JPH06138186A - Method for testing printed circuit board-packaged circuit - Google Patents

Method for testing printed circuit board-packaged circuit

Info

Publication number
JPH06138186A
JPH06138186A JP4289977A JP28997792A JPH06138186A JP H06138186 A JPH06138186 A JP H06138186A JP 4289977 A JP4289977 A JP 4289977A JP 28997792 A JP28997792 A JP 28997792A JP H06138186 A JPH06138186 A JP H06138186A
Authority
JP
Japan
Prior art keywords
output
circuit board
test
circuit
printed circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP4289977A
Other languages
Japanese (ja)
Inventor
Kinya Saito
金弥 斉藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP4289977A priority Critical patent/JPH06138186A/en
Publication of JPH06138186A publication Critical patent/JPH06138186A/en
Withdrawn legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To perform operation test simply by eliminating the need for preparing an exclusive printed circuit board testing device for each printed circuit board and by reducing the number of wirings between the printed circuit board and a measuring instrument. CONSTITUTION:A test signal generation means 4 for generating an operation test signal of a packaging circuit 2, a switching means 5 for selecting either the output of the test signal generation means 4 or the output of a timing generation circuit 3 and then supplying it to the packaged circuit 2, and an output selection means 7 for selecting any signal output a plurality of output signals of the packaged circuit 2 and then outputting it are provided on a printed circuit board 1, a switching means 5 is switched to a test signal generation means side for supplying the test signal generated by the test signal generation means 4 to the packaging circuit 2 on operation test of the packaged circuit 2, any signal out of output signals which are output from the packaged circuit 2 is selected by the output selection means 7 at this time, and then the selected output signal is measured by a measuring instrument 9 which is provided outside the printed circuit board.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、プリント基板実装回路
の試験方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for testing a printed circuit board mounted circuit.

【0002】[0002]

【従来の技術】図3は、従来のプリント基板実装回路の
試験方法の説明図である。図において、50はプリント
基板、51はプリント基板上に実装されたICや電気部
品などの種々の電気回路(以下「実装回路」という)、
52はプリント基板試験装置である。従来のプリント基
板実装回路の試験方法は、プリント基板試験装置52の
試験信号発生器53からプリント基板50の試験入力端
子54に動作試験信号を与え、このときにプリント基板
50の出力端子55から出力される出力信号をプリント
基板試験装置22の信号選択器26に多数のリード線を
用いて接続し、この多数の出力信号中から信号選択器2
6で所望の信号を選択することにより、オシロスコープ
27などの測定器で出力状態を観測するようにしてい
た。
2. Description of the Related Art FIG. 3 is an explanatory diagram of a conventional method for testing a printed circuit board mounted circuit. In the figure, 50 is a printed circuit board, 51 is various electric circuits (hereinafter referred to as “mounting circuit”) such as ICs and electric parts mounted on the printed circuit board,
Reference numeral 52 is a printed circuit board test apparatus. In the conventional method for testing a printed circuit board mounting circuit, an operation test signal is applied from the test signal generator 53 of the printed circuit board test device 52 to the test input terminal 54 of the printed circuit board 50, and at this time, the output terminal 55 of the printed circuit board 50 outputs the test signal. The output signal to be connected is connected to the signal selector 26 of the printed circuit board testing device 22 using a large number of lead wires, and the signal selector 2 is selected from among the large number of output signals.
By selecting a desired signal in 6, the output state is observed by a measuring instrument such as the oscilloscope 27.

【0003】[0003]

【発明が解決しようとする課題】前記した従来の試験方
法の場合、実装回路51の内部回路が異なる毎に専用の
プリント基板試験装置52を設計・制作して用意しなけ
ればならないという問題があった。また、プリント基板
50とプリント基板試験装置52との間に多くの配線を
必要とし、試験に手間がかかるという問題があった。
In the conventional test method described above, there is a problem in that a dedicated printed circuit board test device 52 must be designed and produced and prepared for each different internal circuit of the mounting circuit 51. It was Further, there is a problem that a lot of wiring is required between the printed circuit board 50 and the printed circuit board testing device 52, which makes the test laborious.

【0004】本発明は前記事情に基づきなされたもの
で、その目的とするところは、従来のようにプリント基
板毎に専用のプリント基板試験装置を用意する必要がな
く、またプリント基板と測定器との間の配線も少なくて
済み、動作試験を簡単に行なうことのできるプリント基
板実装回路の試験方法を提供することである。
The present invention has been made based on the above circumstances, and its purpose is to eliminate the need for preparing a dedicated printed circuit board testing device for each printed circuit board as in the conventional case, and to provide a printed circuit board and a measuring instrument. It is an object of the present invention to provide a test method for a printed circuit board mounting circuit, which requires only a small amount of wiring between the circuit boards and can easily perform an operation test.

【0005】[0005]

【課題を解決するための手段】前記課題を解決するため
に本発明が採用した手段を、図1の原理図を参照して説
明する。図において、1はプリント基板、2はプリント
基板1上に実装された電気回路(実装回路)、3は実装
回路2内に設けられている正規の回路動作用のタイミン
グ発生回路、4は動作試験のための試験信号を発生する
試験信号発生手段、5は動作試験時に試験信号発生手段
3の出力を選択するための切替手段、6は実装回路2の
出力端子、7は実装回路2の出力する出力信号中から所
定の出力信号を選択する出力選択手段、8は試験出力端
子、9は試験出力端子8から出力される信号を観測する
ためにプリント基板外部に接続された測定器である。前
記試験信号発生手段4、切替手段5および出力選択手段
7は、実装回路2と同一のプリント基板1上に設けられ
ている。
Means adopted by the present invention for solving the above problems will be described with reference to the principle diagram of FIG. In the figure, 1 is a printed circuit board, 2 is an electric circuit (mounting circuit) mounted on the printed circuit board 1, 3 is a timing generation circuit for normal circuit operation provided in the mounting circuit 2, and 4 is an operation test. Signal generating means for generating a test signal for the switching circuit, 5 is a switching means for selecting the output of the test signal generating means 3 during the operation test, 6 is an output terminal of the mounting circuit 2, and 7 is an output of the mounting circuit 2. Output selecting means for selecting a predetermined output signal from the output signals, 8 is a test output terminal, and 9 is a measuring device connected to the outside of the printed circuit board to observe the signal output from the test output terminal 8. The test signal generating means 4, the switching means 5 and the output selecting means 7 are provided on the same printed circuit board 1 as the mounting circuit 2.

【0006】[0006]

【作用】通常時は、切替手段5はタイミング発生回路3
側に接続されている。したがって、プリント基板1が電
子機器などに実際に組み込まれて使用される際には、内
部の実装回路2にはタイミング発生回路3から正規のタ
イミング信号が供給され、この正規のタイミング信号に
従って正規の動作を行い、出力端子6から正規の出力信
号を出力する。
In normal times, the switching means 5 is the timing generation circuit 3
Connected to the side. Therefore, when the printed circuit board 1 is actually incorporated and used in an electronic device or the like, the internal mounting circuit 2 is supplied with a regular timing signal from the timing generation circuit 3, and the regular timing signal is supplied in accordance with the regular timing signal. It operates and outputs a regular output signal from the output terminal 6.

【0007】プリント基板の動作試験時には、切替手段
5を試験信号発生手段4側に切り替える。これにより、
試験信号発生手段4から動作試験のための所定の試験信
号が実装回路2に供給される。実装回路2はこの試験信
号に従って所定の試験動作を行なう。出力選択手段7
は、この時に実装回路2から出力される複数の出力信号
中から所定の信号を選択し、試験出力端子8に送る。こ
の試験出力端子8に送られた出力信号は外部接続した測
定器9に導かれ、その出力状態を監視することにより実
装回路2が正常であるか否かの判定を行なう。
During the operation test of the printed circuit board, the switching means 5 is switched to the test signal generating means 4 side. This allows
A predetermined test signal for the operation test is supplied from the test signal generating means 4 to the mounting circuit 2. The mounting circuit 2 performs a predetermined test operation according to this test signal. Output selection means 7
Selects a predetermined signal from the plurality of output signals output from the mounting circuit 2 at this time and sends it to the test output terminal 8. The output signal sent to the test output terminal 8 is guided to the externally connected measuring instrument 9, and the output state is monitored to determine whether the mounted circuit 2 is normal or not.

【0008】[0008]

【実施例】以下、図面を参照して本発明の実施例につき
説明する。図2は、本発明の一実施例の構成図である。
図において、10−1〜10−nはプリント基板1上に
実装された例えばICなどの回路(被試験回路)、11
は回路10−1〜10−nの正規の動作のためのタイミ
ング信号を発生するタイミング発生回路、12は回路1
0−1〜10−nの動作試験を行なうための試験信号を
発生する試験信号発生回路、13は動作試験時に試験信
号発生回路12の発生する試験信号を選択するためのマ
ルチプレクサ(MPX)である。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 2 is a block diagram of an embodiment of the present invention.
In the figure, 10-1 to 10-n are circuits (circuits under test) such as ICs mounted on the printed board 1, 11
Is a timing generation circuit for generating timing signals for the normal operation of the circuits 10-1 to 10-n, and 12 is the circuit 1
A test signal generating circuit for generating a test signal for performing an operation test of 0-1 to 10-n, and a multiplexer (MPX) 13 for selecting a test signal generated by the test signal generating circuit 12 during the operation test. .

【0009】14−A,14−Bは回路10−1〜10
−nの出力する複数の出力信号中から指定の出力信号を
選択して出力するためのマルチプレクサ(MPX)、1
5はMPX13の選択する入力信号の切替を設定ピンの
挿入によって行なう入力切替ピン端子、16はMPX1
4−A,14−Bから出力される信号の選択を設定ピン
の挿入によって行なう出力選択ピン端子、17は出力端
子、18は試験出力端子である。これらの回路はすべて
プリント基板1上に設けられている。
14-A and 14-B are circuits 10-1 to 10-10.
A multiplexer (MPX) for selecting and outputting a specified output signal from a plurality of output signals output by -n, 1
Reference numeral 5 is an input switching pin terminal for switching the input signal selected by the MPX 13 by inserting a setting pin, and 16 is MPX1.
Output selection pin terminals for selecting signals output from 4-A and 14-B by inserting setting pins, 17 are output terminals, and 18 is a test output terminal. All of these circuits are provided on the printed board 1.

【0010】通常時は、MPX13はタイミング発生回
路11側を選択しており、タイミング発生回路11の出
力するタイミング信号A,Bを回路10−1〜10−n
にそれぞれ供給している。ICなどの回路10−1〜1
0nはこのタイミング信号A,Bに従って所定の動作を
行なう。そして、回路10−1〜10−nから出力され
る出力信号A,Bはそれぞれ対応する出力端子17−1
A,1B〜17−nA,nBに送出され、外部へ出力さ
れる。
Normally, the MPX 13 selects the timing generation circuit 11 side, and outputs the timing signals A and B output from the timing generation circuit 11 to the circuits 10-1 to 10-n.
To each. Circuits such as ICs 10-1 to 10-1
0n performs a predetermined operation according to the timing signals A and B. Then, the output signals A and B output from the circuits 10-1 to 10-n respectively correspond to the corresponding output terminals 17-1.
A, 1B to 17-nA, nB, and output to the outside.

【0011】回路10−1〜10−nの動作試験を行な
う場合には、試験出力端子18−A,18−Bにオシロ
スコープなどの測定器19を接続する。さらに、入力切
替ピン端子15に設定ピンを挿入することにより、MP
X13を試験信号発生回路11側に切り替える。また、
出力選択ピン端子16の所定の位置に設定ピンを挿入す
ることにより、MPX14−A,14−Bで選択すべき
出力信号を設定する。
When performing an operation test of the circuits 10-1 to 10-n, a measuring device 19 such as an oscilloscope is connected to the test output terminals 18-A and 18-B. Furthermore, by inserting a setting pin into the input switching pin terminal 15, MP
X13 is switched to the test signal generation circuit 11 side. Also,
By inserting a setting pin at a predetermined position of the output selection pin terminal 16, the output signal to be selected by the MPXs 14-A and 14-B is set.

【0012】前記のように設定した後、試験を開始する
と、試験信号発生回路11からMPX13を通って所定
の試験信号A,Bが回路10−1〜10−nに与えら
れ、各回路10−1〜10−nがこの試験信号A,Bに
従った動作を開始する。
When the test is started after the above setting, the predetermined test signals A and B are given from the test signal generation circuit 11 to the circuits 10-1 to 10-n through the MPX 13 and each circuit 10-. 1 to 10-n start the operation according to the test signals A and B.

【0013】この試験動作によって各回路10−1〜1
0−nから出力される出力信号A,Bは、MPX14−
A,14−Bに入力され、出力選択ピン端子16によっ
て設定された回路の出力信号A,Bが試験出力端子18
−A,18−Bに送出される。したがって、測定器19
は、この試験出力端子18−A,18−Bに送出されて
くる出力信号を観測し、その信号状態からプリント基板
1内の対応する回路が正常に動作しているか否かを判定
する。なお、出力選択ピン端子16のピン挿入位置を変
えることにより、MPX14−A,14−Bから出力さ
れる出力信号を自在に設定することできる。
By this test operation, each circuit 10-1 to 10-1
The output signals A and B output from 0-n are MPX14-
The output signals A and B of the circuit which are input to A and 14-B and set by the output selection pin terminal 16 are the test output terminals 18
-Sent to A, 18-B. Therefore, the measuring device 19
Observes the output signals sent to the test output terminals 18-A and 18-B and determines from the signal state whether the corresponding circuit in the printed circuit board 1 is operating normally. The output signals output from the MPXs 14-A and 14-B can be freely set by changing the pin insertion position of the output selection pin terminal 16.

【0014】以上、本発明の一実施例について説明した
が、本発明はこの実施例に限定されるものではなく、そ
の発明の主旨に従った各種変形が可能である。
Although one embodiment of the present invention has been described above, the present invention is not limited to this embodiment, and various modifications can be made according to the gist of the invention.

【0015】[0015]

【発明の効果】以上説明したように、本発明の試験方法
によれば、プリント基板の実装回路の試験時に外部より
試験信号を入力する必要がなく、また実装回路よりの出
力はプリント基板内部で選択されて出力されるため、測
定器の接続変更が不要となり、動作試験を簡単に行なう
ことができる。
As described above, according to the test method of the present invention, it is not necessary to input a test signal from the outside when the mounting circuit of the printed circuit board is tested, and the output from the mounting circuit is stored inside the printed circuit board. Since it is selected and output, it is not necessary to change the connection of the measuring instrument, and the operation test can be easily performed.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の原理図である。FIG. 1 is a principle diagram of the present invention.

【図2】本発明の実施例の構成図である。FIG. 2 is a configuration diagram of an embodiment of the present invention.

【図3】従来例の説明図である。FIG. 3 is an explanatory diagram of a conventional example.

【符号の説明】[Explanation of symbols]

1 プリント基板 2 実装回路 3 タイミング発生回路 4 試験信号発生手段 5 切替手段 6 出力端子 7 出力選択手段 8 試験出力端子 9 測定器 1 printed circuit board 2 mounting circuit 3 timing generation circuit 4 test signal generation means 5 switching means 6 output terminal 7 output selection means 8 test output terminal 9 measuring instrument

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 実装回路の動作試験信号を発生する試験
信号発生手段と、該試験信号発生手段の出力と実装回路
のタイミング発生回路の出力のいずれかを選択して実装
回路に供給する切替手段と、実装回路の複数の出力信号
中の任意の信号を選択して出力する出力選択手段とをプ
リント基板に設け、 実装回路の動作試験時には、前記切替手段を試験信号発
生手段側に切替えることにより試験信号発生手段の発生
する試験信号を実装回路に供給し、 この時に実装回路から出力される出力信号中の任意の信
号を前記出力選択手段によって選択し、該選択した出力
信号をプリント基板外部に用意した測定器で測定するこ
とを特徴とするプリント基板実装回路の試験方法。
1. A test signal generating means for generating an operation test signal of a mounting circuit, and a switching means for selecting one of an output of the test signal generating means and an output of a timing generating circuit of the mounting circuit and supplying the selected circuit to the mounting circuit. And an output selection means for selecting and outputting an arbitrary signal from a plurality of output signals of the mounted circuit are provided on the printed circuit board, and during the operation test of the mounted circuit, the switching means is switched to the test signal generating means side. The test signal generated by the test signal generating means is supplied to the mounting circuit, and an arbitrary signal in the output signals output from the mounting circuit at this time is selected by the output selecting means, and the selected output signal is output to the outside of the printed circuit board. A test method for a printed circuit board mounted circuit, which is characterized by measuring with a prepared measuring instrument.
JP4289977A 1992-10-28 1992-10-28 Method for testing printed circuit board-packaged circuit Withdrawn JPH06138186A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4289977A JPH06138186A (en) 1992-10-28 1992-10-28 Method for testing printed circuit board-packaged circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4289977A JPH06138186A (en) 1992-10-28 1992-10-28 Method for testing printed circuit board-packaged circuit

Publications (1)

Publication Number Publication Date
JPH06138186A true JPH06138186A (en) 1994-05-20

Family

ID=17750183

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4289977A Withdrawn JPH06138186A (en) 1992-10-28 1992-10-28 Method for testing printed circuit board-packaged circuit

Country Status (1)

Country Link
JP (1) JPH06138186A (en)

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