JPH056537Y2 - - Google Patents

Description

[Detailed explanation of the invention] [Summary] In testing electronic components mounted on printed circuit boards, etc., the probes of measuring instruments used to search for defective parts of electronic components are handled by robots, etc., and automatically detected. This is a probe holder that allows for precise probing.

[Industrial application field]

The present invention relates to a probe holder that holds a probe used for testing an electronic component circuit mounted on a printed board or the like.

When testing an electronic component circuit mounted on a printed board, an automatic tester is used to determine whether the circuit is good or bad. In the case of a defective product, it is difficult to identify which part of the circuit is defective. Therefore, a probe is used to touch and measure a location that is considered to be a defective location while searching for and discovering the defective location.

The task of searching for defective locations using this probe is extremely difficult, and there is a demand for automation of the task of searching for defective locations.For this purpose, a probe that can be handled by a robot is required.

[Conventional technology]

Conventionally, the search for defective parts in electronic component circuits has involved three
As shown in the figure, a general-purpose probe 1 connected to a measuring instrument is held in a hand 2, and a lead 4 of an electronic component 3 is
The test is performed by bringing a probe needle 6 into contact with a portion to be measured, such as a through hole in a printed circuit board 5 .

[Problem that the invention attempts to solve]

Various types of electronic components are used depending on the circuit to be mounted on a printed board, and three types of measuring instruments (frequency, voltage, and resistance) are required to measure the quality of the electronic components depending on their characteristics. Furthermore, since it is ideal to use a probe and a measuring device in pairs due to electrical characteristics, the same number of probes and measuring devices are required.

Therefore, when searching for a defective location in an electronic component circuit mounted on a printed board, it is necessary to replace the probe with one that is suitable for the object to be measured.

As described above, since measurements are performed while replacing probes, there is a problem in that searching for defective locations is difficult.

[Means for solving problems]

FIG. 1 is a diagram showing the configuration of the probe holder of the present invention.

This problem is solved by the probe holder of the present invention, in which a frame 7 of the probe holder holding a general-purpose probe is provided with a guide hole 8 for positioning the probe holder so that it can be held and removed by a robot or the like.

[Effect]

That is, the probe is handled by the robot by attaching the frame 7 surface having the guide hole 8 of the probe holder using attachment/detachment means (guide pins and suction pads) on the robot side, which will be described later.

〔Example〕

1A to 1D show an embodiment of the present invention, in which Fig. 1 is a side sectional view, Fig. 2 is a front view including a partial cross section, Fig. 3 is a sectional view of a contact probe, and Fig. 4 is a sectional view of a receptacle. In addition, the same parts are designated by the same reference numerals throughout the drawings.

1A and 1B show a probe holder, 7 is a frame, and guide holes 8 are provided above and below the frame 7 for positioning a robot or the like. An insulating holder 10 is fixed to the lower end of the frame 7, and the insulating holder 1
A receptacle 9a is fixed to one end of the receptacle 9a. A contact probe 9b is housed in the receptacle 9a. Note that the contact probe 9b
As shown in FIG. 1C, the contactor 9c is comprised of a contactor 9c built into the sleeve 21 and a spring 18, and is preloaded to be movable in the axial direction. The receptacle 9a has a shape as shown in FIG. A metal fitting 16 is insulated and fixed to the other end of the insulating holder 10, and a connector 12 is attached to the metal fitting 16. The tip of the general-purpose probe 11 is attached and held by the connector 12, and the upper part of the general-purpose probe 11 is held by a holder (clamp) 15 fixed to the frame 7. The receptacle 9a and the connector 12 are connected by a lead wire 14, so that a signal from the contact probe 9b is transmitted to the measuring instrument side. The cover 17 is screwed to the insulating holder 10 and protects the inside.

Further, as shown in FIG. 2, a guide pin 18 that engages with a guide hole 8 of the frame 7 of the probe holder is attached to a support fitting 24 attached to the robot 23 side.
A suction pad 19 that suctions to the surface of the frame 7 is provided. Suction pad 19 is tube 20
It is connected to a solenoid valve (not shown) and a vacuum source.

The guide pin 18 is connected to the guide hole 8 of the probe holder.
The robot 23 and the probe holder are accurately positioned. The probe holder is held in a vacuum by switching the solenoid valve connected to the piping tube 20 to the vacuum source side at a position where the suction pad 19 is in close contact with the frame 7 of the probe holder. Vacuum suction is released by switching the solenoid valve to the atmosphere side.

A robot 23 is installed in the testing machine, and probe holders connected to a plurality of measuring machines suitable for the circuit under test are housed in a housing section (not shown). The testing machine tests the mounted printed circuit board, and if the circuit is defective, the robot 2 searches for the defective location.
3 goes to pick up the probe holder and handles it.

Specifically, the robot 23 handles the probe holder suitable for measuring the defective part according to the instructions from the tester as described above, and then the robot 2
3 receives a command from the testing machine to move to the position of the object to be measured that is considered to be defective. The robot 23 moves to the instructed position of the object to be measured, brings the contact 9c of the contact probe 9b into contact with the object, and automatically measures the electrical characteristics while discovering any defective parts.
At this time, the contact probe 9b is preloaded by a spring 18 so as to be able to move in the axial direction, and absorbs the deflection of the printed circuit board and variations in the height of the object to be measured, and makes contact between the contact probe 9b and the object to be measured. is always guaranteed.

Since the general-purpose probe 11 is handled by the robot 23 using the probe holder, it has become possible to automatically search for defective locations in electronic component circuits such as mounted printed boards, which has been difficult until now.

It is also possible to replace the entire probe by providing a mounting member for the robot on the probe itself, but this poses the problem of having to use a dedicated product.However, according to the present invention, a commercially available probe can be inserted. Since only one step is required, the test range can be easily expanded.

[Effect of idea]

As explained above, according to the present invention, by providing a guide hole in the frame of the probe holder for attaching and detaching positioning, a general-purpose probe can be handled by a robot, etc., and the defective location can be automatically searched for. big.

[Brief explanation of the drawing]

Figures 1A to 2D are diagrams explaining the configuration of the probe holder of the present invention, Figure 2 is a diagram explaining an application example of the probe holder of the present invention, and Figure 3 is a conventional search for defective locations in electronic component circuits. FIG. In the figure, 7 is the frame, 8 is the guide hole, and 9 is the frame.
a is a receptacle, 9b is a contact probe,
10 is an insulating holder, 11 is a general-purpose probe, 12 is a connector, 14 is a lead wire, 15 is a clamp, 1
6 is a metal fitting, 17 is a cover, 18 is a spring, and 22 is a protrusion.

Claims (1)

[Claims for Utility Model Registration] Mounting member 8 that determines the mounting position with the moving means
An insulating holder 10 is fixed to one end of the frame 7, and a receptacle 9a with a built-in contact probe 9b is inserted into one end of the insulating holder 10, and a general-purpose probe 11 used for measuring electronic circuits is inserted into the other end. the connector 12 and the receptacle 9;
a and the inserted general-purpose probe 1
A probe holder characterized in that a holder 15 for holding the probe 1 is fixed to the frame 7, and the contact probe 9b performs measurement.