and an inspection pin holding means 17 for contacting the inspection point 13 are provided.

In the present invention, the inspection pin 18 is a tubular member 2 having an outer diameter substantially equal to the inner diameter of the inspection pin mounting hole 20.
6 and a detecting portion 25 which is connected to the inside of the tubular member 26 via the elastic material 3 and which is in contact with the inspection location 13 and which detects a change in the inspection location 13, and an outer diameter substantially equal to the inner diameter of the tubular member 26. The columnar protrusion 27 is provided at a predetermined position, and the lead-out portion 24 for taking out the change of the inspection location 13 is provided.

Further, in the present invention, the inspection pin 19 is
A first tubular member 33 having an outer diameter substantially equal to the inner diameter of the inspection pin mounting hole 20, and a second tubular member 36 having a columnar projection 35 having an outer diameter substantially equal to the inner diameter of the first tubular member 33 at predetermined positions. And a detection unit 34 that is connected to the second tubular member 36 via the elastic member 3 and that contacts the inspection location 13 and that detects a change in the inspection location 13, and an inner diameter of the first tubular member 33. A columnar protrusion 27 having substantially the same outer diameter is provided at a predetermined position, and a lead-out portion 24 for taking out the change of the inspection location 13 is provided.

Further, in the present invention, the inspection pin has a tubular member 3 having a columnar protrusion 35 having a predetermined outer diameter at a predetermined position.
6 and the tubular member 36 which are connected via the elastic member 3 to the contact point 4 that contacts the inspection point 13, and a detection section 34 that detects a change in the inspection point 13 and an outer diameter approximately equal to the inner diameter of the inspection pin mounting hole 20. The tubular member 26 having a diameter and an inner diameter substantially equal to the outer diameter of the columnar protrusion 35 is provided at a predetermined position, and the inspection point 13
And a lead-out section for taking out the change of

Further, in the present invention, the inspection pin 18 (or 19) is the inspection pin holding means 171 or the inspection pin 1.
The locking portions 30, 32, and 37 that lock with the mating portion 26 (or 33) of the 8 (or 19) itself are provided.

Further, in the present invention, the substrate mounting means 16
Is a plurality of positioning pin mounting holes 22 through which positioning pins 15 that determine the mounting position and / or mounting direction of the circuit board 7 can be repeatedly mounted according to the mounting positions and / or mounting directions of the plurality of types of circuit boards 7. Was set up.

[0016]

The circuit board 7 to be inspected is placed at a desired position on the board placing means 16 in a desired direction in accordance with its shape and size, and the inspection place 13 of the placed circuit board 7 is checked. The desired number of test pins 18 (or 19) are mounted in the test pin mounting holes 20 corresponding to the positions and the number of test pins 18
(Or 19) is brought into contact with the inspection point 13.

Further, the inspection pin 18 (or 19) is separated into at least two parts in the inspection pin mounting hole 20, that is, the detection portion and the lead-out portion, and the locking portions 30, 32, 37 are used for the inspection pin holding means 17 and / or the inspection portion. When the mounting length of the pin 18 (or 19) itself to the mating portions 26 and 33 is restricted to be shorter than the conventional one, and the lead-out portion 24 is attached to the detection portion 25 (or the detection portion 34 and the lead-out portion 24 are tubular members. (When attached to 33), the inspection pin 18 (or 19) is provided with a structure that is favorably held by the inspection pin holding means 17, and it is necessary to fix the inspection pin 18 (or 19) to the inspection pin holding means 17 by adhesion or the like. Inspection pin 18 (or 1 by removing
9) can be mounted much easier than the conventional one.

[0018]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described in detail below with reference to the drawings.

In FIG. 1 in which parts corresponding to those in FIG. 7 are designated by the same reference numerals, 14 indicates a prober according to the present invention as a whole, and a circuit board 7 and a stage 16 on which a positioning pin 15 positions and is placed. 3, a prober upper part 17 configured to be movable up and down to the position of the stopper 11 through the pillar 10 and shown in FIG.
Alternatively, the probe 19 shown in FIG. 4 is inserted into and attached to an arbitrary probe attachment hole 20 in the prober upper portion 17.

The stage 16 is made of an electrically insulative material, and is provided with two holes 21 for mounting the pillars 10 and a large number of circular positioning holes 22 arranged regularly. After the positioning pin 15 having the lower portion of the circular cross section is inserted into the hole 22 and attached, the circuit board 7 to be inspected is butted against the side surface of the head of the positioning pin 15 to form circuits of various shapes and sizes. The substrate 7 can be easily placed in a desired position and direction.

The upper part 17 of the prober is entirely made of an electrically insulating material, and as shown in FIG. 2, a large number of regularly arranged circular probe mounting holes 20 and two circular holes through which the column 10 is inserted. And 23 are provided.

The probe 18 is made of a metallic material,
As shown in FIG. 3 in which parts corresponding to those in FIG. 5 are assigned the same reference numerals, the wire rod attachment portion 24 and the contact probe portion 25 are configured so as to be easily separated from each other. After inserting the joining pipe 26 into the probe attaching hole 20 at an arbitrary position from below and attaching it, insert the plug 27 at the lower end of the wire attaching portion 24 into the plug attaching hole 28 at the top of the joining pipe 26 from above and attach it. Therefore, the structure is easily integrated, and the electric function and the mechanical function are well maintained. This makes it easier to repeatedly mount the probes 18 in the probe mounting holes 20 according to the position and number of the inspection points 13.

The contact probe portion 25 has a cylindrical outer cylinder 29 having a cylindrical joint pipe 26 provided on the upper portion thereof, a spring 3 housed in the lower portion of the outer cylinder 29, and an upper portion via the spring 3. And a pin 4 in which is stored.

The outer diameter of the circular joint pipe 26 is substantially equal to the inner diameter of the probe mounting hole 20, and the inner diameter of the circular plug mounting hole 28 at the top thereof is substantially the same as the outer diameter of the plug 27 having a circular cross section. Further, when the plug 27 is inserted into the plug mounting hole 28, it is slightly pushed outward so that its peripheral side surface is strongly mounted to the probe mounting hole 20. This allows the probe 18
Is prevented from falling off, and a retaining process by adhesion or the like is unnecessary.

When the joining pipe 26 is inserted into the probe mounting hole 20, the protrusion 30 at the bottom of the joining pipe 26 is abutted in the vicinity of the opening of the probe mounting hole 20, and the insertion depth of the joining pipe 26 is further reduced. This is regulated within a predetermined range (here, within the thickness of the prober upper portion 17), and the reaction force received from the circuit board 7 when the pin 4 is brought into contact with the inspection point 13 of the circuit board 7 is transmitted to the prober upper portion 17, The reaction force is supported on the upper part 17 of the prober.
As a result, the labor for mounting the contact probe portion 25 is further reduced, and the displacement of the contact probe portion 25 in the upper surface direction of the prober upper portion 17 is prevented.

A presser 31 is provided on the upper portion of the wire attachment portion 24 to connect the lead wire 5 to a predetermined measuring device (not shown).
Is attached by crimping, and a plug 27 having a circular cross section and a tapered tip is provided in the lower portion.

The protrusion 32 near the base of the plug 27 is
When the plug 27 is inserted into the plug mounting hole 28, it is abutted against the vicinity of the opening of the probe mounting hole 20, and the depth of insertion of the plug 27 is set to a much smaller predetermined range (here, within the depth of the plug mounting hole 28). It is designed to regulate. As a result, the labor for mounting the wire rod mounting portion 24 is further reduced.

The probe 19 is entirely made of a metal material, and has a sleeve 33, a wire attachment portion 24 and a contact probe portion 3 as shown in FIG.
It is configured so that it can be easily separated into three parts of 4 and 4, and the sleeve 33 is inserted into the probe mounting hole 20 at an arbitrary position so as not to project from the surface of the prober upper portion 17, and then the wire rod mounting portion 24 By inserting the plug 27 at the lower end and the plug 35 at the upper end of the contact probe portion 34 into the sleeve 33 from above and below, respectively, an integrated structure can be easily obtained, and good electrical and mechanical functions can be maintained. Has been done. This makes it easier to repeatedly mount the probes 19 in the probe mounting holes 20 according to the position and number of the inspection points 13.

The sleeve 33 has a circular tubular structure whose outer diameter is substantially equal to the inner diameter of the probe mounting hole 20 and whose inner diameter is substantially equal to the outer diameter of the plug 27, and after mounting in the probe mounting hole 20. , Plug inside it 2
When the 7 and the plug 35 are inserted, the peripheral side surface is strongly attached to the probe attachment hole 20 by being slightly spread outward. This prevents the probe 19 from falling off, and eliminates the need for a retaining process such as adhesion.

The contact probe portion 34 has a cylindrical outer cylinder 36 having a plug 35 having a circular cross section and a tapered tip at the top, a spring 3 housed inside the lower part of the outer cylinder 36, and a spring. 3 and a pin 4 whose upper part is housed through.

The protrusion 37 near the base of the plug 35 is
When the plug 35 is inserted into the sleeve 33, the plug 35 is abutted on the vicinity of the opening of the probe mounting hole 20, and the insertion depth of the plug 35 is restricted within a predetermined smaller range (here, within half the length of the sleeve 33). At the same time, the prober upper portion 17 is made to support the reaction force received from the circuit board 7 similarly to the above-mentioned protrusion 30. This further reduces the labor for attaching the contact probe portion 34, and prevents the contact probe portion 34 from being displaced in the upper surface direction of the prober upper portion 17.

Further, the probe 18 and the probe 19 are made to be able to maintain good electrical and mechanical functions while being repeatedly attached a predetermined number of times by appropriately selecting the material, size, surface accuracy and the like. ing.

When actually inspecting with the above-mentioned structure, first, the required number of positioning pins 15 are inserted and attached in desired positioning holes 22 of the stage 16 until the head stops, and the circuit board 7 to be inspected is desired. Place in the position and direction.

Next, the prober upper part 17 is moved to the upper part of the pillar 10, and the probe 18 or the probe 19 is inserted in the probe mounting hole 20 corresponding to the position of the inspection point 13 of the circuit board 7.
Insert and install.

When the probe 18 is used, first, the required number of contact probe portions 25 are attached to the probe mounting holes 20.
After inserting the protrusion 30 from the lower surface until the protrusion 30 abuts on the prober upper portion 17, the contact probe portion 25
The same number of wire rod mounting portions 24 as the protruding portions 32 are provided on the prober upper portion 1
Insert it from the top until it hits 7, and attach it.

When the probe 19 is used, first, the sleeve 33 is inserted into the probe mounting hole 20 and mounted, and then the same number of contact probe portions 34 as the sleeve 33 are attached from the lower surface until the protrusion 37 abuts on the prober upper portion 17. In addition to inserting and attaching, the same number of wire rod attachment portions 24 are inserted and attached from the upper surface until the protrusions 32 hit the prober upper portion 17.

Next, as in FIG. 8, the prober upper part 17 is lowered to the position of the stopper 11, whereby all the probes 18 or 19 come into contact with the respective inspection points 13 of the circuit board 7 and the circuit board 7 is covered. It is possible to inspect the continuity of the wiring pattern, the operating state of components on the circuit board, and the like.

According to the above construction, the circuit board 7 can be mounted at a desired position on the stage 16 in a desired direction according to its shape and size, and the inspection points of the mounted circuit board 7 can be checked. Since the desired number of probes 18 or 19 can be attached to the probe attachment holes 20 corresponding to the positions and the number of 13 to bring the probes 18 or 19 into contact with the inspection point 13, the shape, size and inspection point 13
Various circuit boards 7 having different positions and numbers can be easily inspected.

This makes it possible to save the time for producing the dedicated prober 6 and eliminate the need to design the circuit board 7 in consideration of the position of the probe 18 or 19 at the time of inspection.

Further, the probe 18 (or 19) can be separated into upper and lower parts in the probe mounting hole 20, and the length required for the protrusions 30 and 37 to be mounted is remarkably shorter than the conventional one. The probe 18 (or 19) can be attached and replaced much more easily than in the conventional case because the length of the probe 18 (or 19) is regulated to a predetermined length and a process for preventing the attachment of each attachment portion from becoming unnecessary is eliminated.

This makes it easier to select the probe having the tip-shaped pin 4 according to the condition of the inspection point 13 on the circuit board 7 while using the prober 14.

Further, the lead wire 5 of the probes 18 and 19
By being able to separate the part to which is attached and the part containing the pin 4, the lead wire 5 can be attached without the operator touching the pin 4 which normally has a sharp tip,
Work efficiency and safety are improved.

In the above-mentioned embodiment, the joint pipe 26
Although the case where the plug 27 is attached to the plug attaching hole 28 at the top of the above is described, the present invention is not limited to this, and the concavo-convex structure of the attaching portion is turned upside down, and the joining pipe 26 is provided at the bottom of the wire attaching portion. The contact probe section 34 may be attached to the joint pipe 26.

Further, in the above-mentioned embodiment, the case of the probe 18 and the probe 19 for detecting the voltage and current of the inspection point 13 has been described, but the present invention is not limited to this, and other than the voltage and current of the inspection point. Physical quantity (eg temperature,
It can also be widely applied to probes that detect changes in magnetism, light, pressure, and vibration.

Further, in the above-described embodiment, the probes 18 and 19 are all made of a metal material, but the present invention is not limited to this, and when the portions other than the necessary portions are made of a non-metal material such as synthetic resin. Widely applicable to.

Further, in the above-described embodiment, the case where the mounting portion (for example, the plug 27 and the joining pipe 26) has a circular cross-sectional shape has been described, but the present invention is not limited to this, and the mounting portion has a cross section other than a circular shape. Shape (eg triangular,
It can also be widely applied to the case of forming a polygonal shape such as a square or a wavy shape.

Further, in the above-described embodiment, the case where the positioning pin 15 is provided with only the function of abutting when the circuit board 7 is mounted is described, but the present invention is not limited to this, and the circuit board 7 is not limited thereto. The function of fixing the circuit board 7 on the stage 16 may be provided by changing the shape and size of the head according to the shape and size.

Further, in the above-mentioned embodiment, the case where the mounting portion (for example, the plug 27 and the joining pipe 26) is not provided with the spring property is described, but the present invention is not limited to this, and the mounting reliability is further enhanced. Therefore, a spring property may be given to the mounting location.

Further, in the above-mentioned embodiment, the case where the contact probe portion 25 is attached to the prober upper portion 17 by insertion is described, but the present invention is not limited to this and may be attached by a screw.

Further, in the above-mentioned embodiment, the case where the lead wire 5 is connected to the presser 31 of the wire rod mounting portion 24 by crimping is described, but the present invention is not limited to this, and electrical and mechanical such as soldering. You may connect by other methods that are reliable.

[0051]

As described above, according to the present invention, a circuit board to be inspected can be placed in a desired position on a board placing means in a desired direction according to its shape and size.
By mounting a desired number of test pins in the test pin mounting holes corresponding to the positions and the number of test points on the placed circuit board, the test pins can be brought into contact with the test points. It is possible to realize a circuit board inspection device that can easily inspect various circuit boards having different positions and numbers.

Further, according to the present invention, the inspection pin is separated in the inspection pin mounting hole, and the protrusion restricts the mounting length to a predetermined length which is significantly shorter than the conventional one, and by the adhesion or the like. Since it is not necessary to prevent the mounting portions from coming off, it is possible to realize a circuit board inspection device in which the inspection pins can be mounted much more easily than in the past.

[Brief description of drawings]

FIG. 1 is a perspective view showing an embodiment of a circuit board inspection apparatus according to the present invention.

FIG. 2 is a schematic diagram for explaining an upper portion of a prober in an example.

FIG. 3 is a schematic diagram used for explaining a first probe in an example.

FIG. 4 is a schematic diagram used for explaining a second probe in the example.

FIG. 5 is a schematic diagram used for explaining a probe.

FIG. 6 is a schematic diagram used for explaining a usage state of a probe.

FIG. 7 is a perspective view for explaining a conventional circuit board inspection device.

FIG. 8 is a schematic diagram used for explaining a conventional use state.

[Explanation of symbols]

1, 18, 19 ... Probe, 5 ... Lead wire, 6, 1
4 ... Prober, 7 ... Circuit board, 8, 15 ... Positioning pin, 9, 16 ... Stage, 10 ... Pillar, 11 ...
Stopper, 12, 17 ... Prober top, 13 ... Inspection point, 20 ... Probe mounting hole, 22 ... Positioning hole, 24 ... Wire rod mounting portion, 25,34 ... Contact probe portion, 26 ... Joining Tube, 27, 35 ... plug,
28 ... Plug mounting holes, 30, 32, 37 ...
33 ... Sleeve.

Claims (6)

[Claims] 1. A board mounting means for mounting a plurality of types of circuit boards to be inspected, and a plurality of inspection pin mounting holes for repeatedly mounting inspection pins in accordance with inspection points of the circuit board, A circuit board inspection device, comprising: an inspection pin holding means for holding the inspection pin in a state where the inspection pin is mounted and for bringing the inspection pin into contact with the inspection location. 2. The inspection pin comprises a tubular member having an outer diameter substantially equal to the inner diameter of the inspection pin mounting hole, and a contact pin connected to the tubular member via an elastic material to contact the inspection location. The detection unit and the derivation unit include a detection unit that detects a change in a location, and a lead-out unit that has a columnar protrusion having an outer diameter substantially equal to the inner diameter of the tubular member at a predetermined position and takes out the change in the inspection location. The circuit board inspection apparatus according to claim 1, wherein the parts are separated. 3. The inspection pin comprises a first tubular member having an outer diameter substantially equal to the inner diameter of the inspection pin mounting hole, and a columnar protrusion having an outer diameter substantially equal to the inner diameter of the first tubular member at predetermined positions. A second tubular member having a second tubular member, a detection part connected to the second tubular member through an elastic material and contacting the inspection point, and detecting the change in the inspection point; A columnar protrusion having an outer diameter substantially equal to the inner diameter of the member is provided at a predetermined position, and a lead-out portion for taking out the change of the inspection location is provided, and the first tubular member, the detecting portion, and the lead-out portion are separated from each other. The circuit board inspection device according to claim 1, wherein 4. The inspection pin comprises a tubular member having a columnar protrusion having a predetermined outer diameter at a predetermined position, and a contact pin which is connected to the inside of the tubular member via an elastic material and contacts the inspection location. A detection unit for detecting changes in the location, and a tubular member having an outer diameter substantially equal to the inner diameter of the inspection pin mounting hole and an inner diameter substantially equal to the outer diameter of the columnar protrusion are provided at predetermined positions, and the change in the inspection location is detected. The circuit board inspection apparatus according to claim 1, further comprising a lead-out section for taking out, wherein the detecting section and the lead-out section are separated from each other. 5. The inspection pin according to claim 1, 2 or 3, wherein the inspection pin is provided with an engagement portion that engages with the mating portion of the inspection pin holding means and / or the inspection pin itself. Alternatively, the circuit board inspection device according to claim 4. 6. The board mounting means includes a positioning pin that determines a mounting position and / or a mounting direction of the circuit board according to a shape, a mounting position and / or a mounting direction of a plurality of types of the circuit boards. The circuit board inspection apparatus according to claim 1, further comprising a plurality of positioning pin mounting holes that can be repeatedly mounted.